Detection platform and detection equipment for detecting microstructure of workpiece

Abstract

The invention discloses a detection platform and detection equipment for detecting the microstructure of a workpiece, and the detection platform comprises a positioning plate which is used for positioning a to-be-detected workpiece; the first driving mechanism is used for driving the positioning plate to do reciprocating translation along a first set direction; the second driving mechanism is used for driving the first mounting plate to do reciprocating translation in the second set direction, and the first driving mechanism is arranged on the first mounting plate; the third driving mechanism is used for driving the second mounting plate to rotate around the first set axis, and the second driving mechanism is arranged on the second mounting plate; the fourth driving mechanism is used for driving the third mounting plate to lift in a reciprocating manner, and the third driving mechanism is arranged on the third mounting plate; the fifth driving mechanism is used for driving the first mounting frame to swing around a second set axis, and the fourth driving mechanism is arranged on the first mounting frame; and the sixth driving mechanism is used for driving the second mounting frame to swing around a third set axis. The device can be adapted to blades with different shapes and contours.

Description

Technical Field

[0001] This application relates to the field of engine blade inspection technology, specifically to an inspection platform and inspection equipment for inspecting the microstructure of workpieces. Background Technology

[0002] In aerospace, gas turbine, and automotive engine manufacturing, blades are critical components, and their microstructure directly determines product performance and reliability. Traditional blade inspection technologies are generally based on machine vision, laser measurement, and X-ray diffraction. While these technologies address blade inspection needs to some extent, they have significant limitations in adaptability, accuracy, and efficiency. Machine vision, due to its low cost and convenience, is widely used for blade surface morphology inspection; however, it struggles to provide sufficient resolution, resulting in inaccurate results. Laser measurement and X-ray diffraction offer high accuracy and fast speed, but their associated motion equipment has limited freedom of movement, making it difficult to adapt to blades with different shapes and profiles, thus limiting their applicability to the blades being inspected.

[0003] Furthermore, laser measurement and X-ray diffraction technologies often require precise motion platforms to ensure the stability and positional accuracy of the instruments during the detection process. Existing motion platforms in such measuring equipment have failed to effectively address the stability issues under high loads and high precision, leading to error accumulation and vibration effects during multi-degree-of-freedom motion, ultimately affecting the accuracy of the measurement results. Moreover, existing motion platforms occupy a large area, resulting in high costs for deployment, use, and maintenance. Summary of the Invention

[0004] This application aims to address one of the technical problems in related technologies to a certain extent. To this end, this application provides a testing platform and testing equipment for detecting the microstructure of workpieces.

[0005] To achieve the above objectives, this application adopts the following technical solution: a detection platform for detecting the microstructure of a workpiece, the detection platform comprising:

[0006] Positioning plate, used to position the workpiece to be inspected;

[0007] The first driving mechanism is used to drive the positioning plate to reciprocate and translate along a first predetermined direction;

[0008] The second drive mechanism is used to drive the first mounting plate to reciprocate and translate along a second predetermined direction. The first drive mechanism is disposed on the first mounting plate.

[0009] The third drive mechanism is used to drive the second mounting plate to rotate around the first set axis. The second drive mechanism is disposed on the second mounting plate.

[0010] The fourth drive mechanism is used to drive the third mounting plate to reciprocate up and down in a third predetermined direction. The third drive mechanism is disposed on the third mounting plate.

[0011] A fifth drive mechanism is used to drive the first mounting bracket to swing about a second predetermined axis; the fourth drive mechanism is disposed on the first mounting bracket; and,

[0012] The sixth drive mechanism is used to drive the second mounting bracket to swing around the third set axis. The second mounting bracket is used to mount the microstructure detection instrument.

[0013] Wherein, the first set direction, the second set direction, and the third set direction are perpendicular to each other, the axial direction of the first set axis is in the same direction as the third set direction, the axial direction of the second set axis is in the same direction as the second set direction, and the axial direction of the third set axis is in the same direction as the first set direction.

