Multi-channel digital high-voltage meter parallel test module and test method

Abstract

The invention discloses a multi-channel digital high-voltage meter parallel test module and test method, and belongs to the technical field of digital meter test, and the multi-channel digital high-voltage meter parallel test module comprises a one-to-multi-channel high-voltage cable, a plurality of high-voltage relays, a Darlington transistor array and a control chip; the high-voltage relay is provided with an input end, an output end and a control port; the Darlington transistor array is used for regulating and controlling the opening and closing of the high-voltage relay; the control chip is used for sending an instruction to the Darlingtube array; one end of one path of the high-voltage cable is used for being connected with a standard high-voltage output device, all the ends of the multiple paths are connected with the input ends of all the high-voltage relays in a one-to-one correspondence mode, the output ends of all the high-voltage relays are used for being connected with a digital high-voltage meter, control ports of all the high-voltage relays are electrically connected with the Darlington tube array, and the Darlington tube array is electrically connected with the control chip. The test method performs multi-channel control based on the test module. According to the invention, under the condition that the connecting line is not replaced, multipath switching can be carried out on the input standard voltage according to actual needs, and metering of the multipath high-voltage meter is realized.

Description

Technical Field

[0001] This application belongs to the field of digital meter testing technology, and in particular relates to a parallel testing module and testing method for multi-channel digital high voltage meters. Background Technology

[0002] Digital high voltage meters (voltage dividers) are used by power systems and electrical and electronic equipment manufacturing departments to measure power frequency AC high voltage and DC high voltage. According to the metrological characteristics specified in the "Verification Regulations for Digital High Voltage Meters", a standard voltage needs to be input to the high voltage meter when tracing its origin.

[0003] When testing digital high voltage meters using existing technology, if there are multiple high voltage meters or multiple high voltage meters to be traced, the standard voltage is only one channel, and the connection wires need to be changed constantly during testing, resulting in low metering efficiency and inconvenience. Summary of the Invention

[0004] This application aims to solve the technical problem of simultaneously testing multiple digital high voltage meters. To this end, this application provides a parallel testing module and method for multiple digital high voltage meters. Without changing the connecting wires, it can switch the input standard voltage to multiple channels according to actual needs, thereby realizing the measurement of multiple high voltage meters.

[0005] In a first aspect, embodiments of this application provide a parallel testing module for multi-channel digital high-voltage meters, comprising:

[0006] High-voltage cables that branch from one line to multiple lines;

[0007] Multiple high-voltage relays, each with an input terminal, an output terminal, and a control port;

[0008] Darlington transistor arrays are used to control the opening and closing of high-voltage relays;

[0009] The control chip is used to send commands to the Darlington array;

[0010] One end of each high-voltage cable is used to connect to a standard high-voltage output device, and the other ends of each high-voltage cable are connected to the input terminals of each high-voltage relay. The output terminals of each high-voltage relay are used to connect to a digital high-voltage meter. The control ports of each high-voltage relay are electrically connected to a Darlington transistor array, and the Darlington transistor array is electrically connected to a control chip.

[0011] In some implementations, the number of ports on the high-voltage cable is the same as the number of high-voltage relays.

[0012] In some implementations, the number of ports of the high-voltage cable and the number of high-voltage relays range from 24 to 48.

[0013] In some implementations, the Darlington array is formed by multiple Darlington tubes arranged independently in parallel, with the number of Darlington tubes matching the number of high-voltage relays.

[0014] In some implementations, the chip is used to receive control commands from a host computer and then send commands to the Darlington transistor array to drive multiple high-voltage relays to turn on and off in turn.

[0015] In some implementations, when the Darlington array controls the opening and closing of the high-voltage relays, only one high-voltage relay remains open at any given time.

[0016] Secondly, embodiments of this application provide a parallel testing method for multi-channel digital high-voltage meters, which employs the multi-channel digital high-voltage meter parallel testing module as described above. The parallel testing method includes:

[0017] S1. Send a test signal to the control chip. The control chip extracts the maximum channel value N and ensures that the variable n representing the test sequence number is less than or equal to N.

[0018] S2. Upon receiving a test signal, the control chip sends a command to the Darlington array to open the nth channel, causing the Darlington array to open the high-voltage relay corresponding to the nth channel.

[0019] S3. Obtain the data of the digital high voltage meter corresponding to the nth channel and complete the metering of the digital high voltage meter of the nth channel.

