Method, device and equipment for analyzing field coverage times based on geologic model

Abstract

The invention provides a geologic model-based field coverage frequency analysis method. The method comprises the following steps of: establishing a three-dimensional geologic model of a target land parcel; according to the set point position deviation, respectively obtaining shot detection data before and after the point position deviation; performing model slicing on the three-dimensional geologic model based on the point position deviation to obtain a two-dimensional geologic model; performing ray tracing forward modeling on a target stratum in the two-dimensional geologic model based on the shot detection data before and after the point position deviation, and obtaining coverage frequency distribution of the target stratum; based on the coverage frequency distribution of the target layer, respectively counting target surface elements meeting acquisition requirements before and after point position deviation on the target layer; based on the number of the target surface elements meeting the collection requirements before and after the point position deviation, the number of the target surface elements with the coverage times changed, the change difference of the coverage times between the target surface elements and the total number of the surface elements contained in the target layer, the field coverage times of the target layer are obtained. According to the invention, the accuracy of obtaining the field coverage times can be improved.

Description

Technical Field

[0001] This invention relates to the field of geophysical exploration, and in particular to a method, apparatus, and equipment for analyzing field cover frequency based on geological models. Background Technology

[0002] In seismic exploration, cover count is one of the important criteria for evaluating the quality of seismic acquisition. Traditional cover count analysis methods calculate the common midpoint (CMP) cover count under the assumption of a horizontally layered homogeneous medium. However, in field operations, especially during the acquisition of submarine seismic data (OBN / OBC), the actual locations of shot receivers deviate from their designed locations due to sea state factors such as ocean currents, wind speeds, and obstacles. Furthermore, complex geological zones, with their large topographic relief and intricate underground geological structures, suffer from chaotic reflections and weak energy during geological exploration, leading to deviations in the common midpoint (CMP) and common reflection point (CRP). Therefore, the analysis of cover count becomes inaccurate, consequently affecting the imaging quality of geological structures. Summary of the Invention

[0003] This invention provides a method, apparatus, and equipment for analyzing field cover frequency based on a geological model, in order to overcome or at least partially solve the above-mentioned problems.

[0004] A first aspect of this invention provides a method for analyzing field cover frequency based on a geological model, the method comprising:

[0005] Establish a three-dimensional geological model of the target site;

[0006] Based on the set point deviation, shot-receiver data before and after the point deviation occurs are obtained; wherein, the point deviation is used to characterize the offset of the receiver point in the target direction.

[0007] The three-dimensional geological model is sliced ​​based on the point deviation to obtain a two-dimensional geological model; wherein the slicing direction is determined by the target direction.

[0008] Based on the shot detection data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the coverage number distribution of the target layer;

[0009] Based on the coverage distribution of the target layer, the target surface elements on the target layer that meet the acquisition requirements before and after the deviation of the point are statistically analyzed; wherein, the acquisition requirements include a preset percentage of the number of times full coverage is achieved;

[0010] Based on the number of target elements that meet the acquisition requirements before and after the location deviation, the number of target elements whose coverage times have changed, the difference in coverage times between each target element, and the total number of elements contained in the target layer, the field coverage times of the target layer are obtained.

[0011] Optionally, establishing a three-dimensional geological model of the target site includes:

[0012] Define the observation system for the target site;

[0013] A three-dimensional geological model is established based on the observation system; the observation system includes the number of shot points, the number of geophone points, the location of shot points, and the location of geophone points.

[0014] Optionally, obtaining the field coverage of the target layer based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage changes, the difference in coverage among the target elements, and the total number of elements contained in the target layer includes:

[0015] The following percentages are determined: the number of target cells that meet the acquisition requirements before and after the point deviation, relative to the total number of cells in the target layer; the number of target cells whose coverage times change, relative to the total number of cells in the target layer; and the number of target cells with different coverage times changes, relative to the total number of cells in the target layer.

[0016] Based on the first percentage, the second percentage, and the third percentage, the number of field coverages of the target layer is obtained; wherein, the number of field coverages of the target layer is used to analyze the geological structural characteristics within the three-dimensional geological model and the two-dimensional geological model.

[0017] Optionally, obtaining the field coverage count of the target layer based on the first percentage, the second percentage, and the third percentage includes:

[0018] Based on the first percentage, obtain the area cell information of the target layer that meets the coverage requirement before and after the point deviation;

[0019] Based on the second percentage and the third percentage, information on the change in the number of times the target layer covers the location before and after the deviation is obtained;

[0020] Based on the changes in the number of surface elements that meet the coverage requirements before and after the location deviation, and the changes in the number of coverages of the target layer before and after the location deviation, a comprehensive analysis is performed on the number of field coverages of the target layer.

[0021] Optionally, the method further includes:

[0022] Determine the illumination of the target layer before and after the positional deviation;

[0023] Based on the illumination before and after the positional deviation, analyze the change information of the illumination of the target layer before and after the positional deviation;

[0024] The performance of the observation system is evaluated based on the changes in illumination of the target layer before and after the location deviation.

