Test fixture for durability and stability of SD card slot assembly

Abstract

The invention relates to a test fixture for the durability stability of an SD card slot assembly, and the test fixture comprises a small PCB which is at least provided with a first metal contact point and a second metal contact point, the first metal contact point and the second metal contact point are connected through a conduction part, one end of the first metal contact point is installed in an electric connector and is used for contacting a first spring Pin, and the other end of the first metal contact point is used for contacting a second spring Pin; one end of the second metal contact point is detachably connected in the PCB jig sleeve; the PCB jig sleeve is provided with at least two second springs Pin and is in contact with the second metal contact points, and the beneficial effects are that the PCB small board and the PCB jig sleeve are arranged, one end, provided with the first metal contact points, of the PCB small board is connected with the electric connector, the first springs Pin of the PCB small board are tested, one end, provided with the second metal contact points, of the PCB small board is connected with the PCB jig sleeve and is used for being in contact with the second springs Pin of the PCB jig sleeve, and the PCB small board is connected with the PCB jig sleeve. And one end, far away from the PCB small board, of the second spring Pin is connected with a calculation device through a conducting piece, and the second spring Pin is used for testing and recording the disconnection contact condition of the electric connector and measuring the contact resistance value of the electric connector after abrasion.

Description

[Technical Field]

[0001] This invention relates to the field of electrical connector testing fixtures, and in particular to a testing fixture for the durability and stability of an SD card slot assembly. [Background Technology]

[0002] SD card (memory card, full name Secure Digital) slots are widely used in many devices. Because the spring pins (pin-shaped pins, referring to the metal contact points on the SD card) of the SD card slot are inside its metal casing, they are not easy to observe. Therefore, it is not easy to detect in time when they are damaged, lose their elasticity, or are not fully functional. Thus, life testing is particularly important.

[0003] According to MIL-STD-1344A (one of the standards for testing methods of electrical connectors), the lifespan of the SD card slot (electrical connector) should be more than 10,000 cycles, ensuring good function and appearance, each spring pin should be functional, and its contact resistance should be less than 100MΩ.

[0004] like Figure 1 The current method for testing the lifespan of the electrical connector 20 shown is as follows: a dummy SD card (plastic dummy card) is designed and inserted into the electrical connector 20 for testing. However, since the dummy SD card used for lifespan testing has no function and no extension cable, it is impossible to demonstrate the function of the electrical connector 20 or measure its impedance. For example, the dummy SD card simulates a test fixture and lacks gold fingers (referring to the connection components between the memory module and the memory slot), resulting in less wear on the tested end. During the test, it is impossible to demonstrate whether the electrical connector 20 is good or bad, or whether there is a signal interruption or poor contact. After the test, the number of on / off cycles cannot be recorded, making it impossible to specifically evaluate the product's quality. Furthermore, it is difficult to measure the contact impedance value after wear after the test.

[0005] In view of this, it is necessary to provide a test fixture for the durability and stability of SD card slot components to solve the above problems. [Summary of the Invention]

[0006] The technical problem this invention aims to solve is the lifespan testing of SD card slots (electrical connectors). Currently, a dummy SD card (plastic dummy card) is designed and inserted into the electrical connector for testing. However, since the dummy SD card used for lifespan testing has no function and no extension cable, it is impossible to demonstrate functionality or measure impedance. Therefore, this invention provides a testing fixture for the durability and stability of SD card slot assemblies to solve the above problem.

