Calibration method and device for simulation photovoltaic module and test equipment
By using simulated photovoltaic modules composed of electrical components to replace traditional standard plates, the ratio calibration test equipment was obtained, which solved the problem of inspection accuracy caused by metastability effect and achieved stable and efficient calibration of the test equipment.
Patent Information
- Application Number
- CN202511714197.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-20
- Publication Date
- 2026-02-27
AI Technical Summary
The metastable effect of traditional photovoltaic module templates leads to low accuracy of testing equipment, and frequent template replacements increase costs and workload. Existing calibration methods cannot effectively avoid power fluctuation problems.
A simulated photovoltaic module composed of electrical components is used to replace the traditional standard plate. The test equipment is calibrated by obtaining the ratio of the original performance parameters to the standard performance parameters, thus avoiding the instability of the standard plate power reference caused by metastability.
It improves the accuracy of testing equipment, ensures the stability and consistency of test results, and reduces the cost and workload caused by changing the standard.
Smart Images
Figure CN121585094A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of photovoltaic, in particular to a kind of simulation photovoltaic module and the calibration method, device of test equipment. BACKGROUND
[0002] Power is used to measure the standard of photovoltaic module commodity value, in the traditional production process of photovoltaic module, photovoltaic module manufacturer will be in third party authority calibration template, through calibration template to test equipment, the power reference of test equipment after calibration is consistent with third party authority, subsequent photovoltaic module can be approved by market after the inspection of the test equipment.
[0003] However, the power fluctuation caused by the metastable state effect of calibration template will affect the test result of test equipment, there is the problem of low inspection accuracy. SUMMARY
[0004] Therefore, it is necessary to provide a kind of simulation photovoltaic module and the calibration method, device of test equipment to improve the inspection accuracy for the above technical problems.
[0005] The first aspect, the present application provides a kind of calibration method of test equipment, comprising:
[0006] The original performance parameter of the simulation photovoltaic module of the electric component is obtained;Wherein, the original performance parameter is obtained by test equipment to simulation photovoltaic module for testing;
[0007] Compare the original performance parameter and the standard performance parameter of simulation photovoltaic module, according to the result of comparison to test equipment for calibration.
[0008] In one embodiment, according to the result of comparison to test equipment for calibration, comprising:
[0009] The ratio between the original performance parameter and the standard performance parameter is obtained;
[0010] The test equipment is calibrated based on the ratio.
[0011] The second aspect, the present application also provides a kind of simulation photovoltaic module, applied to the calibration method of the above-mentioned test equipment;Wherein, simulation photovoltaic module is constituted by electric component.
[0012] In one embodiment, simulation photovoltaic module includes current output unit, voltage drive unit, capacitor unit and resistance unit in parallel in turn;
[0013] Wherein, voltage drive unit includes diode, diode is in reverse bias state.
[0014] In one embodiment, current output unit includes current source;
[0015] The output end of the current source is connected to one end of the capacitor unit, one end of the resistance unit, and the negative electrode of the diode, respectively, and the input end of the current source is connected to the other end of the capacitor unit, the other end of the resistance unit, and the positive electrode of the diode, respectively;
[0016] The negative electrode of the diode is connected to one end of the capacitor unit and one end of the resistance unit, respectively, and the positive electrode of the diode is connected to the other end of the capacitor unit and the other end of the resistance unit, respectively.
[0017] In one of the embodiments, the capacitor unit comprises a capacitor.
[0018] One end of the capacitor is connected to the output end of the current source, the negative electrode of the diode, and one end of the resistance unit, respectively, and the other end of the capacitor is connected to the input end of the current source, the positive electrode of the diode, and the other end of the resistance unit, respectively.
[0019] In one of the embodiments, the resistance unit comprises a first resistance and a second resistance.
[0020] One end of the first resistance is connected to the output end of the current source, the negative electrode of the diode, one end of the capacitor, and one end of the second resistance, respectively, and the other end of the first resistance is connected to the input end of the current source, the positive electrode of the diode, and the other end of the capacitor, respectively.
[0021] The other end of the first resistance and the other end of the second resistance are the output ends of the analog photovoltaic module.
[0022] In a third aspect, the application further provides a calibration device of a testing device, comprising:
[0023] A parameter acquisition module is configured to acquire original performance parameters of an analog photovoltaic module composed of electrical components, wherein the original performance parameters are obtained by the testing device testing the analog photovoltaic module.