[0025] Optionally, the step of slicing the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model includes:

[0026] When the target direction is the first direction, the three-dimensional geological model is sliced ​​on the plane formed by the first direction and the third direction; or,

[0027] When the target direction is the second direction, the three-dimensional geological model is sliced ​​on the plane formed by the second direction and the third direction; wherein the first direction, the second direction, and the third direction are all orthogonal to each other; or,

[0028] When the target direction is a fourth direction other than the first and second directions, the three-dimensional geological model is sliced ​​in the corresponding angular direction;

[0029] A two-dimensional geological model is established based on the obtained model slices.

[0030] Optionally, the step of slicing the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model includes:

[0031] Based on the positional deviation, the offset distance of the detector point in the target direction is determined;

[0032] Based on the offset distance, the step size of the model slice is obtained;

[0033] The three-dimensional geological model is sliced ​​according to the stated step size to obtain a two-dimensional geological model.

[0034] Optionally, the step of performing ray tracing forward modeling on the target layer in the two-dimensional geological model based on the shot and receiver data before and after the point deviation to obtain the coverage number distribution of the target layer includes:

[0035] Based on the shot detection data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the ray tracing path;

[0036] The co-reflection point attribute analysis is performed on the ray tracing path to determine the co-reflection point coverage distribution of the target layer.

[0037] A second aspect of the present invention provides a field cover frequency analysis device based on a geological model, the analysis device comprising:

[0038] The 3D model creation module is used to create a 3D geological model of the target site.

[0039] The point deviation design module is used to acquire shot-receiver data before and after the point deviation occurs, according to the set point deviation; wherein, the point deviation is used to characterize the offset of the receiver point in the target direction.

[0040] A two-dimensional model building module is used to slice the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model; wherein the direction of the model slicing is determined by the target direction;

[0041] The coverage number acquisition module is used to perform ray tracing forward modeling on the target layer in the two-dimensional geological model based on the shot detection data before and after the point deviation, and to obtain the coverage number distribution of the target layer;

[0042] The target surface element statistics module is used to count the target surface elements on the target layer that meet the acquisition requirements before and after the point deviation, based on the coverage frequency distribution of the target layer; wherein, the acquisition requirements include a preset percentage of the number of times full coverage is achieved;

[0043] The coverage count analysis module is used to obtain the field coverage count of the target layer based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage count changes, the difference in coverage count between each target element, and the total number of elements contained in the target layer.

[0044] In a third aspect of the present invention, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the field cover number analysis method based on a geological model as described in the first aspect of the present invention.

[0045] The method provided by this invention has the following main advantages:

[0046] According to the method provided by this invention, a combination of two-dimensional and three-dimensional geological models is used. By slicing the three-dimensional geological model in different directions and establishing a two-dimensional geological model, complex geological structures and stratigraphic profiles can be visualized and observed in different strata and orientations. This improves the accuracy of obtaining CRP coverage counts, overcoming the limitations and inaccuracies of traditional CMP methods alone. Furthermore, based on the two-dimensional geological model, ray tracing forward modeling of seismic waves allows for the quantitative calculation and comparison of the coverage counts of surface elements affected by point deviations, thereby improving the comprehensiveness and accuracy of field coverage count analysis. Attached Figure Description

[0047] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0048] Figure 1 This is a flowchart illustrating the steps of a field cover number analysis method based on a geological model, as provided in an embodiment of this application.

[0049] Figure 2 This is a schematic diagram of a three-dimensional geological model provided in an embodiment of the present invention;

[0050] Figure 3 This is a schematic diagram of the internal structure of a three-dimensional geological model provided in an embodiment of the present invention;

[0051] Figure 4 This is a schematic diagram of a detector point after a positional deviation occurs, provided by an embodiment of the present invention;

[0052] Figure 5 This is a schematic diagram of the distribution of coverage times before point deviation occurs, provided by an embodiment of the present invention;

[0053] Figure 6 This is a schematic diagram of the coverage number distribution after point deviation occurs, provided by an embodiment of the present invention;

[0054] Figure 7 This is a schematic diagram illustrating the change in the number of coverages of each target surface element before and after a point deviation occurs, provided by an embodiment of the present invention.

[0055] Figure 8 This is a schematic diagram illustrating the difference in the number of coverages of each target surface element before and after a point deviation occurs, provided by an embodiment of the present invention.

[0056] Figure 9This is a schematic diagram of illumination before point deviation occurs, provided by an embodiment of the present invention;

[0057] Figure 10 This is a schematic diagram of illumination after point deviation occurs, provided by an embodiment of the present invention;

[0058] Figure 11 This is a schematic diagram comparing illumination before and after a point deviation occurs, provided by an embodiment of the present invention;

[0059] Figure 12 This is a schematic diagram of a model slice along a first direction of a three-dimensional geological model provided in an embodiment of the present invention;

[0060] Figure 13 This is a schematic diagram of a model slice along the second direction of a three-dimensional geological model provided in an embodiment of the present invention;

[0061] Figure 14 This is a schematic diagram of a model slice along the fourth direction of a three-dimensional geological model provided in an embodiment of the present invention;

[0062] Figure 15 This is a schematic diagram of model slices along various directions of a three-dimensional geological model provided in an embodiment of the present invention;

[0063] Figure 16 This is a schematic diagram of a two-dimensional geological model provided in an embodiment of the present invention;

[0064] Figure 17 This is a schematic diagram of the structure of a field cover number analysis device for a geological model provided in an embodiment of the present invention. Detailed Implementation

[0065] Exemplary embodiments of this application will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of this application are shown in the drawings, it should be understood that this application may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of this application and to fully convey the scope of this application to those skilled in the art.

