Method and device for determining model of nanocrystalline common mode choke

Abstract

The invention provides a method and a device for determining a model of a nanocrystalline common-mode inductor. The method comprises the following steps: acquiring a first curve and a second curve which are obtained by actually measuring common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve represents the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve represents the relationship between the impedance value of the differential-mode impedance and the frequency; fitting the first curve through two groups of RLC parallel units to obtain a common-mode impedance equivalent model; according to the common-mode impedance equivalent model, determining a mutual inductance model between windings of the nanocrystalline common-mode inductor; and fitting the second curve according to a mutual inductance model to obtain an equivalent model of the nanocrystalline common mode inductor. According to the method, the differential-mode impedance and the common-mode impedance in the nanocrystalline common-mode inductor are considered at the same time, so that the determination accuracy of the model is improved.

Description

Technical Field

[0001] This invention relates to the field of electronic technology, and specifically to a method and apparatus for determining the model of a nanocrystalline common-mode inductor. Background Technology

[0002] Currently, in order to accurately assess the CE (conducted emission) performance of electronic products and analyze the formation mechanism of CE problems, it is necessary to perform electromagnetic compatibility (EMC) modeling on electronic products.

[0003] Nanocrystalline materials, with their high relative permeability, can achieve higher inductance for the same number of turns, making them widely used as cores for EMC common-mode inductors. However, current simulation modeling of nanocrystalline common-mode inductors often fails to consider the frequency-dependent permeability variation of the nanocrystalline core, leading to poor model accuracy. Furthermore, current simulation models for nanocrystalline common-mode inductors typically only consider common-mode or differential-mode impedance, rarely taking into account both. This results in models that cannot accurately describe the actual nanocrystalline common-mode inductor. Summary of the Invention

[0004] In view of this, embodiments of the present invention aim to provide a method, apparatus, storage medium, and electronic device for determining the model of a nanocrystalline common-mode inductor, in order to solve the problem that the models constructed in the prior art cannot accurately describe the actual nanocrystalline common-mode inductor.

[0005] This invention provides a method for determining the model of a nanocrystalline common-mode inductor, comprising:

[0006] A first curve and a second curve are obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve characterizes the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve characterizes the relationship between the impedance value of the differential-mode impedance and the frequency.

[0007] The first curve is fitted by two sets of parallel RLC units to obtain the common-mode impedance equivalent model;

[0008] Based on the common-mode impedance equivalent model, the mutual inductance model between the windings of the nanocrystalline common-mode inductor is determined.

[0009] The second curve is fitted according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor.

[0010] In one embodiment, fitting the first curve using two sets of parallel RLC units to obtain the common-mode impedance equivalent model includes:

[0011] The initial common-mode impedance model is obtained by fitting the first curve with a set of initial RLC parallel units;

[0012] The impedance value of the initial common-mode impedance model is attenuated to obtain the first common-mode impedance model;

[0013] The impedance difference curve is obtained by calculating the difference between the actual impedance value in the first curve and the absolute impedance value in the first common-mode impedance model. The impedance difference curve is the relationship curve between the difference between the actual impedance value and the absolute impedance value in the first common-mode impedance model and the frequency.

[0014] The impedance difference curve is fitted by a set of compensated RLC parallel units to obtain the second common-mode impedance model;

[0015] The equivalent model of the common-mode impedance is determined based on the first common-mode impedance model and the second common-mode impedance model.

[0016] In one embodiment, fitting the first curve with a set of initial RLC parallel units to obtain an initial common-mode impedance model includes:

[0017] The maximum impedance value in the first curve is determined as the first impedance value, and the frequency corresponding to the first impedance value is determined as the first frequency. Based on the first impedance value, the first resistance value corresponding to the initial RLC parallel unit is calculated.

[0018] The center frequency between the first frequency and the maximum frequency in the first curve is determined as the second frequency, and the second impedance value corresponding to the second frequency is determined in the first curve. Based on the second frequency and the second impedance value, the first capacitance value corresponding to the initial RLC parallel unit is calculated.

[0019] Calculate the first inductance value based on the first frequency and the first capacitance value;

[0020] The initial common-mode impedance model is determined based on the initial RLC parallel unit, the first resistance value, the first inductance value, and the first capacitance value.

[0021] In one embodiment, the attenuation process performed on the impedance value of the initial common-mode impedance model to obtain a first common-mode impedance model includes:

[0022] The first capacitance value, the first resistance value, and the first inductance value are attenuated according to a preset ratio to obtain the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0023] The first common-mode impedance model is determined based on the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0024] In one embodiment, fitting the impedance difference curve using a set of compensated RLC parallel units to obtain a second common-mode impedance model includes:

[0025] The maximum impedance value in the impedance difference curve is determined as the third impedance value, the frequency corresponding to the third impedance value is determined as the third frequency, and the second resistance value corresponding to the compensated RLC parallel unit is calculated based on the third impedance value.

[0026] The center frequency between the third frequency and the maximum frequency in the impedance difference curve is determined as the fourth frequency, and the fourth impedance value corresponding to the fourth frequency is determined in the impedance difference curve. Based on the fourth frequency and the fourth impedance value, the second capacitance value corresponding to the compensation RLC parallel unit is calculated.

[0027] The minimum frequency in the impedance difference curve is determined as the fifth frequency, and the fifth impedance value corresponding to the fifth frequency is determined in the impedance difference curve. Based on the fifth frequency and the fifth impedance value, the second inductance value corresponding to the compensated RLC parallel unit is calculated.

[0028] The second common-mode impedance model is determined based on the compensated RLC parallel unit, the second resistance value, the second inductance value, and the second capacitance value.

