Testing device for circuit board processing

Abstract

The invention belongs to the technical field of circuit board testing, and particularly relates to a testing device for circuit board processing, which comprises a control bottom table, an operation table is arranged at the upper end of the control bottom table, a supporting side wall is arranged on the side wall of the operation table, a testing structure is arranged on the surface of the operation table, and an electric control box is arranged at the upper end of the testing structure. An adjusting structure is arranged at one end of the console surface close to the testing structure; the testing structure comprises a jig, the jig is rotationally connected to the surface of the operation table, and a telescopic shaft is arranged at the lower end of the electric control box. By arranging the adjusting structure, the abutting roller can independently transfer and collect qualified products and defective products after detection of the circuit board is completed, and the abutting roller can automatically clean the jig after the defective products are detected, so that impurities such as metal chips, conductive adhesives and oxide layers falling off due to contact with the probes can be removed in time, and the detection efficiency of the circuit board is improved. And secondary attachment to the surface of a qualified circuit board or a probe is avoided, so that the repetitive short circuit defect caused by impurity accumulation is reduced.

Description

Technical Field

[0001] This invention belongs to the field of circuit board testing, specifically a testing device for circuit board processing. Background Technology

[0002] Because solder slag can easily connect with electronic components during the production and soldering of circuit boards, it is necessary to test the circuit boards. This process is a crucial quality inspection step in the electronic manufacturing process. Its core purpose is to test and verify the conductivity, insulation and functional integrity of the circuit boards to ensure that the products meet the design specifications and reliability requirements.

[0003] An existing circuit board testing device precisely fixes the circuit board to a fixture, establishes electrical connections using probes, and sequentially performs short-circuit scanning, functional performance verification, and environmental stress simulation testing. The system then automatically generates a test report. However, during continuous testing of multiple circuit boards, the lack of an independent sorting and transfer mechanism for qualified and defective products not only extends the work cycle but also increases rework costs due to the risk of mixed materials. Furthermore, when short-circuit defects caused by residual metal shavings, conductive adhesive, or oxide layers on the circuit board surface are detected, these impurities easily detach and adhere to the fixture surface during repeated probe contact. If not cleaned promptly, other circuit boards may be misjudged as having short-circuit faults due to contact with residual impurities on the fixture during subsequent testing. This leads to two consequences: first, qualified products are incorrectly identified as defective, resulting in material waste and reduced production efficiency; second, circuit boards with genuine design or process defects are not identified, allowing them to proceed to the next process step.

[0004] Therefore, the present invention provides a testing device for circuit board processing. Summary of the Invention

[0005] In order to overcome the shortcomings of the prior art, at least one technical problem raised in the background art is solved.

[0006] The technical solution adopted by this invention to solve its technical problem is as follows: A testing device for circuit board processing according to this invention includes a control base, an operating table at the upper end of the control base, a supporting sidewall on the side wall of the operating table, a testing structure on the surface of the operating table, an electrical control box at the upper end of the testing structure, and an adjustment structure at one end of the operating table surface near the testing structure; the testing structure includes a fixture rotatably connected to the surface of the operating table, a telescopic shaft at the lower end of the electrical control box, and a testing pressure plate at the lower end of the telescopic shaft; the adjustment structure includes an adjustment frame slidably connected up and down to the surface of the supporting sidewall, a moving block slidably connected to the inner wall of the adjustment frame, and a surface of the moving block... The fixture has a sliding frame with a sliding shaft inside. A slider is slidably connected to the surface of the sliding shaft, and a compression spring is fitted on the surface of the sliding shaft. A rotating rod is rotatably connected to one end of the slider, and an abutment roller is provided at one end of the rotating rod. A conveyor belt is rotatably connected to one end of the adjusting frame, and a telescopic cylinder is connected to one end of the moving block. Several adjusting slots are opened on the surface of the fixture. A first positioning block, a second positioning block, and two third positioning blocks are respectively provided on the surface of the operating table, and the two third positioning blocks slide inside the operating table. A support strip is provided on the surface of the third positioning blocks. A collection cavity is provided at the end of the operating table near the fixture. An abutment cylinder is slidably connected inside the operating table and is in contact with the fixture.

