Wafer cleaning and drying module and wafer transfer method after wafer cleaning and drying

By installing multiple sensors in the wafer cleaning and drying module, the problem of wafer dropping caused by inaccurate gripper position detection was solved, enabling safe wafer transfer and accurate detection, thereby improving production efficiency and product yield.

CN121815996BActive Publication Date: 2026-06-09HANGZHOU ZHONGGUI ELECTRONICS TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
HANGZHOU ZHONGGUI ELECTRONICS TECH CO LTD
Filing Date
2026-03-11
Publication Date
2026-06-09

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Abstract

This invention discloses a wafer cleaning and drying module and a method for transferring wafers after cleaning and drying, comprising: a drying chamber; a lifting mechanism; a flipping mechanism, equipped with a support and grippers for switching the wafer between a vertical and a horizontal position; the grippers having at least a first working position that cooperates with the lifting mechanism, and a second working position that can hold the wafer and switch it between a vertical and a horizontal position, wherein in the first working position the grippers are located at the bottom of the support, and in the second working position the grippers are located at the top of the support and hold the wafer; further comprising: a first sensor located at the bottom of the support for detecting whether the grippers are in the first working position; a second sensor located at the top of the support for detecting whether the grippers are in the second working position; and a third sensor for detecting whether the flipping mechanism is in a horizontal position. This invention provides sensors at both the first and second working positions to ensure that the wafer is effectively flipped and transferred.
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