Hysteresis-adjustable comparison circuit and device
By adding four MOSFETs to the reference comparator circuit and using an external detection circuit to control the hysteresis-adjustable comparator circuit, the communication reliability problem of the hysteresis comparator under different interference signal environments is solved, the circuit complexity and power consumption are reduced, and the application range is expanded.
Patent Information
- Application Number
- CN202511749250.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-26
- Publication Date
- 2026-02-17
AI Technical Summary
Existing hysteresis comparators cannot adapt to different interference signal scenarios, and adjustable hysteresis comparators have high circuit complexity, resulting in insufficient communication reliability of chips in different application environments.
Four MOSFETs are added to the reference comparator circuit. The conduction state of the first and second MOSFETs is controlled by an external detection circuit to adjust the hysteresis voltage and reduce the current of the reference comparator circuit to adapt to different interference signals.
It has improved the reliability of chip communication under different interference signal environments, reduced circuit complexity and power consumption, and expanded the application range.
Smart Images
Figure CN121547026A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of integrated circuits, and in particular to a hysteresis-adjustable comparator circuit and device. Background Technology
[0002] As the chip industry continues to develop, the requirements for chips are becoming increasingly stringent. In the automotive-grade chip industry, zero failures are required, placing extremely high demands on chip reliability. In CAN (Controller Area Network) transceiver chips, the comparator plays a crucial role, determining whether the chip can communicate normally. Furthermore, interference signals on the CAN bus are generally significant, and different application environments may cause varying degrees of interference. Therefore, a hysteresis comparator capable of handling different levels of interference is needed to ensure communication reliability.
[0003] To avoid the impact of interference signal fluctuations on comparator outputs, conventional hysteresis comparators and adjustable hysteresis comparators have emerged. Conventional hysteresis comparators typically have a fixed hysteresis voltage, which cannot be adjusted to cope with varying interference signal fluctuations in different application environments. Adjustable hysteresis comparators adjust the hysteresis voltage by regulating the current source, but this method causes variations in the comparator's speed. Some adjustable hysteresis comparators use a combination of digital and analog circuitry to adjust the hysteresis, resulting in high circuit complexity and significant current and area consumption.
[0004] In view of the above-mentioned technologies, finding a comparator circuit with adjustable hysteresis that has a simple circuit structure and a wide range of applications is a problem that urgently needs to be solved by those skilled in the art. Summary of the Invention
[0005] The purpose of this application is to provide a comparator circuit and device with adjustable hysteresis. This solves the problems of conventional hysteresis comparators being unsuitable for scenarios with different interference signals and the high circuit complexity of adjustable hysteresis comparators in the prior art.
[0006] To solve the above-mentioned technical problems, this application provides a comparator circuit with adjustable hysteresis, including: a first MOSFET, a second MOSFET, a third MOSFET, a fourth MOSFET, and a reference comparator circuit;
[0007] The source of the first MOSFET is connected to the source of the second MOSFET, and both are connected to the power supply terminal of the reference comparator circuit and the reference power supply.
[0008] The gates of both the first and second MOS transistors are connected to an external detection circuit.
[0009] The drain of the first MOSFET is connected to the source of the third MOSFET; the drain of the second MOSFET is connected to the source of the fourth MOSFET.
[0010] The gate and drain of the third MOSFET are connected together and are also connected to the first adjustment terminal of the reference comparator circuit.
[0011] The gate and drain of the fourth MOSFET are connected together and are also connected to the second adjustment terminal of the reference comparator circuit.
[0012] The first and second signal terminals of the reference comparator circuit are connected to the first and second signal input circuits, respectively.
[0013] When the hysteresis-adjustable comparator circuit malfunctions after receiving the first signal from the first signal input circuit and the second signal from the second signal input circuit, the external detection circuit sends corresponding control signals to the first MOSFET and the second MOSFET so that the first MOSFET and the second MOSFET can be turned on according to the corresponding control signals.
[0014] After the first and second MOSFETs are turned on, the third and fourth MOSFETs reduce the current in the corresponding branches of the first and second adjustment terminals of the reference comparator circuit, in order to reduce the hysteresis voltage.
