High-power inverter power supply detection method, device testing apparatus, device, storage medium and product

Abstract

The application discloses a kind of high-power inverter power detection method, equipment testing device, equipment, storage medium and product, it is related to electronic equipment test technical field, the method comprises: obtaining the test configuration information of high-power inverter power;Determine the function module to be measured in high-power inverter power based on test configuration information, and generate corresponding test scheme according to the function module to be measured;According to test scheme, test excitation is applied to the function module to be measured, and the test feedback data of the function module to be measured is collected;Test feedback data is compared with preset module data, and the pass condition of the module to be tested is determined according to the comparison result.Compared with the direct machine test of prior art, the application is independently excited and data comparison to the function module to be measured, so as to realize safe, efficient and accurate fault positioning and pass determination.

Description

Technical Field

[0001] This application relates to the field of electronic equipment testing technology, and in particular to a high-power inverter power supply testing method, equipment testing device, equipment, storage medium and product. Background Technology

[0002] High-power inverters are key power electronic devices that convert direct current (DC) into high-power alternating current (AC), widely used in critical fields such as industrial energy storage, new energy power generation, and electric vehicle charging. Internally, they typically consist of multiple functional circuit boards, including a main control unit, power conversion module, auxiliary power supply, sampling circuit, filtering circuit, and communication module, making the system complex and highly integrated. During production and assembly, any latent fault on any circuit board can lead to malfunctions in the entire unit, or even serious accidents such as short circuits and burnouts under high voltage and high current, causing significant economic losses and threatening the personal safety of operators. Therefore, rigorous and reliable functional testing of each circuit board during production and assembly is an indispensable step to ensure the quality and safety of the final product.

[0003] Currently, the industry commonly uses a manual replacement comparison method based on known good complete machines for testing such power modules. The typical operating procedure is as follows: First, a functional prototype is set up as a reference system. Then, the circuit board to be tested (such as a new auxiliary power board) replaces the corresponding board in the prototype. Subsequently, the entire machine is powered on, and the operator uses external instruments such as oscilloscopes, multimeters, and power meters to manually observe and determine whether the working status of the board in the system is normal.

[0004] Therefore, how to perform safety function testing on the modules under test within a high-power inverter power supply is an urgent problem to be solved. Summary of the Invention

[0005] The main objective of this application is to provide a method, testing device, equipment, storage medium, and product for testing high-power inverter power supplies, aiming to solve the technical problem of how to achieve safety function testing of the module under test in a high-power inverter power supply.

[0006] To achieve the above objectives, this application proposes a method for testing the power supply of a high-power inverter. The method is applied to a device testing apparatus connected to a high-power inverter power supply. The method includes:

[0007] Obtain the test configuration information of the high-power inverter power supply;

[0008] Based on the test configuration information, the functional module under test in the high-power inverter power supply is determined, and a corresponding test plan is generated according to the functional module under test.

[0009] According to the test plan, test stimuli are applied to the functional module under test, and test feedback data of the functional module under test is collected.

[0010] The test feedback data is compared with the preset module data, and the pass / fail status of the module to be tested is determined based on the comparison results.

[0011] In one embodiment, the step of generating a corresponding test plan based on the functional module under test includes:

[0012] Identify the type attributes of the functional module under test;

[0013] The corresponding test logic and security parameters are determined based on the type attributes.

[0014] The test plan is generated based on the test logic and the security parameters.

[0015] In one embodiment, the step of determining the corresponding test logic and security parameters based on the type attribute includes:

[0016] The initial test sequence and initial security threshold are obtained based on the type attribute;

[0017] The initial test sequence and the initial security threshold are configured based on a preset configuration strategy to determine the test logic and the security parameters.

[0018] In one embodiment, the step of applying test stimuli to the functional module under test according to the test plan and collecting test feedback data of the functional module under test includes:

[0019] According to the test sequence in the test plan, apply the corresponding test stimulus to the functional module under test in accordance with the preset steps;

[0020] After the test stimulus is applied, test feedback data of the functional module under test is collected.

[0021] In one embodiment, after the step of determining the pass / fail status of the module under test based on the comparison results, the method further includes:

[0022] Generate a test report containing the identification information of the functional module under test, the test time, the test feedback data, and the pass / fail status, and store the test report.

[0023] In one embodiment, before the step of collecting test feedback data from the functional module under test, the method further includes:

[0024] Obtain the initial state feedback of the functional module under test under the test stimulus;

[0025] Determine whether the initial state feedback meets the preset response conditions;

[0026] If so, then the step of collecting test feedback data of the functional module under test is performed.

[0027] Furthermore, to achieve the above objectives, this application also proposes a device testing apparatus, the apparatus comprising:

[0028] The acquisition module is used to acquire the test configuration information of the high-power inverter power supply;

[0029] The generation module is used to determine the functional module under test in the high-power inverter power supply based on the test configuration information, and generate a corresponding test plan according to the functional module under test.

[0030] The data acquisition module is used to apply test stimuli to the functional module under test according to the test plan, and to acquire test feedback data of the functional module under test.

[0031] The determination module is used to compare the test feedback data with preset module data and determine the pass / fail status of the module to be tested based on the comparison results.

[0032] In addition, to achieve the above objectives, this application also proposes a high-power inverter power supply detection device, the device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, the computer program being configured to implement the steps of the high-power inverter power supply detection method described above.

