Radio frequency performance test method and device, electronic equipment and readable storage medium

Abstract

The invention relates to a radio frequency performance test method and device, electronic equipment and a readable storage medium. The method comprises the following steps: acquiring a test result sliding window corresponding to a to-be-tested chip; according to the test result sliding window, obtaining carrier-to-noise ratio test results of a plurality of tested chips in front of the to-be-tested chip; according to the carrier-to-noise ratio test results of the plurality of tested chips, determining a target threshold value for performing radio frequency performance test on the to-be-tested chip; and performing a radio frequency performance test on the to-be-tested chip according to the target threshold value. By adopting the method, the misjudgment on the chip during the radio frequency performance test can be reduced.

Description

Technical Field

[0001] This application relates to the technical field of chip testing, and particularly to a radio frequency performance testing method, apparatus, electronic device, and readable storage medium. Background Art

[0002] In the process of chip mass production testing, radio frequency carrier-to-noise ratio (CNR) testing is one of the key indicators for evaluating the radio frequency performance of chips. In the traditional technology, in the initial stage of chip test development, test data of several batches are obtained, and the initial CNR card value is determined according to the test data. In the subsequent normal chip production process, a fixed threshold (such as ±300) is used as the standard for judging whether the CNR test is qualified. However, in the actual test environment, there may be fluctuations in noise. When the environmental noise increases, using the above method will cause qualified chips to be misjudged as failed. Summary of the Invention

[0003] Based on this, it is necessary to provide a radio frequency performance testing method, apparatus, electronic device, computer-readable storage medium, and computer program product that can avoid misjudgment for the above technical problems.

[0004] In a first aspect, this application provides a radio frequency performance testing method, including:

[0005] Obtain a test result sliding window corresponding to the chip to be tested;

[0006] According to the test result sliding window, obtain the carrier-to-noise ratio test results of multiple tested chips before the chip to be tested;

[0007] According to the carrier-to-noise ratio test results of the multiple tested chips, determine a target threshold for radio frequency performance testing of the chip to be tested;

[0008] Perform radio frequency performance testing on the chip to be tested according to the target threshold.

[0009] In one embodiment, the obtaining the carrier-to-noise ratio test results of multiple tested chips before the chip to be tested according to the test result sliding window includes:

[0010] When the test index corresponding to the chip to be tested exceeds a preset index value, select the carrier-to-noise ratio test results of a preset number of tested chips before the chip to be tested according to the test result sliding window.

[0011] In one embodiment, when the test index corresponding to the chip under test exceeds a preset index value, selecting the carrier-to-noise ratio test results of a preset number of tested chips preceding the chip under test according to the test result sliding window includes:

[0012] If the test index corresponding to the chip under test exceeds the preset index value, check whether the carrier-to-noise ratio test result of the previous chip of the chip under test is valid;

[0013] If the carrier-to-noise ratio (CNR) test result of the previous chip is found to be valid, the CNR test results of the preset number of tested chips are selected according to the sliding window of the test results.

[0014] In one embodiment, the method further includes:

[0015] If the test index corresponding to the chip under test does not exceed the preset index value, the RF performance of the chip under test is tested according to the predetermined initial threshold.

[0016] In one embodiment, the method further includes:

[0017] Obtain the pre-set initial card value and fixed tolerance;

[0018] The initial threshold is obtained based on the initial card value and the fixed tolerance.

[0019] In one embodiment, determining the target threshold for performing RF performance testing on the chip under test based on the carrier-to-noise ratio test results of the plurality of tested chips includes:

[0020] The carrier-to-noise ratio test results of the multiple tested chips are averaged to obtain the target card value corresponding to the chip to be tested.

[0021] The target threshold is obtained based on the target card value and the pre-set fixed tolerance.

[0022] In one embodiment, performing radio frequency performance testing on the chip under test based on the target threshold includes:

[0023] Obtain the carrier-to-noise ratio test results of the chip under test;

[0024] If the carrier-to-noise ratio test result of the chip under test is within the target threshold, then the radio frequency performance test of the chip under test is deemed to have passed.

[0025] In one embodiment, after determining that the radio frequency performance test of the chip under test has passed, the method further includes:

[0026] Record the programming values ​​of the chip under test;

[0027] The chip to be tested is programmed.

