Method and device for detecting and repairing dents of roller of calender on site

Abstract

The embodiment of the invention relates to a method and a device for detecting and repairing dents of a roller of a calender on site. Systems and methods for mapping and / or repairing a surface of a calender roller while the calender roller is still installed in a calender roller system are described. A method for mapping and repairing a surface of a calender roller may include: providing a calender roller system including a calender roller; surveying and mapping the surface profile of the calender roller; identifying a dimple region on the surface of the calender roller based at least in part on the surface profile; and depositing a material at the indented region. Systems for mapping and repairing surfaces of calender rollers are also described.

Description

[0001] Priority Application Cross Reference

[0002] This application claims priority to U.S. Patent Application No. 18 / 830,482, filed September 10, 2024, entitled “METHOD AND DEVICE FOR IN PLACE CALENDER ROLLER DENT INSPECTION AND REPAIR,” the technical disclosure of which is hereby incorporated by reference in its entirety for all purposes. TECHNICAL FIELD

[0003] The present disclosure relates generally to a calender roll system, and more particularly to a method and process for mapping and repairing a calender roll in a calender roll system. BACKGROUND

[0004] Calender rolls are used to form films, such as electrode films for energy storage devices. The materials used to form the films can include hard materials, such as electrode active materials for batteries, and calendering such hard materials can cause defects (e.g., scratches, dents) to form on the surface of the calender roll. Defects on the surface of the calender roll can cause varying film thickness or other defects across the width of the film. Prior methods for identifying and repairing defects on the surface of the calender roll require removal of the calender roll from the calender roll system, which is very time consuming. Therefore, there is a need for improved inspection and repair methods. SUMMARY

[0005] To summarize the present disclosure and its advantages over the prior art, certain objects and advantages of the present disclosure are described herein. Not all of these objectives or advantages can be achieved in any particular embodiment. Thus, for example, those skilled in the art will recognize that the application can be embodied or carried out in a manner that achieves or optimizes one advantage or a group of advantages as taught herein without necessarily achieving other objectives or advantages as can be taught or suggested herein.

[0006] All of these embodiments are intended to fall within the scope of the invention disclosed herein. These and other embodiments will become readily apparent to those skilled in the art from the following detailed description of the preferred embodiments with reference to the attached drawings, which are by way of illustration, not by way of limitation.

[0007] In a first aspect, a method for repairing a surface of a calender roll is disclosed. The process for repairing a surface of a calender roll includes: providing a calender roll system including a calender roll; mapping a surface profile of the calender roll; identifying a dented area on the surface of the calender roll based at least in part on the surface profile; and depositing a material at the dented area.

[0008] In some embodiments, mapping a surface profile of a calender roll includes rotating the calender roll; measuring a first circumferential surface profile of the calender roll at a first longitudinal position; measuring a second circumferential surface profile of the calender roll at a second longitudinal position; and combining the first circumferential surface profile and the second circumferential surface profile to form the surface profile of the calender roll, wherein the first longitudinal position and the second longitudinal position are along a length of the calender roll.

[0009] In some embodiments, mapping a surface profile of a calender roll includes measuring a first longitudinal surface profile at a first circumferential position; measuring a second longitudinal surface profile at a second circumferential position; combining the first longitudinal surface profile and the second longitudinal surface profile to form the surface profile of the calender roll, wherein the first circumferential position and the second circumferential position are along a circumference of the calender roll.

[0010] In some embodiments, the method further includes polishing the deposited material to match a surface of the calender roll. In some embodiments, the method further includes mapping a second surface profile of the calender roll after depositing the material. In some embodiments, rotating the calender roll includes rotating the calender roll at a circumferential speed in a range of 0.1 meters / minute to 50 meters / minute. In some embodiments, combining includes aligning the first circumferential surface profile and the second circumferential surface profile. In some embodiments, the indentation region includes a deepest point having a depth greater than about 10 pm. In some embodiments, the indentation region has an area greater than about 10 mm 2 In some embodiments, depositing the material includes depositing an electroplated metal or alloy at the indentation region. In some embodiments, depositing the material includes contacting the indentation region with a metal-containing solution. In some embodiments, the metal-containing solution includes cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, or a combination thereof. In some embodiments, depositing the material includes depositing a metal from the metal-containing solution at the indentation region. In some embodiments, the method further includes depositing a coating over the deposited material. In some embodiments, the coating includes nickel tungsten.

[0011] In a second aspect, a system for mapping a calender roll is disclosed. The system for mapping a calender roll includes a calender roll system including a calender roll, wherein the calender roll includes a roll surface and a shaft; a surface mapping device including a profilometer positioned on a track parallel to the calender roll shaft; an attachment component configured to detachably attach the surface mapping device to the calender roll system; and a detection element configured to coordinate rotation of the calender roll and position of the profilometer.

[0012] In some embodiments, the detection element comprises an incremental encoder. In some embodiments, the detection element comprises a calender roll encoder. In some embodiments, the detection element comprises a rotating recording element and a reference located on the surface of the roll. In some embodiments, the profilometer comprises a color sensor, a step height sensor, or a combination thereof. In some embodiments, the mapping device further comprises a defect localization unit. In some embodiments, the defect localization unit comprises a laser. In some embodiments, the calender roll system comprises a calender film located on the surface of the roll.

[0013] In a third aspect, a process for repairing and using a calender roll is disclosed. The process for repairing and using a calender roll comprises: providing a calender roll system comprising a calender roll; mapping a surface profile of the calender roll; identifying a dent region on the surface of the calender roll based at least in part on the surface profile; depositing a repair material at the dent region, wherein the repair material comprises a metal; and calendering an electrode film material comprising an electrode active material to form an electrode film, wherein the electrode active material comprises a metal, wherein the metal is selected from the group consisting of: cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, and combinations thereof. In some embodiments, the metal is selected from the group consisting of: cobalt, nickel, and combinations thereof. In some embodiments, the electrode active material is a cathode active material. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 is a perspective view of a calender roll system 100 according to some embodiments.

[0015] Figure 2 is a schematic flowchart of a process 200 for mapping and repairing a calender roll surface according to some embodiments.

[0016] Figure 3 is a schematic flowchart of a process 300 for mapping a calender roll surface according to some embodiments.

[0017] Figure 4 is a schematic flowchart of a process 400 for mapping a calender roll surface according to some embodiments.

[0018] Figure 5 is a schematic flowchart of a process 500 for mapping a calender roll surface according to some embodiments.

[0019] Figure 6 is a schematic flowchart of a process 600 for combining multiple cross-sectional surface profiles of a calender roll according to some embodiments.

[0020] Figure 7 is a schematic flowchart of a process 700 for repairing a calender roll surface according to some embodiments.

[0021] Figure 8 is a schematic flow chart of a process 800 for repairing a calender roll surface according to some embodiments.

[0022] Figure 9 is a schematic flow chart of a process 900 for repairing a calender roll surface according to some embodiments.

[0023] Figure 10A is a schematic perspective view of a system 1000 for mapping a calender roll surface according to some embodiments.

[0024] Figure 10B is a schematic side view of a system 1000 for mapping a calender roll surface according to some embodiments.

[0025] Figure 11 is a top-down schematic view of the relative position of the roll and the measurement unit 1102 before mapping begins according to some embodiments.

[0026] Figure 12 is a schematic perspective view of a system 1200 for mapping a calender roll surface according to some embodiments.

[0027] Figure 13 is a schematic illustration of a plating unit 1300 for a plating process according to some embodiments.

[0028] Figure 14A is an image of a dent region on a calender roll surface according to some embodiments.

[0029] Figure 14B is an image of a film formed using a calender roll having a dent according to some embodiments.

[0030] Figure 15 is a combined circumferential surface profile plot along the length of a calender roll according to some embodiments.

[0031] Figure 16 is a surface profile plot after combining the circumferential surface profiles in Figure 15 according to some embodiments.

[0032] Figure 17 is a surface profile plot of a calender roll according to some embodiments.

[0033] Figure 18A is an image of a dent region on a calender roll surface according to some embodiments.

[0034] Figure 18B is an image of a dent region after repair according to some embodiments.

[0035] Figure 18C is a surface profile plot of a calender roll prior to repair according to some embodiments.

[0036] Figure 18D is a surface profile plot of the same calender roll after repair according to some embodiments.

[0037] Figure 19A is a surface profile plot of another calender roll prior to repair according to some embodiments.

[0038] Figure 19B is a surface profile plot of a calender roll after plating according to some embodiments.

[0039] Figure 20A is a surface profile plot of another calender roll prior to repair according to some embodiments.

[0040] Figure 20B is a surface profile plot of a calender roll after plating according to some embodiments.

[0041] Figure 21A is a surface profile plot of a calender roll with an encoder mounted on a main frame according to some embodiments.

