Testing device and testing method for high-frequency large-current thin-film capacitor

Abstract

The invention discloses a testing device and a testing method for a high-frequency large-current thin-film capacitor, and particularly relates to the field of capacitors, the testing device comprises a workbench, a support is installed on the workbench, a rotation driving assembly is installed on the support, and an annular clamping device is installed at the output end of the rotation driving assembly; the annular clamp holder comprises an outer ring and an inner ring arranged in the outer ring, an outer flexible ring and an inner flexible ring are arranged between the outer ring and the inner ring, the outer flexible ring is fixed on the inner side wall of the outer ring, and the inner flexible ring is fixed on the outer side wall of the inner ring. According to the invention, the high-frequency dv / dt test is carried out on the capacitor, and the key parameter high-frequency loss DF value of the capacitor product which cannot meet the impact current test is amplified by n times compared with the loss DF value of the original static test, so that the capacitor with quality hidden danger flaws can be eliminated in the subsequent test; therefore, the capacitor product which is tested to be qualified can meet the safety application on a high-frequency line.

Description

Technical Field

[0001] This invention relates to the field of capacitor technology, and more specifically, to a testing device and method for high-frequency, high-current thin-film capacitors. Background Technology

[0002] High-frequency, high-current film capacitors are commonly used in electronic ballasts, ultrasonic circuits, and high-power power supplies, and must withstand high voltage, high frequency, and high current. Capacitor testing is a crucial step in ensuring the reliable operation of electronic equipment, preventing malfunctions, and ensuring safety. Its purpose is to test whether the core parameters meet the design requirements.

[0003] Currently, traditional film capacitor production testing follows the basic tests of the four electrical characteristics of capacitors (capacitance, loss, insulation resistance, and withstand voltage). However, in actual product applications, film capacitors often need to withstand high frequencies and high currents in the circuits they are used in. Film capacitor manufacturers are increasingly realizing that ordinary testing methods and equipment are often insufficient to meet the requirements of film capacitors used in high-frequency circuits, and capacitors with quality and safety defects cannot be completely eliminated through testing. Currently, some manufacturers simply add charge-discharge testing to the capacitor manufacturing and sorting process, which also fails to completely eliminate products with quality and safety defects. Summary of the Invention

[0004] The present invention provides a testing device and testing method for high-frequency, high-current film capacitors, which aims to solve the problem that existing testing methods for film capacitors cannot meet the requirements for their application in high-frequency circuits.

[0005] To achieve the above objectives, the present invention provides the following technical solution: a testing device for a high-frequency, high-current thin-film capacitor, comprising a worktable, a support mounted on the worktable, a rotary drive assembly mounted on the support, and an annular clamp mounted on the output end of the rotary drive assembly; the annular clamp comprises an outer ring and an inner ring disposed inside the outer ring, with an outer flexible ring and an inner flexible ring disposed between the outer ring and the inner ring, the outer flexible ring being fixed to the inner sidewall of the outer ring, and the inner flexible ring being fixed to the outer sidewall of the inner ring, the outer ring, the inner ring, the outer flexible ring, and the inner flexible ring being coaxially arranged, and the outer flexible ring and the inner flexible ring being used to clamp the leads of the capacitor; the testing device further comprises a voltage change rate tester, which is used to test the capacitor.

[0006] Preferably, a finger-clamping cylinder is installed on the bracket, and a clamping plate is installed on each of the two clamping fingers of the finger-clamping cylinder. Electrode plates are installed at both ends of the clamping plates. The voltage change rate tester is electrically connected to the two electrode plates. When the finger-clamping cylinder drives the two clamping plates to clamp the leads of the capacitor, the two electrode plates contact the two leads respectively.

[0007] Preferably, the rotary drive assembly includes a mounting bracket mounted on a support, a rotating frame rotatably connected to the mounting bracket, and a motor for driving the rotating frame to rotate mounted on the mounting bracket. Both the outer ring and the inner ring are fixedly mounted to the rotating frame.

