A multi-channel TR component baseband signal digitization conversion and testing method and system

Abstract

The application relates to a multi-channel TR component baseband signal digitization conversion and testing method and system, which comprises the following steps: determining a TR component channel participating in baseband signal digitization conversion and selecting a TR component channel as a reference channel; adjusting the TR component channels in an adjustment group according to the channel parameters of the reference channel; comparing the adjusted digitization conversion output signals and original digitization conversion output signals to determine a defect area; re-dividing the adjustment group and a non-adjustment group according to the defect area and again comparing the adjusted digitization conversion output signals and the original digitization conversion output signals until the defect area is within an allowable range or disappears. The multi-channel TR component baseband signal digitization conversion and testing method and system disclosed by the application determine an adjustment range by means of a dynamic grouping mode of the TR component, the adjustment range can be compressed in a suitable range, and the time cost of the adjustment process is shortened.

Description

Technical Field

[0001] This application relates to the field of data processing technology, and in particular to a method and system for digital conversion and testing of baseband signals of a multi-channel TR component. Background Technology

[0002] The TR module is the core unit of a phased array antenna. Each TR module typically includes a power amplifier (PA), a low-noise amplifier (LNA), a phase shifter, an attenuator, etc., to achieve independent control of signal amplitude and phase. Due to factors such as manufacturing errors, differences in usage environment, and variations in inherent parameters, the performance of the TR module will vary in actual use scenarios, necessitating testing.

[0003] One testing method is to test the TR component at regular intervals, but this method requires frequent testing. Another method is to test the TR component dynamically during use, but this method requires a lot of computing power, resulting in excessive testing costs. If each TR component is then adjusted, the complexity of the adjustment results and the solution process will inevitably lead to a delay in the results, meaning that the calculation results are already invalid by the time they are obtained. Summary of the Invention

[0004] This application provides a method and system for digital conversion and testing of baseband signals of multi-channel TR components. By using a dynamic grouping method for TR components to determine the adjustment range, the adjustment range can be compressed to a suitable range, which helps to shorten the time spent in the adjustment process.

[0005] The above-mentioned objective of this application is achieved through the following technical solution:

[0006] In a first aspect, this application provides a method for digital conversion and testing of baseband signals in a multi-channel TR component, including:

[0007] The TR component channels involved in the baseband signal digitization conversion are determined, and there are multiple TR component channels.

[0008] All TR component channels are evaluated and one TR component channel is selected as the reference channel;

[0009] Divide the remaining TR component channels into adjustment groups and non-adjustment groups;

[0010] Adjust the TR component channels in the adjustment group according to the channel parameters of the reference channel;

[0011] The adjusted digital conversion output signal is compared with the original digital conversion output signal to determine the defect area;

[0012] Based on the defective area, the adjustment group and the non-adjustment group are further divided, and the adjusted digital conversion output signal and the original digital conversion output signal are compared again until the defective area is within the allowable range or disappears.

[0013] In one possible implementation of the first aspect, evaluating the TR component channel includes:

[0014] Multiple test signals are intermittently extracted from the signal that needs to be emitted;

[0015] Obtain the digital conversion output signal of the TR component channel and obtain the test signal from the digital conversion output signal;

[0016] Calculate the amplitude and phase changes of the test signal;

[0017] Calculate the stability of the amplitude change and the stability of the phase change of the test signal respectively;

[0018] When selecting a TR component channel as a reference channel, the stability of the amplitude change and the stability of the phase change of the test signal are weighted and calculated, and the TR component channel with the smallest calculation result is selected as the reference channel.

[0019] In one possible implementation of the first aspect, the calculation of the stability of the phase change of the test signal further includes:

[0020] Arrange the obtained phase start times sequentially in the time series to obtain a phase start time sequence;

[0021] Calculate the difference sequence or quadratic difference sequence of the phase start time sequence;

[0022] The difference sequence or quadratic difference sequence of the phase start time sequence is processed using the one-way property of the sequence difference to obtain the processed sequence;

[0023] Calculate the mean of the processed sequence and use the mean of the processed sequence as the stability of the phase change of the test signal;

[0024] The stability of amplitude changes is handled in the same way.

[0025] In one possible implementation of the first aspect, when the remaining TR component channels are divided into adjusted groups and non-adjusted groups, the groups are formed according to the amplitude and phase changes of the test signals corresponding to the TR component channels, the set reference ratio, and the remaining performance of the equipment.

[0026] The remaining performance of the equipment takes precedence over the set reference ratio, which in turn takes precedence over the amplitude and phase changes of the test signal corresponding to the TR component channel.