[0024] A calibration module is configured to compare the original performance parameters with standard performance parameters of the analog photovoltaic module, and calibrate the testing device according to the comparison result.
[0025] In a fourth aspect, the application further provides a computer device comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.
[0026] In a fifth aspect, the application further provides a computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to implement the steps of the above method.
[0027] The calibration method and device of the analog photovoltaic module and the test equipment can obtain original performance parameters of the analog photovoltaic module composed of electrical components, compare the original performance parameters with standard performance parameters of the analog photovoltaic module, and calibrate the test equipment according to the comparison result. The calibration of the test equipment is performed by using the analog photovoltaic module composed of electrical components. The analog photovoltaic module does not have a metastable state effect and has the advantage of stable power curve. The analog photovoltaic module is used to replace a traditional standard plate, thereby avoiding the problem of unstable standard plate power reference caused by the metastable state effect in principle, and improving the test accuracy of the test equipment. BRIEF DESCRIPTION OF DRAWINGS
[0028] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related art, the drawings needed to be used in the description of the embodiments of the present application or the related art will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other related drawings can be obtained by those skilled in the art without creative labor.
[0029] Figure 1 A flowchart of a calibration method of a conventional test equipment in an embodiment;
[0030] Figure 2 A flowchart of a calibration method of a test equipment in an embodiment;
[0031] Figure 3 A flowchart of a calibration method of a test equipment in another embodiment;
[0032] Figure 4 A block diagram of a calibration device of a test equipment in an embodiment;
[0033] Figure 5 A simplified circuit diagram of a single-diode model of a photovoltaic module in an embodiment;
[0034] Figure 6 A power curve diagram of a photovoltaic module tested under STC conditions in an embodiment;
[0035] Figure 7 A block diagram of an analog photovoltaic module in an embodiment;
[0036] Figure 8 A structural diagram of an analog photovoltaic module in an embodiment;
[0037] Figure 9 An internal structure diagram of a computer device in an embodiment. DETAILED DESCRIPTION
[0038] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not to limit the present application.
[0039] It should be noted that the terms "first", "second" and the like used in the present application can be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from the second element. The terms "include" and "have" and any variations thereof used in the present application are intended to cover non-exclusive inclusion. The term "a plurality of" used in the present application means two or more. The term "and / or" used in the present application means one of the options or any combination of the options.
[0040] Power is a standard for measuring the value of photovoltaic module products, and the power parameter can be obtained by an IV tester (test equipment). In the traditional production process of photovoltaic modules, a photovoltaic module manufacturer will calibrate a standard version of photovoltaic module at a third-party authoritative institution, calibrate the test equipment by the standard version, and calibrate the test equipment after the calibration. The power reference of the test equipment after the calibration is consistent with the third-party authoritative institution, and the photovoltaic modules tested by the test equipment subsequently can be recognized by the market.
[0041] It should be noted that the calibration method of the conventional test equipment is as follows Figure 1 As shown in the figure, the test equipment is taken as an IV test machine for example, the test environment is first built, the amplitude and temperature of the test environment are calibrated in the STC requirement range (set according to the actual situation, which is not limited in the embodiments of the present application), the test equipment tests the standard version to obtain the original electrical parameter (original IV electrical parameter) of the standard version, wherein the original electrical parameter is obtained by the current IV test machine according to the test reference without calibration; the standard version is calibrated by the authoritative third-party institution to obtain the standard version parameter, the standard version parameter is input into the current IV test machine, and the current IV test machine is calibrated according to the original electrical parameter and the standard version parameter. The calibrated IV test machine is the calibration reference value of the standard version, at this time, the photovoltaic module manufactured is tested by using the calibrated IV test machine to obtain the module electrical parameter (module IV electrical parameter) of the photovoltaic module, that is, it can be determined whether the photovoltaic module meets the standard, that is, whether the module power reference of the photovoltaic module is consistent with the calibration reference of the standard version.
[0042] In the process, the use cycle of the standard plate is generally one year, and the standard plate needs to be maintained at a stable level as a reference standard. However, with the development of photovoltaic technology, the innovation of high-efficiency cell technology brings efficiency improvement, but also introduces new challenges. For example, TOPCon cells and HJT cells (both are photovoltaic modules) have metastable state effect, and the power level of the standard plate as a power test anchor point cannot be maintained stable. A large number of literature studies have verified that the power of photovoltaic modules will decrease and increase under dark state and light conditions.