[0014] The application of this application has the following beneficial effects: The testing platform, through the coordinated operation of a positioning plate, a first driving mechanism, a second driving mechanism, and a fourth driving mechanism, can drive the workpiece to be tested to move relative to the microstructure testing instrument along a first predetermined direction, a second predetermined direction, and a third predetermined direction. Simultaneously, through the coordinated operation of a positioning plate, a third driving mechanism, a fifth driving mechanism, and a sixth driving mechanism, the workpiece to be tested and the microstructure testing instrument can rotate relative to each other along a first predetermined axis, a second predetermined axis, and a third predetermined axis. Through the above structural design, the angle and position of the blade relative to the microstructure testing instrument can be precisely adjusted according to the testing requirements of blades with different external profiles. Therefore, this testing platform can adapt to blades with different external profiles, increasing its application range.

[0015] Optionally, the testing platform further includes a damping support bracket, a marble optical table disposed on the damping support bracket, and a first frame and a second frame disposed at intervals on the marble optical table along a first predetermined direction. The first mounting frame is swayably disposed on the first frame, and the second mounting frame is swayably disposed on the second frame.

[0016] Optionally, the first frame includes a cross arm and a first support arm and a second support arm arranged at intervals along a second predetermined direction, with both ends of the cross arm fixedly connected to the top ends of the first and second support arms respectively; the fifth drive mechanism includes two sets of electric rotary tables, and the two sets of electric rotary tables are respectively disposed on the first and second support arms; the first mounting frame includes a base plate and fixed frames disposed at both ends of the base plate; the two sets of fixed frames are respectively rotatably disposed on the first and second support arms and respectively connected to the output ends of the two sets of electric rotary tables; and the fourth drive mechanism is disposed on the base plate.

[0017] Optionally, the detection platform further includes a drive assembly disposed on the first frame and a line laser camera that can be driven by the drive assembly. The emitting end and receiving end of the line laser camera are both arranged facing the positioning plate, and the line laser camera is used to detect the position of the workpiece to be detected.

[0018] Optionally, the drive assembly includes a lifting drive mechanism, a first connecting frame disposed at the output end of the lifting drive mechanism, a horizontal drive mechanism disposed at the connecting frame, and a second connecting frame disposed at the output end of the horizontal drive mechanism, wherein the line laser camera is disposed on the second connecting frame.

[0019] Optionally, the first and second drive mechanisms are both coreless linear motors, and the fourth drive mechanism is an electric lifting platform.

[0020] Optionally, the testing platform further includes a first slide rail structure disposed between the positioning plate and the first mounting plate, a second slide rail structure disposed between the first mounting plate and the second mounting plate, and a third slide rail structure disposed between the third mounting plate and the first mounting frame.

[0021] Optionally, the third, fifth, and sixth drive mechanisms are all electric rotary tables.

[0022] Furthermore, this application also provides a testing device for detecting the microstructure of a workpiece, including a microstructure detection instrument. The testing device further includes a testing platform as described in any one of the above technical solutions, and the microstructure detection instrument is mounted on the second mounting bracket. The reasoning process for the beneficial effects of the testing device provided in this application and the aforementioned testing platform is similar, and will not be repeated here.

[0023] Optionally, the microstructure detection instrument includes an X-ray emitter and an X-ray receiver, the second mounting frame includes a first mounting arm and a second mounting arm, the X-ray emitter is disposed on the first mounting arm and the X-ray receiver is disposed on the second mounting arm; the sixth drive mechanism includes two sets of coaxially arranged electric rotary stages, the first mounting arm and the second mounting arm are respectively disposed at the output ends of the two sets of electric rotary stages.

