Twin-trawling test circuit and twin-trawling test platform of power module

Abstract

The invention discloses a twin trawling test circuit and a twin trawling test platform of a power module. The twin trawling test circuit comprises a power supply module, a filtering module, an accompanying test power module, a tested power module, a reactor and a control module, the power supply module is electrically connected with the input end of the filtering module; the output end of the filtering module is electrically connected with the test-accompanying power module and the tested power module. The test accompanying power module and the tested power module are electrically connected through a reactor; the control module is electrically connected with the control end of the test accompanying power module and the control end of the tested power module. By adopting the technical scheme, high-frequency harmonics on the power supply side can be effectively suppressed, and the high-frequency harmonics are prevented from flowing into the power supply module to influence the service life and the power supply quality of the power supply module; meanwhile, the influence of the test current on the filtering module can be reduced, the weight and the size of the filtering module are reduced, the active loss is reduced, and the problem that the filtering module is large in size or the device is seriously heated due to overlarge circulating current is avoided.

Description

Technical Field

[0001] This invention relates to the field of power module testing technology, and in particular to a power module pull-out test circuit and pull-out test platform. Background Technology

[0002] To more realistically simulate the actual operating conditions of power modules, test equipment typically uses power modules to build both the test circuit topology and the circuit topology under test. The amplitude and phase of the output voltage of both are controlled to achieve a reverse connection, and the dynamic characteristics of the power module under test are observed during the process. However, existing reverse connection test schemes often neglect the impact of harmonic interference on the power supply side, which can cause high-frequency harmonics generated by the power module during operation to flow into the power supply. Over long-term operation, this will affect the lifespan and power quality of the power supply.

[0003] In existing technical solutions, although filter modules are added to the test circuit topology and the circuit under test topology to suppress harmonic interference, the current flowing through the test circuit topology and the circuit under test topology is large for high-power modules. This results in the filter modules in the test circuit topology and the circuit under test topology requiring high power. The filter modules need to be larger in size when designed, and the filter modules generate a lot of heat, which will greatly increase the active power loss of the test circuit.

[0004] Therefore, how to effectively suppress high-frequency harmonics on the power supply side of the test platform, reduce the impact of test current on the filter module, and avoid excessive active power loss in the system has become an urgent technical problem to be solved. Summary of the Invention

[0005] This invention provides a power module parallel test circuit and parallel test platform, which can effectively suppress high-frequency harmonics on the power supply side, prevent high-frequency harmonics from flowing into the power module and affecting the lifespan and power supply quality of the power module; at the same time, it can also reduce the impact of test current on the filter module, reduce the weight and volume of the filter module, reduce active power loss, and avoid the problem of excessive circulating current causing the filter module to be large or the device to overheat.

[0006] According to one aspect of the present invention, a power module counter-test circuit is provided, comprising: a power supply module, a filter module, a power module under test, a power module under test, a reactor, and a control module;

[0007] The power supply module is electrically connected to the input terminal of the filter module; the output terminal of the filter module is electrically connected to the power module under test and the power module under test respectively; the power module under test and the power module under test are electrically connected through the reactor; the control module is electrically connected to the control terminal of the power module under test and the control terminal of the power module under test respectively.

[0008] Optionally, it also includes: the energy storage module under test and the energy storage module being tested;

[0009] The power module for testing is electrically connected to the output terminal of the filter module through the energy storage module for testing.

[0010] The power module under test is electrically connected to the output terminal of the filter module through the energy storage module under test.

[0011] Optionally, the accompanying energy storage module includes an accompanying bus capacitor;

[0012] The energy storage module under test includes the bus capacitor under test.

[0013] Optionally, the filtering module includes an EMI filter circuit.

[0014] Optionally, both the power module under test and the power module under test include an inverter; wherein the inverter includes a three-phase full-bridge circuit, and the three-phase full-bridge circuit includes multiple switching devices and multiple diodes.

[0015] Optionally, the power module includes a DC power supply;

[0016] The control module is used to control the inverter in the power module under test to be in the inverter state, and at the same time control the inverter in the power module under test to be in the rectification state, so as to test the dynamic characteristics of the diode in the power module under test.

[0017] Optionally, the power module includes a DC power supply;

[0018] The control module is used to control the inverter in the power module under test to be in the inverter state, and at the same time control the inverter in the power module under test to be in the rectification state, so as to test the dynamic characteristics of the switching device in the power module under test.

