Portable equipment interface testing device

Abstract

The invention discloses a portable equipment interface testing device, which is characterized in that a plurality of switch groups, a first cable and a second cable are arranged on a circuit board, each switch group comprises two self-locking switches, the two self-locking switches are respectively a first switch and a second switch, one end of the first switch is connected with the first cable, one end of the second switch is connected with the second cable, and the other end of the first switch is connected with the second cable; the first cable and the second cable are used for being connected with a probe of a universal meter, one end of the equipment connection cable is provided with a plurality of connectors, the plurality of connectors are respectively used for being connected with to-be-tested equipment of different models, and the other end of the equipment connection cable is connected with the circuit board. The portable equipment interface testing device is connected with the to-be-tested equipment and the universal meter through the circuit board, so that the pins of the to-be-tested equipment are led out and amplified, the universal meter can conveniently measure different pins, and the portable equipment interface testing device can adapt to the to-be-tested equipment with different interfaces for testing; damage to an equipment interface caused by traditional manual testing and measurement errors caused by uneven force are avoided.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of interface testing devices, and more particularly relates to a portable device interface testing device. BACKGROUND

[0002] In the field of manufacturing and maintenance of electronic devices today, accurate and efficient testing of device interfaces is a key link to ensure stable operation and reliable performance. With the rapid development of technology, electronic devices are evolving towards miniaturization and integration, and their internal interface structures are becoming increasingly complex. The interface pins are not only small in size, but also highly dense in arrangement, which puts higher requirements on testing technology.

[0003] Currently, resistance testing and continuity detection of device interfaces mainly rely on a multimeter through manual contact with the pins. However, this traditional testing method has many inherent defects. First, due to the small spacing and small size of the interface pins, the operator needs to manually and accurately touch each pin, which is difficult to operate, tedious and time-consuming, and has low testing efficiency, making it difficult to meet the needs of rapid and efficient testing in modern mass production. Second, manual operation cannot guarantee the consistency of contact force each time, and fluctuations in the pressure of the probe will directly affect the measurement of contact resistance, leading to data deviation and seriously affecting the accuracy of the test. In addition, frequent use of metal probes to directly touch small pins can easily cause the pins to bend or be damaged due to improper operation, resulting in unnecessary damage to the device.

[0004] A more prominent problem is that existing testing devices generally lack universality and are mostly developed for specific devices or interface types. When facing products of different models or interface layouts, special testing tools or equipment often need to be replaced, which not only increases the testing cost, but also reduces the flexibility and convenience of operation. Although some improved testing devices have appeared in recent years, they have not achieved effective breakthroughs in improving testing accuracy, operational convenience, device protection, and universal adaptation.

[0005] Therefore, there is an urgent need for a device interface testing device that is simple in structure, low in cost, small in size, easy to carry, and has the advantages of easy operation and compatibility with multiple interface types, to solve the key technical problems of low efficiency, poor precision, easy damage, and weak universality in the current testing process, and to promote the development of electronic device testing technology towards higher efficiency, greater reliability, and greater intelligence. SUMMARY

[0006] The present application aims to solve the problems of poor device universality, tedious manual operation, and easy damage to the device in the prior art.

[0007] To achieve the above objectives, the present invention provides a convenient device interface testing apparatus, comprising: The circuit board has multiple switch groups, a first cable, and a second cable. The switch groups include two self-locking switches, which are a first switch and a second switch, respectively. One end of the first switch is connected to the first cable, and one end of the second switch is connected to the second cable. The first cable and the second cable are used to connect to the probes of a multimeter. The device connection cable has multiple connectors at one end, which are used to connect different models of devices under test. The other end of the device connection cable is connected to the circuit board, and the pins of the device under test are connected to the switch group one by one.

[0008] Optionally, the pins of the device under test are simultaneously connected to the other end of the first switch and the other end of the second switch, and the first switch and the second switch are normally open.

[0009] Optionally, the switch group is arranged in the pin order corresponding to the device under test.

[0010] Optionally, the system also includes a housing, with the circuit board disposed within the housing and the contacts of the first cable and the second cable, the self-locking switch, and the plurality of connectors exposed outside the housing.

[0011] Optionally, the housing is provided with a first color area and a second color area, and the first switch and the second switch are respectively located in the first color area and the second color area.

[0012] Optionally, the first color region and the second color region can be grouped into multiple sets.