[0033] In addition, to achieve the above objectives, this application also proposes a storage medium, which is a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, it implements the steps of the high-power inverter power supply detection method described above.

[0034] In addition, to achieve the above objectives, this application also provides a computer program product, which includes a computer program that, when executed by a processor, implements the steps of the high-power inverter power supply detection method described above.

[0035] This application provides a method for testing a high-power inverter power supply. The method includes: acquiring test configuration information of the high-power inverter power supply; determining the functional module under test (DUT) within the high-power inverter power supply based on the test configuration information, and generating a corresponding test plan according to the DUT; applying test stimuli to the DUT according to the test plan, and collecting test feedback data of the DUT; comparing the test feedback data with preset module data, and determining the pass / fail status of the DUT based on the comparison result.

[0036] This application first obtains the test configuration information of a high-power inverter power supply, then determines the functional module under test (DUT) within the high-power inverter power supply based on the test configuration information, generates a corresponding test plan for the DUT, applies test stimuli to the DUT according to the test plan, collects test feedback data from the DUT, and finally compares the test feedback data with preset module data to determine the pass / fail status of the DUT based on the comparison results. Compared with existing direct whole-machine testing, this application achieves safe, efficient, and accurate fault location and pass / fail determination by independently automating the stimulation and data comparison of the DUT. Attached Figure Description

[0037] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0038] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 This is a flowchart illustrating Embodiment 1 of the high-power inverter power supply detection method of this application;

[0040] Figure 2 This is a flowchart illustrating Embodiment 2 of the high-power inverter power supply detection method of this application.

[0041] Figure 3 This is a flowchart illustrating Embodiment 3 of the high-power inverter power supply detection method of this application;

[0042] Figure 4 This is a schematic diagram of the module structure of the equipment testing device according to an embodiment of this application;

[0043] Figure 5 This is a schematic diagram of the equipment structure of the hardware operating environment involved in the high-power inverter power supply detection method in this application embodiment.

[0044] The purpose, features, and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0045] It should be understood that the specific embodiments described herein are merely illustrative of the technical solutions of this application and are not intended to limit this application.

[0046] To better understand the technical solution of this application, a detailed description will be provided below in conjunction with the accompanying drawings and specific implementation methods.

[0047] The main solution proposed in this application is as follows: A high-power inverter power supply is a key power electronic device that converts direct current (DC) into high-power alternating current (AC), widely used in critical fields such as industrial energy storage, new energy power generation, and electric vehicle charging. Internally, it typically consists of multiple functional circuit boards, including a main control unit, power conversion module, auxiliary power supply, sampling circuit, filtering circuit, and communication module, making the system complex and highly integrated. During the production and assembly process, any latent fault on any circuit board can lead to abnormal operation of the entire unit, or even cause serious accidents such as short circuits and burnouts under high voltage and high current, resulting in significant economic losses and threatening the personal safety of operators. Therefore, rigorous and reliable functional testing of each circuit board during the production and assembly stage is an indispensable step to ensure the quality and safety of the final product.

[0048] Currently, the industry commonly uses a manual replacement comparison method based on known good complete machines for testing such power modules. The typical operating procedure is as follows: First, a functional prototype is set up as a reference system. Then, the circuit board to be tested (such as a new auxiliary power board) replaces the corresponding board in the prototype. Subsequently, the entire machine is powered on, and the operator uses external instruments such as oscilloscopes, multimeters, and power meters to manually observe and determine whether the working status of the board in the system is normal.

[0049] This application first obtains the test configuration information of a high-power inverter power supply, then determines the functional module under test (DUT) within the high-power inverter power supply based on the test configuration information, generates a corresponding test plan for the DUT, applies test stimuli to the DUT according to the test plan, collects test feedback data from the DUT, and finally compares the test feedback data with preset module data to determine the pass / fail status of the DUT based on the comparison results. Compared with existing direct whole-machine testing, this application achieves safe, efficient, and accurate fault location and pass / fail determination by independently automating the stimulation and data comparison of the DUT.

[0050] It should be noted that the execution subject of the following embodiments can be a device testing apparatus, or a computing service device with data processing, network communication, and program execution functions, such as a tablet computer, personal computer, or mobile phone, or a device testing apparatus capable of performing the above functions. This embodiment does not specifically limit this. The following uses a device testing apparatus (hereinafter referred to as the apparatus) as the execution subject to describe this embodiment and the following embodiments.

[0051] Based on this, this application provides a method for detecting the power supply of a high-power inverter, referring to... Figure 1 , Figure 1 This is a flowchart illustrating an embodiment of the high-power inverter power supply detection method of this application.

[0052] In this embodiment, the method is applied to a device testing apparatus connected to a high-power inverter power supply, and the method includes steps S10 to S40:

[0053] Step S10: Obtain the test configuration information of the high-power inverter power supply.

[0054] It should be noted that the aforementioned high-power inverter power supply can be a power electronic device that converts DC power into high-power AC power. This high-power inverter power supply can receive DC input from battery packs, photovoltaic arrays, or other sources, and through complex internal power conversion and control, output AC power that meets specific voltage, frequency, and power quality requirements.

