A method for extracting terahertz optical parameters of a transformer solid insulation structure

Abstract

This invention relates to the field of terahertz technology, specifically a method for extracting terahertz optical parameters of a transformer solid insulation structure. The method includes acquiring the terahertz time-domain spectrum of the transformer solid insulation structure via a reflection method; separating a reference signal and a sample signal from the terahertz time-domain spectrum, converting the reference signal into a reference terahertz frequency domain signal, and converting the sample signal into a sample terahertz frequency domain signal; calculating the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculating the amplitude and phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio; and calculating the terahertz frequency domain absorption coefficient of the transformer solid insulation structure based on the amplitude and phase using Fresnel's formula and the electromagnetic wave propagation factor. This invention can improve the accuracy and efficiency of extracting terahertz optical parameters of transformer solid insulation structures.

Description

Technical Field

[0001] This invention belongs to the field of terahertz technology, and in particular relates to a method for extracting terahertz optical parameters of a transformer solid insulation structure. Background Technology

[0002] Terahertz detection technology is mainly divided into two types in terms of optical path design: transmission and reflection. Transmission methods are favored for their ease of operation, low error, and high signal quality, making them the preferred method for most laboratory research. However, when terahertz technology is applied to actual transformer testing, transmission methods are difficult to adapt to the complex insulation structure inside transformers. The paper or cardboard inside transformers not only plays multiple roles in insulation, compressive strength, and tensile strength, but also exhibits extremely diverse shapes and distributions due to differences in function and location. For example, thin insulating paper less than 1 mm is typically used to wrap metal conductors as inter-turn insulation; pre-compressed cardboard of 1 mm to 5 mm is often used in the main insulation between windings or between windings and ground, forming oil channel separators, screens, or pads; while thicker insulating materials are used to manufacture molded insulating components, mainly providing mechanical support. Given the complexity of the internal insulation structure of transformers, it is not feasible to use a built-in signal receiving probe for terahertz transmission spectroscopy testing. Furthermore, while the transmitting and receiving probes of the reflective terahertz optical path structure face challenges compared to the transmission optical path in terms of signal-to-noise ratio and decoupling of characteristic information, it has significant value in engineering applications. This technology has been successfully applied to the detection of coating thickness and internal defects in solid materials. Therefore, the reflective terahertz optical path structure can be applied to the condition detection of typical transformer insulation structures. Consequently, there is an urgent need for a method to extract terahertz optical parameters from transformer solid insulation structures to improve the accuracy and efficiency of terahertz optical parameter extraction. Summary of the Invention

[0003] This invention provides a method for extracting terahertz optical parameters of transformer solid insulation structures, which can improve the accuracy and efficiency of extracting terahertz optical parameters of transformer solid insulation structures.

[0004] To achieve the above objectives, the present invention provides a method for extracting terahertz optical parameters of a transformer solid insulation structure, comprising:

[0005] The terahertz time-domain spectrum of the solid insulation structure of the transformer was obtained by the reflection method.

[0006] Separate the reference signal and sample signal in the terahertz time-domain spectrum, and convert the reference signal into a reference terahertz frequency domain signal, and the sample signal into a sample terahertz frequency domain signal;

[0007] Calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio;

[0008] The terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using Fresnel's formula and electromagnetic wave propagation factor based on amplitude and phase.

[0009] To address the aforementioned problems, the present invention also provides a terahertz optical parameter extraction device for a transformer solid insulation structure, the device comprising:

[0010] The terahertz time-domain spectrum acquisition module is used to acquire the terahertz time-domain spectrum of the transformer solid insulation structure, wherein the terahertz time-domain spectrum of the transformer solid insulation structure is acquired by the reflection method;

[0011] The terahertz frequency domain signal processing module is used to separate the reference signal and the sample signal in the terahertz time domain spectrum, convert the reference signal into a reference terahertz frequency domain signal, and convert the sample signal into a sample terahertz frequency domain signal; calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio;

[0012] The absorption coefficient calculation module is used to calculate the terahertz frequency domain absorption coefficient of the solid insulation structure of a transformer based on the amplitude and phase using Fresnel's formula and the electromagnetic wave propagation factor.

[0013] To address the above problems, the present invention also provides an electronic device, the electronic device comprising:

[0014] At least one processor; and,

[0015] A memory communicatively connected to the at least one processor; wherein,

[0016] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform the terahertz optical parameter extraction method for the transformer solid insulation structure described above.

