Data center inspection method and device and computer readable storage medium
By adopting adaptive exposure strategies and image acquisition technology in data center inspection equipment, the problem of inaccurate acquisition of dynamic indicator light images has been solved, improving inspection efficiency and saving resource consumption.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-18
- Publication Date
- 2026-04-21
AI Technical Summary
In existing technologies, data center inspection robots often fail to accurately acquire dynamic indicator light images when collecting device indicator light images, leading to resource waste, high computational and analytical overhead, and high storage space requirements.
After the inspection equipment reaches the target inspection point, it is determined whether it is the first inspection point. The corresponding exposure strategy and historical images are obtained, and an adaptive exposure strategy is adopted for image acquisition, including short exposure and long exposure techniques, to reduce the number of images acquired.
It improves the accuracy and efficiency of image acquisition, reduces resource consumption, and lowers storage and computing requirements.
Smart Images
Figure CN121907984A_ABST
Abstract
Description
Technical Field
[0001] This article relates to information processing technology, and in particular to a data center inspection method, device and computer-readable storage medium. Background Technology
[0002] Currently, data center inspections are beginning to utilize inspection robots. These robots collect information about the data center environment and the operating status of equipment within the data center through various sensors. Equipment status information is primarily obtained by capturing images of equipment indicator lights.
[0003] The acquisition of dynamic indicator light images is inaccurate. Related technologies often use image sensors to capture images of the device. When the device indicator light flashes at a certain frequency, if the time point of the captured static image is during the period when the indicator light is off, it cannot accurately reflect the operating status of the device. Therefore, it is often necessary to take multiple pictures.
[0004] However, this approach leads to a waste of resources. Summary of the Invention
[0005] This application provides a data center inspection method, device, and computer-readable storage medium, which can use appropriate image acquisition information to acquire images at different inspection points on the inspection site, thereby avoiding unnecessary resource consumption of image acquisition during the inspection process.
[0006] On one hand, this application provides a data center inspection method, which is executed by a mobile inspection device, the inspection device periodically inspecting the data center according to a preset number of inspection points; the method includes: When the inspection equipment reaches the target inspection point, determine whether the target inspection point is the first inspection point. If the target inspection point is not the first inspection point, obtain the exposure strategy and historical images corresponding to the target inspection point; According to the exposure strategy, images of the indicator lights corresponding to the target inspection points are acquired to obtain newly acquired images; The inspection results of the indicator lights are determined based on the historical images and the newly acquired images.
[0007] On the other hand, this application also provides a data center inspection device, including: a memory and a processor, wherein the memory is used to store an executable program; The processor is used to read and execute the executable program to implement the data center inspection method described above.
[0008] In another aspect, this application also provides a computer-readable storage medium storing computer-executable commands for performing the data center inspection method described above.
[0009] Compared with related technologies, this application, when the inspection equipment reaches the target inspection point, determines whether the target inspection point is a first-time inspection point; if the target inspection point is not a first-time inspection point, it acquires the exposure strategy and historical images corresponding to the target inspection point; it then acquires images of the indicator lights corresponding to the target inspection point according to the exposure strategy, obtaining newly acquired images; and finally, it determines the inspection result of the indicator lights based on the historical images and the newly acquired images. The data center inspection method provided by this application greatly reduces the number of images acquired because it uses an appropriate exposure strategy for each inspection point, thereby saving resources consumed in image acquisition during the inspection process.
[0010] Other features and advantages of this application will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the application. Other advantages of this application can be realized and obtained by means of the solutions described in the description and the accompanying drawings. Attached Figure Description
[0011] The accompanying drawings are used to provide an understanding of the technical solutions of this application and constitute a part of the specification. They are used together with the embodiments of this application to explain the technical solutions of this application and do not constitute a limitation on the technical solutions of this application.
