Tool and method for testing lead-free multi-contact module before casing

By using a leadless multi-contact module pre-packaging test fixture, and combining probe and guide components, the problems of poor contact and low efficiency in traditional testing are solved, achieving efficient and accurate electrical performance testing.

CN121863166APending Publication Date: 2026-04-14TIANSHUI 749 ELECTRONICS
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
TIANSHUI 749 ELECTRONICS
Filing Date
2026-01-08
Publication Date
2026-04-14

AI Technical Summary

Technical Problem

Existing leadless module pre-assembly electrical testing relies on traditional leaded test fixtures, which suffer from problems such as poor contact, signal distortion, low production efficiency, high labor intensity, and equipment wear.

Method used

A leadless multi-contact module pre-packaging test fixture is adopted, which uses a probe assembly to replace the traditional lead and electron tube contact, and forms an electrical connection with the leadless module under test through multiple contacts. Combined with a guide assembly, the probe can achieve stable sliding and positioning.

Benefits of technology

It improves the accuracy of test data, reduces equipment wear and tear, lowers labor intensity and costs, increases production efficiency, avoids physical damage, and ensures test stability and accuracy.

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Abstract

The invention discloses a test tool and method for a leadless multi-contact module before casing, and the device comprises a bearing box, the top of which is provided with a support frame; the guide assembly is arranged at one end, close to the bearing box, of the supporting frame; the positioning assembly is arranged at the end, away from the bearing box, of the supporting frame. One end of the probe assembly is slidably connected with the guide assembly, and the other end is movably connected with the positioning assembly through the adjusting assembly; and the supporting block is fixedly arranged at the top of the bearing box and located below the probe assembly, and the supporting block is used for placing the leadless module to be tested. According to the tool, the probe assembly is adopted to replace a traditional lead and electronic teaching contact mode, so that the influence of contact resistance change on the test is effectively reduced; meanwhile, the external electromagnetic interference resistance of the contact mode of the probe assembly is higher, the signal distortion risk can be remarkably reduced, and the accuracy of test data is guaranteed; in addition, compared with repeated plugging abrasion of a traditional lead, frequent desoldering is not needed, the overall service life of the tool can be prolonged, and cost input caused by equipment replacement is reduced.
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Description

Technical Field

[0001] This invention belongs to the field of microcircuit module testing technology, specifically relating to a test fixture and method for a leadless multi-contact module before casing. Background Technology

[0002] Leadless modules, as highly integrated microcircuit modules that utilize PCB single-board component mounting and achieve DC-DC conversion through micro-assembly technology, are widely used in electronic equipment due to their advantages of miniaturization, lightweight design, and high reliability. These modules employ a metal casing and do not have traditional lead structures before encapsulation. Their electrical connections and signal transmissions are achieved through dedicated interfaces after encapsulation. This characteristic places special requirements on electrical performance testing before encapsulation, necessitating performance verification without damaging the original module structure or introducing additional leads.

[0003] Currently, the industry still relies on traditional leaded testing fixtures and processes for electrical testing of leadless modules before casing. The core method involves manually soldering auxiliary leads to establish the electrical connection between the module and the testing equipment. The leads are then removed after testing before casing can proceed. However, this approach has revealed many unavoidable drawbacks in practical applications, severely restricting production efficiency and product yield, specifically in the following aspects: Firstly, traditional tooling relies on the physical contact between leads and electronic tubes to achieve signal transmission. This contact method is susceptible to changes in contact resistance and external electromagnetic interference, leading to problems such as poor contact and signal distortion, which directly affects the accuracy of test data. At the same time, repeated insertion and removal of leads and tubes will cause mechanical wear, significantly shortening the tooling's service life and increasing equipment replacement costs.

[0004] Secondly, testing multi-pin leadless modules requires manual soldering of leads point by point, followed by desoldering point by point after testing. The entire process is cumbersome and time-consuming, especially in mass production scenarios, requiring a large amount of manpower for repetitive soldering and desoldering operations. This not only results in high labor intensity but also hinders production efficiency. Furthermore, the variability in manual operation can easily lead to problems such as misaligned leads and cold solder joints, further increasing rework costs. At the same time, the module is easily damaged during the desoldering process. Summary of the Invention

[0005] This invention provides a test fixture and method for pre-packaging a leadless multi-contact module to address the technical deficiencies mentioned in the background section.

