Method for constructing ultrahigh overload assessment environment in soft recovery process of ballistic target test model

Abstract

The invention belongs to the technical field of ballistic target tests, and discloses a method for constructing an ultrahigh overload assessment environment in a soft recovery process of a ballistic target test model. According to the method for constructing the ultra-high overload assessment environment in the soft recovery process of the ballistic target test model, aiming at the anti-ultra-high overload test assessment requirement of electronic equipment to be tested, the ultra-high overload assessment environment is constructed through overload environment requirement analysis, test model design, soft recovery material type selection design, soft recovery material layout design and overload environment test verification; and an overload environment with the overload acceleration peak value exceeding 40000g and the loading time exceeding 1ms and meeting expected requirements is constructed, and the method has engineering practical value.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of ballistic target test, and particularly relates to a method for constructing an ultrahigh overload test environment in a soft recovery process of a ballistic target test model. BACKGROUND

[0002] In a high overload environment, electronic equipment has the risk of performance decline, failure, and even damage. Moreover, with the increase of overload acceleration amplitude and loading time, the related risk also increases sharply. Therefore, it is of great value to simulate the overload test environment of electronic equipment to the maximum extent to accurately measure and evaluate the overload resistance performance of electronic equipment.

[0003] Currently, the main method for testing the high overload resistance performance of electronic equipment is a hammering or impacting mode, that is, a falling hammer, a pendulum hammer, or a Hopkinson bar impacting mode is used to directly or indirectly impact the electronic equipment for single or multiple times, and the overload resistance performance of the electronic equipment is tested by monitoring the working state of the electronic equipment during (or before and after) the impact.

[0004] When the hammering or impacting mode is used for testing, the overload acceleration amplitude generated by this mode is generally in the range of 10 3 g~10 5 g, and the loading duration is generally in the range of 10 -6 s~10 -4 s. The impact overload shaping mode can improve the overload loading time to a certain extent, but the overload acceleration peak value will also decrease. The fundamental reason is that the overload loading energy generated by the hammering or impacting mode is insufficient. The insufficient overload loading energy often leads to the problem that the real high overload resistance performance of the electronic equipment cannot be fully tested and evaluated, so that the electronic equipment can pass the overload resistance performance test in the hammering or impacting mode, but it fails in actual application.

[0005] The Chinese patent document discloses a method for constructing an ultrahigh overload test environment by using a two-stage light gas gun launching process (ZL202311014320.8), which can construct a high overload test environment with an overload amplitude of more than 10,000 g and a loading time of 10 ms. However, it still cannot meet the more stringent overload requirements.

[0006] Therefore, there is an urgent need to develop a method for constructing an ultrahigh overload test environment in a soft recovery process of a ballistic target test model. SUMMARY

[0007] The technical problem to be solved by the application is to provide a method for constructing an ultrahigh overload test environment in a soft recovery process of a ballistic target test model to overcome the defects of the prior art.

[0008] The method for constructing an ultra-high overload test environment by a soft recovery process of a ballistic target test model of the application comprises the following steps: S10. Overload environment requirement analysis; According to the overload performance test environment requirement of the electronic equipment to be tested, the expected overload acceleration amplitude range and loading time range of the constructed ultra-high overload test environment are determined; S20. Test model design; According to the shape size, mass, and expected overload performance of the electronic equipment to be tested, the test model design is carried out, and the shape size and mass of the test model are determined; the test model structure is optimized by using an auxiliary design method including theoretical strength checking and numerical simulation, to ensure that the structure and material of the test model with the electronic equipment to be tested inside remain intact under the expected ultra-high overload test environment; S30. Soft recovery material selection and design; According to the overload acceleration amplitude range and loading time range of the ultra-high overload test environment, in combination with the related parameters including the shape size of the test model, the mass of the test model, the flight speed, the density of the soft recovery material, and the drag coefficient, the density range of the soft recovery material required for the soft recovery of the test model is analyzed, and the type of the soft recovery material is determined; wherein the overload acceleration borne by the test model is inversely proportional to the mass of the test model, and is proportional to the square of the shape size of the test model, the density of the soft recovery material, the drag coefficient, and the flight speed; S40. Soft recovery material layout design; According to the type of the soft recovery material, in combination with the deceleration characteristics of the high-speed moving test model in the soft recovery material, the length of the required soft recovery material layout is determined; at the same time, since the high-speed moving test model will generate strong heat accumulation effect by violent friction with the soft recovery material during the soft recovery process, the thermal protection of the electronic equipment to be tested needs to be considered in the soft recovery material layout design; in order to protect the electronic equipment to be tested inside the test model and control the environmental temperature of the electronic equipment to be tested, a hot melt material with a set hot melting temperature is arranged at the end section of the soft recovery material during the soft recovery material layout design; S50. Overload environment test and verification; According to the shape size of the test model, the mass of the test model, the flight speed, and the soft recovery material determined in S20~S40, a ballistic target test is carried out to test and verify whether the ultra-high overload test environment reaches the expectation, and if not, iterative design is carried out until the expectation is reached.