[0024] These features and advantages of this application will be disclosed in detail in the following specific embodiments and accompanying drawings. The best embodiments or means of this application will be shown in detail in conjunction with the accompanying drawings, but are not intended to limit the technical solutions of this application. In addition, each of these features, elements and components appearing in the following text and drawings is multiple and is labeled with different symbols or numbers for convenience, but all represent parts with the same or similar structure or function. Attached Figure Description

[0025] The following description, in conjunction with the accompanying drawings, further illustrates this application:

[0026] Figure 1 This application provides a schematic diagram of the structure of a detection platform for detecting the microstructure of a workpiece.

[0027] Figure 2 This is a schematic diagram of the internal structure of the testing platform;

[0028] Figure 3 This is a schematic diagram of the internal structure of the testing platform from another perspective;

[0029] Figure 4 This is a schematic diagram of the internal structure of a testing device that utilizes this testing platform;

[0030] Figure 5 This is a structural schematic diagram of the positioning plate, the first drive mechanism, the second drive mechanism, the first mounting plate, and the second mounting plate;

[0031] Figure 6 A schematic diagram of the structure of the third drive mechanism, the fourth drive mechanism, the second mounting plate, and the third mounting plate;

[0032] Figure 7 Exploded view of the third drive mechanism, the fourth drive mechanism, the second mounting plate, and the third mounting plate;

[0033] Figure 8 A schematic diagram of the fifth drive mechanism, drive assembly, first frame, and first mounting bracket;

[0034] Figure 9 A structural schematic diagram of the fifth drive mechanism, drive assembly, first frame, and first mounting bracket from another perspective;

[0035] Figure 10 A schematic diagram of the sixth drive mechanism, the second frame, and the second mounting bracket;

[0036] Figure 11 This is an exploded view of the sixth drive mechanism, the second frame, and the second mounting bracket.

[0037] Among them, 1. First drive mechanism; 10. Positioning plate; 2. Second drive mechanism; 20. First mounting plate; 21. First slide rail structure; 3. Third drive mechanism; 30. Second mounting plate; 31. Second slide rail structure; 4. Fourth drive mechanism; 40. Third mounting plate; 41. Third slide rail structure; 5. Fifth drive mechanism; 6. Sixth drive mechanism; 60. Drive disk; 61. Transmission shaft; 7. Microstructure detection instrument; 70. X-ray emitter; 71. X-ray receiver; 8. Line laser camera; 90. Chassis; 91. Damping support bracket; 92. Marble optical tabletop; 93. First frame; 930. Cross arm; 931. First support arm; 932. Second support arm; 94. Second frame; 940. Circular slide rail structure; 95. First mounting bracket; 950. Base plate; 951. Fixing bracket; 96. Second mounting bracket; 960. First mounting arm; 961. Second mounting arm; 97. Drive assembly; 970. Lifting drive mechanism; 971. First connecting bracket; 972. Horizontal drive mechanism; 973. Second connecting bracket; 98. Control unit. Detailed Implementation

[0038] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described are intended to explain this application and should not be construed as limiting it.

[0039] The terms "an embodiment," "example," or "example" used in this specification refer to a particular feature, structure, or characteristic described in connection with the embodiment itself that may be included in at least one embodiment disclosed in this application. The phrase "in an embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment.

[0040] In the description of this application, it should be understood that the terms "upper," "lower," "front," "rear," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. In the description of this application, "a plurality of" means two or more, unless otherwise precisely specified.