[0028] In one embodiment, after obtaining the carrier-to-noise ratio test result of the chip under test, the method further includes:

[0029] If the carrier-to-noise ratio test result of the chip under test is outside the target threshold, the radio frequency performance test of the chip under test is determined to be unsuccessful, and the test failure information of the chip under test is recorded.

[0030] Secondly, this application also provides a radio frequency performance testing apparatus, comprising:

[0031] The acquisition module is used to acquire the test result sliding window corresponding to the chip under test;

[0032] The selection module is used to slide a window based on the test results to obtain the carrier-to-noise ratio test results of multiple tested chips located before the chip under test;

[0033] The determination module is used to determine the target threshold for performing radio frequency performance testing on the chip under test based on the carrier-to-noise ratio test results of the plurality of tested chips;

[0034] The testing module is used to perform radio frequency performance testing on the chip under test according to the target threshold.

[0035] Thirdly, this application also provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the method described in any of the first aspects above.

[0036] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described in any of the first aspects above.

[0037] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the method described in any of the first aspects above.

[0038] The aforementioned radio frequency (RF) performance testing methods, apparatus, electronic devices, computer-readable storage media, and computer program products acquire a sliding window of test results corresponding to the chip under test. Based on the sliding window, they obtain the carrier-to-noise ratio (CNR) test results of multiple previously tested chips located before the chip under test. Based on the CNR test results of the multiple previously tested chips, they determine a target threshold for RF performance testing of the chip under test. Based on the target threshold, they perform RF performance testing on the chip under test. Furthermore, they can dynamically determine the threshold for RF performance testing of the chip under test based on the CNR test results of several previously tested chips. Because this threshold can adapt to changes in ambient noise, it can reduce misjudgments of the chip during RF performance testing. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0040] Figure 1 This is a flowchart illustrating a radio frequency performance testing method in one embodiment;

[0041] Figure 2 This is a flowchart illustrating the radio frequency performance testing method in another embodiment;

[0042] Figure 3 This is a schematic diagram of a sliding window for test results in one embodiment;

[0043] Figure 4 This is a schematic diagram of the chip carrier-to-noise ratio test results in one embodiment;

[0044] Figure 5 This is a flowchart illustrating the radio frequency performance testing method in yet another embodiment;

[0045] Figure 6 This is a structural block diagram of a radio frequency performance testing device in one embodiment;

[0046] Figure 7 This is a diagram of the internal structure of an electronic device in one embodiment. Detailed Implementation

[0047] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0048] It should be noted that the terms "first," "second," etc., used in this application can be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from the second element. The terms "comprising" and "having," and any variations thereof, used in this application, are intended to cover non-exclusive inclusion. The term "multiple" used in this application refers to two or more. The term "and / or" used in this application refers to one of the embodiments, or any combination of multiple embodiments.

[0049] In one exemplary embodiment, such as Figure 1 As shown, a radio frequency performance testing method is provided. This embodiment illustrates the method applied to a terminal, but it is understood that the method can also be applied to a server, and to a system including both a terminal and a server, and implemented through interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0050] Step S102: Obtain the test result sliding window corresponding to the chip under test.

[0051] The chip under test can be a chip whose radio frequency (RF) performance needs to be tested, such as whether its CNR (Constant Radio Frequency) is within a specified range. The test result sliding window is a movable window used to cover historical test results of the chip's RF performance. This window can have a fixed size or a variable size, which is not limited here.

[0052] Optionally, the terminal can determine the sliding window based on the input sliding window size and use that sliding window as the test result sliding window corresponding to the chip under test. For example, if the user inputs a sliding window size of N into the terminal, the terminal can determine a test result sliding window of length N accordingly.

[0053] Step S104: Based on the test results, slide the window to obtain the carrier-to-noise ratio test results of multiple tested chips located before the chip to be tested.

[0054] Among them, "tested chip" refers to a chip that has completed radio frequency performance testing, such as a chip whose CNR has been tested to ensure it meets the requirements. The carrier-to-noise ratio (CNR) test result can be the obtained CNR.

[0055] Optionally, the terminal can store the carrier-to-noise ratio (CNR) test results of each tested chip, and store the CNR test results sequentially according to the order in which the tests were completed. After obtaining the test result sliding window, the terminal can select the CNR test results of several tested chips preceding the current chip from the pre-stored CNR test results based on the test result sliding window. For example, the CNR of chip 1, chip 2, ..., chip M-1 can be tested sequentially to obtain... After determining a test result sliding window of length N (N≤M-1), this sliding window can be used to select the CNR of the N chips preceding the current chip M under test, i.e. .