[0027] In one possible implementation of the first aspect, comparing the adjusted digitization output signal with the original digitization output signal and determining the defective region includes:

[0028] Select detection points on the original digital conversion output signal. The detection points include a set of peak points and a set of trough points.

[0029] Use the detection location points to generate peak reference curves and trough reference curves;

[0030] Plot the peak and trough curves based on the detection location and the adjusted digital conversion output signal;

[0031] By comparing the crest curve with the crest reference curve, the first defect region is obtained;

[0032] By comparing the trough curve and the trough reference curve, the second defect region is obtained;

[0033] The first defect region and the second defect region are merged to obtain the defect region.

[0034] In one possible implementation of the first aspect, comparing the crest curve and the crest reference curve to obtain the first defect region includes:

[0035] Place the crest curve and the crest reference curve in the same coordinate system;

[0036] The peak curve or peak reference curve is shifted laterally according to the signal processing time.

[0037] The non-overlapping region on the crest curve is determined by the difference in the abscissa between the peak point on the crest curve and the corresponding peak point on the crest reference curve.

[0038] Continue to move the peak curve or peak reference curve in the longitudinal direction to make the peak curve overlap with the peak reference curve as much as possible and then re-determine the non-overlapping area on the peak curve.

[0039] The two identified non-overlapping regions are designated as the first defect region.

[0040] In one possible implementation of the first aspect, comparing the trough curve and the trough reference curve to obtain the second defect region includes:

[0041] Place the trough curve and the trough reference curve into the same coordinate system;

[0042] The trough curve or trough reference curve is shifted laterally according to the signal processing time.

[0043] The non-overlapping region on the trough curve is determined by the difference in the abscissa between the peak point on the trough curve and the corresponding peak point on the trough reference curve.

[0044] Continue to move the trough curve or trough reference curve in the longitudinal direction to make the trough curve overlap with the trough reference curve as much as possible and then re-determine the non-overlapping area on the trough curve.

[0045] The two non-overlapping regions identified are designated as the second defect region.

[0046] In one possible implementation of the first aspect, when merging the first defect region and the second defect region to obtain the defect region, a portion of the first defect region and a portion of the second defect region located in the same time period are taken as the defect region.

[0047] Secondly, this application provides a multi-channel TR component baseband signal digitization conversion and testing device, comprising:

[0048] The channel determination unit is used to determine the TR component channels that participate in the baseband signal digitization conversion. There are multiple TR component channels.

[0049] The channel evaluation unit is used to evaluate all TR component channels and select one TR component channel as a reference channel.

[0050] Channel grouping unit, used to divide the remaining TR component channels into adjustment groups and non-adjustment groups;

[0051] The channel adjustment unit is used to adjust the TR component channels in the adjustment group according to the channel parameters of the reference channel.

[0052] The signal comparison unit is used to compare the adjusted digital conversion output signal with the original digital conversion output signal to determine the defect area;

[0053] The channel readjustment unit further divides the adjusted group and the non-adjusted group according to the defect area and compares the adjusted digital conversion output signal with the original digital conversion output signal again until the defect area is within the allowable range or disappears.

[0054] Thirdly, this application provides a multi-channel TR component baseband signal digitization conversion and testing system, the system comprising:

[0055] One or more memories for storing instructions; and

[0056] One or more processors are configured to call and execute the instructions from the memory to perform the methods described in the first aspect and any possible implementation thereof.

[0057] Fourthly, this application provides a computer-readable storage medium, the computer-readable storage medium comprising:

[0058] The program, when run by a processor, is executed as described in the first aspect and any possible implementation thereof.

[0059] Fifthly, this application provides a computer program product, including program instructions that, when run by a computing device, execute the method described in the first aspect and any possible implementation thereof.

[0060] Sixthly, this application provides a chip system including a processor for implementing the functions involved in the foregoing aspects, such as generating, receiving, transmitting, or processing the data and / or information involved in the foregoing methods.

[0061] This chip system can consist of chips or include chips and other discrete components.

[0062] In one possible design, the chip system also includes a memory for storing necessary program instructions and data. The processor and the memory can be decoupled and located on different devices, connected via wired or wireless means, or the processor and the memory can be coupled to the same device. Attached Figure Description

[0063] Figure 1 This is a flowchart illustrating the steps of a multi-channel TR component baseband signal digitization conversion and testing method provided in this application.

[0064] Figure 2 This is a schematic diagram of a reference channel provided in this application.

[0065] Figure 3 This is a schematic diagram of grouping TR component channels provided in this application.

[0066] Figure 4 This is a schematic diagram provided in this application for comparing an adjusted digitization output signal with the original digitization output signal.

