Method and device for calculating OBN acquisition surface element, electronic equipment and medium
By calculating the OBN acquisition surface elements, the layer velocity parameters and spatial sampling interval were determined, and key acquisition parameters were adjusted. This solved the problem of unsuitable surface element attributes in OBN acquisition, and enabled the optimized design and high-quality acquisition of the observation system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-10
- Publication Date
- 2026-04-10
AI Technical Summary
Existing technologies struggle to accurately calculate element attribute parameters during OBN acquisition, leading to inappropriate observation system design and impacting the quality of acquired data.
By determining the layer velocity parameters of the target layer, calculating the spatial sampling interval and the range of element parameters, and adjusting key acquisition parameters such as OBN point spacing, excitation point spacing, receiver line spacing, and excitation line spacing, the element size is ensured to be within the parameter range. The element size is optimized using the greatest common divisor function.
It enables accurate calculation of OBN acquisition element parameters, improves the rationality of the observation system design and the imaging effect of the acquired data, and meets the requirement of no offset aliasing in spatial sampling.
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Figure CN121837342A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of seismic exploration, and more particularly to a method and device for calculating OBN acquisition bins, an electronic device and a medium. BACKGROUND
[0002] Bin attribute analysis is one of the key factors for optimizing the design of a seismic acquisition observation system. In current conventional ground exploration, high-quality exploration data can be obtained by reducing bin size and increasing sampling density. The traditional way to reduce bin size is to reduce the receiver interval and shot point interval. However, due to the unique working mode of OBN exploration, it is not possible to deploy high-density OBN receivers during the acquisition process due to the limitations of the conditions. Therefore, the density of the sampling can only be improved by increasing the number of shot points. Therefore, the OBN acquisition method generally has a large OBN point interval and a small shot point interval. Since the OBN point interval is large, the bin formed by 1 / 2 of the trace interval and 1 / 2 of the shot point interval is not suitable for actual acquisition requirements. Therefore, the method for calculating the OBN acquisition bin is not necessarily suitable for OBN acquisition design.
[0003] Therefore, there is a need to develop a method for calculating the OBN acquisition bin.
[0004] The information disclosed in the background section of the present application is only intended to deepen the understanding of the general background of the present application and should not be regarded as acknowledging or implying in any form that the information constitutes prior art known to those skilled in the art. SUMMARY
[0005] The present application provides a method and device for calculating the OBN acquisition bin, an electronic device and a medium, which can accurately calculate the size of the bin attribute parameter in the OBN acquisition design process, provide an important reference for determining the basic parameters of the observation system, achieve the purpose of optimizing the design of the observation system, and have strong practicability.
[0006] In a first aspect, the present application provides a method for calculating the OBN acquisition bin, comprising:
[0007] determining the velocity parameter of the target layer;
[0008] calculating the spatial sampling interval and then determining the bin parameter range;
[0009] determining the key acquisition parameters of the OBN, calculating the size of the OBN acquisition bin according to the key acquisition parameters;
[0010] adjusting the key acquisition parameters according to the bin parameter range constraint, and outputting the final size of the OBN acquisition bin.
[0011] As a specific implementation manner of the embodiment of the present disclosure, the space sampling interval is calculated, and then the bin parameter range is determined.
[0012] According to the formation dip angle in the geological model, the velocity of the formation, and the expected frequency, the value range of the space sampling interval bin is calculated, that is, the bin parameter range.
[0013] As a specific implementation manner of the embodiment of the present disclosure, the space sampling interval is:
[0014]
[0015] wherein dx represents the space sampling interval, v represents the root mean square velocity above the target layer, f m represents the expected highest frequency, and θ represents the formation dip angle or the migration dip angle.
[0016] As a specific implementation manner of the embodiment of the present disclosure, according to the device condition received in the OBN acquisition, the excitation condition, and whether to be fused with the streamer acquisition data, the key acquisition parameters of the OBN are determined.
[0017] As a specific implementation manner of the embodiment of the present disclosure, the key acquisition parameters include the OBN point distance, the excitation point distance, the receiving line distance, and the excitation line distance.
[0018] As a specific implementation manner of the embodiment of the present disclosure, the size of the OBN acquisition bin is:
[0019]
[0020] wherein B 纵 , B 横 is the longitudinal and transverse bin grid size, RI is the OBN point distance, SI is the excitation point distance, RLI is the receiving line distance, SLI is the excitation line distance, and Gcd is the greatest common divisor function.