[0042] Figure 21B is a surface profile plot of a calender roll with an encoder mounted on a frame separate from the main frame according to some embodiments. DETAILED DESCRIPTION

[0043] The following detailed description of certain embodiments presents various descriptions of specific embodiments. However, the description presented here of the innovation can be presented in many different ways, for example, as defined and encompassed by the claims. In this description, reference is made to the drawings, where like numerals and / or terms can indicate like or functionally similar elements. It should be understood that the elements illustrated in the figures are not necessarily to scale. Additionally, it should be understood that certain embodiments can include more or fewer elements than shown in the figures, and / or a subset of the elements shown in the figures. Additionally, some embodiments can include any suitable combination of features from two or more of the figures. Headings are provided for convenience only and do not affect scope or meaning.

[0044] Systems and methods for mapping and / or repairing the surface of a calender roll while the calender roll is still mounted in a calender roll system are described. Because the surface of the calender roll is mapped and / or local defects are repaired without removing the roll from the roll system, the calender roll can be repaired without resorting to time-consuming and expensive methods that can require removal of the calender roll and repair of the entire or substantially the entire surface. Such systems and methods are particularly advantageous for calendering electrode film materials (e.g., electrode active materials), which can be particularly hard and often cause damage to the roll surface. Such substantially defect-free calender rolls can be advantageous for the manufacturing process of dry electrode films, where defects on the calender roll surface can be transferred to the dry electrode film and can cause the electrode film to perform poorly when used in an energy storage device.

[0045] Definitions

[0046] A “self-supporting” electrode film is an electrode film that incorporates a binder matrix structure sufficient to support the film or layer and maintain its shape, thereby enabling the electrode film or layer to be independently supported. A self-supporting electrode film or active layer is an electrode film that incorporates such a binder matrix structure when incorporated into an energy storage device. Typically and depending on the method employed, such electrode films have sufficient strength to be employed in an energy storage device manufacturing process without the need for any external support elements, such as current collectors or other films. For example, a “self-supporting” electrode film can have sufficient strength to be wound, handled, and unwound in an electrode manufacturing process without the need for other support elements. A dry electrode film, such as a cathode electrode film or an anode electrode film, can be self-supporting.

[0047] A “solvent-free” electrode film is an electrode film that is free of detectable processing solvents, processing solvent residues, or processing solvent impurities. A dry electrode film, such as a cathode electrode film or an anode electrode film, can be solvent-free.

[0048] A “wet” electrode, “wet process” electrode, or slurry electrode is an electrode that is prepared by at least one step involving a slurry of active material(s), binder(s), and optional additive(s). A wet electrode can include processing solvents, processing solvent residues, and / or processing solvent impurities.

[0049] Generally, one or more aspects of the present disclosure relate to systems and methods for mapping and repairing a calender roll in a calender roll system. A method for repairing a calender roll surface includes mapping a surface of the calender roll, identifying surface defects, and depositing material at the surface defects. In some embodiments, the method further includes mapping the calender roll surface after depositing material at the identified surface defects. In some embodiments, the repair of the calender roll surface is complete if the depth of the repaired surface defects is less than a threshold value.

[0050] Calender roll system for forming electrode films

[0051] Figure 1 This is a perspective view of a calender roll system 100 including adjacent calender rolls 180A and 180B according to some embodiments. Calender roll 180A is supported at opposite ends by a first bearing housing assembly 100A and a second bearing housing assembly 100C. Calender roll 180B is supported at opposite ends by a third bearing housing assembly 100B and a fourth bearing housing assembly 100D. The first bearing housing assembly 100A supports a first journal 182A located at a first end of the first calender roll 180A. The second bearing housing assembly 100C supports a second journal 182C located at a second end of the first calender roll 180A. The third bearing housing assembly 100B supports a first journal 182B located at a first end of the second calender roll 180B. The fourth bearing housing assembly 100D supports a second journal 182D located at a second end of the second calender roll 180B. Calender rolls 180A and 180B are adjacent to each other. In some embodiments, the calender roll includes a shaft located at the center of the roll, which supports and drives the roll to rotate. In some embodiments, the length of the roll is, is about, is at least, is at least about, is at most, is at most about, is at most about 0.5m, 1m, 1.1m, 1.2m, 1.3m, 1.4m, 1.5m, 1.6m, 1.7m, 1.8m, 1.9m, 2m, 2.1m, 2.2m, 2.3m, 2.4m, 2.5m, 3m, 4m, 5m, 6m, 7m, 8m, 9m, or 10m, or any value range between them. In some embodiments, the diameter of the roller is, is about, is at least, is at least about, is at most about, is at most about 0.1m, 0.2m, 0.3m, 0.4m, 0.5m, 0.6m, 0.7m, 0.8m, 0.9m, 1m, 1.1m, 1.2m, 1.3m, 1.4m, 1.5m, 2m, or 3m, or any value range between them. Figure 1 As illustrated, considering the size of the rollers, disassembling the rollers from the bearing housing assembly, repairing the roller surfaces, and then reinstalling the rollers back into the roller system is very time-consuming. Therefore, the roller system requires an in-place inspection and repair method. In some embodiments, the "in-place" inspection and / or repair method allows for inspection and / or repair without removing the calender rollers from the calender roller system.

[0052] Process for mapping and repairing calender roll surfaces

[0053] Figure 2 A process 200 for mapping and repairing the surface of a calender roll, according to some embodiments, is schematically illustrated. For example... Figure 2As illustrated, process 200 includes mapping the surface profile of the calender roll at step 202. Process 200 also includes a step 204 of identifying surface defects. Process 200 further includes depositing material at the surface defects at step 206. After material is deposited at the surface defects at step 206, the calender roll surface can be remapped by returning to step 210 to mapping step 202. In some embodiments, other surface defects may be identified at step 204, and material may be deposited at the surface defects at step 206. In some embodiments, no further surface defects are identified at step 204, and repair is completed at step 208.

[0054] Process for mapping calender roll surfaces

[0055] Figure 3 A process 300 for mapping the surface of a calender roll, according to some embodiments, is schematically illustrated. For example... Figure 3 As illustrated, method 300 includes measuring multiple cross-sectional surface profiles of a calender roll at multiple locations at step 302, and combining the multiple cross-sectional surface profiles at step 304 to form a surface profile of the calender roll. Method 300 further includes identifying surface defects at step 306. In some embodiments, combining the multiple cross-sectional surface profiles includes aligning the multiple cross-sectional surface profiles with information from multiple locations. In some embodiments, the calender roll is mapped onto its surface using a calendering film. In some embodiments, identifying surface defects includes marking the surface defects.

[0056] In some embodiments, the cross-sectional surface profile includes a circumferential surface profile, a longitudinal surface profile, or a combination thereof. In some embodiments, the circumferential surface profile of the calender roll at a particular location is a surface feature along the circumference of the roll at that location. In some embodiments, the longitudinal surface profile of the calender roll at a particular location is a surface feature along the length of the roll at that location. In some embodiments, surface features include surface profile, texture, variation, roughness, and combinations thereof. In some embodiments, multiple locations include multiple longitudinal locations along the length of the calender roll, multiple circumferential locations along the circumference of the calender roll, or combinations thereof.

[0057] In some embodiments, surface defects include scratches, dents, cracks, pits, corrosion, pores, stains, blistering, or combinations thereof. In some embodiments, a surface defect is a dent. In some embodiments, a surface defect is identified when one or more parameters of the surface defect are above a threshold. In some embodiments, parameters of the surface defect may include average depth or height, maximum depth or height, surface area, volume, or combinations thereof. In some embodiments, a surface defect is identified when the maximum depth of the recessed area is, is about, is at least, or is at least about 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, 20 μm, 25 μm, 30 μm, 40 μm, 50 μm, or 100 μm, or any value range between them. In some embodiments, the area of ​​the recessed area is, is about, is at least, or is at least about 1 mm. 2 2mm 2 3mm 2 4mm 2 5mm 2 6mm 2 7mm 2 8mm 2 9mm 2 10mm 2 11mm 2 12mm 2 13mm 2 14mm 2 15mm 2 16mm 2 17mm 2 18mm 2 19mm 2 20mm 2 25mm 2 30mm 2 40mm 2 50mm 2 Or 100mm 2Surface defects are identified when the average depth of the recessed region is, is approximately, is at least, or is at least approximately 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, 20 μm, 25 μm, 30 μm, 40 μm, 50 μm, 100 μm, or any value range between them. In some embodiments, a surface defect region is identified when the maximum depth of the recessed region is greater than about 10 μm and the area is greater than about 10 mm². In some embodiments, the threshold for surface defects is determined by the precision requirements of the film formed by the calender rolls.

