Method, device and equipment for detecting thickness of heat treatment hardened layer, medium and product

Abstract

The invention discloses a method, a device, equipment, a medium and a product for detecting the thickness of a heat treatment hardened layer, and relates to the technical field of engineering nondestructive detection.The method comprises the steps that the distance between probes is gradually increased, the waveform characteristic of a reflected signal is monitored, and a corresponding probe distance interval is determined on the basis of distortion of the reflected signal; performing dichotomy refinement on the probe spacing interval to obtain a probe spacing interval mean value; obtaining a first peak position time of the straight-through signal and a second peak position time of the reflected signal when the probe spacing is in the mean value of the probe spacing interval; determining the thickness of the heat treatment hardened layer based on the specific angle, the first peak position time, the second peak position time, the probe spacing interval mean value and the sound velocity; a one-transmitting and one-receiving double-probe arrangement mode is combined with an ultrasonic time-of-flight diffraction method, the thickness is calculated by analyzing the acoustic path distance difference between a surface straight-through signal and a reflection signal, the technical limitation of a traditional single probe is eliminated, and the application range of nondestructive testing is widened.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of engineering nondestructive testing, and particularly relates to a method, device, equipment, medium and product for detecting the thickness of a heat treatment hardened layer. BACKGROUND

[0002] Heat treatment is a process of heating, holding and cooling a workpiece in the field of mechanical manufacturing. By changing the microstructure inside the workpiece, the mechanical properties of the material are adjusted to make the workpiece have good hardness and wear resistance, and the strength and load capacity of the material are improved. Therefore, detecting the thickness of the heat treatment hardened layer is an important link for measuring the quality of heat treatment and ensuring the performance of the workpiece.

[0003] For key components such as track links and supporting wheels of a tracked engineering machine chassis, nondestructive detection of the thickness of the heat treatment hardened layer can improve the detection efficiency of the thickness of the heat treatment hardened layer and reduce the cost of manual destructive testing. Among them, eddy current detection and ultrasonic detection are the most commonly used methods for detecting the thickness of non-homogeneous materials, but they are limited by the conductivity requirements of the measured object and the skin effect, which results in that the thickness of the hardened layer detected by the eddy current nondestructive detection is usually less than 10 mm. Ultrasonic A-scan detection is a commonly used ultrasonic detection technology. By using critical refraction longitudinal waves (LCR) and interface reflected transverse waves, a single ultrasonic probe is used to calculate the thickness of the heat treatment hardened layer, but LCR waves and Rayleigh / surface waves are usually used to detect defects in plates, and the waveforms usually propagate on the surface. In addition, the energy of the transverse wave attenuates greatly, and the detection depth is small. Therefore, the traditional method for detecting the thickness of the heat treatment hardened layer has obvious limitations in the detection range, and cannot meet the high-precision detection requirements in a large thickness range, which is difficult to meet the actual engineering requirements of heat treatment workpiece hardened layer measurement. SUMMARY

[0004] The purpose of the present application is to provide a method, device, equipment, medium and product for detecting the thickness of a heat treatment hardened layer, which can solve the problem that the traditional method for detecting the thickness of a heat treatment hardened layer has obvious limitations in the detection range and cannot meet the high-precision detection requirements in a large thickness range.

[0005] To achieve the above-mentioned purpose, the present application provides the following solutions: In a first aspect, the present application provides a method for detecting the thickness of a heat treatment hardened layer, comprising: connecting an excitation probe and a receiving probe to a water tank in which a heat treatment sample to be measured is placed at a specific angle, wherein the excitation probe is used to emit an ultrasonic excitation signal, and the receiving probe is used to receive a straight-through signal and a reflected signal; gradually increasing the probe spacing, and monitoring the waveform characteristics of the reflected signal, and determining the corresponding probe spacing interval based on the distortion of the reflected signal; refining the probe spacing interval by bisection to obtain a probe spacing interval mean value; The first peak position time of the through signal and the second peak position time of the reflected signal are obtained when the probe spacing is the average value of the probe spacing interval. The thickness of the heat-treated hardened layer is determined based on the specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity.

[0006] In one embodiment, the step of refining the probe spacing interval using a bisection method to obtain the mean value of the probe spacing interval specifically includes: Calculate the median value of the probe spacing range; When the probe spacing is at the middle value, the distortion of the reflected signal is determined, and the probe spacing range is updated based on the distortion of the reflected signal. Calculate the error of the updated probe spacing range; When the error meets the preset accuracy requirement, the mean value of the probe spacing interval that meets the accuracy requirement is calculated and used as the mean value of the probe spacing interval.