[0021] As a specific implementation manner of the embodiment of the present disclosure, the key acquisition parameters are adjusted according to the bin parameter range constraint, comprising:
[0022] It is judged whether the size of the OBN acquisition bin calculated according to the key acquisition parameters is within the bin parameter range, and if not, the key acquisition parameters are adjusted, and the size of the OBN acquisition bin is recalculated.
[0023] In a second aspect, the embodiment of the present disclosure further provides a device for calculating an OBN acquisition bin, comprising:
[0024] A parameter determination module determines the velocity parameter of the target layer.
[0025] A range determination module calculates the space sampling interval, and then determines the bin parameter range.
[0026] a calculation module configured to determine a key acquisition parameter of the OBN and calculate a size of an OBN acquisition bin according to the key acquisition parameter;
[0027] an adjustment module configured to adjust the key acquisition parameter according to the bin parameter range constraint and output a final size of the OBN acquisition bin.
[0028] As a specific implementation manner of the embodiment of the present disclosure, the calculation of the spatial sampling interval and the determination of the bin parameter range include:
[0029] According to a stratigraphic dip in the geological model, a velocity of the stratigraphic layer, and an expected frequency, a value range of the spatial sampling interval bin is calculated, that is, the bin parameter range.
[0030] As a specific implementation manner of the embodiment of the present disclosure, the spatial sampling interval is:
[0031]
[0032] wherein dx represents the spatial sampling interval, v represents a root mean square velocity above the target layer, f m represents an expected highest frequency, and θ represents a stratigraphic dip or a migration dip.
[0033] As a specific implementation manner of the embodiment of the present disclosure, the key acquisition parameter of the OBN is determined according to a device condition received in the OBN acquisition, a firing condition, and whether the OBN acquisition data is fused with streamer acquisition data.
[0034] As a specific implementation manner of the embodiment of the present disclosure, the key acquisition parameter includes an OBN point distance, a firing point distance, a receiving line distance, and a firing line distance.
[0035] As a specific implementation manner of the embodiment of the present disclosure, the size of the OBN acquisition bin is:
[0036]
[0037] wherein B 纵 , B 横 represents a longitudinal and transverse bin grid size, RI represents the OBN point distance, SI represents the firing point distance, RLI represents the receiving line distance, SLI represents the firing line distance, and Gcd represents a greatest common divisor function.
[0038] As a specific implementation manner of the embodiment of the present disclosure, the adjustment of the key acquisition parameter according to the bin parameter range constraint includes:
[0039] determining whether the size of the OBN acquisition bin calculated according to the key acquisition parameter is within the bin parameter range, and if not, adjusting the key acquisition parameter and recalculating the size of the OBN acquisition bin.
[0040] In a third aspect, the embodiments of the present disclosure further provide an electronic device, which comprises:
[0041] a memory, which stores executable instructions;
[0042] a processor, which runs the executable instructions in the memory to implement the method for calculating an OBN acquisition bin.
[0043] In a fourth aspect, the embodiments of the present disclosure further provide a computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to implement the method for calculating an OBN acquisition bin.
[0044] The method and device of the present application have other characteristics and advantages, which will be apparent or will be described in detail in the accompanying drawings and subsequent detailed description incorporated herein, which together serve to explain the specific principles of the present application. BRIEF DESCRIPTION OF DRAWINGS
[0045] The above and other objects, features and advantages of the present application will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings, in which like reference characters refer to like parts throughout the figures, and in which:
[0046] Figure 1 A flow chart showing the steps of the method for calculating an OBN acquisition bin according to one embodiment of the present application is shown.
[0047] Figure 2 A schematic diagram showing the bin value calculated according to the stratigraphic dip of the target zone of interest layer according to one embodiment of the present application is shown.
[0048] Figure 3 A block diagram showing a device for calculating an OBN acquisition bin according to one embodiment of the present application is shown.
[0049] BRIEF DESCRIPTION OF DRAWINGS
[0050] 201, parameter determining module; 202, range determining module; 203, calculating module; 204, adjusting module. DETAILED DESCRIPTION
[0051] Preferred embodiments of the present application will be described in more detail below. Although the following describes preferred embodiments of the present application, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments set forth herein.