[0020] In some implementations, before sending the test signal, one end of a high-voltage cable is connected to a standard high-voltage output device, multiple digital high-voltage meters are connected one-to-one to the output terminals of each high-voltage relay, and the connections at each point are checked to ensure they are connected in parallel using a multi-channel digital high-voltage meter test module.

[0021] In some implementations, after sending a test signal to the control chip, the control chip initializes the variable n = 1; after completing the measurement of the digital high voltage meter of the nth channel, the control chip increments the variable n by 1 and repeatedly executes the instruction to send the Darlington array to open the nth channel.

[0022] In some implementations, before repeatedly executing the instruction to open the nth channel to the Darlington array, it is determined whether the variable n is less than N; if yes, the execution is repeated; otherwise, it ends.

[0023] As can be seen from the above technical solution, the beneficial effects of this application are as follows:

[0024] The test module of this application requires only one standard high-voltage source input, which can be converted into multiple high-voltage source outputs. Specifically, it connects to high-voltage relays via a one-to-many high-voltage cable, providing a circuit for controlling multiple digital high-voltage meters. The control chip controls the Darlington transistor array, thereby driving the opening and closing of each high-voltage relay. This achieves automatic multi-channel distribution of standard high-voltage signals and enables parallel metering without changing the wiring. The control chip can accurately drive the relays, avoiding the need for traditional manual wiring. This directly reduces the number of wiring operations and manual interventions in existing tests, saving time on multi-channel wiring. This shortens the time for batch metering of multiple high-voltage meters, improves metering efficiency, operational convenience, and safety, and saves significant manpower and material costs, preventing delays in related tasks due to excessive metering time.

[0025] The testing method described in this application utilizes a sequential control mechanism in the control chip's execution flow. This mechanism includes initializing the variable 'n' and alternately opening and closing relays, thereby automating the management of high-voltage relays and sequentially completing the metering of each digital high-voltage meter. This avoids signal conflicts and measurement errors. By automatically switching lines through command transmission, manual rewiring and wiring are eliminated, shortening the overall metering time, reducing labor costs, and mitigating safety hazards associated with repetitive wiring. This, in turn, improves metering efficiency and operational safety. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced one by one below. Obviously, the accompanying drawings described below are some embodiments of this application. For those skilled in the art, other embodiments and drawings can be obtained based on these drawings without creative effort. Various schematic diagrams according to the embodiments of this application are shown in the accompanying drawings. These drawings are not necessarily drawn to scale. For the purpose of clarity, some details have been enlarged and some details may have been omitted.

[0027] Figure 1 A schematic diagram illustrating the principle of an embodiment of the parallel testing module for multi-channel digital high voltage meters of the present invention is shown;

[0028] Figure 2 A schematic flowchart of an embodiment of the parallel testing method for multi-channel digital high voltage meters of the present invention is shown; Detailed Implementation

[0029] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. The detailed description of the embodiments of this application provided in the drawings is not intended to limit the scope of the claimed application. The described embodiments are only a part of the embodiments of this application, not all of them. Based on the embodiments in this application, they can be arranged and designed in various different configurations. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0030] This application is described below with reference to the accompanying drawings and specific embodiments:

[0031] Please refer to Figure 1 The first aspect of this application provides a parallel testing module for a multi-channel digital high-voltage meter, comprising: a high-voltage cable, multiple high-voltage relays, a Darlington transistor array, and a control chip. The high-voltage cable is a single-to-multi-channel high-voltage cable, specifically, one end of the high-voltage cable has only one port, while the other end branches into multiple ports; the multiple high-voltage relays correspond to the number of channels in the high-voltage cable, and each high-voltage relay has an input terminal, an output terminal, and a control port. Considering 1.5 times redundancy to ensure safety, the high-voltage relays are selected with a maximum input voltage of 1.5 times (e.g., if the maximum input voltage is 3kV, a 4.5kV high-voltage relay is selected); the Darlington transistor array is electrically connected to the high-voltage relays and is used to control the opening and closing of the high-voltage relays; the control chip is electrically connected to the Darlington transistor array and is used to send commands to the Darlington transistor array. One end of each high-voltage cable is used to connect to a standard high-voltage output device, and the other ends of each high-voltage cable are connected to the input terminals of each high-voltage relay. The output terminals of each high-voltage relay are used to connect to a digital high-voltage meter. The control ports of each high-voltage relay are electrically connected to a Darlington transistor array, and the Darlington transistor array is electrically connected to a control chip. The above connections form the entire test module.