[0008] Preferably, the annular clamp is provided with two sets of expanders. Each expander includes a mounting plate located at the bottom of the outer ring. A set of rotating shaft one and a set of rotating shaft two are mounted on both ends of the mounting plate. Both rotating shaft one and rotating shaft two are located between the outer flexible ring and the inner flexible ring. Rotating shaft one squeezes the outer flexible ring, and rotating shaft two squeezes the inner flexible ring, thereby creating a gap between rotating shaft one and rotating shaft two.

[0009] Preferably, a feeding assembly is provided below one of the expansion units. The feeding assembly includes a feeding rack, a feeding trough on one side of the feeding rack, and a feeding block on the other side. The capacitor is fed from the feeding trough to the feeding block. A tension spring is fixedly connected between the bottom of the feeding block and the bottom of the feeding rack. A power assembly is provided on one side of the feeding assembly. The power assembly is used to drive the feeding block to move the capacitor upward and laterally.

[0010] Preferably, a stop block is provided at the rear end of the feeding block, and the upper and lower ends of the stop block extend to the upper and lower sides of the feeding block, respectively. A pressure plate is provided at the bottom of the feeding block, and a movable shaft is installed at both ends of the pressure plate. The movable shaft moves laterally through the feeding frame, and a spring is sleeved on the movable shaft. The pressure plate presses on the stop block.

[0011] Preferably, the power assembly includes a second motor and a rotating arm installed at the output end of the second motor. A push rod is installed at the front end of the feeding block, and a protrusion is located on the lower side of the front end of the push rod.

[0012] Preferably, limit plates are provided on both sides of the feeding block, and a second movable shaft is vertically fixedly installed on the limit plate. The second movable shaft moves through the feeding block and a second spring is sleeved on the second movable shaft. Limit blocks are provided on both sides of the upper end of the feeding frame.

[0013] Preferably, a flexible block is provided at the front side of the upper end of the feeding block, and the flexible block is made of elastic material.

[0014] The present invention also provides a test method using the above-described test apparatus for a high-frequency, high-current thin-film capacitor, comprising the following steps: Step 1: The rotating drive assembly drives the ring clamp to rotate, and the capacitor is transported from the feed chute to the loading block by the conveyor belt; Step 2: Insert the capacitor leads into the gap using the power assembly and move the loading block laterally so that the capacitor leads are held in place by the outer and inner flexible rings. Step 3: The ring clamp delivers the capacitor to the position of the finger clamping cylinder. The finger clamping cylinder drives two clamping plates to clamp the capacitor's leads. A voltage change rate tester is used to test the capacitor.

[0015] The technical effects and advantages of this invention are as follows: 1. This invention performs high-frequency dv / dt testing on capacitors. For capacitor products that cannot meet the test requirements for this inrush current, the key parameter high-frequency loss DF value is increased by n times compared to the loss DF value of the original static test. This allows capacitors with potential quality defects to be eliminated in subsequent tests, so that qualified capacitor products can meet the safety requirements of high-frequency circuits.

[0016] 2. This invention uses a ring clamp composed of an outer ring, an outer flexible ring, an inner ring, and an inner flexible ring. An expander is used to expand the outer and inner flexible rings to form a gap. By inserting the capacitor's pins into the gap and moving it forward a short distance, the capacitor can be clamped by the ring clamp. The capacitor is fed by a feeding assembly and a second motor, thus eliminating the need for pneumatic circuits such as cylinders, which saves costs.

[0017] 3. When the capacitor moves to the inside of the uppermost pin insertion gap and needs to move laterally, the limiting block presses down on the limiting plate to release the limiting plate from the capacitor, so that the capacitor can be appropriately offset when moving forward to avoid the pin bending. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 This is a partial structural diagram of the present invention. Figure 1 ; Figure 3 This is a partial structural diagram of the present invention. Figure 2 ; Figure 4 This is a schematic diagram of the structure of the ring clamp of the present invention; Figure 5 For the present invention Figure 4 Top view; Figure 6 For the present invention Figure 4 Enlarged view of the local structure at point A; Figure 7 This is a schematic diagram of the feeding assembly of the present invention. Figure 1 ; Figure 8 This is a schematic diagram of the feeding assembly of the present invention. Figure 2 ; Figure 9 For the present invention Figure 7 Enlarged view of the local structure at point B; Figure 10 This is a flowchart of the testing method of the present invention.