[0052] To facilitate understanding of the scheme and effects of the embodiments of the present application, six specific application examples are given below. Those skilled in the art should understand that the examples are only for facilitating understanding of the present application, and any specific details thereof are not intended to limit the present application in any way.
[0053] Example 1
[0054] Figure 1 A flow chart showing steps of a method of calculating an OBN acquisition bin according to an embodiment of the present application is shown.
[0055] As shown in Figure 1 , the method of calculating an OBN acquisition bin comprises:
[0056] Step 101, determining a velocity parameter of a target layer;
[0057] Step 102, calculating a spatial sampling interval, and thereby determining a bin parameter range;
[0058] Step 103, determining key acquisition parameters of the OBN, and calculating a size of the OBN acquisition bin according to the key acquisition parameters;
[0059] Step 104, adjusting the key acquisition parameters according to a bin parameter range constraint, and outputting a final size of the OBN acquisition bin.
[0060] In one example, calculating a spatial sampling interval, and thereby determining a bin parameter range comprises:
[0061] According to a stratigraphic dip in a geological model, a velocity of the stratigraphic layer, and a desired frequency, a value range of the spatial sampling interval bin, i.e. the bin parameter range, is calculated.
[0062] In one example, the spatial sampling interval is:
[0063]
[0064] where dx represents the spatial sampling interval, v represents a root mean square velocity above the target layer, f m represents a desired highest frequency, and θ represents a stratigraphic dip or a migration dip.
[0065] In one example, the key acquisition parameters of the OBN are determined according to a device condition received in the OBN acquisition, a condition of excitation, and whether the OBN acquisition data is fused with streamer acquisition data.
[0066] In one example, the key acquisition parameters include an OBN point distance, an excitation point distance, a receiving line distance, and an excitation line distance.
[0067] In one example, the size of the OBN acquisition bin is:
[0068]
[0069] wherein B 纵 , B 横 are the longitudinal and transverse bin grid sizes, RI is the OBN point distance, SI is the excitation point distance, RLI is the receiving line distance, SLI is the excitation line distance, and Gcd is the greatest common divisor function.
[0070] In one example, adjusting the key acquisition parameters according to the bin parameter range constraint comprises:
[0071] determining whether the size of the OBN acquisition bin calculated according to the key acquisition parameters is within the bin parameter range, and if not, adjusting the key acquisition parameters and recalculating the size of the OBN acquisition bin.
[0072] Specifically, according to the exploration purpose of the target area, the depth domain interpretation profile data, the depth domain horizon data, and other data information of the previous acquisition data are used to statistically determine the interval velocity parameters of the target layers.
[0073] The bin size value of each target layer that meets the spatial sampling without offset aliasing is calculated and statistically determined, and an appropriate bin parameter range is selected. In seismic acquisition design, the selection of spatial sampling is mainly based on two theories: one is based on stacking theory, that is, the spatial sampling is required to meet the no aliasing frequency; the other is based on the offset theory of the diffraction point, that is, the spatial sampling is required to meet the no aliasing frequency. The calculation formula derived from the two theories is:
[0074]
[0075] wherein dx represents the spatial sampling interval; v represents the root mean square velocity above the target layer; f m represents the expected highest frequency; and θ represents the stratigraphic dip angle or the offset dip angle. According to the stratigraphic dip angle in the geological model, the velocity of the stratum, and the expected frequency, the value range of the spatial sampling interval bin can be calculated.
[0076] The key acquisition parameters such as the OBN point distance, the excitation point distance, the receiving line distance, and the excitation line distance are designed according to the number of OBN nodes in OBN acquisition, the requirements of air gun excitation, whether to be fused with streamer acquisition data, and other requirements. Generally, due to the influence of factors such as fewer OBN nodes, the designed OBN point distance and receiving line distance are larger, and the excitation point distance and excitation line distance are smaller.
[0077] According to the improved method for calculating the bin of OBN acquisition, whether the bin value after the key acquisition parameters such as the designed OBN point distance, the shot point distance, the receiving line distance and the shot line distance are determined meets the bin size range of the spatial sampling without offset false frequency is calculated. For OBN acquisition, according to the traditional bin grid calculation method, the larger OBN point distance and receiving line distance are no longer suitable. Therefore, the improved bin parameter calculation formula is:
[0078]
[0079] Wherein, B 纵 , B 横 is the longitudinal and transverse bin grid size, RI is the OBN point distance, SI is the shot point distance, RLI is the receiving line distance, SLI is the shot line distance, and Gcd is the greatest common divisor function.