[0067] Figure 5 This is a graphical illustration of the first type of stability provided in this application.

[0068] Figure 6 This is a graphical illustration of the second type of stability provided in this application.

[0069] Figure 7 This is a graphical illustration of the third type of stability provided in this application. Detailed Implementation

[0070] The technical solutions in this application will be further described in detail below with reference to the accompanying drawings.

[0071] This application discloses a method for digital conversion and testing of baseband signals in a multi-channel TR component. Please refer to [link to relevant documentation]. Figure 1 In some examples, the multi-channel TR component baseband signal digitization conversion and testing method disclosed in this application includes the following steps:

[0072] S101, determine the TR component channels that participate in the baseband signal digitization conversion, and there are multiple TR component channels;

[0073] S102, Evaluate all TR component channels and select one TR component channel as the reference channel;

[0074] S103, divide the remaining TR component channels into adjustment groups and non-adjustment groups;

[0075] S104, Adjust the TR component channel in the adjustment group according to the channel parameters of the reference channel;

[0076] S105, compare the adjusted digital conversion output signal with the original digital conversion output signal to determine the defect area;

[0077] S106, the adjustment group and the non-adjustment group are further divided according to the defect area, and the adjusted digital conversion output signal and the original digital conversion output signal are compared again until the defect area is within the allowable range or disappears.

[0078] Overall, the multi-channel TR component baseband signal digitization conversion and testing method provided in this application is mainly used to test the digitized conversion signal of the TR component. For the received signal, digitization is the conversion of analog signal into digital signal (ADC process); for the transmitted signal, digitization is the conversion of digital signal into analog signal (DAC process).

[0079] This application focuses on the digital conversion process of the transmitted signal, which is as follows: digital signal stream (generated by DSP / FPGA) → DAC conversion → analog baseband / intermediate frequency signal → up-conversion and power amplification by TR component → transmission by antenna.

[0080] In phased array technology, multiple TR components participate in the digital conversion of baseband signals because amplitude and phase control are used for direction adjustment to achieve signal synthesis. When the performance of the TR components involved in the digital conversion of baseband signals varies, it will lead to errors in signal synthesis. On the one hand, the directivity of the signal will decrease; on the other hand, the resulting sidelobe problems and inter-signal interference problems will directly affect the signal quality.

[0081] Therefore, in step S101, it is necessary to determine the TR component channels participating in the baseband signal digitization conversion. Then, in step S102, all TR component channels (the TR component channels determined in step S101) are evaluated, and one TR component channel is selected as a reference channel. Figure 2 As shown, the TR component corresponding to the reference channel has relatively stable evaluation results, which can be used as a basis for adjusting the remaining TR component channels.

[0082] In step S103, the remaining TR component channels are divided into adjustment groups and non-adjustment groups, such as... Figure 3 As shown, in step S014, the TR component channel in the adjustment group is adjusted according to the channel parameters of the reference channel, thus achieving range control for adjusting the TR component channel.

[0083] It should be understood that each additional adjustment to the TR component channel increases the computational load and time required, leading to longer lead times for obtaining results and decreased validity of those results. For example, continuously transmitted signals are periodic; if the results calculated in the previous cycle can be directly applied to the next cycle, their validity will be significantly higher than results obtained by applying them to several subsequent cycles.

[0084] This is because the closer the application time point is to the calculation reference time point, the smaller the error between them. Therefore, this application uses a method of limiting the number of adjustments to the TR component channels to shorten the distance between the application time point and the calculation reference time point as much as possible.

[0085] In step S105, the adjusted digitization output signal is compared with the original digitization output signal to determine the defective area, such as... Figure 4 As shown, the left box represents the TR component channel, and the right box represents the signal generated based on the TR component channel.

[0086] Finally, in step S106, the adjustment group and the non-adjustment group are further divided according to the defect area, and the adjusted digital conversion output signal and the original digital conversion output signal are compared again until the defect area is within the allowable range or disappears.

[0087] These two steps involve repeatedly identifying and adjusting the defective area until it is within the allowable range or disappears. In other words, the defective area is effectively controlled through iteration, and it is compressed within the allowable range.

[0088] In some examples, the specific methods for evaluating TR component channels are as follows:

[0089] Multiple test signals are intermittently extracted from the signal that needs to be emitted;

[0090] Obtain the digital conversion output signal of the TR component channel and obtain the test signal from the digital conversion output signal;

[0091] Calculate the amplitude and phase changes of the test signal;

[0092] Calculate the stability of the amplitude change and the stability of the phase change of the test signal respectively;

[0093] When selecting a TR component channel as a reference channel, the stability of the amplitude change and the stability of the phase change of the test signal are weighted and calculated, and the TR component channel with the smallest calculation result is selected as the reference channel.