[0019] The attached figures are labeled as follows: 1. Workbench; 11. Support; 2. Rotary drive assembly; 21. Mounting bracket; 22. Rotating frame; 23. Motor 1; 3. Ring clamp; 30. Gap; 31. Outer ring; 311. Outer flexible ring; 32. Inner ring; 321. Inner flexible ring; 4. Expander; 41. Mounting plate; 42. Rotating shaft 1; 43. Rotating shaft 2; 5. Finger clamping cylinder; 51. Clamping plate; 6. Feeding assembly; 61. Feeding rack; 62. 1. Feed chute; 612. Limiting block; 62. Loading block; 621. Stop block; 622. Flexible block; 63. Tension spring; 64. Pressure plate; 641. Movable shaft one; 642. Spring one; 65. Limiting plate; 651. Movable shaft two; 652. Spring two; 66. Top rod; 661. Protrusion; 7. Motor two; 71. Rotating arm; 8. Discharge assembly; 81. Motor three; 82. Discharge chute; 9. Conveyor belt; 100. Capacitor. Detailed Implementation

[0020] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] Refer to the instruction manual appendix Figures 1-5 A testing device for high-frequency, high-current film capacitors includes a worktable 1, a support 11 mounted on the worktable 1, a rotary drive assembly 2 mounted on the support 11, and an annular clamp 3 mounted on the output end of the rotary drive assembly 2.

[0022] In this embodiment, as Figures 4-5 As shown, the ring clamp 3 includes an outer ring 31 and an inner ring 32 disposed inside the outer ring 31. An outer flexible ring 311 and an inner flexible ring 321 are disposed between the outer ring 31 and the inner ring 32. The outer flexible ring 311 is fixed on the inner side wall of the outer ring 31, and the inner flexible ring 321 is fixed on the outer side wall of the inner ring 32. The outer ring 31, the inner ring 32, the outer flexible ring 311 and the inner flexible ring 321 are coaxially arranged. The outer flexible ring 311 and the inner flexible ring 321 are used to clamp the pins of the capacitor 100.

[0023] Among them, capacitor 100 is a high-frequency, high-current film capacitor. Both the outer flexible ring 311 and the inner flexible ring 321 can be made of rubber. By squeezing the outer flexible ring 311 and the inner flexible ring 321, the pins of capacitor 100 can be fixed.

[0024] In this embodiment, as Figure 1As shown, the rotary drive assembly 2 includes a mounting bracket 21 mounted on a support 11, a rotating frame 22 rotatably connected to the mounting bracket 21, and a motor 23 for driving the rotating frame 22 to rotate mounted on the mounting bracket 21. The outer ring 31 and the inner ring 32 are both fixedly mounted to the rotating frame 22.

[0025] Among them, motor 23 drives the rotating frame 22 to rotate via belt drive. The outer ring 31 and inner ring 32 are both fixed to the rotating frame 22, and the rotating frame 22 can drive the outer ring 31 and inner ring 32 to rotate synchronously.

[0026] In this embodiment, the testing device further includes a voltage change rate tester, which is used to test the capacitor 100.

[0027] In this embodiment, as Figure 1 As shown, a finger-clamping cylinder 5 is installed on the bracket 11. Each of the two fingers of the finger-clamping cylinder 5 is equipped with a clamping plate 51. Electrode plates are installed at both ends of the clamping plate 51. The voltage change rate tester is electrically connected to the two electrode plates. When the finger-clamping cylinder 5 drives the two clamping plates 51 to clamp the pins of the capacitor 100, the two electrode plates contact the two pins respectively.