[0080] According to the improved bin algorithm, the longitudinal bin size is half of the greatest common divisor of the OBN point distance and the shot line distance, and the transverse bin size is half of the greatest common divisor of the shot point distance and the receiving line distance.
[0081] Whether the bin value after the key acquisition parameters such as the designed OBN point distance, the shot point distance, the receiving line distance and the shot line distance are determined meets the bin size range of the spatial sampling without offset false frequency is determined. If the calculated bin value does not meet the bin size range of the spatial sampling without offset false frequency, the key acquisition parameter values such as the OBN point distance, the shot point distance, the receiving line distance and the shot line distance are adjusted, the bin value is recalculated, and the required bin value is reached. Generally, in the process of adjusting the key acquisition parameter values such as the OBN point distance, the shot point distance, the receiving line distance and the shot line distance, other key parameters such as the aspect ratio and the channel density also need to be considered to achieve the purpose of the observation system optimization design.
[0082] The application can calculate the bin parameters of the target area OBN acquisition, improve the rationality of the key acquisition parameter design such as the OBN point distance, the shot point distance, the receiving line distance and the shot line distance of the target area OBN acquisition, and lay a foundation for subsequent analysis work.
[0083] Example 2
[0084] The application also provides a device for calculating the bin of OBN acquisition, which comprises:
[0085] The parameter determination module determines the interval velocity parameter of the target layer;
[0086] The range determination module calculates the spatial sampling interval, and further determines the bin parameter range;
[0087] The calculation module determines the key acquisition parameters of the OBN, and calculates the size of the OBN acquisition bin according to the key acquisition parameters;
[0088] The adjusting module adjusts the key acquisition parameters according to the bin parameter range constraint, and outputs the size of the OBN acquisition bin.
[0089] In one example, the spatial sampling interval is calculated, and then the bin parameter range is determined.
[0090] According to the formation dip in the geological model, the velocity of the formation and the expected frequency, the value range of the spatial sampling interval bin is calculated, that is, the bin parameter range.
[0091] In one example, the spatial sampling interval is:
[0092]
[0093] wherein dx represents the spatial sampling interval, v represents the root mean square velocity above the target layer, f m represents the expected highest frequency, and θ represents the formation dip or the migration dip.
[0094] In one example, the key acquisition parameters of the OBN are determined according to the equipment condition received in the OBN acquisition, the excitation condition and whether to fuse with the streamer acquisition data.
[0095] In one example, the key acquisition parameters include the OBN point distance, the excitation point distance, the receiving line distance and the excitation line distance.
[0096] In one example, the size of the OBN acquisition bin is:
[0097]
[0098] wherein B 纵 , B 横 are the longitudinal and transverse bin grid sizes, RI is the OBN point distance, SI is the excitation point distance, RLI is the receiving line distance, SLI is the excitation line distance, and Gcd is the greatest common divisor function.
[0099] In one example, adjusting the key acquisition parameters according to the bin parameter range constraint includes:
[0100] Judging whether the size of the OBN acquisition bin calculated according to the key acquisition parameters is within the bin parameter range, if not, adjusting the key acquisition parameters and recalculating the size of the OBN acquisition bin.
[0101] Specifically, according to the exploration purpose of the target area, the depth domain interpretation profile data, the depth domain horizon data and other data information of the previous acquisition data are used to statistically determine the velocity parameter of the target layer.
[0102] The purpose of calculating statistics is to meet the bin size value of spatial sampling without offset aliasing and to select appropriate bin parameter range. In seismic acquisition design, the selection of spatial sampling is mainly based on two theories: one is based on stacking theory, that is, spatial sampling should meet the non-aliasing false frequency; the second is based on the offset theory of the diffraction point, that is, spatial sampling should meet the non-aliasing false frequency. The calculation formula derived from the two theories is:
[0103]
[0104] Wherein: dx represents the spatial sampling interval; v represents the root mean square velocity above the purpose layer; f m represents the expected highest frequency; θ represents the strata dip angle or offset dip angle. According to the strata dip angle in the geological model, the velocity of the strata and the expected frequency, the value range of the spatial sampling interval bin can be calculated.