[0041] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "connected," "linked," and "connected" should be interpreted broadly. For example, they can refer to a fixed connection, a connection through an intermediary, or a connection within two elements or an interaction between two elements. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0042] This embodiment provides a detection platform for detecting the microstructure of a workpiece, such as... Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, the testing platform includes a positioning plate 10, a first driving mechanism 1, a second driving mechanism 2, a first mounting plate 20, a third driving mechanism 3, a second mounting plate 30, a fourth driving mechanism 4, a third mounting plate 40, a fifth driving mechanism 5, a first mounting frame 95, a sixth driving mechanism 6, and a second mounting frame 96. The positioning plate 10 is used to position the workpiece to be tested. The first driving mechanism 1 is connected to the positioning plate 10 and drives the positioning plate 10 to reciprocate along a first predetermined direction. The second driving mechanism 2 is connected to the first mounting plate 20 and drives the first mounting plate 20 to reciprocate along a second predetermined direction. The first driving mechanism 1 is mounted on the first mounting plate 20. Therefore, the second driving mechanism 2 can drive the first mounting plate 20, the first driving mechanism 1, and the positioning plate 10 to synchronously translate along the second predetermined direction. The third drive mechanism 3 is connected to the second mounting plate 30, and the third drive mechanism 3 is used to drive the second mounting plate 30 to rotate around the first set axis. The second drive mechanism 2 is disposed on the second mounting plate 30. Thus, the second mounting plate 30, the second drive mechanism 2, the first mounting plate 20, the first drive mechanism 1 and the positioning plate 10 can be driven to rotate around the first set axis by the third drive mechanism 3.

[0043] In this embodiment, the fourth drive mechanism 4 is connected to the third mounting plate 40, and the fourth drive mechanism 4 is used to drive the third mounting plate 40 to reciprocate up and down along a third predetermined direction. The third drive mechanism 3 is disposed on the third mounting plate 40. The fifth drive mechanism 5 is connected to the first mounting frame 95, and the fifth drive mechanism 5 is used to drive the first mounting frame 95 to swing around a second predetermined axis. The fourth drive mechanism 4 is disposed on the first mounting frame 95. The sixth drive mechanism 6 is connected to the second mounting frame 96, and the sixth drive mechanism 6 is used to drive the second mounting frame 96 to swing around a third predetermined axis. The second mounting frame 96 is used to mount the microstructure detection instrument 7.

[0044] like Figure 4 and Figure 5As shown, in this embodiment, the first set direction Y, the second set direction X, and the third set direction Z are perpendicular to each other. The axial direction of the first set axis is in the same direction as the third set direction, the axial direction of the second set axis is in the same direction as the second set direction, and the axial direction of the third set axis is in the same direction as the first set direction.

[0045] This testing platform, through the coordinated operation of a positioning plate 10, a first driving mechanism 1, a second driving mechanism 2, and a fourth driving mechanism 4, can drive the workpiece to be tested to move relative to the microstructure testing instrument 7 along a first, second, and third predetermined direction. Simultaneously, through the coordinated operation of the positioning plate 10, the third driving mechanism 3, the fifth driving mechanism 5, and the sixth driving mechanism 6, it can drive the workpiece to be tested and the microstructure testing instrument 7 to rotate relative to each other along a first, second, and third predetermined axis. Through this structural design, the angle and position of the blade relative to the microstructure testing instrument 7 can be precisely adjusted according to the testing requirements of blades with different profiles. Therefore, this testing platform can adapt to blades with different profiles, increasing its application range.

[0046] Figure 4 An inspection device using the inspection platform provided in this embodiment is shown. The inspection device includes a microstructure inspection instrument 7 and an inspection platform, with the microstructure inspection instrument 7 mounted on a second mounting bracket 96 within the inspection platform. Due to the use of the inspection platform provided in this embodiment, the inspection device can precisely control the angle and position of the workpiece to be inspected relative to the microstructure inspection instrument 7, enabling the inspection device to adapt to a wider range of workpieces with different external contours.

[0047] Combination Figure 4 and Figure 10 As shown, the microstructure detection instrument 7 in this embodiment includes an X-ray emitter 70 and an X-ray receiver 71. The second mounting bracket 96 includes a first mounting arm 960 and a second mounting arm 961. The X-ray emitter 70 is disposed on the first mounting arm 960, and the X-ray receiver 71 is disposed on the second mounting arm 961. The sixth drive mechanism 6 in this embodiment includes two sets of coaxially arranged electric rotary stages. The first mounting arm 960 and the second mounting arm 961 are respectively disposed at the output ends of the two sets of electric rotary stages. Specifically, in this embodiment, combined with... Figure 10 and Figure 11 As shown, the electric rotary table has a drive disk 60, and the end of the second mounting arm 961 is directly fixed to the drive disk 60 of the electric rotary table by screws. The other electric rotary table is provided with a drive shaft 61, which passes through the middle of the electric rotary table and is fixedly connected to the end of the first rotating arm. This allows the two electric rotary tables, serving as the sixth drive mechanism 6, to be coaxially arranged.