[0058] Figure 4 A schematic illustration shows a process 400, according to some embodiments, for mapping the surface of a calender roll by measuring multiple circumferential surface profiles. For example... Figure 4 As illustrated, process 400 includes a rotary calender roll 402. Process 400 also includes measuring a first circumferential surface profile at a first longitudinal position at step 404, and measuring a second circumferential surface profile at a second longitudinal position at step 406. In some embodiments, measuring the first and / or second circumferential surface profiles includes recording information about the first and / or second longitudinal positions. Process 400 includes combining the first and second circumferential surface profiles at step 408 to form a surface profile of the calender roll, and identifying surface defects at step 410. In some embodiments, combining the first and second circumferential surface profiles includes aligning the first and second circumferential surface profiles with the recorded information about the first and second longitudinal positions.

[0059] In some embodiments, the calender rolls rotate continuously throughout the mapping process. In some embodiments, the calender rolls rotate while measuring the circumferential surface profile. In some embodiments, measuring the circumferential surface profile of the calender rolls at a specific location includes measuring the circumferential surface profile of the calender rolls while the calender rolls rotate at least one full revolution (such as 1 revolution, 2 revolutions, 3 revolutions, 4 revolutions, 5 revolutions, 10 revolutions, or any number of revolutions in between). In some embodiments, the number of revolutions of the calender rolls is set as needed. In some embodiments, the completion of rotation of the calender rolls at a first position triggers the measuring device to move to a second position. In some embodiments, the calender rolls rotate at circumferential speeds of approximately 0.1 m / min, 1 m / min, 2 m / min, 5 m / min, 10 m / min, 15 m / min, 20 m / min, 25 m / min, 30 m / min, 35 m / min, 36 m / min, 37 m / min, 38 m / min, and 39 m / min. 40 m / min, 41 m / min, 42 m / min, 43 m / min, 44 m / min, 45 m / min, 46 m / min, 47 m / min, 48 m / min, 49 m / min, 50 m / min, 55 m / min, 60 m / min, 70 m / min, 80 m / min, 90 m / min or 100 m / min, or any range of values ​​in between.

[0060] In some embodiments, the information of the first longitudinal position and / or the second longitudinal position includes the relative distance between the first longitudinal position and / or the second longitudinal position and the starting position. In some embodiments, the first circumferential position and the second circumferential position are along the length of the calender roll. In some embodiments, the first circumferential position and the second circumferential position are along a line parallel to the axis of the calender roll. In some embodiments, the first circumferential position and the second circumferential position are adjacent positions. In some embodiments, the distance between two adjacent positions is no greater than the field of view of the measuring device. In some embodiments, the distance between the first circumferential position and the second circumferential position is, approximately, at most, at most approximately, at least, or at least approximately 1 mm, 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm, 9 mm, 10 mm, 11 mm, 12 mm, 13 mm, 14 mm, 15 mm, 16 mm, 17 mm, 18 mm, 19 mm, 20 mm, 25 mm, 30 mm, 40 mm, or 50 mm, or any value range between them.

[0061] Figure 5 A schematic illustration shows a process 500, according to some embodiments, for mapping the surface of a calender roll by measuring multiple longitudinal surface profiles. For example... Figure 5As illustrated, process 500 includes measuring a first longitudinal surface profile at a first circumferential position at step 502, and measuring a second longitudinal surface profile at a second circumferential position at step 504. In some embodiments, measuring the first and / or second longitudinal surface profiles includes recording information about the first and / or second circumferential positions. In some embodiments, the recorded information about the first and / or second circumferential positions includes a relative distance from a starting position. In some embodiments, when measuring from the first circumferential position to the second circumferential position, the calender roll rotates while the measuring unit is fixed. In some embodiments, when the measuring unit moves from the first circumferential position to the second circumferential position, the calender roll does not rotate. Process 500 also includes combining the first and second longitudinal surface profiles at step 506 to form a surface profile of the calender roll, and identifying surface defects at step 508. In some embodiments, combining the first and second longitudinal surface profiles includes aligning the first and second longitudinal surface profiles with the recorded information about the first and second circumferential positions.

[0062] Figure 6 A process 600 for assembling multiple cross-sectional surface profiles of calender rolls, according to some embodiments, is schematically illustrated. Figure 6As illustrated, process 600 includes collecting raw data at step 602. In some embodiments, the raw data includes a cross-sectional surface profile, measurement location information, the rotational speed of a calender roll, or a combination thereof. Process 600 also includes detrending the collected raw data at step 604. In some embodiments, detrending the collected raw data includes identifying a trend in the cross-sectional surface profile, fitting a trend line to the cross-sectional surface profile, and subtracting the trend line from the cross-sectional surface profile. In some embodiments, the trend line includes a best-fit line. In some embodiments, detrending the collected raw data further includes correcting for errors in the combined cross-sectional surface profile before identifying the trend. Process 600 also includes a step 606 of filtering the detrended data. In some embodiments, filtering the detrended data includes removing data below a threshold from the cross-sectional surface profile. In some embodiments, the threshold is, is approximately, is at least, is at least about, is at most, is at most about 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.1 μm, 1.2 μm, 1.3 μm, 1.4 μm, 1.5 μm, 1.6 μm, 1.7 μm, 1.8 μm, 1.9 μm, 2 μm, 2.1 μm, 2.2 μm, 2.3 μm, 2.4 μm, 2.5 μm, 2.6 μm, 2.7 μm, 2.8 μm, 2.9 μm, 3 μm, 4 μm, or 5 μm, or any range of values ​​between them. Process 600 further forms a surface profile of the calender roll at step 608. In some embodiments, forming the surface profile of the calender roll includes combined filtered data. In some embodiments, combining filtered data includes aligning information about the cross-sectional surface profile with its position. In some embodiments, aligning the cross-sectional surface profile includes combining circumferential surface profiles as a function of the roll circumference and position along the length of the calender roll. In some embodiments, aligning the cross-sectional surface profile includes combining longitudinal surface profiles as a function of the roll length and position along the circumference of the calender roll. In some embodiments, the surface profile is a surface roughness map as a function of the circumference and length of the calender roll. In some embodiments, surface defect regions can be identified and located on the surface profile of the calender roll. In some embodiments, surface defects can be identified and marked once parameters and thresholds for the surface defects are provided.

[0063] Process for repairing calender roll surfaces

[0064] In some embodiments, after identifying and marking surface defects, the surface defects can be repaired. In some embodiments, the repair is performed manually or through automated methods. Figure 7A process 700 for repairing the surface of a calender roll, according to some embodiments, is schematically illustrated. For example... Figure 7 As illustrated, process 700 includes: contacting a surface defect region with a metal-containing solution at step 702; depositing material at the surface defect region at step 704; and polishing the surface of the deposited material at step 706.

[0065] Figure 8 The diagram schematically illustrates a detailed process 800 for repairing the surface of a calender roll according to some embodiments. For example... Figure 8 As illustrated, process 800 includes cleaning a surface defect area to form a cleaned dent area. In some embodiments, the surface defect area may be identified in the mapping process disclosed herein or may be identified by other methods. Method 800 also includes masking the cleaned defect area at step 804. In some embodiments, masking includes covering the surface of the calender roll surrounding the defect area. In some embodiments, masking includes covering the surrounding surface with masking tape. In some embodiments, the masking tape includes aluminum foil tape, vinyl tape, or a combination thereof. Method 800 includes contacting the defect area with a metal-containing solution at step 806 and depositing a filler material at step 808 to at least partially fill the cleaned defect area. In some embodiments, an electrolyte is stably supplied throughout the electroplating process. In some embodiments, the electrolyte comprises a metal-organic liquid. Process 800 also includes forming a coating over the deposited filler material at step 810 and polishing the repaired area at step 812. In some embodiments, step 810 of forming a coating over the deposited filler material is optional.

[0066] In some embodiments, cleaning the defective area includes electro-cleaning (i.e., electrochemical cleaning or electrolytic cleaning) the defective area. In some embodiments, electro-cleaning the defective area removes oil, grease, oxides, and other impurities from the defective area. In some embodiments, electro-cleaning the defective area includes electro-cleaning using NaOH. In some embodiments, cleaning the defective area includes etching the defective area. In some embodiments, etching the defective area includes physical etching, chemical etching, or a combination thereof. In some embodiments, chemical etching includes etching with hydrochloric acid at concentrations of 1 wt.%, 5 wt.%, 6.5 wt.%, 7 wt.%, 8 wt.%, 9 wt.%, 10 wt.%, 11 wt.%, 12 wt.%, 13 wt.%, 14 wt.%, or 15 wt.%, or any value range between them. In some embodiments, etching includes etching the defective area to enlarge the defective area. In some embodiments, etching includes etching the defective area to increase the depth of the defective area. In some embodiments, etching includes etching the defective area to increase the aspect ratio of the defective area.