[0094] The above method evaluates the TR component channel by calculating two parameters: the stability of the amplitude change and the stability of the phase change of the test signal. Stability refers to whether the amplitude change is stable, which can be divided into three cases: no change, linear change, and fluctuating change. Figures 5 to 7 As shown.

[0095] After obtaining the stability of amplitude change and phase change, the stability of amplitude change and phase change of the test signal are weighted and calculated, and the TR component channel with the smallest calculation result is selected as the reference channel.

[0096] In general, the weighting value for the stability of amplitude changes is less than the weighting value for the stability of phase changes. This is because in signal synthesis, the influence of phase is usually much greater than that of amplitude. In other words, phase determines the spatial orientation of the synthesized signal, while amplitude determines the quality and shape of the synthesized signal.

[0097] In some examples, the weighted average for the stability of amplitude changes is 0.2–0.3, and the weighted average for the stability of phase changes is 0.7–0.8.

[0098] When calculating the stability of the phase change of the test signal, the following content was also added:

[0099] Arrange the obtained phase start times sequentially in the time series to obtain a phase start time sequence;

[0100] Calculate the difference sequence or quadratic difference sequence of the phase start time sequence;

[0101] The difference sequence or quadratic difference sequence of the phase start time sequence is processed using the one-way property of the sequence difference to obtain the processed sequence;

[0102] Calculate the mean of the processed sequence and use the mean of the processed sequence as the stability of the phase change of the test signal;

[0103] The stability of amplitude changes is handled in the same way.

[0104] Specifically, this part determines the stability of the phase change of the test signal by the change of the phase in the time series. Specifically, the phase start time is sorted to obtain the phase start time series. Then, the difference series of the phase start time series is calculated (the next phase start time series minus the previous phase start time series) or the quadratic difference series (the next difference series minus the previous difference series).

[0105] By using the difference sequence or the quadratic difference sequence, we can obtain the change of the phase start time in the time dimension. Then, we use the unidirectionality of the difference sequence to process the difference sequence or the quadratic difference sequence of the phase start time sequence. Specifically, we change the negative numbers in the difference sequence or the quadratic difference sequence to positive numbers, but the positive numbers at this time need to be twice the absolute value of the corresponding negative numbers.

[0106] Finally, the mean of the processed sequence (the average of all numbers in the processed sequence) is calculated and used as the stability of the phase change of the test signal.

[0107] In some cases, when the remaining TR component channels are divided into adjusted and unadjusted groups, the groups are formed based on the amplitude and phase changes of the test signals corresponding to the TR component channels, the set reference ratio, and the remaining performance of the equipment.

[0108] The remaining performance of the equipment takes precedence over the set reference ratio, which in turn takes precedence over the amplitude and phase changes of the test signal corresponding to the TR component channel.

[0109] Specifically, there are three specific reference bases for grouping: the remaining performance of the equipment, the set reference ratio, and the amplitude and phase changes of the test signal corresponding to the TR component channel. When grouping, the remaining performance of the equipment should be given priority. The remaining performance of the equipment is a fixed reference ratio, and the computing power consumption for adjusting one TR component channel is a fixed value (preset value).

[0110] The number of TR component channels in the adjustment group is 5 according to the set reference ratio. However, under the premise of ensuring the remaining performance of the equipment, only the adjustment of three TR component channels can be satisfied. Therefore, the number of TR component channels in the adjustment group is three.

[0111] The amplitude and phase changes of the test signals corresponding to the TR component channels are also determined based on the magnitude of the changes. The amplitude and phase changes each correspond to a preset reference value. For example, if it is determined that 5 TR component channels need to be adjusted, but the number of TR component channels to be adjusted is calculated according to the set reference ratio as 4, then the number of TR component channels in the adjustment group is 4, and then the remaining performance of the equipment is used for verification.

[0112] In some cases, comparing the adjusted digitization output signal with the original digitization output signal to identify defective areas includes:

[0113] S201, Select detection position points on the original digital conversion output signal. The detection position points include a set of peak points and a set of trough points.

[0114] S202, use the detection location points to generate peak reference curves and trough reference curves;

[0115] S203, plot the peak curve and trough curve based on the detection location point and the adjusted digital conversion output signal;

[0116] S204. By comparing the crest curve and the crest reference curve, the first defect area is obtained.

[0117] S205, compare the trough curve and the trough reference curve to obtain the second defect area;

[0118] S206, merge the first defect region and the second defect region to obtain the defect region.