[0017] To address the aforementioned problems, the present invention also provides a computer-readable storage medium storing at least one computer program, which is executed by a processor in an electronic device to implement the terahertz optical parameter extraction method for transformer solid insulation structures described above.

[0018] This invention obtains the terahertz time-domain spectrum of a transformer's solid insulation structure. The terahertz time-domain spectrum of the transformer's solid insulation structure is obtained through a reflection method, providing fundamental information about the structure. Furthermore, by separating the reference signal and sample signal from the terahertz time-domain spectrum and converting the reference signal into a reference terahertz frequency domain signal and the sample signal into a sample terahertz frequency domain signal, the optical properties of the material can be analyzed in the frequency dimension. In addition, by calculating the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculating the amplitude and phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio, systematic errors can be eliminated, and amplitude and phase information reflecting the essential characteristics of the sample can be obtained. Finally, based on the amplitude and phase, the terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using the Fresnel formula and the electromagnetic wave propagation factor, providing a quantitative evaluation index for the transformer's solid insulation state, thereby improving the accuracy and efficiency of terahertz optical parameter extraction of the transformer's solid insulation structure. Attached Figure Description

[0019] Figure 1 This is a flowchart illustrating a method for extracting terahertz optical parameters of a transformer solid insulation structure according to an embodiment of the present invention.

[0020] Figure 2 A schematic diagram of the transmission of terahertz pulses in the copper windings of a transformer solid insulation structure, as provided in an embodiment of the present invention, for the method of extracting terahertz optical parameters of a transformer solid insulation structure.

[0021] Figure 3 A schematic diagram of the transmission of a terahertz pulse in the screen structure of a transformer solid insulation structure, which is a method for extracting terahertz optical parameters of a transformer solid insulation structure according to an embodiment of the present invention.

[0022] Figure 4 This is a schematic diagram of the transmission of a terahertz pulse in the insulating pad of a transformer solid insulation structure, which is a method for extracting terahertz optical parameters of a transformer solid insulation structure according to an embodiment of the present invention.

[0023] Figure 5 A schematic diagram of the terahertz time-domain spectrum of the copper winding of the transformer solid insulation structure, which is a method for extracting terahertz optical parameters of the transformer solid insulation structure according to an embodiment of the present invention.

[0024] Figure 6 A schematic diagram of the copper winding absorption coefficient of the transformer solid insulation structure, which is provided as an embodiment of the present invention for the method of extracting terahertz optical parameters of the transformer solid insulation structure;

[0025] Figure 7This is a functional block diagram of a terahertz optical parameter extraction device for a transformer solid insulation structure according to an embodiment of the present invention;

[0026] Figure 8 This is a schematic diagram of an electronic device for implementing the terahertz optical parameter extraction method for a transformer solid insulation structure, as provided in an embodiment of the present invention.

[0027] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0028] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0029] This application provides a method for extracting terahertz optical parameters of a transformer's solid insulation structure. The execution subject of this method includes, but is not limited to, at least one of the following electronic devices that can be configured to execute the method provided in this application: a server, a terminal, etc. In other words, the method for extracting terahertz optical parameters of a transformer's solid insulation structure can be executed by software or hardware installed on a terminal device or a server device. The software can be a blockchain platform. The server includes, but is not limited to, a single server, a server cluster, a cloud server, or a cloud server cluster. The server can be an independent server or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, content delivery networks (CDNs), and big data and artificial intelligence platforms.

[0030] Reference Figure 1 The diagram shown is a flowchart illustrating a method for extracting terahertz optical parameters of a transformer solid insulation structure according to an embodiment of the present invention. In this embodiment, the method for extracting terahertz optical parameters of the transformer solid insulation structure includes:

[0031] S1. Obtain the terahertz time-domain spectrum of the transformer solid insulation structure, wherein the terahertz time-domain spectrum of the transformer solid insulation structure is obtained by reflection method.

[0032] Understandably, the reflection method refers to the method of obtaining the optical response information of a material by utilizing the characteristic that terahertz pulses are reflected at the surface or internal interface of a sample.

[0033] Specifically, the process of obtaining the terahertz time-domain spectrum of the solid insulation structure of a transformer using the reflection method includes:

[0034] For the copper winding structure and the screen structure in the solid insulation structure of the transformer, the reflection method is used to emit terahertz pulses to the front of the insulating paper of the copper winding structure and the screen structure to obtain the front reflection signal and the reflection signal after penetrating the insulation layer. The terahertz time-domain spectrum of the copper winding structure and the screen structure is constructed using the front reflection signal and the reflection signal.