[0029] In one embodiment, the mutual inductance model includes multiple windings, each of the multiple windings includes the common-mode impedance equivalent model, and adjacent windings of the multiple windings are connected by differential-mode resistors and differential-mode capacitors.

[0030] In one embodiment, fitting the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor includes:

[0031] Based on the second curve, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor;

[0032] Based on the third resistance value, the third capacitance value, and the mutual inductance model, the equivalent model of the nanocrystalline common-mode inductor is determined.

[0033] In one embodiment, determining the third resistance value of the differential-mode resistor and the third capacitance value of the differential-mode capacitor based on the second curve includes:

[0034] The maximum impedance value in the second curve is determined as the sixth impedance value, and the frequency corresponding to the sixth impedance value is determined as the sixth frequency.

[0035] The center frequency between the sixth frequency and the minimum frequency in the second curve is determined as the seventh frequency, and the seventh impedance value corresponding to the seventh frequency is determined in the second curve.

[0036] Calculate the leakage inductance value of the mutual inductance model based on the seventh frequency and the seventh impedance value;

[0037] Based on the leakage inductance value, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor.

[0038] In one embodiment, determining the third resistance value of the differential-mode resistor and the third capacitance value of the differential-mode capacitor based on the leakage inductance value includes:

[0039] The third capacitance value is calculated based on the leakage inductance value and the sixth frequency;

[0040] The third resistance value is calculated based on the sixth impedance value.

[0041] Another aspect of the present invention provides a model determination apparatus for a nanocrystalline common-mode inductor, the apparatus comprising:

[0042] The acquisition module is used to acquire a first curve and a second curve obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve represents the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve represents the relationship between the impedance value of the differential-mode impedance and the frequency.

[0043] The first fitting module is used to fit the first curve using two sets of parallel RLC units to obtain a common-mode impedance equivalent model.

[0044] The determination module is used to determine the mutual inductance model between the windings of the nanocrystalline common-mode inductor based on the common-mode impedance equivalent model.

[0045] The second fitting module is used to fit the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common mode inductor.

[0046] Compared with related technologies, the method for determining the model of nanocrystalline common-mode inductors provided by this invention has the following advantages:

[0047] The method for determining the model of a nanocrystalline common-mode inductor provided by this invention includes: obtaining a first curve and a second curve obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve characterizes the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve characterizes the relationship between the impedance value of the differential-mode impedance and the frequency; then, fitting the first curve with two sets of parallel RLC units to obtain an equivalent model of the common-mode impedance; then, determining the mutual inductance model between the windings of the nanocrystalline common-mode inductor based on the equivalent model of the common-mode impedance; finally, fitting the second curve with the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor. In other words, by fitting the first curve corresponding to the common-mode impedance and the second curve corresponding to the differential-mode impedance to obtain the equivalent model of the nanocrystalline common-mode inductor, it can be ensured that the equivalent model simultaneously considers the common-mode and differential-mode impedances of the nanocrystalline common-mode inductor, thereby ensuring that the constructed equivalent model can accurately describe the actual nanocrystalline common-mode inductor. Attached Figure Description

[0048] Figure 1 The diagram shown illustrates the variation of inductance of inductors with different magnetic core materials as a function of frequency, according to an embodiment of the present invention.

[0049] Figure 2 The diagram shown is a flowchart illustrating a method for determining the model of a nanocrystalline common-mode inductor according to an embodiment of the present invention.

[0050] Figure 3 The diagram shown is a schematic diagram of the common-mode impedance test configuration provided in an embodiment of the present invention.

[0051] Figure 4 The diagram shown is a schematic diagram of the differential mode impedance test configuration provided in an embodiment of the present invention.

[0052] Figure 5 The figure shown is a schematic diagram of the first curve provided in an embodiment of the present invention.

[0053] Figure 6 The diagram shown is a schematic diagram of the structure of an initial RLC parallel unit provided in an embodiment of the present invention.

[0054] Figure 7 The diagram shown is a schematic representation of a first curve provided in another embodiment of the present invention.

[0055] Figure 8 The diagram shown is a schematic diagram of the first curve provided in another embodiment of the present invention.

[0056] Figure 9 The figure shown is a curve comparison diagram provided by an embodiment of the present invention.

[0057] Figure 10 The figure shown is a schematic diagram of the impedance difference curve provided in an embodiment of the present invention.

[0058] Figure 11 The figure shown is a schematic diagram of the impedance difference curve provided in another embodiment of the present invention.

[0059] Figure 12 The figure shown is a schematic diagram of the impedance difference curve provided in another embodiment of the present invention.

[0060] Figure 13 The figure shown is a schematic diagram of the impedance difference curve provided in another embodiment of the present invention.

[0061] Figure 14 The diagram shown is a structural schematic of the common-mode impedance equivalent model provided in an embodiment of the present invention.

[0062] Figure 15 The figure shown is a curve comparison diagram provided by another embodiment of the present invention.

[0063] Figure 16 The figure shown is a three-dimensional model schematic diagram of a nanocrystalline common-mode inductor provided in an embodiment of the present invention.

[0064] Figure 17 The diagram shown is a structural schematic of a mutual inductance model provided in an embodiment of the present invention.

[0065] Figure 18 The figure shown is a schematic diagram of the second curve provided in an embodiment of the present invention.

[0066] Figure 19 The diagram shown is a schematic representation of a second curve provided in another embodiment of the present invention.

[0067] Figure 20 The figure shown is a curve comparison diagram provided by another embodiment of the present invention.