[0007] The solution to the technical problem of this invention is: a test fixture for the durability and stability of an SD card slot assembly, comprising:

[0008] The PCB small plate is provided with at least two first metal contact points and second metal contact points, the first metal contact points and the second metal contact points are connected through a conducting part, one end of the PCB small plate provided with the first metal contact points is arranged in an electric connector, used for contacting a first spring pin in the electric connector, one end of the PCB small plate provided with the second metal contact points is detachably connected in a PCB fixture sleeve;

[0009] The PCB fixture sleeve is provided with at least two second spring pins, the second spring pins contact the second metal contact points, one end of the second spring pins away from the PCB small plate is connected with the conducting part, one end of the conducting part away from the second spring pins is connected with a computing device, the computing device is provided with a connecting part, the connecting part is electrically connected with the second spring pins, the second spring pins and the connecting part are locked by a fixing part, the computing device is short-circuited with the second spring pins adjacent to the PCB fixture sleeve, used for forming a loop.

[0010] Preferably, the first metal contact points, the second metal contact points and the second spring pins are provided with corresponding quantities according to the first spring pin provided in the electric connector.

[0011] Preferably, the conducting part includes but is not limited to a copper foil.

[0012] Preferably, the connecting part is a conductive material.

[0013] Preferably, the fixing part includes but is not limited to a screw.

[0014] The present application has the beneficial effect that the present application provides a kind of SD card slot assembly durability stability test fixture, which is provided with PCB small plate and PCB fixture sleeve, the PCB small plate is provided with the first metal contact points and the second metal contact points connected by the conducting part, one end of the PCB small plate provided with the first metal contact points is arranged in the electric connector, the first spring pin of test electric connector is contacted, one end of the PCB small plate provided with the second metal contact points is detachably connected in the PCB fixture sleeve, used for being connected with the second spring pin in the PCB fixture sleeve, one end of the second spring pin away from the PCB small plate is connected with the computing device through the conducting part, then the contact condition of the electric connector can be tested, and the number of times of contact breakage can be recorded, the advantages and disadvantages of the electric connector can be evaluated, and the contact impedance value after wear of the electric connector can be conveniently measured to determine whether it meets the standard specifications of the electric connector, and the PCB small plate is consumable, the PCB fixture sleeve is permanent, after multiple tests, the PCB small plate will be consumed, at which time only the PCB small plate needs to be replaced to continue testing, reducing the test cost. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a kind of structure schematic diagram of prior art electric connector.

[0016] Figure 2It is a PCB small plate structure schematic view of a SD card slot assembly durability stability test fixture of the present application.

[0017] Figure 3 It is a PCB fixture cover structure schematic view of a SD card slot assembly durability stability test fixture of the present application.

[0018] Figure 4 It is a structure schematic view of a SD card slot assembly durability stability test fixture of the present application.

CONCRETE IMPLEMENTATIONS

[0019] In order to further illustrate the technical means adopted by the present application and its effects, the following describes in detail the embodiments of the present application and its accompanying drawings.

[0020] The present application provides a SD card slot assembly durability stability test fixture, comprising:

[0021] The PCB small plate 100 is provided with at least two first metal contact points 110 and second metal contact points 120, the first metal contact points 110 and the second metal contact points 120 are connected through a conducting part 130, one end of the PCB small plate 100 provided with the first metal contact points 110 is arranged in the electric connector 20, used for contacting the first spring pin 30 in the electric connector 20, one end of the PCB small plate 100 provided with the second metal contact points 120 is detachably connected in the PCB fixture cover 200;

[0022] The PCB fixture cover 200 is provided with at least two second spring pins 210, the second spring pins 210 contact the second metal contact points 120, one end of the second spring pins 210 away from the PCB small plate 100 is connected with the conducting part 130, one end of the conducting part 130 away from the second spring pins 210 is connected with a computing device (not shown in the figure), the computing device (not shown in the figure) is provided with a connecting part 250, the connecting part 250 is electrically connected with the second spring pins 210 at the end, the second spring pins 210 and the end of the connecting part 250 are locked by a fixing part 240, the computing device (not shown in the figure) is short-circuited with the second spring pins 210 adjacent to the PCB fixture cover 200, used for forming a loop, in the embodiment, the first spring pin 30 of the electric connector 20 is provided with nine, therefore the first metal contact points 110 and the second metal contact points 120 are correspondingly provided with nine, the conducting part 130 on the PCB small plate 100 and the PCB fixture cover 200 are respectively correspondingly provided with nine, when the PCB fixture cover 200 is connected with the computing device (not shown in the figure), 1&2, 3&4, 5&6, 7&8, 9&1 are short-circuited.