[0035] For the insulating pad in the solid insulation structure of the transformer, a terahertz pulse is emitted to the front of the insulating paper of the insulating pad using the reflection method to obtain the front reflection signal of the insulating pad. An optical plane mirror is used to obtain the optical front reflection signal at the same position on the insulating paper of the insulating pad. The terahertz time-domain spectrum of the insulating pad is constructed using the front reflection signal of the insulating pad and the optical front reflection signal.

[0036] Understandably, terahertz time-domain spectroscopy refers to a spectroscopic technique that uses ultrashort terahertz pulses to measure electric field waveforms in the time domain and obtains frequency domain information through Fourier transform.

[0037] Understandably, the copper winding structure refers to the conductive part inside the transformer, which is made of copper wire and is the core of electromagnetic energy transmission. Its surface is usually covered with insulating paper to prevent short circuits between turns.

[0038] Understandably, a screen structure refers to a shielding layer or semi-conductive shielding layer located outside the insulating layer, used to uniformly distribute the electric field, suppress partial discharge, and improve insulation reliability.

[0039] Understandably, an optical plane mirror is a reflective mirror with extremely flat surface, usually coated with metal or dielectric film, used as a standard reflection reference.

[0040] Understandably, insulating pads refer to solid insulating components inside a transformer used to support, isolate, and secure the windings. They are typically made of insulating paper, epoxy resin, or other insulating materials.

[0041] S2. Separate the reference signal and sample signal in the terahertz time-domain spectrum, and convert the reference signal into a reference terahertz frequency domain signal, and convert the sample signal into a sample terahertz frequency domain signal.

[0042] Specifically, separating the reference signal and the sample signal in the terahertz time-domain spectrum includes:

[0043] For the copper winding structure and the screen structure in the solid insulation structure of the transformer, the front reflection signal is used as the reference signal and the reflection signal after penetrating the insulation layer is used as the sample signal using a preset windowing function.

[0044] For the insulating pads in the solid insulation structure of the transformer, the optical front reflection signal is used as the reference signal and the front reflection signal of the insulating pad is used as the sample signal by using a preset windowing function.

[0045] Understandably, the preset windowing function refers to multiplying the signal waveform by a specific mathematical function before performing a Fourier transform on the time-domain signal, in order to control spectral leakage, suppress noise, and improve analysis accuracy, and is used to uniformly process reference signals and sample signals.

[0046] Further, converting the reference signal into a reference terahertz frequency domain signal and converting the sample signal into a sample terahertz frequency domain signal includes:

[0047] The reference signal is converted to a reference terahertz frequency domain signal, and the sample signal is converted to a sample terahertz frequency domain signal using the following formulas:

[0048] ;

[0049] in, The frequency of the terahertz pulse. It is a terahertz frequency domain signal. For frequency Lower terahertz pulse intensity For frequency Phase delay of lower terahertz pulses The imaginary unit, It is an exponential function.

[0050] It is understood that converting the reference signal to a reference terahertz frequency domain signal and converting the sample signal to a sample terahertz frequency domain signal using the following formulas also includes... ,in, For time The terahertz time-domain spectrum below, This is a Fourier transform.

[0051] S3. Calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio.

[0052] Understandably, amplitude refers to the magnitude of the ratio, representing the intensity change of the sample signal relative to the reference signal at a certain frequency.

[0053] Understandably, phase refers to the angle of the ratio, representing the phase delay of the sample signal relative to the reference signal at a certain frequency.

[0054] Specifically, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated, including:

[0055] For the copper winding structure and the enclosure structure in the solid insulation structure of a transformer, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated using the following formula. :

[0056]

[0057] in, These represent the electromagnetic field components of the sample signals in the copper winding structure and the enclosure structure. , This represents the straight-line distance from the terahertz probe to the sample surface. The incident angle of the terahertz pulse. The initial terahertz pulse electric field magnetic intensity before it is incident on the sample. This represents the transmission coefficient of the terahertz pulse as it transitions from air to the surface of the insulating paper. This represents the transmission coefficient of the terahertz pulse as it transitions from the surface of the insulating paper to the air. Let be the reflection coefficient of the terahertz pulse from the insulating paper to the dielectric x. The electromagnetic field components of the reference signal in the copper winding structure and the enclosure structure. , The reflection coefficient is the terahertz pulse transitioning from air to the surface of the insulating paper. Let d be the propagation factor of electromagnetic waves in the insulating paper, where d is the thickness of the insulating paper. The propagation angle of the terahertz pulse in the insulating paper;

[0058] For the insulating pads in the solid insulation structure of a transformer, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated using the following formula. :

[0059]

[0060] in, This is a sample signal of the insulating pad. This serves as a reference signal for the insulating pad. is the complex refractive index of the insulating paper.