[0067] In some embodiments, the metal in the metal-containing solution includes cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, or combinations thereof. In some embodiments, the metal in the metal-containing solution includes cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, titanium, chromium, copper, silicon, or combinations thereof. In some embodiments, the metal in the metal-containing solution includes tungsten. In some embodiments, the metal in the metal-containing solution includes cobalt, nickel, tungsten, chromium, copper, or combinations thereof. In some embodiments, the metal-containing solution includes a sulfate of a metal. In some embodiments, the metal-containing solution includes nickel sulfate, cobalt sulfate, or combinations thereof. In some embodiments, the metal in the metal-containing solution includes the metal contained in the electrode film mixture to be rolled through a calender roll. In some embodiments, the metal in the metal-containing solution is one or more elements contained in the active material of the electrode film mixture to be rolled through a calender roll. In some embodiments, the metal in the active material of the electrode film mixture includes cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, titanium, chromium, copper, silicon, or combinations thereof. For example, if the calender rolls are used to calender an electrode film mixture including a lithium nickel manganese cobalt (“NMC”) film, the metal in the metal-containing solution may include nickel, cobalt, manganese, or a combination thereof. In some embodiments, since the metal in the metal-containing solution is one or more elements contained in the active material of the electrode film mixture, the calendered film will not be affected or contaminated even if a small amount of deposit peels off from the roll surface. In some embodiments, the metal in the metal-containing solution may enhance the properties of the deposited material, such as increasing hardness, Young's modulus, toughness, and abrasion resistance. In some embodiments, the metal-containing solution includes elements that help improve the adhesion between the deposited material and the roll surface. In some embodiments, the Young's modulus of the metal in the metal-containing solution is, is about, is at least, or is at least about 100 GPa, 110 GPa, 120 GPa, 130 GPa, 140 GPa, 150 GPa, 160 GPa, 170 GPa, 180 GPa, 190 GPa, 200 GPa, 210 GPa, 220 GPa, 230 GPa, 240 GPa, 250 GPa, or 300 GPa, or any value range between them. In some embodiments, the material deposited in the defect region comprises the metal in the metal-containing solution. In some embodiments, the material deposited in the defect region comprises a metal or alloy. In some embodiments, the material deposited in the defect region comprises cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, or combinations thereof. In some embodiments, the metal deposited in the defect region comprises cobalt, nickel, tungsten, or combinations thereof. In some embodiments, the deposited material comprises the metal element contained in the electrode film mixture to be rolled through the rolls of a rolling mill. In some embodiments, the deposited material includes elements that can improve hardness, Young's modulus, toughness, wear resistance, etc.In some embodiments, the deposited material includes elements capable of improving adhesion to the roller surface.

[0068] In some embodiments, depositing material and / or forming a coating at the defect area includes electroplating. In some embodiments, electroplating includes first contacting the defect area with a pre-plating solution and then contacting the defect area with a metal-containing solution. In some embodiments, the pre-plating solution includes an acid of the metal to be deposited, such as nickel acid or cobalt acid. In some embodiments, electroplating includes depositing metal in a metal-containing solution using an electric current. In some embodiments, electroplating is performed at temperatures of 15°C, 20°C, 25°C, 26°C, 27°C, 28°C, 29°C, 30°C, 31°C, 32°C, 33°C, 34°C, 35°C, 36°C, 37°C, 38°C, 39°C, 40°C, 41°C, 42°C, 43°C, or 45°C, 45°C, 50°C, 55°C, or 60°C, or any range of values ​​between them, such as 15°C-60°C, 15°C-50°C, 35°C-50°C, or 35°C-40°C. In some embodiments, the current density of the electroplating is, approximately, at least, at least about, at most, or at most about 0.5, 0.6, 0.7, 0.9, 0.9, 1, 1.1, 1.2, 1.3, 1.4, 1.5, 1.6, 1.7, 1.8, 1.9, 2, 2.1, 2.2, 2.3, 2.4, 2.5, 3, 4, or 5, or any range of values ​​between them. In some embodiments, a higher electroplating current density may result in porous and / or burn-in plating material. In some embodiments, a lower electroplating current density may result in a longer electroplating time. In some embodiments, the electroplating is performed at a stable or substantially stable current density and / or at a stable or substantially stable temperature. In some embodiments, the electroplating includes activating the surface of defective regions before applying current. In some embodiments, activating the surface includes contacting the surface of the defect area with sulfuric acid of the following concentrations: 1 wt.%, 5 wt.%, 10 wt.%, 11 wt.%, 12 wt.%, 13 wt.%, 14 wt.%, 15 wt.%, 16 wt.%, 17 wt.%, 18 wt.%, 19 wt.%, 20 wt.%, 30 wt.%, or any range of values ​​between them.

[0069] In some embodiments, forming a coating over the deposited material includes depositing a coating. In some embodiments, forming a coating over the deposited metal includes electroplating with a solution containing the material to be deposited. In some embodiments, the coating includes a material that is harder than the material deposited at the defect region. In some embodiments, the coating includes a material that has higher wear resistance than the deposited metal. In some embodiments, the coating includes a material with a hardness of 45Rc, 48Rc, 49Rc, 50Rc, 51Rc, 52Rc, 53Rc, 54Rc, 55Rc, 56Rc, 57Rc, 58Rc, 59Rc, 60Rc, 65Rc, or 70Rc, or any value range between them. In some embodiments, the coating prevents the deposited metal from wearing away. In some embodiments, the coating includes nickel-tungsten. In some embodiments, the coating has a thickness of 0.1 μm, 0.5 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 15 μm, or 20 μm, or any range of values ​​between them, such as 0.1-20 μm, 0.1-10 μm, 1-10 μm, or 1-5 μm. In some embodiments, the surface of the coating is higher than the surface surrounding the defect area. In some embodiments, the surface of the coating is raised above the surface of the area surrounding the defect region by 1 μm, 2 μm, 3 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 11 μm, 12 μm, 13 μm, 14 μm, 15 μm, 16 μm, 17 μm, 18 μm, 19 μm, or 20 μm, or any value between them. In some embodiments, the coating is further polished to match the surface surrounding the defect region.

[0070] In some embodiments, polishing includes grinding the repaired area. In some embodiments, grinding includes using abrasive belts, abrasive blocks, or a combination thereof. In some embodiments, the abrasive block includes a curved or flat surface that matches the surface of the roller. In some embodiments, polishing includes polishing with a high-grit polishing agent. In some embodiments, the high-grit polishing agent includes, includes about, includes at least, includes at least about, includes at most, includes at most about about 100 grit, 500 grit, 1000 grit, 1500 grit, 1600 grit, 2000 grit, 2400 grit, 2500 grit, 3000 grit, 5000 grit, or 10000 grit, or any range of values ​​between them. In some embodiments, the size of the high-particle-size compound is, is about, is at least, is at least about, is at most, is at most about, is at most about 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 0.3 μm, 4 μm, 5 μm, or 10 μm, or any value range between them. In some embodiments, polishing does not change the roughness of the roller surface around the unrepaired defect area. In some embodiments, the average roughness (Ra) of the polished surface is, is approximately, is at most, or is at most about 0.01 μm, 0.02 μm, 0.03 μm, 0.04 μm, 0.05 μm, 0.06 μm, 0.07 μm, 0.08 μm, 0.09 μm, 0.1 μm, 0.2 μm, 0.3 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.8 μm, or 1 μm, or any value range between them. In some embodiments, the gloss and roughness of the polished area match the surrounding surface. In some embodiments, the roughness of the polished surface can meet the manufacturing requirements of subsequent calendering processes.

[0071] In some embodiments, the depth of the defect area after repair and polishing is reduced to, about, less than, less than about 0.1 μm, 0.5 μm, 1 μm, 1.5 μm, 2 μm, 2.5 μm, 3 μm, 3.5 μm, 4 μm, 5 μm, 6 μm, 7 μm, 8 μm, 9 μm, 10 μm, 15 μm, or 20 μm, or any value range between them. In some embodiments, the depth of the defect area after repair and polishing is reduced to, about, less than, less than about 90%, 80%, 70%, 60%, 50%, 40%, 35%, 30%, 25%, 20%, 15%, 10%, 5%, or 0% of the depth of the defect area before repair, or any value range between them. In some embodiments, the surface of the defect area after repair and polishing is higher than the surrounding surface.

