Test board, test equipment and test method
CN121963829APending Publication Date: 2026-05-01SHENZHEN LONGSYS ELECTRONICS CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN LONGSYS ELECTRONICS CO LTD
- Filing Date
- 2024-10-23
- Publication Date
- 2026-05-01
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Figure CN121963829A_ABST
Abstract
The invention discloses a test board, test equipment and a test method, relates to the technical field of chip test, and aims to solve the problem of how to improve the chip test efficiency. The test board comprises a test circuit, a controller and a chip slot. The chip slot is used for inserting a chip to be tested. And the test circuit is electrically connected with the controller and the chip slot, and is used for receiving an assistant test instruction from the controller and assisting the controller to test the chip to be tested according to the assistant test instruction. The controller comprises a chip interface, and the chip interface is used for communicating with a chip to be tested. The controller stores test firmware, and the controller is used for executing the test firmware, sending a test mode instruction to the to-be-tested chip through the chip interface, and sending an auxiliary test instruction to the test circuit. The test mode instruction is used for indicating that the to-be-tested chip is in a target test mode. The test assisting instruction is used for instructing the test circuit to assist the controller in executing the test of the chip to be tested.
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