Main shaft fault detection method

Abstract

The invention discloses a main shaft fault detection method, which is used for performing fault detection through main shaft fault detection equipment, and comprises the following steps: collecting multiple paths of voltage signals of an encoder of a main shaft to be detected, and generating a test curve according to the voltage signals; wherein the voltage signals comprise an S-path voltage signal, a C-path voltage signal and a Z-path voltage signal; determining output test data corresponding to the encoder according to the multiple paths of voltage signals; wherein the output test data comprises at least one of bias data, phase data, amplitude data and deviation data; and determining a fault detection result corresponding to the to-be-detected main shaft according to the output test data or the test curve. According to the method, the state of the spindle can be directly detected through the encoder signal, the spindle does not need to be disassembled or depends on a large professional instrument, related faults of the spindle can be conveniently and rapidly diagnosed on site, and the troubleshooting difficulty and time cost of the faults of the spindle are reduced. The method can be widely applied to the technical field of industry.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of industry, and particularly relates to a main shaft fault detection method. BACKGROUND

[0002] In industrial manufacturing, a machine tool is referred to as an industrial mother machine. The machine tool needs to be matched with each other among a system, a driver, a main shaft and peripheral components during operation. During use, abnormal conditions such as system alarm and poor machining effect often occur. Since the system, the driver and the main shaft are closely related to each other, when the alarm and the abnormal condition occur, maintenance and repair are relatively complex. The cause of the system alarm may be system parameter error, abnormal connection, signal interference, main shaft fault, encoder abnormality and the like, and the cause of the poor machining effect may be system parameter mismatch, large main shaft vibration, poor main shaft encoder precision, poor main shaft signal, main shaft fault and the like. In order to determine the cause of the abnormality, a technician often needs to check the faults one by one, and often needs to check the main shaft after disassembly. The disassembly process is difficult, and other components are easily damaged. The checking method is complex, the checking difficulty is high, a great amount of time is consumed, the maintenance and repair time is long, and great inconvenience is brought to production.

[0003] In the related art, in order to check the above problems, large professional equipment such as an oscilloscope and a dynamic balance instrument is generally needed to accurately check, but such equipment is large in size, not easy to carry, and needs to be powered by an independent power supply, so it is difficult to use in a factory site. In addition, the equipment needs to be manually adjusted and measured during use, and the operation is complex, so it is not easy to use for maintenance and detection. In some technical solutions, an instrument such as a multimeter is used for detection. Although the instrument is convenient to carry, the detection content is limited, and it is difficult to truly find out the cause of the problem, especially in the aspect of main shaft precision inspection, the multimeter cannot be used for measurement at all, and the practicability is low. For problems such as rusting and wear of an encoder disc, main shaft fault and large main shaft runout, in the current detection method, a technician needs to disassemble the main shaft from the machine tool, perform concentricity detection and dynamic balance detection, disassemble the main shaft, take out the encoder disc, check the appearance of the encoder disc using a magnifying glass, check whether the tooth shape of the encoder disc meets the requirements, whether the surface of the encoder disc is rusted and worn, and the like, and after detection, the main shaft needs to be reassembled, concentricity detection and dynamic balance detection are performed again, and then the main shaft is installed in the machine tool. The process is complex, the repetition is high, a long time is consumed, and the detection cost is high.

[0004] In summary, the problems in the related art need to be solved. SUMMARY

[0005] The present application aims to at least partly solve one of the problems in the related art.

[0006] Therefore, an object of embodiments of the present application is to provide a main shaft fault detection method.

[0007] To achieve the above technical purposes, the technical solutions adopted by the embodiments of the present application comprise: In one aspect, the present application provides a main shaft fault detection method, which is used for fault detection by a main shaft fault detection device, and the method comprises: Collecting a plurality of voltage signals of an encoder of a main shaft to be detected, and generating a test curve according to the voltage signals; wherein the voltage signals comprise S-channel voltage signals, C-channel voltage signals, and Z-channel voltage signals; Determining output test data corresponding to the encoder according to the plurality of voltage signals; wherein the output test data comprises at least one of bias data, phase data, amplitude data, and deviation data; Determining a fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve.

[0008] In addition, the main shaft fault detection method according to the above-mentioned embodiments of the present application can further have the following additional technical features: Further, in one embodiment of the present application, the determining of the output test data corresponding to the encoder according to the plurality of voltage signals comprises: Continuously collecting a plurality of voltage data on each of the voltage signals, and determining a maximum voltage value and a minimum voltage value in the plurality of voltage data; Determining initial bias data according to the maximum voltage value and the minimum voltage value; Determining a period and a starting phase of the voltage signals according to the initial bias data; Determining the bias data and the amplitude data according to voltage data of each of the voltage signals in a plurality of periods; Determining the phase data and the deviation data according to voltage data of different voltage signals in a plurality of periods.

[0009] Further, in one embodiment of the present application, the determining of the period of the voltage signals according to the initial bias data comprises: Detecting a first time point when voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the first time, and detecting a second time point when voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the second time; Determining the period of the voltage signals according to a difference between the second time point and the first time point.

[0010] Further, in one embodiment of the present application, the determining of the fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve comprises: By comparing the standard curve and the test curve, a fault detection result corresponding to the main shaft to be detected is determined; According to the size of the output test data, a fault detection result corresponding to the main shaft to be detected is determined.

[0011] Further, in an embodiment of the present application, the method further comprises: In the case that the main shaft to be detected rotates continuously, first test data corresponding to multiple paths of the voltage signals are determined; According to the first test data, fluctuation test data corresponding to the encoder are determined; According to the fluctuation test data, a fault detection result corresponding to the main shaft to be detected is determined.