[0072] In some embodiments, the surface area of ​​the defective region after repair and polishing is reduced to approximately, less than, or less than approximately 0.1 mm. 2 0.5mm 2 1mm 2 1.5mm 2 2mm 2 2.5mm 2 3mm 2 3.5mm 2 4mm 2 5mm 2 6mm 2 7mm 2 8mm 2 9mm 2 10mm 2 15mm 2 20mm 2 25mm 2 30mm 2 35mm 2 40mm 2 45mm 2 Or 50mm 2 The value may be 90%, 80%, 70%, 60%, 50%, 40%, 35%, 30%, 25%, 20%, 15%, 10%, 5%, or 0% of the surface area of ​​the defective area before repair and polishing, or any value range between them. In some embodiments, the surface area of ​​the defective area after repair and polishing is reduced to, about, less than, less than about, 90%, 80%, 70%, 60%, 50%, 40%, 35%, 30%, 25%, 20%, 15%, 10%, 5%, or 0% of the surface area of ​​the defective area before repair, or any value range between them.

[0073] In some embodiments, material deposition, polishing, and / or repair are limited to the defect area. In some embodiments, only the identified defect area and its surrounding area are repaired. In some embodiments, the repair area is, approximately, less than, or less than approximately 10%, 5%, 1%, 0.1%, 0.05%, 0.01%, 0.005%, 0.001%, or 0.0001% of the surface area of ​​the calender roll, or any value in between.

[0074] In some embodiments, the aspect ratio of the defective region is, at most, or at most about 1 / 5, 1 / 6, 1 / 7, 1 / 8, 1 / 9, or 1 / 10, or any value range between them. In some embodiments, the defective region has a high aspect ratio, thus repeated electroplating and polishing processes are advantageous. In some embodiments, the high aspect ratio is, about, at least, or at least about, 1 / 5, 1 / 4, 1 / 3, 1 / 2, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 15, or 20, or any value range between them. Figure 9The illustration schematically depicts a process 900 for repairing defective regions with a high aspect ratio, according to some embodiments. For example... Figure 9 As illustrated, process 900 includes: coating a defect region with a metal-containing solution at step 902; depositing material at step 904 to partially fill the defect region; and polishing the partially filled defect region at step 906. In some embodiments, partially filling the defect region includes filling, filling about, filling at least, filling at least about, filling at most, filling up to about 5%, 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80%, 90%, or 95% of the defect depth, or any value range between them. In some embodiments, polishing the partially filled defect region includes polishing the defect region to a known surface. Process 900 further includes: coating the partially filled defect region with a metal-containing solution, 908; depositing material at step 910 to completely fill the defect region; and polishing the completely filled defect region at step 912. In some embodiments, the partial filling / polishing steps are repeated 2, 3, 4, 5, 6, 7, 8, 9, or 10 times, or any value range between them.

[0075] Calender roll surface mapping system

[0076] Some embodiments of this disclosure relate to a system for mapping the surface of a calender roll. In some embodiments, the system includes a calender roll system and a surface mapping apparatus. In some embodiments, the calender roll system includes a calender roll having a roll surface and a shaft. In some embodiments, the surface mapping apparatus includes a measuring unit located on a track. In some embodiments, the system includes a motor configured to move the measuring unit along the track. In some embodiments, the track is parallel to the shaft. In some embodiments, the system includes an attachment member configured to detachably attach the surface mapping apparatus to the calender roll system. In some embodiments, the surface mapping apparatus further includes a detection element configured to coordinate the rotation of the calender roll and the position of the measuring unit. In some embodiments, the detection element includes a sensor and an incremental encoder. In some embodiments, the detection element includes a separate calender roll encoder, or as a supplement to or replacement for an external encoder. In some embodiments, the calender roll encoder is an incremental encoder or an absolute encoder of the calender roll.

[0077] In some embodiments, the detection element includes a sensor and an incremental encoder. Figure 10A This is a schematic perspective view of a system 1000 for mapping the surface of a calender roll, according to some embodiments. Figure 10AAs illustrated, system 1000 includes a calender roll 1004 (not shown) having a roll surface and a shaft. System 1000 also includes a mapping device 1002. The mapping device 1002 includes a measuring unit 1006, a sensor 1008, an incremental encoder 1010, a main frame 1018, a motor 1012, and a guide rail 1014. The motor 1012 and the measuring unit 1006 are mounted on the main frame 1018. In some embodiments, the incremental encoder 1010 is not directly mounted on the main frame 1018. After the roll 1004 begins to rotate, the sensor 1008 detects the start of the roll rotation and the completion of one revolution. After the roll 1004 begins to rotate, the incremental encoder 1010 triggers the measuring unit 1006 to measure the circumferential surface profile of the roll at the initial position. After measuring the circumferential surface profile of the roller at the starting position, the incremental encoder 1010 triggers the motor 1012 to move one step along the track 1014 in the direction of 1020. In some embodiments, the sensor 1008 detects that rotation has been completed at a certain position. The motor 1012 drives the measuring unit 1006 to move one step along the track 1014 in the direction of 1016 and measures the circumferential surface profile of the roller at that position. The measuring unit 1006 moves to the next position and continues to measure the circumferential surface profile of the roller at that position until it reaches the end of the track.

[0078] In some embodiments, sensor 1008 can detect the completion of one revolution of the calender roll by detecting a reference on the surface of the roll. Figure 10B This is a schematic side view of a system 1000 for mapping the surface of a calender roll, according to some embodiments. Figure 10B As illustrated, a reference 1020 can be attached to the surface of a calender roll 1004. A sensor 1008 can identify the reference 1020 and use it as the start and end point of a rotation. In some embodiments, the reference 1020 can be used as a zero-reference position for aligning circumferential surface profiles measured at different locations. In some embodiments, the sensor includes a color sensor or a step height sensor. In some embodiments, the color of the reference differs from the color of the roll surface. In some embodiments, the color of the reference is easily identifiable by a rotational recording element. In some embodiments, the reference includes a thickness that can be identified by a rotational recording element.

[0079] Figure 11 This is a schematic top view showing the relative positions of the rollers and measuring unit 1102 before the start of mapping, according to some embodiments. Figure 11As illustrated, roller 1106 has a first edge 1104 and a second edge 1108. The starting position of measuring unit 1102 is close to the first edge 1104 of roller 1106, at a distance of L3. The measuring range of measuring unit 1102 is L2, which is less than the length L1 of roller. After the measurement begins, roller rotates, and measuring unit 1102 measures the circumferential surface profile at the starting position until roller 1106 completes at least one revolution. Then, measuring unit 1102 moves along the length of roller 1206 from the starting position to a second position and measures the circumferential surface profile at the second position. Then, measuring unit 1102 moves along the length of roller 1206 from the second position to the next position and measures the circumferential surface profile at the next position until measuring unit 1102 reaches the end of the measuring range L2 near the second edge 1108.

[0080] In some embodiments, the detection element can correlate the position of the measuring unit with the rotation of the calender roll without the need for external sensors or external encoders. In some embodiments, the detection element includes a calender roll encoder for detecting the completion of a rotation. In some embodiments, after the calender roll encoder detects that the calender roll has completed one rotation, it triggers a motor to move the measuring unit to the next position.

[0081] In some embodiments, the system for mapping the surface of a calender roll includes a mapping device for measuring the longitudinal surface profile. Figure 12 A system 1200 for mapping the surface of a calender roll by measuring a longitudinal surface profile, according to some embodiments, is schematically illustrated. Figure 12 As illustrated, system 1200 includes a calender roll 1202 (not shown) having a roll surface and a shaft. System 1200 also includes a mapping device comprising a measuring unit 1204. In some embodiments, the measuring unit 1204 is rotatable in a direction 1206 while the calender roll is fixed. In some embodiments, the measuring unit is fixed while the calender roll 1202 rotates in a direction 1206. In some embodiments, the measuring unit 1204 is configured to measure a longitudinal surface profile at a specific circumferential location.

[0082] In some embodiments, the system includes a defect location unit. In some embodiments, when a surface defect is detected and located, the defect location unit can mark the identified defect for further repair. In some embodiments, the defect location unit includes a laser or other suitable marker. In some embodiments, the defect location unit is configured to locate a surface defect once parameters and thresholds (e.g., average or maximum depth, surface area) of the surface defect are provided.

[0083] In some embodiments, the measuring unit includes a profilometer, a capacitive sensor, a digital microscope, a camera, or any other sensor capable of collecting surface profile data, or a combination thereof. In some embodiments, the profilometer includes a contact profilometer or a non-contact profilometer. In some embodiments, the profilometer includes a laser profilometer. In some embodiments, the measuring unit has a range of field of view (FOV). In some embodiments, the measuring unit includes a field of view (FOV) of 1 mm, 2 mm, 3 mm, 4 mm, 5 mm, 6 mm, 7 mm, 8 mm, 9 mm, 10 mm, 11 mm, 12 mm, 13 mm, 14 mm, 15 mm, 20 mm, 25 mm, 30 mm, 35 mm, 40 mm, or 50 mm, or any range of values ​​between them. In some embodiments, the resolution of the measurement unit is, is about, is at least, is at least about, is at most, is at most about 0.01 μm, 0.05 μm, 0.1 μm, 0.15 μm, 0.2 μm, 0.25 μm, 0.3 μm, 0.35 μm, 0.4 μm, 0.5 μm, 0.6 μm, 0.7 μm, 0.8 μm, 0.9 μm, 1 μm, 1.5 μm, 2 μm, 5 μm, or 10 μm, or any range of values ​​between them.