[0009] The present invention relates to a method for constructing an ultra-high overload test environment in the soft recovery process of a ballistic target test model. Targeting the ultra-high overload test requirements of electronic devices under test, this method constructs an overload environment that meets the expected requirements, with a peak overload acceleration exceeding 40,000g and a loading time exceeding 1ms, through overload environment requirement analysis, test model design, soft recovery material selection and design, soft recovery material layout design, and overload environment test verification. This method has practical engineering value. Attached Figure Description

[0010] Figure 1 A flowchart of the method for constructing an ultra-high overload test environment for the soft recovery process of the ballistic target test model of the present invention; Figure 2 This is a schematic diagram of the blunt-headed body model structure in the embodiment; Figure 2 In the diagram, 1. Assembly area of ​​the electronic device under test; 2. Buffer material; 3. Model shell; 4. Matching power supply and circuit module; Figure 3 The overload curve of the blunt-headed body model used in this embodiment was measured during the soft recovery process. Detailed Implementation

[0011] The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0012] Example: Figure 1 As shown in this embodiment, the method for constructing an ultra-high overload test environment in the soft recovery process of the ballistic target test model includes the following steps: S10. Overload Environment Requirements Analysis; Based on the requirements of the overload performance testing environment for the electronic device under test, the expected overload acceleration amplitude range and loading time range of the ultra-high overload testing environment are clearly defined. The test model in this embodiment is a kilogram-sized blunt-nosed body model. The overload acceleration amplitude of the internal region of the test model is not less than 40,000g and the loading time is not less than 1ms. S20. Experimental model design; Based on the dimensions, mass, and expected overload resistance of the electronic device under test, an experimental model is designed to define its dimensions and mass. Auxiliary design methods, including theoretical strength verification and numerical simulation, are used to optimize the structure of the experimental model to ensure that the structure and materials of the experimental model containing the electronic device under test remain intact under the expected ultra-high overload test environment. The experimental model is shown below. Figure 2The model shell 3 includes an upper part and a lower part, and the upper part and the lower part are screwed into a closed body, and the material of the model shell 3 is high-strength titanium alloy; the inside of the test model is provided with an electronic equipment assembly area 1 to be tested, both sides of the electronic equipment assembly area 1 to be tested are provided with a matched power supply and a circuit module 4, and a buffer material 2 is filled in the cavity of the test model; S30. Soft recovery material selection design; According to the overload acceleration amplitude range and the loading time range of the super-high overload test environment, in combination with related parameters including the test model size, the test model mass, the flight speed, the soft recovery material density and the drag coefficient, the density range of the soft recovery material required for the soft recovery of the test model is analyzed, and the type of the soft recovery material is determined; wherein the overload acceleration borne by the test model is inversely proportional to the test model mass, and is proportional to the square of the test model size, the soft recovery material density, the drag coefficient and the flight speed; For the kilogram-level blunt body model of the embodiment, the maximum diameter of the test model section is about 10 cm, the test model mass is about 1 kg, the flight speed is about 3 km / s, and the proportional coefficient including the drag coefficient is assumed to be 0.2; in order to meet the requirements of constructing the overload acceleration amplitude range of 40000g±20000g and the loading time of not less than 1ms, in combination with the consideration of the flame retardant of the soft recovery material, it is determined that the soft recovery material selected is a sponge material with a density range of about 14kg / m 3 -42kg / m 3 ; S40. Soft recovery material layout design; According to the type of the soft recovery material, in combination with the deceleration characteristics of the test model in high-speed motion in the soft recovery material, the length of the required soft recovery material layout is determined; at the same time, since the test model in high-speed motion will generate strong heat accumulation effect by violent friction with the soft recovery material in the soft recovery process, the heat protection of the electronic equipment to be tested needs to be considered in the soft recovery material layout design; in order to protect the electronic equipment to be tested inside the test model and control the environmental temperature of the electronic equipment to be tested, a hot melt material with a set melting temperature is arranged at the end of the soft recovery material during the soft recovery material layout design; For the kilogram-level blunt body model of the embodiment, in addition to the low-density sponge with a layout length of 10 meters, a paraffin with a length of 3 meters is arranged at the end of the soft recovery material, and the hot melting temperature of the paraffin is about 60℃; S50. Overload environment test verification; According to the test model size, the test model mass, the flight speed and the soft recovery material determined in S20~S40, a ballistic target test is carried out to test and verify whether the super-high overload test environment meets the expectation, and if not, iterative design is carried out until the expectation is met.