[0028] In this embodiment, the implementation method is as follows: the leads of capacitor 100 are placed between the outer flexible ring 311 and the inner flexible ring 321, and the leads of capacitor 100 protrude above the ring clamp 3. The ring clamp 3 is rotated by the rotation drive assembly 2, so that capacitor 100 can be transported through the ring clamp 3. When it is transported to the position of the finger clamp cylinder 5, the finger clamp cylinder 5 drives the two clamping plates 51 to clamp the two leads of capacitor 100. The two leads are in contact with the two electrode plates respectively. Then, a voltage change rate tester is used to perform a high-frequency dv / dt test on capacitor 100. The high-frequency dv / dt test device is equivalent to a constant current source that continuously applies an impulse current to the capacitor 100 under test during the test. For capacitor 100 products that cannot meet the test of this impulse current, the key parameter high-frequency loss DF value is amplified by n times compared with the original static test loss DF value, so that capacitor 100 products with quality defects can be eliminated in subsequent tests, so that the qualified capacitor 100 products can meet the safety application of high-frequency lines.

[0029] Refer to the instruction manual appendix Figure 1 , Figures 4-6The ring clamp 3 is provided with two sets of expanders 4. The expander 4 includes a mounting plate 41 set at the bottom of the outer ring 31. A set of rotating shaft 42 and a set of rotating shaft 43 are installed at both ends of the mounting plate 41. The rotating shaft 42 and the rotating shaft 43 are both located between the outer flexible ring 311 and the inner flexible ring 321. The rotating shaft 42 squeezes the outer flexible ring 311, and the rotating shaft 43 squeezes the inner flexible ring 321, thereby forming a gap 30 between the rotating shaft 42 and the rotating shaft 43.

[0030] It should be noted that the mounting plate 41 is fixed to the worktable 1 by the support plate, and its position remains unchanged. Figure 6 As shown, each set of rotating shaft 1 42 has two rotating shaft 1 42s, and each set of rotating shaft 2 43 also has two rotating shaft 2 43s. There are eight mounting plates at both ends of the mounting plate 41. A gap 30 is formed between the mounting plate 41 and the rotating shaft 1 42. When the rotation drive assembly 2 drives the outer ring 31 and inner ring 32 to rotate, when the outer flexible ring 311 passes the rotating shaft 1 42, it will be flattened by the rotating shaft 1 42. Similarly, when the inner flexible ring 321 passes the rotating shaft 2 43, it will also be flattened. When it leaves the rotating shaft 1 42 and rotating shaft 2 43, it will return to its original shape. Therefore, as... Figure 6 As shown, each expander 4 forms two gaps 30.

[0031] Furthermore, such as Figures 7-9 As shown, a feeding assembly 6 is provided below one of the expansion devices 4. The feeding assembly 6 includes a feeding rack 61. A feeding trough 611 is provided on one side of the feeding rack 61, and a feeding block 62 is provided on the other side. The capacitor 100 is conveyed from the feeding trough 611 to the feeding block 62. A tension spring 63 is fixedly connected between the bottom of the feeding block 62 and the bottom of the feeding rack 61. A power assembly is provided on one side of the feeding assembly 6. The power assembly is used to drive the feeding block 62 to move the capacitor 100 upward and horizontally.

[0032] It should be noted that a conveyor belt 9 is set at the rear end of the feed trough 611. The capacitor 100 is conveyed into the feed trough 611 by the conveyor belt 9 and then conveyed from the front end of the feed trough 611 to the upper end of the loading block 62. The power component drives the loading block 62 to move the capacitor 100 upward and laterally. The upward movement means that the two pins of the capacitor 100 are inserted into the two gaps 30 respectively, while the lateral movement means that the pins are moved forward from the gaps 30 to between the outer flexible ring 311 and the inner flexible ring 321 and are squeezed and clamped.

[0033] Furthermore, a stop block 621 is provided at the rear end of the feeding block 62. The upper and lower ends of the stop block 621 extend to the upper and lower sides of the feeding block 62, respectively. A pressure plate 64 is provided at the bottom of the feeding block 62. A movable shaft 641 is installed at both ends of the pressure plate 64. The movable shaft 641 moves laterally through the feeding frame 61. A spring 642 is sleeved on the movable shaft 641. The pressure plate 64 presses on the stop block 621.