[0006] To achieve the above objectives, the present invention employs the following technical solution: Firstly, a pre-assembly testing fixture for a leadless multi-contact module is provided, comprising: The carrier box has a support frame on top; A guide assembly is located at one end of the support frame near the load-bearing box; The positioning component is located at the end of the support frame away from the load-bearing box; The probe assembly has one end slidably connected to the guide assembly, and the other end movably connected to the positioning assembly via an adjustment assembly; A support block is fixed to the top of the carrier box and located below the probe assembly. The support block is used to place the leadless module to be tested. When the adjustment component is moved away from the positioning component, the adjustment component causes the probe component to move downward along the entire length of the guide component and contact the leadless module to be tested. When the adjustment component comes into contact with the positioning component, the adjustment component drives the probe component to move upward along the entire length of the guide component and away from the leadless module to be tested, so as to position the probe component.

[0007] Furthermore, the guiding component includes: A support frame is fixed at one end opposite to the support block; The sliding rod is connected at one end to the support frame and at the other end to the top of the carrier box; The probe assembly includes: A sliding seat is slidably connected to the outside of the sliding rod; A tray is fixed on the sliding seat, and two sets of connecting rods and probes are connected to the top of the tray; Two sets of connecting rods are symmetrically arranged on the tray, and a fixing block is installed on each set of connecting rods. The probe is located between the two sets of connecting rods. The support block has a groove in the middle, which is used to support the leadless module under test.

[0008] Furthermore, the support frame is composed of vertical rods and horizontal plates; The unit has two vertical rods arranged in parallel, a horizontal plate fixed to the top of the two vertical rods, and a sliding seat slidably connected between the two vertical rods.

[0009] Furthermore, each set of connecting rods consists of two rods, which are connected by a fixing block.

[0010] Furthermore, the probe is provided in two sets, with the two sets of probes arranged at intervals; Each set of probes extends to the bottom of the tray.

[0011] Furthermore, each group of probes consists of two probes.

[0012] Furthermore, the adjustment component includes: The movable rod is fixed on the probe assembly; A connecting rod is rotatably connected to the movable rod, and a pull rod and an adjusting block are connected to the end of the connecting rod away from the movable rod. The positioning component includes: The baffle is also fixed to the probe assembly and is located above the moving rod; A fixed base is fixed to the side of the baffle near the moving rod. The fixed base has a positioning port, and the adjusting block is adapted to the positioning port.

[0013] Furthermore, the adjusting block has a rectangular structure and is axially perpendicular to the connecting rod; When the connecting rod is turned to the side away from the fixed seat, the adjusting block moves out of the positioning port and the moving rod drives the probe assembly to move down. While pulling the lever upward, turn the connecting rod toward one side of the fixed base to rotate it so that the adjusting block engages with the positioning port to position the probe assembly.

[0014] Furthermore, a leather sleeve is provided on the outside of the pull rod.

[0015] Secondly, a method for pre-packaging testing of a leadless multi-contact module is provided. This method utilizes a pre-packaging testing fixture for a leadless multi-contact module as described above, and includes: Place the leadless module under test on the support block; By operating the adjustment component, the probe component is moved downward and establishes an electrical connection with the corresponding multiple test contacts on the leadless module under test; The electrical performance of the leadless module under test is tested by applying test signals to the module under test using a probe assembly and collecting response signals. After the test is completed, the probe assembly is adjusted upward by adjusting the component to separate the probe assembly from the leadless module under test, and then the leadless module under test is removed.

[0016] Compared with the prior art, the present invention has the following beneficial effects: 1. This fixture uses probe assemblies to replace the traditional lead wire and electronic tube contact method. It forms an electrical connection with the leadless module under test through multiple contacts, increasing the contact area and optimizing the contact pressure distribution, effectively reducing the impact of contact resistance changes on the test. At the same time, the contact mode of the probe assembly has stronger resistance to external electromagnetic interference, which can significantly reduce the risk of signal distortion and ensure the accuracy of test data. In addition, compared with the repeated insertion and removal wear of traditional leads, the contact between the probe assembly and the module is softer and has lower wear. With the stable sliding of the guide assembly, frequent desoldering is not required, which can extend the overall service life of the fixture and reduce the cost of equipment replacement.

[0017] 2. The two ends of the sliding rod are fixedly connected to the support frame and the bearing box respectively, forming a rigid linear guide trajectory. The sliding seat and the sliding rod slide together, so that the probe moves up and down along the fixed trajectory, avoiding the offset error of manual operation and improving the stability of the test.

