LabVIEW-based special automatic test method for 1799A direct-current power supply

Abstract

The invention discloses a special automatic test method for a 1799A direct-current power supply based on LabVIEW. The special automatic test method comprises a three-layer modular architecture including a driving layer, an application layer and an interaction layer, and a multi-thread cooperative control and high-precision data processing algorithm. According to the multi-thread cooperative control, a test task is distributed to three independent threads including a control thread, a collection thread and a processing thread, thread synchronization is achieved through a shared variable and a queue, and the equipment response delay is reduced to be within 20 ms; a high-precision data processing algorithm comprises ripple noise reduction and peak detection, transient response calculation and efficiency calculation, line loss is eliminated through an iterative algorithm, and the efficiency test precision of the whole machine is improved to + / -0.05%. The special automatic test method for a 1799A series wide-range and high-power-density direct-current power supply is particularly suitable for a mass production stage efficient test scene based on a LabVIEW development environment, and can realize full-parameter automatic test of output steady-state voltage, ripple, power, efficiency, dynamic response and the like.

Description

Technical Field

[0001] This invention relates to a DC power supply performance testing technology, and more particularly to a dedicated automated testing method for a 1799A DC power supply based on LabVIEW. Background Technology

[0002] The 1799A series DC power supplies, as core power supply equipment with a wide range (22V-1000V) and high power density (1500-2000W), are widely used in industrial control, automotive electronics and scientific research fields. Their core indicators such as output accuracy, ripple characteristics and transient response directly determine the reliability of downstream equipment.

[0003] Currently, testing of the 1799A power supply mainly employs traditional manual methods, requiring operators to sequentially operate multiple devices such as oscilloscopes, multimeters, and AC power supplies. This presents the following key problems:

[0004] Inefficient: Traditional testing systems require manual completion of equipment wiring, parameter setting, data recording and calculation for a single test, which takes up to 45 minutes and cannot meet the high throughput requirements of mass production.

[0005] Large timing error: Dynamic parameters such as ripple and transient response rely on manual synchronous operation of multiple devices. Operation delays cause timing errors to exceed 5%, making it impossible to accurately capture transient processes.

[0006] Insufficient accuracy: Manual reading and calculation are prone to human error, and traditional testing algorithms are not optimized for the wide voltage range of 1799A, resulting in a test accuracy of only ±0.5%, which cannot meet the high accuracy requirement of ±0.05%.

[0007] Poor hardware compatibility: The communication protocols and drivers of different models of test equipment (such as oscilloscopes and multimeters of different brands) are not consistent. When replacing hardware, it is necessary to rewrite the test software on a large scale, resulting in high maintenance costs.

[0008] Safety risks: Manually switching between high-voltage AC power and 1799A power supply poses a risk of electric shock, and it is impossible to monitor abnormal equipment status in real time.

[0009] Existing automated testing solutions are mostly designed for general-purpose power supplies and are not adapted to the wide range and high power density characteristics of the 1799A power supply. Furthermore, they fail to address the integration issues of multi-device collaborative control, high-precision algorithm optimization, and end-to-end automation. Therefore, a dedicated automated testing method for the 1799A DC power supply is urgently needed to overcome these technical bottlenecks.

[0010] In view of this, the present invention is hereby proposed. Summary of the Invention

[0011] The purpose of this invention is to provide a dedicated automated testing method for 1799A DC power supplies based on LabVIEW, so as to solve the above-mentioned technical problems existing in the prior art.

[0012] The objective of this invention is achieved through the following technical solution:

[0013] The present invention provides a dedicated automated testing method for 1799A DC power supplies based on LabVIEW, which includes a three-layer modular architecture, multi-threaded collaborative control, and high-precision data processing algorithms.

[0014] The three-layer modular architecture includes:

[0015] Driver layer: The communication interfaces (LAN / USB / RS485 / RS232) of all hardware devices are encapsulated using object-oriented principles to form a standardized device class library. It provides general interfaces for initialization, reading data, setting parameters, and shutting down the device, achieving hardware independence and supporting seamless switching between different device models.

[0016] Application layer: Includes four independent components: power supply control, test sequence, data processing, and report generation. They work together through a queue communication mechanism to achieve parallel execution of test tasks and fault isolation.