[0066] In a first aspect, this invention provides a method for analyzing field cover frequency based on a geological model, referring to... Figure 1 , Figure 1 A flowchart illustrating the steps of a field cover frequency analysis method based on a geological model, as provided in this embodiment of the invention, is shown below. Figure 1 As shown, the method includes:

[0067] Step S101: Establish a three-dimensional geological model of the target site.

[0068] Among them, reference Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of a three-dimensional geological model provided in an embodiment of the present invention. Figure 3 This is a schematic diagram of the internal structure of a three-dimensional geological model provided in an embodiment of the present invention; as shown below. Figure 2 As shown, a three-dimensional geological model of the target site can be established based on the interpreted seismic data acquired from the target site. The interpreted seismic data is obtained by analyzing the raw seismic data acquired from the target site. This interpreted seismic data includes data on the target layer to be studied, which can be strata at depths of 700m-3500m below the surface. Figure 3 As shown, the complex underground geological structure and spatial morphological characteristics of the target site can be intuitively observed from the established three-dimensional geological model. Combining the three-dimensional geological model with the target site enhances the intuitiveness and accuracy of geological analysis. Furthermore, the established three-dimensional geological model has energy analysis capabilities, which is more conducive to the acquisition of seismic data from the target subsurface layers. The energy analysis function refers to the ability to analyze the energy distribution of seismic waves within the three-dimensional geological system.

[0069] Step S102: Based on the set point deviation, obtain the shot inspection data before and after the point deviation occurs.

[0070] The defined observation system can directly acquire shot-receiver data before the occurrence of positional deviation. This system includes data such as the number of shot points, the number of receiver points, the shot-receiver distance, and the receiver point distance. (Refer to...) Figure 4 , Figure 4 This is a schematic diagram of a detector point after a positional deviation occurs, provided by an embodiment of the present invention; as shown. Figure 4 As shown, by setting the positional deviation based on the receiver point distance, shot-receiver data can be obtained after the positional deviation occurs. The positional deviation characterizes the offset of the receiver point in the target direction. This target direction can be any direction parallel to the target layer in the established three-dimensional geological model of the target block.

[0071] Step 103: Based on the point deviation, slice the three-dimensional geological model to obtain a two-dimensional geological model.

[0072] First, the 3D geological model of the target site is sliced ​​according to the set point deviation. Each slice can be any plane perpendicular to the target layer within the 3D geological model, and the distance between adjacent slices is related to the set point deviation. Then, the obtained slices are used as the study plane to build a 2D geological model. The direction of the slices is determined by the target direction; the resulting 2D geological model clearly displays the included stratigraphic profiles and the boundaries between strata.

[0073] Step 104: Based on the shot inspection data before and after the point deviation, perform ray tracing forward modeling on the target layer in the two-dimensional geological model to obtain the coverage number distribution of the target layer.

[0074] Ray tracing forward modeling follows the Gaussian ray beam method and can be used for geological models of complex structures in inhomogeneous media, offering advantages such as fast computation speed and accurate simulation results. Based on the obtained shot-receiver data before and after point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the propagation paths of seismic waves in the two-dimensional geological model before and after point deviation. The propagation path can be the path taken by seismic waves originating from different shot locations, reflected by various surface elements in the target layer, and reaching the receiver location. (Refer to...) Figure 5 and Figure 6 , Figure 5 This is a schematic diagram of the distribution of coverage times before point deviation occurs, provided by an embodiment of the present invention. Figure 6 This is a schematic diagram illustrating the distribution of coverage frequency after point deviation occurs, provided by an embodiment of the present invention; as shown... Figure 5 and Figure 6 As shown in the figure, the solid lines at different angles represent the propagation paths of seismic waves in the strata. By analyzing the seismic wave propagation paths before and after the point deviation occurs, the seismic wave coverage number of each surface element in the target layer can be obtained, thus yielding the coverage number distribution of the target layer before and after the point deviation. In addition, the coverage number distribution of all strata in the two-dimensional geological model can be obtained through ray tracing forward modeling.

[0075] Step 105: Based on the coverage distribution of the target layer, count the target surface elements on the target layer that meet the acquisition requirements before and after the point deviation; wherein, the acquisition requirements include a preset percentage of the number of times full coverage is achieved.

[0076] The target layer comprises multiple facets, each with a different coverage count. The coverage count distribution of the target layer can be composed of the coverage counts of each facet within the target layer. Based on the obtained coverage count distribution of the target layer, the target facets on the target layer that meet the acquisition requirements before and after the point deviation can be statistically analyzed. The acquisition requirements include a preset percentage of achieving full coverage.