[0043] It can be understood that, due to the metastable state decay of the standard plate using high-efficiency photovoltaic components, the original electrical parameters of the decayed standard plate will gradually decrease. If the original parameters of the standard plate are always corrected during the calibration process, the calibrated test reference will deviate from the initial calibrated reference, which will raise the test reference of the newly manufactured photovoltaic module, resulting in a false high power test of the photovoltaic module. If a low-efficiency photovoltaic component without metastable state is used to calibrate the standard plate, the power curve model of the standard plate and the test piece will not match.
[0044] In summary, the power fluctuation of the standard plate will directly affect the test result and reduce the accuracy of the test, causing disputes at the client end and interference to the efficiency improvement process at the module end, which is difficult to trace and is not conducive to the development of the industry. In order to reduce the power fluctuation caused by the metastable state of the standard plate, the module end can reduce the fluctuation caused by the metastable state of the standard plate by increasing the frequency of calibration with the third party. However, this will increase the calibration cost of the module manufacturing end, and frequent replacement of the standard plate will also cause trouble in troubleshooting at the module end (all test equipment has a certain test uncertainty, and there are many factors to consider in the deviation of two calibrations, which is a huge workload). The module end can also use WPUS as a calibration target. WPUS is a calibration target commonly used by third-party testing institutions and an important factor for the third party to maintain the reference stable. However, WPUS has the problem of high cost due to long production cycle.
[0045] The calibration method of the test equipment based on the simulated photovoltaic module provided by the embodiment of the application acquires the original performance parameters of the simulated photovoltaic module composed of electrical components, compares the original performance parameters with the standard performance parameters of the simulated photovoltaic module, and calibrates the test equipment according to the comparison result. The simulated photovoltaic module does not have metastable state effect and has the advantage of stable power curve. By using the simulated photovoltaic module to replace the traditional standard plate, the problem of unstable power reference of the standard plate caused by the metastable state effect of the photovoltaic module is avoided in principle, and the test accuracy of the test equipment is improved.
[0046] In an exemplary embodiment, as shown in Figure 2 a calibration method of a test equipment is provided, comprising:
[0047] S202, obtaining original performance parameters of a simulated photovoltaic module composed of electrical components; wherein the original performance parameters are obtained by a testing device testing the simulated photovoltaic module.
[0048] The specific type of the testing device can be set according to actual conditions, as long as it can meet the function of testing the simulated photovoltaic module and obtaining the original performance parameters.
[0049] Specifically, the metastable state of the high-efficiency photovoltaic module is mainly caused by the introduction of amorphous silicon and Si-H bonds in the cell process, and the simulated photovoltaic module composed of electrical components does not have the metastable state effect of the high-efficiency photovoltaic module. The power curve is stable, the testing device tests the simulated photovoltaic module to obtain the original performance parameters, which avoids the problem of unstable reference power caused by the metastable state effect in principle, and improves the inspection accuracy of the testing device.
[0050] S204, comparing the original performance parameters with standard performance parameters of the simulated photovoltaic module, and calibrating the testing device according to the comparison result.
[0051] Specifically, by comparing the original performance parameters with the standard performance parameters of the simulated photovoltaic module, the testing device is calibrated according to the comparison result. Since the simulated photovoltaic module does not have the metastable state effect, the power curve is stable, and it is suitable for long-term calibration of the testing device.
[0052] In the calibration method of the testing device, the simulated photovoltaic module composed of electrical components is used to calibrate the testing device. The simulated photovoltaic module does not have the metastable state effect and has the advantage of stable power curve. By using the simulated photovoltaic module to replace the traditional reference plate, the problem of unstable reference power caused by the metastable state effect is avoided in principle, and the inspection accuracy of the testing device is improved.
[0053] In one embodiment, calibrating the testing device according to the comparison result comprises:
[0054] Obtaining a ratio between the original performance parameters and the standard performance parameters;
[0055] Calibrating the testing device based on the ratio.
[0056] The original performance parameters and the standard performance parameters are both performance parameters, but the acquisition methods are different. The performance parameters can include voltage, current and power.
[0057] Specifically, the ratio between the original performance parameters and the standard performance parameters is obtained, and the testing device is calibrated according to the ratio.