[0056] Step S106: Based on the carrier-to-noise ratio test results of multiple tested chips, determine the target threshold for RF performance testing of the chip under test.

[0057] The target threshold can be a threshold for determining the radio frequency performance of the chip under test, such as the upper and / or lower limit of CNR.

[0058] Optionally, the terminal can determine the target threshold based on the carrier-to-noise ratio (CNR) test results of multiple chips preceding the chip under test. For example, after obtaining the CNR of N chips preceding the current chip M under test, the mean of the N CNRs can be calculated. The target threshold can then be obtained using the mean and a pre-set fixed tolerance. For instance, the mean can be calculated... Let the fixed tolerance be... Then the upper and lower limits of CNR are obtained as follows: .

[0059] Step S108: Perform RF performance testing on the chip under test according to the target threshold.

[0060] Optionally, the terminal can measure the CNR of the chip under test and determine whether the measured CNR meets the target threshold, thereby realizing the RF performance test of the chip under test. For example, after determining the upper and lower limits of CNR as follows... Then, if the measured CNR of the chip under test is... ,and If the chip under test is found to be a qualified chip, then the chip is determined to be qualified; otherwise, if If the chip is not found to be qualified, it is determined that the chip under test is unqualified.

[0061] The aforementioned RF performance testing method obtains a sliding window of test results corresponding to the chip under test. Based on the sliding window, it obtains the carrier-to-noise ratio (CNR) test results of multiple chips that have been tested before the chip under test. Based on the CNR test results of the multiple tested chips, it determines a target threshold for RF performance testing of the chip under test. Based on the target threshold, it performs RF performance testing on the chip under test. The threshold for RF performance testing of the chip under test can be dynamically determined based on the CNR test results of several tested chips before the chip under test. Since this threshold can adapt to changes in ambient noise, it can reduce misjudgments of the chip during RF performance testing.

[0062] In an exemplary embodiment, step S104 may specifically include: when the test index corresponding to the chip under test exceeds a preset index value, selecting the carrier-to-noise ratio test results of a preset number of tested chips located before the chip under test according to the test result sliding window.

[0063] The test index refers to the number of the chip being tested. For example, if the CNR of chip 1, chip 2, ..., chip M-1 is tested in sequence, the test indices can be recorded as 1, 2, ..., M-1 respectively.

[0064] Optionally, the terminal can determine whether the test index corresponding to the chip under test exceeds a preset index value. If it exceeds the preset index value, it can select the carrier-to-noise ratio (CNR) test results of several chips previously tested, located before the chip under test, based on the test result sliding window. A target threshold is determined based on the CNR test results of these chips, and then the RF performance of the chip under test is tested according to the target threshold. Otherwise, if the test index corresponding to the chip under test does not exceed the preset index value, the RF performance of the chip under test can be directly tested using the preset threshold. For example, an initial threshold can be predetermined, and an index value T can be set. If the test index M of the current chip under test > T, the CNR of N chips preceding the current chip under test can be selected using the sliding window. The target threshold is calculated using the CNR of the N chips, and the RF performance of the current chip under test is tested based on the obtained target threshold. Otherwise, if M ≤ T, the RF performance of the current chip under test can be tested directly using the initial threshold. In some embodiments, the preset index value can be the same size as the test result sliding window, for example, T = N.

[0065] In this embodiment, when the test index corresponding to the chip under test exceeds the preset index value, the carrier-to-noise ratio (CNR) test results of a preset number of tested chips located before the chip under test are selected according to the test result sliding window. When a certain number of tested chips have been accumulated, the target threshold can be determined based on the CNR of each tested chip, thereby increasing the accuracy of the target threshold.

[0066] In an exemplary embodiment, the step of selecting the carrier-to-noise ratio (CNR) test results of a preset number of tested chips preceding the chip under test based on a sliding window of test results when the test index corresponding to the chip under test exceeds a preset index value may specifically include: when the test index corresponding to the chip under test exceeds a preset index value, detecting whether the CNR test result of the chip preceding the chip under test is valid; and when the CNR test result of the chip preceding the chip is detected to be valid, selecting the CNR test results of a preset number of tested chips based on a sliding window of test results.