[0012] Figure 1 This is a flowchart illustrating a data center inspection method according to an embodiment of this application; Figure 2 This is a flowchart illustrating another data center inspection method according to an embodiment of this application; Figure 3 This is a schematic diagram illustrating a process for estimating the flashing interval of the indicator light according to an embodiment of this application; Figure 4 This is a flowchart illustrating a method for determining the status of an indicator light corresponding to a target inspection point, according to an embodiment of this application. Figure 5 This is a flowchart illustrating a data center inspection method according to an embodiment of this application. Detailed Implementation
[0013] This application describes several embodiments, but these descriptions are exemplary and not restrictive, and it will be apparent to those skilled in the art that many more embodiments and implementations are possible within the scope of the embodiments described herein. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are also possible. Unless specifically limited, any feature or element of any embodiment may be used in combination with, or may replace, any feature or element of any other embodiment.
[0014] This application includes and contemplates combinations of features and elements known to those skilled in the art. The embodiments, features, and elements disclosed in this application may also be combined with any conventional features or elements to form a unique inventive scheme as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive schemes to form another unique inventive scheme as defined by the claims. Therefore, it should be understood that any feature shown and / or discussed in this application may be implemented individually or in any suitable combination. Therefore, the embodiments are not limited except by the limitations imposed by the appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.
[0015] Furthermore, in describing representative embodiments, the specification may have presented methods and / or processes as a specific sequence of steps. However, the method or process should not be limited to the specific order of steps described herein, to the extent that it does not depend on such a specific order. As will be understood by those skilled in the art, other sequences of steps are also possible. Therefore, the specific order of steps set forth in the specification should not be construed as a limitation of the claims. Moreover, the claims concerning the method and / or process should not be limited to the steps performed in the written order, and those skilled in the art will readily understand that these orders can be varied and still remain within the spirit and scope of the embodiments of this application.
[0016] This application provides a data center inspection method, which is executed by a mobile inspection device. The inspection device periodically inspects the data center according to a preset number of inspection points. Figure 1 As shown, the method includes: Step 101: When the inspection equipment reaches the target inspection point, determine whether the target inspection point is the first inspection point. Step 102: If the target inspection point is not the first inspection point, obtain the exposure strategy and historical images corresponding to the target inspection point; Step 103: Acquire images of the indicator lights corresponding to the target inspection points according to the exposure strategy to obtain newly acquired images; Step 104: Determine the inspection results of the indicator lights based on the historical images and the newly acquired images.
[0017] Mobile inspection equipment can be inspection robots. A single inspection point can be a single piece of equipment, a single cabinet, or a single area.
[0018] For example, the inspection cycle for data center inspection can be set according to the actual situation. If the real-time requirement for inspection results is high, the inspection cycle can be set to be relatively short, and the resource consumption will be correspondingly larger. If the real-time requirement for inspection results is not high, the inspection cycle can be set to be relatively long, and the resource consumption will be correspondingly smaller.
[0019] Determining the inspection result of the indicator light based on the historically acquired images and the newly acquired images can specifically involve judging whether the indicator light status in the historically acquired images and the newly acquired images is consistent. If they are consistent, the inspection result of the indicator light corresponding to the target inspection point during this inspection is normal; if they are inconsistent, the inspection result of the indicator light corresponding to the target inspection point during this inspection is abnormal. The historically acquired images of the target inspection point are images that demonstrate the indicator light corresponding to the target inspection point is in a normal state during previous inspections; these images can be pre-acquired images.
[0020] A data center can be an Internet Data Center (IDC). An IDC refers to a service platform with comprehensive equipment (including high-speed internet access bandwidth, high-performance local area networks, and a secure and reliable server room environment), professional management, and complete applications. Based on this platform, IDC service providers offer customers basic internet platform services (server hosting, virtual hosting, email caching, virtual mail, etc.) as well as various value-added services (site rental services, domain name system services, load balancing systems, database systems, data backup services, etc.). Data centers often use indicator lights to display equipment status. Indicator lights are devices that use light to monitor the working or positional status of circuits and electrical equipment. Indicator lights are typically used to reflect the working status of circuits (energized or de-energized), the working status of electrical equipment (running, shut down, or under test), and its positional status (closed or open).
[0021] In related technologies, data center inspections are increasingly utilizing inspection robots. These robots collect information about the data center environment and equipment operating status through various sensors, primarily acquiring equipment status information by capturing images of indicator lights. However, as data centers expand and technology advances, the types and quantities of equipment increase, along with the display formats and methods of indicator lights. This necessitates adjustments to the methods for collecting images of equipment indicator lights, specifically addressing the following issues:
[0022] 1. Inaccurate acquisition of dynamic indicator light images: When the device image is captured by the image sensor, if the device indicator light flashes at a certain frequency and the time point of the captured static image is during the period when the indicator light is off, a single image cannot accurately reflect the operating status of the device.