[0058] Exemplarily, taking voltage as an example, if the voltage in the original performance parameter is 100V and the voltage in the standard performance parameter is 99V, the test equipment needs to determine the corresponding voltage calibration coefficient (99%) by obtaining the ratio between the two voltages. Subsequently, the test equipment needs to multiply the voltage obtained during the test of other photovoltaic components by the voltage calibration coefficient before outputting.
[0059] It should be noted that the calibration process can be: after the bias coefficient is brought in, the original performance parameter is reacquired until the original performance parameter acquired is equal to the standard performance parameter. At this time, the test reference of the test equipment is unified with the standard reference, that is, the test equipment completes the calibration.
[0060] In the embodiment of the application, the test equipment is calibrated according to the ratio between the original performance parameter and the standard performance parameter, so as to unify the test reference of the test equipment with the standard reference, which facilitates the subsequent test equipment to test other photovoltaic components.
[0061] In order to facilitate the understanding of those skilled in the art, the calibration method of the test equipment will be described below in combination with a specific example, as shown in Figure 3 The test equipment is taken as an IV test machine as an example for description:
[0062] First, the test environment is built, the amplitude and temperature of the test environment are calibrated in the STC requirement range (set according to the actual situation, which is not limited in the embodiment of the application), the test equipment tests the simulated photovoltaic component (simply referred to as simulated component), and the original electrical parameter (original IV electrical parameter) of the simulated component is obtained. The original electrical parameter is obtained by the current IV test machine according to the test reference which has not been calibrated; the simulated component is calibrated by an authoritative third-party institution, and the calibration parameter of the simulated component is obtained. The calibration parameter is input to the current IV test machine, and the current IV test machine is calibrated according to the original electrical parameter and the calibration parameter. The calibrated IV test machine is the calibration value of the simulated component. At this time, the test of the manufactured photovoltaic component is carried out by using the calibrated IV test machine, and the component electrical parameter (component IV electrical parameter) of the photovoltaic component is obtained. That is, it can be determined whether the photovoltaic component meets the standard, that is, whether the component power reference of the photovoltaic component is consistent with the calibration reference of the simulated component.
[0063] It should be noted that the simulated component is used to simulate the power test IV curve of the photovoltaic component. The simulated component cannot be used to calibrate the irradiance of the IV tester. The irradiance of the IV test is calibrated by the standard monitoring battery. The irradiance of the tester needs to be calibrated to the STC condition (set according to the actual situation, which is not limited in the embodiment of the application) before the simulated component is used for calibration.
[0064] It should be understood that although each step in the flowchart involved in the above-described embodiments is shown in sequence according to the arrow, the steps are not necessarily executed in the order indicated by the arrow. Unless otherwise specified herein, the execution of the steps is not strictly limited in sequence, and the steps can be executed in other orders. Moreover, at least some of the steps in the flowchart involved in the above-described embodiments can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of the steps or stages is not necessarily sequential, but can be alternately or alternately executed with at least some of the other steps or steps or stages in the other steps. It can be understood that the steps in different embodiments can be freely combined as needed, and various non-contradictory schemes formed by the combination are within the scope of protection of the present application.
[0065] Based on the same inventive concept, the embodiments of the present application also provide a calibration device for implementing the calibration method of the test device. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme described in the above method, so the specific limitations in one or more test device calibration device embodiments provided below can refer to the limitations of the test device calibration method described above, and will not be repeated here.
[0066] In one exemplary embodiment, as shown in Figure 4 A calibration device 400 for a test device is provided, comprising:
[0067] The parameter acquisition module 401 is configured to acquire original performance parameters of the simulated photovoltaic module composed of the electrical component; wherein the original performance parameters are obtained by the test device testing the simulated photovoltaic module.
[0068] The calibration module 402 is configured to compare the original performance parameters with the standard performance parameters of the simulated photovoltaic module, and calibrate the test device according to the comparison result.
[0069] In one embodiment, the calibration module 402 is further configured to acquire a ratio between the original performance parameters and the standard performance parameters.
[0070] The test device is calibrated based on the ratio.
[0071] The modules in the above test device calibration device can be realized by software, hardware and their combinations in whole or in part. The above modules can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to the above modules.
[0072] In one exemplary embodiment, a simulated photovoltaic module is provided for use in the calibration method of the testing device described above; wherein the simulated photovoltaic module is composed of electrical components.