[0077] For example, when the acquisition requirement is to reach 90% of the full coverage count, and the full coverage count is 200 times, then the target area cell with 180 coverage counts is counted; when the acquisition requirement is to reach 85% of the full coverage count, and the full coverage count is 200 times, then the target area cell with 170 coverage counts is counted; when the acquisition requirement is to reach 80% of the full coverage count, and the full coverage count is 200 times, then the target area cell with 160 coverage counts is counted; when the acquisition requirement is to reach 75% of the full coverage count, and the full coverage count is 200 times, then the target area cell with 150 coverage counts is counted. The specific acquisition requirements can be determined based on the geological structure.

[0078] Step 106: Based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage times have changed, the difference in coverage times between each target element, and the total number of elements contained in the target layer, obtain the field coverage times of the target layer.

[0079] First, the total number of surface elements contained in the target layer is counted. Then, based on the target surface elements that meet the acquisition requirements before and after the point deviation, the number of target surface elements before and after the point deviation can be counted separately. Due to the point deviation, the position of the detector point shifts, and the coverage count of the target surface element will change accordingly. Therefore, based on the obtained coverage count distribution of the target layer, the coverage count of each target surface element before and after the point deviation can be obtained, and the target surface elements whose coverage count changed before and after the point deviation, as well as their number, can be counted. (Referring to...) Figure 7 , Figure 7 This is a schematic diagram illustrating the change in the number of coverages of each target surface element before and after a point deviation occurs, provided by an embodiment of the present invention; as shown. Figure 7 As shown, the trends and magnitudes of coverage count changes differ among the various target elements. For example, target element 1 had 180 coverage counts before the point deviation and 170 coverage counts after the point deviation, meaning its coverage count decreased by 10 counts after the point deviation occurred. Similarly, target element 2 had 170 coverage counts before the point deviation and 180 coverage counts after the point deviation occurred, meaning its coverage count increased by 10 counts after the point deviation occurred. Therefore, referring to... Figure 8 , Figure 8 This is a schematic diagram illustrating the difference in the number of coverages of each target surface element before and after a point deviation occurs, provided by an embodiment of the present invention; for example... Figure 8 As shown, the difference in the number of coverages between each target element before and after the point deviation can be obtained by statistically analyzing the trend and magnitude of the change in the number of coverages.

[0080] Based on the obtained point deviations, the number of target elements that meet the acquisition requirements, the number of target elements whose coverage times have changed, the differences in coverage times between each target element, and the total number of elements contained in the target layer, a comprehensive analysis of the field coverage times of the target layer can be performed.

[0081] This implementation provides a geological model-based method for analyzing field cover frequency. By combining two-dimensional and three-dimensional geological models, complex geological structures and stratigraphic profiles can be visualized at different strata and orientations, improving the accuracy of CRP cover frequency acquisition. Furthermore, based on the geological model, ray tracing forward modeling of seismic waves allows for a quantitative comparison of the cover frequency and illumination of surface elements affected by location deviations, enhancing the comprehensiveness and accuracy of field cover frequency analysis.

[0082] In some optional embodiments, establishing a three-dimensional geological model of the target site includes:

[0083] Define the observation system for the target site;

[0084] A three-dimensional geological model is established based on the observation system; the observation system includes the number of shot points, the number of geophone points, the location of shot points, and the location of geophone points.

[0085] In this embodiment, the target site is first acquired, and an observation system is defined based on the target site. Then, raw seismic data of the target site is collected, and analytical seismic data is extracted from the raw seismic data. Finally, a three-dimensional geological model of the target site is established based on the acquired observation system and analytical seismic data. The observation system includes data such as the number of shot points, the number of receiver points, the location of shot points, and the location of receiver points.

[0086] In some optional embodiments, obtaining the field coverage count of the target layer based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage count changes, the difference in coverage count among the target elements, and the total number of elements contained in the target layer includes:

[0087] The following percentages are determined: the number of target cells that meet the acquisition requirements before and after the point deviation, relative to the total number of cells in the target layer; the number of target cells whose coverage times change, relative to the total number of cells in the target layer; and the number of target cells with different coverage times changes, relative to the total number of cells in the target layer.

[0088] Based on the first percentage, the second percentage, and the third percentage, the number of field coverages of the target layer is obtained; wherein, the number of field coverages of the target layer is used to analyze the geological structural characteristics within the three-dimensional geological model and the two-dimensional geological model.

[0089] In this embodiment, the first percentage before and after the point deviation is obtained. Specifically, based on the number of target surface elements that meet the acquisition requirements before the point deviation, the number of target surface elements that meet the acquisition requirements after the point deviation, and the total number of surface elements contained in the target layer, the first percentage of the number of target surface elements before the point deviation relative to the total number of surface elements contained in the target layer, and the first percentage of the number of target surface elements after the point deviation relative to the total number of surface elements contained in the target layer are obtained.

[0090] Then, the second percentage is obtained. Specifically, based on the number of coverages of each target element in the target layer before the point deviation, the number of coverages of each target element in the target layer after the point deviation, and the total number of elements contained in the target layer, the second percentage of the target elements whose coverages changed before and after the point deviation is obtained relative to the total number of elements contained in the target layer.