[0012] Further, in an embodiment of the present application, the determination of the fluctuation test data corresponding to the encoder according to the first test data comprises: Taking the Z-path voltage signal of the encoder as a reference, the number of rotations of the main shaft to be detected and the signal period in each rotation are determined; Based on the first test data, the amplitude data, the bias data and the phase data corresponding to each signal period are calculated; According to the changes of the amplitude data, the bias data and the phase data in multiple signal periods, the amplitude fluctuation data, the bias fluctuation data and the phase fluctuation data are generated.

[0013] Further, in an embodiment of the present application, the main shaft fault detection device comprises: a housing, a display screen, an input interface, a power module and a circuit board; The input interface is arranged on one side of the housing, the display screen is arranged on the surface of the housing, and the power module and the circuit board are arranged in the interior of the housing; The input interface is used for accessing the encoder signal of the main shaft to be detected and transmitting the encoder signal to the circuit board; the circuit board comprises a microprocessor circuit, a power supply circuit, a sampling circuit and a communication circuit, the input end of the power supply circuit is connected to the power module, and the output end of the power supply circuit is used for supplying power to the display screen, the microprocessor circuit, the sampling circuit and the communication circuit; the sampling circuit is connected to the input interface and the microprocessor circuit, and is used for transmitting the encoder signal to the microprocessor circuit for processing; the microprocessor circuit is connected to the communication circuit and the display screen, and the display screen is used for displaying the detection result of the encoder signal of the main shaft to be detected, the detection result comprising test data and a test curve.

[0014] Further, in one embodiment of the present application, the power supply module comprises a power supply interface and a rechargeable battery, an input end of the power supply interface is used to access an external power supply, and an output end of the power supply interface is connected to the rechargeable battery and the power supply circuit.

[0015] Further, in one embodiment of the present application, the sampling circuit comprises a two-way switch chip and a differential operation circuit. An input end of the two-way switch chip is used to access the encoder signal, an output end of the two-way switch chip is connected to an input end of the differential operation circuit, and an output end of the differential operation circuit is connected to the microprocessor circuit.

[0016] Further, in one embodiment of the present application, the differential operation circuit comprises a first signal input port, a second signal input port, a signal output port, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, a sixteenth resistor, a seventeenth resistor, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, an IC chip, and a fourteenth capacitor. The first signal input port is connected to a first end of the sixteenth resistor and a first end of the thirteenth resistor, a second end of the thirteenth resistor is connected to a first end of the fourteenth resistor and a second pin of the IC chip, and a second end of the fourteenth resistor is connected to the signal output port and a first pin of the IC chip; the second signal input port is connected to a second end of the sixteenth resistor and a first end of the fifteenth resistor, a second end of the fifteenth resistor is connected to a third pin of the IC chip and a first end of the seventeenth resistor, a fourth pin of the IC chip is grounded, a second end of the seventeenth resistor is connected to a seventh pin of the IC chip, a first end of the twentieth resistor, and a first end of the fourteenth capacitor, a second end of the twentieth resistor and a second end of the fourteenth capacitor are connected to a sixth pin of the IC chip, an eighth pin of the IC chip is connected to a power supply, a fifth pin of the IC chip is connected to a first end of the eighteenth resistor and a first end of the nineteenth resistor, a second end of the eighteenth resistor is connected to the power supply, and a second end of the nineteenth resistor is grounded.

[0017] The advantages and beneficial effects of the present application will be partially given in the following description, partially will become obvious from the following description, or will be learned by the practice of the present application: The main shaft fault detection method disclosed in the embodiments of the present application is used for fault detection by a main shaft fault detection device, and the method comprises the following steps: collecting a plurality of voltage signals of an encoder of a main shaft to be detected, and generating a test curve according to the voltage signals; wherein the voltage signals comprise S-channel voltage signals, C-channel voltage signals and Z-channel voltage signals; determining output test data corresponding to the encoder according to the plurality of voltage signals; wherein the output test data comprises at least one of bias data, phase data, amplitude data and deviation data; and determining a fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve. The method can directly detect the state of the main shaft through the encoder signals, without the need to disassemble the main shaft or rely on large professional instruments, so that the main shaft related faults can be quickly diagnosed on site, and the difficulty and time cost of troubleshooting of the main shaft faults are reduced. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following introduces the drawings of the related technical solutions in the embodiments of the present application or the prior art. It should be understood that the drawings in the following introduction are only for the convenience of clearly describing some embodiments of the technical solutions in the present application, and other drawings can be obtained by those skilled in the art without creative labor on the premise that they do not need to be creative.

[0019] Figure 1 The structural schematic diagram of a main shaft fault detection device provided in the embodiments of the present application is shown in the figure. Figure 2 The structural schematic diagram of a circuit board provided in the embodiments of the present application is shown in the figure. Figure 3 The structural schematic diagram of a power supply circuit provided in the embodiments of the present application is shown in the figure. Figure 4 The schematic diagram of a sampling circuit provided in the embodiments of the present application is shown in the figure. Figure 5 The flowchart of a main shaft fault detection method provided in the embodiments of the present application is shown in the figure. Figure 6 The user interface schematic diagram of a main shaft fault detection device provided in the embodiments of the present application is shown in the figure. Figure 7 The user interface schematic diagram of another main shaft fault detection device provided in the embodiments of the present application is shown in the figure. DETAILED DESCRIPTION

[0020] The present application will be further described below in combination with the drawings of the specification and specific embodiments. The described embodiments should not be regarded as limiting the present application, and all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0021] In the following description, reference is made to "some embodiments", which describe a subset of all possible embodiments, but it is to be understood that "some embodiments" can be the same subset or different subsets as each other and as other subsets of all possible embodiments, and can be combined with each other and with other subsets of all possible embodiments without conflict.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description herein is for describing the embodiments of the application only and is not intended to be limiting of the application.