[0105] According to the number of OBN nodes in OBN acquisition, the requirements of air gun shooting, whether to fuse with streamer acquisition data and other requirements, the key acquisition parameters such as OBN point distance, shooting point distance, receiving line distance and shooting line distance are designed. Generally, due to the influence of factors such as fewer OBN nodes, the designed OBN point distance and receiving line distance are larger, and the shooting point distance and shooting line distance are smaller.
[0106] According to the improved method of calculating OBN acquisition bin, whether the bin value after the key acquisition parameters such as OBN point distance, shooting point distance, receiving line distance and shooting line distance are determined meets the bin size range of spatial sampling without offset aliasing. For OBN acquisition, the larger OBN point distance and receiving line distance are not suitable according to the traditional bin grid calculation method. Therefore, the improved bin parameter calculation formula is:
[0107]
[0108] Wherein, B 纵 , B 横 is the longitudinal and transverse bin grid size, RI is the OBN point distance, SI is the shooting point distance, RLI is the receiving line distance, SLI is the shooting line distance, and Gcd is the greatest common divisor function.
[0109] According to the improved bin algorithm, the longitudinal bin size is half of the greatest common divisor of the OBN point distance and the shot line distance, and the transverse bin size is half of the greatest common divisor of the shooting point distance and the receiving line distance.
[0110] The bin value after determining the key acquisition parameter values of the OBN point distance, the shot point distance, the receiver line distance and the shot line distance is judged whether it meets the bin size range of the spatial sampling without offset aliasing. If the calculated bin value does not meet the bin size range of the spatial sampling without offset aliasing, the key acquisition parameter values of the OBN point distance, the shot point distance, the receiver line distance and the shot line distance are adjusted, the bin value is recalculated until the required bin value is reached. Generally, in the process of adjusting the key acquisition parameter values of the OBN point distance, the shot point distance, the receiver line distance and the shot line distance, other key parameters such as the aspect ratio and the shot record density also need to be considered to achieve the purpose of the optimal design of the observation system.
[0111] The application can calculate the bin parameters of the OBN acquisition of the target area, improve the rationality of the design of the key acquisition parameters such as the OBN point distance, the shot point distance, the receiver line distance and the shot line distance of the OBN acquisition of the target area, and lay a foundation for subsequent analysis work.
[0112] Example 3
[0113] An OBN seismic acquisition is needed for a target area, and an observation system is needed to be designed for the geological characteristics and target layers of the target area. In the design of the observation system, the optimization of the key acquisition parameters is very important. The bin attribute is a very important acquisition parameter in the acquisition design process, which directly affects the imaging effect of the acquisition data.
[0114] According to the exploration purpose of the target area, the main target layer is a certain reservoir. According to the depth domain interpretation results and horizon data of the past acquisition, the interval velocity of the target reservoir is 3825 m / s.
[0115] The bin value of the target layer is calculated to meet the bin size value of the spatial sampling without offset aliasing, and the appropriate bin parameter range is selected. In the seismic acquisition design, the selection of the spatial sampling is mainly based on two theories: one is based on the stacking theory, that is, the spatial sampling is required to meet the aliasing-free frequency; the other is based on the offset theory of the diffraction point, that is, the spatial sampling is required to meet the offset-free frequency. The calculation formula derived from the two theories is:
[0116]
[0117] Wherein, dx represents the spatial sampling interval; v represents the root mean square velocity above the target layer; fmax represents the highest expected frequency; θ represents the stratigraphic dip angle or the migration dip angle.
[0118] Figure 2 A schematic diagram of the bin value calculated according to the stratigraphic dip angle of the target layer according to one embodiment of the application is shown.
[0119] The bin size of a certain target formation meeting the sampling non-misleading frequency is calculated at the highest effective frequency 120Hz and the velocity 3825m / s of the target formation, and then the bin size can be calculated according to the dip angle of the formation in the geological model. Figure 2 The bin value map is calculated according to the dip angle of the target formation, and the size of the bin value map changes with the change of the dip angle. As shown in the figure, in the high and steep fault area, the bin size less than 20m is required to meet the non-misleading frequency requirement of migration.
[0120] According to the number of OBN nodes, the shooting of the air gun, and the integration of the collected data of the area streamer, and other factors, the OBN point distance is 100m, the receiving line distance is 200m, the shooting point distance is 25m, and the shooting line distance is 50m in the designed observation system.