[0055] Understandably, the aforementioned high-power inverter power supply is a system composed of multiple functionally defined and collaboratively operating circuit modules. These modules are coupled to each other via electrical connectors or wires, working together to complete the conversion, control, protection, and monitoring of electrical energy. The key functional modules within the aforementioned high-power inverter power supply that need to be tested mainly include: the main control unit, auxiliary power supply board, main power conversion circuit board, sampling circuit board, filter circuit board, relay circuit board, and external communication board, etc.

[0056] It should also be noted that the above test configuration information can be a set of data used to define and initialize the test process. For example, the unique identifier of the object under test (such as product serial number, model number), the specification of the functional module to be tested (for example, indicating whether the auxiliary power supply board or the main power conversion circuit board needs to be tested this time), the selected specific test items (such as withstand voltage test, ripple test, communication function test), and the environmental parameters required for the test (such as input voltage range, load conditions, and permissible safety thresholds).

[0057] In practical implementation, the acquisition of the aforementioned test configuration information can be achieved in several ways. One common approach is for the operator to manually select or input relevant parameters through the human-machine interface of the host computer software connected to the device. For example, the operator can select the type of the module under test (e.g., auxiliary power board) from a drop-down menu and set the desired input voltage value. The device receives these user instructions and integrates them into the structured test configuration information. Another approach is automated acquisition. For instance, the equipment testing device can automatically identify the model and identity of the tested object by scanning the barcode or QR code on the module under test or the entire device, or by reading the identification chip stored internally. Then, it can retrieve the standard test parameters matching the model from the configuration database pre-installed in the system and automatically generate the aforementioned test configuration information. Through these methods, whether manually specified or automatically identified, the equipment testing device can obtain clear and executable test instructions.

[0058] Step S20: Based on the test configuration information, determine the functional module under test in the high-power inverter power supply, and generate a corresponding test plan according to the functional module under test.

[0059] It should be noted that the aforementioned functional module under test can refer to a circuit board or functional unit that constitutes the power supply of the high-power inverter, possesses independent electrical functions, and can be individually connected to a test system for verification, such as the main control unit, auxiliary power supply board, and main power conversion circuit board. The aforementioned test scheme can be a set of structured test instructions specifically generated for the aforementioned functional module under test. It at least defines the sequence of test steps (test logic), the range of electrical parameters allowed to be applied at each step (safety parameters), and the expected pass / fail criteria. For example, for an auxiliary power supply board, its test scheme would explicitly specify first applying an input of a certain voltage range, then sequentially measuring each output voltage, and determining whether each voltage is stable within the allowable error band.

[0060] In its implementation, after receiving the test configuration information, the device first parses the instructions contained in the test configuration information to clarify the specific object to be tested. For example, if the information indicates testing "Module A," the device determines that the functional module under test is the "auxiliary power supply board" within the power supply. Next, based on the type attribute of the "auxiliary power supply board," the device retrieves a matching basic test template from its built-in rule base or knowledge base. The basic test template contains typical test procedures (test logic) and initial safety thresholds for this type of module. Then, the system adjusts and configures the parameters in the basic template according to the specific requirements (such as specific input voltage values) contained in the test configuration information, ultimately generating a specific test plan that can directly drive the hardware to execute. For example, for the auxiliary power supply board, the generated plan would be detailed as follows: "First, apply 380V DC to the input; second, measure the +5V output, which must be between 4.95V and 5.05V; third, measure the +12V output…". In this way, the transformation from abstract instructions to a specific, operable test plan with built-in safety boundaries is achieved.

[0061] Step S30: Apply test stimuli to the functional module under test according to the test plan, and collect test feedback data of the functional module under test.

[0062] It should be noted that the test stimuli mentioned above can be a series of specific electrical signals or power supplies generated according to the test scheme and applied to the module under test. For example, set DC or AC voltage or current, pulse signals (PWM waves) used to drive power switching transistors, analog quantities input from analog sensors, or message data used to trigger communication, etc.

[0063] It should also be noted that the test feedback data mentioned above can be all measurable electrical responses and status information generated by the functional module under test after receiving the test stimulus, such as the real-time values ​​and ripple of the output voltage and current of the functional module under test, the signal waveforms of key nodes, the reply messages of the digital communication port, the switching status of the relay contacts, etc.

[0064] In its implementation, the aforementioned device follows the timing, amplitude, and safety parameters defined in the test scheme to apply the test stimuli to the functional module under test, which is mounted on a dedicated tooling fixture. For example, when testing an auxiliary power supply board, the device first controls a programmable DC power supply to output DC power, as specified in the scheme, such as 380V, with the current limited to 1A (this reflects the safety parameter constraints), to the input terminals of the auxiliary power supply board. Simultaneously, the device is automatically scheduled to collect the values, fluctuations (ripple), and total input current of the linear output voltages (e.g., +5V, +12V, +15V) of each circuit of the auxiliary power supply board in real time. All these collected raw readings constitute the test feedback data for this test. For more complex modules, such as the main power conversion circuit board, the application of test stimuli is divided into several sub-steps: first, a low-voltage auxiliary power supply and a normal drive signal are applied to check whether the switching transistor drive waveform is normal (at this time, the main power circuit is not connected to high voltage); after confirming that the drive is normal, a restricted low voltage of the main circuit is applied according to the scheme for functional verification.

[0065] Step S40: Compare the test feedback data with the preset module data, and determine the pass / fail status of the module to be tested based on the comparison results.