[0015] Preferably, the reference comparator circuit includes: a comparator circuit with hysteresis and a fifth MOSFET;
[0016] Among them, the power supply terminal of the comparator circuit with hysteresis serves as the power supply terminal of the reference comparator circuit and is connected to the source of the first MOSFET, the source of the second MOSFET, and the reference power supply.
[0017] The first terminal of the comparator circuit with hysteresis is connected to the gate and drain of the third MOSFET as the first adjustment terminal of the reference comparator circuit.
[0018] The second terminal of the comparator circuit with hysteresis is connected to the gate and drain of the fourth MOSFET as the second adjustment terminal of the reference comparator circuit.
[0019] The first signal terminal of the comparator circuit with hysteresis is connected to the first signal input circuit as the first signal terminal of the reference comparator circuit.
[0020] The second signal terminal of the comparator circuit with hysteresis is connected to the second signal input circuit as the second signal terminal of the reference comparator circuit.
[0021] The third terminal of the comparator circuit with hysteresis is connected to the drain of the fifth MOSFET;
[0022] The gate of the fifth MOSFET is connected to the current source;
[0023] The source of the fifth MOSFET is grounded.
[0024] Preferably, the comparator circuit with hysteresis includes: a sixth MOSFET, a seventh MOSFET, an eighth MOSFET, a ninth MOSFET, a tenth MOSFET, and an eleventh MOSFET;
[0025] The sources of the sixth MOSFET, the seventh MOSFET, the eighth MOSFET, and the ninth MOSFET are connected together and together serve as the power supply terminal of the comparator circuit with hysteresis, which is connected to the source of the first MOSFET, the source of the second MOSFET, and the reference power supply.
[0026] The gate, drain, gate, drain of the sixth MOSFET, gate of the seventh MOSFET, drain of the eighth MOSFET, and drain of the tenth MOSFET are connected together and together form the first terminal of a comparator circuit with hysteresis, which is connected to the gate and drain of the third MOSFET.
[0027] The gate, drain, eighth MOSFET, seventh MOSFET, and eleventh MOSFET are connected together and together form the second terminal of a comparator circuit with hysteresis, which is connected to the gate and drain of the fourth MOSFET.
[0028] The gate of the tenth MOSFET is connected to the first signal input circuit as the first signal terminal of the comparator circuit with hysteresis.
[0029] The gate of the eleventh MOSFET is connected to the second signal input circuit as the second signal terminal of the comparator circuit with hysteresis.
[0030] The source of the tenth MOSFET is connected to the source of the eleventh MOSFET, and together they form the third terminal of the comparator circuit with hysteresis, which is connected to the drain of the fifth MOSFET.
[0031] Preferably, it further includes: a twelfth MOSFET and a thirteenth MOSFET, and the twelfth MOSFET, the thirteenth MOSFET and the fifth MOSFET constitute a first current mirror;
[0032] Among them, the gate of the twelfth MOSFET, the drain of the twelfth MOSFET, and the gate of the thirteenth MOSFET are connected, and together they are connected to the gate of the fifth MOSFET and the current source.
[0033] The drain of the thirteenth MOSFET is connected to the reference power supply;
[0034] The sources of the twelfth MOSFET, the thirteenth MOSFET, and the fifth MOSFET are connected together and grounded.
[0035] Preferably, it further includes: a second current mirror and a second operational amplifier circuit;
[0036] The power supply terminal of the second current mirror is connected to the reference power supply.
[0037] The first end of the second current mirror is connected to the drain of the thirteenth MOSFET;
[0038] The second terminal of the second current mirror is connected to the first terminal of the second operational amplifier circuit.
[0039] The second terminal of the two-stage operational amplifier circuit is connected to the drain of the tenth MOSFET;
[0040] The third terminal of the second-stage operational amplifier circuit is connected to the drain of the eleventh MOSFET;
[0041] The output terminal of the second operational amplifier circuit and the third terminal of the second current mirror are connected together and serve as the output terminal of the hysteresis-adjustable comparator circuit.