[0034] It should be noted that the movable shaft 641 can be a square rod, and the side wall of the square rod contacts the stop block 621 to limit the movement of both sides of the stop block 621.

[0035] Furthermore, the power assembly includes a second motor 7 and a rotating arm 71 installed at the output end of the second motor 7. A push rod 66 is installed at the front end of the feeding block 62, and a protrusion 661 is located on the lower side of the front end of the push rod 66.

[0036] It should be noted that when motor 7 drives the rotating arm 71 to rotate, as Figure 7 As shown, the rotating arm 71 rotates clockwise. The rotating arm 71 first pushes the top rod 66 to move upward. The top rod 66 drives the feeding block 62 to move upward. The tension spring 63 is stretched. When the feeding block 62 moves to the highest point, the two pins of the capacitor 100 are inserted into the gap 30 respectively. Then, when the rotating arm 71 rotates again, it will push the protrusion 661 to move laterally, causing the feeding block 62 to move laterally. The pressure plate 64 is pushed by the stop block 621, and the spring 642 is compressed.

[0037] Furthermore, limit plates 65 are provided on both sides of the feeding block 62, and a movable shaft 651 is vertically fixed on the limit plate 65. The movable shaft 651 moves through the feeding block 62, and a spring 652 is sleeved on the movable shaft 651. Limit blocks 612 are provided on both sides of the upper end of the feeding rack 61.

[0038] It should be noted that when the feeding block 62 moves to the highest point, the limiting block 612 presses down the limiting plate 65, so that the bottom of the limiting plate 65 contacts the two wings of the feeding block 62. In this state, the upper surface of the limiting plate 65 is flush with or lower than the upper surface of the feeding block 62, and the spring 652 is compressed.

[0039] Furthermore, a flexible block 622 is provided on the front side of the upper end of the feeding block 62, and the flexible block 622 is made of elastic material.

[0040] It should be noted that the flexible block 622 can be made of rubber. The purpose of setting the flexible block 622 is that when the tension spring 63 pulls the feeding block 62 to reset, the flexible block 622 can elastically deform to avoid the capacitor 100.

[0041] Working principle: (1) The capacitor 100 is conveyed into the feed trough 611 by the conveyor belt 9 and is conveyed from the front end of the feed trough 611 to the upper end of the loading block 62. At this time, the stop block 621 and the flexible block 622 respectively block the two ends of the capacitor 100, and the two limiting plates 65 respectively block the two sides of the capacitor 100.

[0042] (2) Motor 2 7 drives the rotating arm 71 to rotate clockwise. The rotating arm 71 first pushes the top rod 66 to move upward. The top rod 66 drives the loading block 62 to move upward. The tension spring 63 is stretched. When the loading block 62 moves to the highest point, the limiting block 612 presses down the limiting plate 65, so that the bottom of the limiting plate 65 contacts the two wings of the loading block 62. The spring 2 652 is compressed. At this time, the two pins of the capacitor 100 are inserted into the two gaps 30 respectively.

[0043] (3) When the rotating arm 71 rotates again, it will push the protrusion 661 to make the loading block 62 move laterally, the pressure plate 64 is pushed by the stop block 621, the spring 642 is compressed, and the pin moves forward from the gap 30 between the outer flexible ring 311 and the inner flexible ring 321 and is squeezed and clamped.

[0044] (4) When the rotating arm 71 is disengaged from the feed trough 611, under the action of the tension spring 63, the feeding block 62 moves downward and resets to press on the pressure plate 64. Under the action of the first spring 642, the pressure plate 64 also resets. Under the action of the second spring 652, the limiting plate 65 also resets.

[0045] Repeating the above steps allows the capacitor 100 to be sequentially clamped onto the annular clamp 3. The annular clamp 3 then transports the capacitor 100. When it reaches the position of the finger-clamping cylinder 5, the cylinder 5 drives two clamping plates 51 to hold the two leads of the capacitor 100, with each lead contacting one of the two electrode plates. A high-frequency dv / dt test is then performed on the capacitor 100 using a voltage change rate tester.