[0061] For example, for the copper winding structure and the screen structure in the solid insulation structure of a transformer, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated using the following formula. The following steps can be taken to implement this:

[0062] In the copper winding structure and the surrounding screen structure of a transformer's solid insulation structure, the reflected signal r1 from the front of the insulating paper is used as the reference signal, and the reflected signal t3, which passes through the insulation layer and is reflected from the bottom surface, is used as the sample signal. By analyzing the electromagnetic wave expressions of these two signals, the terahertz frequency domain absorption coefficient can be extracted. The electromagnetic wave expression for the front reflected signal r1 is: Assuming the dielectric on the back of the insulating paper is arbitrary, then the expression for t3 is: .

[0063] electromagnetic field components and The electromagnetic fields corresponding to signals r1 and t3, respectively. This represents the propagation factor of electromagnetic waves in air. For frequency, This represents the straight-line distance from the terahertz probe to the sample surface. The incident angle of the terahertz pulse. Let d be the propagation factor of electromagnetic waves in the insulating paper, where d is the thickness of the insulating paper. The angle at which the terahertz wave propagates in the insulating paper. and These are the reflection and transmission coefficients of terahertz waves as they transition from air to the surface of insulating paper, respectively. This represents the reflection coefficient of terahertz waves from the insulating paper to the medium x.

[0064] Using r1 as the reference signal and t3 as the sample signal, the ratio of the sample signal to the reference signal is defined as: .

[0065]

[0066] in, Terahertz radiation sources are linearly polarized, with only one polarization component. This embodiment of the invention uses p-polarization as an example, with the ratio... The expression can be expanded as follows As shown.

[0067] in, Let x be the complex refractive index of the dielectric material on the bottom surface of the insulating paper. Let be the complex refractive index of the insulating paper. ,in, It is the second imaginary unit. Extinction coefficient, is the refractive index.

[0068] For example, for the insulating pad in the solid insulation structure of a transformer, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated using the following formula. The following implementation steps can be adopted:

[0069] For insulating pads used in transformer insulation, such as Figure 2 As shown, the reflected signal r1 from the standard mirror located at the same front surface position can be used as the reference signal, and the reflected signal r2 from the front surface of the insulating pad can be used as the sample signal. The electromagnetic wave expressions for the two signals are as follows: Japanese style As shown, where, This represents the reflection coefficient of terahertz waves from air to a standard silvered optical mirror. .

[0070] Using r1 as the reference signal and r2 as the sample signal, the ratio of the sample signal to the reference signal is defined. , as in the formula As shown.

[0071] S4. Calculate the terahertz frequency domain absorption coefficient of the transformer's solid insulation structure using Fresnel's formula and electromagnetic wave propagation factor based on the amplitude and phase.

[0072] Understandably, Fresnel's formula describes the laws governing the reflection and transmission of electromagnetic waves at the interface between two media.

[0073] Specifically, the terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated based on the amplitude and phase using Fresnel's formula and the electromagnetic wave propagation factor, including:

[0074] For the copper winding structure and the enclosure structure in the solid insulation structure of a transformer, the terahertz frequency domain absorption coefficient is calculated using the following formula in the copper winding structure. :

[0075] ;

[0076] in, The amplitude of the copper winding structure. The refractive index of the insulating paper for the copper winding structure;

[0077] In the enclosure structure, the terahertz frequency domain absorption coefficient is calculated using the following formula. :

[0078] ;

[0079] in, The amplitude of the screen structure. is the refractive index of the insulating paper in the screen structure.

[0080] Furthermore, before calculating the terahertz frequency domain absorption coefficient of the transformer solid insulation structure using Fresnel's formula and electromagnetic wave propagation factor based on amplitude and phase, the calculation also includes refractive index and extinction coefficient, and then calculating the terahertz frequency domain absorption coefficient of the transformer solid insulation structure based on refractive index and extinction coefficient.

[0081] For example, calculating the refractive index and extinction coefficient, and then calculating the terahertz frequency domain absorption coefficient of the transformer's solid insulation structure based on the refractive index and extinction coefficient, can be carried out using the following implementation steps:

[0082] Refractive index and extinction coefficient The calculation formulas are respectively and .