[0017] Interaction layer: The human-computer interface is designed based on user operating habits, integrating one-click testing, real-time monitoring, and fault alarm functions, and supporting visual editing of test sequences and query of historical reports;

[0018] The multi-threaded collaborative control includes:

[0019] The test tasks are assigned to three independent threads: control, acquisition, and processing. Thread synchronization is achieved through shared variables and queues, reducing device response latency to less than 20ms, including multi-device timing consistency.

[0020] The high-precision data processing algorithm includes:

[0021] Ripple noise reduction and peak detection: 5-level decomposition of db4 wavelet and adaptive threshold noise reduction are used to filter out 50Hz power frequency interference and high frequency noise. Then, the effective value and peak value of ripple are accurately calculated by sliding window peak detection.

[0022] Transient response calculation: Control the electronic load to generate a fast step load, synchronously collect the voltage response curve, and use the first-order differential algorithm to accurately calculate the rise time and recovery time;

[0023] Efficiency calculation: By eliminating line loss through iterative algorithms, the overall efficiency test accuracy is improved to ±0.05%.

[0024] Compared with existing technologies, the LabVIEW-based automated testing method for 1799A DC power supplies provided by this invention is a dedicated automated testing method for the 1799A series of wide-range, high-power-density DC power supplies. It is especially suitable for efficient testing scenarios in the mass production stage based on the LabVIEW development environment, and can realize automated testing of all parameters such as output steady-state voltage, ripple, power, efficiency, and dynamic response. Attached Figure Description

[0025] Figure 1 The principle framework of the LabVIEW-based 1799A DC power supply dedicated automated test system provided in the embodiments of the present invention;

[0026] Figure 2 An exterior view of the cabinet for the LabVIEW-based 1799A DC power supply dedicated automated test system provided in this embodiment of the invention;

[0027] Figure 3 This is a schematic diagram of the system software structure according to an embodiment of the present invention;

[0028] Figure 4 This is a flowchart of the host computer software of the system in an embodiment of the present invention. Detailed Implementation

[0029] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them, and do not constitute a limitation on the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the protection scope of the present invention.

[0030] First, the following explanations are provided for the terms that may be used in this article:

[0031] The terms “including,” “contains,” “comprising,” “having,” or other similar semantic descriptions shall be interpreted as non-exclusive inclusion.

[0032] The contents not described in detail in the embodiments of this invention are prior art known to those skilled in the art. Where specific conditions are not specified in the embodiments of this invention, they shall be performed according to conventional conditions in the art or conditions recommended by the manufacturer. Where the manufacturers of the reagents or instruments used in the embodiments of this invention are not specified, they are all conventional products that can be purchased commercially.

[0033] The present invention provides a dedicated automated testing method for 1799A DC power supplies based on LabVIEW, which includes a three-layer modular architecture, multi-threaded collaborative control, and high-precision data processing algorithms.

[0034] The three-layer modular architecture includes:

[0035] Driver layer: The communication interfaces (LAN / USB / RS485 / RS232) of all hardware devices are encapsulated using object-oriented principles to form a standardized device class library. It provides general interfaces for initialization, reading data, setting parameters, and shutting down the device, achieving hardware independence and supporting seamless switching between different device models.

[0036] Application layer: Includes four independent components: power supply control, test sequence, data processing, and report generation. They work together through a queue communication mechanism to achieve parallel execution of test tasks and fault isolation.

[0037] Interaction layer: The human-computer interface is designed based on user operating habits, integrating one-click testing, real-time monitoring, and fault alarm functions, and supporting visual editing of test sequences and query of historical reports;

[0038] The multi-threaded collaborative control includes:

[0039] The test tasks are assigned to three independent threads: control, acquisition, and processing. Thread synchronization is achieved through shared variables and queues, reducing device response latency to less than 20ms, including multi-device timing consistency.

[0040] The high-precision data processing algorithm includes:

[0041] Ripple noise reduction and peak detection: 5-level decomposition of db4 wavelet and adaptive threshold noise reduction are used to filter out 50Hz power frequency interference and high frequency noise. Then, the effective value and peak value of ripple are accurately calculated by sliding window peak detection.