[0019] Optionally, the DC power supply includes an AC / DC rectifier circuit;

[0020] The input terminal of the filter module is electrically connected to the DC terminal of the AC / DC rectifier circuit, and the AC terminal of the AC / DC rectifier circuit is used to connect to the power grid.

[0021] According to another aspect of the present invention, a power module drag test platform is provided, including the power module drag test circuit described in any of the above claims.

[0022] The technical solution of this invention, by setting a filter module between the power supply module, the power module under test, and the power module under test, is beneficial to improving the lifespan and power quality of the power supply module. It can effectively prevent high-frequency harmonics generated during the operation of the power module under test and the power module under test from flowing into the power supply module, thus affecting the lifespan and power quality of the power supply module. At the same time, the filter module is set between the connection node of the power module under test and the power supply module, so that the circulating current between the power module under test and the power module under test does not pass through the filter module. This can avoid the problem of excessive circulating current causing the filter module to be large or the device to overheat. It can also reduce the active power loss in the test circuit.

[0023] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a circuit topology for a power module's drag-and-drop test circuit in related technologies;

[0026] Figure 2 This is another circuit topology for a power module's drag-and-drop test circuit in related technologies;

[0027] Figure 3 This is a circuit topology for a power module pull-out test circuit provided in an embodiment of the present invention;

[0028] Figure 4 This is another circuit topology for a power module's drag-and-drop test circuit provided in an embodiment of the present invention;

[0029] Figure 5 This is a circuit topology for an EMI filter circuit provided in an embodiment of the present invention. Detailed Implementation

[0030] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0031] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0032] Figure 1 This is a circuit topology for a power module's drag-and-drop test circuit in related technologies, such as... Figure 1 As shown, the drag test circuit includes a power supply module 10, a power supply module 21 under test, a power supply module 22 under test, a reactor 23, and a control module 30. No filter module is set in the drag test circuit. The power supply module 10 is directly electrically connected to the power supply module 21 under test and the power supply module 22 under test. When the power supply module 21 under test and the power supply module 22 under test are running, the high-frequency harmonics generated will flow into the power supply module 10. Under long-term operation, this will affect the lifespan and power supply quality of the power supply module 10.

[0033] In addition, some drag test circuits have incorporated filtering modules. Figure 2 This is another circuit topology for a power module's parallel test circuit in related technologies, such as... Figure 2 As shown, a test filter module 01 and a test filter module 02 are added to the power supply module 10 test circuit. The test filter module 01 is electrically connected to the test power module 21, and the test filter module 02 is electrically connected to the test power module 22. Although this scheme can suppress harmonic interference to the power supply module 10, all the current in the test power module 21 will flow through the test filter module 01, and all the current in the test power module 22 will flow through the test filter module 02. For some high-power modules, the current can reach hundreds of amperes in the test circuit, which requires a large size when designing the test filter module 01 and the test filter module 02, and the devices generate a lot of heat, which greatly increases the active power loss.

[0034] To address the aforementioned technical problems, embodiments of the present invention provide a power module counter-test circuit, comprising: a power supply module, a filter module, a power module under test, a power module under test, a reactor, and a control module; the input terminals of the power supply module and the filter module are electrically connected; the output terminal of the filter module is electrically connected to both the power module under test and the power module under test; the power module under test and the power module under test are electrically connected via the reactor; and the control module is electrically connected to both the control terminals of the power module under test and the power module under test.

[0035] By adopting the above technical solution, the high-frequency harmonics generated during the operation of the power module 21 under test and the power module under test 22 can be effectively prevented from flowing into the power module 10, affecting the lifespan and power supply quality of the power module 10. At the same time, the circulating current between the power module 21 under test and the power module under test 22 can be prevented from passing through the filter module 40, which can avoid the problem of excessive circulating current causing the filter module 40 to be large or the device to overheat. It can also reduce the active power loss in the test circuit.

[0036] The above is the core idea of ​​this invention. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention. The technical solutions in the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings.

[0037] It should be noted that the implementation methods provided in the embodiments of the present invention can be combined with each other without contradiction.