[0007] In one embodiment, the step of updating the probe spacing range based on the distortion of the reflected signal specifically includes: When the reflected waveform is not distorted, the lower limit of the probe spacing interval is updated to the middle value, while the upper limit of the probe spacing interval remains unchanged, thus forming the updated probe spacing interval. When the reflected waveform is distorted, the upper limit of the probe spacing interval is updated to the middle value, while the lower limit of the probe spacing interval remains unchanged, thus forming the updated probe spacing interval.

[0008] In one embodiment, the step of determining the thickness of the heat-treated hardened layer based on the specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity specifically includes: Based on the wave mode transform Snyder's law, the first critical angle and the second critical angle of the heat-treated sample under test are calculated. Based on the relationship between the specific angle and the first critical angle and the second critical angle, the sound path difference is determined based on the first peak position time, the second peak position time, and the sound speed. The half-reflection path is determined based on the sound path difference and the average value of the probe spacing interval; The thickness of the heat-treated hardened layer is determined based on the half-reflection path and the path difference.

[0009] In one embodiment, the step of determining the sound path difference based on the relationship between the specific angle and the first critical angle and the second critical angle, and based on the first peak position time, the second peak position time, and the sound velocity, specifically includes: When the specific angle is less than the first critical angle, the acoustic path difference is determined based on the first peak position time, the second peak position time, and the longitudinal wave velocity of the sample material. When the specific angle is between the first critical angle and the second critical angle, the sound path difference is determined based on the first peak position time, the second peak position time, the longitudinal wave velocity of the sample material, and the transverse wave velocity of the sample material.

[0010] In one embodiment, the step of determining the thickness of the heat-treated hardened layer based on the half-reflection sound path and the sound path difference is calculated using the following formula: T = In the formula, T The thickness of the heat-treated hardened layer. The half-reflection path, The sound path difference is mentioned.

[0011] Secondly, this application also provides a device for detecting the thickness of a heat-treated hardened layer, comprising: The probe arrangement module connects the excitation probe and the receiving probe at a specific angle to a water tank on which the heat-treated sample to be tested is placed. The excitation probe is used to emit ultrasonic excitation signals, and the receiving probe is used to receive direct signals and reflected signals. The interval determination module gradually increases the probe spacing and monitors the waveform characteristics of the reflected signal to determine the corresponding probe spacing interval based on the distortion of the reflected signal. The precision refinement module refines the probe spacing interval using a bisection method to obtain the mean value of the probe spacing interval; The signal acquisition module acquires the first peak position time of the through signal and the second peak position time of the reflected signal when the probe spacing is the average value of the probe spacing interval. The thickness calculation module determines the thickness of the heat-treated hardened layer based on the specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity.

[0012] Thirdly, this application also provides a computer device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the above-described method.

[0013] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the above-described method.

[0014] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the above-described method.

[0015] According to the specific embodiments provided in this application, the following technical effects are disclosed: This application provides a method for detecting the thickness of a heat-treated hardened layer. By employing a dual-probe arrangement (one transmitter, one receiver) combined with ultrasonic diffraction time-of-flight method, the thickness is calculated by analyzing the path difference between the surface through-channel signal and the reflected signal. This overcomes the limitations of traditional single-probe methods that rely on LCR waves, surface waves, or shear waves, thus expanding the applicability of non-destructive testing. Simultaneously, by monitoring the distortion characteristics of the reflected signal waveform, the critical probe spacing range is determined, and iterative refinement is performed using a bisection method. This bisection refinement efficiently and iteratively narrows the probe spacing range affected by reflected signal distortion, improving the efficiency and reliability of thickness detection while maintaining accuracy. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a flowchart of a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application; Figure 2 This is a schematic diagram illustrating the propagation principle of surface through signal and interface reflection signal in a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application. Figure 3 This is a schematic diagram illustrating the detection principle of a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application. Figure 4 This is a schematic diagram of the received signal waveform evolution of a heat treatment hardened layer thickness detection method according to an embodiment of this application; Figure 5 This is a waveform transmission diagram of the excitation probe incident angle when it is less than the first critical angle in the heat treatment hardened layer thickness detection method according to an embodiment of this application. Figure 6 This is a waveform transmission diagram of the excitation probe incident angle between a first critical angle and a second critical angle in a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application. Figure 7 This is a schematic diagram of the grid division for detecting the hardened layer thickness of a 35MnB material track link part, which is an embodiment of the heat treatment hardened layer thickness detection method of this application. Figure 8 This is a diagram illustrating the testing equipment used in the actual application of a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application. Figure 9 This is a schematic diagram of the preset positions of the excitation probe and receiving probe for detecting the hardened layer thickness of a 35MnB track link part, which is an embodiment of the heat treatment hardened layer thickness detection method of this application. Figure 10 The waveform diagram corresponding to a probe spacing of 30 mm in the method for detecting the thickness of the heat-treated hardened layer according to an embodiment of this application. Figure 11 The waveform diagram corresponding to a probe spacing of 40 mm in the method for detecting the thickness of the heat-treated hardened layer according to an embodiment of this application. Figure 12 This is a line graph showing the transmission time of the through signal and the reflected signal in a method for detecting the thickness of a heat-treated hardened layer according to an embodiment of this application. Figure 13 This is a line graph showing the results of heat treatment hardened layer thickness detection after refinement by the dichotomy method according to an embodiment of the present application. Figure 14 This is a schematic diagram of the structure of a computer device provided in an embodiment of this application. Detailed Implementation