[0091] Finally, obtain the third percentage of the target surface area based on the change in coverage times. (Refer to...) Figure 8 ,picture Figure 8 This is a schematic diagram illustrating the difference in the number of coverage occurrences for each target surface element before and after a location deviation, provided by an embodiment of the present invention. The change in the number of coverage occurrences is the difference between the number of coverage occurrences before and after the location deviation for the same target surface element. Figure 8 As shown, based on the number of target cells with different coverage times before and after the point deviation, and the total number of cells contained in the target layer, the third percentage of the number of cells with different coverage times changes relative to the total number of cells contained in the target layer can be obtained. The coverage times changes of the target cells can be categorized.

[0092] For example, refer to Figure 8 Target cells with a coverage change value of 1 are classified into the first category, and the third percentage of the number of target cells in the first category can be obtained; target cells with a coverage change value of 2 are classified into the second category, and the third percentage of the number of target cells in the second category can be obtained; target cells with a coverage change value of 3 are classified into the third category, and the third percentage of the number of target cells in the third category can be obtained.

[0093] This yields the first, second, and third percentages related to the number of times the target layer is covered.

[0094] In some optional embodiments, obtaining the field coverage count of the target layer based on the first percentage, the second percentage, and the third percentage includes:

[0095] Based on the first percentage, obtain the area cell information of the target layer that meets the coverage requirement before and after the point deviation;

[0096] Based on the second percentage and the third percentage, information on the change in the number of times the target layer covers the location before and after the deviation is obtained;

[0097] Based on the area information of the target layer that meets the coverage number requirement before and after the location deviation, and the change information of the coverage number of the target layer before and after the location deviation, a comprehensive analysis is performed on the field coverage number of the target layer.

[0098] In this embodiment, the number of coverage elements is crucial for geological structure analysis. The first percentage before the point deviation can be used to obtain the area information of the target layer that meets the coverage element requirement before the point deviation; the first percentage after the point deviation can be used to obtain the area information of the target layer that meets the coverage element requirement after the point deviation. A higher first percentage before the point deviation indicates more area elements that meet the coverage element requirement before the deviation; a higher first percentage after the point deviation indicates more area elements that meet the coverage element requirement after the deviation. Generally speaking, more area elements that meet the coverage element requirement are more beneficial for the analysis of the geological structure of the target layer.

[0099] The second and third percentages can be used to obtain information on the change in the number of coverage elements of the target layer before and after the location deviation. A higher second percentage indicates that more cells in the target layer have experienced a change in coverage element count before and after the location deviation. The third percentage corresponds to different values ​​of coverage element change, representing the magnitude of the change in coverage element count before and after the location deviation.

[0100] For example, refer to Figure 8 The coverage change value of 1 is divided into the first category. The higher the third percentage of the first category, the more face cells with a coverage change value of 1. The coverage change value of 2 is divided into the second category. The higher the third percentage of the second category, the more face cells with a coverage change value of 2.

[0101] Based on the surface element information of the target layer that meets the coverage number requirement before and after the location deviation, as well as the change information of the coverage number of the target layer before and after the location deviation, a comprehensive analysis of the field coverage number of the target layer is conducted to facilitate further investigation and construction of complex geological structures, including the target layer.

[0102] In some optional embodiments, the method further includes acquiring illumination, comprising the following steps:

[0103] Based on the observation system, single-frequency pulses with a dominant frequency of 20Hz are placed at the shot point and receiver point.

[0104] Using the single-frequency pulse as the seismic source, the pulse source wave field is propagated to the target underground layer at a certain inclination angle using a one-way wave propagation operator.

[0105] Obtain the underground illuminance of each shot point and corresponding receiver point within the observation system with respect to the dip angle direction;

[0106] The wave equation illumination of the target layer is obtained by superimposing the illumination of all shot points and receiver points within the observation system.

[0107] In this embodiment, illumination can be used to analyze the energy distribution of seismic waves propagating through the target layer in both three-dimensional and two-dimensional geological models. High illumination of the target layer indicates that such an observation system can effectively acquire reflection information about the target layer's structure.

[0108] In some alternative embodiments, the method further includes:

[0109] Determine the illumination of the target layer before and after the positional deviation;

[0110] Based on the illumination before and after the positional deviation, analyze the change information of the illumination of the target layer before and after the positional deviation;

[0111] The performance of the observation system is evaluated based on the changes in illumination of the target layer before and after the location deviation.

[0112] In this embodiment, refer to Figure 9 and Figure 10 , Figure 9 This is a schematic diagram of illumination before point deviation occurs, provided by an embodiment of the present invention. Figure 10 This is a schematic diagram of illumination after a point deviation occurs, provided by an embodiment of the present invention. For example... Figure 9 As shown, the illumination of the target layer before the point deviation is first obtained. For example... Figure 10 As shown, the illumination of the target layer after point deviation is then obtained. (Refer to...) Figure 11 , Figure 11 This is a schematic diagram comparing illumination before and after a point deviation, provided by an embodiment of the present invention; as shown. Figure 11As shown, the illumination of the target layer before and after the point deviation is quantitatively compared, and the change information of illumination intensity is obtained. The change information includes the percentage change in illumination intensity; the percentage change in illumination intensity can be obtained by simulation calculation, which is the percentage of the number of facets in the target layer whose illumination intensity changed before and after the point deviation out of the total number of facets contained in the target layer.