[0042] Transient response calculation: Control the electronic load to generate a fast step load, synchronously collect the voltage response curve, and use the first-order differential algorithm to accurately calculate the rise time and recovery time;

[0043] Efficiency calculation: By eliminating line loss through iterative algorithms, the overall efficiency test accuracy is improved to ±0.05%.

[0044] The testing process is fully automated.

[0045] From device self-test, test sequence configuration, parameter acquisition, data processing to report generation, no manual intervention is required throughout the entire process; it supports barcode scanners to read the 1799A power supply serial number and automatically call the corresponding test template to achieve a closed-loop test of "one-click start-automatic completion-categorized storage";

[0046] The testing process includes the following steps:

[0047] Step 1: System Initialization and Device Self-Test

[0048] 1) Start the industrial computer and run the test program developed based on LabVIEW. The program will automatically load the "driver layer" class library and initialize each device in sequence:

[0049] Oscilloscope: Set the RPG DS1000Z sampling rate to 2.5GS / s and the channel attenuation ratio to 10:1 via the LAN interface; set the Keysight MDO4000 trigger mode to "edge triggered";

[0050] Multimeter: The measurement accuracy of the Keysight 34461A is calibrated via USB interface. The high-current multimeter is configured with a current range of 0-150A, and the low-current multimeter is configured with a current range of 0-3.8A.

[0051] AC power supply: Set the default output voltage of the ITECH IT-7326 to 220V and the frequency to 50Hz via the RS485 interface;

[0052] Relay module: The on / off response time is tested via RS485 interface to ensure it is ≤10ms;

[0053] 2) After initialization, the interaction layer will pop up a "Device Self-Test" interface, displaying the communication status of each device and generating a self-test report; if all devices pass the self-test, proceed to step 2; if a device fails to communicate, the program will alarm and prompt you to troubleshoot the fault.

[0054] Step 2: Test sequence configuration:

[0055] In the interactive layer "Sequence Editing Module", the operator selects the 1799A power supply model from the drop-down menu. The system automatically loads the basic test items for this model, including constant voltage accuracy, constant current accuracy, ripple characteristics, and efficiency test.

[0056] Add the "Overload Protection Test" item by dragging and dropping, configure the overload current to 120% of the rated current, and the test duration to 10 seconds;

[0057] Configure the voltage settings for constant voltage accuracy testing: 22V, 100V, 500V, 1000V, with a test duration of 5 seconds for each setting;

[0058] Click "Save Sequence" and the application layer will store the test sequence for later reuse.

[0059] Step 3: Parameter Acquisition and Testing under Multi-threaded Cooperative Control:

[0060] Clicking the "Start Test" button in the interaction layer initiates multi-threading in the application layer:

[0061] Control thread: Sends instructions to the relay module through the driver layer to close the power supply circuit between the AC power supply and the 1799A power supply, and controls the ITECH IT-7326 to output 220V AC power; at the same time, controls the ITECH IT-8814B electronic load to switch to "constant current mode" and load 10A, 50A, 100A and 150A loads in sequence;

[0062] Acquisition Thread: When the electronic load is 10A, the Keysight MDO4000 oscilloscope is synchronously triggered to acquire the ripple waveform for 5 seconds; a low-current multimeter is triggered to acquire the output voltage at 22V and the current at 10A; a power meter is triggered to acquire the input active power; the acquired data is transmitted to the application layer buffer in real time.

[0063] Processing thread: Reads data from the buffer. If the voltage reading deviates from the mean by 3 times the standard deviation at a certain moment, it is judged as abnormal and removed. The valid data is associated with the "22V constant voltage -10A load" test item.

[0064] Step 4: High-precision data processing and pass / fail determination:

[0065] The application layer "data processing component" performs calculations for different test items:

[0066] Ripple characteristic test: The original ripple signal acquired by the oscilloscope was decomposed into 5 levels using the db4 wavelet. The coefficients with an absolute value <0.01mV in the high-frequency detail coefficients cD1~cD5 were set to zero. The noise-reduced signal was then reconstructed by inverse wavelet transform. The peak and valley values ​​of the reconstructed signal were detected by a sliding window. The peak-to-peak value of the ripple was calculated to be 30mV, and the effective value was 2mV-4mV.