[0048] The above structural design allows for independent control of the rotation of the first mounting arm 960 and the second mounting arm 961 via two sets of electric rotary tables, which in turn allows for independent control of the rotation of the X-ray emitter 70 and the X-ray receiver 71. This enables adjustment of the relative angle between the two components to accommodate workpieces of different sizes and shapes, further improving the adaptability of the inspection platform.

[0049] like Figure 5 , Figure 6 and Figure 7 As shown, in this embodiment, both the first drive mechanism 1 and the second drive mechanism 2 are coreless linear motors, and the fourth drive mechanism 4 is an electric lifting platform. In this embodiment, the output ends of the first drive mechanism 1 and the second drive mechanism 2 have a maximum travel of 200mm along the first set direction Y and the second set direction X, respectively. Furthermore, coreless linear motors have advantages such as fast response speed and high control precision, and there is no wear problem with motor brushes or drive screws, thus significantly reducing heat generation. In addition, the non-cogging characteristic of coreless linear motors ensures excellent speed stability. Coreless linear motors can be directly purchased from the market; their specific structure and working principle are existing technologies and will not be described further here.

[0050] Furthermore, to ensure high stability of the positioning plate 10 and the workpiece to be inspected positioned thereon during movement, the inspection platform provided in this embodiment also includes a first slide rail structure 21 disposed between the positioning plate 10 and the first mounting plate 20, a second slide rail structure 31 disposed between the first mounting plate 20 and the second mounting plate 30, and a third slide rail structure 41 disposed between the third mounting plate 40 and the first mounting bracket 95. Specifically, as... Figure 5 As shown, the first slide rail structure 21 includes a slider fixedly mounted on the positioning plate 10 and a guide rail fixedly mounted on the upper surface of the first mounting plate 20. The second slide rail structure 31 includes a slider fixedly mounted on the lower surface of the first mounting plate 20 and a guide rail fixedly mounted on the upper surface of the second mounting plate 30. Figure 6 and Figure 7 As shown, the third slide rail structure 41 includes a slider fixedly mounted on a vertical plate and a guide rail fixedly mounted on the bottom wall of the fourth drive mechanism 4. The vertical plate is locked and fixed to the lower surface of the third mounting plate 40, and the bottom wall of the fourth drive mechanism 4 is fixedly connected to the first mounting bracket 95.

[0051] In addition, this embodiment also provides limit structures for the first driving mechanism 1, the second driving mechanism 2, and the fourth driving mechanism 4. The limit structures include limit electromagnets, positive limit plates, and negative limit plates. Taking the limit structure provided for the first driving mechanism 1 as an example, as follows... Figure 5As shown, the positive and negative limit plates are arranged and installed on the first mounting plate 20 along the moving stroke of the positioning plate 10, and the limit electromagnet is installed on the positioning plate 10.

[0052] like Figure 7 As shown, the output travel of the fourth drive mechanism 4 in this embodiment is 50mm. The electric lifting platform includes a servo motor and a vertical guide mechanism driven by the servo motor to generate lifting motion, enabling high-precision vertical motion control. The vertical guide mechanism includes a pair of GTS30V anti-creep crossed roller bearings and GTS70V recirculating ball bearings. The electric lifting platform is an existing product and can be directly purchased from the market; its structure and working principle will not be described in detail here.