[0046] The above technical solution uses an annular clamp 3 composed of an outer ring 31, an outer flexible ring 311, an inner ring 32, and an inner flexible ring 321. The expansion device 4 expands the outer flexible ring 311 and the inner flexible ring 321 to form a gap 30. By inserting the pins of the capacitor 100 into the gap 30 and moving it forward a short distance, the capacitor 100 can be clamped by the annular clamp 3. The feeding component 6 and the motor 7 are used to feed the capacitor 100, thus eliminating the need for pneumatic circuits such as cylinders and saving costs.

[0047] Since the outer ring 31 and inner ring 32 are a ring-shaped conveying device, the leads of the capacitor 100 will be squeezed and bent when the capacitor 100 moves horizontally. In order to avoid affecting the test (such as poor contact), a limit plate 65 that can be extended vertically is provided. When the capacitor 100 moves into the uppermost lead insertion gap 30 and needs to move horizontally, the limit block 612 presses down the limit plate 65 to release the limit plate 65 from the capacitor 100, so that the capacitor 100 can be appropriately offset when it moves forward to avoid the lead bending.

[0048] Refer to the instruction manual appendix Figure 10 The test method using the above-mentioned test apparatus for a high-frequency, high-current film capacitor includes the following steps: Step 1: The rotating drive assembly 2 drives the ring clamp 3 to rotate, and the capacitor 100 is conveyed from the feed trough 611 to the loading block 62 by the conveyor belt 9; Step 2: Insert the leads of capacitor 100 into gap 30 using the power assembly and move the loading block 62 laterally so that the leads of capacitor 100 are clamped by the outer flexible ring 311 and the inner flexible ring 321. Step 3: The ring clamp 3 delivers the capacitor 100 to the position of the finger clamping cylinder 5. The finger clamping cylinder 5 drives the two clamping plates 51 to clamp the pins of the capacitor 100. A voltage change rate tester is used to test the capacitor 100.

[0049] Below another set of expanders 4, a discharge assembly 8 is set. The discharge assembly 8 includes a motor 81 and a discharge trough 82. The output shaft at the upper end of the motor 81 is fixed to the discharge trough 82. The discharge trough 82 is set at an inclination. When the capacitor 100 is conveyed to the position of the expander 4, and when the two pins of the capacitor 100 are located at the positions of the two gaps 30, the capacitor 100 can automatically fall and slide down from the discharge trough 82. The discharge trough 82 is rotated by the motor 81, which can make the capacitor 100 slide to different positions to facilitate the sorting of qualified and unqualified products.

[0050] In conclusion, the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A testing device for high-frequency, high-current thin-film capacitors, characterized in that: Includes a workbench (1), on which a bracket (11) is mounted, on which a rotary drive assembly (2) is mounted, and at the output end of the rotary drive assembly (2) a ring clamp (3). The ring clamp (3) includes an outer ring (31) and an inner ring (32) disposed inside the outer ring (31). An outer flexible ring (311) and an inner flexible ring (321) are disposed between the outer ring (31) and the inner ring (32). The outer flexible ring (311) is fixed on the inner side wall of the outer ring (31), and the inner flexible ring (321) is fixed on the outer side wall of the inner ring (32). The outer ring (31), the inner ring (32), the outer flexible ring (311) and the inner flexible ring (321) are coaxially arranged. The outer flexible ring (311) and the inner flexible ring (321) are used to clamp the pins of the capacitor (100). The testing apparatus also includes a voltage change rate tester, which is used to test the capacitor (100).

2. The testing device for a high-frequency, high-current thin-film capacitor according to claim 1, characterized in that: A finger-clamping cylinder (5) is installed on the bracket (11). A clamping plate (51) is installed on each of the two clamping fingers of the finger-clamping cylinder (5). Electrode plates are installed at both ends of the clamping plate (51). The voltage change rate tester is electrically connected to the two electrode plates. When the finger-clamping cylinder (5) drives the two clamping plates (51) to clamp the pins of the capacitor (100), the two electrode plates contact the two pins respectively.

