Correcting device for magnetic field induction equipment

Abstract

The invention provides a correction device for magnetic field induction equipment. The correction device comprises a base, a rotating chassis arranged on the base, a first supporting arm and a second supporting arm which are arranged at the two ends of the rotating chassis, a frame pivoted to one end of each of the first supporting arm and the second supporting arm, and carrying discs pivoted to the two sides of the frame. The tray has a clamp to secure the magnetic field sensing device. When being subjected to a plurality of external forces, the rotary chassis is arranged to rotate in the horizontal direction by taking the center of the first surface of the base as a Z axis, the frame is arranged to pivot by taking a connecting line between one ends of the first supporting arm and the second supporting arm as an X axis, and the carrying disc is arranged to pivot by taking the centers of the two sides of the frame as a Y axis, so that the magnetic field induction equipment is corrected.

Description

Technical Field

[0001] This invention relates to a calibration device for a magnetic field sensing device, and to a calibration device for calibrating a magnetic field sensing device by rotating it along three axes. Background Technology

[0002] Magnetic field sensing devices, also known as magnetic force sensors or magnetic field sensors (hereinafter collectively referred to as M sensors), detect changes in the magnetic field in the surrounding environment through magnetically sensitive elements (such as Hall elements, magnetoresistive elements, etc.) inside the M sensor. When a change in the magnetic field is detected, the M sensor converts this physical signal into an electronic signal (such as voltage, current, or digital signal) for processing and analysis. Typically, M sensors are combined with accelerometers (G sensors) or gyroscopes to achieve device orientation by measuring the direction of the Earth's magnetic field. Therefore, there is a need for techniques to calibrate M sensors so that they can accurately measure and report changes in the magnetic field. Summary of the Invention

[0003] The present invention provides a calibration device for a magnetic field sensing device. By placing the M sensor on the carrier plate of the calibration device (located in the middle of the calibration device), the M sensor is rotated in three axes so that the normal direction of the M sensor points to all eight quadrants of three-dimensional space, thereby satisfying the calibration requirements of the M sensor.

[0004] According to a first aspect of the invention, a calibration device is provided for a magnetic field sensing device (M sensor). The calibration device includes a base having a first surface. The calibration device also includes a rotating disk disposed on the first surface of the base, and the rotating disk is configured to rotate horizontally about the center of the first surface of the base as the Z-axis when subjected to an external force. The calibration device also includes a first support arm, with a first end disposed on one side of the rotating disk. The calibration device also includes a second support arm, with a first end disposed on the other side of the rotating disk. The calibration device also includes a frame having a first side, a second side, a third side, and a fourth side. The first and third sides are perpendicular to the second and fourth sides. The centers of the first and third sides are pivotally connected to the second ends of the first and second support arms, respectively, relative to the first end. The frame is configured to pivot about the line connecting the second ends of the first and second support arms as the X-axis when subjected to an external force. The calibration device also includes a carrier plate pivotally connected to the center of the second side and the center of the fourth side of the frame, and the carrier plate is configured to pivot about the Y-axis with respect to the center of the second side and the center of the fourth side of the frame when subjected to external force. The carrier plate includes a clamp for holding the magnetic field sensing device.

[0005] To make the above and other objects, features and advantages of the present invention more apparent and understandable, specific embodiments are described below in conjunction with the accompanying drawings. Attached Figure Description

[0006] Figure 1 A schematic diagram illustrating the calibration requirements of an M sensor according to various embodiments of the present invention is provided.

[0007] Figure 2A A perspective view of an example calibration device for mounting an M sensor on a carrier disk according to various embodiments of the present invention is shown.

[0008] Figure 2B A perspective view illustrating the carrier disk pivoting of an example calibration device for mounting an M sensor on a carrier disk according to various embodiments of the present invention;

[0009] Figure 3A A partially enlarged perspective view of an example calibration device for mounting an M sensor on a carrier disk according to various embodiments of the present invention is shown.