[0018] 3. The sliding seat is slidably connected between two parallel vertical rods. The two vertical rods form a two-way guiding constraint, which can more accurately limit the displacement trajectory of the sliding seat compared with a single sliding rod, avoid deviation or jamming, further ensure the verticality and stability of the probe assembly when it moves up and down, and improve the docking accuracy with the test point of the leadless module. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 A three-dimensional schematic diagram of a test fixture for pre-assembly of a leadless multi-contact module provided by the present invention; Figure 2 This is a top view of the leadless module under test. The components are as follows: 1. Carrier box; 2. Handrail; 3. Power switch; 4. CNT remote control function switch; 5. First load switch; 6. Second load switch; 7. Wiring port; 8. Wire hole; 9. Support block; 10. Vertical rod; 11. Horizontal plate; 12. Sliding rod; 13. Sliding seat; 14. Tray; 15. Connecting rod; 16. Fixing block; 17. Probe; 18. Moving rod; 19. Connecting rod; 20. Pulling rod; 21. Sheath; 22. Fixing seat; 23. Baffle; 24. Module without lead wire to be tested. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0022] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0023] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0024] In the description of the embodiments of the present invention, it should be noted that if terms such as "upper," "lower," "horizontal," or "inner" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of the invention is in use, they are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. Furthermore, terms such as "first" and "second" are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0025] Furthermore, the use of the term "horizontal" does not imply that the component must be absolutely horizontal, but rather that it can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0026] In the description of the embodiments of the present invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in the present invention according to the specific circumstances.

[0027] To address the technical deficiencies mentioned in the background art, this embodiment provides a device and photovoltaic modules for protecting offshore photovoltaic modules during construction.

[0028] The present invention will now be described in further detail with reference to the accompanying drawings: See Figure 1The first aspect of this invention provides a pre-assembly testing fixture for a leadless multi-contact module, comprising: a carrier box 1, with a support frame on the top of the carrier box 1; a guide assembly located at one end of the support frame near the carrier box 1; a positioning assembly located at the end of the support frame away from the carrier box 1; a probe assembly, one end of which is slidably connected to the guide assembly, and the other end of which is movably connected to the positioning assembly via an adjustment assembly; and a support block 9 fixedly located on the top of the carrier box 1 and below the probe assembly, the support block 9 being used to place the leadless module 24 to be tested; wherein, when the adjustment assembly is operated to move away from the positioning assembly, the adjustment assembly causes the probe assembly to move downward along the length of the guide assembly and contact the leadless module 24 to be tested; when the adjustment assembly is operated to contact the positioning assembly, the adjustment assembly causes the probe assembly to move upward along the length of the guide assembly and away from the leadless module 24 to be tested, thereby positioning the probe assembly.

[0029] In the above structure, because the fixture uses a probe assembly to replace the traditional lead wire and electronic tube contact method, it forms an electrical connection with the leadless module 24 under test through multiple contacts, which increases the contact area and optimizes the contact pressure distribution, effectively reducing the impact of contact resistance changes on the test. At the same time, the contact mode of the probe assembly has stronger resistance to external electromagnetic interference, which can significantly reduce the risk of signal distortion and ensure the accuracy of test data. In addition, compared with the repeated insertion and removal wear of traditional leads, the contact between the probe assembly and the leadless module 24 under test is gentler and has lower wear. Combined with the stable sliding of the guide assembly, it can extend the overall service life of the fixture and reduce the cost of equipment replacement.

[0030] In application, this fixture eliminates the tedious process of manually soldering and unsoldering auxiliary leads point by point in the traditional testing process. Simply place the leadless module 24 to be tested on the support block 9, and the probe assembly can be precisely moved downward along the guide assembly by operating the adjustment component, quickly completing the precise docking of multiple contacts. After the test is completed, the operation adjustment component contacts the positioning component, which can drive the probe assembly to move upward to reset and position, greatly reducing repetitive manual operations, reducing labor intensity, and significantly improving testing efficiency. At the same time, it avoids problems such as misalignment and cold solder joints caused by manual welding, reduces rework costs, and further optimizes production efficiency.

[0031] Finally, in the traditional testing process of desoldering, high temperature and mechanical operation can easily damage the module PCB board and solder pads. However, this fixture completely avoids the risk of thermal and mechanical damage during the soldering and desoldering process by using probe components to make non-soldering contact with the leadless module 24 under test, thus ensuring the structural integrity of the leadless module 24 under test from the testing stage.