[0042] Preferably, the second current mirror includes: a fourteenth MOSFET, a fifteenth MOSFET, and a sixteenth MOSFET;
[0043] Among them, the source of the fourteenth MOSFET, the source of the fifteenth MOSFET, and the sixteenth MOSFET are connected together and together serve as the power supply terminal of the second current mirror, which is connected to the reference power supply.
[0044] The gate, drain, gate of the 14th MOSFET, gate of the 15th MOSFET, and gate of the 16th MOSFET are connected together and together serve as the first terminal of the second current mirror, which is connected to the drain of the 13th MOSFET.
[0045] The drain of the fifteenth MOSFET is connected to the first terminal of the second current mirror circuit as the second terminal of the second operational amplifier circuit.
[0046] The drain of the sixteenth MOSFET is connected to the output of the second operational amplifier circuit as the third terminal of the second current mirror.
[0047] Preferably, the two-stage operational amplifier circuit includes: a first-stage amplifier circuit, a second-stage amplifier circuit, and a conversion circuit;
[0048] In this circuit, the first terminal of the first stage amplifier circuit is connected to the first terminal of the second stage amplifier circuit, and together they serve as the first terminal of the second stage operational amplifier circuit connected to the second terminal of the second current mirror.
[0049] The second terminal of the first-stage amplifier circuit is connected to the drain of the tenth MOSFET as the second terminal of the second-stage operational amplifier circuit.
[0050] The second terminal of the second-stage amplifier circuit is connected to the drain of the eleventh MOSFET as the third terminal of the second-stage operational amplifier circuit.
[0051] The third terminal of the first-stage amplifier circuit is connected to the third terminal of the second-stage amplifier circuit;
[0052] The output of the second-stage amplifier circuit is connected to the input of the conversion circuit;
[0053] The output of the conversion circuit is connected to the third terminal of the second current mirror as the output of the second operational amplifier circuit.
[0054] Preferably, the first-stage amplifier circuit includes: a seventeenth MOSFET and an eighteenth MOSFET;
[0055] Among them, the source of the seventeenth MOS transistor is connected to the first terminal of the first stage amplifier circuit, the first terminal of the second stage amplifier circuit, and the second terminal of the second current mirror.
[0056] The gate of the seventeenth MOSFET is connected to the drain of the tenth MOSFET as the second terminal of the first stage amplifier circuit.
[0057] The drain of the seventeenth MOSFET is connected to the drain and gate of the eighteenth MOSFET, and together they form the third terminal of the first-stage amplifier circuit and are connected to the third terminal of the second-stage amplifier circuit.
[0058] The source of the eighteenth MOSFET is grounded.
[0059] Preferably, the first-stage amplifier circuit includes: a nineteenth MOSFET and a twentieth MOSFET; the switching circuit is: a twenty-first MOSFET;
[0060] Among them, the source of the nineteenth MOS transistor is connected to the first terminal of the second stage amplifier circuit, the first terminal of the first stage amplifier circuit, and the second terminal of the second current mirror.
[0061] The gate of the nineteenth MOSFET is connected to the drain of the eleventh MOSFET as the second terminal of the second stage amplifier circuit.
[0062] The drain of the nineteenth MOSFET is connected to the drain of the twentieth MOSFET, and together they serve as the output terminal of the second-stage amplifier circuit and are connected to the gate of the twenty-first MOSFET, which serves as the input terminal of the conversion circuit.
[0063] The gate of the twentieth MOSFET is connected to the third terminal of the first-stage amplifier circuit as the third terminal of the second-stage amplifier circuit.
[0064] The drain of the 21st MOSFET is connected to the third terminal of the second current mirror as the output terminal of the switching circuit.
[0065] The source of the twentieth MOSFET is connected to the source of the twenty-first MOSFET and grounded.
[0066] On the other hand, this application also provides an electronic device including the aforementioned hysteresis-adjustable comparison circuit.