[0083] When the structure is a copper winding, the dielectric on the back of the insulating paper is metal. The complex refractive index of electromagnetic waves in metal is much greater than that in insulating paper. The expressions for the refractive index and extinction coefficient of the copper winding are as follows: and :

[0084] For insulating materials absorption coefficient Therefore, for copper windings, the expressions for refractive index and absorption coefficient can be simplified to: and .

[0085] When the structure is a screened structure, the area behind the screen is open air during transformer manufacturing or maintenance. Therefore, the refractive index of the screen structure The calculation formula is: And the extinction coefficient of the screen structure The expression is :

[0086] For insulating materials The expressions for the refractive index and absorption coefficient of the screen structure can be simplified to: and .

[0087] When the solid insulation structure of the transformer is an insulating pad, the expressions for the refractive index and absorption coefficient of the insulating pad are as follows:

[0088] ;

[0089] .

[0090] This invention obtains the terahertz time-domain spectrum of a transformer's solid insulation structure. The terahertz time-domain spectrum of the transformer's solid insulation structure is obtained through a reflection method, providing fundamental information about the structure. Furthermore, by separating the reference signal and sample signal from the terahertz time-domain spectrum and converting the reference signal into a reference terahertz frequency domain signal and the sample signal into a sample terahertz frequency domain signal, the optical properties of the material can be analyzed in the frequency dimension. In addition, by calculating the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculating the amplitude and phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio, systematic errors can be eliminated, and amplitude and phase information reflecting the essential characteristics of the sample can be obtained. Finally, based on the amplitude and phase, the terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using the Fresnel formula and the electromagnetic wave propagation factor, providing a quantitative evaluation index for the transformer's solid insulation state, thereby improving the accuracy and efficiency of terahertz optical parameter extraction of the transformer's solid insulation structure.

[0091] Reference Figure 2 The diagram shown is a schematic representation of the transmission of terahertz pulses in the copper windings of a transformer solid insulation structure using a terahertz optical parameter extraction method for a transformer solid insulation structure according to an embodiment of the present invention.

[0092] Understandably, Figure 2 It includes a terahertz pulse transceiver, which emits terahertz pulses onto the front of the insulating paper of the copper winding structure to obtain the front reflected signal and the refraction and reflection signal after penetrating the insulating layer.

[0093] Reference Figure 3 The diagram shown is a schematic representation of the transmission of a terahertz pulse in the enclosure of a transformer solid insulation structure using a terahertz optical parameter extraction method for a transformer solid insulation structure according to an embodiment of the present invention.

[0094] Understandably, Figure 3 It includes a terahertz pulse transceiver, which emits terahertz pulses toward the front of the insulating paper of the screen structure to obtain the front reflected signal and the refraction and reflection signal after penetrating the insulating layer.

[0095] Reference Figure 4 The diagram shown is a schematic representation of the transmission of a terahertz pulse in the insulating pad of a transformer solid insulation structure using a terahertz optical parameter extraction method provided in an embodiment of the present invention.

[0096] Understandably, Figure 4The device includes a terahertz pulse transceiver and an optical plane mirror. The terahertz pulse transceiver emits terahertz pulses to the front of the insulating paper of the insulating pad to obtain the front reflection signal of the insulating pad. The optical plane mirror emits terahertz pulses at the same position on the insulating paper of the insulating pad and uses the terahertz pulse receiving device in the terahertz pulse transceiver to obtain the optical front reflection signal.

[0097] like Figure 5 The image shown is a schematic diagram of the terahertz time-domain spectrum of the copper winding of the transformer solid insulation structure, which is provided by the terahertz optical parameter extraction method for the transformer solid insulation structure according to an embodiment of the present invention.

[0098] like Figure 6 The diagram shown is a schematic of the copper winding absorption coefficient of the transformer solid insulation structure, which is part of the terahertz optical parameter extraction method for transformer solid insulation structures provided in an embodiment of the present invention.

[0099] like Figure 7 The diagram shown is a functional block diagram of a terahertz optical parameter extraction device for a transformer solid insulation structure provided in an embodiment of the present invention.

[0100] The terahertz optical parameter extraction device 100 for a transformer solid insulation structure described in this invention can be installed in an electronic device. Depending on the functions implemented, the terahertz optical parameter extraction device 100 for a transformer solid insulation structure may include a terahertz time-domain spectrum acquisition module 101, a terahertz frequency-domain signal processing module 102, and an absorption coefficient calculation module 103.