[0066] It should be noted that the aforementioned preset module data can be a set of standard data or parameter ranges pre-set and stored in the aforementioned device or host computer system for the type of the functional module under test. The aforementioned preset module data defines the precise conditions that the various test feedback data of the functional module under test should meet under normal operating conditions, serving as the "benchmark" for determining whether it is qualified or not. The aforementioned preset module data typically includes, but is not limited to: the rated values ​​of each output voltage / current and their allowable deviation range (e.g., +5V output must be between 4.95V and 5.05V), characteristic parameters of key signal waveforms (e.g., amplitude, frequency, and duty cycle range of the drive pulse), the correct message format of the communication response, and the logical timing and response time of relay operation, etc.

[0067] In the specific implementation, after receiving the aforementioned test feedback data, the system compares the test feedback data item by item with the preset module data corresponding to the currently tested module type (e.g., "Auxiliary Power Board Type A"). The comparison process is based on a pre-programmed judgment algorithm. For example, when testing an auxiliary power board, the system compares the measured +12V output value (e.g., 12.05V) with the range specified in the preset module data (e.g., 11.8V to 12.2V). If the measured value falls entirely within all preset ranges, it is judged as "qualified". If any measured data exceeds its corresponding preset range (e.g., ripple value exceeds the standard or a certain channel has no output), it is judged as "unqualified". The judgment result (qualified / unqualified) and items exceeding the standard (unqualified items) are generated immediately.

[0068] Furthermore, in order to generate corresponding test plans for different functional modules under test, in this embodiment, the step of generating corresponding test plans based on the functional modules under test includes:

[0069] Step S21: Identify the type attributes of the functional module to be tested.

[0070] It should be noted that the aforementioned type attributes can be used as essential category labels to characterize and distinguish the different functional circuit boards inside the high-power inverter power supply. Understandably, these type attributes mainly include: main control unit, auxiliary power board, main power conversion circuit board, sampling circuit board, filtering module, relay module, and external communication board. For example, a circuit board responsible for converting high-voltage input to multiple low-voltage outputs has the type attribute of "auxiliary power board"; while another core power board responsible for DC-AC conversion has the type attribute of "main power conversion circuit board".

[0071] In its implementation, the aforementioned device performs identification based on the received test configuration information. This test configuration information explicitly includes the module type specified by the operator (e.g., "auxiliary power board" selected in the drop-down menu of the host computer software), and the device can directly read this information to complete the identification. Alternatively, when the operator installs the module under test onto a dedicated tooling fixture, which integrates a barcode scanner or RFID reader, it automatically scans the identification code on the module. After receiving this identification code, the device can determine the module model and the aforementioned type attribute corresponding to the identification code by querying its internally stored mapping database (e.g., barcode "PSU-2023-A01" corresponds to "Type A auxiliary power board"). Through this method, the functional essence (i.e., the aforementioned type attribute) of the object under test can be determined unambiguously.

[0072] Step S22: Determine the corresponding test logic and security parameters based on the type attribute.

[0073] It should be noted that the above test logic can be a set of pre-set ordered test steps, judgment conditions, and data acquisition items for verifying the specific functions of the module under test. The above safety parameters can be electrical parameter limits that the module under test and the device must strictly adhere to during the test. For example, for a module with the type attribute of "auxiliary power board", the core of its above test logic is to apply an input voltage and sequentially measure and judge whether the output voltage, current, and ripple of each circuit meet the standards; and its above safety parameters include the upper limit of the input voltage and the maximum allowable input current. For a module with the type attribute of main power conversion circuit board, its above test logic is more complex. The core is to first test the drive signal under no-power conditions, and then test the power circuit under strict current and voltage limiting conditions. Its above safety parameters are even more stringent, including the low voltage value during the drive signal test stage and the extremely low voltage and current upper limit during the main circuit test stage.

[0074] In its implementation, the aforementioned device maintains a test rule base associated with all known attributes of the aforementioned types. When the device identifies the type attribute of the current module (e.g., "main power conversion circuit board"), it queries this rule base. The query result directly relates to two parts: first, a pre-designed standard test procedure for this type of module, i.e., the aforementioned test logic; and second, protective limits set for each critical step of this procedure, i.e., the aforementioned safety parameters. For example, based on the attribute "main power conversion circuit board," the system determines its test logic as follows: Step 1 - Send a drive pulse with a specific duty cycle to the input of the drive circuit; Step 2 - Apply a safety voltage far below the rated value, for example, only 24V, with the current hard-limited to within 0.5A, to the bus circuit. Here, "24V" and "0.5A" are the aforementioned safety parameters retrieved from the rule base for this type attribute in this step.

[0075] Step S23: Generate the test plan based on the test logic and the security parameters.

[0076] In its implementation, after obtaining the aforementioned test logic (step framework) and safety parameters (constraint values), a scheme generation engine is activated. This engine first instantiates each abstract test step in the test logic. For example, in the step of applying input voltage, the engine will, based on the constraints of "input voltage = 380V ± 5V, current limit = 1A" in the safety parameters, concretize it into a control command for a programmable power supply. Next, the engine will combine all the instantiated step commands in the logically defined order into a complete, serializable, executable task list, which is the final test scheme.

[0077] This embodiment first acquires the test configuration information of the high-power inverter power supply, then determines the functional module under test (DUT) within the high-power inverter power supply based on the test configuration information, generates a corresponding test plan based on the DUT, applies test stimuli to the DUT according to the test plan, collects test feedback data from the DUT, and finally compares the test feedback data with preset module data to determine the pass / fail status of the DUT based on the comparison results. Compared with existing direct whole-machine testing, this embodiment achieves safe, efficient, and accurate fault location and pass / fail determination by independently automating the stimulation and data comparison of the DUT functional module.