[0010] Figure 3B A partially enlarged perspective view of an example calibration device for mounting another M sensor on a carrier disk according to various embodiments of the present invention is shown.

[0011] Figure 4A and Figure 4B Side views of example correction devices according to various embodiments of the present invention are shown along the Y-axis direction;

[0012] Figure 4C A side view along the X-axis direction is shown for an example correction device according to various embodiments of the present invention;

[0013] Figure 5A A perspective view of an example correction device having a foot-operated rotation mechanism according to various embodiments of the present invention is shown.

[0014] Figure 5B A partially enlarged perspective view of the foot pedal rotation mechanism of an example correction device according to various embodiments of the present invention is shown;

[0015] Figure 6A and Figure 6B A schematic diagram illustrating a table of data calibrated by an example calibration device according to various embodiments of the present invention for calibrating an M sensor.

[0016] In the attached figures, the following labels are used:

[0017] 100: Calibration device;

[0018] 110: Base;

[0019] 110a: First surface;

[0020] 120: Rotating chassis;

[0021] 121: Universal turntable;

[0022] 130a: First support arm;

[0023] 130a1, 130b1: First end;

[0024] 130a2, 130b2: Second end;

[0025] 130b: Second support arm;

[0026] 140: Frame;

[0027] 140a: First side;

[0028] 140b: Second side;

[0029] 140c: Third side;

[0030] 140d: Fourth side;

[0031] 141a: First bearing;

[0032] 141b: Second bearing;

[0033] 141c: Third bearing;

[0034] 141d: Fourth bearing;

[0035] 142a: First convex shaft;

[0036] 142b: Second convex shaft;

[0037] 142c: Third convex shaft;

[0038] 142d: Fourth convex shaft;

[0039] 143a: X-axis pull pin;

[0040] 143b: Y-axis pull pin;

[0041] 150: Carrier disk;

[0042] 151a, 151b: Fixtures;

[0043] 152: Block;

[0044] 160: Foot-operated rotating mechanism;

[0045] 161: Foot pedal;

[0046] 162: Linkage combination;

[0047] 163: Transmission assembly;

[0048] 200:M sensor. Detailed Implementation

[0049] The following provides numerous different embodiments or examples for implementing various features of the provided invention. The embodiments of components and configurations described below are merely examples and are not intended to be limiting. Furthermore, for simplicity and clarity, reference numerals and / or designations are repeated in the examples, and do not in themselves limit the relationships between the various embodiments and / or components discussed.

[0050] The terms "first," "second," etc., used in this article do not specifically refer to order or sequence; they are merely used to distinguish elements or operations described using the same technical terms.

[0051] Figure 1 A schematic diagram illustrating the calibration requirements of an M sensor according to various embodiments of the present invention is provided. Calibration of the magnetic field sensing device (M sensor) is crucial to ensure that the M sensor can accurately measure and report changes in the magnetic field. Therefore, during calibration, the M sensor needs to be rotated in a figure-eight motion in the air, such as... Figure 1 As shown above, the normal direction of the M sensor should be aligned with all eight quadrants of space as much as possible to input the correction command and output a 3×4 matrix (e.g., Figure 1 The correction value generated internally by the chip (as shown in the equation below) is as follows: Figure 1 The calibration value matrix below is shown. Hi_Bias represents the performance of the M sensor under different bias voltages, Data_in is the actual measured value of the chip, and data_comp is the theoretical value of the actual measured value after calibration compensation. To achieve the above objective, the calibration device provided by this invention can fix the M sensor to the carrier disk of the calibration device (located in the middle of the calibration device), allowing the M sensor to rotate along three axes so that the normal direction of the M sensor points to all eight quadrants of three-dimensional space, thus satisfying the calibration requirements of the M sensor. The technology of the calibration device capable of mounting an M sensor provided by this invention will be referred to... Figures 2A to 5B The following is a detailed explanation.