[0053] like Figure 7 , Figure 8 , Figure 9 , Figure 10 and Figure 11 As shown, in this embodiment, the third drive mechanism 3, the fifth drive mechanism 5, and the sixth drive mechanism 6 are all electric rotary tables. Specifically, the third drive mechanism 3 comprises one set of electric rotary tables, while the fifth drive mechanism 5 and the sixth drive mechanism 6 each include two sets of electric rotary tables. These electric rotary tables are existing products and can be directly purchased from the market; their structure and working principle will not be described in detail here.

[0054] The detection platform provided in this embodiment can precisely control movement or rotation in various directions, and has high repeatability and stability. Specifically, the first drive mechanism 1 has a movement stroke of 200mm along the first set direction, with a repeatability of ±2μm; the second drive mechanism 2 has a movement stroke of 200mm along the second set direction, with a repeatability of ±2μm; and the fourth drive mechanism 4 has a movement stroke of 50mm along the third set direction, with a repeatability of ±3μm. The rotation range of the third drive mechanism 3 around the first set axis is 90°, with a repeatability of ±0.05°; the rotation range of the two sets of electric rotary tables of the fifth drive mechanism 5 around the second set axis is 360°, with a repeatability of ±0.05°; the rotation range of the electric rotary table of the sixth drive mechanism 6 used to drive the first mounting arm 960 around the third set axis is 50°, and the rotation range of the electric rotary table of the sixth drive mechanism 6 used to drive the second mounting arm 961 around the third set axis is also 50°, with a repeatability of ±0.05°. It is easy to understand that the first mounting arm 960 and the second mounting arm 961 are staggered.

[0055] like Figure 1 , Figure 2 and Figure 3As shown, the detection platform provided in this embodiment also includes a damping support bracket 91, a marble optical table 92 disposed on the damping support bracket 91, and a first frame 93 and a second frame 94 disposed at intervals along a first predetermined direction on the marble optical table 92. The first mounting bracket 95 is swayably disposed on the first frame 93, and the second mounting bracket 96 is swayably disposed on the second frame 94.

[0056] The use of damping support bracket 91 can effectively reduce the impact of external vibrations on the testing platform, further improving motion control accuracy. As the main support structure for each component, the marble optical table 92 not only achieves extremely high stability and vibration resistance but also ensures that the microstructure testing instrument 7 is not disturbed. In addition, the testing platform provided in this embodiment also includes a chassis 90 and a control unit 98. The chassis 90 is installed outside the damping support bracket 91, the marble optical table 92, the first frame 93, and the second frame 94. The chassis 90 is made entirely of sheet metal and uses a carbon steel powder coating process, providing good corrosion resistance and durability. A control unit 98 is also installed outside the chassis 90. The control unit 98 includes a suspended computer and a control cabinet, allowing operators to control the testing platform via the computer. The chassis 90 also includes a door, inspection port, observation window, and other structures, which will not be described in detail here.

[0057] Furthermore, such as Figure 8 and Figure 9 As shown, the first frame 93 in this embodiment includes a horizontal arm 930 and a first support arm 931 and a second support arm 932 arranged at intervals along a second predetermined direction. The two ends of the horizontal arm 930 are fixedly connected to the top ends of the first support arm 931 and the second support arm 932, respectively. The fifth drive mechanism 5 in this embodiment includes two sets of electric rotary tables, which are respectively disposed on the first support arm 931 and the second support arm 932. The first mounting frame 95 in this embodiment includes a base plate 950 and fixed frames 951 disposed at both ends of the base plate 950. The two sets of fixed frames 951 are rotatably disposed on the first support arm 931 and the second support arm 932, respectively, and are connected to the output ends of the two sets of electric rotary tables. The fourth drive mechanism 4 is disposed on the base plate 950. Through the above structural design, the fifth drive mechanism 5 can drive the first mounting frame 95 and each structure disposed on the first mounting frame 95 to swing synchronously around the second predetermined axis.