[0121] According to the previous bin calculation method, the bin size of the designed observation system is 100m*12.5m, which is obviously not suitable. According to the improved bin parameter calculation formula:
[0122]
[0123] Among them, B 纵 , B 横 are the longitudinal and transverse bin grid sizes, RI is the OBN point distance, SI is the shooting point distance, RLI is the receiving line distance, SLI is the shooting line distance, and Gcd is the greatest common divisor function. The calculated bin size of the observation system is 25m*12.5m, which is obviously more accurate than the traditional calculation result, but still does not meet the bin size range of spatial sampling non-misleading frequency.
[0124] In order to meet the bin size range of spatial sampling non-misleading frequency less than 20m, the observation system scheme needs to be adjusted, and the OBN point distance is designed to be 100m, the receiving line distance is 225m, the shooting point distance is 25m, and the shooting line distance is 50m. The calculation result is 12.5m*12.5m bin size, which meets the bin size range of spatial sampling non-misleading frequency less than 20m.
[0125] In the OBN acquisition design process, the design of the acquisition scheme is a systematic research result, and there are multiple factors such as coverage times, offset distances, and shot density. The present application has a good reference significance in the basic establishment of certain parameters or the preliminary research, and plays a very important role in the determination of the bin parameters in the OBN acquisition.
[0126] Example 4
[0127] Figure 3 A block diagram of a device for calculating OBN acquisition bins according to an embodiment of the present application is shown.
[0128] As Figure 3 shown, the device for calculating OBN acquisition bin includes:
[0129] The parameter determination module 201 determines the interval velocity parameter of the target layer.
[0130] The range determination module 202 calculates the spatial sampling interval, and further determines the bin parameter range.
[0131] The calculation module 203 determines the key acquisition parameters of the OBN, and calculates the size of the OBN acquisition bin according to the key acquisition parameters.
[0132] The adjustment module 204 adjusts the key acquisition parameters according to the bin parameter range constraint, and outputs the final size of the OBN acquisition bin.
[0133] In one example, calculating the spatial sampling interval and further determining the bin parameter range includes:
[0134] According to the stratigraphic dip in the geological model, the velocity of the stratum and the expected frequency, the value range of the spatial sampling interval bin is calculated, that is, the bin parameter range.
[0135] In one example, the spatial sampling interval is:
[0136]
[0137] Wherein, dx represents the spatial sampling interval, v represents the root mean square velocity above the target layer, f m represents the expected highest frequency, and θ represents the stratigraphic dip or offset dip.
[0138] In one example, the key acquisition parameters of the OBN are determined according to the equipment situation received in the OBN acquisition, the excitation situation and whether to fuse with the streamer acquisition data.
[0139] In one example, the key acquisition parameters include OBN point distance, excitation point distance, receiving line distance and excitation line distance.
[0140] In one example, the size of the OBN acquisition bin is:
[0141]
[0142] Wherein, B 纵 , B 横 is the longitudinal and transverse bin grid size, RI is the OBN point distance, SI is the excitation point distance, RLI is the receiving line distance, SLI is the excitation line distance, and Gcd is the greatest common divisor function.
[0143] In one example, adjusting the key acquisition parameters according to the bin parameter range constraint includes:
[0144] determining whether the size of the OBN acquisition bin calculated according to the key acquisition parameter is within the bin parameter range, and if not, adjusting the key acquisition parameter and recalculating the size of the OBN acquisition bin.
[0145] Example 5
[0146] The embodiment provides an electronic device, which comprises a memory storing executable instructions, and a processor running the executable instructions in the memory to implement the method for calculating an OBN acquisition bin.
[0147] The electronic device according to the embodiment of the present disclosure comprises a memory and a processor.
[0148] The memory is configured to store non-transitory computer-readable instructions. Specifically, the memory can comprise one or more computer program products, which can comprise various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may, for example, comprise random access memory (RAM), cache memory, and / or the like. The non-volatile memory may, for example, comprise read-only memory (ROM), hard disk, flash memory, and / or the like.
[0149] The processor can be a central processing unit (CPU) or other forms of processing units having data processing and / or instruction execution capabilities, and can control other components in the electronic device to perform desired functions. In one embodiment of the present disclosure, the processor is configured to run the computer-readable instructions stored in the memory.
[0150] Those skilled in the art will understand that, in order to solve the technical problem of how to obtain a good user experience effect, the embodiment can also include well-known structures such as a communication bus, an interface, and the like, which should also be included in the protection scope of the present disclosure.