[0052] Figure 2A A perspective view of an example calibration device 100, according to various embodiments of the present invention, wherein the M sensor 200 is mounted on a carrier disk 150, and Figure 2B Draw a three-dimensional diagram showing the carrier disk pivoting at 150 degrees. (Example) Figure 2A As shown, the calibration device 100 includes a base 110 having a first surface 110a. The calibration device 100 also includes a rotating base 120 disposed on the first surface 110a of the base 110. The normal to the center of the rotating base 120 can be used as the Z-axis, and the rotating base is used to rotate horizontally about the center of the first surface 110a of the base 110 as the Z-axis when subjected to an external force (e.g., manually or by other mechanisms).

[0053] The calibration device 100 further includes a first support arm 130a and a second support arm 130b, with the first end 130a1 of the first support arm 130a and the first end 130b1 of the second support arm 130b respectively disposed on both sides of the rotating base 120. The calibration device 100 also includes a frame 140, having a first side 140a, a second side 140b, a third side 140c, and a fourth side 140d. The first side 140a and the third side 140c are perpendicular to the second side 140b and the fourth side 140d. The center of the first side 140a and the center of the third side 140c are respectively pivotally connected to the second end 130a2 of the first support arm 130a relative to the first end 130a1 and the second end 130b2 of the second support arm 130b relative to the first end 130b1. The line connecting the second ends 130a2 of the first support arm 130a and the second ends 130b2 of the second support arm 130b can be used as the X-axis. Frame 140 is used to pivot about the X-axis when subjected to external forces (e.g., manually or by other mechanisms).

[0054] The calibration device 100 also includes a carrier disk 150, pivotally connected to the center of the second side 140b and the center of the fourth side 140d of the frame 140, which can be considered as the Y-axis. The carrier disk 150 is used to pivot about the Y-axis when subjected to external forces (e.g., manual rotation, the weight of the M sensor 200 itself, or rotation by other mechanisms). Figure 2B As shown, the carrier 150, which houses the M sensor 200, can pivot around the Y-axis. As discussed above, the frame can pivot around the X-axis, and rotating the chassis 120 causes the first support arm 130a, the second support arm 130b, the frame 140, and the carrier 150 mounted thereon to rotate around the Z-axis, achieving three-axis rotation of the M sensor. This ensures that the M sensor's normal direction points to all eight quadrants of three-dimensional space, satisfying the M sensor's calibration requirements. Next, refer to... Figures 3A to 4B The present invention describes the design details of a calibration device capable of carrying an M sensor.

[0055] Figure 3AA partially enlarged perspective view of an example calibration device 100, according to various embodiments of the present invention, on a carrier disk 150, is shown. A first side 140a of a frame 140 has a first convex shaft 142a pivotally connected to a first bearing 141a at the second end 130a2 of a first support arm 130a. Correspondingly, a third side 140c of the frame 140 has a third convex shaft 142c pivotally connected to a third bearing 141c at the second end 130b2 of a second support arm 130b. Accordingly, the frame 140 can be pivotally connected and pivotally rotated to the first bearing 141a and the third bearing 141c of the first support arm 130a via the first convex shaft 142a and the third convex shaft 142c, respectively (with the X-axis as the axis).

[0056] The carrier disk 150 has a second bearing 141b and a fourth bearing 141d, which are pivotally connected to a second cam 142b located at the center of the second side 140b of the frame 140 and a fourth cam 142d located at the center of the fourth side 140d, respectively. Accordingly, the carrier disk 150 can pivot on the frame 140 (with the Y-axis as the axis) through the pivotal connection between the second bearing 141b and the fourth bearing 141d and the second cam 142b and the fourth cam 142d of the frame 140. The aforementioned first, second, third, and fourth bearings can be made of ceramic material to reduce friction during pivoting.