[0078] Based on the first embodiment of this application, in the second embodiment of this application, the content that is the same as or similar to that in the first embodiment described above can be referred to the above description and will not be repeated hereafter. On this basis, a second embodiment of the high-power inverter power supply detection method of this application is proposed. Please refer to... Figure 2 , Figure 2 This is a flowchart illustrating Embodiment 2 of the high-power inverter power supply testing method of this application. To determine the corresponding test logic and safety parameters based on the aforementioned type attributes, such as… Figure 2 As shown, in this embodiment, the step of determining the corresponding test logic and security parameters based on the type attribute includes:

[0079] Step S201: Obtain the initial test sequence and the initial security threshold based on the type attribute.

[0080] It should be noted that the aforementioned initial test sequence can be a standardized test procedure framework preset for a functional module of a specific type and attribute, without the parameter configuration for this test task. The aforementioned initial safety thresholds can be suggested basic electrical parameter limits associated with each step of the aforementioned initial test sequence for a functional module of a specific type and attribute, serving as preliminary constraints to protect the module and system safety. For example, for a module with the type attribute of "auxiliary power board," its aforementioned initial test sequence is a standard three-step framework: 1. Apply input voltage; 2. Measure all output voltages and ripple; 3. Measure input current. Its aforementioned initial safety thresholds include: the suggested input voltage for the first step is the nominal value (e.g., 380VDC), and the maximum permissible input current is 2A; the reference range for each output voltage in the second step is ±5% of its nominal value. These sequences and thresholds are universal, standardized starting points.

[0081] In its implementation, once the type attribute of the module under test (e.g., "main power conversion circuit board") is identified, a query is immediately initiated against the knowledge base (i.e., within the device). The knowledge base stores standard test templates corresponding to each type attribute. The query result can return two sets of data bound to that type attribute: one is a standardized list of operating steps (the initial test sequence), and the other is the suggested safety parameter values ​​for each step of the sequence (the initial safety threshold). For example, the system queries the knowledge base based on "main power conversion circuit board" and obtains the following initial test sequence: Step A - Apply auxiliary power and check; Step B - Apply drive signal and detect drive waveform; Step C - Apply low-voltage main circuit power under strict constraints for functional verification. Simultaneously, the initial safety thresholds are specified: the amplitude range of the drive signal in Step B; and the main circuit voltage in Step C must not exceed 24V, and the current must not exceed 0.5A. In this way, the system obtains standardized basic components for generating the final test plan.

[0082] Step S202: Configure the initial test sequence and the initial security threshold based on the preset configuration strategy to determine the test logic and the security parameters.

[0083] It should be noted that the aforementioned preset configuration strategies can refer to a set of predefined rules or algorithms used to guide how to fine-tune, fill in, or reconstruct the initial test sequence (step framework) and the initial safety thresholds (basic limits) based on specific test requirements, the specifications of the module under test, or environmental variables. For example, a simple configuration strategy is "if the module specification states that the input voltage range is 300-400VDC, then the test input voltage is set to the nominal value of 380VDC"; another strategy is "if the ambient temperature is higher than 40°C, all current-related safety thresholds are reduced by 10%". By applying these strategies, the static initial data is dynamically configured into the final test logic (a step sequence containing specific parameter values) and the safety parameters (precise limits calibrated by the environment or task) used to control the execution of the aforementioned tests.

[0084] In practice, after obtaining the initial test sequence and initial safety thresholds mentioned above, the set of configuration strategies associated with the current task is invoked. These strategies may be based on explicit instructions in the test configuration information (such as skipping certain non-critical steps if the user specifies "execute quick test"), or on detailed specifications of the module under test read from the database. For example, for a module with the type attribute "main power conversion circuit board," its initial test sequence includes a "low-voltage function verification" step, and the initial safety threshold suggests "voltage < 24V, current < 0.5A." If the configuration strategy detects that the specific model of the module has a rated bus voltage of 800VDC, and the current task is a "factory full inspection," then the strategy may configure the voltage value for this step to a more representative test value, such as 50V (still far below the rated value to ensure safety), and adjust the current limit accordingly, thereby generating the aforementioned safety parameters for final execution.

[0085] Furthermore, in order to obtain the test feedback data of the aforementioned functional module under test, in this embodiment, the step of applying test stimuli to the functional module under test according to the test plan and collecting the test feedback data of the functional module under test includes:

[0086] Step S31: Apply corresponding test stimuli to the functional module under test according to the test sequence in the test plan and the preset steps.

[0087] Step S32: After applying the test stimulus, collect the test feedback data of the functional module under test.

[0088] It should be noted that the aforementioned test sequence can be an ordered list of test steps executed one after another as specified in the aforementioned test plan. The aforementioned preset steps can be each specific operational step in the aforementioned test sequence, such as "applying a DC power supply with a specific voltage" or "sending a set of CAN communication messages." The corresponding test stimulus applied to the aforementioned functional module under test can be a specific physical signal generated and output by the aforementioned device according to the instructions of each of the aforementioned preset steps, such as a precise 5.0V voltage, a set of PWM drive pulses with a frequency of 20kHz, or a specific data command. After applying the aforementioned test stimulus, the test feedback data collected by the aforementioned device can be all measurable instantaneous electrical responses and status information generated by the functional module under test in response to the aforementioned test stimulus.