[0067] The hysteresis-adjustable comparator circuit provided in this application adds four MOSFETs to a conventional reference comparator circuit. The first and second MOSFETs act as switches, connecting to the third and fourth MOSFETs and an external detection circuit. The third and fourth MOSFETs act as adjustment devices, connecting to the first and second MOSFETs and the reference comparator circuit. The first and second signal terminals of the reference comparator circuit serve as input terminals of the hysteresis-adjustable comparator circuit, connected to the first and second signal input circuits. When the signals output by the first and second signal input circuits fluctuate significantly, the hysteresis-adjustable comparator circuit malfunctions. When the external detection circuit detects this malfunction, it sends corresponding control signals to the first and second MOSFETs to turn them on. After the first and second MOSFETs are turned on, the third and fourth MOSFETs begin to work in conjunction with the reference comparator circuit, reducing the current in the corresponding branches of the first and second adjustment terminals of the reference comparator circuit, thus reducing the pull-up capability and causing the hysteresis voltage to decrease. This application adds four MOSFETs to a conventional reference comparison circuit, resulting in a simple structure, low complexity, low power consumption, and low layout area. Furthermore, the first and second MOSFETs in this application are controlled by control signals output from an external detection circuit, so only the control signals need to be modified in different environments, making it widely applicable. Attached Figure Description
[0068] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0069] Figure 1 A circuit diagram of a hysteresis-adjustable comparator circuit provided for an embodiment of this application;
[0070] Figure 2 A complete circuit diagram of a hysteresis-adjustable comparator circuit provided for an embodiment of this application. Detailed Implementation
[0071] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.
[0072] The core of this application is to provide a comparator circuit and device with adjustable hysteresis.
[0073] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0074] Figure 1 A circuit diagram of a hysteresis-adjustable comparator circuit provided for embodiments of this application is shown below. Figure 1 As shown, it includes: a first MOSFET M1, a second MOSFET M2, a third MOSFET M3, a fourth MOSFET M4, and a reference comparator circuit. In Figure 1 The reference comparator circuit includes a comparator circuit with hysteresis and a fifth MOSFET M5, while the comparator circuit with hysteresis includes a sixth MOSFET M6, a seventh MOSFET M7, an eighth MOSFET M8, a ninth MOSFET M9, a tenth MOSFET M10, and an eleventh MOSFET M11.
[0075] The connection relationship of its hysteresis-adjustable comparator circuit is as follows: the source of the first MOSFET M1 and the source of the second MOSFET M2 are connected, and together they are connected to the power supply terminals of the reference comparator circuit (the sources of the sixth MOSFET M6, the seventh MOSFET M7, the eighth MOSFET M8, and the ninth MOSFET M9) and the reference power supply; the gates of the first MOSFET M1 and the second MOSFET M2 are both connected to the external detection circuit; the drain of the first MOSFET M1 is connected to the source of the third MOSFET M3; the drain of the second MOSFET M2 is connected to the source of the fourth MOSFET M4; the gate and drain of the third MOSFET M3 are connected, and together they are connected to the first adjustment terminal of the reference comparator circuit (the gates of the sixth MOSFET M6, the drain of the sixth MOSFET M6, the gate of the seventh MOSFET M7, and the drain of the eighth MOSFET M8). The gate and drain of the tenth MOSFET M10 are connected; the gate and drain of the fourth MOSFET M4 are connected, and together they are connected to the second adjustment terminal of the reference comparator circuit (the gate and drain of the ninth MOSFET M9, the gate of the eighth MOSFET M8, the drain of the seventh MOSFET M7, and the drain of the eleventh MOSFET M11); the first signal terminal of the reference comparator circuit (the gate of the tenth MOSFET M10) is connected to the first signal input circuit; the second signal terminal of the reference comparator circuit (the gate of the eleventh MOSFET M11) is connected to the second signal input circuit; the source of the tenth MOSFET M10 and the source of the eleventh MOSFET M11 are connected, and together they are connected to the drain of the fifth MOSFET M5; the gate of the fifth MOSFET M5 is connected to the current source Ibias; the source of the fifth MOSFET M5M is grounded.