[0067] Optionally, if the terminal detects that the test index corresponding to the chip under test exceeds a preset index value, it can continue to check whether the carrier-to-noise ratio (CNR) test result of the previous chip is valid. If valid, it can continue to select the CNR test results of several previously tested chips located before the current chip under test according to the test result sliding window, determine the target threshold based on the CNR test results of multiple previously tested chips, and perform RF performance testing on the chip under test according to the target threshold. Otherwise, if the CNR test result of the previous chip is detected to be invalid, the CNR test result of the previous chip can be discarded, and the chip performance test can be terminated. For example, if the test index M of the current chip under test is greater than T, and the CNR of the previous chip M-1 is a garbage value (e.g., ...), If ), then discard. And terminate chip performance testing, only When it is not a garbage value, select And calculate the mean. Based on the obtained target threshold Radio frequency performance tests were performed on chip M.

[0068] In this embodiment, when the test index corresponding to the chip under test exceeds the preset index value, the carrier-to-noise ratio test result of the previous chip is checked to see if it is valid. If the carrier-to-noise ratio test result of the previous chip is detected to be valid, the carrier-to-noise ratio test results of a preset number of tested chips are selected according to the test result sliding window. This ensures that the selected carrier-to-noise ratio test results are valid, thereby making the determined target threshold valid.

[0069] In an exemplary embodiment, the above-described radio frequency performance testing method may further include: performing radio frequency performance testing on the chip under test according to a predetermined initial threshold, provided that the test index corresponding to the chip under test does not exceed a preset index value.

[0070] The initial threshold refers to the threshold initially determined for judging the radio frequency performance of the chip under test.

[0071] Optionally, the terminal can predetermine an initial threshold. If the test index corresponding to the chip under test does not exceed the preset index value, the RF performance test of the chip under test is performed directly according to the initial threshold. For example, an initial threshold can be predetermined. ,in For the initially determined card value, set the index value T. If the test index M of the current chip under test is less than or equal to T, then the initial threshold is used directly to perform RF performance testing on the current chip under test to detect... Does it belong to .

[0072] In this embodiment, by performing radio frequency performance testing on the chip under test based on a predetermined initial threshold, provided that the test index corresponding to the chip under test does not exceed a preset index value, the performance of several preceding chips can be tested based on the predetermined initial threshold, ensuring the reliable implementation of chip performance testing.

[0073] In an exemplary embodiment, the above-described radio frequency performance testing method may further include: obtaining a pre-set initial card value and fixed tolerance; and obtaining an initial threshold based on the initial card value and fixed tolerance.

[0074] The initial card value can be an expected CNR value. The fixed tolerance refers to the fixed deviation of the expected CNR.

[0075] Optionally, an initial card value and a fixed tolerance can be preset, and the terminal determines the initial threshold for chip testing based on the preset initial card value and fixed tolerance. For example, the initial card value can be manually set. Fixed tolerance is Then the initial threshold can be .

[0076] In this embodiment, by obtaining a pre-set initial card value and fixed tolerance, an initial threshold is obtained based on the initial card value and fixed tolerance. Performance tests can be performed on the preceding chips based on the pre-determined initial threshold, ensuring the reliable implementation of chip performance testing.

[0077] In an exemplary embodiment, step S106 may specifically include: averaging the carrier-to-noise ratio test results of multiple tested chips to obtain the target card value corresponding to the chip to be tested; and obtaining the target threshold based on the target card value and a pre-set fixed tolerance.

[0078] The target card value can be a dynamically changing expected CNR value.

[0079] Optionally, after obtaining the CNR test results of multiple tested chips preceding the chip under test, the terminal can determine the average of the CNR test results of the multiple tested chips as the target card value, and determine the target threshold for chip performance testing based on the target card value and a fixed tolerance. For example, after obtaining the CNR of N chips preceding chip M, it can calculate... The average value is used to obtain the target card value. If the fixed tolerance is Then the target threshold can be .

[0080] In this embodiment, the target card value corresponding to the chip to be tested is obtained by averaging the CNR test results of multiple tested chips. Based on the target card value and the pre-set fixed tolerance, the target threshold is obtained. The test threshold can be dynamically updated based on the CNR test results of several chips before the current chip, thereby increasing the accuracy of the chip performance test results.