[0023] In industrial manufacturing, the machine tool is called the industrial mother machine, and the machine tool needs to be matched with each other between the system, the driver and the spindle and the peripheral components during operation. During use, abnormal situations such as system alarm and poor machining effect often occur. Since the machine tool system, the driver and the spindle are closely related, when an alarm and an abnormality occur, maintenance and repair are relatively complex. Among them, the reasons for causing the system alarm can be system parameter error, abnormal wiring, signal interference, spindle failure, encoder abnormality, etc., and the reasons for causing poor machining effect can be system parameter mismatch, large spindle vibration, poor spindle encoder precision, poor spindle signal, spindle failure, etc. In order to determine the cause of the abnormality, the technician often needs to troubleshoot one by one, often needs to disassemble the spindle for inspection, the disassembly process is difficult, and other parts are easily damaged, the troubleshooting method is complex, the troubleshooting difficulty is high, the time cost is huge, the maintenance time is long, and great inconvenience is brought to production.

[0024] In the related art, in order to troubleshoot the above problems, large professional equipment such as an oscilloscope and a dynamic balance instrument is generally needed to accurately troubleshoot, but such equipment is often large in size and not easy to carry, and needs to be powered by an independent power supply, which is difficult to use on the factory site. Moreover, manual debugging and measurement are needed during use, and the operation is complex, which is not easy for maintenance and detection. In some technical solutions, an instrument such as a multimeter is used for detection, which is convenient to carry, but the detection content is limited, and it is difficult to truly find out the problem cause, especially in spindle precision inspection, the multimeter cannot be measured at all, and the practicality is very low. For problems such as rusting and wear of the encoder disc, spindle failure, and large spindle runout, the technician needs to disassemble the spindle from the machine tool, perform concentricity detection and dynamic balance detection, and at the same time, needs to disassemble the spindle, take out the encoder disc, and use a magnifying glass to check the appearance of the encoder disc, check whether the tooth shape meets the requirements, whether the surface is rusty and worn, etc. After detection, the spindle needs to be reassembled, and after performing concentricity detection and dynamic balance detection again, the spindle is installed into the machine tool, the process is complex, the repeatability is high, the time cost is long, and the detection cost is high.

[0025] Therefore, the main shaft fault detection device provided in the embodiments of the present application comprises a shell, a display screen, an input interface, a power module and a circuit board. The input interface is used to input the encoder signal of the main shaft to be detected and transmit the encoder signal to the circuit board. The circuit board is integrated with a microprocessor circuit, a power supply circuit, a sampling circuit and a communication circuit. The power supply circuit distributes the power of the power module to each component. The sampling circuit sends the encoder signal to the microprocessor circuit for analysis and processing. The microprocessor circuit transmits the processing result to the display screen through the communication circuit for display. The detection result comprises test data and a test curve. The device can directly detect the state of the main shaft through the encoder signal, without disassembling the main shaft or relying on large professional instruments, so that the main shaft related faults can be quickly diagnosed on site, and the difficulty and time cost of troubleshooting of the main shaft faults are reduced.

[0026] In the embodiments of the present application, a main shaft fault detection method based on the above main shaft fault detection device is also provided. Hereinafter, the main shaft fault detection device in the embodiments of the present application is first explained and described.

[0027] Reference Figure 1 In the embodiments of the present application, the main shaft fault detection device mainly comprises: a shell 1, a display screen 2, an input interface 3, a power module and a circuit board; The input interface is arranged on one side of the shell, the display screen is arranged on the surface of the shell, and the power module and the circuit board are arranged in the interior of the shell. The input interface is used to input the encoder signal of the main shaft to be detected and transmit the encoder signal to the circuit board. The circuit board comprises a microprocessor circuit, a power supply circuit, a sampling circuit and a communication circuit. The input end of the power supply circuit is connected to the power module, and the output end of the power supply circuit is used to supply power to the display screen, the microprocessor circuit, the sampling circuit and the communication circuit. The sampling circuit is connected to the input interface and the microprocessor circuit, and is used to transmit the encoder signal to the microprocessor circuit for processing. The microprocessor circuit is connected to the communication circuit and the display screen. The display screen is used to display the detection result of the encoder signal of the main shaft to be detected. The detection result comprises test data and a test curve.

[0028] In the embodiments of the present application, the main shaft fault detection device comprises a shell, a display screen, an input interface, a power module and a circuit board. Figure 1As shown, the whole can be set as the style of test box, including shell, display screen, input interface, power module and circuit board and other components, wherein the shell is used as the external structure of the device, for accommodating and protecting the internal components, so that it is firm and durable, convenient for on-site carrying and using. The display screen is set on the surface of the shell, as the output part of the human-computer interaction interface, for intuitively displaying the detection results processed by the microprocessor circuit, which can include specific test data (such as waveform frequency, amplitude) and dynamic test curve (such as the waveform graph of the encoder signal) and the like, but is not limited to this. The input interface is located on one side of the shell, which is the key signal input channel of the detection device, and can be specially used for connecting the encoder signal line of the main shaft to be detected (such as directly connecting the female connector corresponding to the encoder), so as to introduce the encoder signal into the device for analysis. The power module is built-in in the shell, which can provide working power for the whole device, and usually can adopt battery or external adapter power supply to meet the demand of on-site portable use.

[0029] In the embodiment of the application, the circuit board is the core component of the main shaft fault detection device, which is set in the shell, and a plurality of functional circuits are integrated thereon, please refer to Figure 2 , Figure 2 The structure schematic diagram of a circuit board provided in the embodiment of the application is shown, which can include microprocessor circuit, power supply circuit, sampling circuit and communication circuit. Among them, the microprocessor circuit is responsible for receiving signals and performing core operation and analysis, which is the calculation and processing center of the device. The sampling circuit is connected with the input interface, which is responsible for receiving and preliminarily processing the encoder signal, and then transmitting it to the microprocessor circuit. The power supply circuit is connected with the power module, which converts, stabilizes and distributes the voltage output to the display screen, microprocessor circuit, sampling circuit and other parts, so as to realize the overall power supply of the device. The communication circuit can be used to connect with the external terminal through the communication interface 5, so as to transmit data and convert the detection results into report output. The components in the circuit board work cooperatively, which can realize the convenient and rapid acquisition and analysis of the main shaft encoder signal.