[0068] Figure 21 The diagram shown is a schematic block diagram of a model determination device for nanocrystalline common-mode inductors provided in an embodiment of the present invention.

[0069] Figure 22 The diagram shown is a block diagram of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0070] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0071] Nanocrystalline materials have high relative permeability, and can achieve higher inductance with the same number of turns, and are widely used as magnetic cores for EMC common mode inductors.

[0072] like Figure 1 As shown, compared to other materials (such as iron-silicon-aluminum, nickel-zinc, etc.), the relative permeability of nanocrystalline materials decays rapidly with frequency at around 150kHz. The common-mode inductance of nanocrystalline magnetic cores varies greatly in the low-frequency range. Therefore, a simple inductance model cannot accurately describe its impedance.

[0073] In related technologies, when constructing simulation models for nanocrystalline common-mode inductors, the variation of the permeability of the nanocrystalline core with frequency is often ignored, which leads to poor model accuracy. Models usually only consider common-mode or differential-mode impedance, and there are very few models that take into account both common-mode and differential-mode impedance. Since common-mode inductors have a large number of turns, the parasitic capacitance between different windings and between different turns of the same coil cannot be ignored, which results in the constructed model being unable to accurately describe the actual nanocrystalline common-mode inductor.

[0074] In view of the above problems, one embodiment of the present invention provides a method for determining the model of a nanocrystalline common-mode inductor, which can be executed by a computer device (e.g., a server or a user terminal). Figure 2 As shown, the method for determining the model of this nanocrystalline common-mode inductor may include:

[0075] 210. Obtain the first curve and the second curve obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve characterizes the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve characterizes the relationship between the impedance value of the differential-mode impedance and the frequency.

[0076] In some implementations, the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor can be measured using an impedance analyzer to obtain the common-mode impedance values ​​at multiple frequencies and the differential-mode impedance values ​​at multiple frequencies. A first curve can then be generated based on the common-mode impedance values ​​at multiple frequencies, and a second curve can be generated based on the differential-mode impedance values ​​at multiple frequencies.

[0077] For example, when testing the common-mode impedance and differential-mode impedance of a nanocrystalline common-mode inductor using an impedance analyzer, the test frequency band can be 100kHz-30MHz, and the test is performed using a logarithmic scan method.

[0078] As an example, the test configuration for common-mode impedance can be as follows: Figure 3 As shown, the test configuration for differential-mode impedance can be as follows: Figure 4 As shown.

[0079] 220. By fitting the first curve with two sets of parallel RLC units, the equivalent model of common-mode impedance is obtained.

[0080] In some implementations, the specific implementation of fitting the first curve to obtain the common-mode impedance equivalent model by two sets of parallel RLC units in step 220 may include:

[0081] 221. The initial common-mode impedance model is obtained by fitting the first curve with a set of initial RLC parallel units.

[0082] In some implementations, in step 221, fitting the first curve with a set of initial RLC parallel units to obtain the initial common-mode impedance model may include:

[0083] A1. Determine the maximum impedance value in the first curve as the first impedance value, and determine the frequency corresponding to the first impedance value as the first frequency. Calculate the first resistance value corresponding to the initial RLC parallel unit based on the first impedance value.

[0084] For example, the first curve can be as follows Figure 5 As shown, in Figure 5 In the figure, the horizontal axis represents the frequency f, and the vertical axis represents Zcm. Both the horizontal and vertical axes in the first curve can be represented using logarithmic coordinates.

[0085] Among them, such as Figure 6 As shown, the initial RLC parallel unit may include a first resistor, a first inductor, and a first capacitor. The first resistor may be connected in parallel with the first inductor, and the first capacitor may be connected in parallel with the first inductor.

[0086] Wherein, the first resistance value of the first resistor is R, the first capacitance value of the first capacitor is C, and the first inductance value of the first inductor is L.

[0087] like Figure 7 As shown, the maximum impedance value in the first curve can be determined as the first impedance value Z. r The frequency corresponding to the first impedance value Zr is determined as the first frequency f. r .

[0088] Then, the first resistance value R is calculated using the following formula:

[0089] R = Z r

[0090] A2. Determine the center frequency between the first frequency and the maximum frequency in the first curve as the second frequency, and determine the second impedance value corresponding to the second frequency in the first curve. Calculate the first capacitance value corresponding to the initial RLC parallel unit based on the second frequency and the second impedance value.

[0091] For example, such as Figure 8As shown, the center frequency between the first frequency and the maximum frequency in the first curve can be determined as the second frequency f1, and the second impedance value Z1 corresponding to the second frequency can be determined in the first curve.

[0092] Then, based on the second frequency and the second impedance value, the first capacitance value C corresponding to the initial RLC parallel unit can be calculated using the following formula:

[0093]

[0094] It is understandable that, such as Figure 8 As shown, in the first curve, the curve between the second frequency and the maximum frequency is roughly a straight line, and the impedance of this straight line part is basically determined by the first capacitor. Therefore, by taking the second frequency f1 and the second impedance value Z1 corresponding to the center point on this straight line, the first capacitor value C can be accurately calculated.

[0095] A3. Calculate the first inductance value based on the first frequency and the first capacitance value.

[0096] Continuing with the example above, based on the first frequency f r Given the first capacitance value C, the first inductance value L can be calculated using the following formula:

[0097]

[0098] A4. Determine the initial common-mode impedance model based on the initial RLC parallel unit, the first resistance value, the first inductance value, and the first capacitance value.

[0099] It can be seen that after determining the first resistance value R, the first capacitance value C, and the first inductance value L, all the parameters of the initial RLC parallel unit can be obtained. Thus, the initial RLC parallel unit after determining the first resistance value R, the first capacitance value C, and the first inductance value L can be used as the initial common-mode impedance model.