[0032] like Figure 1As shown, in the scheme, the guide assembly includes a support frame, which is fixed at one end opposite to the support block 9; a sliding rod 12, one end of which is connected to the support frame and the other end of which is connected to the top of the carrier box 1; the probe assembly includes a sliding seat 13, which is slidably connected to the outside of the sliding rod 12; a tray 14, which is fixed on the sliding seat 13, and the top of the tray 14 is connected to two sets of connecting rods 15 and probes 17; wherein, the two sets of connecting rods 15 are symmetrically arranged on the tray 14, and each set of connecting rods 15 is equipped with a fixing block 16, and the probes 17 are arranged between the two sets of connecting rods 15; a groove is provided in the middle of the support block 9, and the groove is used to support the leadless module 24 to be tested.

[0033] As shown in the figure, the two ends of the sliding rod 12 are fixed to the support frame and the carrier box 1 respectively. The two sliding rods 12 are connected by the cross plate 11, thus forming a rigid linear guide trajectory. The sliding seat 13 of the probe assembly slides and engages with the sliding rod 12, so that the probe 17 moves up and down along the rigid linear guide trajectory, avoiding the offset error of manual operation, ensuring that the probe 17 can accurately align with the test point of the leadless module 24 under test every time, solving the problem of poor contact caused by the inaccurate alignment of traditional manual operation, and improving the stability of the test.

[0034] In practice, there are two connecting rods 15 in each group, and the two connecting rods 15 are connected by a fixing block 16. There are also two sets of probes 17, and the two sets of probes 17 are arranged at intervals. The end of each set of probes 17 extends to the bottom of the tray 14, and there are two probes in each set.

[0035] Furthermore, the adjustment assembly includes a movable rod 18, which is fixedly mounted on the tray 14 of the probe assembly; a connecting rod 19, which is rotatably connected to the movable rod 18, with a pull rod 20 and an adjustment block connected to the end of the connecting rod 19 away from the movable rod 18. The positioning assembly includes a baffle 23, which is also fixedly mounted on the probe assembly, connected between the two vertical rods 10, and located above the movable rod 18; and a fixed seat 22, which is fixed to the side of the baffle 23 near the movable rod 18, with a positioning opening on the fixed seat 22, and the adjustment block is adapted to the positioning opening.

[0036] Through the linkage structure of the moving rod 18, connecting rod 19 and pulling rod 20, the probe assembly can be driven to move up and down along the vertical rod 10 simply by operating the pulling rod 20; when the pulling rod 20 is moved, the adjusting block is moved away from the positioning port on the fixed base 22, so that the probe 17 moves down to contact the leadless module 24 to be tested; when resetting, the pulling rod 20 is operated to make the adjusting block lock into the positioning port, the probe 17 moves up to reset and lock, which greatly shortens the operation time of a single test.

[0037] Meanwhile, during operation, when the adjustment block is inserted into the positioning port, it can form a rigid lock on the probe assembly through the mechanical structure, preventing the probe 17 from moving down due to vibration or accidental contact in non-testing states, preventing wear caused by unnecessary contact between the probe 17 and the leadless module 24 under test, and protecting the probe 17 from damage by external force collision, thereby improving the safety and lifespan of the tooling.

[0038] from Figure 1 As can be seen, the adjusting block has a rectangular structure and is axially perpendicular to the connecting rod 19. It can be understood that when the connecting rod 19 is turned away from the fixed seat 22, the adjusting block moves out of the positioning port and the moving rod 18 moves the probe assembly downward. At the same time as the pulling rod 20 is pulled upward, the connecting rod 19 is turned towards the fixed seat 22 to make the adjusting block cooperate with the positioning port to position the probe assembly.

[0039] Meanwhile, to improve operational comfort, a leather sleeve 21 is provided on the outside of the pull rod 20. The leather sleeve 21 is made of soft and elastic material, which can effectively buffer the contact pressure between the hand and the pull rod 20, avoiding discomfort or abrasion caused by the direct friction of the rod against the palm during high-frequency pulling operations, significantly reducing hand fatigue and improving the operating experience. At the same time, the leather sleeve 21 can increase the friction between the hand and the pull rod 20, preventing slippage during operation, ensuring precise and controllable pulling action, and reducing the risk of probe 17 displacement deviation or misoperation caused by slippage. Furthermore, the insulation of the leather sleeve 21 can reduce the risk of electrostatic interference when the operator touches the parts, indirectly ensuring the stability of the test signal.