[0018] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0019] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0020] See Figure 1 This application provides a method for detecting the thickness of a heat-treated hardened layer, comprising the following steps: S100: Connect the excitation probe and the receiving probe at a specific angle to a water bath on which the heat-treated sample to be tested is placed. The excitation probe is used to emit ultrasonic excitation signals, and the receiving probe is used to receive direct signals and reflected signals. S200: Gradually increase the probe spacing and monitor the waveform characteristics of the reflected signal. Determine the corresponding probe spacing range based on the distortion of the reflected signal. S300: The probe spacing interval is refined by a bisection method to obtain the mean value of the probe spacing interval; S400: Obtain the first peak position time of the through signal and the second peak position time of the reflected signal when the probe spacing is within the average range of probe spacing; S500: Determine the thickness of the heat-treated hardened layer based on a specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity.

[0021] In S100, the heat-treated sample to be tested is placed flat in a water bath and fixed. The excitation probe and the receiving probe are placed in preset positions with an initial probe spacing of L0. The angles of the excitation probe and the receiving probe are simultaneously adjusted to a specific angle using a precision bidirectional rotation mechanism.

[0022] See Figure 2 An ultrasonic excitation signal with amplitude A and period t is set for the signal generator. The ultrasonic excitation signal is transmitted to the water-sample interface in the form of obliquely incident longitudinal wave, and is transmitted directly along the sample surface and through the reflection path at the hardened layer-core interface.

[0023] See S200. Figure 3 As the probe spacing L increases, the detection position gradually shifts from inside the hardened layer to the hardened layer-core interface. The reflected signal is processed by a signal amplifier and acquired and displayed using a digital oscilloscope. See also Figure 4 The overlap between the reflected signal and the direct signal gradually decreases and they separate. When the reflected signal becomes distorted, the corresponding probe spacing interval [L] is determined. a0 L b0 ].

[0024] It should be noted that there is a significant boundary between the grain size of the substrate material and the grain size of the hardened layer, and the grain size of the substrate material is much larger than the grain size of the hardened layer. In this case, when the ultrasonic excitation signal is reflected through the core interface, the signal waveform will be distorted.

[0025] The lower limit value L of the probe spacing range in this application a0 The minimum probe spacing can be initially selected. The minimum spacing between the probes depends on two factors: firstly, the hardware, which determines the minimum distance that prevents interference during probe assembly; and secondly, the minimum distance that prevents overlap between the reflected and direct signals. The larger of these two values ​​should be used. The upper limit L of the probe spacing range is... b0 This is the first time that the probe spacing has been observed when the waveform of the reflected signal is distorted.

[0026] In S300, specifically, the step of refining the probe spacing interval using a bisection method to obtain the mean value of the probe spacing interval includes: calculating the median value of the probe spacing interval; when the probe spacing is the median value, determining the distortion of the reflected signal and updating the probe spacing interval based on the distortion of the reflected signal; calculating the error of the updated probe spacing interval; and when the error meets the preset accuracy requirements, calculating the mean value of the probe spacing interval that meets the accuracy requirements, and using it as the mean value of the probe spacing interval.