[0057] A Y-axis pull pin 143b is also provided on the second side 140b of the carrier 150 and frame 140, adjacent to the second convex shaft 142b. Similarly, an X-axis pull pin 143a is provided between the first side 140a of the frame 140 and the second end 130a2 of the first support arm 130a, adjacent to the first bearing 141a. The Y-axis pull pin 143b can selectively fix the carrier 150 and frame 140, for example by passing through corresponding openings in the carrier 150 and frame 140, to prevent the carrier 150 from pivoting to the frame 140 when pivoting is not required. Similarly, the X-axis pull pin 143a can selectively fix the frame 140 and first support arm 130a, for example by passing through corresponding openings in the frame 140 and first support arm 130a, to prevent the frame 140 from pivoting to the first support arm 130a and second support arm 130b when pivoting is not required. In some embodiments, an X-axis pull pin may also be provided between the frame 140 and the second support arm 130b to fix the frame 140 and the second support arm 130b.

[0058] In some embodiments, to prevent wireless signals from interfering with the M sensor signal, the calibration signal needs to be transmitted via a wired connection. For this purpose, the carrier 150 may be equipped with a connector (not shown) to communicatively connect the M sensor 200 when it is mounted on the carrier. A Y-axis conductive ring (not shown) may be provided on the second bearing 141b between the carrier 150 and the second side 140b of the frame. Similarly, an X-axis conductive ring (not shown) may be provided on the first bearing 141a between the first side 140a of the frame 140 and the second end 130a2 of the first support arm 130a. The connector, the Y-axis conductive ring, and the X-axis conductive ring are electrically connected. Therefore, when the M sensor 200 is mounted on the carrier and connected to the connector, the X-axis conductive ring can be connected to an external device, enabling the magnetic field sensing device to communicate with the external device via a wire when the carrier 150 pivots on the Y-axis and the frame 140 pivots on the X-axis, and the signal communication will not be interrupted during the rotation correction process.

[0059] The carrier 150 may also include clamps 151a and 151b for holding the M sensor 200 on the carrier 150. The carrier 150 may also include multiple stops 152 for fixing the M sensor 200 on the carrier 150. The base 110, rotating base 120, first support arm 130a, second support arm 130b, frame 140, carrier 150, clamps 151a and 151b may be made of aluminum, and the stops may be made of antimagnetic plastic steel (Polyoxymethylene, POM) to avoid magnetic field interference during calibration, which could cause deviation of the M sensor 200.

[0060] Figure 3B A partially enlarged perspective view of an example calibration device 100, according to various embodiments of the present invention, showing the mounting of another M sensor 300 on a carrier disk 150. (See diagram below.) Figure 3B As shown, the carrier 150 can fix different types of M sensor 300 by replacing the aforementioned clamps and stops. Similarly, the clamps 151a and 151b on the carrier 150 can be used to clamp the M sensor 300 on the carrier 150, and the multiple stops 152 on the carrier 150 can be used to fix the M sensor 300 on the carrier 150.

[0061] Figure 4A and Figure 4B A side view along the Y-axis direction is illustrated for an example correction device 100 according to various embodiments of the present invention. (As shown in...) Figure 4A and Figure 4BAs shown, the rotating chassis 120 can be coupled to the first surface 110a of the base 110 via a universal turntable 121, allowing the rotating chassis 120 to rotate horizontally relative to the first surface 110a of the base 110. The universal turntable 121 has a thickness of at least 30 mm, ensuring that the distance between the rotating chassis 120 and the first surface 110a of the base 110 is greater than 30 mm to avoid mutual interference. (Referring to...) Figure 4B Half the distance between the center of the second side 140b and the center of the fourth side 140d of the frame 140, that is, the distance from the geometric center of the frame 140 to the center of the second side 140b and the center of the fourth side 140d, is greater than the distance between the first bearing 141a and the third bearing (not shown in the figure) and the rotating chassis 120 by at least 40 mm, so as to avoid interference between the frame 140 and the rotating chassis 120 when the frame 140 pivots.

[0062] Figure 4C A side view along the X-axis is shown of an example correction device according to several embodiments of the present invention. The distance between the first bearing 141a and the center of the first side 140a of the frame 140 and the distance between the third bearing 141c and the center of the third side 140c of the frame 140 are at least 30 mm to avoid interference between the frame 140 and the first support arm 130a and the second support arm 130b when the frame 140 pivots.