[0067] Constant voltage accuracy test: The measured voltage at the 22V setting was 21.99V, with a deviation of 0.045% from the set value; the measured voltage at the 1000V setting was 999.8V, with a deviation of 0.02%.

[0068] Efficiency test: The power meter collected an input active power of 1500W, and the multimeter collected an output power of 1485W. The line loss was eliminated by an iterative algorithm, and the overall efficiency was calculated to be ≥98%, which was deemed qualified.

[0069] After all test items are completed, the application layer generates an intermediate test report, marking the results of each individual item.

[0070] Step 5: Automated Report Generation and Data Storage:

[0071] The application layer "Report Generation Component" calls the LabVIEW Report Toolkit to import intermediate test reports, oscilloscope ripple waveforms, and multimeter reading tables into a preset Excel template;

[0072] Automatically generate an "efficiency-load curve", with the horizontal axis representing the load current (10A-150A) and the vertical axis representing the efficiency (98.5%-99.3%).

[0073] Since all test items passed, the program will save the final report to the "Pass Reports" folder;

[0074] Operators can query the report by date and model in the "Report Query" module of the interactive layer to view detailed data and waveforms.

[0075] Step 6: Automatic power calibration:

[0076] If any test item fails in step 4, the interactive layer will prompt "Start automatic calibration?"; after clicking "Yes":

[0077] The application layer calls the "automatic power calibration module" to control the high-precision multimeter to collect the actual output voltage of the 1000V range as 999.4V;

[0078] Send a calibration command to the 1799A power supply via the LAN interface to adjust the internal feedback resistor value;

[0079] After calibration, repeat steps 3 and 4 to retest the constant voltage accuracy at 1000V. The deviation has been reduced to 0.03%.

[0080] In summary, the LabVIEW-based automated testing method for 1799A DC power supplies in this invention solves the problems of low efficiency, large timing errors, insufficient accuracy, and poor hardware compatibility of traditional manual testing, and achieves high-precision and high-efficiency automated testing of the core indicators of the 1799A power supply.

[0081] To more clearly demonstrate the technical solution and its effects provided by the present invention, the embodiments of the present invention will be described in detail below with reference to specific examples.

[0082] LabVIEW (Laboratory Virtual Instrument Engineering Workbench) is a graphical programming-based virtual instrument development platform with powerful data acquisition, analysis, processing, and visualization capabilities, as well as excellent scalability and compatibility. LabVIEW can be used to easily build systems for automated testing of the 1799A power supply.

[0083] like Figures 1 to 4 As shown:

[0084] This invention adopts a three-layer modular architecture of "driver layer - application layer - interaction layer", combined with multi-threaded collaborative control and high-precision data processing algorithms. The specific technical solution is as follows:

[0085] 1. Three-tier architecture design

[0086] Driver layer: The communication interfaces (LAN / USB / RS485 / RS232) of all hardware devices are encapsulated using object-oriented principles to form a standardized device class library. It provides common interfaces such as "initialization", "reading data", "setting parameters" and "shutting down the device", achieving hardware independence and supporting seamless switching between different device models.

[0087] Application layer: It is broken down into four independent components: power supply control, test sequence, data processing, and report generation. They work together through a queue communication mechanism to achieve parallel execution of test tasks and fault isolation.

[0088] Interaction layer: The human-computer interface is designed based on user operating habits, integrating functions such as "one-click testing", "real-time monitoring" and "fault alarm", and supporting visual editing of test sequences and query of historical reports.

[0089] 2. Multi-threaded collaborative control

[0090] The test tasks are distributed to three independent threads: control, acquisition, and processing. Thread synchronization is achieved through shared variables and queues, reducing the device response latency from the traditional 500ms to less than 20ms and solving the timing consistency problem of multiple devices.

[0091] 3. High-precision data processing algorithms

[0092] Ripple noise reduction and peak detection: 5-level decomposition of db4 wavelet and adaptive threshold noise reduction are used to filter out 50Hz power frequency interference and high frequency noise. Then, the effective value and peak value of ripple are accurately calculated by sliding window peak detection.

[0093] Transient response calculation: Control the electronic load to generate a fast step load, synchronously collect the voltage response curve, and use the first-order differential algorithm to accurately calculate the rise time and recovery time;

[0094] Efficiency calculation: By eliminating line loss through iterative algorithms, the overall efficiency test accuracy is improved to ±0.05%.