[0073] Specifically, the electrical components include a direct current power supply, a diode, a capacitor, and a resistor, and a single-diode model simplified circuit of the photovoltaic module is as shown in Figure 5 , wherein the functions of the key units can all be realized using electrical components: ① equivalent direct current source, which is the light-generated (Light) current output unit of the photovoltaic module, can be simulated using a direct current power supply. ② equivalent PN junction, which is the voltage driving unit of the photovoltaic module, plays a role in regulating voltage and reverse saturation current in the simplified circuit, and can be simulated using a diode. ③ equivalent capacitor, which is an important factor of IV test deviation of high-efficiency photovoltaic modules, tests the ability of the testing device, scanning method, and data algorithm to eliminate the capacitance of the photovoltaic module, and can be simulated using a small capacitor. ④ equivalent parallel resistance, which is an important factor of the leakage current of the photovoltaic module, can be simulated using a resistor. ⑤ equivalent series resistance, which is the internal transmission resistance of the photovoltaic module, can be simulated using a resistor.
[0074] It should be noted that the I-V (current-voltage) curve of the photovoltaic module conforms to the current continuity equation, as shown in the following formula (1):
[0075] ; (1)
[0076] Wherein, I is the output current of the photovoltaic module; I L is the light-generated current; I0 is the reverse saturation current; q is the electronic charge (1.6×10 19 C); V is the output voltage of the photovoltaic module; A is the diode factor, K is the Boltzmann constant (1.38×10 -23 J / K); T is the absolute temperature; Rsh and Rs are the resistance values corresponding to the resistors as shown in Figure 5 .
[0077] The power curve tested under STC conditions is as shown in Figure 6 , wherein the maximum power point Pmax is the nominal power of the photovoltaic module, and the output parameters include Pmax, Isc (short-circuit current of the photovoltaic module), Voc (open-circuit voltage of the photovoltaic module), Imp (maximum power point current of the photovoltaic module), Vmp (maximum power point voltage of the photovoltaic module), FF (fill factor of the photovoltaic module), etc.; wherein, as Figure 6As shown, the horizontal coordinate is voltage (unit: V), representing the output voltage of the photovoltaic module during the IV test; the left vertical coordinate is current (unit: A), representing the output current of the photovoltaic module during the IV test; the right vertical coordinate is power, representing the output power of the photovoltaic module during the IV test; the red curve is the current-voltage curve of the photovoltaic module, and the product of the horizontal and vertical coordinates of any point on the curve is the output power of the photovoltaic module, corresponding to the blue curve; the blue curve is the power curve of the photovoltaic module, and the top point of the curve is Pmax.
[0078] It should be noted that the circuit simulating the photovoltaic module is similar to the photovoltaic module and also meets the current continuity equation of the approximate single-diode model, and similar power curves can be tested under STC conditions. The main output parameters also include Pmax, Isc, Voc, Imp, Vmp, FF, etc. The simulated photovoltaic module can also be used to calibrate the test equipment.
[0079] The above-mentioned simulated photovoltaic module is composed of electrical components and is applied to the calibration method of the above-mentioned test equipment. The metastable state of the photovoltaic module is mainly caused by the introduction of amorphous silicon, Si-H bond and other factors in the battery process. The simulated photovoltaic module is composed of electrical components and does not have the metastable state effect of high-efficiency components. The power curve is stable, which avoids the problem of unstable reference power caused by the metastable state effect from the principle, and improves the test accuracy of the subsequent test equipment.
[0080] In one embodiment, as shown in Figure 7 The simulated photovoltaic module includes, in sequence and in parallel, a current output unit, a voltage driving unit, a capacitor unit and a resistor unit.
[0081] The voltage driving unit includes a diode, and the diode is in a reverse bias state.
[0082] Specifically, the current output unit can be equivalent to a direct current source in the photovoltaic module, the voltage driving unit can be equivalent to a PN junction to regulate the voltage and the reverse saturation current, the capacitor unit can be used to represent the influence of the test equipment, the scanning mode and the data algorithm on the photovoltaic module, and the resistor unit can be used to represent the influence of the leakage current of the photovoltaic module and the transmission resistance inside the photovoltaic module.
[0083] It should be noted that since the current output unit and the voltage driving unit in the simulated photovoltaic module are two device units, if the diode in the voltage driving unit is forward biased, the current output by the current output unit will directly flow through the diode in the voltage driving unit, and the circuit will fail at this time.