[0013] Optionally, it also includes a label for marking pin information, the label being disposed on the switch assembly or the housing.

[0014] Optionally, the housing includes a groove and a cover plate, the circuit board is disposed in the groove, the cover plate is provided with a plurality of through holes, and the operating end of the self-locking switch is exposed in the through holes.

[0015] Optionally, the number of switch groups is not less than the number of pins of the device under test.

[0016] Optionally, the switch group is arranged in a rectangular array.

[0017] This invention provides a convenient device interface testing apparatus, the advantages of which are: This portable device interface testing device connects the device under test (DUT) and a multimeter via a circuit board. It not only brings out and amplifies the pins of the DUT, but also allows the multimeter to easily measure different pins. It can adapt to DUTs with different interfaces, avoiding damage to the device interface and measurement errors caused by uneven force in traditional manual testing. It is simple and convenient to use, improving work efficiency.

[0018] Other features and advantages of the present invention will be described in detail in the following detailed description section. Attached Figure Description

[0019] The above and other objects, features and advantages of the present invention will become more apparent from the more detailed description of exemplary embodiments of the invention in conjunction with the accompanying drawings, wherein the same reference numerals generally represent the same components in the exemplary embodiments of the invention.

[0020] Figure 1 A schematic diagram of a convenient device interface testing apparatus according to an embodiment of the present invention is shown.

[0021] Figure 2 An exploded view of a portable device interface testing apparatus according to an embodiment of the present invention is shown.

[0022] Figure 3 A schematic diagram of the cover plate of a portable device interface testing apparatus according to an embodiment of the present invention is shown.

[0023] Figure 4 A circuit diagram of a portable device interface testing apparatus according to an embodiment of the present invention is shown.

[0024] Explanation of reference numerals in the attached figures: 1. Equipment connection cable; 2. Multimeter; 3. Housing; 4. Circuit board; 5. Cover plate. Detailed Implementation

[0025] Preferred embodiments of the invention will now be described in more detail. While preferred embodiments of the invention are described below, it should be understood that the invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that the invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0026] like Figures 1-4 As shown, a portable device interface testing device includes: Circuit board 4 is provided with multiple switch groups, a first cable and a second cable. The switch groups include two self-locking switches, which are a first switch and a second switch, respectively. One end of the first switch is connected to the first cable, and one end of the second switch is connected to the second cable. The first cable and the second cable are used to connect to the probes of the multimeter 2. The device connection cable 1 has multiple connectors at one end, which are used to connect different models of devices under test. The other end of the device connection cable 1 is connected to the circuit board 4, and the pins of the device under test are connected to the switch group one by one.

[0027] Specifically, the circuit board 4 connects the device under test (DUT) and the multimeter, which not only brings out and amplifies the pins of the DUT, but also allows the multimeter 2 to easily measure different pins. It can also adapt to DUTs with different interfaces, avoiding damage to the device interface and measurement errors caused by uneven force in traditional manual testing. It is simple and convenient to use and improves work efficiency.

[0028] Furthermore, the device connection cable 1 and the circuit board 4 inside the housing 3 are connected by a cable connector. One end of the cable connector is fixed to the housing 3 by a screw and exposed, while the other end is connected to the connector of the circuit board 4, so that the connector of the circuit board 4 can be led to the outside of the housing 3, which facilitates the connection and use of the device connection cable 1.

[0029] In this embodiment, the pins of the device under test are simultaneously connected to the other end of the first switch and the other end of the second switch, and the first switch and the second switch are normally open.

[0030] Specifically, the first switch and the second switch control the on / off relationship between the corresponding pins and the first cable and the second cable, respectively.

[0031] In this embodiment, the switch group is arranged in the order of the pins of the device under test.

[0032] Specifically, sequential arrangement makes it easier to find and locate.

[0033] In this embodiment, a housing 3 is also included, a circuit board 4 is disposed inside the housing 3, and the contact ends of the first cable and the second cable, the self-locking switch and multiple connectors are exposed outside the housing 3.

[0034] Specifically, the circuit board 4 is protected by the outer casing 3.

[0035] In this embodiment, the outer casing 3 is provided with a first color area and a second color area, and the first switch and the second switch are respectively located in the first color area and the second color area.

[0036] Specifically, the first switch and the second switch are distinguished and marked by a first color area and a second color area.