[0095] 4. Full-process automation

[0096] From device self-test, test sequence configuration, parameter acquisition, data processing to report generation, no manual intervention is required throughout the entire process; it supports barcode scanners to read the 1799A power supply serial number and automatically call the corresponding test template to achieve a closed-loop test of "one-click start-automatic completion-categorized storage".

[0097] The beneficial effects of this invention are:

[0098] Significantly improved efficiency: The time for a single test has been reduced from 45 minutes to 8 minutes, an efficiency improvement of 462%, meeting the high throughput requirements of mass production;

[0099] Significantly improved accuracy: The testing accuracy of core indicators reaches ±0.05%, including voltage acquisition accuracy of ±0.01%, current acquisition accuracy of ±0.02%, and power factor acquisition accuracy of ±0.1%, which is better than similar solutions in the industry;

[0100] Strong hardware compatibility: The standardized design of the driver layer means that hardware upgrades do not require modification of the core code, reducing maintenance costs;

[0101] High safety: Automated relay switching and real-time fault alarms avoid the risk of electric shock during manual operation;

[0102] Wide applicability: Supports testing of 8 models in the 1799A series, adaptable to a wide voltage range of 22V-1000V and a wide current range of 0-150A, and can be extended to similar wide-range DC power supply testing scenarios.

[0103] Example 1

[0104] 1. Hardware and software environment

[0105] 1) Hardware equipment: Advantech 610L industrial PC (system control center), Rigol Precision DS1000Z high voltage oscilloscope (≥500V signal acquisition), Keysight MDO4000 low voltage oscilloscope (<500V signal acquisition), Keysight 34461A high precision multimeter (2 units, one for high current ≥3.8A and the other for low current <3.8A acquisition), ITECH IT-7326 programmable AC power supply (0-300V output), ITECH IT-8814B electronic load (0-150A output), RS485 relay module, Hangzhou Yuanfang PF9811 power meter, 12-channel LAN network switch;

[0106] 2) Software environment: Windows 10 operating system, LabVIEW 2020 development environment, LabVIEW reporting toolkit, original drivers for each device (such as oscilloscope LAN driver, multimeter USB driver).

[0107] 2. Implementation Steps

[0108] Step 1: System Initialization and Device Self-Test

[0109] 1) Start the industrial computer and run the test program developed based on LabVIEW. The program will automatically load the "driver layer" class library and initialize each device in sequence:

[0110] Oscilloscope: Set the RPG DS1000Z sampling rate to 2.5GS / s and the channel attenuation ratio to 10:1 via the LAN interface; set the Keysight MDO4000 trigger mode to "edge triggered";

[0111] Multimeter: The measurement accuracy of the Keysight 34461A is calibrated via USB interface. The high-current multimeter is configured with a current range of 0-150A, and the low-current multimeter is configured with a current range of 0-3.8A.

[0112] AC power supply: Set the default output voltage of the ITECH IT-7326 to 220V and the frequency to 50Hz via the RS485 interface;

[0113] Relay module: Test the on / off response time via RS485 interface to ensure ≤10ms.

[0114] 2) After initialization, the interactive layer will pop up the "Device Self-Test" interface, displaying the communication status of each device (such as "Oscilloscope LAN connected: normal" and "Multimeter USB connected: normal"), and generate a self-test report; if all devices pass the self-test, proceed to step 2; if a device fails to communicate (such as the relay RS485 disconnecting), the program will alarm and prompt you to troubleshoot the fault.

[0115] Step 2: Test sequence configuration

[0116] In the interactive layer "Sequence Editing Module", the operator selects the 1799A power supply model "DH1799AD1" from the drop-down menu, and the system automatically loads the basic test items for this model (including constant voltage accuracy, constant current accuracy, ripple characteristics, efficiency test, etc.).

[0117] Add the "Overload Protection Test" item by dragging and dropping, configure the overload current to 150A (120% of the rated current), and the test duration to 10s;

[0118] Configure the voltage settings for constant voltage accuracy testing: 22V, 100V, 500V, 1000V, with a test duration of 5 seconds for each setting;

[0119] Click "Save Sequence" and the application layer will store the test sequence as "DH1799A_D1_Test Sequence.xm" for easy reuse later.