[0023] 2. High storage space requirements: To avoid inaccurate identification of dynamic indicator lights, current intelligent inspection equipment mainly acquires equipment inspection images by shooting videos or taking multiple photos in succession. As the size of the data center expands and the inspection frequency increases, the storage and archiving of image information requires a large amount of storage space.
[0024] 3. High computational and analytical overhead: Image information requires analysis and judgment through complex algorithms. Current inspection image acquisition methods generate a large amount of inspection data in the form of images and videos per device or cabinet, which consumes more computing resources such as central processing unit (CPU) and graphics processing unit (GPU), making analysis difficult and resource consumption high.
[0025] Ultimately, the above problems stem from the diverse indicator lights on the devices, making image acquisition difficult.
[0026] The data center inspection method provided in this application embodiment determines whether the target inspection point is a first-time inspection point when the inspection equipment arrives at the target inspection point. If the target inspection point is not a first-time inspection point, the method acquires the exposure strategy and historical images corresponding to the target inspection point. It then acquires images of the indicator lights corresponding to the target inspection point according to the exposure strategy, obtaining newly acquired images. Finally, it determines the inspection result of the indicator lights based on the historical images and the newly acquired images. The data center inspection method provided in this application embodiment significantly reduces the number of images acquired by using an appropriate exposure strategy for each inspection point, thereby saving resources consumed in image acquisition during the inspection process.
[0027] In one exemplary instance, determining whether the target inspection point is a first-time inspection point includes: First, obtain the inspection mark information of the target inspection point; Secondly, based on the inspection mark information of the target inspection point, it is determined whether the target inspection point is a first-time inspection point or a non-first-time inspection point.
[0028] For example, the inspection mark information of the target inspection point is information that indicates whether the target inspection point is the first inspection point. Specifically, it can be identified by numerical values, such as 0 and non-zero. 0 indicates the first inspection point, and non-zero indicates the non-first inspection point.
[0029] In one exemplary instance, such as Figure 2 As shown, the method further includes: Step 201: If the target inspection point is the first inspection point, then collect multiple short-exposure images and one long-exposure image of the target inspection point; wherein, the short-exposure image is an image with an exposure time less than a preset time, and the long-exposure image is an image with an exposure time greater than the preset time. Step 202: Determine the status of the indicator light corresponding to the target inspection point based on the obtained multiple short-exposure images and one long-exposure image; Step 203: Determine the exposure strategy for the target inspection point based on the obtained status of the indicator lights.
[0030] In one exemplary instance, the indicator light's states include: constantly lit, off, and flashing.
[0031] In one exemplary instance, the exposure strategy includes: an image capture mode, wherein the image acquisition method corresponding to the constant-on state and the capture mode corresponding to the off state may include: a short-exposure capture mode; and the capture mode corresponding to the flashing state may include: a long-exposure capture mode. That is, if the indicator light is in the constant-on state, the short-exposure capture mode is determined to be used; if the indicator light is in the off state, the short-exposure capture mode is determined to be used; and if the indicator light is in the flashing state, the long-exposure capture mode is determined to be used.
[0032] In one exemplary instance, the method further includes: If the indicator light is in the flashing state, then the flashing interval of the indicator light is estimated based on the multiple short-exposure images; The step of determining the exposure strategy for the target inspection point based on the obtained indicator light status further includes: Set the exposure time for the target inspection point so that the exposure time is not less than the flashing interval.
[0033] For example, the exposure time is determined based on the flashing period of the indicator light corresponding to the current inspection point, and the exposure time is not shorter than the flashing period of the indicator light corresponding to the current inspection point. In one exemplary instance, such as Figure 3 As shown, estimating the flashing interval of the indicator light based on the multiple short-exposure images includes: Step 301: Obtain the acquisition time of multiple short-exposure images of the target inspection point, and sort the multiple short-exposure images according to the acquisition time; Step 302: From the sorted short exposure images, obtain any short exposure image with an indicator light lit as the first target short exposure image. Then, from the short exposure images other than the first target short exposure image, obtain the short exposure image that is closest to the acquisition time of the first target exposure image and has an indicator light lit as the second target short exposure image. Step 303: Obtain the flashing cycle of the indicator light corresponding to the target inspection point based on the acquisition time of the first target short exposure image and the acquisition time of the second target short exposure image.