[0081] In an exemplary embodiment, step S108 may specifically include: obtaining the carrier-to-noise ratio (CNR) test result of the chip under test; if the CNR test result of the chip under test is within the target threshold, then the RF performance test of the chip under test is determined to be passed.

[0082] Optionally, after obtaining the carrier-to-noise ratio (CNR) test result of the chip under test, the terminal can detect whether the CNR test result is within the target threshold. If it is within the target threshold, the RF performance test of the chip under test is deemed to have passed; otherwise, if the CNR test result of the chip under test is not within the target threshold, the RF performance test of the chip under test is deemed to have failed. For example, if the measured CNR of the current chip under test is... ,and If the chip under test is found to be a qualified chip, then the chip is determined to be qualified; otherwise, if If the chip is not found to be qualified, it is determined that the chip under test is unqualified.

[0083] In this embodiment, by obtaining the carrier-to-noise ratio (CNR) test results of the chip under test, if the CNR test results of the chip under test are within the target threshold, it is determined that the radio frequency performance test of the chip under test has passed. The chip performance can be detected by using dynamically updated test thresholds, thereby improving the accuracy of chip performance test results.

[0084] In an exemplary embodiment, after determining that the radio frequency performance test of the chip under test has passed, the process may further include: recording the programming value of the chip under test; and performing a programming operation on the chip under test.

[0085] Among them, the burning code value refers to the final form after the program code or data is written into the chip.

[0086] Optionally, after the RF performance test of the chip under test passes, the terminal can record the coding value of the chip under test and perform the coding operation on it; otherwise, if the RF performance test of the chip under test fails, the terminal can record the failure information and end the chip performance test process.

[0087] In this embodiment, by recording the coding value of the chip under test, the coding operation is performed on the chip under test. This allows the coding of the chip to be recorded when the chip performance test is passed, ensuring the reliable execution of the code in the chip.

[0088] In an exemplary embodiment, after obtaining the carrier-to-noise ratio (CNR) test result of the chip under test, the method may further include: if the CNR test result of the chip under test is outside the target threshold, then the RF performance test of the chip under test is determined to be unsuccessful, and the test failure information of the chip under test is recorded.

[0089] Among them, test failure information refers to information reflecting that the radio frequency performance test of the chip under test failed.

[0090] Optionally, the terminal can determine that the RF performance test of the chip under test fails if the carrier-to-noise ratio test result does not fall below the target threshold, and record the corresponding test failure information. For example, if If the chip fails to pass the test, it is determined that the chip under test is unqualified, and the information is recorded and the chip performance test process ends.

[0091] In this embodiment, if the carrier-to-noise ratio test result of the chip under test is outside the target threshold, the RF performance test of the chip under test is determined to be unsuccessful, and the test failure information of the chip under test is recorded. This can accurately detect unqualified chips and avoid misjudgment.

[0092] To facilitate a deeper understanding of the embodiments of this application by those skilled in the art, a specific example will be used for illustration below.

[0093] To avoid misjudging qualified chips as faulty, this application provides an RF performance testing system, including: Automatic Test Equipment (ATE), a dynamic threshold calculation module, a test execution module, a result judgment module, and a coding control module. The system uses the dynamic threshold calculation module to analyze the currently measured data in real time, generate the latest adaptive judgment threshold, and the test execution module completes the RF performance test. The result judgment module judges the pass / fail status of the RF performance test results based on the adaptive judgment threshold, and the coding control module is responsible for performing the coding operation on qualified chips.

[0094] In one exemplary embodiment, the radio frequency performance testing method may include the following steps:

[0095] Step S1: Determine whether the chip under test is one of the first N chips (preferably N=20).

[0096] Step S2: If it is the first N chips, use a fixed threshold to perform CNR testing;

[0097] Step S3: If not the first N chips, obtain the CNR test data of the first N chips and calculate its average value as the dynamic offset.

[0098] Step S4: Calculate the dynamic threshold in real time based on the dynamic offset and the preset fixed tolerance (e.g., ±300): Dynamic threshold = Dynamic offset ± Fixed tolerance;

[0099] Step S5: Use the latest adaptive threshold to perform CNR testing on the chip under test;

[0100] Step S6: If the test passes, record the burning value and perform the burning operation; if the test fails, record the failure information and end the process.