[0038] Figure 3 This is a circuit topology for a power module's drag-and-drop test circuit provided in an embodiment of the present invention, such as... Figure 3 As shown, the test circuit includes a power supply module 10, a filter module 40, a power module under test 21, a power module under test 22, a reactor 23, and a control module 30. The power supply module 10 is electrically connected to the input terminal of the filter module 40; the output terminal of the filter module 40 is electrically connected to the power module under test 21 and the power module under test 22, respectively; the power module under test 21 and the power module under test 22 are electrically connected through the reactor 23; the control module 30 is electrically connected to the control terminals of the power module under test 21 and the power module under test 22, respectively.

[0039] The power supply module 10 provides power input to the power module under test 21 and the power module under test 22, including but not limited to voltage conversion circuits, power output control circuits, and operating condition simulation circuits. The filter module 40 filters harmonic interference generated by the power module under test 21 and the power module under test 22, preventing harmonic interference from flowing into the power supply module 10 and affecting its lifespan and power quality. The filter module 40 includes, but is not limited to, electromagnetic interference (EMI) filter circuits, harmonic filters, and voltage change rate filters.

[0040] Both the power module under test (PBT) 21 and the power module under test (DUT) 22 include semiconductor power circuits. Semiconductor power devices, such as insulated-gate bipolar transistors (IGBTs) and metal-oxide-semiconductor field-effect transistors (MOSFETs), can be used as switching devices to efficiently convert, control, and regulate electrical energy. In one optional embodiment, the PBT 21 and the DUT 22 have the same circuit structure; in another optional embodiment, the PBT 21 and the DUT 22 operate in different states during a reverse drag test. The reactor 23 includes an inductor used to control the magnitude and phase of the current.

[0041] The control module 30 is used to control the operating state of the power module under test 21 and the power module under test 22. The control module 30 includes, but is not limited to, control devices such as microcontroller units (MCUs), microprocessor units (MPUs), and central processing units (CPUs). In an optional embodiment, the control module 30 can also communicate with a host computer (not shown in the figure). The host computer can be, for example, a human-computer interaction device, which can be a touch screen, a display screen, or a combination of mouse and keyboard. This application embodiment does not limit the scope of the human-computer interaction device.

[0042] For example, the operating states of the power module under test (PBT) 21 and the power module under test (DUT) 22 can be controlled. For instance, the voltage amplitude and phase of the output voltages of the PBT and DUT 22 can be controlled to achieve a reverse connection. Simultaneously, dynamic data from the DUT 22 can be collected, which can be used to test its dynamic characteristics. The PBT and DUT 22 in the reverse connection test circuit can form a closed loop, and a circulating current can be formed between them. In this case, the circulating current path mainly contains reactive power, and the power module 10 primarily needs to compensate for the resistive losses in the circuit, thus reducing the capacity requirements of the power module 10.

[0043] The input terminal of the filter module 40 is connected to the power supply module 10 at one point, and the output terminal of the filter module 40 is simultaneously electrically connected to the power module under test 21 and the power module under test 22. This effectively prevents high-frequency harmonics generated during the operation of the power module under test 21 and the power module under test 22 from flowing into the power supply module 10, affecting the lifespan and power supply quality of the power supply module 10. At the same time, the filter module 40 is not in the circulating current path of the power module under test 21 and the power module under test 22. The circulating current between the power module under test 21 and the power module under test 22 does not pass through the filter module 40, which avoids the problem of excessive circulating current causing the filter module 40 to be large or the device to overheat. It can also reduce the active power loss in the test circuit.

[0044] In this embodiment of the invention, by setting a filter module 40 between the power supply module 10, the power module under test 21, and the power module under test 22, it is beneficial to improve the lifespan and power supply quality of the power supply module 10. It can effectively prevent high-frequency harmonics generated during the operation of the power module under test 21 and the power module under test 22 from flowing into the power supply module 10 and affecting the lifespan and power supply quality of the power supply module 10. At the same time, the filter module 40 is set between the connection node of the power module under test 21 and the power module under test 22 and the power supply module 10, so that the circulating current between the power module under test 21 and the power module under test 22 does not pass through the filter module 40. This can avoid the problem of excessive circulating current causing the filter module 40 to be large or the device to overheat. It can also reduce the active power loss in the test circuit.