[0089] In its implementation, the device loads and parses the generated test plan, extracting the test sequence. Then, it executes each of the preset steps in the sequence sequentially. For example, when executing a test plan for a "sampling circuit board," the first preset step might be "applying a 2.5V standard voltage to the voltage sampling channel." The device outputs a 2.5V DC voltage (the test stimulus) to a designated input terminal of the board under test. Immediately afterward, the device triggers data acquisition, synchronously acquiring the output value of the analog-to-digital converter (ADC) of the sampling circuit board (the test feedback data) at a predetermined time after the stimulus is applied. After completing this data acquisition step, the device automatically proceeds to the next preset step in the sequence, such as "applying a 100A analog signal to the current sampling channel," and repeats the stimulus application and data acquisition process. For more complex modules, such as a "main power conversion circuit board," the preset steps in its test sequence may include logical judgments. For example, before executing the step "applying low-voltage main circuit power," it will first check whether the feedback data from the previous "drive signal test" step is normal.

[0090] Based on the first and / or second embodiments of this application, in the third embodiment of this application, the content that is the same as or similar to that in embodiments one and two above can be referred to the above description, and will not be repeated hereafter. Based on this, please refer to... Figure 3 , Figure 3 This is a flowchart illustrating Embodiment 3 of the high-power inverter power supply testing method of this application. To store the test information of the aforementioned functional module under test, such as... Figure 3 As shown, in this embodiment, after the step of determining the pass / fail status of the module to be tested based on the comparison results, the method further includes:

[0091] Step S401: Generate a test report containing the identification information of the functional module under test, the test time, the test feedback data, and the pass / fail status, and store the test report.

[0092] It should be noted that the aforementioned test report can be a structured electronic document or database record automatically generated for each complete test task (for a single functional module under test). It systematically integrates four main categories of key information: 1) Identification information, used to uniquely identify the tested object, which may include the module's serial number, model, batch number, or production code; 2) Test time, i.e., the specific date and time of test execution; 3) Test feedback data, i.e., all raw or processed measurement values, waveform data, and status information collected during this test; 4) Pass / Fail status, i.e., the final judgment automatically given by the system based on the comparison results (such as "pass" or "fail"; if unqualified, it may include specific unqualified items). For example, a test report for a certain "auxiliary power supply board" may include identification information (SN: PSU20230815001), test time (2023-08-15 14:30:25), detailed test feedback data (input voltage 380.1V, +5V output 5.02V / ripple 50mV, +12V output 12.05V / ripple 80mV, etc.), and pass / fail status (pass).

[0093] In practical implementation, during the testing process, all relevant information is collected and cached in real time or in stages: the aforementioned identification information, the aforementioned test time, the aforementioned test feedback data, and the aforementioned pass / fail status are obtained. Once all steps of a test are completed and a final conclusion is reached, the above four types of information are automatically populated and combined to generate a complete test report document (such as PDF, XML, or database record). Subsequently, the report is stored in a designated location. For example, after a test of a "main power conversion circuit board" (identified as PWR-1001) is completed, the system automatically generates a report, recording the waveform screenshots of its drive signal test, the voltage and current curves during low-voltage testing, and determining it as "pass." This report is then stored in the database with the filename "PWR-1001_20230815_143025.pdf," and may also be associated with this "pass" record in the module's production history table.

[0094] Furthermore, to effectively prevent the risk of invalid data, wasted test resources, or equipment damage that may result from severe short circuits, open circuits, or other fatal faults in the aforementioned functional module under test, this embodiment includes the following step before the step of collecting test feedback data from the functional module under test:

[0095] Step S33: Obtain the initial state feedback of the functional module under test under the test stimulus.

[0096] Step S34: Determine whether the initial state feedback meets the preset response conditions.

[0097] Step S35: If yes, then execute the step of collecting test feedback data of the functional module under test.

[0098] It should be noted that the aforementioned initial state feedback can be a key primary signal or parameter that is first observed within a very short time (e.g., milliseconds) after the test stimulus is applied to the module under test, and can reflect the basic operating state of the module. This initial state feedback is usually not complete performance data, but rather indicative information used to determine whether the module is "alive" and in a measurable state. Examples include: whether there is current build-up in the power module input circuit; whether there is a pulse response at the power switch driver; whether the relay makes a clicking sound or changes its contact state; and whether the communication interface provides a response signal. The aforementioned preset response conditions can be rapid judgment criteria set for the initial state feedback to determine whether the basic state of the module is normal. Examples include: whether the input current is within the preset safe build-up range (neither zero nor exceeding the short-circuit current threshold); whether the drive pulse amplitude is greater than the minimum threshold voltage; and whether the relay action time is within a reasonable range.