[0100] After determining the first resistance value R, the first capacitance value C, and the first inductance value L, the impedance value of the initial common-mode impedance model can be calculated using the following formula based on the first resistance value R, the first capacitance value C, and the first inductance value L.

[0101]

[0102] Where i is an imaginary number.

[0103] As an example, such as Figure 9 As shown, the impedance value Z of the initial common-mode impedance model calculated above can be compared with the actual measured impedance value Zcm.

[0104] according to Figure 9It can be seen that the two impedance curves are at the resonant frequency (i.e., the first frequency f). r The fitting is better after the resonant point, but worse before the resonant point. This is because the impedance before the resonant point is mainly determined by the common-mode inductance. Since the permeability of the nanocrystalline core decreases with frequency, its inductance also decreases with frequency, resulting in a decrease in inductance with frequency. This change cannot be fitted by a single inductor. Therefore, in this embodiment, an additional compensated RLC parallel unit can be used to compensate for the low-frequency difference, thereby ensuring the accuracy of the common-mode impedance equivalent model.

[0105] 222. The impedance value of the initial common-mode impedance model is attenuated to obtain the first common-mode impedance model.

[0106] In some implementations, the attenuation process performed on the impedance value of the initial common-mode impedance model in step 222 to obtain the first common-mode impedance model may include:

[0107] The first capacitance value, the first resistance value, and the first inductance value are attenuated according to a preset ratio to obtain the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0108] The first common-mode impedance model is determined based on the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0109] For example, the preset ratio can be K, the first capacitance value after attenuation can be C1, the first resistance value after attenuation can be R1, and the first inductance value after attenuation can be L1. Optionally, the preset ratio K can be customized according to actual needs. For example, K can usually be between 0.5 and 0.8.

[0110] The attenuated first capacitance value C1 can be calculated using the following formula:

[0111]

[0112] The attenuated first inductance value L1 can be calculated using the following formula:

[0113] L1 = KL

[0114] The first resistance value R1 after attenuation can be calculated using the following formula:

[0115] R1 = KR

[0116] Then, the first resistance value R, the first capacitance value C, and the first inductance value L are replaced with the attenuated first capacitance value C1, the attenuated first inductance value L1, and the attenuated first inductance value L1 in the initial common-mode impedance model, thereby obtaining the first common-mode impedance model.

[0117] 223. Calculate the difference between the actual impedance value in the first curve and the absolute impedance value in the first common-mode impedance model to obtain the impedance difference curve. The impedance difference curve is the relationship curve between the difference between the actual impedance value and the absolute impedance value in the first common-mode impedance model and the frequency.

[0118] Following the example above, after obtaining the attenuated first capacitance value C1, the attenuated first inductance value L1, and the attenuated first resistance value R1, the impedance value Z1 of the first common-mode impedance model can be calculated using the following formula:

[0119]

[0120] Then, the difference ΔZ between the actual impedance value Zcm of the common-mode impedance and the amplitude of the impedance value Z1 of the first common-mode impedance model can be calculated using the following formula:

[0121] ΔZ=Z cm ―|Z1|

[0122] Optionally, in the process of calculating the difference between the actual impedance value in the first curve and the absolute impedance value in the first common-mode impedance model to obtain the impedance difference curve, the preset ratio K can be adjusted to make the ΔZ curve smooth and have only one peak.

[0123] Following the example above, the impedance difference curve obtained from the difference ΔZ can be as follows: Figure 10 As shown, in Figure 10 In the figure, the vertical axis represents the difference ΔZ, and the horizontal axis represents the frequency f.

[0124] 224. By fitting the impedance difference curve with a set of compensated RLC parallel units, the second common-mode impedance model is obtained.

[0125] In some implementations, the specific implementation of fitting the impedance difference curve using a set of compensated RLC parallel units in step 224 to obtain the second common-mode impedance model may include:

[0126] B1. Determine the maximum impedance value in the impedance difference curve as the third impedance value, and determine the frequency corresponding to the third impedance value as the third frequency. Based on the third impedance value, calculate the second resistance value corresponding to the compensation RLC parallel unit.

[0127] The structure of the compensation RLC parallel unit can be the same as that of the initial RLC parallel unit. The compensation RLC parallel unit may include a second resistor, a second capacitor, and a second inductor. The second resistance value of the second resistor is R0, the second capacitance value of the second capacitor is C0, and the second inductance value of the second inductor is L0.

[0128] Following the example above, such as Figure 11 As shown, the maximum impedance value Z in the impedance difference curve can be represented. max The value is determined as the third impedance value, and then the third impedance value Z is determined using the following formula. max Calculate the second resistance value R0 corresponding to the compensated RLC parallel unit:

[0129] R0 = Z max

[0130] B2. Determine the center frequency between the third frequency and the maximum frequency in the impedance difference curve as the fourth frequency, and determine the fourth impedance value corresponding to the fourth frequency in the impedance difference curve. Calculate the second capacitance value corresponding to the compensation RLC parallel unit based on the fourth frequency and the fourth impedance value.

[0131] Following the example above, such as Figure 12 As shown, the center frequency between the third frequency and the maximum frequency in the impedance difference curve is determined as the fourth frequency f3, and the fourth impedance value Z3 corresponding to the fourth frequency f3 is determined in the impedance difference curve. Then, based on the fourth frequency f3 and the fourth impedance value Z3, the second capacitance value C0 corresponding to the compensated RLC parallel unit is calculated using the following formula:

[0132]

[0133] B3. Determine the minimum frequency in the impedance difference curve as the fifth frequency, and determine the fifth impedance value corresponding to the fifth frequency in the impedance difference curve. Calculate the second inductance value corresponding to the compensation RLC parallel unit based on the fifth frequency and the fifth impedance value.