[0101] The above-mentioned RF performance testing method adopted:

[0102] Adaptive threshold calculation mechanism: Using sliding window real-time statistical technology, the judgment threshold is automatically adjusted based on the statistical characteristics of the test data of the first N chips under test;

[0103] Adaptive testing strategy: The first N chips are benchmarked using a fixed threshold, and subsequent chips are benchmarked using a dynamic threshold;

[0104] Real-time data processing: Dynamic thresholds are updated and applied in real time during the test process without interrupting the test flow;

[0105] Integrated coding control: The coding operation is automatically triggered after the test is passed, realizing the coordinated control of testing and coding.

[0106] Multi-site parallel processing: Supports multi-port (socket) parallel testing, with each site independently maintaining a dynamic threshold calculation buffer in real time via a sliding window.

[0107] The aforementioned RF performance testing method shifts from the traditional fixed threshold approach to an adaptive threshold approach based on sliding window technology; from static judgment to dynamic judgment based on the most recent N historical data; from ignoring environmental changes to actively adapting to environmental fluctuations; and from a single standard to a real-time updated judgment standard. This significantly improves test yield. Experimental data shows that RF test yield loss can be reduced from 10.6% to 4.07%, and in interference testing scenarios, yield loss can be reduced from 37.5% to 5.7%. Furthermore, it enhances test stability, as the dynamic threshold adapts to changes in environmental noise, reducing misjudgments caused by sudden interference; improves test efficiency, achieving more accurate test judgments with almost no increase in test time; reduces production costs, minimizing chip waste due to misjudgments and increasing capacity utilization; reduces the need for retesting when overall product yield is too low, and lowers the initial development costs of the chip test environment; in addition, it has good applicability and can be widely applied to various chip RF performance testing scenarios, especially suitable for mass production environments; and it enables intelligent testing, making the testing process more intelligent and accurate through data-driven threshold adjustment.

[0108] Figure 2A flowchart illustrating a radio frequency performance testing method is provided. Based on... Figure 2 After the RF performance test begins, the electronic fuse (eFuse) configuration file can be loaded first. The target configuration bit is found by traversal and written to the register. Then, the device under test (DUT) is tested against the test small signal. The ATE records the performance index data. If the ATE determines that the performance index data exceeds the limit value, the test is deemed to have failed and the process ends. If the ATE determines that the performance index data does not exceed the limit value, and it is the first test, the DUT is not among the first 20, and the previous chip is not a garbage value, then the average of the CNR measurement values ​​of the previous 20 chips is taken as the dynamic offset, and the dynamic threshold (limit) is obtained as dynamic offset ± 300. Based on the dynamic threshold, it is detected whether the CNR of the current DUT exceeds the limit value, that is, whether the CNR of the current DUT is within the dynamic threshold. If it exceeds the limit value, the test is deemed to have failed and the process ends. If it does not exceed the limit value, the code is burned and the code value is verified without burning the code. If the code value is normal, the test passes; if the code value is abnormal, the test fails and the process ends.

[0109] Figure 3 A schematic diagram of a sliding window for test results is provided. Figure 3 Assuming the test result sliding window length is 20, when the chip under test is the 21st chip, the test result sliding window covers chips 1 to 20; when the chip under test is the 22nd chip, the test result sliding window covers chips 2 to 21; when the chip under test is the 23rd chip, the test result sliding window covers chips 3 to 22, and so on.

[0110] Figure 4 A schematic diagram of the chip's carrier-to-noise ratio test results is provided. According to... Figure 4 When using a traditional fixed threshold of ±300, the chip is easily misjudged as unqualified in an interference environment. However, the RF performance testing method described in this application, based on adaptive upper and lower thresholds, can avoid yield loss caused by chip misjudgment in both noise-free and interference environments.

[0111] In one exemplary embodiment, such as Figure 5 As shown, a radio frequency performance testing method is provided, which may specifically include the following steps:

[0112] Step S501: Obtain the test result sliding window corresponding to the chip under test;

[0113] Step S502: If the test index corresponding to the chip under test exceeds the preset index value, select the carrier-to-noise ratio test results of a preset number of tested chips located before the chip under test according to the test result sliding window.

[0114] Step S503: Average the carrier-to-noise ratio test results of multiple tested chips to obtain the target card value corresponding to the chip to be tested.