[0084] In some embodiments, the system for mapping the surface of a calender roll includes 1, 2, 3, 4, 5, or 10 mapping devices. In some embodiments, the system includes a mapping device located at the top of the calender roll and another mapping device located at the bottom of the calender roll.

[0085] In some embodiments, the system for mapping the surface of a calender roll is configured to measure the surface profile of a calender roll having a calendering film on its surface.

[0086] System for repairing calender roll surfaces

[0087] Some embodiments of this disclosure relate to a system for repairing the surface of a calender roll. In some embodiments, the repair system includes a calender roll system and a surface repair apparatus. In some embodiments, the calender roll system includes a calender roll having a roll surface and a shaft. In some embodiments, the surface repair apparatus includes an electroplating unit. In some embodiments, the surface repair apparatus further includes a polishing unit.

[0088] Figure 13 This is a schematic diagram of an electroplating unit 1300 for an electroplating process according to some embodiments. For example... Figure 13As illustrated, the defect area is surrounded by masking tape 1310, and a metal-containing solution 1304 is coated on the surface of the defect area before electroplating. An anode 1308 is wrapped with an anode coating layer 1306 and placed on the solution 1304. The anode 1308 is connected to the positive terminal of a power supply, and the surface of the rolling mill roll is grounded or connected to the negative terminal of the power supply. After the power is turned on, metal 1302 is deposited from the metal-containing solution 1304 onto the defect area. In some embodiments, because the current path between the anode and cathode is shortest and the gap between the anode and cathode is smallest, the metal is first deposited at the shallower portions of the defect area, such as the edges or corners of the defect area. In some embodiments, electroplating includes the use of brush plating. In some embodiments, the anode comprises a graphite anode or a platinum anode.

[0089] In some embodiments, a system for repairing the surface of a calender roll includes an automated electroplating unit and a polishing unit located above the surface of the calender roll. In some embodiments, the automated electroplating unit and / or polishing unit includes microactuators configured to provide micro-actuation. In some embodiments, after surface defects are repaired and polished, the roll rotates to the next position. In some embodiments, the roll rotates during repair and polishing. In some embodiments, electroplating solvent is continuously provided throughout the electroplating process.

[0090] Electrode film mixtures, electrode films, and energy storage devices

[0091] In some embodiments, the powder and / or membrane used in the system and method may be a dry electrode material / mixture. In some embodiments, the powder and / or membrane used in the system and method may be a wet electrode material / mixture. In some embodiments, the dry electrode material is used to form an electrode membrane, such as a cathode electrode membrane or an anode electrode membrane. In some embodiments, the electrode is formed from the electrode membrane and a current collector. In some embodiments, the electrode membrane includes an active material. In some embodiments, the electrode membrane further includes at least one binder. In some embodiments, the electrode membrane comprises an active material in an amount of, about, at least, or at least about 70 wt.%, 75 wt.%, 80 wt.%, 81 wt.%, 82 wt.%, 83 wt.%, 84 wt.%, 85 wt.%, 86 wt.%, 87 wt.%, 88 wt.%, 89 wt.%, 90 wt.%, 91 wt.%, 92 wt.%, 93 wt.%, 94 wt.%, 95 wt.%, 96 wt.%, 97 wt.%, 98 wt.%, 99 wt.%, or 100 wt.%, or any value range between them. The electrode membrane can be used to form an energy storage device.

[0092] In some embodiments, the electrode and / or current collector includes an adhesive layer. A dry electrode film is adhered to the adhesive layer. In some embodiments, the adhesive layer includes a carbon coating. In some embodiments, the carbon coating includes a conductive carbon coating or layer. In some embodiments, the electrode and / or current collector includes an electrode foil and an insulator (e.g., a carbon coating) disposed entirely, substantially entirely, or partially over the current collector. In some embodiments, the current collector includes a single adhesive layer. In some embodiments, the adhesive layer is a patterned adhesive layer. In some embodiments, the adhesive layer includes a plurality of adhesive elements separated from each other. In some embodiments, the adhesive layer is the same size as the electrode film disposed over the adhesive layer. In some embodiments, the adhesive layer is larger than the electrode film disposed over the adhesive layer. In some embodiments, the adhesive layer is disposed over the current collector to form a coated current collector, and then the electrode film is disposed over the coated current collector to form an electrode.

[0093] In some embodiments, the electrode film material and / or the electrode film includes an active cathode material. The active cathode material may be formed into the dry electrode material discussed herein (e.g., powder). In some embodiments, the cathode active material may include, for example, metal oxides, metal sulfides, or lithium metal oxides. Lithium metal oxides may be, for example, lithium nickel manganese cobalt oxide (NMC), lithium manganese oxide (LMO), lithium iron phosphate (LFP), lithium cobalt oxide (LCO), lithium titanate (LTO), and / or lithium nickel cobalt aluminum oxide (NCA). In some embodiments, the cathode active material may include, for example, layered transition metal oxides (such as LiCoO2 (LCO), Li(NiMnCo)O2 (NMC), and / or LiNi 0.8 Co 0.15 Al 0.05 O2 (NCA)), spinel manganese oxides (such as LiMn2O4 (LMO) and / or LiMn 1.5 Ni 0.5 O4 (LMNO)), olivine (such as LiFePO4), silicon, silicon oxide (SiO) x Aluminum, tin, tin oxide (SnOx), manganese oxide (MnOx), molybdenum oxide (MoO2), molybdenum disulfide (MoS2), nickel oxide (NiO) x ) or copper oxide (CuO) x The cathode active material may include sulfur or sulfur-containing materials, such as lithium sulfide (Li2S), or other sulfur-based materials, or mixtures thereof.

[0094] In some embodiments, the electrode film material and / or the anode electrode film includes an anode active material. The anode active material can be formed into the dry electrode material discussed herein (e.g., powder). In some embodiments, the anode active material may include, for example, intercalation materials (such as carbon, graphite, and / or graphene), alloying / dealloying materials (such as silicon, silicon oxide, tin, and / or tin oxide), metal alloys or compounds (such as Si-Al and / or Si-Sn), and / or conversion materials (manganese oxide, molybdenum oxide, nickel oxide, and / or copper oxide). The negative electrode active material may be used alone or may be mixed together to form a multiphase material (such as Si-C, Sn-C, SiOx-C, SnOx-C, Si-Sn, Si-SiOx, Sn-SnOx, Si-SiOx-C, Sn-SnOx-C, Si-Sn-C, SiOx-SnOx-C, Si-SiOx-Sn, or Sn-SiOx-SnOx). Negative electrode active materials include common natural graphite, synthetic or artificial graphite, surface-modified graphite, spherical graphite, flake graphite and blends or combinations of these types of graphite, metallic elements and their compounds, and metal-C composite materials for negative electrodes.

[0095] In some embodiments, the electrode film material and / or the electrode film comprises a carbon material configured to reversibly intercalate lithium ions. The carbon material may form a portion of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the electrode film comprises carbon material in a total amount of, about, at most, or at most about, 20 wt.%, 15 wt.%, 10 wt.%, 9 wt.%, 8 wt.%, 7 wt.%, 6 wt.%, 5 wt.%, 4 wt.%, 3 wt.%, 2 wt.%, 1 wt.%, or any value range between these. In some embodiments, the lithium-intercalated carbon is selected from graphitic carbon, graphite, hard carbon, soft carbon, and combinations thereof. For example, the electrode film of the electrode may include one or more of a binder material, graphitic carbon, graphite, graphene-containing carbon, hard carbon, and soft carbon, as well as a conductivity-promoting material. In some embodiments, the electrode is mixed with lithium metal and / or lithium ions.

[0096] In some embodiments, the electrode film material and / or the electrode film includes conductive additives. The conductive additive material may be part of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the conductive additive may include conductive carbon additives. In some embodiments, the conductive carbon additive includes carbon black, carbon nanotubes, such as single-walled carbon nanotubes (SWCNTs) and multi-walled carbon nanotubes (MWCNTs). In some embodiments, the electrode film includes conductive additives in a total amount of, about, at most, or at most about, 10 wt.%, 9 wt.%, 8 wt.%, 7 wt.%, 6 wt.%, 5 wt.%, 4 wt.%, 3 wt.%, 2 wt.%, 1 wt.%, 0.5 wt.%, 0.25 wt.%, 0.1 wt.%, or any range of values ​​between them. In some embodiments, the content of each conductive additive is, approximately, at most, or at most about 10 wt.%, 9 wt.%, 8 wt.%, 7 wt.%, 6 wt.%, 5 wt.%, 4 wt.%, 3 wt.%, 2 wt.%, 1 wt.%, 0.5 wt.%, 0.25 wt.%, 0.1 wt.%, or any value range between them, of the electrode film. In some embodiments, the conductive additive is carbon black.