[0134] Following the example above, such as Figure 13 As shown, the minimum frequency in the impedance difference curve can be determined as the fifth frequency f2, and the fifth impedance value Z2 corresponding to the fifth frequency f2 can be determined in the impedance difference curve. Then, based on the fifth frequency f2 and the fifth impedance value Z2, the second inductance value L0 corresponding to the compensation RLC parallel unit is calculated using the following formula:

[0135]

[0136] B4. Determine the second common-mode impedance model based on the compensated RLC parallel unit, the second resistance value, the second inductance value, and the second capacitance value.

[0137] It can be seen that after determining the second resistance value R0, the second capacitance value C0, and the second inductance value L0, all the parameters of the compensated RLC parallel unit can be obtained. Thus, the compensated RLC parallel unit with the second resistance value R0, the second capacitance value C0, and the second inductance value L0 determined can be used as the second common-mode impedance model.

[0138] The expression for the impedance value Z0 of the second common-mode impedance model can be given as follows:

[0139]

[0140] 225. Based on the first common-mode impedance model and the second common-mode impedance model, determine the equivalent model of the common-mode impedance.

[0141] For example, the impedance value Z1 of the first common-mode impedance model and the impedance value Z0 of the second common-mode impedance model can be added together to obtain the impedance value Z5 of the common-mode impedance equivalent model, thereby determining the common-mode impedance equivalent model.

[0142] The expression for the impedance value Z5 in the common-mode impedance equivalent model can be given as follows:

[0143] Z5 = Z0 + Z1

[0144] For example, the structure of the common-mode impedance equivalent model can be as follows: Figure 14 As shown, the first common-mode impedance model and the second common-mode impedance model can be connected in series to obtain the equivalent common-mode impedance model.

[0145] For example, such as Figure 15 As shown, the impedance value Z5 of the calculated common-mode impedance equivalent model can be compared with the actual measured impedance value Zcm. According to... Figure 15 It can be seen that the impedance value Z5 curve of the common-mode impedance equivalent model is basically consistent with the first curve, thus confirming that the common-mode impedance equivalent model after compensation can accurately describe the actual common-mode impedance of the nanocrystalline common-mode inductor.

[0146] 230. Based on the common-mode impedance equivalent model, determine the mutual inductance model between the windings of the nanocrystalline common-mode inductor.

[0147] In some implementations, the mutual inductance model includes multiple windings, each of which includes a common-mode impedance equivalent model, and adjacent windings are connected by differential-mode resistors and differential-mode capacitors.

[0148] For example, in practical applications, nanocrystalline common-mode inductors can be used as follows: Figure 16 As shown, a nanocrystalline common-mode inductor can include multiple windings. In this embodiment, the equivalent common-mode impedance model can be assigned to each winding.

[0149] For example, such as Figure 17 As shown, taking a two-wire common-mode inductor as an example, two adjacent windings of a two-wire common-mode inductor can be connected by a differential-mode resistor and a differential-mode capacitor. The second common-mode impedance model of the two adjacent windings is different from that of the second inductance L. 01 The interaction will form mutual inductance M 01 The first common-mode impedance model in the two windings is due to the first inductance L 11 The interaction will form mutual inductance M 11 The leakage inductance value of the mutual inductance model can be expressed as (L... 01 -M 01 )+(L 11 -M 11 ).

[0150] in, Figure 17 The second capacitance value C 01 Can be with Figure 14 The second capacitance value C0 in the figure can satisfy the following relationship:

[0151]

[0152] in, Figure 17 The first capacitance value C in 11 Can be with Figure 14 The first capacitance value C1 in the circuit can satisfy the following relationship:

[0153]

[0154] in, Figure 17 The second resistance value R in 01 Can be with Figure 14 The second resistance value R0 in the equation can satisfy the following relationship:

[0155] R 01 =2R0

[0156] in, Figure 17 The first resistance value R in 11 Can be with Figure 14 The first resistance value R1 in the circuit can satisfy the following relationship:

[0157] R 11 =2R1

[0158] 240. Fit the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common mode inductor.

[0159] In some embodiments, specific implementations of fitting the second curve to obtain the equivalent model of the nanocrystalline common-mode inductor in step 240 may include:

[0160] 241. Based on the second curve, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor.

[0161] In some embodiments, the specific implementation of determining the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor based on the second curve in step 241 may include:

[0162] C1. Determine the maximum impedance value in the second curve as the sixth impedance value, and determine the frequency corresponding to the sixth impedance value as the sixth frequency.

[0163] C2. Determine the center frequency between the sixth frequency and the minimum frequency in the second curve as the seventh frequency, and determine the seventh impedance value corresponding to the seventh frequency in the second curve.

[0164] C3. Calculate the leakage inductance value of the mutual inductance model based on the seventh frequency and the seventh impedance value.

[0165] For example, the second curve can be as follows Figure 18 As shown, the horizontal axis of the second curve represents frequency, and the vertical axis represents the differential-mode impedance value Zdm. Figure 18 As shown, in practical applications, the maximum impedance value Z in the second curve can be... rdm The sixth impedance value was determined, and the sixth impedance value Z was set. rdm The corresponding frequency f rdm It has been determined to be the sixth frequency.

[0166] like Figure 19 As shown, the sixth frequency f can be... rdm The center frequency f4 between the minimum frequency in the second curve is determined as the seventh frequency, and the seventh impedance value Z4 corresponding to the seventh frequency f4 is determined in the second curve.