[0030] In some embodiments, the main shaft fault detection device can also include other components, such as Figure 1 The switch 6 shown in the above can be used to control the start and stop of the device. Of course, the skilled in the art can also flexibly adjust the component setting of the main shaft fault detection device according to the specific needs, and the application does not limit this.

[0031] It can be understood that the main shaft fault detection device provided in the embodiment of the application comprises a shell, a display screen, an input interface, a power module and a circuit board. The input interface is used for inputting an encoder signal of a main shaft to be detected and transmitting the encoder signal to the circuit board. The circuit board integrates a microprocessor circuit, a power supply circuit, a sampling circuit and a communication circuit. The power supply circuit distributes power of the power module to each component. The sampling circuit sends the encoder signal to the microprocessor circuit for analysis and processing. The microprocessor circuit transmits a processing result to the display screen for display through the communication circuit. The detection result comprises test data and a test curve. The device can directly detect the state of the main shaft through the encoder signal, without disassembling the main shaft or relying on large professional instruments, so that the device is convenient for quickly diagnosing main shaft related faults on site, and reduces the difficulty and time cost of troubleshooting of the main shaft fault.

[0032] Specifically, in some embodiments, the power module comprises a power interface 4 and a rechargeable battery. An input end of the power interface is used for connecting an external power source. An output end of the power interface is connected to the rechargeable battery and the power supply circuit.

[0033] In the embodiment of the application, the power module can be designed as a flexible power supply scheme, which comprises a power interface and a rechargeable battery. An input end of the power interface is used for connecting an external power adapter to introduce external power. The output end of the power interface has a dual function. On the one hand, it is directly connected to the power supply circuit to directly provide power required for operation of the device. On the other hand, it is connected to the rechargeable battery, which can be charged when the external power source is connected. This design enables the device to work for a long time in a fixed power supply environment and to be used in a portable and mobile manner by relying on the battery energy storage, effectively meeting the power supply requirements of different working conditions in the factory site and enhancing the practicability and convenience of the device.

[0034] Specifically, in some embodiments, the power supply circuit comprises a power supply protection circuit, a battery charging and discharging circuit, a power automatic switching circuit and a power conversion circuit.

[0035] In the embodiment of the application, the power supply circuit can comprise a power supply protection circuit, a battery charging and discharging circuit, a power automatic switching circuit and a power conversion circuit. For example, please refer to Figure 3 , Figure 3 A structure schematic diagram of a power supply circuit provided in the embodiment of the application is shown. As Figure 3As shown, in the embodiment of the application, the power supply circuit can form an overvoltage and undervoltage protection circuit through the voltage stabilizing tube Z1 and the switch tubes Q1 and Q2. When the voltage is normal, the voltage stabilizing tube Z1 is disconnected, Q1 is normally turned on, Q2 is also normally turned on, and normal output is provided. When the voltage is too high, the voltage stabilizing tube is turned on, Q1 is disconnected, and the output is disconnected. When the voltage is too low, Q2 is disconnected, and a stable voltage is provided to the battery charging and discharging circuit. The battery and the external power supply are automatically selected through the triode Q3. When there is an external power supply VCC IN, Q3 is disconnected, and the external power supply is provided. When the external power supply VCC IN is disconnected, Q3 is turned on, and the battery is powered. D2 and D4 are used to isolate the external power supply and the battery, prevent the battery from supplying power externally, and prevent the external power supply from being directly supplied to the battery. The switch KEY is used for opening and closing. The chip U2 limits the output of the subsequent circuit by dividing the voltage through the resistors R10 and R12, prevents the battery from over-discharging, and converts the power supply circuit into the standard power supply required by the internal circuit.

[0036] Specifically, in some embodiments, the sampling circuit comprises a two-way switch chip and a differential operation circuit. The input end of the two-way switch chip is used to access the encoder signal, the output end of the two-way switch chip is connected to the input end of the differential operation circuit, and the output end of the differential operation circuit is connected to the microprocessor circuit.

[0037] Please refer to Figure 4 , Figure 4 A schematic diagram of a sampling circuit provided in the embodiment of the application is shown in Figure 4 As shown, the sampling circuit can comprise a two-way switch chip and a differential operation circuit, wherein the differential operation circuit comprises a first signal input port, a second signal input port, a signal output port, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, a sixteenth resistor, a seventeenth resistor, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, an IC chip, and a fourteenth capacitor. The first signal input port is connected with the first end of the sixteenth resistor and the first end of the thirteenth resistor, the second end of the thirteenth resistor is connected with the first end of the fourteenth resistor and the second pin of the IC chip, the second end of the fourteenth resistor is connected with the signal output port and the first pin of the IC chip; the second signal input port is connected with the second end of the sixteenth resistor and the first end of the fifteenth resistor, the second end of the fifteenth resistor is connected with the third pin of the IC chip and the first end of the seventeenth resistor, the fourth pin of the IC chip is grounded, the second end of the seventeenth resistor is connected with the sixth pin of the IC chip, the first end of the twentieth resistor and the first end of the fourteenth capacitor, the second end of the twentieth resistor and the second end of the fourteenth capacitor are connected with the sixth pin of the IC chip, the eighth pin of the IC chip is connected with a power supply, the fifth pin of the IC chip is connected with the first end of the eighteenth resistor and the first end of the nineteenth resistor, the second end of the eighteenth resistor is connected with the power supply, and the second end of the nineteenth resistor is grounded.