[0097] In some embodiments, the electrode film material and / or electrode film includes an adhesive. The adhesive may form part of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the adhesive may include polytetrafluoroethylene (PTFE), polyolefins, polyethers, styrene-butadiene, polysiloxanes and copolymers of polysiloxanes, branched polyethers, polyethylene ethers, carboxymethyl cellulose (CMC), copolymers thereof, and / or combinations thereof. In some embodiments, polyolefins may include polyethylene (PE), polypropylene (PP), polyvinylidene fluoride (PVDF), copolymers thereof, and / or combinations thereof. For example, the adhesive may include polyvinyl chloride, polyphenylene ether (PPO), polyethylene glycol block copolymers, polyethylene oxide (PEO), polyphenylene ether (PPO), polyethylene glycol block copolymers, polydimethylsiloxane (PDMS), polydimethylsiloxane-alkylmethylsiloxane copolymers, copolymers thereof, and / or combinations thereof. In some embodiments, the adhesive may include a thermoplastic material. In some embodiments, the adhesive includes a fiber-reducible and / or fibrous polymer. In some embodiments, the adhesive comprises, is substantially composed of, or is composed of a single fiberizable and / or fiberizable adhesive (such as PTFE). In some embodiments, the adhesive comprises, is substantially composed of, or is composed of PVDF. In some embodiments, the electrode membrane comprises an adhesive having a content of, about, or at most about, 20 wt.%, 19 wt.%, 18 wt.%, 17 wt.%, 16 wt.%, 15 wt.%, 14 wt.%, 13 wt.%, 12 wt.%, 11 wt.%, 10 wt.%, 9 wt.%, 8 wt.%, 7 wt.%, 6 wt.%, 5 wt.%, 4 wt.%, 3 wt.%, 2 wt.%, 1 wt.%, 0.5 wt.%, 0.25 wt.%, 0.1 wt.%, or any value range between them.

[0098] In some embodiments, the electrode film is prepared by a dry electrode manufacturing process. As used herein, a dry electrode manufacturing process can refer to a process that forms a dry electrode film without or substantially without the use of solvents. For example, the components of the active layer or electrode film (including carbon materials and binders) may include, be composed of, or be substantially composed of dry particles. The dry particles used to form the active layer or electrode film may be combined to provide a dry particle active layer mixture. In some embodiments, the active layer or electrode film may be formed from a dry particle active layer mixture such that the weight percentage of the active layer or electrode film components is substantially the same as the weight percentage of the dry particle active layer mixture components. In some embodiments, the active layer or electrode film formed from the dry particle active layer mixture using a dry manufacturing process may be free of or substantially free of any processing additives, such as solvents and resulting solvent residues. In some embodiments, the resulting active layer or electrode film is a self-supporting film formed from the dry particle mixture using a dry process. In some embodiments, the resulting active layer or electrode film is a freestanding support film formed from the dry particle mixture using a dry process. The process for forming the active layer or electrode film may include fiberizing (multiple) fiberizable binder components such that the film includes a fiberizable binder. In another embodiment, an independently supported active layer or electrode film can be formed without a current collector. In yet another embodiment, the active layer or electrode film may include a fibrous polymer matrix, giving the film self-supporting properties. It is believed that a fibrous matrix, lattice, or fiber web can be formed to provide a mechanical structure for the electrode film.

[0099] In some embodiments, the electrode film mixture may be calendered in the calendering apparatus disclosed herein to form a freely supported fibrous electrode film. In some embodiments, the calendering mixture forms a freely supported dry granular film that is free of or substantially free of any liquids, solvents, and resulting residues. In some embodiments, calendering the electrode film mixture may damage the calender roll surface, especially when the electrode film mixture comprises a hard material, such as a cathode active material. In some embodiments, the electrode film is an anodic electrode film. In some embodiments, the electrode film is a cathode electrode film. In some embodiments, the process for manufacturing the electrode film is a dry process in which no liquids or solvents are used, and the listed raw materials are all dry materials (e.g., one or more are dry powders), such that the resulting electrode film is free of or substantially free of any liquids, solvents, and their residues.

[0100] In some embodiments, the energy storage device includes a separator, an anode electrode, a cathode electrode, an electrolyte, and a housing, wherein the electrolyte, separator, anode electrode, and cathode electrode are disposed within the housing, and the separator is located between the anode electrode and the cathode electrode. In some embodiments, the cathode comprises a hybrid cathode active material as described herein. In some embodiments, the energy storage device is formed by placing the electrolyte, separator, anode electrode, and cathode electrode within a housing, wherein the separator is located between the anode electrode and the cathode electrode. In some embodiments, the energy storage device is a battery. In some embodiments, the energy storage device is a lithium-ion battery. In some embodiments, the energy storage device includes an anode electrode located between two cathode electrodes.

[0101] Examples

[0102] The following examples describe exemplary embodiments of this disclosure, including processes, materials, and / or resulting products.

[0103] Example 1 - dents on calender roll surfaces

[0104] Figure 14A It is an image of the dented area on the surface of the calender roll. Figure 14B This is an image of a film formed using a calender roll with grooves. For example... Figure 14B As shown in the diagram, the formed membrane has thin-film bubbles, which reduce the quality of the membrane.

[0105] Example 2 - generating surface profiles of calender rolls

[0106] Figure 15 It is a combined circumferential surface profile along the length of the calender rolls. Figure 16 In combination Figure 15 The surface profile diagram following the circumferential surface profile.

[0107] Example 3 - repeatability study for generating calender roll surface profiles

[0108] Figure 17 This is a surface profile diagram of the calender roll, combining the results of 12 measurements. (Example) Figure 17 As illustrated in the figure, the process used for mapping calender rolls exhibits good repeatability. Through 12 measurements, the calculated radial position repeatability and combined repeatability were both 99%.

[0109] Example 4 - surface profiles before and after calender roll repair

[0110] Figure 18A It is an image of the dented area on the surface of the calender roll. Figure 18B It was after the repair. Figure 18A An image of the indented area. For example... Figure 18B The diagram in the image shows... Figure 18A The dents have been filled and polished.Figure 18C Before the repair Figure 18A The surface profile of the calender rolls in the drawing. Figure 18D This is a surface profile drawing of the same calender roll after repair. For example... Figure 18C and Figure 18D The diagram in the image shows... Figure 18C The blue area in Figure 18D The dent has shrunk and become shallower, indicating that it has been filled and repaired.

[0111] Figure 19A This is a surface profile of another calender roll before the repair. Figure 19B It was after electroplating. Figure 19A A surface profile diagram of the same calender roll. For example... Figure 19A As shown in the diagram, the dented area before repair (shown in blue) had a depth of 16 μm. After repair, as... Figure 19B As illustrated, the indentations after electroplating have a depth of 0-3 μm. Furthermore, the surface surrounding the indented area is shown in red, indicating that the surrounding surface is higher than the normal surface of the roller. Additionally, the area surrounding the indentation has a slope ranging from approximately 6 μm in depth to 10 μm or 6 μm in height. The roughness of the electroplated surface can be corrected by polishing and / or replating.

[0112] Figure 20A This is a surface profile of another calender roll before the repair. Figure 20B It was after electroplating. Figure 20A A surface profile diagram of the same calender roll. For example... Figure 20A As shown in the diagram, the dented area (shown in blue) before repair had a depth of 13.9 μm. After repair, as... Figure 20B As illustrated, the indentation after electroplating has a depth of 3 μm. Furthermore, the surface surrounding the indented area is shown in red, indicating that the surrounding surface is higher than the normal surface of the roller and has a height of less than approximately 7 μm. The roughness of the electroplated surface can be corrected by polishing and / or replating.

[0113] Example 5 - study of polishing repaired calender roll surfaces

[0114] The sample surface was repaired by electroplating a 5 μm nickel-tungsten layer. Grinding and polishing were performed for 25 minutes. Table 1 summarizes the grinding and polishing steps, while Table 2 summarizes the roughness of each step. As illustrated in Table 2, the average roughness (Ra) and the total height (Rt) of the roughness profile were significantly reduced and matched the original roughness before electroplating.

[0115] Table 1

[0116]

[0117] Table 2

[0118]

[0119] Example 6 - study of encoder position

[0120] Figure 21A It is a surface profile of the calender rolls on which the encoder is mounted on the main frame. Figure 21B This is a surface profile drawing of the calender rolls on a frame separate from the main frame, where the encoder is mounted. (Example:) Figure 21A and Figure 21B The diagram in the image shows... Figure 21A Diagonal artifacts in Figure 21B It disappeared.