[0040] In this design, the carrier box 1 serves as the basic load-bearing structure of the entire fixture. Two openable and closable handrails 2 are installed on both sides of the carrier box 1 via hinged rotating devices. The handrails 2 facilitate handling and save space. In addition, a power switch 3, a CNT remote control function switch 4, a first load switch 5 (load + switch), and a second load switch 6 (load - switch) are installed sequentially on the front end of the upper surface of the carrier box 1. The power switch 3 is used to control the on / off state of the entire test circuit. The banana plug of the output connection line of the external load device is connected to the first load switch 5 (load + switch) and the second load switch 6 (load - switch) to provide the rated output current to the leadless module 24 under test. The CNT remote control function switch 4 turns the leadless module 24 under test on and off by using high and low levels.

[0041] In this design, the side of the carrier box 1 is provided with multiple connection ports 7, which can be used to connect external power supply, test instruments or additional loads. The external power supply directly supplies power to the leadless module under test 24. The test instruments mainly include a multimeter, an oscilloscope and an electronic load. The multimeter monitors the output voltage of the leadless module under test 24, the oscilloscope monitors the output waveform of the leadless module under test 24, and the electronic load provides the rated output current to the leadless module under test 24.

[0042] In this design, a wire-passing hole 8 is provided at the center of the upper surface of the carrier box 1 for introducing external cables into the carrier box 1. The support block 9 is made of insulating material and has grooves. The two opposite sidewalls of the grooves are used to support the leadless module 24 to be tested. Figure 2 As shown, it can be seen from the horizontal direction that the leadless module 24 under test has five sets of contact holes, which are arranged sequentially at intervals along the length of the leadless module 24 under test; among them, the two sets of contact holes located at both ends of the leadless module 24 under test are in contact with the probe 17.

[0043] In specific operation, four vertical connecting rods 15 are fixedly connected to the tray 14. Each pair of connecting rods 15 is fixed and isolated above by an insulating fixing block 16. Six probes 17 are passed through and fixed in the middle of the tray 14. The lower end of the probes 17 is also fixed and insulated by another fixing block 16. The lower end of the probes 17 is the test contact end, and the upper end is electrically connected to the connecting rods 15 through a wire. The external test cable is introduced through the wire hole 8 and connected to the connecting rods 15, thereby transmitting the test signal to the probes 17. The probes 17 provide input voltage and output parameter testing for the leadless module 24 under test.

[0044] During testing, the leadless module 24 to be tested is first placed on the support block 9. The operator holds the leather sleeve 21 and pulls the lever 20. The lever 20 drives the connecting rod 19 to move downward, which in turn pushes the moving rod 18 to move downward. The moving rod 18 drives the entire tray 14 and its probe 17. Relying on the sliding seat 13, the probe 17 slides smoothly downward along the sliding rod 12, so that the probe 17 makes full contact with the test point on the leadless module 24 to be tested, thus realizing the test of the leadless module 24.

[0045] Finally, the tips of the six probes 17 simultaneously and precisely press against the test contacts corresponding to the leadless module 24 under test, establishing a reliable electrical connection. At this time, test signals can be applied to the probes 17 through the connection port 7 and the connecting rod 15 by external test equipment, so that various electrical performance tests can be performed on the module.

[0046] After the test is completed, the operator lifts the pull rod 20 upwards and moves the probe 17 upwards through the adjustment component, so that the probe 17 is separated from the leadless module 24 under test, and the leadless module 24 under test that has passed the test can be taken out.

[0047] The probes 17 in this test fixture are precisely pressed down in one go under the action of the adjustment component, establishing a stable electrical connection with all test contacts on the leadless module 24 under test at the same time. This completely eliminates the tedious and dangerous welding process in traditional methods, fundamentally avoiding physical damage to the leadless module 24 under test that may be caused by welding and wire disconnection. Furthermore, during the operation, multiple probes 17 can work in parallel, completing the signal loading and data acquisition of all test points at once. Compared with the traditional point-by-point welding test method, the test time is shortened by orders of magnitude, making it particularly suitable for mass production line testing scenarios and greatly improving production efficiency.

[0048] Secondly, guided by the sliding rod 12, the probe 17 can move smoothly to ensure that all probes 17 contact the test contacts with uniform pressure, ensuring reliable connection and good conductivity. The number and layout of the probes 17 can be flexibly adapted to the test point distribution of different models of leadless modules 24 under test, making it highly versatile.