[0038] In the embodiment of the application, the differential signal can be received by the subtracting circuit composed of the integrated operational amplifier IC chip U1, the signal input end of which can be connected with the two optional switch chips U2 and U3, when 1W_EN is low, S+ and S- are input, when 1W_EN is high, S+ and S- are input through resistance division, for selecting different input voltages. Then, through the differential operational circuit, the first part of the circuit is raised through the eighteenth resistor R18 and the nineteenth resistor R19, so as to obtain a single-ended voltage that can be processed by the microprocessor circuit, and the three paths Figure 4 The sampling circuit shown can obtain S, C and Z three-path output signals that can be received by the microprocessor circuit.

[0039] In the embodiment of the application, the microprocessor circuit can be used for program processing, the received three-path signals are processed through program transformation to obtain the test data and test curve of the main shaft, and the information is sent to the display screen through data transmission for display, so that the output curve test function and the fluctuation test function can be realized.

[0040] Referring to Figure 5 , Figure 5 is a flowchart of a main shaft fault detection method provided in the embodiment of the application, which includes but is not limited to: Step 110, collecting a plurality of voltage signals of an encoder of a main shaft to be detected, and generating a test curve according to the voltage signals; wherein the voltage signals include an S-path voltage signal, a C-path voltage signal and a Z-path voltage signal; Step 120: Determine the output test data corresponding to the encoder based on the multi-channel voltage signals; wherein the output test data includes at least one of bias data, phase data, amplitude data, and deviation data; Step 130: Determine the fault detection result corresponding to the spindle to be tested based on the output test data or the test curve.

[0041] In this embodiment of the application, a spindle fault detection method is also provided, which can perform fault detection based on the aforementioned spindle fault detection equipment. Specifically, in step 110, multiple voltage signals output by the encoder of the spindle to be tested can be acquired. These signals typically include S-channel (sine / A-phase), C-channel (cosine / B-phase), and Z-channel (zero-position reference) signals, and an intuitive test curve is generated based on these raw voltage signals.

[0042] Subsequently, in step 120, the acquired multi-channel voltage signals are analyzed in depth to calculate key output test data for evaluating encoder performance. This data may include one or more of the following: bias data reflecting the DC component of the signal, phase data verifying the synchronicity between sine and cosine signals, amplitude data characterizing signal strength, and deviation data measuring signal waveform distortion. In step 130, the quantized output test data calculated in step 120 is combined with the visualized test curve generated in step 110, and compared with standard values ​​or ideal conditions to comprehensively judge and determine the specific fault detection result of the spindle under test, such as whether there is encoder damage, signal interference, poor installation concentricity, or encoder disk contamination. This method, through a signal acquisition-data analysis-comprehensive diagnosis process, achieves rapid and accurate diagnosis of the spindle status, locating faults without disassembly.

[0043] For example, please refer to Figure 6 , Figure 6 This illustration shows a user interface diagram of a spindle fault detection device provided in an embodiment of this application, such as... Figure 6 As shown in this embodiment, the display screen of the spindle fault detection device can display a relevant user interface, the upper part of which displays the measurement results of the key parameters of the encoder. These values ​​are the direct basis for diagnosing faults and may include: S-bias / amplitude and C-bias / amplitude, which correspond to the bias data and amplitude data of the S-channel (sine) and C-channel (cosine) signals, respectively, and are used to determine whether the signal strength is normal and whether there is attenuation. Figure 6 In the middle section, the P phase is displayed as 90 degrees, indicating that the phase difference between the S and C signals is normal. The Z offset / size / width corresponds to the characteristic parameters of the Z-channel (zero position) signal. The lower part can visually present the above parameters as waveform curves: the red waveform represents the S-channel signal, the green waveform represents the C-channel signal, and the blue waveform represents the Z-channel signal.

[0044] In some embodiments, the determining of the output test data corresponding to the encoder according to the plurality of voltage signals comprises: continuously collecting a plurality of voltage data on each of the voltage signals, and determining a maximum voltage value and a minimum voltage value in the plurality of voltage data; determining initial bias data according to the maximum voltage value and the minimum voltage value; determining a period and a starting phase of the voltage signals according to the initial bias data; determining the bias data and the amplitude data according to voltage data of each of the voltage signals in a plurality of periods; determining the phase data and the deviation data according to voltage data of different ones of the voltage signals in a plurality of periods.

[0045] In the embodiments, when the key output test data is calculated from the original voltage signals, a plurality of voltage points can be obtained by continuously sampling each of the signals (S, C and Z), and the maximum value and the minimum value can be found from the plurality of voltage points, and the initial bias of the signals, i.e., the direct current component of the signals, can be calculated according to the maximum value and the minimum value. Subsequently, the period characteristics and the starting phase point of the signals can be determined by using the initial bias data. On this basis, the voltage data of each of the signals in a plurality of continuous periods can be statistically analyzed, so that the bias data for evaluating the stability of the signals and the amplitude data reflecting the intensity of the signals can be accurately calculated. Furthermore, by comparing and analyzing the data of the S signal and the C signal in a plurality of periods, the phase data for testing the synchronization between the S signal and the C signal and the deviation data for measuring the difference between the waveforms of the signals and the ideal sine wave can be calculated. The progressive calculation process from the analysis of a single signal to the comparison of a plurality of signals in the embodiments realizes the comprehensive and quantitative evaluation of the quality of the encoder signals.

[0046] In some embodiments, the determining of the period of the voltage signals according to the initial bias data comprises: detecting a first time point at which the voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the first time, and detecting a second time point at which the voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the second time; determining the period of the voltage signals according to a difference between the second time point and the first time point.