3. The testing device for a high-frequency, high-current thin-film capacitor according to claim 2, characterized in that: The rotary drive assembly (2) includes a mounting bracket (21) mounted on a support (11), a rotating frame (22) rotatably connected to the mounting bracket (21), and a motor (23) for driving the rotating frame (22) to rotate is mounted on the mounting bracket (21). The outer ring (31) and the inner ring (32) are both fixedly installed with the rotating frame (22).

4. The testing device for a high-frequency, high-current thin-film capacitor according to claim 3, characterized in that: The ring clamp (3) is provided with two sets of expanders (4). The expander (4) includes a mounting plate (41) at the bottom of the outer ring (31). A set of rotating shaft one (42) and a set of rotating shaft two (43) are installed at both ends of the mounting plate (41). The rotating shaft one (42) and the rotating shaft two (43) are both located between the outer flexible ring (311) and the inner flexible ring (321). The rotating shaft one (42) squeezes the outer flexible ring (311), and the rotating shaft two (43) squeezes the inner flexible ring (321), thereby forming a gap (30) between the rotating shaft one (42) and the rotating shaft two (43).

5. The testing device for a high-frequency, high-current thin-film capacitor according to claim 4, characterized in that: A feeding assembly (6) is provided below one of the expansion devices (4). The feeding assembly (6) includes a feeding rack (61). A feeding groove (611) is provided on one side of the feeding rack (61), and a feeding block (62) is provided on the other side. The capacitor (100) is conveyed from the feeding groove (611) to the feeding block (62). A tension spring (63) is fixedly connected between the bottom of the feeding block (62) and the bottom of the feeding rack (61). A power assembly is provided on one side of the feeding assembly (6). The power assembly is used to drive the feeding block (62) to move the capacitor (100) upward and laterally.

6. The testing device for a high-frequency, high-current thin-film capacitor according to claim 5, characterized in that: The rear end of the feeding block (62) is provided with a stop block (621). The upper and lower ends of the stop block (621) extend to the upper and lower sides of the feeding block (62) respectively. The bottom of the feeding block (62) is provided with a pressure plate (64). Both ends of the pressure plate (64) are equipped with a movable shaft (641). The movable shaft (641) moves laterally through the feeding frame (61). A spring (642) is sleeved on the movable shaft (641). The pressure plate (64) presses on the stop block (621).

7. The testing device for a high-frequency, high-current thin-film capacitor according to claim 6, characterized in that: The power assembly includes a second motor (7) and a rotating arm (71) installed at the output end of the second motor (7). A top rod (66) is installed at the front end of the feeding block (62), and a protrusion (661) is located at the lower front end of the top rod (66).

8. The testing device for a high-frequency, high-current thin-film capacitor according to claim 7, characterized in that: Limiting plates (65) are provided on both sides of the feeding block (62). A movable shaft (651) is vertically fixed on the limiting plate (65). The movable shaft (651) moves through the feeding block (62). A spring (652) is sleeved on the movable shaft (651). Limiting blocks (612) are provided on both sides of the upper end of the feeding rack (61).

9. The testing device for a high-frequency, high-current thin-film capacitor according to claim 8, characterized in that: A flexible block (622) is provided on the front side of the upper end of the feeding block (62), and the flexible block (622) is made of elastic material.

10. A test method using the test apparatus for a high-frequency, high-current thin-film capacitor as described in claim 9, characterized in that, Includes the following steps: Step 1: The rotating drive assembly (2) drives the ring clamp (3) to rotate, and the capacitor (100) is transported from the feed trough (611) to the loading block (62) by the conveyor belt (9); Step 2: Insert the lead of capacitor (100) into the gap (30) by means of the power assembly and move the loading block (62) laterally so that the lead of capacitor (100) is clamped by the outer flexible ring (311) and the inner flexible ring (321); Step 3: The ring clamp (3) delivers the capacitor (100) to the position of the finger clamp cylinder (5). The finger clamp cylinder (5) drives the two clamping plates (51) to clamp the pins of the capacitor (100). The voltage change rate tester is used to test the capacitor (100).

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