[0027] If the error does not meet the preset accuracy requirements, the steps of calculating the intermediate value, judging the distortion, updating the interval and calculating the error are repeated based on the updated probe spacing range, and the next iteration is performed until the error meets the accuracy requirements.

[0028] Furthermore, the step of updating the probe spacing interval based on the distortion of the reflected signal specifically includes: when the reflected waveform is not distorted, the lower limit of the probe spacing interval is updated to the middle value, while the upper limit of the probe spacing interval remains unchanged, thus forming the updated probe spacing interval; when the reflected waveform is distorted, the upper limit of the probe spacing interval is updated to the middle value, while the lower limit of the probe spacing interval remains unchanged, thus forming the updated probe spacing interval.

[0029] For example, it is determined whether the received reflected waveform is distorted. If no distorted signal is detected, the probe spacing L is gradually increased until a distorted signal is detected. Subsequently, the probe spacing interval is refined using a bisection method. When a distorted signal is initially detected, the upper and lower limits of the probe spacing interval are L1 and L2, respectively. b0 and L a0 The corresponding intermediate value L m0 The expression is: If the probe spacing is L m0 If the waveform of the reflected signal does not change, then take L. m0 The lower limit value L of the spacing interval a1 L b0 L is the upper limit of the spacing interval. b1 The corresponding intermediate value L m1 The expression is: If the probe spacing is L m0 If the waveform of the reflected signal is distorted, then take L. m0 L is the upper limit of the spacing interval. b1 L a0 The lower limit value L of the spacing interval a1 The corresponding intermediate value L m1 The expression is: Based on the probe spacing L m1 The distortion of the reflected signal waveform at that time is used to determine the upper limit value L of the corresponding spacing interval. a2 With lower limit value L b2 Repeat the above operation until the error ξ reaches the required accuracy δ, then take the average value L of that interval. avg As the probe spacing, the error ξ is related to the mean value L of the probe spacing interval. avg The expression is: Where i represents the number of times the bisection refinement is performed.

[0030] In S400 and S500, the excitation probe and the receiving probe are at the same angle. The receiving probe captures the peak position time of the direct signal and the peak position time of the reflected signal, which are t1 and t2, respectively, that is, the first peak position time and the second peak position time.

[0031] Specifically, the steps for determining the thickness of the heat-treated hardened layer based on a specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity include: calculating the first critical angle and the second critical angle of the heat-treated sample based on the wave mode transform Snyder's law; determining the sound path difference based on the relationship between the specific angle and the first and second critical angles, the time of the first peak position, the time of the second peak position, and the sound velocity; determining the half-reflection sound path based on the sound path difference and the average value of the probe spacing interval; and determining the thickness of the heat-treated hardened layer based on the half-reflection sound path and the sound path difference.

[0032] Furthermore, the step of determining the sound path difference based on the relationship between the specific angle and the first critical angle and the second critical angle, and based on the first peak position time, the second peak position time, and the sound velocity, specifically includes: when the specific angle is less than the first critical angle, determining the sound path difference based on the first peak position time, the second peak position time, and the longitudinal wave sound velocity of the sample material; and when the specific angle is between the first critical angle and the second critical angle, determining the sound path difference based on the first peak position time, the second peak position time, the longitudinal wave sound velocity of the sample material, and the transverse wave sound velocity of the sample material.

[0033] See Figure 5 The ultrasonic excitation signal adopts a longitudinal wave oblique incidence waveform. Based on the wave mode transformation Snyder's law, the first critical angle θ1 and the second critical angle θ2 of the material are calculated. The calculation of the first and second critical angles based on the wave mode transformation Snyder's law is a common existing technique and will not be elaborated further. If the incident angle of the ultrasonic excitation signal is less than the first critical angle, i.e., α < θ1, no waveform conversion occurs. The reflected signal waveform within the heat-treated hardened layer remains a longitudinal wave, and the longitudinal wave velocity of the sample material is c. LThe corresponding expressions for the sound path difference ΔL and the half-reflection sound path l1 are: See Figure 6 If the incident angle of the ultrasonic excitation signal is between the first critical angle and the second critical angle, i.e., θ1 < α < θ2, then the ultrasonic signal undergoes a waveform transformation at the water-sample interface. The reflected signal waveform within the heat-treated hardened layer is a transverse wave, and the surface-through signal waveform is a longitudinal wave. The transverse wave velocity of the sample material is c. T The corresponding expressions for the sound path difference ΔL and the half-reflection sound path l1 are: The principles for selecting the incident angle α include: when the incident angle α is small, the refraction angle β is small, resulting in insufficient detection depth; when the incident angle α is large, it is necessary to ensure that the distance between the excitation probe and the receiving probe is large enough, which will affect the selection of the measurement position. Furthermore, due to the increased transmission paths of the direct and reflected signals, material defects, surface morphology distortions, etc., will all introduce measurement errors. Those skilled in the art can select a suitable incident angle according to the actual situation.