[0119] Specifically, in steps S201 to S206, the comparison between the original digitization output signal and the adjusted digitization output signal is converted into a comparison using peaks and troughs. If the original digitization output signal and the adjusted digitization output signal are consistent, then the peak curve and the peak reference curve will completely overlap, and the trough curve and the trough reference curve will completely overlap. Otherwise, the first defect region and the second defect region will be obtained.

[0120] Finally, the first and second defect regions are merged to obtain the defect region.

[0121] In some examples, the specific method for comparing the crest curve and the crest reference curve to obtain the first defect region is as follows:

[0122] Place the crest curve and the crest reference curve in the same coordinate system;

[0123] The peak curve or peak reference curve is shifted laterally according to the signal processing time.

[0124] The non-overlapping region on the crest curve is determined by the difference in the abscissa between the peak point on the crest curve and the corresponding peak point on the crest reference curve.

[0125] Continue to move the peak curve or peak reference curve in the longitudinal direction to make the peak curve overlap with the peak reference curve as much as possible and then re-determine the non-overlapping area on the peak curve.

[0126] The two identified non-overlapping regions are designated as the first defect region.

[0127] Here, we also need to introduce the specific method of further dividing the adjustment group and non-adjustment group according to the defect area. The defect area corresponds to the position. The detection position point is selected on the original digital conversion output signal. The original digital conversion output signal needs to be given to several TR components. At this time, several sets of detection position points can be obtained. Each set of detection position points corresponds to the same position on the original digital conversion output signal, but there are differences in the time dimension. This difference is called theoretical difference.

[0128] For the adjusted digital conversion output signal, analysis (inverse synthesis process) can reveal that the same set of detection location points differ in the time dimension. This difference is called the actual difference. By comparing the theoretical difference and the actual difference, it can be determined which TR components need to be adjusted. The locations of these TR components that need adjustment are the defect areas.

[0129] The specific steps for comparing the trough curve and the trough reference curve to obtain the second defect region are as follows:

[0130] Place the trough curve and the trough reference curve into the same coordinate system;

[0131] The trough curve or trough reference curve is shifted laterally according to the signal processing time.

[0132] The non-overlapping region on the trough curve is determined by the difference in the abscissa between the peak point on the trough curve and the corresponding peak point on the trough reference curve.

[0133] Continue to move the trough curve or trough reference curve in the longitudinal direction to make the trough curve overlap with the trough reference curve as much as possible and then re-determine the non-overlapping area on the trough curve.

[0134] The two non-overlapping regions identified are designated as the second defect region.

[0135] This part is largely the same as the previous content, except that the processing object is changed to the trough curve and the trough reference curve, and the result is the second defect area.

[0136] In some cases, when merging the first defect region and the second defect region to obtain the defect region, a portion of the first defect region and a portion of the second defect region located in the same time period are taken as the defect region.

[0137] This application also provides a multi-channel TR component baseband signal digitization conversion and testing device, including:

[0138] The channel determination unit is used to determine the TR component channels that participate in the baseband signal digitization conversion. There are multiple TR component channels.

[0139] The channel evaluation unit is used to evaluate all TR component channels and select one TR component channel as a reference channel.

[0140] Channel grouping unit, used to divide the remaining TR component channels into adjustment groups and non-adjustment groups;

[0141] The channel adjustment unit is used to adjust the TR component channels in the adjustment group according to the channel parameters of the reference channel.

[0142] The signal comparison unit is used to compare the adjusted digital conversion output signal with the original digital conversion output signal to determine the defect area;

[0143] The channel readjustment unit further divides the adjusted group and the non-adjusted group according to the defect area and compares the adjusted digital conversion output signal with the original digital conversion output signal again until the defect area is within the allowable range or disappears.

[0144] Furthermore, the evaluation of the TR component channel includes:

[0145] Multiple test signals are intermittently extracted from the signal that needs to be emitted;

[0146] Obtain the digital conversion output signal of the TR component channel and obtain the test signal from the digital conversion output signal;

[0147] Calculate the amplitude and phase changes of the test signal;

[0148] Calculate the stability of the amplitude change and the stability of the phase change of the test signal respectively;

[0149] When selecting a TR component channel as a reference channel, the stability of the amplitude change and the stability of the phase change of the test signal are weighted and calculated, and the TR component channel with the smallest calculation result is selected as the reference channel.