[0101] The module described in this invention can also be called a unit, which refers to a series of computer program segments that can be executed by the processor of an electronic device and can perform a fixed function, and are stored in the memory of the electronic device.

[0102] In this embodiment, the functions of each module / unit are as follows:

[0103] The terahertz time-domain spectrum acquisition module 101 is used to acquire the terahertz time-domain spectrum of the transformer solid insulation structure, wherein the terahertz time-domain spectrum of the transformer solid insulation structure is acquired by the reflection method.

[0104] The terahertz frequency domain signal processing module 102 is used to separate the reference signal and the sample signal in the terahertz time domain spectrum, convert the reference signal into a reference terahertz frequency domain signal, and convert the sample signal into a sample terahertz frequency domain signal; calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio.

[0105] The absorption coefficient calculation module 103 is used to calculate the terahertz frequency domain absorption coefficient of the transformer solid insulation structure based on the amplitude and phase using Fresnel's formula and the electromagnetic wave propagation factor.

[0106] like Figure 8 The diagram shown is a schematic diagram of an electronic device that implements a method for extracting terahertz optical parameters of a transformer solid insulation structure, according to an embodiment of the present invention.

[0107] The electronic device may include a processor 10, a memory 11, a communication bus 12, and a communication interface 13. It may also include a computer program stored in the memory 11 and capable of running on the processor 10, such as a program for extracting terahertz optical parameters of a transformer solid insulation structure.

[0108] In some embodiments, the processor 10 may be composed of integrated circuits, such as a single packaged integrated circuit or multiple integrated circuits with the same or different functions, including combinations of one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and various control chips. The processor 10 is the control unit of the electronic device, connecting various components of the entire electronic device through various interfaces and lines. It executes programs or modules stored in the memory 11 (e.g., a program for extracting terahertz optical parameters of a transformer solid insulation structure) and calls data stored in the memory 11 to perform various functions of the electronic device and process data.

[0109] The memory 11 includes at least one type of readable storage medium, including flash memory, portable hard drive, multimedia card, card-type memory (e.g., SD or DX memory), magnetic memory, disk, optical disk, etc. In some embodiments, the memory 11 can be an internal storage unit of an electronic device, such as a portable hard drive. In other embodiments, the memory 11 can be an external storage device of the electronic device, such as a plug-in portable hard drive, Smart Media Card (SMC), Secure Digital (SD) card, Flash Card, etc. Furthermore, the memory 11 can include both internal and external storage units of the electronic device. The memory 11 can be used not only to store application software and various types of data installed on the electronic device, such as the code of a terahertz optical parameter extraction method program for a transformer solid insulation structure, but also to temporarily store data that has been output or will be output.

[0110] The communication bus 12 can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. This bus can be divided into an address bus, a data bus, a control bus, etc. The bus is configured to enable communication between the memory 11 and at least one processor 10, etc.

[0111] The communication interface 13 is used for communication between the aforementioned electronic device and other devices, including a network interface and a user interface. Optionally, the network interface may include a wired interface and / or a wireless interface (such as a Wi-Fi interface, Bluetooth interface, etc.), typically used to establish communication connections between the electronic device and other electronic devices. The user interface may be a display, an input unit (such as a keyboard), or optionally, a standard wired or wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, or an OLED (Organic Light-Emitting Diode) touchscreen, etc. The display may also be appropriately referred to as a screen or display unit, used to display information processed in the electronic device and to display a visual user interface.

[0112] Figure 8 Only electronic devices with components are shown; it will be understood by those skilled in the art that... Figure 8 The structure shown does not constitute a limitation on the electronic device and may include fewer or more components than shown, or combine certain components, or have different component arrangements.

[0113] For example, although not shown, the electronic device may also include a power supply (such as a battery) to power the various components. Preferably, the power supply can be logically connected to the at least one processor 10 through a power management device, thereby enabling functions such as charging management, discharging management, and power consumption management. The power supply may also include one or more DC or AC power supplies, recharging devices, power fault detection circuits, power converters or inverters, power status indicators, and other arbitrary components. The electronic device may also include various sensors, Bluetooth modules, Wi-Fi modules, etc., which will not be described in detail here.

[0114] It should be understood that the embodiments described are for illustrative purposes only and are not limited to this structure in the scope of the patent application.

[0115] The program for extracting terahertz optical parameters of a transformer solid insulation structure, stored in the memory 11 of the electronic device, is a combination of multiple instructions. When run in the processor 10, it can achieve the following:

[0116] The terahertz time-domain spectrum of the solid insulation structure of the transformer was obtained by the reflection method.