[0034] The steps for determining the thickness of the heat-treated hardened layer based on the half-reflection sound path and the sound path difference are as follows: T = In the formula, T The thickness of the heat-treated hardened layer. For half-reflection path, This is the sound path difference.

[0035] Before refining the probe spacing interval into an average value using a bisection method, this application can further: calculate the first heat treatment thickness corresponding to the upper limit of the probe spacing interval, and calculate the second heat treatment thickness corresponding to the lower limit of the probe spacing interval, to obtain an initial heat treatment thickness interval. The method for calculating the first and second heat treatment thicknesses is the same as the method for calculating the heat-treated hardened layer thickness described above, and will not be repeated here. By determining the initial heat treatment thickness interval, the approximate range of the heat-treated hardened layer thickness is preliminarily defined, which can provide a reference for subsequently determining the final heat-treated hardened layer thickness.

[0036] In one specific embodiment, a 35MnB material track link component was selected as the heat-treated sample to be tested. Based on the inherent properties of the material, the longitudinal wave velocity c of the water was obtained. wL The longitudinal wave velocity of the sample material is 1480 m / s, c. L The transverse wave velocity of the sample material is 5600 m / s, c.T The velocity is 3200 m / s. Based on the wave mode transform Snyder's law, the first critical angle of the material is calculated to be 15.32°, and the second critical angle is 27.55°. The specific test steps are as follows: Step 1: See Figure 7 The quenched surface of the 35MnB material track link part to be tested was divided to obtain a uniform test grid with a grid size of 12.5 mm × 20 mm.

[0037] Step 2: See Figure 8 Two sets of I2-2.5P6F15-H immersion ultrasonic probes (excitation frequency: 2.5 MHz; focal length: 15 mm) were selected as the excitation probe and the receiving probe, respectively. The overall equipment includes a precision scanning motion platform, a precision positioning device, a precision rotation mechanism, an excitation probe, a receiving probe and a water tank, as well as the corresponding signal generation and detection parts, including a signal generator, a signal amplifier and a digital oscilloscope.

[0038] See Figure 9 The 35MnB material track link part to be tested is placed flat in the water tank and fixed. The excitation probe and the receiving probe are placed in the preset position, and the angles of the two probes are the same. The incident angle α of the ultrasonic excitation signal is set to 11°. At this time, the incident angle is less than the first critical angle of the material. The oblique incident waveform is a longitudinal wave and no waveform transformation occurs. The initial probe spacing L0=30mm.

[0039] Step 3: Set the ultrasonic excitation signal for the signal generator, with amplitude A set to 0.8 V and period t to 2 μs. The ultrasonic excitation signal is obliquely incident on the water-sample interface and propagates directly along the sample surface and through a reflection path at the hardened layer-core interface.

[0040] Step 4: Gradually increase the probe spacing, see... Figure 8 The ultrasonic excitation signal is amplified and displayed on a digital oscilloscope. The direct signal propagates along the surface, and its signal strength decreases significantly with increasing probe spacing; the reflected signal has a relatively high strength. See also Figure 10 and Figure 11 When the probe spacing is 40mm, the upper limit value L of the probe spacing range is obtained. b0 At this point, the reflected waveform is distorted. When the probe spacing is 30mm, the lower limit value L of the probe spacing range is obtained. a0 At this time, the reflected waveform is not distorted.

[0041] Step 5: See Figure 12When the probe spacing is 30mm and 40mm, the time difference Δt between the peak positions of the through signal and the reflected signal is 5μs and 6.68μs, respectively, from which the corresponding acoustic path difference ΔL is obtained as 28mm and 37.408mm, respectively. Through calculation, the initial heat treatment thickness range [25.397, 33.885] is obtained.