[0150] Furthermore, when calculating the stability of the phase change of the test signal, the following also applies:

[0151] Arrange the obtained phase start times sequentially in the time series to obtain a phase start time sequence;

[0152] Calculate the difference sequence or quadratic difference sequence of the phase start time sequence;

[0153] The difference sequence or quadratic difference sequence of the phase start time sequence is processed using the one-way property of the sequence difference to obtain the processed sequence;

[0154] Calculate the mean of the processed sequence and use the mean of the processed sequence as the stability of the phase change of the test signal;

[0155] The stability of amplitude changes is handled in the same way.

[0156] Furthermore, when dividing the remaining TR component channels into adjustment groups and non-adjustment groups, the groups are formed based on the amplitude and phase changes of the test signals corresponding to the TR component channels, the set reference ratio, and the remaining performance of the equipment.

[0157] The remaining performance of the equipment takes precedence over the set reference ratio, which in turn takes precedence over the amplitude and phase changes of the test signal corresponding to the TR component channel.

[0158] Furthermore, comparing the adjusted digitization output signal with the original digitization output signal to determine the defective areas includes:

[0159] Select detection points on the original digital conversion output signal. The detection points include a set of peak points and a set of trough points.

[0160] Use the detection location points to generate peak reference curves and trough reference curves;

[0161] Plot the peak and trough curves based on the detection location and the adjusted digital conversion output signal;

[0162] By comparing the crest curve with the crest reference curve, the first defect region is obtained;

[0163] By comparing the trough curve and the trough reference curve, the second defect region is obtained;

[0164] The first defect region and the second defect region are merged to obtain the defect region.

[0165] Furthermore, comparing the crest curve and the crest reference curve to obtain the first defect region includes:

[0166] Place the crest curve and the crest reference curve in the same coordinate system;

[0167] The peak curve or peak reference curve is shifted laterally according to the signal processing time.

[0168] The non-overlapping region on the crest curve is determined by the difference in the abscissa between the peak point on the crest curve and the corresponding peak point on the crest reference curve.

[0169] Continue to move the peak curve or peak reference curve in the longitudinal direction to make the peak curve overlap with the peak reference curve as much as possible and then re-determine the non-overlapping area on the peak curve.

[0170] The two identified non-overlapping regions are designated as the first defect region.

[0171] Furthermore, comparing the trough curve and the trough reference curve to obtain the second defect region includes:

[0172] Place the trough curve and the trough reference curve into the same coordinate system;

[0173] The trough curve or trough reference curve is shifted laterally according to the signal processing time.

[0174] The non-overlapping region on the trough curve is determined by the difference in the abscissa between the peak point on the trough curve and the corresponding peak point on the trough reference curve.

[0175] Continue to move the trough curve or trough reference curve in the longitudinal direction to make the trough curve overlap with the trough reference curve as much as possible and then re-determine the non-overlapping area on the trough curve.

[0176] The two non-overlapping regions identified are designated as the second defect region.

[0177] Furthermore, when merging the first defect region and the second defect region to obtain the defect region, a portion of the first defect region and a portion of the second defect region located in the same time period are taken as the defect region.

[0178] In one example, the unit in any of the above devices may be one or more integrated circuits configured to implement the above methods, such as one or more application-specific integrated circuits (ASICs), or one or more digital signal processors (DSPs), or one or more field-programmable gate arrays (FPGAs), or a combination of at least two of these integrated circuit forms.

[0179] For example, when the units in the device can be implemented through a processing element scheduler, the processing element can be a general-purpose processor, such as a central processing unit (CPU) or other processor capable of calling programs. Alternatively, these units can be integrated together to form a system-on-a-chip (SOC).

[0180] In this application, various objects such as messages / information / devices / network elements / systems / devices / actions / operations / processes / concepts may be named. It is understood that these specific names do not constitute a limitation on the relevant objects. The names may be changed depending on the scenario, context, or usage habits. The technical meaning of the technical terms in this application should be mainly determined from their functions and technical effects embodied / performed in the technical solution.

[0181] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0182] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0183] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0184] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0185] It should also be understood that in the various embodiments of this application, the terms "first," "second," etc., are merely to indicate that multiple objects are different. For example, a first time window and a second time window are only to indicate different time windows. They should not have any effect on the time windows themselves, and the aforementioned terms "first," "second," etc., should not impose any limitations on the embodiments of this application.

[0186] It should also be understood that, in the various embodiments of this application, unless otherwise specified or in case of logical conflict, the terms and / or descriptions between different embodiments are consistent and can be referenced by each other, and the technical features in different embodiments can be combined to form new embodiments according to their inherent logical relationships.

[0187] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a computer-readable storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned computer-readable storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0188] This application also provides a multi-channel TR component baseband signal digitization conversion and testing system, the system comprising:

[0189] One or more memories for storing instructions; and

[0190] One or more processors are configured to retrieve and execute the instructions from the memory, performing the methods described above.