[0034] In one exemplary instance, the step of determining the status of the indicator light corresponding to the target inspection point based on multiple short-exposure images and one long-exposure image is as follows: Figure 4 As shown, it includes: Step 401: When the indicator light is lit in each of the multiple short exposure images and the indicator light is lit in the long exposure image, determine that the state of the indicator light corresponding to the current inspection point is the constant-on state. Step 402: When the indicator light is not lit in each of the multiple short exposure images and the indicator light is not lit in the long exposure image, determine that the indicator light corresponding to the current inspection point is in the off state. Step 403: When the indicator light is lit in at least one of the multiple short exposure images, the indicator light is not lit in at least one of the short exposure images, and the indicator light is flashing in the long exposure image, determine that the state of the indicator light corresponding to the current inspection point is the flashing state.
[0035] This application also provides a data center inspection method applied to intelligent inspection equipment. It can acquire inspection images of a single device or a single cabinet in a single shot, which can improve the inspection efficiency of dynamic indicator lights in the inspection images, reduce the number of images required for a single inspection, and thus reduce the consumption of computing and storage resources.
[0036] The data center inspection method provided in this application embodiment is as follows: Figure 5 As shown, it includes: Step 501: When the inspection equipment reaches the target inspection point, determine whether the target inspection point is the first inspection point. If it is the first inspection point, proceed to step 502; if it is not the first inspection point, proceed to step 507. The determination method can be to scan the previous inspection image of this location; if it is empty, it is determined to be the first inspection. Alternatively, other methods such as manually specifying the location can be used for determination.
[0037] Step 502: If it is the first inspection point, perform the initial inspection image acquisition, that is, multiple short exposures and one long exposure. Step 503: Perform inspection image analysis based on the acquired images, i.e., compare multiple short exposures with one long exposure; Step 504: Determine whether the indicator light status is consistent in multiple short exposures and one long exposure; if consistent, proceed to step 505; if inconsistent, proceed to step 506. Step 505: Record the points to be inspected as short exposures; Step 506: Mark the points to be inspected as long exposure points; Step 507: Determine if it is a long exposure point. If it is a long exposure point, proceed to step 508. If it is not a long exposure point, proceed to step 509. Step 508: Acquire long exposure image and proceed to step 510; Step 509: Acquire a short-exposure image and proceed to step 510; Step 510: Compare with historical inspection images; The data center inspection method provided in this application requires initial image acquisition for any location identified as undergoing its first inspection. This acquisition includes multiple short-exposure images and one 2-4 second long-exposure image for further evaluation. After initial image acquisition, it's necessary to determine if a location has a flashing indicator light. This is done by comparing the indicator light status of the acquired short-exposure and long-exposure images. If the indicator lights are on / off or the colors are the same, the location is identified as a short-exposure point and marked accordingly. If they are different, the location is identified as a long-exposure point and marked accordingly. If the location is not being inspected for the first time, the process proceeds to the next step of long-exposure point evaluation. If the location is marked as a long-exposure point, a long-exposure image is acquired; if it's marked as a short-exposure point, a short-exposure image is acquired. The acquired images are then compared with historically acquired images to form the inspection result for that location.
[0038] The data center inspection method provided in this application has two main features: first, it automatically determines whether an inspection point is being inspected for the first time and identifies the inspection type of the inspection point; second, it innovatively uses long exposure technology of cameras to collect inspection images during the inspection process, solving the problem of low success rate in capturing the status of flashing indicator lights with ordinary shooting, and thus solving the problem of needing multiple consecutive shots to capture the lighting of flashing indicator lights, which leads to a large number of images occupying storage space and increasing the computing power of the inspection system.