[0063] Figure 5A A perspective view of an example correction device 100 having a foot pedal rotation mechanism 160 according to various embodiments of the present invention is shown. Figure 5B A partially enlarged perspective view of the foot pedal rotation mechanism 160 is shown. (Also referencing...) Figure 5A At Figure 5B In some embodiments, the base 110 may be provided with a foot pedal rotation mechanism 160 on the opposite side of the first surface 110a to provide external force to the rotating chassis 120 (or the universal turntable 121) so that it rotates about the Z-axis. The foot pedal rotation mechanism 160 may have a foot pedal 161, a linkage assembly 162, and a transmission assembly 163. The two ends of the linkage assembly 162 are respectively coupled to the foot pedal 161 and the transmission assembly 163, and the transmission assembly 163 is coupled to the universal turntable 121. When the foot pedal is subjected to external force (e.g., when an operator presses down the foot pedal), the foot pedal rotation mechanism causes the linkage assembly 162 and the transmission assembly 163 to drive the universal turntable 121 and the rotating chassis 120 to rotate horizontally about the center of the first surface 110 of the base 110 as the Z-axis. The transmission assembly 163 may include a plurality of gears coupled to each other and rotatable from the axis of the universal turntable 121.

[0064] Figure 6A and Figure 6BA schematic diagram illustrating a table of data calibrated by an example calibration device according to various embodiments of the present invention for calibrating an M sensor. Figure 6A and Figure 6B In the table, Golden_Yaw represents the sampled yaw angle measurement, DUT_Yaw represents the actual calibrated yaw angle measurement, and Yaw_offset represents the difference between the measured and sampled values, which must be within positive and negative values ​​to meet calibration requirements. CPK in the table represents the degree to which the test process's performance meets the M sensor quality standard requirements (specification range, etc.). It represents the actual operational capability of the test procedure under controlled (steady-state) conditions for a certain period. The calculation of CPK in the table is to confirm whether the measured value is within the intermediate value of the specification (SPEC). Figure 6A and Figure 6B As shown in the table, the average CPK in the M sensor calibration and certification (Verify) data is around 1.1, while the false positive rate is around 3.3% (standard <5%), which meets the calibration requirements of the M sensor.

[0065] Through the aforementioned embodiments, the calibration device provided by this invention achieves the effect of simultaneous rotation of the M Sensor, fixed to the carrier plate of the calibration device, along three axes (X / Y / Z axes), thus pointing to eight quadrants in three-dimensional space. Furthermore, by using antimagnetic materials such as aluminum, ceramic, and POM, magnetic field interference can be prevented. Moreover, a conductive ring is provided between the carrier plate, frame, and support arm, forming an electrically connected circuit with the connector on the carrier plate, ensuring uninterrupted signal communication between the M Sensor and the external environment during the three-axis rotation. The calibration device provided by this invention is applicable to the calibration of M sensors in various communication products, possessing advantages such as flexibility, ease of operation, small size, and high efficiency, facilitating convenient calibration operations for products with M sensors. Furthermore, by changing the components on the carrier plate, it can be used with products of different shapes.

[0066] The above description provides different features for implementing some embodiments or examples of the present invention. Specific examples of components and configurations described above (e.g., mentioned values ​​or names) are used to simplify / illustrate some embodiments of the invention. Of course, these components and configurations are merely examples and are not intended to be limiting. Furthermore, reference numerals and / or letters may be repeated in various instances of some embodiments of the invention. This repetition is for simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or configurations discussed.

[0067] Although the present invention has been disclosed above with reference to embodiments, it is not intended to limit the present invention. Those skilled in the art to which this invention pertains may make some modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended patent claims.