[0084] In one embodiment, as shown in Figure 8 The current output unit includes a current source A1.
[0085] The output end of the current source A1 is connected with one end of the capacitor unit, one end of the resistance unit and the negative electrode of the diode D1 respectively, and the input end of the current source A1 is connected with the other end of the capacitor unit, the other end of the resistance unit and the positive electrode of the diode D1 respectively;
[0086] The negative electrode of the diode D1 is connected with one end of the capacitor unit and one end of the resistance unit respectively, and the positive electrode of the diode D1 is connected with the other end of the capacitor unit and the other end of the resistance unit respectively.
[0087] Specifically, as shown in Figure 8 , the current source A1 is equivalent to a direct current source in the photovoltaic module, and the diode D1 is equivalent to a PN junction in the photovoltaic module.
[0088] It should be noted that, Figure 5 The diode in the photovoltaic cell is an equivalent PN junction, and a small amount of leakage current loss will occur when it works in the forward direction, as shown in the following formula (2):
[0089] ; (2)
[0090] Since the current source and the PN junction are homologous, the current source will not directly flow through the diode to form a local current loop, and at the same time, the photovoltaic module will exhibit the reverse characteristics of the diode when it is reversely biased. Figure 8 In order to simulate the PN leakage current of the photovoltaic module, a diode device is introduced in the photovoltaic module, and the reverse leakage current of the diode is used to simulate the PN junction leakage current of the photovoltaic module. Since the current source A1 and the diode D1 of the simulated photovoltaic module are two unit devices, the direction of the diode D1 needs to be reversed to ensure that the diode D1 is in a reverse bias state. If it is consistent with Figure 5 , the diode D1 is forward biased by the current source A1, so the current of the current source A1 will directly flow through the diode D1, and the circuit will fail. At the same time, because the diode D1 and the current source A1 of the simulated module are reversely biased, the simulated photovoltaic module cannot simulate the reverse characteristics of the real photovoltaic module, but it does not affect the forward power output of the photovoltaic module. As a substitute for the standard photovoltaic module, the function fully meets the requirements.
[0091] In one of the embodiments, as shown in Figure 8 , the capacitor unit includes a capacitor C1;
[0092] One end of the capacitor C1 is connected with the output end of the current source A1, the negative electrode of the diode D1 and one end of the resistance unit respectively, and the other end of the capacitor is connected with the input end of the current source, the positive electrode of the diode D1 and the other end of the resistance unit respectively.
[0093] Specifically, as shown in Figure 8 , the capacitor C1 is used to characterize the influence of the test equipment, the scanning mode and the data algorithm on the photovoltaic module.
[0094] In one embodiment, as shown in Figure 8 the resistance unit includes a first resistor R1 and a second resistor R2;
[0095] One end of the first resistor R1 is connected to the output of the current source A1, the negative electrode of the diode D1, one end of the capacitor C1 and one end of the second resistor R2, respectively, and the other end of the first resistor R1 is connected to the input of the current source A1, the positive electrode of the diode D1 and the other end of the capacitor C1, respectively.
[0096] The other end of the first resistor R1 and the other end of the second resistor R2 are the output terminals of the simulated photovoltaic module.
[0097] Specifically, as shown in Figure 8 the first resistor R1 is used to characterize the influence of the leakage current of the photovoltaic module, and the second resistor R2 is used to characterize the influence of the transmission resistance inside the photovoltaic module.
[0098] Exemplarily, the simulated photovoltaic module is composed of various electrical elements, and when selecting the parameters of the electrical elements, the parameters of the real photovoltaic module need to be referred to, such as the electrical parameters of the produced photovoltaic module: Pmax: 700W, Voc: 49V, Isc: 18A, R s : 0.2Ω, R sh : 2000Ω, then the selection of the components of the simulated photovoltaic module can refer to:
[0099] ① The direct current source can be selected as a direct current source with a voltage range of 0 to 100V and a current range of 0 to 30A, the power supply is set to 18A constant current mode, and the voltage is set to an upper limit of 49V.
[0100] ② The diode can be selected as a voltage stabilizing diode, and the maximum reverse working voltage VR must be greater than Voc, which is in a reverse bias state in the simulated photovoltaic module as shown in Figure 8 , and its reverse leakage current is used to simulate the reverse saturation current of the photovoltaic module.