[0047] In the embodiments of the present application, a practical method for accurately calculating a period by detecting a signal zero-crossing point is provided. The principle is that the initial bias data can be regarded as the "central axis" or zero level reference line of the signal waveform. When determining the period, the value change of the voltage signal can be monitored in real time first. When the signal voltage is detected to jump from a state lower than the initial bias data to higher than the initial bias data for the first time, the time point of crossing the "central axis" is recorded, that is, the first time point. Subsequently, the monitoring is continued and the second time point is recorded when the signal crosses the "central axis" from below to above after completing a complete fluctuation. The two time points respectively mark the start point of a sine wave period and the start point of the next period, and therefore the time difference between them is the period length of the voltage signal. In the embodiments of the present application, the period is defined by identifying the intersection of the signal and the reference line, and the calculation is simple and direct, which can effectively and accurately determine the frequency characteristics of the signal.

[0048] In the embodiments of the present application, when determining the fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve, the comparison between the standard curve and the test curve can be used for determination, or the size of the output test data can be used for determination.

[0049] Specifically, in some embodiments, the method further comprises: In the case that the main shaft to be detected rotates continuously, determining first test data corresponding to a plurality of voltage signals; According to the first test data, determining fluctuation test data corresponding to the encoder; According to the fluctuation test data, determining a fault detection result corresponding to the main shaft to be detected.

[0050] Specifically, in some embodiments, the determining, according to the first test data, of the fluctuation test data corresponding to the encoder comprises: Taking the Z-path voltage signal of the encoder as a reference, determining the number of rotations of the main shaft to be detected and the signal period in each rotation; Based on the first test data, calculating amplitude data, bias data and phase data corresponding to each signal period; According to the changes of the amplitude data, the bias data and the phase data in a plurality of signal periods, generating amplitude fluctuation data, bias fluctuation data and phase fluctuation data.

[0051] In this embodiment, the measurement is not limited to a single measurement of the spindle in a stable state; the spindle under test can also be continuously operated while rotating continuously. During this period, the device can continuously acquire multiple voltage signals and calculate a series of continuous first test data (e.g., continuous bias, amplitude, phase, and other data sequences). Subsequently, the method analyzes the fluctuation test data of these key parameters during spindle operation based on this series of dynamically changing first test data (e.g., calculating their standard deviation, the difference between the maximum and minimum values, etc.). The fluctuation test data obtained here is also important because it reveals the stability of the spindle's performance under dynamic working conditions. A high-performance spindle should have stable encoder signal parameters with minimal fluctuations; however, if there are potential faults such as bearing wear, loose encoder disk installation, or poor dynamic balance, even if the static measurement parameters are normal, large parameter fluctuations will be observed during continuous rotation. Therefore, by analyzing the fluctuation test data, it is possible to diagnose more hidden fault types that only appear during dynamic operation, thereby obtaining more comprehensive fault detection results.

[0052] The spindle fault detection method of this application will be introduced and explained below with specific application examples: In this embodiment of the application, when performing fault detection on the spindle, output test function detection and fluctuation test function detection can be performed. The output test function interface is shown in the attached figure. Figure 6 As shown. The top part is the test data, and the bottom part is the test curve. The specific implementation method is as follows: By continuously collecting S, C, Z three signal voltage, whenever detecting 500 (based on the number of signal cycle and sampling period) data, the maximum and minimum of the 500 data are calculated, the center value of the maximum and minimum is taken, the initial bias data is obtained, after obtaining the initial bias data, the data and the initial bias data are compared from the beginning, when the data is greater than the initial bias for one time, then less than the initial bias for one time, and then greater than the initial bias for one time, it is indicated that a cycle is collected, so that the cycle data and the cycle starting phase are obtained. The phase data can be obtained by comparing S and C signals, when the cycle is greater than 2, the S bias data and the C bias data can be obtained through the maximum and minimum, the S amplitude data and the C amplitude data can be obtained through the integral operation of the cycle data, by comparing different signals, the deviation data can be obtained, the collected voltage data is drawn into a curve and sent to the display screen for display, by comparing the standard curve, whether the output waveform is clean and whether the signal exists interference can be judged, when there is clutter, it is indicated that the alarm is caused by interference, shielding, grounding and other interference factors can be directly checked, when the amplitude of any one of the signals is 0 or only half of the other signal, it is indicated that there is a wiring error in the signal, the alarm is caused by wiring error, the wiring condition of the signal can be directly checked, when the bias data and the deviation data are abnormal or there is no output signal, it is indicated that the encoder is abnormal, the alarm is caused by the encoder, the performance of the encoder can be directly checked.

[0053] The fluctuation test function interface is as shown in the accompanying Figure 7 The upper part is test data and the lower part is test curve, and the specific implementation mode is as follows: By continuously collecting the data when the main shaft rotates, whenever the Z signal is detected, the collection of S amplitude, C amplitude, S offset, C offset, phase, amplitude deviation, offset deviation and other data is started. When the Z signal is collected again, it indicates that the main shaft has rotated a circle, in the above manner, the number of cycles in a circle is confirmed, and the amplitude data and offset data of each cycle are calculated. Taking the amplitude data of each cycle as the ordinate, the amplitude fluctuation curve can be obtained, and the maximum amplitude fluctuation data can be obtained. In this way, the data of another circle is collected, the offset data of each cycle in the two circles is compared, and this data is taken as the ordinate to obtain the offset fluctuation curve. The maximum offset fluctuation data can be obtained by taking the maximum offset fluctuation value. By comparing the number of cycles in two circles, the offset fluctuation data can be obtained. By comparing the data of multiple circles, the phase fluctuation curve can be obtained, and the maximum phase fluctuation data can be obtained. By observing different fluctuation curves and data, the system fault point can be indirectly judged. If the offset fluctuation is abnormal, it means that the number of cycles in two circles is not equal, which means that the zero signal is not matched. The system setting parameters can be directly checked. When the signal offset fluctuation is abnormal, it is usually because the code disc tooth shape is abnormal, which causes the distortion of the encoder output signal, thereby causing the output signal offset jump fluctuation to be abnormal. The problems such as code disc tooth defect, rust and damage can be directly checked. When the signal amplitude fluctuation is abnormal, it is usually because the main shaft jumps, the offset is large, and the rotation is eccentric, thereby causing the encoder output signal amplitude to be abnormal, thereby causing the signal amplitude fluctuation to be abnormal. The problems such as shaft core deflection and main shaft concentricity can be directly checked; when the phase fluctuation is abnormal, it is usually because the encoder precision is abnormal, or the running vibration is large, thereby causing the data of each cycle to be deviated. The problems such as encoder precision and main shaft vibration can be directly checked.