[0076] In this circuit, the gates of the first MOSFET M1 and the second MOSFET M2 are both connected to an external detection circuit to acquire the corresponding control signals Vc sent by the external detection circuit to the first MOSFET M1 and the second MOSFET M2. The control signals Vc are expressed as high and low levels. The first signal terminal of the reference comparator circuit (the gate of the tenth MOSFET M10) is connected to the first signal input circuit to acquire the first signal Vin1 output by the first signal input circuit. The second signal terminal of the reference comparator circuit (the gate of the eleventh MOSFET M11) is connected to the second signal input circuit to acquire the second signal Vin2 output by the second signal input circuit.
[0077] In a specific embodiment, without a designed hysteresis voltage, the most common comparator circuit includes: a sixth MOSFET M6, a ninth MOSFET M9, a tenth MOSFET M10, an eleventh MOSFET M11, and a fifth MOSFET M5. In this circuit, the output flips when the first signal Vin1 equals the second signal Vin2. If there is interference fluctuation in the first signal Vin1 equaling the second signal Vin2, the output signal will repeatedly fluctuate with the input interference signal, causing the comparator function to fail. Adding a seventh MOSFET M7 and an eighth MOSFET M8 creates a reference comparator circuit. In this circuit, the seventh MOSFET M7 and the eighth MOSFET M8 form a positive feedback circuit, while the sixth MOSFET M6 and the ninth MOSFET M9 form a negative feedback circuit. To generate hysteresis in this circuit, the positive feedback must be greater than the negative feedback. This means that the size of the seventh MOSFET M7 must be larger than the size of the sixth MOSFET M6, the specific value of which is determined by the designed hysteresis voltage. If the size of the seventh MOSFET M7 is larger than that of the sixth MOSFET M6, then assuming the first signal Vin1 is half of the reference power supply voltage, and the second signal Vin2 rises from zero, the output will not flip when Vin2 reaches the same level as the first signal Vin1, because the pull-up capability of the seventh MOSFET M7 is stronger at this point. The output will only flip when the second signal Vin2 continues to rise to the designed value. The difference between the first signal Vin1 and the second signal Vin2 at this point is the comparator's hysteresis, which can be designed according to specific requirements.
[0078] By adding a first MOSFET M1, a second MOSFET M2, a third MOSFET M3, and a fourth MOSFET M4 to the reference comparator circuit, different hysteresis voltages can be adjusted. When the control signal Vc received by the gates of the first MOSFET M1 and the second MOSFET M2 is high, the first MOSFET M1 and the second MOSFET M2 are turned off, and the third MOSFET M3 and the fourth MOSFET M4 do not work. At this time, the hysteresis voltage of the comparator is the hysteresis value generated by the third MOSFET M3 and the fourth MOSFET M4. When the control signal Vc received by the gates of the first MOSFET M1 and the second MOSFET M2 is low, the first MOSFET M1 and the second MOSFET M2 are turned on, and the third MOSFET M3 and the fourth MOSFET M4 start working. This is equivalent to reducing the pull-up current of the seventh MOSFET M7 and the eighth MOSFET M8, reducing their pull-up capability, and the hysteresis voltage will decrease.
[0079] Therefore, this circuit can adjust the hysteresis voltage by controlling the first MOSFET M1 and the second MOSFET M2. This control signal Vc can be generated by an external detection circuit. When the hysteresis-adjustable comparator circuit is detected to be malfunctioning, it means that the first signal Vin1 and the second signal Vin2 are experiencing significant interference fluctuations. In this case, the control signal Vc can be used to adjust different hysteresis voltages to ensure the hysteresis-adjustable comparator circuit functions correctly. This design allows the hysteresis-adjustable comparator circuit to be applied in various working environments. It can operate under normal communication conditions and also in harsh communication environments with severe interference signals, ensuring the reliability of chip communication.