[0151] Detailed descriptions of the embodiment can refer to the corresponding descriptions in the foregoing embodiments, which will not be repeated here.
[0152] Example 6
[0153] The embodiment provides a computer-readable storage medium storing a computer program, which is executed by a processor to implement the method for calculating an OBN acquisition bin.
[0154] The computer-readable storage medium according to the embodiment of the present disclosure stores non-transitory computer-readable instructions. When the non-transitory computer-readable instructions are run by a processor, all or part of the steps of the method according to the embodiments of the present disclosure are executed.
[0155] The computer readable storage medium described above includes, but is not limited to, an optical storage medium (e.g., a CD-ROM and a DVD), a magneto-optical storage medium (e.g., an MO), a magnetic storage medium (e.g., a magnetic tape or a magnetic hard disk), a medium having a built-in rewritable nonvolatile memory (e.g., a memory card), and a medium having a built-in ROM (e.g., a ROM cartridge).
[0156] Those skilled in the art will understand that the above description of the embodiments of the present application is given for the purpose of exemplifying the advantageous effects of the embodiments of the present application and is not intended to limit the embodiments of the present application to any of the examples given.
[0157] The above has described the embodiments of the present application, and the above description is exemplary and is not exhaustive and is not limited to the disclosed embodiments. Many modifications and changes are obvious to those skilled in the art without departing from the scope and spirit of the described embodiments.
Claims
1. A method for calculating OBN acquisition area cells, characterized in that, include: Determine the layer velocity parameters of the target layer; Calculate the spatial sampling interval, and then determine the range of surface element parameters; Determine the key acquisition parameters of OBN, and calculate the size of the OBN acquisition element based on the key acquisition parameters; The key acquisition parameters are adjusted according to the constraints of the area parameter range, and the final size of the OBN acquisition area is output.
2. The method for calculating OBN acquisition area cells according to claim 1, wherein, Calculating the spatial sampling interval, and then determining the range of surface element parameters, includes: Based on the dip angle, velocity, and desired frequency of the strata in the geological model, the value range of the spatial sampling interval surface element is calculated, which is the surface element parameter range.
3. The method for calculating OBN acquisition area cells according to claim 2, wherein, The spatial sampling interval is: Where dx represents the spatial sampling interval, v represents the root mean square velocity above the target layer, and f m The highest frequency is represented by θ, which represents the dip angle or offset dip angle of the formation.
4. The method for calculating OBN acquisition area cells according to claim 1, wherein, Based on the equipment status, excitation status, and whether the data is fused with data acquired by the OBN, the key acquisition parameters of the OBN are determined.
5. The method for calculating OBN acquisition area cells according to claim 1, wherein, The key acquisition parameters include OBN point spacing, excitation point spacing, receiver line spacing, and excitation line spacing.
6. The method for calculating OBN acquisition area cells according to claim 5, wherein, The dimensions of the OBN acquisition element are: Among them, B 纵 B 横 represents the vertical and horizontal grid size, RI represents the OBN point spacing, SI represents the excitation point spacing, RLI represents the receiver line spacing, SLI represents the excitation line spacing, and Gcd represents the greatest common divisor function.
7. The method for calculating OBN acquisition area cells according to claim 1, wherein, Adjusting the key acquisition parameters according to the constraints of the surface element parameter range includes: Determine whether the size of the OBN acquisition element calculated based on the key acquisition parameters is within the range of the element parameters. If not, adjust the key acquisition parameters and recalculate the size of the OBN acquisition element.
8. An apparatus for calculating OBN acquisition elements, characterized in that, include: The parameter determination module determines the layer velocity parameters of the target layer. The range determination module calculates the spatial sampling interval, and then determines the range of surface element parameters; The calculation module determines the key acquisition parameters of the OBN and calculates the size of the OBN acquisition element based on the key acquisition parameters. The adjustment module adjusts the key acquisition parameters according to the range constraints of the surface element parameters, and outputs the final size of the OBN acquisition surface element.
9. An electronic device, characterized in that, The electronic device includes: Memory, which stores executable instructions; A processor that executes the executable instructions in the memory to implement the method for calculating OBN acquisition cells according to any one of claims 1-7.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the method for calculating OBN acquisition cells as described in any one of claims 1-7.