[0117] Separate the reference signal and sample signal in the terahertz time-domain spectrum, and convert the reference signal into a reference terahertz frequency domain signal, and the sample signal into a sample terahertz frequency domain signal;

[0118] Calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio;

[0119] The terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using Fresnel's formula and electromagnetic wave propagation factor based on amplitude and phase.

[0120] Specifically, the specific implementation method of the processor 10 for the above instructions can be referred to the description of the relevant steps in the corresponding embodiment of the accompanying drawings, and will not be repeated here.

[0121] Furthermore, if the modules / units integrated in the electronic device 1 are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. The computer-readable storage medium can be volatile or non-volatile. For example, the computer-readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, or a read-only memory (ROM).

[0122] The present invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor of an electronic device, can perform the following:

[0123] The terahertz time-domain spectrum of the solid insulation structure of the transformer was obtained by the reflection method.

[0124] Separate the reference signal and sample signal in the terahertz time-domain spectrum, and convert the reference signal into a reference terahertz frequency domain signal, and the sample signal into a sample terahertz frequency domain signal;

[0125] Calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio;

[0126] The terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using Fresnel's formula and electromagnetic wave propagation factor based on amplitude and phase.

[0127] In the several embodiments provided by this invention, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules is only a logical functional division, and other division methods may be used in actual implementation.

[0128] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0129] Furthermore, the functional modules in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in the form of hardware plus software functional modules.

[0130] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0131] Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be embraced within the invention. No appended diagram markings in the claims should be construed as limiting the scope of the claims.

[0132] The blockchain referred to in this invention is a novel application model of computer technologies such as distributed data storage, peer-to-peer transmission, consensus mechanisms, and encryption algorithms. Essentially, a blockchain is a decentralized database, a chain of data blocks linked together using cryptographic methods. Each data block contains information about a batch of network transactions, used to verify the validity of the information (anti-counterfeiting) and generate the next block. A blockchain can include an underlying blockchain platform, a platform product service layer, and an application service layer.

[0133] The embodiments of this application can acquire and process relevant data based on artificial intelligence technology. Artificial intelligence (AI) refers to the theories, methods, technologies, and application systems that use digital computers or machines controlled by digital computers to simulate, extend, and expand human intelligence, perceive the environment, acquire knowledge, and use that knowledge to obtain optimal results.

[0134] Furthermore, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices recited in a system claim may also be implemented by a single unit or device through software or hardware. The terms "first," "second," etc., are used to indicate names and do not indicate any specific order.

[0135] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.

Claims

1. A method for extracting terahertz optical parameters of a transformer solid insulation structure, characterized in that, The method includes: The terahertz time-domain spectrum of the solid insulation structure of a transformer is obtained by means of a reflection method. The process of obtaining the terahertz time-domain spectrum of the solid insulation structure of the transformer by means of a reflection method includes: for the copper winding structure and the screen structure in the solid insulation structure of the transformer, a terahertz pulse is emitted to the front of the insulating paper of the copper winding structure and the screen structure using a reflection method to obtain the front reflection signal and the refracted reflection signal after penetrating the insulating layer, and the terahertz time-domain spectrum of the copper winding structure and the screen structure is constructed using the front reflection signal and the refracted reflection signal; for the insulating pad in the solid insulation structure of the transformer, a terahertz pulse is emitted to the front of the insulating paper of the insulating pad using a reflection method to obtain the front reflection signal of the insulating pad, and an optical front reflection signal is obtained at the same position on the insulating paper of the insulating pad using an optical plane mirror, and the terahertz time-domain spectrum of the insulating pad is constructed using the front reflection signal of the insulating pad and the optical front reflection signal; Separate the reference signal and sample signal in the terahertz time-domain spectrum, and convert the reference signal into a reference terahertz frequency domain signal, and the sample signal into a sample terahertz frequency domain signal; The ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated, and the amplitude and phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal are calculated based on this ratio. Specifically, calculating the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal includes, for the copper winding structure and the screen structure in the solid insulation structure of a transformer, using the following formula to calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal. : ;in, These represent the electromagnetic field components of the sample signals in the copper winding structure and the enclosure structure. , This represents the straight-line distance from the terahertz probe to the sample surface. The incident angle of the terahertz pulse. The initial terahertz pulse electric field magnetic intensity before it is incident on the sample. This represents the transmission coefficient of the terahertz pulse as it transitions from air to the surface of the insulating paper. This represents the transmission coefficient of the terahertz pulse as it transitions from the surface of the insulating paper to the air. Let be the reflection coefficient of the terahertz pulse from the insulating paper to the dielectric x. The electromagnetic field components of the reference signal in the copper winding structure and the enclosure structure. , The reflection coefficient is the terahertz pulse transitioning from air to the surface of the insulating paper. Let d be the propagation factor of electromagnetic waves in the insulating paper, where d is the thickness of the insulating paper. The propagation angle of the terahertz pulse in the insulating paper; For the insulating pads in the solid insulation structure of a transformer, the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal is calculated using the following formula. : ;in, This is a sample signal of the insulating pad. This serves as a reference signal for the insulating pad. The complex refractive index of the insulating paper; The terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using the Fresnel formula and the electromagnetic wave propagation factor based on amplitude and phase. This calculation includes: For the copper winding structure and the enclosure structure in the solid insulation structure of a transformer, the terahertz frequency domain absorption coefficient is calculated using the following formula in the copper winding structure. : ;in, The amplitude of the copper winding structure. The refractive index of the insulating paper for the copper winding structure; In the enclosure structure, the terahertz frequency domain absorption coefficient is calculated using the following formula. : ;in, The amplitude of the screen structure. is the refractive index of the insulating paper in the screen structure.