[0032] In the embodiments of this application, "high voltage" is conventionally understood to refer to a power level in a power distribution line where the AC voltage exceeds 1000 volts or the DC voltage exceeds 1500 volts, defined as a voltage higher than 1000 volts according to GB / T 2900.50-2008 standard. A high-voltage relay is an electrical device that causes a predetermined step change in the controlled quantity in the electrical output circuit when the change in the input quantity (excitation quantity) of a high-voltage circuit reaches a specified requirement. A high-voltage relay is an electronic control device that has a control system (also known as an input circuit) and a controlled system (also known as an output circuit), and is commonly used in automatic control circuits.

[0033] In existing technologies, in most cases, laboratory standard high-voltage signals only have one output. When multiple digital high-voltage meters need to be metered, the current practice in laboratories is to manually change the wiring and then perform single-channel metering. Even when automated metering of a single digital high-voltage meter has been achieved, metering personnel still face the inconvenience of constantly changing and rewiring wires, especially since changing and rewiring wires themselves poses safety risks during high-voltage metering. This application, however, can complete the metering of multiple digital high-voltage meters without replacing the high-voltage cables. A typical application scenario is when a single high-voltage meter has already achieved automated metering; this module can be used to expand to multiple high-voltage meters, also achieving automated metering. Simultaneously, it eliminates the need for repeated wiring, improving metering efficiency, saving costs, reducing safety hazards in high-voltage metering, and enhancing the safety of high-voltage metering.

[0034] In some embodiments, the number of ports on the high-voltage cable is the same as the number of high-voltage relays, meaning the number of ports and high-voltage relays are identical. Each high-voltage relay controls the testing of one digital high-voltage meter, ensuring the independence of each signal transmission and avoiding signal interference between different channels, thus meeting the parallel testing requirements of 36 digital high-voltage meters. In some embodiments, the number of ports on the high-voltage cable and the number of high-voltage relays range from 24 to 48, such as 24, 36, or 48 channels. The testing module of this application can test digital high-voltage meters within this range simultaneously. In some embodiments, the Darlington transistor array is formed by multiple Darlington transistors arranged independently in parallel, with the number of Darlington transistors matching the number of high-voltage relays. Existing Darlington transistor devices are used to form the Darlington transistor array.

[0035] In some embodiments, the test module of this application specifically includes a 1-to-36 high-voltage cable, 36 high-voltage relays, a Darlington transistor array composed of 36 Darlington transistors, and a control chip. The high-voltage relays are numbered 1-36. The Darlington transistor array is used to control the opening and closing of the high-voltage relays. The control chip receives instructions from the host computer and then sends instructions to the Darlington transistor array to drive the multiple high-voltage relays to open and close in turn. One end of the high-voltage cable is used to connect to a standard high-voltage output device. The 36 ports of the high-voltage cable are connected one-to-one with the input terminals of the 36 high-voltage relays. The output terminals of the 36 high-voltage relays are connected to 36 digital high-voltage meters, numbered 1-36, and electrically connected to the output terminals of the corresponding high-voltage relays. The control ports of the 36 high-voltage relays are electrically connected one-to-one with the 36 Darlington transistors in the Darlington transistor array. The Darlington transistor array is electrically connected to the control chip.

[0036] In some implementations, the Darlington transistor array consists of 36 Darlington transistors arranged independently in parallel. Each Darlington transistor controls only one high-voltage relay, meaning that the ports of each group of Darlington transistors are electrically connected one-to-one with the control ports of the high-voltage relays. When the Darlington transistor array receives instructions from the control chip and controls the opening and closing of the high-voltage relays, only one high-voltage relay is allowed to remain open at any given time. The next high-voltage relay is only driven to open after the currently open high-voltage relay has completely closed, thus preventing measurement errors caused by the simultaneous transmission of multiple high-voltage signals.

[0037] In some implementations, the control chip's actions include receiving control commands from the host computer (e.g., a "complete 1-to-36 high-voltage switching" command sent by the host computer), parsing key parameters in the commands, and sending drive commands to the Darlington transistor array. Specifically, after receiving the host computer command, the control chip extracts the maximum channel value N=36 and completes variable initialization (i.e., initializing the variable n representing the test sequence number to 1). Then, based on the current value of variable n, it sends drive commands for the corresponding number of channels to the Darlington transistor array to control the Darlington transistor array to drive the 36 high-voltage relays to turn on and off in sequence.