[0113] In some optional embodiments, the step of slicing the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model includes:

[0114] When the target direction is the first direction, the three-dimensional geological model is sliced ​​on the plane formed by the first direction and the third direction; or,

[0115] When the target direction is the second direction, the three-dimensional geological model is sliced ​​on the plane formed by the second direction and the third direction; wherein the first direction, the second direction, and the third direction are all orthogonal to each other; or,

[0116] When the target direction is a fourth direction other than the first and second directions, the three-dimensional geological model is sliced ​​in the corresponding angular direction;

[0117] A two-dimensional geological model is established based on the obtained model slices.

[0118] In this embodiment, the offset direction of the point position deviation in the 3D geological model is the target direction. The 3D geological model includes a first direction, a second direction, and a third direction that are mutually orthogonal. Slicing the 3D geological model based on the set point position deviation can be divided into the following three cases:

[0119] Case 1: Refer to Figure 12 When the target direction of the point deviation is the first direction, the three-dimensional geological model is sliced ​​on the plane formed by the first direction and the third direction.

[0120] Case 2: Refer to Figure 13 When the target direction of the point deviation is the second direction, the three-dimensional geological model is sliced ​​on the plane formed by the second direction and the third direction.

[0121] Case 3: Refer to Figure 14 When the target direction of the point deviation is a fourth direction other than the first and second directions, the three-dimensional geological model is sliced ​​in the corresponding angular direction.

[0122] Among them, such as Figure 12 , 13As shown in Figure 14, the first direction can be the X direction in the figure, the second direction can be the Y direction in the figure, the third direction can be the Z direction in the figure, and the fourth direction can be any direction perpendicular to the Z direction.

[0123] In any case, the direction of the model slices is always perpendicular to the target layer, so that the obtained model slices include geological profiles of the target layer or other strata. Furthermore, refer to... Figure 15 It can also simultaneously acquire model slices in the first, second, and fourth directions of the three-dimensional geological model.

[0124] Reference Figure 16 Based on the obtained model slices, a two-dimensional geological model is established.

[0125] In some optional embodiments, the step of slicing the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model includes:

[0126] Based on the positional deviation, the offset distance of the detector point in the target direction is determined;

[0127] Based on the offset distance, the step size of the model slice is obtained;

[0128] The three-dimensional geological model is sliced ​​according to the stated step size to obtain a two-dimensional geological model.

[0129] In this embodiment, the offset direction of the receiver points is first determined based on the set point deviation, and then the offset distance of the receiver points is determined. Then, using this offset distance as a step size, the three-dimensional geological model is sliced. Finally, a two-dimensional geological model is established based on the model slice planes. The two-dimensional geological model can clearly display geological profiles of multiple strata, including the target layer.

[0130] In some optional embodiments, the step of performing ray tracing forward modeling on the target layer in the two-dimensional geological model based on the shot detection data before and after the point deviation to obtain the cover number distribution of the target layer may include the following sub-steps:

[0131] First, based on the shot detection data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the ray tracing path;

[0132] Next, common reflection point attribute analysis is performed on the ray tracing path to determine the distribution of the number of times the common reflection points cover the target layer.

[0133] In this embodiment, firstly, based on the shot and refraction data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the acquired two-dimensional geological model to obtain the ray tracing path. Then, common reflection point (CRP) attribute analysis is performed on the ray tracing path to determine the common reflection point (CRP) coverage distribution of the target layer.

[0134] The following example illustrates an exemplary method for analyzing field cover frequency based on a geological model, which may include the following steps:

[0135] Step 1: Define the observation system: shot distance is 50m, receiver distance is 50m, offset distance is 6000m, shot position is 0m, and receivers are placed in the water layer.

[0136] Step 2: Establish a three-dimensional geological model of the target site;

[0137] Step 3: Set the point deviation, generate model slices, and establish a two-dimensional geological model;

[0138] Step 4: Perform CRP coverage analysis based on the target layer to obtain the CRP coverage distribution of the target layer;

[0139] Step 5: Before and after the point deviation, count the number of coverages for each target layer, the target surface cells that meet the acquisition requirements, and the change in the number of coverages for each target surface cell.

[0140] A second aspect of the present invention provides a field cover frequency analysis device based on a geological model, the analysis device comprising:

[0141] The 3D model creation module is used to create a 3D geological model of the target site.

[0142] The point deviation design module is used to acquire shot-receiver data before and after the point deviation occurs, according to the set point deviation; wherein, the point deviation is used to characterize the offset of the receiver point in the target direction.