2. The method for extracting terahertz optical parameters of a transformer solid insulation structure as described in claim 1, characterized in that, Separating the reference signal and sample signal in a terahertz time-domain spectrum includes: For the copper winding structure and the screen structure in the solid insulation structure of the transformer, the front reflection signal is used as the reference signal and the reflection signal after penetrating the insulation layer is used as the sample signal using a preset windowing function. For the insulating pads in the solid insulation structure of the transformer, the optical front reflection signal is used as the reference signal and the front reflection signal of the insulating pad is used as the sample signal by using a preset windowing function.

3. The method for extracting terahertz optical parameters of a transformer solid insulation structure as described in claim 2, characterized in that, Converting a reference signal to a reference terahertz frequency domain signal, and converting a sample signal to a sample terahertz frequency domain signal, includes: The reference signal is converted to a reference terahertz frequency domain signal, and the sample signal is converted to a sample terahertz frequency domain signal using the following formulas: ； in, The frequency of the terahertz pulse. It is a terahertz frequency domain signal. For frequency Lower terahertz pulse intensity For frequency Phase delay of lower terahertz pulses The imaginary unit, It is an exponential function.

4. The method for extracting terahertz optical parameters of a transformer solid insulation structure as described in claim 1, characterized in that, The terahertz frequency domain absorption coefficient of the transformer's solid insulation structure is calculated using Fresnel's formula and the electromagnetic wave propagation factor based on amplitude and phase, including: For the insulating pads in the solid insulation structure of a transformer, the terahertz frequency domain absorption coefficient is calculated using the following formula. : ； in, The speed of electromagnetic wave propagation. The amplitude of the insulating pad. The phase of the terahertz frequency domain signal of the sample in the insulating pad is compared to the phase of the reference terahertz frequency domain signal.

5. A terahertz optical parameter extraction device for a transformer solid insulation structure, characterized in that, The apparatus is used to implement the terahertz optical parameter extraction method for transformer solid insulation structures as described in any one of claims 1 to 4, the apparatus comprising: The terahertz time-domain spectrum acquisition module is used to acquire the terahertz time-domain spectrum of the transformer solid insulation structure, wherein the terahertz time-domain spectrum of the transformer solid insulation structure is acquired by the reflection method; The terahertz frequency domain signal processing module is used to separate the reference signal and the sample signal in the terahertz time domain spectrum, convert the reference signal into a reference terahertz frequency domain signal, and convert the sample signal into a sample terahertz frequency domain signal; calculate the ratio of the sample terahertz frequency domain signal to the reference terahertz frequency domain signal, and calculate the amplitude and the phase of the sample terahertz frequency domain signal relative to the reference terahertz frequency domain signal based on the ratio; The absorption coefficient calculation module is used to calculate the terahertz frequency domain absorption coefficient of the solid insulation structure of a transformer based on the amplitude and phase using Fresnel's formula and the electromagnetic wave propagation factor.

6. An electronic device, characterized in that, The electronic device includes: At least one processor; and, A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the terahertz optical parameter extraction method for transformer solid insulation structures as described in any one of claims 1 to 4.

7. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements the terahertz optical parameter extraction method for the solid insulation structure of a transformer as described in any one of claims 1 to 4.

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