[0042] Step 6: Refer to Figure 13 As shown, the probe spacing interval is refined using a bisection method, and the median value L of the probe interval is taken. m0 =35mm. Since the received reflected signal waveform is not distorted when the probe spacing is 35mm, the corresponding heat-treated hardened layer thickness is measured to be 29.641mm, which does not reach the accuracy δ=1mm. Therefore, the probe spacing range for one iteration is [35, 40]. When the probe spacing L m1 When the thickness is 37.5mm, the reflected waveform shows no distortion, and the corresponding thickness is measured to be 31.763mm, which does not meet the accuracy requirements. Therefore, the spacing interval for the second iteration is [37.5, 40]. The midpoint of this interval, L, is taken. m2 =38.75mm, the corresponding heat-treated hardened layer thickness was measured to be 32.848mm, which did not meet the accuracy requirements. Therefore, the spacing interval for the third iteration is [38.75, 40]. The midpoint of the interval, L, is taken. m3 =39.375mm, the corresponding heat-treated hardened layer thickness was measured to be 33.355mm. At this point, the detection depth error ξ is less than 1 mm, which meets the accuracy requirements. The average value L of the probe spacing interval is used as the basis for the accuracy. avg Using 39.6875 mm as the probe spacing, the refined thickness of the heat-treated hardened layer is 33.620 mm, enabling high-precision non-destructive testing of a large-thickness hardened layer.

[0043] This application employs a "one transmitter, one receiver" ultrasonic probe arrangement, combined with path difference analysis of the direct and reflected signals, to measure the thickness of the heat-treated hardened layer. This overcomes the limitations of traditional single-probe detection methods in terms of depth and accuracy. Furthermore, by arranging the excitation and receiving probes at a specific angle in a water tank, and monitoring the waveform characteristics of the reflected signal, the probe spacing range is determined. A precise average spacing value is then obtained through a bisection method. This bisection method efficiently and iteratively reduces the probe spacing range affected by reflected signal distortion, improving the efficiency and reliability of thickness detection while maintaining accuracy. In practical applications, this application can accurately calculate the thickness of the heat-treated hardened layer up to 30 mm.

[0044] Based on the same inventive concept, this application also provides a device for detecting the thickness of a heat-treated hardened layer. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more embodiments of the device for detecting the thickness of a heat-treated hardened layer provided below can be found in the limitations of the heat-treated hardened layer detection method described above, and will not be repeated here.

[0045] This application also provides a device for detecting the thickness of a heat-treated hardened layer, comprising: The probe arrangement module connects the excitation probe and the receiving probe at a specific angle to a water bath on which the heat-treated sample to be tested is placed. The excitation probe is used to emit ultrasonic excitation signals, and the receiving probe is used to receive direct signals and reflected signals. The interval determination module gradually increases the probe spacing and monitors the waveform characteristics of the reflected signal. Based on the distortion of the reflected signal, it determines the corresponding probe spacing interval. The precision refinement module uses a bisection method to refine the probe spacing interval to obtain the mean value of the probe spacing interval; The signal acquisition module acquires the first peak position time of the direct signal and the second peak position time of the reflected signal when the probe spacing is within the average range of probe spacing. The thickness calculation module determines the thickness of the heat-treated hardened layer based on a specific angle, the time of the first peak position, the time of the second peak position, the average value of the probe spacing interval, and the sound velocity.

[0046] In one exemplary embodiment, a computer device is provided, which may be a server or a terminal, and its internal structure diagram may be as follows. Figure 14 As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and databases. The internal memory provides the environment for the operating system and computer programs stored in the non-volatile storage media to run. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communicating with external terminals via a network connection.

[0047] Those skilled in the art will understand that Figure 14The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0048] In one exemplary embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0049] In one exemplary embodiment, a computer-readable storage medium is provided storing a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0050] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0051] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0052] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0053] The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0054] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0055] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method of detecting the thickness of a hardened layer by heat treatment, characterized by, The method comprises the following steps: connecting an excitation probe and a receiving probe to a water tank in which a heat treatment sample is placed at a specific angle, the excitation probe being used to emit an ultrasonic excitation signal, and the receiving probe being used to receive a direct signal and a reflected signal; gradually increasing the probe spacing, and monitoring the waveform characteristics of the reflected signal, and determining the corresponding probe spacing interval based on the distortion of the reflected signal; refining the probe spacing interval by dichotomy to obtain a probe spacing interval mean value; obtaining a first peak position time of the direct signal and a second peak position time of the reflected signal when the probe spacing is the probe spacing interval mean value; determining the heat treatment hardened layer thickness based on the specific angle, the first peak position time, the second peak position time, the probe spacing interval mean value and the sound velocity.