[0013] For the kilogram-level blunt body model of the embodiment, in the ballistic target test, the launch speed of the test model is about 3.3 km / s, and the measured overload acceleration curve of the test model in the soft recovery process is shown in Figure 3 From Figure 3 It can be seen that the peak of the overload acceleration is over 40000g, the fluctuation range of the overload acceleration is 40000g±20000g, and the loading time is over 1ms, which reaches the expectation, and the method for constructing the super-high overload checking environment in the soft recovery process of the ballistic target test model of the application is effective.

[0014] Although the embodiments of the application have been disclosed as above, it is not limited to the application listed in the specification and the embodiments, and all the features disclosed by the application, or all the steps in the disclosed method or process, except for the mutually exclusive features and / or steps, can be combined in any way, without departing from the principles of the application, and the application is not limited to specific details and the figures shown and described herein.

Claims

1. A method for constructing an ultra-high overload test environment during the soft recovery process of a ballistic target test model, characterized in that, Includes the following steps: S10. Overload Environment Requirements Analysis; S20. Experimental model design; S30. Selection and design of soft recyclable materials; S40. Layout design for soft recyclable materials; S50. Overload environment test verification.

2. The method for constructing an ultra-high overload test environment during the soft recovery process of the ballistic target test model according to claim 1, characterized in that, S10 includes the following: Based on the requirements of the overload performance testing environment for the electronic device under test, the expected overload acceleration amplitude range and loading time range for constructing the ultra-high overload testing environment are clearly defined.

3. The method for constructing an ultra-high overload test environment during the soft recovery process of the ballistic target test model according to claim 2, characterized in that, S20 includes the following: S20. Experimental model design; Based on the dimensions, mass, and expected overload resistance of the electronic device under test, an experimental model is designed, specifying the dimensions and mass of the experimental model. Auxiliary design methods, including theoretical strength verification and numerical simulation, are used to optimize the structure of the experimental model, ensuring that the structure and materials of the experimental model containing the electronic device under test remain intact under the expected ultra-high overload test environment.

4. The method for constructing an ultra-high overload test environment during the soft recovery process of the ballistic target test model according to claim 3, characterized in that, S30 includes the following: S30. Selection and design of soft recyclable materials; For the overload acceleration amplitude range and loading time range of the ultra-high overload test environment, combined with relevant parameters including the test model's external dimensions, mass, flight speed, soft recovery material density, and drag coefficient, the density range of the soft recovery material required for the test model's soft recovery is analyzed, and the type of soft recovery material is identified. Among them, the overload acceleration borne by the test model is inversely proportional to the test model's mass, and directly proportional to the test model's external dimensions, soft recovery material density, drag coefficient, and the square of the flight speed.

5. The method for constructing an ultra-high overload test environment during the soft recovery process of the ballistic target test model according to claim 4, characterized in that, S40 includes the following: S40. Layout design for soft recyclable materials; Based on the type of soft recycling material and the deceleration characteristics of the high-speed test model within it, the required length of the soft recycling material layout is determined. Simultaneously, due to the intense heat accumulation effect generated by the high-speed test model's friction with the soft recycling material during the soft recycling process, thermal protection of the electronic device under test (DUT) needs to be considered in the soft recycling material layout design. To protect the DUT inside the test model and control its ambient temperature, a hot-melt material with a set melting temperature is placed at the end of the soft recycling material layout.

6. The method for constructing an ultra-high overload test environment during the soft recovery process of the ballistic target test model according to claim 5, characterized in that, The S50 includes the following: S50. Overload environment test verification; Based on the test model's external dimensions, mass, flight speed, and soft recovery materials specified in S20~S40, ballistic target tests are conducted to verify whether the ultra-high overload test environment meets expectations. If it does not meet expectations, iterative design is carried out until the expectations are met.

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