[0037] In this embodiment, there are multiple groups of first color regions and second color regions.

[0038] Specifically, the color zones are grouped together with the switch groups to facilitate easy location.

[0039] In this embodiment, a label is also included, which is used to mark pin information and is set on the switch group or housing 3.

[0040] Specifically, text labels make it easier to locate the information.

[0041] In this embodiment, the outer casing 3 includes a groove and a cover plate 5. The circuit board 4 is disposed in the groove, and the cover plate 5 is provided with multiple through holes. The operating end of the self-locking switch is exposed through the through holes.

[0042] In this embodiment, the number of switch groups is no less than the number of pins of the device under test.

[0043] In this embodiment, the switch groups are arranged in a rectangular array.

[0044] In this embodiment, a convenient device interface testing device is used. The cover plate 5 is marked with pin information and the two color areas are distinguished by black and white.

[0045] Taking resistance testing as an example: To test the resistance between pins a and b of the device under test, first connect the interface of the device under test to the corresponding interface on the device connection cable 1. Then, turn on multimeter 2, set it to the resistance test mode, and locate the switch groups corresponding to pins a and b according to the markings. Press the black area switch for pin a and the white area switch for pin b respectively. Since resistance testing does not distinguish between positive and negative terminals, you can also press the white area switch for pin a and the black area switch for pin b respectively. However, you cannot press switches of the same color. After pressing the switches, you can view the resistance value between pins a and b on the multimeter 2 interface. After the test is completed, restore the switch state, and you can continue to carry out other tests.

[0046] In this embodiment, a convenient device interface testing device is used, taking continuity testing as an example: to test the continuity between pin d and pin c of the device under test, first connect the interface of the device under test to the corresponding interface on the device connection cable 1. Then turn on the multimeter 2, set it to the continuity test mode, and find the switch group corresponding to pin d and pin c according to the label information. Press the black area switch corresponding to pin d and the white area switch corresponding to pin c respectively. Since the continuity test does not distinguish between positive and negative, you can also press the white area switch corresponding to pin d and the black area switch corresponding to pin c respectively. However, you cannot press switches of the same color area. After pressing the switch, if the two pins are conductive, the multimeter 2 will emit a beep; otherwise, they are disconnected. After the test is completed, restore the switch state, and you can continue to carry out other tests.

[0047] The various embodiments of the present invention have been described above. These descriptions are exemplary and not exhaustive, nor are they limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments.

Claims

1. A portable device interface testing device, characterized in that, include: The circuit board has multiple switch groups, a first cable, and a second cable. The switch groups include two self-locking switches, which are a first switch and a second switch, respectively. One end of the first switch is connected to the first cable, and one end of the second switch is connected to the second cable. The first cable and the second cable are used to connect to the probes of a multimeter. The device connection cable has multiple connectors at one end, which are used to connect different models of devices under test. The other end of the device connection cable is connected to the circuit board, and the pins of the device under test are connected to the switch group one by one.

2. The portable device interface testing device according to claim 1, characterized in that, The pins of the device under test are simultaneously connected to the other end of the first switch and the other end of the second switch, and the first switch and the second switch are normally open.

3. The portable device interface testing device according to claim 1, characterized in that, The switch group is arranged in the pin order corresponding to the device under test.

4. The portable device interface testing device according to claim 3, characterized in that, It also includes a housing, the circuit board is disposed inside the housing, and the contact ends of the first cable and the second cable, the self-locking switch and the plurality of connectors are exposed outside the housing.

5. The portable device interface testing device according to claim 4, characterized in that, The outer casing is provided with a first color area and a second color area, and the first switch and the second switch are respectively located in the first color area and the second color area.

6. The portable device interface testing device according to claim 5, characterized in that, There are multiple groups of the first color area and the second color area.

7. The portable device interface testing device according to claim 4, characterized in that, It also includes labels for marking pin information, which are disposed on the switch assembly or the housing.

8. The portable device interface testing device according to claim 1, characterized in that, The housing includes a groove and a cover plate. The circuit board is disposed in the groove. The cover plate has multiple through holes, and the operating end of the self-locking switch is exposed through the through holes.

9. The portable device interface testing device according to claim 1, characterized in that, The number of switch groups is not less than the number of pins of the device under test.

10. The portable device interface testing device according to claim 1, characterized in that, The switch groups are arranged in a rectangular array.

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