[0039] Compared with the prior art, the data center inspection method provided in this application has the following advantages: 1. The data center inspection method provided in this application is an image acquisition method applied to intelligent inspection equipment (including intelligent inspection robots). Currently, most intelligent inspection equipment uses ordinary photography to capture images of the inspected objects. In current data centers, some indicator lights on devices such as routers, switches, firewalls, and servers display their operating status by flashing (periodic illumination and extinguishing). Ordinary photography may perform image acquisition during the period when the indicator light is off, resulting in an inaccurate representation of the device's operating status. Current solutions on the market solve this problem by taking multiple consecutive shots, but the success rate cannot reach 100%. This solution uses long exposure photography technology to extend the exposure time of the camera sensor, covering the flashing cycle of the indicator light, thereby achieving a 100% probability of capturing the flashing indicator light in a single image.
[0040] 2. The data center inspection method provided in this application uses a simple and efficient exposure type, which shortens the time for capturing inspection images and improves the efficiency of inspection work. Except for the initial inspection, subsequent repeated inspections only require a single image to complete the image acquisition of one inspection point each time, reducing the storage capacity required for image storage and the CPU and GPU computing power required for image analysis.
[0041] The data center inspection method provided in this application is triggered by actual needs and offers an efficient image acquisition method. Its main technical features are as follows: 1. Long exposure technology is used to collect image information of the inspection target, which greatly improves the accuracy of capturing the status of flashing indicator lights in a single photo.
[0042] 2. The data center inspection method provided in this application provides a method for determining the appropriate camera exposure time to collect images of the inspection target. This method can effectively reduce the subsequent image acquisition time of the inspection target and improve image acquisition efficiency.
[0043] This application embodiment also provides a data center inspection device, including: a memory and a processor, wherein the memory is used to store an executable program; The processor is used to read and execute the executable program to implement the data center inspection method described in any of the above embodiments.
[0044] The data center inspection device provided in this application, when the inspection equipment reaches a target inspection point, determines whether the target inspection point is a first-time inspection point; if the target inspection point is not a first-time inspection point, it acquires the exposure strategy and historical acquired images corresponding to the target inspection point; it acquires images of the indicator lights corresponding to the target inspection point according to the exposure strategy to obtain newly acquired images; and it determines the inspection result of the indicator lights based on the historical acquired images and the newly acquired images. Because an appropriate exposure strategy is used for image acquisition at each inspection point, the number of images acquired is greatly reduced, thereby saving resources consumed in image acquisition during the inspection process.
[0045] This application also provides a computer-readable storage medium storing computer-executable commands, which are used to execute the data center inspection method described in any of the above embodiments.
[0046] It should be understood that a processor can be a Central Processing Unit (CPU), or it can be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), off-the-shelf programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor, etc.
[0047] Memory may include read-only memory and random access memory, and provides instructions and data to the processor. A portion of the memory may also include non-volatile random access memory. For example, memory may also store information about the device type.
[0048] In implementation, the processing performed by the terminal device can be accomplished through integrated logic circuits in the processor's hardware or through software instructions. That is, the steps of the method disclosed in this application can be executed by a hardware processor, or by a combination of hardware and software modules within the processor. The software modules can reside in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other storage media. This storage medium is located in memory, and the processor reads information from the memory and, in conjunction with its hardware, completes the steps of the aforementioned method. To avoid repetition, further details are omitted here.
[0049] This application describes several embodiments, but these descriptions are exemplary and not restrictive, and it will be apparent to those skilled in the art that many more embodiments and implementations are possible within the scope of the embodiments described herein. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are also possible. Unless specifically limited, any feature or element of any embodiment may be used in combination with, or may replace, any feature or element of any other embodiment.
[0050] This application includes and contemplates combinations of features and elements known to those skilled in the art. The embodiments, features, and elements disclosed in this application may also be combined with any conventional features or elements to form a unique inventive scheme as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive schemes to form another unique inventive scheme as defined by the claims. Therefore, it should be understood that any feature shown and / or discussed in this application may be implemented individually or in any suitable combination. Therefore, the embodiments are not limited except by the limitations imposed by the appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.