[0045] Optional, Figure 4 This is another circuit topology for a power module's parallel test circuit provided in an embodiment of the present invention, such as... Figure 4 As shown, the test circuit also includes a test power module 51 and a test power module 52; the test power module 21 is electrically connected to the output terminal of the filter module 40 through the test power module 51; the test power module 22 is electrically connected to the output terminal of the filter module 40 through the test power module 52.

[0046] For example, the energy storage module 51 under test can store the energy output by the power module 10 to provide higher power to the power module 21 under test; the energy storage module 52 under test can store the energy output by the power module 10 to provide higher power to the power module 22 under test. This enables the drag test circuit to provide higher power than the power limit of the power module 10 to the power module 21 under test and / or the power module 22 under test, thereby enabling drag testing of high-power modules.

[0047] In an optional embodiment, the accompanying test energy storage module 51 includes an accompanying test bus capacitor CBUS1; the tested energy storage module 52 includes a tested bus capacitor CBUS2. In one embodiment, the accompanying test bus capacitor CBUS1 and the tested bus capacitor CBUS2 comprise a capacitor bank.

[0048] For example, the power supply module 10 can provide DC signals to the auxiliary bus capacitor CBUS1 and / or the bus capacitor under test CBUS2 through the filter module 40. The auxiliary bus capacitor CBUS1 and the bus capacitor under test CBUS2 have large capacitances, which helps to reduce voltage ripple.

[0049] Optionally, the filtering module 40 includes an EMI filtering circuit 41.

[0050] For example, Figure 5 This is a circuit topology for an EMI filter circuit provided in an embodiment of the present invention, such as... Figure 4 and Figure 5 As shown, the input terminal IN of the EMI filter circuit 41 can be electrically connected to the power supply module 10, and the output terminal OUT of the EMI filter circuit 41 can be electrically connected to the power module under test 21 and the power module under test 22. The EMI filter circuit 41 includes multiple capacitors and inductors. Capacitors C1 and C2 can form a Y capacitor, also known as a common-mode capacitor, to provide low-impedance bypass, discharge common-mode interference, and filter out high-frequency common-mode noise. Inductor L1 is a common-mode inductor used to suppress common-mode interference and low-to-mid-frequency common-mode noise. Capacitor C3 is a differential-mode capacitor used to short-circuit high-frequency differential-mode signals and filter out high-frequency differential-mode noise. Capacitor C4 is a second-stage differential-mode capacitor. Capacitors C5 and C6 can form a second-stage Y capacitor. Inductors L2 and L3 are differential-mode inductors used to suppress differential-mode interference and low-to-mid-frequency differential-mode noise. Capacitors C7 and C8 can form a third-stage Y capacitor. Multiple Y capacitors and multiple differential-mode capacitors can perform multi-stage common-mode noise filtering and differential-mode interference filtering, filtering common-mode noise and differential-mode noise in different frequency bands.

[0051] In one embodiment, the capacitance values ​​and models of the multiple Y capacitors can be different to filter out common-mode noise in different frequency bands; in another embodiment, the capacitance values ​​and models of the multiple differential-mode capacitors can be different to filter out differential-mode noise in different frequency bands.

[0052] Optional, continue to refer to Figure 4 Both the power module under test 21 and the power module under test 22 include inverters; wherein, the inverter includes a three-phase full-bridge circuit, and the three-phase full-bridge circuit includes multiple switching devices and multiple diodes.

[0053] The switching devices include, but are not limited to, controllable switches such as relays, metal-oxide-semiconductor field-effect transistors (MOSFETs), and insulated-gate bipolar transistors (IGBTs). In one embodiment, the switching devices and diodes in the three-phase full-bridge circuit are connected in parallel. In another embodiment, the switching devices in the three-phase full-bridge circuit can be MOSFETs or IGBTs, and the diodes in the three-phase full-bridge circuit can be the body diodes of the MOSFETs or IGBTs.

[0054] For example, the control module 30 can control the switching devices in the power module under test 21 and the power module under test 22. For instance, the control module 30 can control the conduction sequence and duty cycle of the switching devices in the power module under test 21 and the power module under test 22, inverting the DC voltage provided by the power module 10 into a three-phase sinusoidal voltage with adjustable amplitude and phase. By controlling the output voltage and phase difference of each phase in the power module under test 21 and the power module under test 22, the voltage and amplitude across the reactor 23 can be changed, thereby controlling the loop current and enabling the power module under test 21 and / or the power module under test 22 to reach the rated voltage or current, simulating real-world operating conditions. In one embodiment, the test circuit also includes devices such as current sensors and voltage sensors to detect voltage, current, and phase in the loop.