[0115] Step S504: Based on the target card value and the preset fixed tolerance, obtain the target threshold for RF performance testing of the chip under test;

[0116] Step S505: Obtain the carrier-to-noise ratio (CNR) test result of the chip under test. If the CNR test result of the chip under test is within the target threshold, the RF performance test of the chip under test is deemed to have passed.

[0117] Optionally, the terminal can obtain a test result sliding window. If the test index of the chip under test does not exceed a preset index value (e.g., 20), the RF performance test of the chip under test can be performed according to a predetermined initial threshold. Otherwise, if the test index of the chip under test exceeds the preset index value, the CNR test results of several previously tested chips can be selected according to the test result sliding window, and the average of these CNR values ​​can be calculated to obtain the target card value. The target card value ± a fixed tolerance is used to obtain the target threshold. For example, the target threshold can be [target card value - fixed tolerance, target card value + fixed tolerance]. Then, the RF performance test of the chip under test can be performed according to the target threshold. If the CNR test result of the chip under test is within the target threshold, the RF performance test of the chip under test is deemed to have passed and the chip is qualified. If the CNR test result of the chip under test is not within the target threshold, the RF performance test of the chip under test is deemed to have failed and the chip is unqualified.

[0118] The above-mentioned RF performance testing method can dynamically determine the threshold for RF performance testing of the chip under test based on the CNR test results of several previously tested chips. Since this threshold can adapt to changes in ambient noise, it can reduce misjudgments of the chip during RF performance testing.

[0119] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages in other steps. It is understood that the steps in different embodiments can be freely combined as needed, and all non-contradictory solutions formed by such combinations are within the scope of protection of this application.

[0120] Based on the same inventive concept, this application also provides an RF performance testing apparatus for implementing the RF performance testing method described above. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations in one or more RF performance testing apparatus embodiments provided below can be found in the limitations of the RF performance testing method described above, and will not be repeated here.

[0121] In one exemplary embodiment, such as Figure 6 As shown, a radio frequency performance testing device is provided, including: an acquisition module 602, a selection module 604, a determination module 606, and a testing module 608, wherein:

[0122] The acquisition module 602 is used to acquire the test result sliding window corresponding to the chip under test;

[0123] The selection module 604 is used to slide a window based on the test results to obtain the carrier-to-noise ratio test results of multiple tested chips located before the chip under test;

[0124] The determining module 606 is used to determine a target threshold for performing radio frequency performance testing on the chip under test based on the carrier-to-noise ratio test results of the plurality of tested chips.

[0125] The test module 608 is used to perform radio frequency performance testing on the chip under test according to the target threshold.

[0126] In an exemplary embodiment, the selection module 604 is further configured to select the carrier-to-noise ratio test results of a preset number of tested chips preceding the chip under test, based on the test result sliding window, when the test index corresponding to the chip under test exceeds a preset index value.

[0127] In an exemplary embodiment, the selection module 604 is further configured to, when the test index corresponding to the chip under test exceeds the preset index value, detect whether the carrier-to-noise ratio test result of the previous chip of the chip under test is valid; and when the carrier-to-noise ratio test result of the previous chip is detected to be valid, select the carrier-to-noise ratio test results of the preset number of tested chips according to the test result sliding window.

[0128] In an exemplary embodiment, the test module 608 is further configured to perform radio frequency performance testing on the chip under test according to a predetermined initial threshold, provided that the test index corresponding to the chip under test does not exceed a preset index value.

[0129] In an exemplary embodiment, the test module 608 is further configured to obtain a pre-set initial card value and a fixed tolerance; and to obtain the initial threshold based on the initial card value and the fixed tolerance.

[0130] In an exemplary embodiment, the determining module 606 is further configured to average the carrier-to-noise ratio test results of the plurality of tested chips to obtain the target card value corresponding to the chip to be tested; and to obtain the target threshold based on the target card value and a pre-set fixed tolerance.

[0131] In an exemplary embodiment, the test module 608 is further configured to obtain the carrier-to-noise ratio (CNR) test result of the chip under test; if the CNR test result of the chip under test is within the target threshold, the RF performance test of the chip under test is determined to be passed.

[0132] In an exemplary embodiment, the radio frequency performance testing apparatus further includes a coding module for recording the coding value of the chip under test and performing a coding operation on the chip under test.

[0133] In an exemplary embodiment, the test module 608 is further configured to determine that the radio frequency performance test of the chip under test fails if the carrier-to-noise ratio test result of the chip under test is outside the target threshold, and to record the test failure information of the chip under test.