[0054] It can be understood that, by the main shaft fault detection method provided in the embodiments of the present application, at least the following advantages are achieved relative to the schemes on the market at present: 1. The present application can quickly and accurately locate the main shaft interference problem, wiring problem, encoder failure problem through output test, and is used for quickly checking the drive alarm problem, which greatly reduces the fault checking time of the on-site detection personnel and reduces the machine downtime 2. The present application can accurately measure the parameter setting abnormality, main shaft code disc abnormality, encoder precision abnormality, main shaft deflection and large vibration and other abnormalities through fluctuation test in an indirect manner, which is used for quickly checking the causes of poor processing, avoids disassembly and disassembly of the main shaft, reduces damage to other parts caused by disassembly and disassembly of the main shaft, and reduces maintenance cost 3. Compared with the oscilloscope, multimeter, dynamic balance instrument and other tools used for checking problems at present, the present application has the characteristics of small size, simple operation and high accuracy, can help the on-site to quickly find the drive alarm and poor processing problem, and better meets the application requirements of the factory and solves the assembly and maintenance problems.

[0055] In alternative embodiments, the functions / operations in the flow diagrams can occur in sequences other than those depicted. For example, two operations shown in succession can in fact be executed substantially concurrently or the operations sometimes can be executed in the reverse order depending upon the functionality / operations involved. Also, embodiments presented and described in this application are provided by way of example only. The

[0056] Moreover, while this application has been described in the context of functional modules, it is to be understood that one or more of the functions and / or features can be integrated in a single physical device and / or software module or one or more of the functions and / or features can be implemented in separate physical devices or software modules. It will also be appreciated that detailed discussion of the actual implementation of each module is not necessary for an understanding of the application. Rather, the actual implementation is a matter of choice apart from the conception and since the application is properly deemed to encompass at least the best mode contemplated, definite understanding of the detailed construction of the modules is not not necessary for proper appreciation of the disclosure. The disclosure is therefore to be implemented in the context of this understanding. Accordingly, the present application is not limited to that precisely as shown and described.

[0057] If implemented in software, the functions can be stored on or transmitted over as one or more instructions or code on a computer-readable medium. Computer-readable media include both computer storage media and communication media including any medium that facilitates transfer of a computer program from one place to another. A storage media can be any available media that can be accessed by a computer. By way of example, and not limitation, such computer-readable media can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. Also, any connection is properly termed a computer-readable medium. For example, if the software is transmitted from a website, server, or other remote source using a coaxial cable, fiber optic cable, or twisted pair, then the coaxial cable, fiber optic cable, or twisted pair are included in the definition of medium. Disk and disc, as used herein, include compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), and Blu-Ray® disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0058] The logic and / or steps represented in the flow diagrams or otherwise described herein, for example, can be embodied in non-transitory computer-readable media in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor- containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions, or in conjunction with which the instructions can be executed. For purposes of this specification, a "computer-readable medium" can be any apparatus that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. The computer-readable medium can be, for example but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium include the following: an electrical connection (electronic) having one or more wires, a portable computer diskette (magnetic), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber (optical), and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, for example via an optical scanner, then compiled, interpreted, or otherwise processed, and stored in a computer memory in a form that can be later executed by a computer. In this context, a "computer-readable medium" can be any means that can store the program for use by or in connection with the instruction execution system, apparatus, or device.

[0059] The foregoing description of various embodiments of the application has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the application to the precise form disclosed, and various modifications and variations are possible in light of the above teachings or can be acquired from practice of the application. For example, while a particular feature of the application can have been described with respect to only one or more embodiments thereof, the feature is not necessarily limited to that one or more embodiments. Rather, candidates for the feature can be found in the other embodiments as well, and the scope of the application is not intended to be limited to the particular embodiment in which the feature was first described.

[0060] It should be understood that aspects of the application can be implemented in hardware, software, firmware or combinations thereof. In the above embodiments, various steps or methods can be implemented, for example, as software or firmware in a memory and executed by suitable instruction-execution systems. If implemented in hardware, for example, in another embodiment, any of the following technologies, or combinations thereof, can be used: discrete logic circuitry having logic gates for implementing logic functions upon an application of data signals, application-specific integrated circuits having appropriate combinational logic gates, programmable gate arrays (PGA), field-programmable gate arrays (FPGA), and so forth.

[0061] In the above description of the present application, the description using the terms "one embodiment / one example", "another embodiment / another example" or "some embodiments / some examples" and so forth is intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. The appearances of the above-described terms in various places in the specification are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples.

[0062] While the embodiments of the present application have been shown and described, it is to be understood that the embodiments can be changed, modified and further applied by those skilled in the art unless otherwise specified, and the scope of the present application should be defined by the claims and their equivalents.

[0063] The above is a specific description of the preferred embodiments of the present application, but the present application is not limited to the embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present application, and these equivalent modifications or substitutions are included in the scope of the present application defined by the claims In the description of the present specification, the description of the terms "one embodiment", "another embodiment" or "certain embodiments" or the like means that the specific features, structures, materials or characteristics described in connection with the embodiments or examples are included in at least one embodiment or example of the present application. In the present specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Also, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0064] While the embodiments of the present application have been shown and described, it is to be understood that the embodiments can be changed, modified and further applied by those skilled in the art unless otherwise specified, and the scope of the present application should be defined by the claims and their equivalents.