[0191] This application also provides a computer program product including instructions that, when executed, cause the terminal device and the network device to perform operations corresponding to the methods described above.

[0192] This application also provides a chip system including a processor for implementing the functions involved in the above description, such as generating, receiving, transmitting, or processing the data and / or information involved in the above methods.

[0193] This chip system can consist of chips or include chips and other discrete components.

[0194] The processor mentioned above can be a CPU, a microprocessor, an ASIC, or one or more integrated circuits that execute a program to control the method of transmitting the feedback information described above.

[0195] In one possible design, the chip system also includes a memory for storing necessary program instructions and data. The processor and the memory can be decoupled and located on different devices, connected via wired or wireless means to support the chip system in implementing the various functions described in the above embodiments. Alternatively, the processor and the memory can also be coupled to the same device.

[0196] Optionally, the computer instructions are stored in memory.

[0197] Optionally, the memory can be a storage unit within the chip, such as a register or cache. Alternatively, the memory can be a storage unit located outside the chip within the terminal, such as a ROM or other types of static storage devices that can store static information and instructions, such as RAM.

[0198] It is understood that the memory in this application may be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory.

[0199] Non-volatile memory can be ROM, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory.

[0200] Volatile memory can be RAM, which is used as an external cache. There are many different types of RAM, such as static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct memory bus random access memory.

[0201] The embodiments described in this specific implementation are preferred embodiments of this application and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A method for digital conversion and testing of baseband signals in a multi-channel TR component, characterized in that, include: The TR component channels involved in the baseband signal digitization conversion are determined, and there are multiple TR component channels. All TR component channels are evaluated and one TR component channel is selected as the reference channel; Divide the remaining TR component channels into adjustment groups and non-adjustment groups; Adjust the TR component channels in the adjustment group according to the channel parameters of the reference channel; The adjusted digital conversion output signal is compared with the original digital conversion output signal to determine the defect area; The adjustment group and the non-adjustment group are further divided according to the defect area, and the adjusted digital conversion output signal and the original digital conversion output signal are compared again until the defect area is within the allowable range or disappears. When dividing the remaining TR component channels into adjustment groups and non-adjustment groups, the groups are formed according to the amplitude and phase changes of the test signals corresponding to the TR component channels, the set reference ratio, and the remaining performance of the equipment. The remaining performance of the equipment takes precedence over the set reference ratio, and the set reference ratio takes precedence over the amplitude and phase changes of the test signal corresponding to the TR component channel; The adjusted digital conversion output signal and the original digital conversion output signal are compared to determine the defective areas, including: Select detection points on the original digital conversion output signal. The detection points include a set of peak points and a set of trough points. Use the detection location points to generate peak reference curves and trough reference curves; Plot the peak and trough curves based on the detection location and the adjusted digital conversion output signal; By comparing the crest curve with the crest reference curve, the first defect region is obtained; By comparing the trough curve and the trough reference curve, the second defect region is obtained; The first and second defect regions are merged to obtain the defect region. Comparing the peak curve and the peak reference curve to obtain the first defect region includes: Place the crest curve and the crest reference curve in the same coordinate system; The peak curve or peak reference curve is shifted laterally according to the signal processing time. The non-overlapping region on the crest curve is determined by the difference in the abscissa between the peak point on the crest curve and the corresponding peak point on the crest reference curve. Continue to move the peak curve or peak reference curve in the longitudinal direction to make the peak curve overlap with the peak reference curve as much as possible and then re-determine the non-overlapping area on the peak curve. The two identified non-overlapping regions are designated as the first defect region. Comparing the trough curve and the trough reference curve, the second defect region is obtained as follows: Place the trough curve and the trough reference curve into the same coordinate system; The trough curve or trough reference curve is shifted laterally according to the signal processing time. The non-overlapping region on the trough curve is determined by the difference in the abscissa between the peak point on the trough curve and the corresponding peak point on the trough reference curve. Continue to move the trough curve or trough reference curve in the longitudinal direction to make the trough curve overlap with the trough reference curve as much as possible and then re-determine the non-overlapping area on the trough curve. The two non-overlapping regions identified are designated as the second defect region.

2. The method for digital conversion and testing of baseband signals of a multi-channel TR component according to claim 1, characterized in that, The evaluation of TR component channels includes: Multiple test signals are intermittently extracted from the signal that needs to be emitted; Obtain the digital conversion output signal of the TR component channel and obtain the test signal from the digital conversion output signal; Calculate the amplitude and phase changes of the test signal; Calculate the stability of the amplitude change and the stability of the phase change of the test signal respectively; When selecting a TR component channel as a reference channel, the stability of the amplitude change and the stability of the phase change of the test signal are weighted and calculated, and the TR component channel with the smallest calculation result is selected as the reference channel.