[0099] In its implementation, the aforementioned device first collects a few key signals that are most relevant to the current test step and are easily and quickly acquired as the initial state feedback. For example, when testing an "auxiliary power supply board," after the system applies a 380V DC voltage (test excitation) to the input terminal, it immediately monitors the current value of the input circuit (initial state feedback). The device determines whether this current value meets the preset response conditions, for example, the current is greater than a minimum value indicating no-load (e.g., 10mA) and less than a maximum safe value indicating no serious short circuit (e.g., 500mA). If this condition is met, the module is determined to be basically powered on normally without catastrophic failure, and the system then initiates subsequent detailed steps to collect test feedback data of the module under test, such as using high-precision instruments to measure the accurate values ​​and ripple of each output voltage. If the conditions are not met (e.g., the current is zero or far exceeds the safe value), the test step is immediately stopped, the fault is recorded (e.g., "no input current" or "input short circuit"), and it is determined to be unqualified, without the need for further unnecessary detailed data collection, thereby improving test safety and efficiency. For the "main power conversion circuit board", its initial state feedback is whether the pulse waveform measured at the gate of the switching transistor after the drive signal is applied exists and the amplitude is normal. Only if this condition is met will the above device allow the next step of the test, "applying low-voltage main circuit power", to be performed.

[0100] It should be noted that the above examples are only for understanding this application and do not constitute a limitation on the power supply detection method for high-power inverters in this application. Any simple modifications based on this technical concept are within the protection scope of this application.

[0101] This application also provides a device testing apparatus; please refer to [reference needed]. Figure 4 The device includes:

[0102] The acquisition module 10 is used to acquire the test configuration information of the high-power inverter power supply;

[0103] The generation module 20 is used to determine the functional module under test in the high-power inverter power supply based on the test configuration information, and generate a corresponding test plan according to the functional module under test.

[0104] The acquisition module 30 is used to apply test stimuli to the functional module under test according to the test plan, and to acquire test feedback data of the functional module under test.

[0105] The determination module 40 is used to compare the test feedback data with preset module data and determine the pass / fail status of the module to be tested based on the comparison result.

[0106] The device testing apparatus provided in this application, employing the high-power inverter power supply detection method described in the above embodiments, can solve the technical problem of how to perform safety function testing on the module under test within a high-power inverter power supply. Compared with the prior art, the beneficial effects of the device testing apparatus provided in this application are the same as those of the high-power inverter power supply detection method provided in the above embodiments, and other technical features in the device testing apparatus are the same as those disclosed in the methods of the above embodiments, and will not be repeated here.

[0107] This application provides a high-power inverter power supply detection device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the high-power inverter power supply detection method in Embodiment 1 above.

[0108] The following is for reference. Figure 5 This document illustrates a structural schematic diagram of a high-power inverter power supply detection device suitable for implementing embodiments of this application. The high-power inverter power supply detection device in embodiments of this application may include, but is not limited to, mobile terminals such as mobile phones, laptops, digital radio receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Description), PMPs (Portable Media Players), and in-vehicle terminals (e.g., in-vehicle navigation terminals), as well as fixed terminals such as digital TVs and desktop computers. Figure 5The high-power inverter power supply detection device shown is merely an example and should not impose any limitations on the functionality and scope of use of the embodiments of this application.

[0109] like Figure 5 As shown, the high-power inverter power detection device may include a processing unit 1001 (e.g., a central processing unit, a graphics processing unit, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 1002 or a program loaded from a storage device 1003 into a random access memory (RAM) 1004. The RAM 1004 also stores various programs and data required for the operation of the high-power inverter power detection device. The processing unit 1001, ROM 1002, and RAM 1004 are interconnected via a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Typically, the following systems can be connected to I / O interface 1006: input devices 1007 including, for example, touchscreens, touchpads, keyboards, mice, image sensors, microphones, accelerometers, gyroscopes, etc.; output devices 1008 including, for example, liquid crystal displays (LCDs), speakers, vibrators, etc.; storage devices 1003 including, for example, magnetic tapes, hard disks, etc.; and communication devices 1009. Communication device 1009 allows the high-power inverter power detection device to communicate wirelessly or wiredly with other devices to exchange data. Although a high-power inverter power detection device with various systems is shown in the figure, it should be understood that it is not required to implement or possess all the systems shown. More or fewer systems can be implemented alternatively.

[0110] Specifically, according to the embodiments disclosed in this application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments disclosed in this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via a communication device, or installed from storage device 1003, or installed from ROM 1002. When the computer program is executed by processing device 1001, it performs the functions defined in the methods of the embodiments disclosed in this application.

[0111] The high-power inverter power supply testing equipment provided in this application, employing the high-power inverter power supply testing method described in the above embodiments, can solve the technical problem of how to perform safety function testing on the module under test within a high-power inverter power supply. Compared with the prior art, the beneficial effects of the high-power inverter power supply testing equipment provided in this application are the same as those of the high-power inverter power supply testing method described in the above embodiments, and other technical features of this high-power inverter power supply testing equipment are the same as those disclosed in the previous embodiment method, and will not be repeated here.

[0112] It should be understood that the various parts disclosed in this application can be implemented using hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples.

[0113] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0114] This application provides a computer-readable storage medium having computer-readable program instructions (i.e., a computer program) stored thereon, which are used to execute the high-power inverter power supply detection method described in the above embodiments.

[0115] The computer-readable storage medium provided in this application may be, for example, a USB flash drive, but is not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: electrical connections having one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, system, or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination thereof.

[0116] The aforementioned computer-readable storage medium may be included in the high-power inverter power supply testing equipment; or it may exist independently and not be assembled into the high-power inverter power supply testing equipment.