[0055] In an optional embodiment, the power module 10 includes a DC power supply; the control module 30 is used to control the inverter in the power module under test 21 to be in an inverter state, and at the same time control the inverter in the power module under test 22 to be in a rectification state, so as to test the dynamic characteristics of the diode in the power module under test 22.

[0056] In another optional embodiment, the power module 10 includes a DC power supply; the control module 30 is used to control the inverter in the power module under test 22 to be in an inverter state, and at the same time control the inverter in the power module under test 21 to be in a rectification state, so as to test the dynamic characteristics of the switching devices in the power module under test 22.

[0057] Based on the above embodiments, continue to refer to Figure 4The power supply module 10 includes a DC power supply, which includes an AC / DC rectifier circuit 11. The input terminal of the filter module 40 is electrically connected to the DC terminal of the AC / DC rectifier circuit 11, and the AC terminal of the AC / DC rectifier circuit 11 is used to connect to the power grid.

[0058] For example, the power supply grid can be a three-phase AC grid, and the AC / DC rectifier circuit 11 can convert the AC power of the three-phase AC grid into DC power to provide to the power module under test 21 and / or the power module under test 22.

[0059] Based on the same inventive concept, embodiments of the present invention also provide a power module drag-and-drop test platform, which includes the power module drag-and-drop test circuit provided in any embodiment of the present invention. Furthermore, the drag-and-drop test platform may also include a test base, probes, clamps, and other devices.

[0060] The power module drag test platform provided in the embodiments of the present invention includes the power module drag test circuit provided in any embodiment of the present invention, and has the corresponding technical features and beneficial effects of the power module drag test circuit. For the contents not described in detail in the embodiments of the power module drag test platform, please refer to the description of the power module drag test circuit above, and will not be repeated here.

[0061] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. A power module reverse-drive test circuit, characterized in that, include: Power supply module, filter module, power supply module under test, power supply module under test, reactor and control module; The power supply module is electrically connected to the input terminal of the filter module; the output terminal of the filter module is electrically connected to the power module under test and the power module under test respectively; the power module under test and the power module under test are electrically connected through the reactor; the control module is electrically connected to the control terminal of the power module under test and the control terminal of the power module under test respectively.

2. The power module's reverse-drive test circuit according to claim 1, characterized in that, Also includes: The energy storage module under test and the energy storage module being tested; The power module for testing is electrically connected to the output terminal of the filter module through the energy storage module for testing. The power module under test is electrically connected to the output terminal of the filter module through the energy storage module under test.

3. The power module's reverse-drive test circuit according to claim 2, characterized in that, The accompanying energy storage module includes an accompanying bus capacitor. The energy storage module under test includes the bus capacitor under test.

4. The power module's reverse-drive test circuit according to claim 1, characterized in that, The filtering module includes an EMI filtering circuit.

5. The power module's reverse-drive test circuit according to claim 1, characterized in that, Both the power module under test and the power module under test include an inverter; wherein, the inverter includes a three-phase full-bridge circuit, and the three-phase full-bridge circuit includes multiple switching devices and multiple diodes.

6. The power module's reverse-drive test circuit according to claim 5, characterized in that, The power module includes a DC power supply; The control module is used to control the inverter in the power module under test to be in the inverter state, and at the same time control the inverter in the power module under test to be in the rectification state, so as to test the dynamic characteristics of the diode in the power module under test.

7. The power module's reverse-drive test circuit according to claim 5, characterized in that, The power module includes a DC power supply; The control module is used to control the inverter in the power module under test to be in the inverter state, and at the same time control the inverter in the power module under test to be in the rectification state, so as to test the dynamic characteristics of the switching device in the power module under test.

8. The power module's reverse-drive test circuit according to claim 6 or 7, characterized in that, The DC power supply includes an AC / DC rectifier circuit. The input terminal of the filter module is electrically connected to the DC terminal of the AC / DC rectifier circuit, and the AC terminal of the AC / DC rectifier circuit is used to connect to the power grid.

9. A power module drag-and-drop test platform, characterized in that, Includes the power module's drag test circuit as described in claims 1-8.

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