[0051] Furthermore, in describing representative embodiments, the specification may have presented methods and / or processes as a specific sequence of steps. However, the method or process should not be limited to the specific order of steps described herein, to the extent that it does not depend on such a specific order. As will be understood by those skilled in the art, other sequences of steps are also possible. Therefore, the specific order of steps set forth in the specification should not be construed as a limitation of the claims. Moreover, the claims concerning the method and / or process should not be limited to the steps performed in the written order, and those skilled in the art will readily understand that these orders can be varied and still remain within the spirit and scope of the embodiments of this application.
Claims
1. A data center inspection method, characterized in that, The method is executed by a mobile inspection device, which periodically inspects the data center according to a preset number of inspection points; the method includes: When the inspection equipment reaches the target inspection point, determine whether the target inspection point is the first inspection point. If the target inspection point is not the first inspection point, obtain the exposure strategy and historical images corresponding to the target inspection point; According to the exposure strategy, images of the indicator lights corresponding to the target inspection points are acquired to obtain newly acquired images; The inspection results of the indicator lights are determined based on the historical images and the newly acquired images.
2. The method according to claim 1, characterized in that, Determining whether the target inspection point is a first-time inspection point includes: Obtain the inspection marker information of the target inspection point; Based on the inspection mark information of the target inspection point, determine whether the target inspection point is a first-time inspection point or a non-first-time inspection point.
3. The method according to claim 1, characterized in that, The method further includes: If the target inspection point is the first inspection point, then multiple short-exposure images and one long-exposure image of the target inspection point are collected; wherein, the short-exposure image is an image with an exposure time of less than a preset time, and the long-exposure image is an image with an exposure time of more than the preset time; The status of the indicator light corresponding to the target inspection point is determined based on multiple short-exposure images and one long-exposure image. The exposure strategy for the target inspection point is determined based on the status of the obtained indicator lights.
4. The method according to claim 3, characterized in that, The indicator light's state includes any of the following: constantly lit, off, and flashing.
5. The method according to claim 4, characterized in that, The step of determining the exposure strategy for the target inspection point based on the obtained indicator light status includes: If the indicator light is in the constantly lit state, then the short exposure shooting mode is selected. If the indicator light is in the off state, then the short exposure shooting mode is selected. If the indicator light is in the flashing state, then the long exposure shooting mode is selected.
6. The method according to claim 5, characterized in that, The method further includes: If the indicator light is in the flashing state, then the flashing interval of the indicator light is estimated based on the multiple short-exposure images; The step of determining the exposure strategy for the target inspection point based on the obtained indicator light status further includes: Set the exposure time for the target inspection point so that the exposure time is not less than the flashing interval.
7. The method according to claim 6, characterized in that, The step of estimating the flashing interval of the indicator light based on the multiple short-exposure images includes: The acquisition time of multiple short-exposure images of the target inspection point is obtained, and the multiple short-exposure images are sorted according to the acquisition time; From the sorted short exposure images, select any short exposure image with an indicator light lit as the first target short exposure image. Then, from the short exposure images other than the first target short exposure image, select the short exposure image that is closest to the acquisition time of the first target exposure image and has an indicator light lit as the second target short exposure image. The flashing cycle of the indicator light corresponding to the target inspection point is obtained based on the acquisition time of the first target short-exposure image and the acquisition time of the second target short-exposure image.
8. The method according to claim 4, characterized in that, The step of determining the status of the indicator light corresponding to the target inspection point based on multiple short-exposure images and one long-exposure image includes: When the indicator light is lit in each of the multiple short exposure images, and the indicator light is lit in the long exposure image, the state of the indicator light corresponding to the target inspection point is determined to be the constant-on state. If the indicator light is not lit in each of the multiple short exposure images, and the indicator light is not lit in the long exposure image, the state of the indicator light corresponding to the target inspection point is determined to be the off state. When the indicator light is lit in at least one of the multiple short exposure images, the indicator light is not lit in at least one of the short exposure images, and the indicator light is lit in the long exposure image, the state of the indicator light corresponding to the target inspection point is determined to be the flashing state.
9. A data center inspection device, characterized in that, It includes a memory and a processor, wherein the memory is used to store an executable program; The processor is used to read and execute the executable program to implement the data center inspection method as described in any one of claims 1-8.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable commands for performing the data center inspection method as described in any one of claims 1-8.