[0121] While certain embodiments of the invention have been described, these embodiments are presented by way of example only and are not intended to limit the scope of this disclosure. In fact, the novel methods and systems described herein can be embodied in many other forms. Furthermore, various omissions, substitutions, and modifications can be made to the systems and methods described herein without departing from the spirit of this disclosure. The appended claims and their equivalents are intended to cover such forms or modifications falling within the scope and spirit of this disclosure. Therefore, the scope of the invention is defined only by reference to the appended claims.

[0122] Features, materials, properties, or combinations described in connection with a particular aspect, embodiment, or example should be understood to apply to any other aspect, embodiment, or example described in this section or other parts of this specification, unless there is a conflict. All features disclosed in this specification (including any appended claims, abstract, and drawings), and / or all steps of any method or process so disclosed, may be combined in any combination, except for combinations where at least some of such features and / or steps are mutually exclusive. The scope of protection is not limited to the details of any of the foregoing embodiments. The scope of protection extends to any novel feature or any novel combination of features disclosed in this specification (including any appended claims, abstract, and drawings), or any novel feature or any novel combination of steps of any disclosed method or process.

[0123] Furthermore, some features described in this disclosure in the context of separate implementations may also be implemented in combination in a single implementation. Conversely, various features described in the context of a single implementation may also be implemented separately in multiple implementations or in any suitable sub-combination. Moreover, although features may be described above as acting in some combination manner, in some cases, one or more features may be removed from the claimed combination, and the combination may be claimed as a sub-combination or a variation of a sub-combination.

[0124] Furthermore, while operations may be depicted in the accompanying drawings or described in the specification in a specific order, these operations need not be performed in the specific order shown or sequentially, nor need all operations be performed to achieve the desired result. Other operations not depicted or described may be incorporated into the example methods and processes. For example, one or more additional operations may be performed before, after, simultaneously with, or between any of the described operations. Furthermore, in other implementations, these operations may be rearranged or reordered. Those skilled in the art will understand that in some embodiments, the actual steps taken in the illustrated and / or disclosed processes may differ from the steps shown in the accompanying drawings. Depending on the embodiment, some of the above steps may be removed, and others may be added. Furthermore, the features and properties of the above specific embodiments may be combined in different ways to form other embodiments, all of which fall within the scope of this disclosure. Moreover, the separation of the various system components in the above implementations should not be construed as requiring such separation in all implementations, and it should be understood that the described components and systems can generally be integrated into a single product or packaged into multiple products. For example, any components used in the energy storage system described herein may be provided separately or integrated together (e.g., packaged together or attached together) to form an energy storage system.

[0125] For the purposes of this disclosure, certain aspects, advantages, and novel features have been described herein. Not all of these advantages can be achieved according to any particular embodiment. Therefore, for example, those skilled in the art will recognize that this disclosure may be embodied or implemented in a manner that achieves one or a set of advantages taught herein, without necessarily achieving other advantages that may be taught or implied herein.

[0126] For the purposes of this disclosure, in some embodiments, primary particles may be the smallest distinct entities from which larger structures, clusters, or aggregates form. Unless otherwise expressly stated or understood in the context, conditional language such as “can,” “may,” “perhaps,” or “may” is generally intended to convey that certain embodiments include certain features, elements, and / or steps, while other embodiments do not. Therefore, such conditional language is not generally intended to imply that features, elements, and / or steps are necessary for one or more embodiments, or that one or more embodiments necessarily include logic (whether or not user input or prompting is required) for determining whether such features, elements, and / or steps are included in a particular embodiment or whether they are performed in any particular embodiment.

[0127] Unless otherwise explicitly stated, connective language such as the phrase “at least one of X, Y, and Z” should be understood in context as generally used to convey that an item, term, etc., may be X, Y, or Z. Therefore, such connective language generally does not imply that some embodiments require the presence of at least one of X, at least one of Y, and at least one of Z.

[0128] The degree language used herein, such as the terms “approximately,” “about,” “usually,” and “basically,” as used herein, indicates a value, quantity, or characteristic that is close to the stated value, quantity, or characteristic but still performs the desired function or achieves the desired result. For example, terms such as “approximately,” “about,” “usually,” and “basically” may refer to a range of less than 10%, less than 5%, less than 1%, less than 0.1%, and less than 0.01% of the stated quantity, depending on the desired function or desired result.

[0129] The scope of this disclosure is not intended to be limited to the specific disclosure of preferred embodiments in this section or other parts of this specification, but may be defined by the claims set forth in this section or other parts of this specification or by any future claims. The language of the claims should be interpreted broadly based on the language used in the claims, and not limited to the examples described in this specification or during the examination of the application, which should be understood as non-exclusive.

Claims

1. A process for repairing a surface of a calender roll, the process comprising: providing a calender roll system including a calender roll; mapping a surface profile of the calender roll; identifying a dented region on the surface of the calender roll based at least in part on the surface profile; and depositing a material at the dented region.

2. The process of claim 1, wherein mapping the surface profile of the calender roll comprises: rotating the calender roll; measuring a first circumferential surface profile of the calender roll at a first longitudinal position; measuring a second circumferential surface profile of the calender roll at a second longitudinal position; and combining the first circumferential surface profile and the second circumferential surface profile to form the surface profile of the calender roll, wherein the first longitudinal position and the second longitudinal position are along a length of the calender roll.

3. The process of claim 2, wherein rotating the calender roll comprises rotating the calender roll at a circumferential speed in a range of 0.1 meters / minute to 50 meters / minute.

4. The process of claim 2, wherein combining comprises aligning the first circumferential surface profile and the second circumferential surface profile.

5. The process of claim 1, wherein mapping the surface profile of the calender roll comprises: measuring a first longitudinal surface profile at a first circumferential position; measuring a second longitudinal surface profile at a second circumferential position; combining the first longitudinal surface profile and the second longitudinal surface profile to form the surface profile of the calender roll, wherein the first circumferential position and the second circumferential position are along a circumference of the calender roll.

6. The process of claim 1, further comprising polishing the deposited material to match the surface of the calender roll.

7. The process of claim 1, further comprising mapping a second surface profile of the calender roll after depositing the material.

8. The process of claim 1, wherein the dented region comprises a deepest point having a depth greater than about 10 pm.

9. The process of claim 1, wherein the indentation region has an area greater than about 10 mm 2 .

10. The process of claim 1, wherein depositing the material comprises depositing an electroplated metal or alloy at the dented region.

11. The process of claim 1, wherein depositing the material comprises contacting the dented region with a metal-containing solution.

12. The process of claim 11, wherein the metal-containing solution comprises cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, or combinations thereof.

13. The process of claim 11, wherein depositing the material comprises depositing a metal from the metal-containing solution at the dented region.

14. The process of claim 1, further comprising depositing a coating over the deposited material.

15. The process of claim 14, wherein the coating comprises nickel tungsten.

16. A system for mapping a calender roll, the system comprising: a calender roll system including a calender roll, wherein the calender roll comprises a roll surface and a shaft; a surface mapping device comprising a profilometer on a track parallel to the axis of the calender roll; an attachment component configured to detachably attach the surface mapping device to the calender roll system; and a detection element configured to coordinate rotation of the calender roll and position of the profilometer.

17. The system of claim 16, wherein the detection element comprises an incremental encoder.

18. The system of claim 16, wherein the detection element comprises a calender roll encoder.

19. The system of claim 16, wherein the detection element comprises a rotation recording element and a reference on the roll surface.

20. The system of claim 16, wherein the profilometer comprises a color sensor, a step height sensor, or a combination thereof.

21. The system of claim 16, wherein the mapping device further comprises a defect localization unit.

22. The system of claim 21, wherein the defect localization unit comprises a laser.

23. The system of claim 16, wherein the calender roll system comprises a calender film on the roll surface.

24. A process for repairing and using a calender roll, the process comprising: providing a calender roll system comprising a calender roll; mapping a surface profile of the calender roll; identifying a dented region on a surface of the calender roll based at least in part on the surface profile; depositing a repair material at the dented region, wherein the repair material comprises a metal; and calendering an electrode film material comprising an electrode active material to form an electrode film, wherein the electrode active material comprises the metal, wherein the metal is selected from the group consisting of cobalt, nickel, iron, manganese, magnesium, titanium, aluminum, calcium, titanium, chromium, copper, silicon, vanadium, zinc, gold, silver, tungsten, and combinations thereof.

25. The process of claim 24, wherein the metal is selected from the group consisting of cobalt, nickel, and combinations thereof.

26. The process of claim 24, wherein the electrode active material is a cathode active material.

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