[0038] A second aspect of this application provides a parallel testing method for multi-channel digital high-voltage meters, which employs the multi-channel digital high-voltage meter parallel testing module as described above. The parallel testing method includes:

[0039] S1. Send a test signal to the control chip (control command to switch the high voltage meter measurement, such as...) Figure 2 The control chip extracts the maximum channel value N to ensure that the variable n, representing the test sequence number, is less than or equal to N.

[0040] S2. Upon receiving a test signal, the control chip sends a command to the Darlington array to open the nth channel, causing the Darlington array to open the high-voltage relay corresponding to the nth channel.

[0041] S3. Obtain the data of the digital high voltage meter corresponding to the nth channel and complete the metering of the digital high voltage meter of the nth channel.

[0042] In some implementations, it also includes:

[0043] S0. Before sending test signals to the control chip, preliminary connection and inspection operations must be completed. Specifically, before sending test signals, connect one end of one high-voltage cable to the standard high-voltage output device, and connect the output terminals of the 36 digital high-voltage meters to the output terminals of the 36 high-voltage relays one by one. After connection, the connection status of each connection point must be checked one by one to ensure that all connections meet the preset connection requirements of the multi-channel digital high-voltage meter parallel test module, and there are no loose, incorrect or missing connections.

[0044] In some implementations, after sending a test signal to the control chip, the control chip first executes an initialization process to initialize the variables, setting n=1. If the variable n ≤ the maximum channel value N (N=36), the control chip sends a command to the Darlington transistor array to open the nth channel. Upon receiving the command, the Darlington transistor array drives the high-voltage relay corresponding to the nth channel to open. That is, the Darlington array sends a control signal to the corresponding high-voltage relay, with the control signal number corresponding to the high-voltage relay number. At this time, the standard voltage output by the standard high-voltage output device is transmitted through the high-voltage cable and the nth high-voltage relay to the nth digital high-voltage meter. The meter then obtains the measurement data for that channel, completing the measurement of the nth digital high-voltage meter. After completing the measurement of the nth digital high-voltage meter, the control chip increments the variable n by 1, i.e., executes n=n+1, and repeatedly sends the command to the Darlington transistor array to open the nth channel.

[0045] In some implementations, before repeatedly sending the command to the Darlington array to open the nth channel, it is determined whether the variable n is less than N; if yes, the execution is repeated; if no, the process ends. Specifically, after completing the measurement of the nth channel digital high voltage meter, the digital high voltage meter returns a measurement completion signal to the control chip; upon receiving this signal, the control chip immediately sends a command to the Darlington array to close the nth channel, causing the nth channel high voltage relay to turn off; subsequently, the control chip increments the value of variable n by 1 and again determines whether the incremented variable n is less than or equal to the maximum channel value N; if the determination result is yes, the above steps S2 and S3 are repeated: the control chip sends the command to the Darlington array to open the nth channel - acquires measurement data - receives the measurement completion signal - closes the nth channel high voltage relay - increments the variable n by 1; if the determination result is no (i.e., n>N), the control chip stops sending commands to the Darlington array, and the entire parallel testing process of the multi-channel digital high voltage meter ends.

[0046] Regarding the specific implementation methods of this application, it should be noted that:

[0047] In the description of this application, unless otherwise expressly specified and limited, the terms "connection," "conduction," "control," and "drive" should be interpreted broadly. For example, "connection" can be a direct dielectric connection or an electrical connection achieved through wires, connectors, or intermediate circuits; "conduction" can refer to the continuity of a circuit path or specifically to the conductive state established by a switching device (such as a relay or transistor) under a control signal; "control" can be direct logic level signal control or indirect control after current or voltage amplification via a drive circuit (such as a Darlington transistor array or power amplifier); and "drive" should be understood as providing an enable signal or sufficient power to activate the operation of a specific load (such as a relay coil). Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circuit design and component characteristics.

[0048] In the description of this application, the terms "on," "off," "previous path," "next path," "sequence," and "alternate" indicate the operation or timing relationship based on the process of the described embodiments. They are only used to facilitate the description of the working logic of this application and to simplify the description, and do not indicate or imply that the control process referred to must strictly follow the described sequence. For example, the operation pair "on" and "off" can be closely connected in time, with a delay set in between to ensure electrical safety; "previous path" and "next path" are only used to describe the relative order in a specific cycle, and their actual physical path number can be determined according to the hardware layout; "sequence" or "alternate" operations can be sequentially increasing or decreasing, or can be performed according to a preset arbitrary path sequence. All process descriptions are only used to explain the control logic and timing relationship between components in a specific working mode. If the control strategy changes, the operation indication will also change accordingly.

