SAR ADC-based sampling and conversion methods, chips, and devices
By monitoring the operation of the internal power circuit of the chip and delaying the sampling and conversion time, the accuracy and reliability problems of SAR ADC under noise interference are solved, achieving higher conversion accuracy and system stability, which is suitable for mobile terminals, automotive electronics and communication equipment.
Patent Information
- Application Number
- CN202511716387.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-21
- Publication Date
- 2026-06-02
- Estimated Expiration
- 2045-11-21
AI Technical Summary
Noise and current transient interference generated by high-power drive and power supply chips during operation can be coupled to the chip pins through board-level parasitic parameters or spatial electromagnetic fields, resulting in a decrease in the conversion accuracy and reliability of SAR ADCs, especially when the analog-to-digital converter is integrated inside the chip.
By monitoring the operation of the internal power circuit of the chip, delaying the sampling and conversion stages to avoid system interference and ensure voltage stability, a digital logic control strategy is adopted to dynamically adjust the delay time to adapt to different interference conditions.
It significantly improves the conversion accuracy and reliability of SAR ADCs in harsh power environments, avoids the impact of interference on conversion results, and is low in cost and requires no changes to the hardware circuit.
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Figure CN121567126B_ABST
Abstract
Citation Information
Patent Citations
Method and apparatus for subclocking a sar analog-to-digital converter
CN1981442A