[0167] After determining the seventh frequency f4 and the seventh impedance Z4, the leakage inductance L of the mutual inductance model can be calculated using the following formula. dm :

[0168]

[0169] Then, according to Figure 14 The first capacitance value C1 and the second capacitance value C0 will reduce the leakage inductance value L. dm Assigned to two RLC units in the mutual inductance model. For example, in Figure 17 The mutual inductance value L of the first inductor in the first common-mode impedance model d1 The expression can be as follows:

[0170]

[0171] Following the example above, in Figure 17 The mutual inductance value L of the second inductor in the second common-mode impedance model d0 The expression can be as follows:

[0172] L d0 =L dm ―L d1

[0173] Following the example above, we can... Figure 14 The second inductance value L0 is determined. Figure 17 The self-inductance L of the second inductor in the second common-mode impedance model 01 ,exist Figure 17 The self-inductance L of the second inductor in the second common-mode impedance model 01 The expression can be as follows:

[0174]

[0175] Following the example above, in Figure 17 The mutual inductance M corresponding to the second common-mode impedance model between the two windings 01 The expression can be as follows:

[0176]

[0177] Following the example above, we can... Figure 14 The first inductance value L1 in the middle is determined Figure 17 The self-inductance L of the first inductor in the first common-mode impedance model 11 The self-inductance value L of the first inductor 11 The expression can be as follows:

[0178]

[0179] Following the example above, in Figure 17 The mutual inductance M corresponding to the first common-mode impedance model between the two windings 11 The expression can be as follows:

[0180]

[0181] C4. Based on the leakage inductance value, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor.

[0182] In one embodiment, the specific implementation of the step "determining the third resistance value of the differential-mode resistor and the third capacitance value of the differential-mode capacitor based on the leakage inductance value" may include:

[0183] Calculate the third capacitance value based on the leakage inductance value and the sixth frequency.

[0184] Following the example above, based on the leakage inductance value L dm and the sixth frequency f rdm The value of the third capacitor C can be calculated using the following formula. dm :

[0185]

[0186] Calculate the third resistance value based on the sixth impedance value.

[0187] Following the example above, based on the sixth impedance value Z rdm The third resistance value R can be calculated using the following formula. dm :

[0188]

[0189] 242. Based on the third resistance value, the third capacitance value, and the mutual inductance model, determine the equivalent model of the nanocrystalline common-mode inductor.

[0190] It can be seen that, in determining the value of the third capacitor C dm The third resistance value R dm This allows us to obtain all the parameters of the mutual inductance model, which can then be used as the equivalent model of the nanocrystalline common-mode inductor.

[0191] As an example, in practical applications, the impedance value of the equivalent model of the nanocrystalline common-mode inductor can be calculated to obtain the calculated value of Zdm. Then, the actual measured impedance value Zdm is compared with the calculated value of Zdm to obtain the following result: Figure 20 The curve comparison chart shown is based on Figure 20 It can be seen that the differential-mode impedance of the equivalent model of the nanocrystalline common-mode inductor is in good agreement with the test results and has high accuracy.

[0192] As can be seen, in this embodiment, a first curve and a second curve are obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor. The first curve represents the relationship between the common-mode impedance value and frequency, and the second curve represents the relationship between the differential-mode impedance value and frequency. Then, the first curve is fitted with two sets of parallel RLC units to obtain the equivalent model of the common-mode impedance. Based on the equivalent model, the mutual inductance model between the windings of the nanocrystalline common-mode inductor is determined. Finally, the second curve is fitted with the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor. In other words, by fitting the first curve corresponding to the common-mode impedance and the second curve corresponding to the differential-mode impedance to obtain the equivalent model of the nanocrystalline common-mode inductor, it can be ensured that the equivalent model simultaneously considers the common-mode and differential-mode impedances of the nanocrystalline common-mode inductor, thereby ensuring that the constructed equivalent model can accurately describe the actual nanocrystalline common-mode inductor. Furthermore, an additional compensating parallel RLC unit is used to compensate for low-frequency differences, further ensuring the accuracy of the constructed equivalent model.

[0193] Figure 21 The diagram shown is a block diagram of a model determination device for a nanocrystalline common-mode inductor provided in an embodiment of the present invention. Figure 21 As shown, the model determining device 300 for the nanocrystalline common-mode inductor includes:

[0194] The acquisition module 310 is used to acquire a first curve and a second curve obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve represents the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve represents the relationship between the impedance value of the differential-mode impedance and the frequency.

[0195] The first fitting module 320 is used to fit the first curve through two sets of parallel RLC units to obtain the common-mode impedance equivalent model.

[0196] The determination module 330 is used to determine the mutual inductance model between the windings of the nanocrystalline common-mode inductor based on the common-mode impedance equivalent model.

[0197] The second fitting module 340 is used to fit the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common mode inductor.

[0198] In some implementations, the first fitting module 320 is specifically used for:

[0199] The initial common-mode impedance model is obtained by fitting the first curve with a set of initial RLC parallel units;

[0200] The impedance value of the initial common-mode impedance model is attenuated to obtain the first common-mode impedance model;

[0201] The impedance difference curve is obtained by calculating the difference between the actual impedance value in the first curve and the absolute impedance value in the first common-mode impedance model. The impedance difference curve is the relationship curve between the difference between the actual impedance value and the absolute impedance value in the first common-mode impedance model and the frequency.

[0202] The second common-mode impedance model is obtained by fitting the impedance difference curve through a set of compensated RLC parallel units.

[0203] Based on the first common-mode impedance model and the second common-mode impedance model, the equivalent model of common-mode impedance is determined.