[0049] In the description of this application, the use of terms such as "some embodiments," "optional embodiments," "example," "specific example," "optional example," or "optional embodiment," etc., indicates that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application, but does not imply that these embodiments illustrate and describe all possible forms of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Furthermore, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.

[0050] The present invention has been described in detail above with reference to specific embodiments and exemplary examples. The above description is exemplary and not exhaustive, and is not limited to the disclosed embodiments; the above description should not be construed as a limitation of the present invention. Technical solutions between various embodiments can be combined with each other, but must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed in this application. Although embodiments of the present application have been shown and described, various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present application. Those skilled in the art will understand that various other specific changes and combinations of embodiments based on the technical teachings disclosed in this application, without departing from the essence of the present application, are still within the scope of protection defined by the claims of the present invention and their equivalent technical solutions.

Claims

1. A parallel testing module for multi-channel digital high-voltage meters, characterized in that, include: High-voltage cables that branch from one line to multiple lines; Multiple high-voltage relays, each having an input terminal, an output terminal, and a control port; A Darlington transistor array is used to control the opening and closing of the high-voltage relay; The control chip is used to send commands to the Darlington array; Among them, one end of the high-voltage cable is used to connect to the standard high-voltage output device, and each end of the multiple cables is respectively connected to the input terminal of each high-voltage relay. The output terminal of each high-voltage relay is used to connect to the digital high-voltage meter. The control port of each high-voltage relay is electrically connected to the Darlington transistor array, and the Darlington transistor array is electrically connected to the control chip.

2. The multi-channel digital high-voltage meter parallel testing module according to claim 1, characterized in that, The number of ports on the high-voltage cable is the same as the number of high-voltage relays.

3. The multi-channel digital high-voltage meter parallel testing module according to claim 2, characterized in that, The number of ports of the high-voltage cable and the number of high-voltage relays range from 24 to 48.

4. The multi-channel digital high-voltage meter parallel testing module according to claim 3, characterized in that, The Darlington tube array is formed by multiple Darlington tubes arranged independently in parallel, and the number of Darlington tubes is the same as the number of high-voltage relays.

5. The multi-channel digital high-voltage meter parallel testing module according to claim 1, characterized in that, The chip is used to receive control commands from the host computer and then send commands to the Darlington transistor array so that the Darlington transistor array drives multiple high-voltage relays to turn on and off in turn.

6. The multi-channel digital high-voltage meter parallel testing module according to claim 5, characterized in that, When the Darlington transistor array controls the opening and closing of the high-voltage relay, only one of the high-voltage relays remains open at any given time.

7. A parallel testing method for multi-channel digital high-voltage meters, characterized in that, Employing the multi-channel digital high-voltage meter parallel testing module as described in any one of claims 1-6, the parallel testing method includes: A test signal is sent to the control chip, and the control chip extracts the maximum channel value N to ensure that the variable n representing the test sequence number is less than or equal to N; Upon receiving the test signal, the control chip sends a command to the Darlington array to open the nth channel, causing the Darlington array to open the high-voltage relay corresponding to the nth channel; Obtain the data from the digital high-voltage meter corresponding to the nth channel, and complete the metering of the digital high-voltage meter of the nth channel.

8. The parallel testing method for multi-channel digital high-voltage meters according to claim 7, characterized in that, It also includes connecting one end of one of the high-voltage cables to a standard high-voltage output device before sending the test signal, connecting multiple digital high-voltage meters to the output terminals of each of the high-voltage relays one by one, and checking that each connection is connected according to the parallel test module of the multi-channel digital high-voltage meters.

9. The parallel testing method for multi-channel digital high-voltage meters according to claim 7, characterized in that, After sending a test signal to the control chip, the control chip initializes the variable n = 1; After completing the measurement of the digital high voltage meter of the nth channel, the control chip increments the variable n by 1 and repeatedly executes the instruction to send the Darlington array to open the nth channel.

10. The parallel testing method for multi-channel digital high-voltage meters according to claim 9, characterized in that, Before repeatedly executing the instruction to open the nth channel of the Darlington array, it is determined whether the variable n is less than N; if yes, the execution is repeated; if no, the execution ends.

Images