[0023] The conducting part 130 includes but is not limited to copper foil.

[0024] The connecting member 250 is made of conductive material.

[0025] The fixing member 240 includes, but is not limited to, a screw.

[0026] The present application has the following advantages: the SD card slot assembly durability test jig is provided with a PCB plate 100 and a PCB jig sleeve 200. The PCB plate 100 is provided with a through member 130 connecting a first metal contact point 110 and a second metal contact point 120. One end of the first metal contact point 110 is installed in an electrical connector 20. The first spring Pin 30 of the electrical connector 20 is tested. One end of the second metal contact point 120 is detachably connected in the PCB jig sleeve 200, which is used to connect with the second spring Pin 210 in the PCB jig sleeve 200. The end of the second spring Pin 210 away from the PCB plate 100 is connected with a computing device (not shown in the figure) through the through member 130. Therefore, the electrical connector 20 can be tested for broken contact conditions, and the number of broken contacts can be recorded. The electrical connector 20 can be evaluated for its advantages and disadvantages. The contact impedance value of the electrical connector 20 after wear can be easily measured to determine whether it meets the standard specifications of the electrical connector 20. The PCB plate 100 is consumable, and the PCB jig sleeve 200 is permanent. After multiple tests, the PCB plate 100 will be worn out. At this time, the test can continue by replacing the PCB plate 100, thereby reducing the test cost.

[0027] It should be noted that the present application is not limited to the above-mentioned embodiments. Any simple modification, equivalent change and modification of the above-mentioned embodiments based on the technical scheme of the present application by any person skilled in the art falls within the protection scope of the present application.

Claims

1. A test fixture for testing durability and stability of an SD card slot assembly, characterized in that, The application relates to a PCB (Printed Circuit Board) device, which comprises the following parts: a PCB plate, which is provided with at least two first metal contact points and second metal contact points, the first metal contact points and the second metal contact points are connected through a conducting part, one end of the PCB plate provided with the first metal contact points is arranged in an electric connector, and the electric connector is used for contacting a first spring pin in the electric connector; one end of the PCB plate provided with the second metal contact points is detachably connected in a PCB fixture sleeve; the PCB fixture sleeve is provided with at least two second spring pins, and the second spring pins contact the second metal contact points.

2. The test fixture for the durability and stability of an SD card slot assembly as described in claim 1, characterized in that: The conducting part is a copper foil.

3. The test fixture for the durability and stability of an SD card slot assembly as described in claim 1, characterized in that: One end of the second spring pin away from the PCB plate is connected with the conducting part, and one end of the conducting part away from the second spring pin is connected with a computing device.

4. The test fixture for the durability and stability of an SD card slot assembly as described in claim 3, characterized in that: The computing device is provided with a connecting part, the connecting part is electrically connected with the second spring pin at the end, and the second spring pin and the end of the connecting part are locked by a fixing part.

5. The test fixture for the durability and stability of an SD card slot assembly as described in claim 4, characterized in that: The connecting part is made of conductive material.

6. The test fixture for the durability and stability of an SD card slot assembly as described in claim 4, characterized in that: The fixing part is a screw.

7. The test fixture for the durability and stability of an SD card slot assembly as described in claim 3, characterized in that: The second spring pin adjacent to the PCB fixture sleeve of the computing device is short-circuited.

8. The test fixture for the durability and stability of an SD card slot assembly as described in claim 1, characterized in that: The first metal contact points, the second metal contact points and the second spring pins are provided with corresponding quantities according to the first spring pin provided in the electric connector.

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