3. The method for digital conversion and testing of baseband signals of a multi-channel TR component according to claim 2, characterized in that, When calculating the stability of the phase change of the test signal, the following also applies: Arrange the obtained phase start times sequentially in the time series to obtain a phase start time sequence; Calculate the difference sequence or quadratic difference sequence of the phase start time sequence; The one-way property of sequence differences is used to process the difference sequence or quadratic difference sequence of the phase start time sequence to obtain the processed sequence. Calculate the mean of the processed sequence and use the mean of the processed sequence as the stability of the phase change of the test signal; The stability of amplitude changes is handled in the same way; The method of using the one-way difference property of a sequence to process the difference sequence or quadratic difference sequence of the phase start time sequence is to turn the negative numbers in the difference sequence or quadratic difference sequence into positive numbers. At this time, the positive number needs to be twice the absolute value of the corresponding negative number.

4. The method for digital conversion and testing of baseband signals of a multi-channel TR component according to claim 1, characterized in that, When merging the first defect region and the second defect region to obtain the defect region, a portion of the first defect region and a portion of the second defect region located in the same time period are taken as the defect region.

5. A multi-channel TR component baseband signal digitization conversion and testing device, characterized in that, include: The channel determination unit is used to determine the TR component channels that participate in the baseband signal digitization conversion. There are multiple TR component channels. The channel evaluation unit is used to evaluate all TR component channels and select one TR component channel as a reference channel. Channel grouping unit, used to divide the remaining TR component channels into adjustment groups and non-adjustment groups; The channel adjustment unit is used to adjust the TR component channels in the adjustment group according to the channel parameters of the reference channel. The signal comparison unit is used to compare the adjusted digital conversion output signal with the original digital conversion output signal to determine the defect area; The channel readjustment unit further divides the adjustment group and the non-adjustment group according to the defect area and compares the adjusted digital conversion output signal with the original digital conversion output signal again until the defect area is within the allowable range or disappears. When dividing the remaining TR component channels into adjustment groups and non-adjustment groups, the groups are formed according to the amplitude and phase changes of the test signals corresponding to the TR component channels, the set reference ratio, and the remaining performance of the equipment. The remaining performance of the equipment takes precedence over the set reference ratio, and the set reference ratio takes precedence over the amplitude and phase changes of the test signal corresponding to the TR component channel; The adjusted digital conversion output signal and the original digital conversion output signal are compared to determine the defective areas, including: Select detection points on the original digital conversion output signal. The detection points include a set of peak points and a set of trough points. Use the detection location points to generate peak reference curves and trough reference curves; Plot the peak and trough curves based on the detection location and the adjusted digital conversion output signal; By comparing the crest curve with the crest reference curve, the first defect region is obtained; By comparing the trough curve and the trough reference curve, the second defect region is obtained; The first and second defect regions are merged to obtain the defect region. Comparing the peak curve and the peak reference curve to obtain the first defect region includes: Place the crest curve and the crest reference curve in the same coordinate system; The peak curve or peak reference curve is shifted laterally according to the signal processing time. The non-overlapping region on the crest curve is determined by the difference in the abscissa between the peak point on the crest curve and the corresponding peak point on the crest reference curve. Continue to move the peak curve or peak reference curve in the longitudinal direction to make the peak curve overlap with the peak reference curve as much as possible and then re-determine the non-overlapping area on the peak curve. The two identified non-overlapping regions are designated as the first defect region. Comparing the trough curve and the trough reference curve, the second defect region is obtained as follows: Place the trough curve and the trough reference curve into the same coordinate system; The trough curve or trough reference curve is shifted laterally according to the signal processing time. The non-overlapping region on the trough curve is determined by the difference in the abscissa between the peak point on the trough curve and the corresponding peak point on the trough reference curve. Continue to move the trough curve or trough reference curve in the longitudinal direction to make the trough curve overlap with the trough reference curve as much as possible and then re-determine the non-overlapping area on the trough curve. The two non-overlapping regions identified are designated as the second defect region.

6. A multi-channel TR component baseband signal digitization conversion and testing system, characterized in that, The system includes: One or more memories for storing instructions; and One or more processors are configured to retrieve and execute the instructions from the memory to perform the method as described in any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes: The program, when run by the processor, executes the method as described in any one of claims 1 to 4.

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