[0143] A two-dimensional model building module is used to slice the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model; wherein the direction of the model slicing is determined by the target direction;

[0144] The coverage number acquisition module is used to perform ray tracing forward modeling on the target layer in the two-dimensional geological model based on the shot detection data before and after the point deviation, and to obtain the coverage number distribution of the target layer;

[0145] The target surface element statistics module is used to count the target surface elements on the target layer that meet the acquisition requirements before and after the point deviation, based on the coverage frequency distribution of the target layer; wherein, the acquisition requirements include a preset percentage of the number of times full coverage is achieved;

[0146] The coverage count analysis module is used to obtain the field coverage count of the target layer based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage count changes, the difference in coverage count between each target element, and the total number of elements contained in the target layer.

[0147] In this embodiment, refer to Figure 17 , Figure 17 A schematic diagram of a field cover frequency analysis device based on a geological model provided in an embodiment of the present invention; as shown. Figure 17 As shown, the field cover frequency analysis device based on the geological model includes:

[0148] The 3D model creation module 201 is used to create a 3D geological model of the target site.

[0149] The point deviation design module 202 is used to acquire shot-receiver data before and after the point deviation occurs according to the set point deviation; wherein, the point deviation is used to characterize the offset of the receiver point in the target direction.

[0150] The two-dimensional model building module 203 is used to slice the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model; wherein the direction of the model slicing is determined by the target direction;

[0151] The coverage count acquisition module 204 is used to, based on the shot inspection data before and after the point deviation, perform the following calculations:

[0152] Ray tracing forward modeling was performed on the target layer in the two-dimensional geological model to obtain the coverage number distribution of the target layer.

[0153] The target surface element statistics module 205 is used to count the target surface elements on the target layer that meet the acquisition requirements before and after the point deviation, based on the coverage number distribution of the target layer; wherein, the acquisition requirements include a preset percentage of the number of times full coverage is achieved.

[0154] The coverage count analysis module 206 is used to obtain the field coverage count of the target layer based on the number of target elements that meet the acquisition requirements before and after the point deviation, the number of target elements whose coverage count changes, the difference in coverage count between each target element, and the total number of elements contained in the target layer.

[0155] Optionally, the 3D model building module includes:

[0156] The system definition module is used to define the observation system for the target land parcel;

[0157] The first model building module is used to build a three-dimensional geological model based on the observation system; the observation system includes the number of shot points, the number of receiver points, the location of the shot points, and the location of the receiver points.

[0158] Optionally, the coverage count analysis module includes:

[0159] The first calculation module is used to determine the following percentages of the target surface cells that meet the acquisition requirements before and after the point deviation, relative to the total number of surface cells contained in the target layer: the percentage of the target surface cells whose coverage times have changed relative to the total number of surface cells contained in the target layer; and the percentage of the target surface cells with different coverage times changes relative to the total number of surface cells contained in the target layer.

[0160] The first analysis module is used to obtain the field coverage count of the target layer based on the first percentage, the second percentage, and the third percentage; wherein the field coverage count of the target layer is used to analyze the geological structural features inside the three-dimensional geological model and the two-dimensional geological model.

[0161] Optionally, the second analysis module includes:

[0162] The first acquisition module is used to acquire, based on the first percentage, the surface cell information of the target layer that meets the coverage number requirement before and after the point deviation;

[0163] The second acquisition module is used to acquire information on the change in the number of times the target layer covers the location before and after the deviation, based on the second percentage and the third percentage.

[0164] The coverage count analysis module is used to comprehensively analyze the field coverage count of the target layer based on the change in the number of surface cells that meet the coverage count requirements before and after the location deviation, and the change in the coverage count of the target layer before and after the location deviation.

[0165] Optionally, the device further includes:

[0166] An illumination acquisition module is used to determine the illumination of the target layer before and after the point deviation;

[0167] The third acquisition module is used to analyze the change information of the illumination of the target layer before and after the point deviation based on the illumination before and after the point deviation.

[0168] The illumination analysis module is used to evaluate the performance of the observation system based on the changes in illumination of the target layer before and after the location deviation.

[0169] Optionally, the two-dimensional model building module includes:

[0170] The first slicing module is used to slice the three-dimensional geological model on a plane formed by the first direction and a third direction when the target direction is the first direction; or,

[0171] The second slicing module is used to slice the three-dimensional geological model on a plane formed by the second direction and the third direction when the target direction is the second direction; wherein the first direction, the second direction, and the third direction are orthogonal to each other; or,

[0172] The third slicing module is used to slice the three-dimensional geological model in the corresponding angular direction when the target direction is a fourth direction other than the first and second directions.

[0173] The second model building module is used to build a two-dimensional geological model based on the acquired model slices.

[0174] Optionally, the point deviation design module includes:

[0175] The path simulation module performs ray tracing forward modeling on the target layer in the two-dimensional geological model based on the shot and inspection data before and after the point deviation, and obtains the ray tracing path.

[0176] The coverage number distribution module performs co-reflection point attribute analysis on the ray tracing path to determine the co-reflection point coverage number distribution of the target layer.

[0177] The field cover frequency analysis device based on a geological model provided in this embodiment can not only visualize complex geological structures and stratigraphic profiles in different strata and orientations, but also improve the comprehensiveness and accuracy of the field cover frequency analysis, while reducing the workload and time consumption of manual operation and improving work efficiency.