[0120] Step 3: Parameter Acquisition and Testing under Multi-threaded Cooperative Control

[0121] Clicking the "Start Test" button in the interaction layer initiates multi-threading in the application layer:

[0122] Control thread: Sends instructions to the relay module through the driver layer to close the power supply circuit between the AC power supply and the 1799A power supply, and controls the ITECH IT-7326 to output 220V AC power; at the same time, controls the ITECH IT-8814B electronic load to switch to "constant current mode" and load 10A, 50A, 100A and 150A loads in sequence;

[0123] Acquisition Thread: When the electronic load is 10A, the Keysight MDO4000 oscilloscope is synchronously triggered (because the 100V output is <500V) to acquire the ripple waveform, with a sampling time of 5s; a low-current multimeter is triggered to acquire the output voltage (22V range) and current (10A); a power meter is triggered to acquire the input active power; the acquired data is transmitted to the application layer buffer in real time;

[0124] Processing thread: Reads data from the buffer, uses the 3σ criterion to filter outliers (such as a voltage reading that deviates from the mean by 3 times the standard deviation at a certain moment, which is judged as an anomaly and removed), and associates the valid data with the "22V constant voltage -10A load" test item.

[0125] Step 4: High-precision data processing and pass / fail determination

[0126] The application layer "data processing component" performs calculations for different test items:

[0127] Ripple characteristic test: The original ripple signal acquired by the oscilloscope is decomposed into 5 levels using the db4 wavelet. The coefficients with an absolute value <0.01mV in the high-frequency detail coefficients cD1~cD5 are set to zero. The noise-reduced signal is then reconstructed through inverse wavelet transform. The peak and valley values ​​of the reconstructed signal are detected using a sliding window (window size 100 sampling points). The peak-to-peak value of the ripple is calculated to be around 30mV (≤60mV threshold, qualified), and the effective value is around 2mV-4mV (≤8mV threshold, qualified).

[0128] Constant voltage accuracy test: The measured voltage at the 22V range is 21.99V, with a deviation of 0.045% from the set value (≤0.05% threshold, qualified); the measured voltage at the 1000V range is 999.8V, with a deviation of 0.02% (qualified).

[0129] Efficiency test: The power meter collected an input active power of 1500W, and the multimeter collected an output power of 1485W (output voltage 1000V × output current 1.485A). After eliminating line loss (approximately 5W) through an iterative algorithm, the overall efficiency was calculated as (1485 / (1500-5)) × 100% = 99.3% (≥98% threshold, deemed qualified).

[0130] After all test items are completed, the application layer generates an intermediate test report, marking the results of each item (e.g., "Overload protection test: Pass (power supply triggered protection at 150A)").

[0131] Step 5: Automated Report Generation and Data Storage

[0132] The application layer "Report Generation Component" calls the LabVIEW Report Toolkit to import intermediate test reports, oscilloscope ripple waveforms (inserted into the Excel chart area), and multimeter reading tables into a preset Excel template;

[0133] Automatically generate an "efficiency-load curve", with the horizontal axis representing the load current (10A-150A) and the vertical axis representing the efficiency (98.5%-99.3%).

[0134] Since all test items passed, the program will store the final report in the "Pass Reports" folder and name it "DH1799A_D1_20240520_1030.xlsx";

[0135] Operators can query the report by date and model in the "Report Query" module of the interactive layer to view detailed data and waveforms.

[0136] Step 6: Automatic power calibration (optional)

[0137] If any test item in step 4 fails (e.g., constant voltage accuracy deviation of 0.06% at 1000V), the interactive layer will prompt "Start automatic calibration?"; after clicking "Yes":

[0138] The application layer calls the "automatic power calibration module" to control the high-precision multimeter to collect the actual output voltage of the 1000V range as 999.4V;

[0139] Send a calibration command to the 1799A power supply via the LAN interface to adjust the internal feedback resistor value;

[0140] After calibration, repeat steps 3 and 4 to retest the constant voltage accuracy at 1000V. The deviation should be reduced to 0.03% (qualified).