[0049] Secondly, a method for pre-packaging testing of a leadless multi-contact module is provided. This method utilizes a pre-packaging testing fixture for a leadless multi-contact module as described above, and includes: Step 1: First, place the leadless module 24 to be tested on the support block 9; Step 2: By operating the adjustment component, the probe component is moved downward and establishes an electrical connection with the corresponding multiple test contacts on the leadless module 24 under test; Step 3: Apply test signals to the leadless module 24 under test through the probe assembly and collect response signals to complete the electrical performance test of the leadless module 24 under test; After the test is completed, the probe assembly is adjusted upward by adjusting the component to separate the probe assembly from the leadless module 24 under test, and the leadless module 24 under test is removed.

[0050] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A pre-assembly testing fixture for a leadless multi-contact module, characterized in that, include: The carrier box has a support frame on top; A guide assembly is located at one end of the support frame near the load-bearing box; The positioning component is located at the end of the support frame away from the load-bearing box; The probe assembly has one end slidably connected to the guide assembly, and the other end movably connected to the positioning assembly via an adjustment assembly; A support block is fixed to the top of the carrier box and located below the probe assembly. The support block is used to place the leadless module to be tested. When the adjustment component is moved away from the positioning component, the adjustment component causes the probe component to move downward along the entire length of the guide component and contact the leadless module to be tested. When the adjustment component comes into contact with the positioning component, the adjustment component drives the probe component to move upward along the entire length of the guide component and away from the leadless module to be tested, so as to position the probe component.

2. The leadless multi-contact module pre-assembly testing fixture according to claim 1, characterized in that, The guiding component includes: A support frame is fixed at one end opposite to the support block; The sliding rod is connected at one end to the support frame and at the other end to the top of the carrier box; The probe assembly includes: A sliding seat is slidably connected to the outside of the sliding rod; A tray is fixed on the sliding seat, and two sets of connecting rods and probes are connected to the top of the tray; Two sets of connecting rods are symmetrically arranged on the tray, and a fixing block is installed on each set of connecting rods. The probe is located between the two sets of connecting rods. The support block has a groove in the middle, which is used to support the leadless module under test.

3. The leadless multi-contact module pre-assembly testing fixture according to claim 2, characterized in that, The support frame consists of vertical rods and horizontal plates; The unit has two vertical rods arranged in parallel, a horizontal plate fixed to the top of the two vertical rods, and a sliding seat slidably connected between the two vertical rods.

4. The leadless multi-contact module pre-assembly testing fixture according to claim 2, characterized in that, Each set of connecting rods consists of two rods, which are connected by a fixing block.

5. The leadless multi-contact module pre-assembly testing fixture according to claim 2, characterized in that, The probe is provided in two sets, with the two sets of probes arranged at an interval; Each set of probes extends to the bottom of the tray.

6. The leadless multi-contact module pre-assembly testing fixture according to claim 5, characterized in that, Each group of probes consists of two probes.

7. The leadless multi-contact module pre-assembly testing fixture according to claim 1, characterized in that, The adjustment component includes: The movable rod is fixed on the probe assembly; A connecting rod is rotatably connected to the movable rod, and a pull rod and an adjusting block are connected to the end of the connecting rod away from the movable rod. The positioning component includes: The baffle is also fixed to the probe assembly and is located above the moving rod; A fixed base is fixed to the side of the baffle near the moving rod. The fixed base has a positioning port, and the adjusting block is adapted to the positioning port.

8. The leadless multi-contact module pre-assembly testing fixture according to claim 7, characterized in that, The adjusting block has a rectangular structure and is axially perpendicular to the connecting rod. When the connecting rod is turned to the side away from the fixed seat, the adjusting block moves out of the positioning port and the moving rod drives the probe assembly to move down. While pulling the lever upward, turn the connecting rod toward one side of the fixed base to rotate it so that the adjusting block engages with the positioning port to position the probe assembly.

9. A test fixture for pre-packaging of a leadless multi-contact module according to claim 7 or 8, characterized in that, The pull rod is fitted with a leather sleeve on its outer side.

10. A method for testing a leadless multi-contact module before casing, characterized in that, The method is performed using a pre-assembly testing fixture for a leadless multi-contact module as described in any one of claims 1-9, including: Place the leadless module under test on the support block; By operating the adjustment component, the probe component is moved downward and establishes an electrical connection with the corresponding multiple test contacts on the leadless module under test; The electrical performance of the leadless module under test is tested by applying test signals to the module under test using a probe assembly and collecting response signals. After the test is completed, the probe assembly is adjusted upward by adjusting the component to separate the probe assembly from the leadless module under test, and then the leadless module under test is removed.