[0204] In some implementations, the first fitting module 320 is further used for:

[0205] The maximum impedance value in the first curve is determined as the first impedance value, and the frequency corresponding to the first impedance value is determined as the first frequency. Based on the first impedance value, the first resistance value corresponding to the initial RLC parallel unit is calculated.

[0206] The center frequency between the first frequency and the maximum frequency in the first curve is determined as the second frequency, and the second impedance value corresponding to the second frequency is determined in the first curve. Based on the second frequency and the second impedance value, the first capacitance value corresponding to the initial RLC parallel unit is calculated.

[0207] Calculate the first inductance value based on the first frequency and the first capacitance value;

[0208] The initial common-mode impedance model is determined based on the initial RLC parallel unit, the first resistance value, the first inductance value, and the first capacitance value.

[0209] In some implementations, the first fitting module 320 is further used for:

[0210] The first capacitance value, the first resistance value, and the first inductance value are attenuated according to a preset ratio to obtain the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0211] The first common-mode impedance model is determined based on the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

[0212] In some implementations, the first fitting module 320 is further used for:

[0213] The maximum impedance value in the impedance difference curve is determined as the third impedance value, the frequency corresponding to the third impedance value is determined as the third frequency, and the second resistance value corresponding to the compensation RLC parallel unit is calculated based on the third impedance value.

[0214] The center frequency between the third frequency and the maximum frequency in the impedance difference curve is determined as the fourth frequency, and the fourth impedance value corresponding to the fourth frequency is determined in the impedance difference curve. Based on the fourth frequency and the fourth impedance value, the second capacitance value corresponding to the compensation RLC parallel unit is calculated.

[0215] The minimum frequency in the impedance difference curve is determined as the fifth frequency, and the fifth impedance value corresponding to the fifth frequency is determined in the impedance difference curve. Based on the fifth frequency and the fifth impedance value, the second inductance value corresponding to the compensation RLC parallel unit is calculated.

[0216] The second common-mode impedance model is determined based on the compensated RLC parallel unit, the second resistance value, the second inductance value, and the second capacitance value.

[0217] In some implementations, the mutual inductance model includes multiple windings, each of which includes a common-mode impedance equivalent model, and adjacent windings are connected by differential-mode resistors and differential-mode capacitors.

[0218] In some implementations, the second fitting module 340 is specifically used for:

[0219] Based on the second curve, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor;

[0220] Based on the third resistance value, the third capacitance value, and the mutual inductance model, the equivalent model of the nanocrystalline common-mode inductor is determined.

[0221] In some implementations, the second fitting module 340 is further specifically used for:

[0222] The maximum impedance value in the second curve is determined as the sixth impedance value, and the frequency corresponding to the sixth impedance value is determined as the sixth frequency.

[0223] The center frequency between the sixth frequency and the minimum frequency in the second curve is determined as the seventh frequency, and the seventh impedance value corresponding to the seventh frequency is determined in the second curve.

[0224] Calculate the leakage inductance value of the mutual inductance model based on the seventh frequency and the seventh impedance value;

[0225] Based on the leakage inductance value, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor.

[0226] In some implementations, the second fitting module 340 is further used for:

[0227] Calculate the third capacitance value based on the leakage inductance value and the sixth frequency;

[0228] Calculate the third resistance value based on the sixth impedance value.

[0229] The specific implementation process of the functions and roles of each module in the above device can be found in the implementation process of the corresponding steps of the model determination method for nanocrystalline common-mode inductors in the above embodiments, and will not be repeated here.

[0230] Figure 22 The diagram shown is a block diagram of an electronic device 900 provided in an embodiment of the present invention.

[0231] Reference Figure 22 The electronic device 900 includes a processing component 910, which further includes one or more processors, and memory resources represented by a memory 920 for storing instructions executable by the processing component 910, such as application programs. The application programs stored in the memory 920 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processing component 910 is configured to execute instructions to perform the aforementioned method for determining the model of the nanocrystalline common-mode inductor.

[0232] Electronic device 900 may also include a power supply component configured to perform power management of electronic device 900, a wired or wireless network interface configured to connect electronic device 900 to a network, and an input / output (I / O) interface. Electronic device 900 can operate on an operating system stored in memory 920, such as Windows Server™, Mac OSX™, Unix™, Linux™, FreeBSD™, or similar.

[0233] A non-transitory computer-readable storage medium, when the instructions in the storage medium are executed by the processor of the aforementioned electronic device 900, enables the electronic device 900 to execute the aforementioned model determination method for nanocrystalline common-mode inductors.

[0234] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0235] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0236] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0237] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0238] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0239] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, essentially, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes: USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media capable of storing program verification codes.

[0240] Furthermore, it should be noted that the combination of the various technical features in this case is not limited to the combination methods described in the claims of this case or the combination methods described in the specific embodiments. All technical features described in this case can be freely combined or combined in any way, unless they contradict each other.

[0241] It should be noted that the above examples are merely specific embodiments of the present invention, and the present invention is obviously not limited to the above embodiments, with many similar variations. All modifications that can be directly derived or conceived by those skilled in the art from the content disclosed in this invention should fall within the protection scope of this invention.

[0242] It should be understood that the terms "first," "second," etc., mentioned in the embodiments of the present invention are merely for the purpose of more clearly describing the use of the technical solutions in the embodiments of the present invention, and are not intended to limit the scope of protection of the present invention.