[0080] In other words, the hysteresis-adjustable comparator circuit provided in this application adds four MOSFETs to a conventional reference comparator circuit. The first and second MOSFETs act as switches, connecting to the third and fourth MOSFETs and an external detection circuit. The third and fourth MOSFETs act as adjustment devices, connecting to the first and second MOSFETs and the reference comparator circuit. The first and second signal terminals of the reference comparator circuit serve as input terminals of the hysteresis-adjustable comparator circuit, connected to the first and second signal input circuits. When the signals output by the first and second signal input circuits fluctuate significantly, the hysteresis-adjustable comparator circuit malfunctions. When the external detection circuit detects this malfunction, it sends corresponding control signals to the first and second MOSFETs to turn them on. After the first and second MOSFETs are turned on, the third and fourth MOSFETs begin to work in conjunction with the reference comparator circuit, reducing the current in the corresponding branches of the first and second adjustment terminals of the reference comparator circuit, thus reducing the pull-up capability. At this point, the hysteresis voltage decreases. This application adds four MOSFETs to a conventional reference comparison circuit, resulting in a simple structure, low complexity, low power consumption, and low layout area. Furthermore, the first and second MOSFETs in this application are controlled by control signals output from an external detection circuit, so only the control signals need to be modified in different environments, making it widely applicable.
[0081] Based on the above embodiments, as a preferred embodiment, such as... Figure 2As shown, the hysteresis-adjustable comparator circuit further includes: a twelfth MOSFET M12, a thirteenth MOSFET M13, a second current mirror, and a second-stage operational amplifier circuit. The second current mirror includes: a fourteenth MOSFET M14, a fifteenth MOSFET M15, and a sixteenth MOSFET M16; the second-stage operational amplifier circuit includes: a seventeenth MOSFET M17, an eighteenth MOSFET M18, a nineteenth MOSFET M19, a twentieth MOSFET M20, and a twenty-first MOSFET M21. Furthermore, in this design, the twelfth MOSFET M12, the thirteenth MOSFET M13, and the fifth MOSFET M5 constitute the first current mirror.
[0082] The connection relationship of the first current mirror is as follows: the gate of the twelfth MOSFET M12, the drain of the twelfth MOSFET M12, and the gate of the thirteenth MOSFET M13 are connected, and together they are connected to the gate of the fifth MOSFET M5 and the current source Ibias; the drain of the thirteenth MOSFET M13 is connected to the reference power supply; the source of the twelfth MOSFET M12, the source of the thirteenth MOSFET M13, and the source of the fifth MOSFET M5 are connected and grounded.
[0083] The connection relationship between the second current mirror and the second-stage operational amplifier circuit is as follows: the source of the fourteenth MOSFET M14, the source of the fifteenth MOSFET M15, and the sixteenth MOSFET M16 are connected and together connected to the reference power supply; the gate and drain of the fourteenth MOSFET M14, the gate of the fifteenth MOSFET M15, and the gate of the sixteenth MOSFET M16 are connected and together connected to the drain of the thirteenth MOSFET M13; the drain of the fifteenth MOSFET M15 is connected to the first terminal of the second-stage operational amplifier circuit (the source of the seventeenth MOSFET M17 and the source of the nineteenth MOSFET M19); the drain of the sixteenth MOSFET M16 is connected to the output terminal of the second-stage operational amplifier circuit (the drain of the twenty-first MOSFET M21). Together, they serve as the output terminal of the hysteresis-adjustable comparator circuit, outputting the signal Vout; the gate of the seventeenth MOSFET M17 is connected to the drain of the tenth MOSFET M10; the drain of the seventeenth MOSFET M17 is connected to the drain and gate of the eighteenth MOSFET M18, and together they are connected to the gate of the twentieth MOSFET M20; the gate of the nineteenth MOSFET M19 is connected to the drain of the eleventh MOSFET M11; the drain of the nineteenth MOSFET M19 is connected to the drain of the twentieth MOSFET M20, and together they are connected to the gate of the twenty-first MOSFET M21; the source of the eighteenth MOSFET M18, the source of the twentieth MOSFET M20, and the source of the twenty-first MOSFET M21 are connected and grounded.