[0134] Each module in the aforementioned RF performance testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of the electronic device in hardware form or independent of it, or stored in the memory of the electronic device in software form, so that the processor can call and execute the corresponding operations of each module.

[0135] In one exemplary embodiment, an electronic device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 7 As shown, this electronic device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The input / output interface is used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, Near Field Communication (NFC), or other technologies. When the computer program is executed by the processor, it implements a radio frequency performance testing method. The display unit is used to form a visually visible image and can be a display screen, projection device, or virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the electronic device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the electronic device, or external keyboards, touchpads, or mice, etc.

[0136] Those skilled in the art will understand that Figure 7 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the electronic device to which the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0137] In one exemplary embodiment, an electronic device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0138] In one exemplary embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above-described method embodiments.

[0139] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0140] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0141] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0142] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0143] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for testing radio frequency performance, characterized in that, The method includes: Obtain the test result sliding window corresponding to the chip under test; Based on the test results sliding window, the carrier-to-noise ratio test results of multiple tested chips located before the chip under test are obtained; Based on the carrier-to-noise ratio test results of the plurality of tested chips, a target threshold for performing RF performance testing on the chip under test is determined. The radio frequency performance of the chip under test is tested according to the target threshold.

2. The method according to claim 1, characterized in that, The step of obtaining the carrier-to-noise ratio test results of multiple tested chips located before the chip under test by sliding a window based on the test results includes: If the test index corresponding to the chip under test exceeds the preset index value, the carrier-to-noise ratio test results of a preset number of tested chips located before the chip under test are selected according to the test result sliding window.

3. The method according to claim 2, characterized in that, When the test index corresponding to the chip under test exceeds a preset index value, the carrier-to-noise ratio test results of a preset number of tested chips preceding the chip under test are selected according to the test result sliding window, including: If the test index corresponding to the chip under test exceeds the preset index value, check whether the carrier-to-noise ratio test result of the previous chip of the chip under test is valid; If the carrier-to-noise ratio (CNR) test result of the previous chip is found to be valid, the CNR test results of the preset number of tested chips are selected according to the sliding window of the test results.

4. The method according to claim 1, characterized in that, The method further includes: If the test index corresponding to the chip under test does not exceed the preset index value, the RF performance of the chip under test is tested according to the predetermined initial threshold.

5. The method according to claim 4, characterized in that, The method further includes: Obtain the pre-set initial card value and fixed tolerance; The initial threshold is obtained based on the initial card value and the fixed tolerance.

6. The method according to claim 1, characterized in that, The step of determining the target threshold for RF performance testing of the chip under test based on the carrier-to-noise ratio test results of the plurality of tested chips includes: The carrier-to-noise ratio test results of the multiple tested chips are averaged to obtain the target card value corresponding to the chip to be tested. The target threshold is obtained based on the target card value and the pre-set fixed tolerance.

7. The method according to claim 1, characterized in that, The step of performing radio frequency performance testing on the chip under test according to the target threshold includes: Obtain the carrier-to-noise ratio test results of the chip under test; If the carrier-to-noise ratio test result of the chip under test is within the target threshold, then the radio frequency performance test of the chip under test is deemed to have passed.

8. The method according to claim 7, characterized in that, After determining that the radio frequency performance test of the chip under test has passed, the method further includes: Record the programming values ​​of the chip under test; The chip to be tested is programmed.

9. The method according to claim 7, characterized in that, After obtaining the carrier-to-noise ratio test results of the chip under test, the method further includes: If the carrier-to-noise ratio test result of the chip under test is outside the target threshold, the radio frequency performance test of the chip under test is determined to be unsuccessful, and the test failure information of the chip under test is recorded.

10. A radio frequency performance testing device, characterized in that, The device includes: The acquisition module is used to acquire the test result sliding window corresponding to the chip under test; The selection module is used to slide a window based on the test results to obtain the carrier-to-noise ratio test results of multiple tested chips located before the chip under test; The determination module is used to determine the target threshold for performing radio frequency performance testing on the chip under test based on the carrier-to-noise ratio test results of the plurality of tested chips; The testing module is used to perform radio frequency performance testing on the chip under test according to the target threshold.

11. An electronic device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 9.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 9.

13. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 9.

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