[0178] In a third aspect of the present invention, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the field cover number analysis method based on a geological model as described in the first aspect of the present invention.

[0179] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0180] Embodiments of the present invention are described with reference to flowchart illustrations and / or block diagrams of an apparatus according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, generate instructions for implementing the flowchart illustrations. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0181] Although preferred embodiments of the present invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the embodiments of the present invention.

[0182] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, apparatus, article, or terminal device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, apparatus, article, or terminal device. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, apparatus, article, or terminal device that includes said element.

[0183] The foregoing has provided a detailed description of the method, apparatus, and equipment for analyzing field cover frequency based on a geological model provided by the present invention. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the apparatus and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method of analyzing field coverage times based on a geological model, characterized by, The analysis method comprises: establishing a three-dimensional geological model of a target plot; acquiring shot and detection data before and after a set point deviation, respectively, wherein the point deviation is used to represent the deviation of a detection point in a target direction; performing model slicing on the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model, wherein the model slicing direction is determined by the target direction; performing ray tracing forward modeling on a target layer in the two-dimensional geological model based on the shot and detection data before and after the point deviation to obtain the coverage frequency distribution of the target layer; based on the coverage frequency distribution of the target layer, counting the target bin satisfying the acquisition requirement on the target layer before and after the point deviation, respectively, wherein the acquisition requirement comprises reaching a preset percentage of full coverage frequency; based on the number of target bins satisfying the acquisition requirement, the number of target bins with changed coverage frequency, the change difference of coverage frequency between each target bin, and the total number of bins included in the target layer, obtaining the field coverage frequency of the target layer.

2. The method of claim 1, wherein, The establishment of the three-dimensional geological model of the target plot comprises: defining an observation system of the target plot; establishing a three-dimensional geological model based on the observation system; the observation system comprises the number of shot points, the number of detection points, the position of shot points, and the position of detection points.

3. The method of claim 1, wherein, The method further comprises: determining the illumination of the target layer before and after the point deviation; ​ 4. The method of claim 3, wherein, ​ ​ ​ ​ 5. The method of claim 2, wherein, ​ ​ Based on the illumination before and after the point deviation, analyze the change information of the illumination of the target layer before and after the point deviation; Based on the change information of the illumination of the target layer before and after the point deviation, evaluate the performance of the observation system.

6. The method of claim 1, wherein, The model slicing of the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model, comprising: When the target direction is the first direction, the three-dimensional geological model is sliced in the plane formed by the first direction and the third direction; or, When the target direction is the second direction, the three-dimensional geological model is sliced in the plane formed by the second direction and the third direction; wherein the first direction, the second direction and the third direction are orthogonal to each other; or, When the target direction is the fourth direction other than the first direction and the second direction, the three-dimensional geological model is sliced in the corresponding angle direction; Based on the obtained model slice, a two-dimensional geological model is established.

7. The method of claim 1, wherein, The model slicing of the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model, comprising: Based on the point deviation, determine the offset distance of the receiver point in the target direction; Based on the offset distance, obtain the step length of the model slice; According to the step length, slice the three-dimensional geological model to obtain a two-dimensional geological model.

8. The method of claim 1, wherein, Based on the shot and receiver data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the coverage number distribution of the target layer, comprising: Based on the shot and receiver data before and after the point deviation, ray tracing forward modeling is performed on the target layer in the two-dimensional geological model to obtain the ray tracing path; Perform common reflection point attribute analysis on the ray tracing path to determine the common reflection point coverage number distribution of the target layer.

9. A geological model-based field coverage number analysis apparatus, characterized by comprising: The analysis device comprises: A three-dimensional model establishing module for establishing a three-dimensional geological model of a target block; A point deviation design module for obtaining shot and receiver data before and after the occurrence of a set point deviation, respectively; wherein the point deviation is used to represent the offset of the receiver point in the target direction; A two-dimensional model establishing module for model slicing of the three-dimensional geological model based on the point deviation to obtain a two-dimensional geological model; wherein the model slicing direction is determined by the target direction; A coverage number obtaining module for ray tracing forward modeling of the target layer in the two-dimensional geological model based on the shot and receiver data before and after the point deviation to obtain the coverage number distribution of the target layer; A target bin statistical module for respectively counting the target bins on the target layer before and after the point deviation that meet the acquisition requirements based on the coverage number distribution of the target layer; wherein the acquisition requirements include reaching a preset percentage of full coverage number. The coverage times analysis module is configured to obtain the field coverage times of the target layer based on the number of target surface elements meeting the collection requirements before and after the point deviation, the number of target surface elements in which the coverage times change, the change difference of the coverage times between each target surface element, and the total number of surface elements included in the target layer.

10. An electronic device comprising a memory, a processor, and a computer program stored on the memory, wherein the computer program comprises instructions that, when executed by the processor, cause the electronic device to perform the method of any one of claims 1-9. The processor executes the computer program to implement the method for analyzing field coverage times based on a geological model according to any one of claims 1 to 8.

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