[0084] In a specific embodiment, the current source Ibias is connected to the drain, gate, fifth gate, and thirteenth gate of the twelfth MOSFET, forming a first current mirror, such that the current flowing through the twelfth, thirteenth, and fifth MOSFETs is proportional to their width-to-length ratio. The fourteenth, fifteenth, and sixteenth MOSFETs M14, M15, and M16 form a second current mirror, such that the current flowing through them is proportional to their width-to-length ratio. The seventeenth, eighteenth, nineteenth, twentyth, and twenty-first MOSFETs M21 form a two-stage operational amplifier circuit, whose main function is to convert the input differential signal into a single-ended output signal.
[0085] In a specific embodiment, the design of the first and second current sources reduces the power consumption of the circuit, suppresses common-mode interference, and improves broadband efficiency; while the two-stage operational amplifier circuit converts the input differential signal into a single-ended output signal, while achieving a balance between gain, bandwidth, and stability.
[0086] It should be noted that the embodiments provided in this application are only one possible way to implement the method, but are not limited to this method. Users can set their own methods according to their needs.
[0087] Therefore, the hysteresis-adjustable comparator circuit provided in this application has the following advantages:
[0088] 1. Simple structure, low complexity, low power consumption and low layout area.
[0089] 2. It has a wide range of applications and can be used in different working environments.
[0090] 3. Strong anti-interference ability.
[0091] On the other hand, this application also provides an electronic device that includes the above-described hysteresis-adjustable comparison circuit and has the same beneficial effects.
[0092] Since the embodiments provided in this application are the same as the embodiments of the hysteresis-adjustable comparator circuit described above, they will not be described again here.
[0093] The foregoing has provided a detailed description of a hysteresis-adjustable comparator circuit and device provided in this application. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of the claims of this application.
[0094] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
Claims
1. A hysteresis-adjustable comparison circuit, characterized by, The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit.
2. The hysteretic adjustable comparison circuit of claim 1, wherein, The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit.
3. The hysteretic adjustable comparison circuit of claim 2, wherein, The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to a hysteresis-adjustable comparison circuit. The application relates to The source of the sixth MOS, the source of the seventh MOS, the source of the eighth MOS and the source of the ninth MOS are connected together and are connected to the source of the first MOS, the source of the second MOS and the reference power supply as the power supply end of the hysteresis comparison circuit; The gate of the sixth MOS, the drain of the sixth MOS, the gate of the seventh MOS, the drain of the eighth MOS and the drain of the tenth MOS are connected together and are connected to the gate of the third MOS and the drain of the third MOS as the first end of the hysteresis comparison circuit; The gate of the ninth MOS, the drain of the ninth MOS, the gate of the eighth MOS, the drain of the seventh MOS and the drain of the eleventh MOS are connected together and are connected to the gate of the fourth MOS and the drain of the fourth MOS as the second end of the hysteresis comparison circuit; The gate of the tenth MOS is connected to the first signal input circuit as the first signal end of the hysteresis comparison circuit; The gate of the eleventh MOS is connected to the second signal input circuit as the second signal end of the hysteresis comparison circuit; The source of the tenth MOS and the source of the eleventh MOS are connected together and are connected to the drain of the fifth MOS as the third end of the hysteresis comparison circuit.
4. The hysteresis-adjustable comparison circuit of claim 3, wherein, Further comprising: A twelfth MOS and a thirteenth MOS, and the twelfth MOS, the thirteenth MOS and the fifth MOS constitute a first current mirror; The gate of the twelfth MOS, the drain of the twelfth MOS and the gate of the thirteenth MOS are connected together and are connected to the gate of the fifth MOS and the current source; The drain of the thirteenth MOS is connected to the reference power supply; The source of the twelfth MOS, the source of the thirteenth MOS and the source of the fifth MOS are connected together and are grounded.
5. The hysteresis-adjustable comparison circuit of claim 4, wherein, Further comprising: A second current mirror and a two-stage operational amplifier circuit; The power supply end of the second current mirror is connected to the reference power supply; The first end of the second current mirror is connected to the drain of the thirteenth MOS; The second end of the second current mirror is connected to the first end of the two-stage operational amplifier circuit; The second end of the two-stage operational amplifier circuit is connected to the drain of the tenth MOS; The third end of the two-stage operational amplifier circuit is connected to the drain of the eleventh MOS; The output end of the two-stage operational amplifier circuit and the third end of the second current mirror are connected together and are connected to the output end of the hysteresis adjustable comparison circuit.