[0058] By adopting the above structural design, the first frame 93 and the second frame 94 are arranged at intervals along a first predetermined direction, and the first support arm 931 and the second support arm 932 are arranged at intervals along a second predetermined direction. This allows for the arrangement of a first drive mechanism 1, a second drive mechanism 2, a third drive mechanism 3, a fourth drive mechanism 4, and a fifth drive mechanism 5 between the first support arm 931 and the second support arm 932 to drive the positioning plate 10 and the workpiece to be inspected. Simultaneously, a sixth drive mechanism 6 for driving the microstructure inspection instrument 7 can be arranged within the space between the first frame 93 and the second frame 94. This design allows for efficient use of space and reduces the overall size of the inspection platform. It also reduces the floor space occupied by the inspection platform and lowers the costs of deployment, use, and maintenance.

[0059] like Figure 10 As shown, to improve the rotational stability of the first mounting arm 960 and the second mounting arm 961, a turntable is also provided on the second frame 94 in this embodiment, and an annular slide rail structure 940 is provided between the turntable and the first mounting arm 960 and the second mounting arm 961. Specifically, the annular slide rail structure 940 includes an annular track fixedly disposed on the aforementioned turntable and sliders respectively disposed on the first mounting arm 960 and the second mounting arm 961.

[0060] The detection platform provided in this embodiment also includes a drive assembly 97 disposed on the cross arm 930 and a line laser camera 8 that can be driven by the drive assembly 97. Both the emitting and receiving ends of the line laser camera 8 are arranged facing the positioning plate 10, and the line laser camera 8 is used to detect the position of the workpiece to be detected. When using detection equipment with this detection platform, the position of the workpiece to be detected can be detected by the line laser camera 8, and by cooperating with various drive mechanisms to drive and control the workpiece to be detected, the workpiece can be moved to the target position so that the microstructure detection instrument 7 can detect it.

[0061] Furthermore, the drive assembly 97 in this embodiment includes a lifting drive mechanism 970, a first connecting frame 971 disposed at the output end of the lifting drive mechanism 970, a horizontal drive mechanism 972 disposed at the connecting frame, and a second connecting frame 973 disposed at the output end of the horizontal drive mechanism 972. The line laser camera 8 is disposed on the second connecting frame 973. In this embodiment, the lifting drive mechanism 970 is an electric push rod, and the horizontal drive mechanism 972 is a ball screw motor. The output end of the electric push rod is fixedly connected to the first connecting frame 971, and the output end of the ball screw motor is fixedly connected to the second connecting frame 973.

[0062] The application includes a testing device equipped with this testing platform. When performing microstructure testing on a workpiece, the workpiece is first positioned on the positioning plate 10. Then, a line laser camera 8 detects the specific position of the workpiece. Based on the detection information fed back by the line laser camera 8, one or more of the first drive mechanism 1, second drive mechanism 2, third drive mechanism 3, fourth drive mechanism 4, and fifth drive mechanism 5 are controlled to drive the workpiece to the target position. The microstructure testing instrument 7 then performs microstructure testing on the workpiece. During the testing process, the instrument 7 can be driven by a sixth drive mechanism 6, and the workpiece can also be driven by one or more of the first drive mechanism 1, second drive mechanism 2, third drive mechanism 3, fourth drive mechanism 4, and fifth drive mechanism 5. This allows for adjustment of the workpiece's position and angle relative to the instrument 7 as needed, ensuring high-precision microstructure testing.

[0063] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Those skilled in the art should understand that this application includes, but is not limited to, the contents described in the accompanying drawings and the specific embodiments above. Any modifications that do not depart from the functional and structural principles of this application will be included within the scope of the claims.