[0243] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for determining the model of a nanocrystalline common-mode inductor, characterized in that, include: A first curve and a second curve are obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve represents the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve represents the relationship between the impedance value of the differential-mode impedance and the frequency. The first curve is fitted by two sets of parallel RLC units to obtain the common-mode impedance equivalent model; Based on the common-mode impedance equivalent model, the mutual inductance model between the windings of the nanocrystalline common-mode inductor is determined. The second curve is fitted according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor.

2. The method according to claim 1, characterized in that, The process of fitting the first curve using two sets of parallel RLC units to obtain a common-mode impedance equivalent model includes: The initial common-mode impedance model is obtained by fitting the first curve with a set of initial RLC parallel units; The impedance value of the initial common-mode impedance model is attenuated to obtain the first common-mode impedance model; The impedance difference curve is obtained by calculating the difference between the actual impedance value in the first curve and the absolute impedance value in the first common-mode impedance model. The impedance difference curve is the relationship curve between the difference between the actual impedance value and the absolute impedance value in the first common-mode impedance model and the frequency. The impedance difference curve is fitted by a set of compensated RLC parallel units to obtain the second common-mode impedance model; The equivalent model of the common-mode impedance is determined based on the first common-mode impedance model and the second common-mode impedance model.

3. The method according to claim 2, characterized in that, The process of fitting the first curve with a set of initial RLC parallel units to obtain an initial common-mode impedance model includes: The maximum impedance value in the first curve is determined as the first impedance value, and the frequency corresponding to the first impedance value is determined as the first frequency. Based on the first impedance value, the first resistance value corresponding to the initial RLC parallel unit is calculated. The center frequency between the first frequency and the maximum frequency in the first curve is determined as the second frequency, and the second impedance value corresponding to the second frequency is determined in the first curve. Based on the second frequency and the second impedance value, the first capacitance value corresponding to the initial RLC parallel unit is calculated. Calculate the first inductance value based on the first frequency and the first capacitance value; The initial common-mode impedance model is determined based on the initial RLC parallel unit, the first resistance value, the first inductance value, and the first capacitance value.

4. The method according to claim 3, characterized in that, The attenuation process performed on the impedance value of the initial common-mode impedance model to obtain the first common-mode impedance model includes: The first capacitance value, the first resistance value, and the first inductance value are attenuated according to a preset ratio to obtain the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value. The first common-mode impedance model is determined based on the attenuated first capacitance value, the attenuated first resistance value, and the attenuated first inductance value.

5. The method according to claim 4, characterized in that, The process of fitting the impedance difference curve using a set of compensated RLC parallel units to obtain a second common-mode impedance model includes: The maximum impedance value in the impedance difference curve is determined as the third impedance value, the frequency corresponding to the third impedance value is determined as the third frequency, and the second resistance value corresponding to the compensated RLC parallel unit is calculated based on the third impedance value. The center frequency between the third frequency and the maximum frequency in the impedance difference curve is determined as the fourth frequency, and the fourth impedance value corresponding to the fourth frequency is determined in the impedance difference curve. Based on the fourth frequency and the fourth impedance value, the second capacitance value corresponding to the compensation RLC parallel unit is calculated. The minimum frequency in the impedance difference curve is determined as the fifth frequency, and the fifth impedance value corresponding to the fifth frequency is determined in the impedance difference curve. Based on the fifth frequency and the fifth impedance value, the second inductance value corresponding to the compensated RLC parallel unit is calculated. The second common-mode impedance model is determined based on the compensated RLC parallel unit, the second resistance value, the second inductance value, and the second capacitance value.

6. The method according to claim 1, characterized in that, The mutual inductance model includes multiple windings, each of which includes the common-mode impedance equivalent model, and adjacent windings are connected by differential-mode resistors and differential-mode capacitors.

7. The method according to claim 6, characterized in that, The step of fitting the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common-mode inductor includes: Based on the second curve, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor; Based on the third resistance value, the third capacitance value, and the mutual inductance model, the equivalent model of the nanocrystalline common-mode inductor is determined.

8. The method according to claim 7, characterized in that, Determining the third resistance value of the differential-mode resistor and the third capacitance value of the differential-mode capacitor based on the second curve includes: The maximum impedance value in the second curve is determined as the sixth impedance value, and the frequency corresponding to the sixth impedance value is determined as the sixth frequency. The center frequency between the sixth frequency and the minimum frequency in the second curve is determined as the seventh frequency, and the seventh impedance value corresponding to the seventh frequency is determined in the second curve. Calculate the leakage inductance value of the mutual inductance model based on the seventh frequency and the seventh impedance value; Based on the leakage inductance value, determine the third resistance value of the differential mode resistor and the third capacitance value of the differential mode capacitor.

9. The method according to claim 8, characterized in that, Determining the third resistance value of the differential-mode resistor and the third capacitance value of the differential-mode capacitor based on the leakage inductance value includes: The third capacitance value is calculated based on the leakage inductance value and the sixth frequency; The third resistance value is calculated based on the sixth impedance value.

10. A device for determining the model of a nanocrystalline common-mode inductor, characterized in that, include: The acquisition module is used to acquire a first curve and a second curve obtained by measuring the common-mode impedance and differential-mode impedance of the nanocrystalline common-mode inductor; the first curve represents the relationship between the impedance value of the common-mode impedance and the frequency, and the second curve represents the relationship between the impedance value of the differential-mode impedance and the frequency. The first fitting module is used to fit the first curve using two sets of parallel RLC units to obtain a common-mode impedance equivalent model. The determination module is used to determine the mutual inductance model between the windings of the nanocrystalline common-mode inductor based on the common-mode impedance equivalent model. The second fitting module is used to fit the second curve according to the mutual inductance model to obtain the equivalent model of the nanocrystalline common mode inductor.

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