6. The hysteretic adjustable comparison circuit of claim 5, wherein, The second current mirror comprises a fourteenth MOS, a fifteenth MOS and a sixteenth MOS; The source of the fourteenth MOS, the source of the fifteenth MOS and the sixteenth MOS are connected together and are connected to the reference power supply as the power supply end of the second current mirror; The gate of the fourteenth MOS transistor, the drain of the fourteenth MOS transistor, the gate of the fifteenth MOS transistor and the gate of the sixteenth MOS transistor are connected, and are connected with the drain of the thirteenth MOS transistor as the first end of the second current mirror; The drain of the fifteenth MOS transistor is connected with the first end of the two-stage operational amplifier circuit as the second end of the second current mirror; The drain of the sixteenth MOS transistor is connected with the output end of the two-stage operational amplifier circuit as the third end of the second current mirror.
7. The hysteretic adjustable comparison circuit of claim 5, wherein, The two-stage operational amplifier circuit comprises a first-stage amplification circuit, a second-stage amplification circuit and a conversion circuit; The first end of the first-stage amplification circuit is connected with the first end of the second-stage amplification circuit, and is connected with the second end of the second current mirror as the first end of the two-stage operational amplifier circuit; The second end of the first-stage amplification circuit is connected with the drain of the tenth MOS transistor as the second end of the two-stage operational amplifier circuit; The second end of the second-stage amplification circuit is connected with the drain of the eleventh MOS transistor as the third end of the two-stage operational amplifier circuit; The third end of the first-stage amplification circuit is connected with the third end of the second-stage amplification circuit; The output end of the second-stage amplification circuit is connected with the input end of the conversion circuit; The output end of the conversion circuit is connected with the output end of the two-stage operational amplifier circuit as the third end of the second current mirror.
8. The hysteresis-adjustable comparison circuit of claim 7, wherein, The first-stage amplification circuit comprises a seventeenth MOS transistor and an eighteenth MOS transistor; The source of the seventeenth MOS transistor is connected with the first end of the second-stage amplification circuit and the second end of the second current mirror as the first end of the first-stage amplification circuit; The gate of the seventeenth MOS transistor is connected with the drain of the tenth MOS transistor as the second end of the first-stage amplification circuit; The drain of the seventeenth MOS transistor is connected with the drain of the eighteenth MOS transistor and the gate of the eighteenth MOS transistor, and is connected with the third end of the first-stage amplification circuit and the third end of the second-stage amplification circuit; The source of the eighteenth MOS transistor is grounded.
9. The hysteresis-adjustable comparison circuit of claim 7, wherein, The first-stage amplification circuit comprises a nineteenth MOS transistor and a twentieth MOS transistor, and the conversion circuit comprises a twenty-first MOS transistor; The source of the nineteenth MOS transistor is connected with the first end of the first-stage amplification circuit and the second end of the second current mirror as the first end of the second-stage amplification circuit; The gate of the nineteenth MOS transistor is connected with the drain of the eleventh MOS transistor as the second end of the second-stage amplification circuit; The drain of the nineteenth MOS transistor is connected with the drain of the twentieth MOS transistor, and is connected with the output end of the second-stage amplification circuit and the gate of the twenty-first MOS transistor as the input end of the conversion circuit; The gate of the twentieth MOS transistor is connected with the third end of the second-stage amplification circuit as the third end of the first-stage amplification circuit; The drain of the twenty-first MOS transistor is connected with the third end of the second current mirror as the output end of the conversion circuit; The source of the twentieth MOS transistor and the source of the twenty-first MOS transistor are connected and grounded.
10. An electronic device, comprising: A hysteresis-adjustable comparison circuit comprising the hysteresis-adjustable comparison circuit of any one of claims 1-9.