[0141] 3. Industrial applicability

[0142] The testing method of this invention has been applied in the mass production line of 1799A DC power supplies, with a cumulative testing and verification of 5,000 power supplies. The consistency of the test data reached 99.8% (compared to 78% for traditional manual testing). Through the automatic calibration function, the calibration time for a single power supply has been reduced from 30 minutes to 5 minutes, and labor costs have been reduced by 83%. In addition, the "modular drive design" and "multi-threaded collaborative control" technologies of this method can be extended to testing scenarios for other wide-range DC power supplies (such as 20V-800V, 1000W-3000W), providing a reusable technical solution for automated testing of industrial DC power supplies, and has significant industrial application value.

[0143] The verification results show that the system meets the testing requirements of AC-DC module power supplies, and its efficiency and accuracy are superior to existing technologies.

[0144] Through the overall system construction and software operation described above, the LabVIEW-based automated testing method for 1799A DC power supplies of this invention solves the problems of low efficiency, large human error, poor equipment compatibility, slow adaptation to multiple models, and difficulty in data traceability in traditional single-channel serial testing by integrating standardized hardware and collaborating with LabVIEW host computer software. It has significant economic and social benefits.

[0145] The above description is merely a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims. The information disclosed in the background section is intended only to enhance the understanding of the overall background technology of the present invention and should not be construed as an admission or implication in any way that such information constitutes prior art known to those skilled in the art.

Claims

1. A dedicated automated testing method for a 1799A DC power supply based on LabVIEW, characterized in that, It includes a three-layer modular architecture, multi-threaded collaborative control, and high-precision data processing algorithms; The three-layer modular architecture includes: Driver layer: The communication interfaces (LAN / USB / RS485 / RS232) of all hardware devices are encapsulated using object-oriented principles to form a standardized device class library. It provides general interfaces for initialization, reading data, setting parameters, and shutting down the device, achieving hardware independence and supporting seamless switching between different device models. Application layer: Includes four independent components: power supply control, test sequence, data processing, and report generation. They work together through a queue communication mechanism to achieve parallel execution of test tasks and fault isolation. Interaction layer: The human-computer interface is designed based on user operating habits, integrating one-click testing, real-time monitoring, and fault alarm functions, and supporting visual editing of test sequences and query of historical reports; The multi-threaded collaborative control includes: The test tasks are assigned to three independent threads: control, acquisition, and processing. Thread synchronization is achieved through shared variables and queues, reducing device response latency to less than 20ms, including multi-device timing consistency. The high-precision data processing algorithm includes: Ripple noise reduction and peak detection: 5-level decomposition of db4 wavelet and adaptive threshold noise reduction are used to filter out 50Hz power frequency interference and high frequency noise. Then, the effective value and peak value of ripple are accurately calculated by sliding window peak detection. Transient response calculation: Control the electronic load to generate a fast step load, synchronously collect the voltage response curve, and use the first-order differential algorithm to accurately calculate the rise time and recovery time; Efficiency calculation: By eliminating line loss through iterative algorithms, the overall efficiency test accuracy is improved to ±0.05%.

2. The LabVIEW-based automated testing method for 1799A DC power supplies according to claim 1, characterized in that, The testing process is fully automated: From device self-test, test sequence configuration, parameter acquisition, data processing to report generation, no manual intervention is required throughout the entire process; it supports barcode scanners to read the 1799A power supply serial number and automatically call the corresponding test template to achieve a closed-loop test of "one-click start-automatic completion-categorized storage".