Claims

1. A main shaft failure detection method characterized by, A method for fault detection by a main shaft fault detection device, the method comprising: collecting a plurality of voltage signals of an encoder of a main shaft to be detected, and generating a test curve according to the voltage signals; wherein the voltage signals comprise S-channel voltage signals, C-channel voltage signals, and Z-channel voltage signals; determining output test data corresponding to the encoder according to the plurality of voltage signals; wherein the output test data comprises at least one of bias data, phase data, amplitude data, and deviation data; determining a fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve.

2. A method of spindle fault detection according to claim 1, wherein, The method further comprises: determining first test data corresponding to the plurality of voltage signals under the condition that the main shaft to be detected rotates continuously; determining fluctuation test data corresponding to the encoder according to the first test data; determining the fault detection result corresponding to the main shaft to be detected according to the fluctuation test data. The determining of the output test data corresponding to the encoder according to the plurality of voltage signals comprises: continuously collecting a plurality of voltage data on each of the voltage signals, and determining a maximum voltage value and a minimum voltage value in the plurality of voltage data; 3. A method of spindle fault detection according to claim 2, wherein, determining initial bias data according to the maximum voltage value and the minimum voltage value; determining a period and a starting phase of the voltage signals according to the initial bias data; determining the bias data and the amplitude data according to voltage data of each of the voltage signals in a plurality of periods; 4. A method of spindle fault detection according to claim 3, wherein, determining the phase data and the deviation data according to voltage data of different voltage signals in a plurality of periods. The determining of the period of the voltage signals according to the initial bias data comprises: detecting a first time point at which voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the first time, and detecting a second time point at which voltage data on the voltage signals changes from being less than the initial bias data to being greater than the initial bias data for the second time; 5. A spindle fault detection method according to any one of claims 1-4, characterized in that, determining the period of the voltage signals according to a difference between the second time point and the first time point. The determining of the fault detection result corresponding to the main shaft to be detected according to the output test data or the test curve comprises: comparing a standard curve with the test curve to determine the fault detection result corresponding to the main shaft to be detected; determining the fault detection result corresponding to the main shaft to be detected according to a size of the output test data.

6. A method of spindle fault detection according to claim 5, wherein, The method further comprises: determining first test data corresponding to the plurality of voltage signals under the condition that the main shaft to be detected rotates continuously; determining fluctuation test data corresponding to the encoder according to the first test data; determining the fault detection result corresponding to the main shaft to be detected according to the fluctuation test data.

7. The method of claim 1, wherein, The determining of the fluctuation test data corresponding to the encoder according to the first test data comprises: taking the Z-channel voltage signal of the encoder as a reference to determine a number of rotations of the main shaft to be detected and a signal period in each rotation; calculating amplitude data, bias data, and phase data corresponding to each of the signal periods based on the first test data; generating amplitude fluctuation data, bias fluctuation data, and phase fluctuation data according to changes in the amplitude data, the bias data, and the phase data in a plurality of the signal periods. The main shaft fault detection device comprises: a housing, a display screen, an input interface, a power module, and a circuit board; The input interface is arranged on one side of the shell, the display screen is arranged on the surface of the shell, and the power module and the circuit board are arranged in the interior of the shell; The input interface is used for accessing the encoder signal of the spindle to be detected and transmitting the encoder signal to the circuit board; the circuit board comprises a microprocessor circuit, a power supply circuit, a sampling circuit and a communication circuit, an input end of the power supply circuit is connected with the power module, an output end of the power supply circuit is used for supplying power to the display screen, the microprocessor circuit, the sampling circuit and the communication circuit; the sampling circuit is connected with the input interface and the microprocessor circuit, and is used for transmitting the encoder signal to the microprocessor circuit for processing; the microprocessor circuit is connected with the communication circuit and the display screen, and the display screen is used for displaying the detection result of the encoder signal of the spindle to be detected, the detection result comprising test data and a test curve.

8. A method of spindle fault detection according to claim 7, wherein, The power module comprises a power interface and a rechargeable battery, an input end of the power interface is used for accessing an external power supply, and an output end of the power interface is connected with the rechargeable battery and the power supply circuit.

9. A method of spindle fault detection according to claim 7, wherein, The sampling circuit comprises a two-way switch chip and a differential operation circuit; An input end of the two-way switch chip is used for accessing the encoder signal, an output end of the two-way switch chip is connected with an input end of the differential operation circuit, and an output end of the differential operation circuit is connected with the microprocessor circuit.

10. A method of spindle fault detection according to claim 9, wherein, The differential operation circuit comprises a first signal input port, a second signal input port, a signal output port, a thirteenth resistor, a fourteenth resistor, a fifteenth resistor, a sixteenth resistor, a seventeenth resistor, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, an IC chip and a fourteenth capacitor; The first signal input port is connected with a first end of the sixteenth resistor and a first end of the thirteenth resistor, a second end of the thirteenth resistor is connected with a first end of the fourteenth resistor and a second pin of the IC chip, a second end of the fourteenth resistor is connected with the signal output port and a first pin of the IC chip; the second signal input port is connected with a second end of the sixteenth resistor and a first end of the fifteenth resistor, a second end of the fifteenth resistor is connected with a third pin of the IC chip and a first end of the seventeenth resistor, a fourth pin of the IC chip is grounded, a second end of the seventeenth resistor is connected with a seventh pin of the IC chip, a first end of the twentieth resistor and a first end of the fourteenth capacitor, a second end of the twentieth resistor and a second end of the fourteenth capacitor are connected with a sixth pin of the IC chip, an eighth pin of the IC chip is connected with a power supply, a fifth pin of the IC chip is connected with a first end of the eighteenth resistor and a first end of the nineteenth resistor, a second end of the eighteenth resistor is connected with the power supply, and a second end of the nineteenth resistor is grounded.

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