Claims

1. A calibration device for a magnetic field sensing device, characterized in that, include: A base having a first surface; A rotating chassis is disposed on the first surface of the base, and the rotating chassis is configured to rotate horizontally about the center of the first surface of the base as the Z-axis when subjected to an external force. A first support arm, with a first end of the first support arm disposed on one side of the rotating chassis; A second support arm, with a first end of the second support arm disposed on the other side of the rotating chassis; A frame having a first side, a second side, a third side and a fourth side, wherein the first side and the third side are perpendicular to the second side and the fourth side, wherein the center of the first side and the center of the third side are respectively pivotally connected to a second end of a first support arm relative to the first end and a second end of a second support arm relative to the first end, and the frame is configured to pivot about the X-axis with respect to the line connecting the second ends of the first support arm and the second end of the second support arm when subjected to an external force; A carrier disk is pivotally connected to the center of the second side and the center of the fourth side of the frame, and the carrier disk is configured to pivot about the center of the second side and the center of the fourth side of the frame as a Y-axis when subjected to an external force, wherein the carrier disk includes a clamp for holding the magnetic field sensing device.

2. The calibration device as described in claim 1, characterized in that, The rotating chassis is coupled to the first surface of the base via a universal turntable. The first side of the frame has a first convex shaft pivotally connected to a first bearing at the second end of the first support arm. The third side of the frame has a third convex shaft pivotally connected to a third bearing at the second end of the second support arm. The carrier disk has a second bearing and a fourth bearing, which are respectively pivotally connected to a second convex shaft located at the center of the second side of the frame and a fourth convex shaft located at the center of the fourth side.

3. The calibration device as described in claim 2, characterized in that, The carrier is provided with a connector, and a Y-axis conductive ring is provided on the second bearing between the carrier and the second side of the frame, and an X-axis conductive ring is provided on the first bearing between the first side of the frame and the second end of the first support arm. The connector, the Y-axis conductive ring, and the X-axis conductive ring are electrically connected.

4. The calibration device as described in claim 3, characterized in that, The connector is communicatively connected to the magnetic field sensing device, and the X-axis conductive ring is communicatively connected to an external device, enabling the magnetic field sensing device to communicate with the external device via a wire when the carrier plate pivots on the Y-axis and the frame pivots on the X-axis.

5. The calibration device as described in claim 2, characterized in that, The first bearing, the second bearing, the third bearing, and the fourth bearing are made of ceramic material.

6. The calibration device as described in claim 2, characterized in that, The base is equipped with a foot-operated rotating mechanism on the opposite side of the first surface. The foot-operated rotation mechanism includes a foot pedal, a linkage assembly, and a transmission assembly. One end of the linkage assembly is coupled to the foot pedal, and the other end is coupled to the transmission assembly. The transmission assembly is coupled to the universal turntable. When the foot pedal is subjected to an external force, the foot pedal rotation mechanism drives the linkage assembly and the transmission assembly to drive the universal turntable and the rotating chassis to rotate horizontally about the center of the first surface of the base as the Z-axis.

7. The calibration device as described in claim 2, characterized in that, A Y-axis pull pin is provided on the second side of the carrier and the frame adjacent to the second convex shaft, and an X-axis pull pin is provided between the first side of the frame and the second end of the first support arm adjacent to the first bearing. The Y-axis pull pin can selectively fix the carrier and the frame to prevent the carrier from pivoting on the frame, and the X-axis pull pin can selectively fix the frame and the first support arm to prevent the frame from pivoting on the first support arm and the second support arm.

8. The calibration device as described in claim 2, characterized in that, Half the distance between the center of the second side and the center of the fourth side of the frame is greater than the distance between the first bearing and the third bearing and the rotating chassis by at least 40 mm. The thickness of the universal turntable is at least 30mm, such that the distance between the rotating base and the first surface of the base is greater than 30mm. The distance between the first bearing and the center of the first side of the frame and the distance between the third bearing and the center of the third side of the frame are at least 30 mm.

9. The calibration device as described in claim 1, characterized in that, The base, the rotating chassis, the first support arm, the second support arm, the frame, the carrier plate, and the clamp are made of aluminum.

10. The calibration device as claimed in claim 1, characterized in that, The carrier plate also includes multiple blocks for fixing the magnetic field sensing device, and these blocks are made of anti-magnetic plastic steel.

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