3. The LabVIEW-based automated testing method for 1799A DC power supplies according to claim 2, characterized in that, The testing process includes the following steps: Step 1: System Initialization and Device Self-Test 1) Start the industrial computer and run the test program developed based on LabVIEW. The program will automatically load the "driver layer" class library and initialize each device in sequence: Oscilloscope: Set the RPG DS1000Z sampling rate to 2.5GS / s and the channel attenuation ratio to 10:1 via the LAN interface; set the Keysight MDO4000 trigger mode to "edge triggered"; Multimeter: The measurement accuracy of the Keysight 34461A is calibrated via USB interface. The high-current multimeter is configured with a current range of 0-150A, and the low-current multimeter is configured with a current range of 0-3.8A. AC power supply: Set the default output voltage of the ITECH IT-7326 to 220V and the frequency to 50Hz via the RS485 interface; Relay module: The on / off response time is tested via RS485 interface to ensure it is ≤10ms; 2) After initialization, the interaction layer will pop up a "Device Self-Test" interface, displaying the communication status of each device and generating a self-test report; if all devices pass the self-test, proceed to step 2; if a device fails to communicate, the program will alarm and prompt you to troubleshoot the fault. Step 2: Test sequence configuration: In the interactive layer "Sequence Editing Module", the operator selects the 1799A power supply model from the drop-down menu. The system automatically loads the basic test items for this model, including constant voltage accuracy, constant current accuracy, ripple characteristics, and efficiency test. Add the "Overload Protection Test" item by dragging and dropping, configure the overload current to 120% of the rated current, and the test duration to 10 seconds; Configure the voltage settings for constant voltage accuracy testing: 22V, 100V, 500V, 1000V, with a test duration of 5 seconds for each setting; Click "Save Sequence" and the application layer will store the test sequence for later reuse. Step 3: Parameter Acquisition and Testing under Multi-threaded Cooperative Control: Clicking the "Start Test" button in the interaction layer initiates multi-threading in the application layer: Control thread: Sends instructions to the relay module through the driver layer to close the power supply circuit between the AC power supply and the 1799A power supply, and controls the ITECH IT-7326 to output 220V AC power; at the same time, controls the ITECH IT-8814B electronic load to switch to "constant current mode" and load 10A, 50A, 100A and 150A loads in sequence; Acquisition Thread: When the electronic load is 10A, the Keysight MDO4000 oscilloscope is synchronously triggered to acquire the ripple waveform for 5 seconds; a low-current multimeter is triggered to acquire the output voltage at 22V and the current at 10A; a power meter is triggered to acquire the input active power; the acquired data is transmitted to the application layer buffer in real time. Processing thread: Reads data from the buffer. If the voltage reading deviates from the mean by 3 times the standard deviation at a certain moment, it is judged as abnormal and removed. The valid data is associated with the "22V constant voltage -10A load" test item. Step 4: High-precision data processing and pass / fail determination: The application layer "data processing component" performs calculations for different test items: Ripple characteristic test: The original ripple signal acquired by the oscilloscope was decomposed into 5 levels using the db4 wavelet. The coefficients with an absolute value <0.01mV in the high-frequency detail coefficients cD1~cD5 were set to zero. The noise-reduced signal was then reconstructed by inverse wavelet transform. The peak and valley values ​​of the reconstructed signal were detected by a sliding window. The peak-to-peak value of the ripple was calculated to be 30mV, and the effective value was 2mV-4mV. Constant voltage accuracy test: The measured voltage at the 22V setting was 21.99V, with a deviation of 0.045% from the set value; the measured voltage at the 1000V setting was 999.8V, with a deviation of 0.02%. Efficiency test: The power meter collected an input active power of 1500W, and the multimeter collected an output power of 1485W. The line loss was eliminated by an iterative algorithm, and the overall efficiency was calculated to be ≥98%, which was deemed qualified. After all test items are completed, the application layer generates an intermediate test report, marking the results of each individual item. Step 5: Automated Report Generation and Data Storage: The application layer "Report Generation Component" calls the LabVIEW Report Toolkit to import intermediate test reports, oscilloscope ripple waveforms, and multimeter reading tables into a preset Excel template; Automatically generate an "efficiency-load curve", with the horizontal axis representing the load current (10A-150A) and the vertical axis representing the efficiency (98.5%-99.3%). Since all tests passed, the program will save the final report to the "Pass Reports" folder; In the "Report Query" module of the interactive layer, operators can query the report by date and model to view detailed data and waveforms; Step 6: Automatic power calibration: If any test item fails in step 4, the interactive layer will prompt "Start automatic calibration?"; after clicking "Yes": The application layer calls the "automatic power calibration module" to control the high-precision multimeter to collect the actual output voltage of the 1000V range as 999.4V; Send a calibration command to the 1799A power supply via the LAN interface to adjust the internal feedback resistor value; After calibration, repeat steps 3 and 4 to retest the constant voltage accuracy at 1000V. The deviation has been reduced to 0.03%.

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