Claims

1. A detection platform for detecting the microstructure of a workpiece, characterized in that, The detection platform includes: Positioning plate, used to position the workpiece to be inspected; The first driving mechanism is used to drive the positioning plate to reciprocate and translate along a first predetermined direction; The second drive mechanism is used to drive the first mounting plate to reciprocate and translate along a second predetermined direction. The first drive mechanism is disposed on the first mounting plate. The third drive mechanism is used to drive the second mounting plate to rotate around the first set axis. The second drive mechanism is disposed on the second mounting plate. The fourth drive mechanism is used to drive the third mounting plate to reciprocate up and down in a third predetermined direction. The third drive mechanism is disposed on the third mounting plate. A fifth drive mechanism is used to drive the first mounting bracket to swing about a second predetermined axis; the fourth drive mechanism is disposed on the first mounting bracket; and, The sixth drive mechanism is used to drive the second mounting bracket to swing around the third set axis. The second mounting bracket is used to mount the microstructure detection instrument. Wherein, the first set direction, the second set direction, and the third set direction are perpendicular to each other, the axial direction of the first set axis is in the same direction as the third set direction, the axial direction of the second set axis is in the same direction as the second set direction, and the axial direction of the third set axis is in the same direction as the first set direction.

2. The detection platform as described in claim 1, characterized in that, The testing platform further includes a damping support bracket, a marble optical table disposed on the damping support bracket, and a first frame and a second frame disposed at intervals on the marble optical table along a first predetermined direction. The first mounting frame is swayably disposed on the first frame, and the second mounting frame is swayably disposed on the second frame.

3. The detection platform as described in claim 2, characterized in that, The first frame includes a cross arm and a first support arm and a second support arm arranged at intervals along a second predetermined direction, wherein the two ends of the cross arm are respectively fixed to the top ends of the first support arm and the second support arm. The fifth drive mechanism includes two sets of electric rotary tables, and the two sets of electric rotary tables are respectively disposed on the first support arm and the second support arm. The first mounting frame includes a base plate and fixed frames disposed at both ends of the base plate. The two sets of fixed frames are respectively rotatably disposed on the first support arm and the second support arm and respectively connected to the output ends of the two sets of electric rotary tables. The fourth drive mechanism is disposed on the base plate.

4. The detection platform as described in claim 2, characterized in that, The detection platform also includes a drive assembly disposed on the first frame and a line laser camera that can be driven by the drive assembly. The emitting end and the receiving end of the line laser camera are both arranged facing the positioning plate. The line laser camera is used to detect the position of the workpiece to be detected.

5. The detection platform as described in claim 4, characterized in that, The drive assembly includes a lifting drive mechanism, a first connecting frame disposed at the output end of the lifting drive mechanism, a horizontal drive mechanism disposed at the connecting frame, and a second connecting frame disposed at the output end of the horizontal drive mechanism, wherein the line laser camera is disposed on the second connecting frame.

6. The detection platform as described in any one of claims 1 to 5, characterized in that, The first and second drive mechanisms are both coreless linear motors, and the fourth drive mechanism is an electric lifting platform.

7. The detection platform as described in claim 6, characterized in that, The testing platform also includes a first slide rail structure disposed between the positioning plate and the first mounting plate, a second slide rail structure disposed between the first mounting plate and the second mounting plate, and a third slide rail structure disposed between the third mounting plate and the first mounting frame.

8. The detection platform as described in any one of claims 1 to 5, characterized in that, The third, fifth, and sixth drive mechanisms are all electric rotary tables.

9. A testing device for detecting the microstructure of a workpiece, comprising a microstructure testing instrument, characterized in that, The testing equipment further includes a testing platform as described in any one of claims 1 to 8, and the microstructure testing instrument is mounted on the second mounting frame.

10. The detection device as described in claim 9, characterized in that, The microstructure detection instrument includes an X-ray emitter and an X-ray receiver. The second mounting frame includes a first mounting arm and a second mounting arm. The X-ray emitter is disposed on the first mounting arm, and the X-ray receiver is disposed on the second mounting arm. The sixth drive mechanism includes two sets of coaxially arranged electric rotary tables, with the first mounting arm and the second mounting arm respectively located at the output ends of the two sets of electric rotary tables.

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