[0101] ③ The capacitor is selected according to the actual photovoltaic module version and cell type, generally 10 to 20nF / m², and HJT module 80 to 200nF / m².
[0102] ④ The series resistance is selected according to the actual test value, and since the series resistance is usually not more than 0.5Ω, this unit can be omitted.
[0103] ⑤ The parallel resistance can be selected according to the actual test value.
[0104] In one exemplary embodiment, a computer device is provided, which can be a server, and its internal structure diagram can be as shown in Figure 8As shown, the computer device can be arranged in the test device or outside the test device. The computer device includes a processor, a memory, an input / output interface (I / O) and a communication interface. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operating system and the computer program in the non-volatile storage medium to run. The database of the computer device is configured to store original performance parameters and standard performance parameters. The input / output interface of the computer device is configured to exchange information between the processor and external devices. The communication interface of the computer device is configured to communicate with external terminals through network connection. The computer program is executed by the processor to implement the calibration method of the test device.
[0105] Those skilled in the art can understand that, Figure 9 Figure 9 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.
[0106] In one exemplary embodiment, a computer device is provided, including a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the calibration method of the test device.
[0107] In one embodiment, a computer readable storage medium is provided, storing a computer program, and the computer program is executed by the processor to implement the calibration method of the test device.
[0108] In one embodiment, a computer program product is provided, including a computer program, and the computer program is executed by the processor to implement the calibration method of the test device.
[0109] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or authorized by all parties, and the collection, use and processing of related data need to comply with relevant regulations.
[0110] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.
[0111] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.
[0112] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.
Claims
1. A calibration method for a testing device, characterized in that, include: Obtain the original performance parameters of a simulated photovoltaic module composed of electrical components; wherein, the original performance parameters are obtained by testing the simulated photovoltaic module with testing equipment; The original performance parameters are compared with the standard performance parameters of the simulated photovoltaic module, and the test equipment is calibrated based on the comparison results.
2. The method according to claim 1, characterized in that, The calibration of the test equipment based on the comparison results includes: Obtain the ratio between the original performance parameters and the standard performance parameters; The test equipment is calibrated based on the ratio.
3. A simulated photovoltaic module, characterized in that, A calibration method applicable to the test equipment of claim 1 or 2; wherein the simulated photovoltaic module is composed of electrical components.
4. The simulated photovoltaic module according to claim 3, characterized in that, The simulated photovoltaic module includes a current output unit, a voltage drive unit, a capacitor unit, and a resistor unit connected in parallel in sequence. The voltage driving unit includes a diode, which is in a reverse bias state.
5. The simulated photovoltaic module according to claim 4, characterized in that, The current output unit includes a current source; The output terminal of the current source is connected to one end of the capacitor unit, one end of the resistor unit, and the negative terminal of the diode, respectively; the input terminal of the current source is connected to the other end of the capacitor unit, the other end of the resistor unit, and the positive terminal of the diode, respectively. The negative terminal of the diode is connected to one end of the capacitor unit and one end of the resistor unit, respectively, and the positive terminal of the diode is connected to the other end of the capacitor unit and the other end of the resistor unit, respectively.
6. The simulated photovoltaic module according to claim 5, characterized in that, The capacitor unit includes a capacitor; One end of the capacitor is connected to the output terminal of the current source, the negative terminal of the diode, and one end of the resistor unit, respectively. The other end of the capacitor is connected to the input terminal of the current source, the positive terminal of the diode, and the other end of the resistor unit, respectively.
7. The simulated photovoltaic module according to claim 6, characterized in that, The resistor unit includes a first resistor and a second resistor; One end of the first resistor is connected to the output terminal of the current source, the negative terminal of the diode, one end of the capacitor, and one end of the second resistor, respectively; the other end of the first resistor is connected to the input terminal of the current source, the positive terminal of the diode, and the other end of the capacitor, respectively. The other end of the first resistor and the other end of the second resistor are the output terminals of the simulated photovoltaic module.
8. A calibration device for a testing equipment, characterized in that, include: The parameter acquisition module is used to acquire the original performance parameters of the simulated photovoltaic module composed of electrical components; wherein, the original performance parameters are obtained by testing the simulated photovoltaic module with testing equipment; A calibration module is used to compare the original performance parameters with the standard performance parameters of the simulated photovoltaic module, and to calibrate the test equipment based on the comparison results.
9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 or 2.
10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 or 2.