2. The method of claim 1, wherein The step of refining the probe spacing interval by dichotomy to obtain a probe spacing interval mean value comprises the following steps: calculating a middle value of the probe spacing interval; judging the distortion of the reflected signal when the probe spacing is the middle value, and updating the probe spacing interval based on the distortion of the reflected signal; calculating the error of the updated probe spacing interval; when the error meets the preset accuracy requirement, calculating the mean value of the probe spacing interval that meets the accuracy requirement as the probe spacing interval mean value.

3. The method of claim 2, wherein the thickness of the hardened layer is determined by the following equation: ###0001### where, d is the thickness of the hardened layer, D is the diameter of the laser beam, and f is the focal length of the lens. The step of updating the probe spacing interval based on the distortion of the reflected signal comprises the following steps: when the reflected waveform is not distorted, updating the lower limit value of the probe spacing interval to the middle value, keeping the upper limit value of the probe spacing interval unchanged to form the updated probe spacing interval; when the reflected waveform is distorted, updating the upper limit value of the probe spacing interval to the middle value, keeping the lower limit value of the probe spacing interval unchanged to form the updated probe spacing interval.

4. The method of claim 1, wherein The step of determining the heat treatment hardened layer thickness based on the specific angle, the first peak position time, the second peak position time, the probe spacing interval mean value and the sound velocity comprises the following steps: calculating a first critical angle and a second critical angle of the heat treatment sample based on the wave transformation Snell's law; determining the sound path difference based on the first peak position time, the second peak position time and the sound velocity according to the relationship between the specific angle and the first critical angle and the second critical angle; determining the half-reflection sound path based on the sound path difference and the probe spacing interval mean value; determining the heat treatment hardened layer thickness based on the half-reflection sound path and the sound path difference.

5. The method of claim 4, wherein the thickness of the hardened layer is determined by the following equation: ###0001### where, d is the thickness of the hardened layer, D is the diameter of the laser beam, and f is the focal length of the lens. The step of determining the sound path difference based on the first peak position time, the second peak position time and the sound velocity according to the relationship between the specific angle and the first critical angle and the second critical angle comprises the following steps: when the specific angle is less than the first critical angle, determining the sound path difference based on the first peak position time, the second peak position time and the longitudinal wave sound velocity of the sample material. When the specific angle is between the first critical angle and the second critical angle, a sound path difference is determined based on the first peak position time, the second peak position time, a longitudinal wave sound speed of the sample material, and a transverse wave sound speed of the sample material.

6. The method of claim 4, wherein the thickness of the hardened layer is determined by the following equation: ###0001### where, d is the thickness of the hardened layer, D is the diameter of the laser beam, and f is the focal length of the lens. The step of determining the heat treatment hardened layer thickness based on the half-reflection sound path and the sound path difference is calculated by the following formula: T = ； wherein T is the thickness of the heat treated hardening layer, is the half-reflection acoustic path, is the acoustic path difference.

7. An apparatus for detecting a hardened layer thickness of a heat treatment, characterized by The method comprises the steps of: a probe; a placement module, which connects an excitation probe and a receiving probe at a specific angle on a water tank on which a heat treatment sample is placed, the excitation probe being used to emit an ultrasonic excitation signal, and the receiving probe being used to receive a direct signal and a reflected signal; an interval determination module, which gradually increases the probe spacing, and monitors the waveform characteristics of the reflected signal, and determines a corresponding probe spacing interval based on the distortion of the reflected signal; a precision refinement module, which performs bisection refinement on the probe spacing interval to obtain a probe spacing interval mean value; a signal acquisition module, which acquires a first peak position time of the direct signal and a second peak position time of the reflected signal when the probe spacing is the probe spacing interval mean value; a thickness calculation module, which determines the heat treatment hardened layer thickness based on the specific angle, the first peak position time, the second peak position time, the probe spacing interval mean value, and the sound speed.

8. A computer device comprising: A memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor executes the computer program to implement the heat treatment hardened layer thickness detection method of any one of claims 1-6.

9. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the heat treatment hardened layer thickness detection method of any one of claims 1-6.

10. A computer program product comprising a computer program, characterized in that, The computer program is executed by the processor to implement the heat treatment hardened layer thickness detection method of any one of claims 1-6.

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