[0117] The aforementioned computer-readable storage medium carries one or more programs. When these programs are executed by a high-power inverter power supply testing device, the high-power inverter power supply testing device performs the following actions: acquires test configuration information of the high-power inverter power supply; determines the functional module under test (DUT) within the high-power inverter power supply based on the test configuration information, and generates a corresponding test plan based on the DUT; applies test stimuli to the DUT according to the test plan, and collects test feedback data from the DUT; compares the test feedback data with preset module data, and determines the pass / fail status of the DUT based on the comparison result.

[0118] Computer program code for performing the operations of this application can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, and conventional procedural programming languages ​​such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a Local Area Network (LAN) or a Wide Area Network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0119] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of implementations of systems, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0120] The modules described in the embodiments of this application can be implemented in software or hardware. The names of the modules do not necessarily limit the functionality of the unit itself.

[0121] The readable storage medium provided in this application is a computer-readable storage medium that stores computer-readable program instructions (i.e., a computer program) for executing the above-described high-power inverter power supply detection method, thereby solving the technical problem of how to implement safety function testing of the module under test within a high-power inverter power supply. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in this application are the same as those of the high-power inverter power supply detection method provided in the above embodiments, and will not be repeated here.

[0122] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the high-power inverter power supply detection method described above.

[0123] The computer program product provided in this application can solve the technical problem of power supply detection for high-power inverters. Compared with the prior art, the beneficial effects of the computer program product provided in this application are the same as those of the high-power inverter power supply detection method provided in the above embodiments, and will not be repeated here.

[0124] The above description is only a part of the embodiments of this application and does not limit the patent scope of this application. All equivalent structural transformations made under the technical concept of this application and using the contents of the specification and drawings of this application, or direct / indirect applications in other related technical fields, are included in the patent protection scope of this application.

Claims

1. A method for detecting the power supply of a high-power inverter, characterized in that, The method is applied to a device testing apparatus connected to a high-power inverter power supply, and the method includes: Obtain the test configuration information of the high-power inverter power supply; Based on the test configuration information, the functional module under test in the high-power inverter power supply is determined, and a corresponding test plan is generated according to the functional module under test. According to the test plan, test stimuli are applied to the functional module under test, and test feedback data of the functional module under test is collected. The test feedback data is compared with the preset module data, and the pass / fail status of the functional module under test is determined based on the comparison results. The step of generating a corresponding test plan based on the functional module to be tested includes: Identify the type attributes of the functional module under test, wherein the type attributes are essential category labels used to characterize and distinguish different functional circuit boards inside the high-power inverter power supply, and the type attributes include: main control unit, auxiliary power supply board, main power conversion circuit board, sampling circuit board, filter circuit board, relay circuit board and external communication board. The corresponding test logic and security parameters are determined based on the type attributes. The test plan is generated based on the test logic and the security parameters.

2. The method as described in claim 1, characterized in that, The step of determining the corresponding test logic and security parameters based on the type attribute includes: The initial test sequence and initial security threshold are obtained based on the type attribute; The initial test sequence and the initial security threshold are configured based on a preset configuration strategy to determine the test logic and the security parameters.

3. The method as described in claim 1, characterized in that, The steps of applying test stimuli to the functional module under test according to the test plan and collecting test feedback data from the functional module under test include: According to the test sequence in the test plan, apply the corresponding test stimulus to the functional module under test in accordance with the preset steps; After the test stimulus is applied, test feedback data of the functional module under test is collected.

4. The method as described in claim 1, characterized in that, After the step of determining the pass / fail status of the functional module under test based on the comparison results, the method further includes: Generate a test report containing the identification information of the functional module under test, the test time, the test feedback data, and the pass / fail status, and store the test report.

5. The method as described in claim 3, characterized in that, Before the step of collecting test feedback data from the functional module under test, the method further includes: Obtain the initial state feedback of the functional module under test under the test stimulus; Determine whether the initial state feedback meets the preset response conditions; If so, then the step of collecting test feedback data of the functional module under test is performed.

6. A device for testing equipment, characterized in that, The equipment testing device is connected to a high-power inverter power supply, and the equipment testing device includes: The acquisition module is used to acquire the test configuration information of the high-power inverter power supply; The generation module is used to determine the functional module under test in the high-power inverter power supply based on the test configuration information, and generate a corresponding test plan according to the functional module under test. The data acquisition module is used to apply test stimuli to the functional module under test according to the test plan, and to acquire test feedback data of the functional module under test. The determination module is used to compare the test feedback data with preset module data and determine the pass / fail status of the functional module under test based on the comparison result. The generation module is further configured to identify the type attributes of the functional module under test, wherein the type attributes are essential category labels used to characterize and distinguish different functional circuit boards inside the high-power inverter power supply, and the type attributes include: main control unit, auxiliary power supply board, main power conversion circuit board, sampling circuit board, filter circuit board, relay circuit board, and external communication board; determine the corresponding test logic and safety parameters according to the type attributes; and generate the test plan based on the test logic and the safety parameters.

7. A high-power inverter power supply testing device, characterized in that, The device includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, the computer program being configured to implement the steps of the high-power inverter power supply detection method as described in any one of claims 1 to 5.

8. A storage medium, characterized in that, The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, it implements the steps of the high-power inverter power supply detection method as described in any one of claims 1 to 5.

9. A computer program product, characterized in that, The computer program product includes a computer program that, when executed by a processor, implements the steps of the high-power inverter power supply detection method as described in any one of claims 1 to 5.

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