[0007] Preferably, the test structure further includes: a base plate disposed on the upper end of the operating table; a plurality of limiting rods disposed on the surface of the operating table, wherein a connecting layer is slidably connected to the surfaces of the plurality of limiting rods, and the connecting layer is connected to the test pressure plate; the adjustment structure further includes: a rotating shaft disposed at one end of the fixture, and the rotating shaft rotates on the upper end of the base plate; a first tooth block disposed on the surface of the second positioning block; a first gear disposed on the surface of the rotating shaft, and the first gear meshes with the first tooth block; and a fixed shaft disposed on the surface of the supporting sidewall, wherein the adjustment frame slides on the surface of the fixed shaft.

[0008] Preferably, the surfaces of the first positioning block, the second positioning block, and the third positioning block are all provided with auxiliary balls.

[0009] Preferably, an adjusting rod is provided inside the upper end of the base plate, a sliding rod is slidably connected to the surface of the adjusting rod, one end of the sliding rod is connected to a telescopic frame, and the second positioning block slides inside the telescopic frame.

[0010] Preferably, an adjusting spring is fitted onto the surface of the adjusting rod, and one end of the adjusting spring is connected to the slide rod.

[0011] Preferably, the surface of the support strip is provided with an auxiliary pad.

[0012] Preferably, the surface of the rotating rod is provided with a plurality of placement grooves, an adjustment shaft is provided on one side of the placement groove, a second tooth block is rotatably connected to the surface of the adjustment shaft, and a plurality of third tooth blocks are provided on the side wall of the fixture, and the second tooth blocks mesh with the third tooth blocks during operation.

[0013] Preferably, a return spring is fitted onto the surface of the adjusting shaft, and the return spring is connected to the second tooth block.

[0014] Preferably, a transfer door is slidably connected to the upper end of the collection cavity.

[0015] Preferably, the lower end of the adjustment frame is provided with a second rack, the inside of the operating table is rotatably connected with a second gear, and the second rack meshes with the second gear; one end of the transfer door is provided with a first rack, and the first rack meshes with the second gear.

[0016] The beneficial effects of this invention are as follows: 1. The circuit board processing testing device of the present invention, by setting an adjustment structure, enables the abutment roller to separately transfer and collect qualified products and defective products after the circuit board inspection is completed. Furthermore, after the defective products are detected, the abutment roller can automatically clean the fixture, which can promptly remove impurities such as metal shavings, conductive adhesive and oxide layer that have fallen off the probe, and prevent them from adhering to the surface of qualified circuit boards or probes again, thereby reducing repetitive short circuit defects caused by the accumulation of impurities.

[0017] 2. The circuit board processing testing device of the present invention, by setting an auxiliary ball, can guide and automatically correct the circuit board when the circuit board is placed on the surface of the fixture, and the rolling friction can reduce resistance, so as to realize the circuit board quickly and accurately return to its original position.

[0018] 3. The circuit board processing testing device of the present invention, by setting a second gear, in the initial state, the transfer door seals the collection chamber, thereby preventing impurities in the outside air from entering the collection chamber. When a defective product is detected and needs to be transferred, the adjusting frame will move downward. At this time, the second rack located at the lower end of the adjusting frame will mesh with the second gear, thereby driving the first rack to move. Since the first rack is connected to the transfer door, the transfer door will automatically open at this time to facilitate the transfer of the circuit board. Attached Figure Description

[0019] The invention will now be further described with reference to the accompanying drawings.

[0020] Figure 1This is a perspective view of Embodiment 1 of the present invention; Figure 2 This is a partial structural view of Embodiment 1 of the present invention; Figure 3 This is a diagram showing the positions of the base plate and the operating table of the present invention; Figure 4 This is a diagram showing the positions of the fixture and the base plate of the present invention; Figure 5 yes Figure 4 Enlarged view of a portion of point A in the middle; Figure 6 This is a positional diagram of the supporting sidewall and the fixed shaft of the present invention; Figure 7 yes Figure 6 Enlarged view of a section at point B in the middle; Figure 8 This is a working diagram of the contact roller and fixture of the present invention; Figure 9 This is a connection diagram of the rotating rod and the second toothed block of the present invention; Figure 10 This is a diagram showing the positions of the transfer door and the adjustment frame of the present invention; In the diagram: 1. Control base; 2. Operating panel; 21. Support sidewall; 3. Electrical control box; 4. Adjustment structure; 401. Adjustment frame; 402. Conveyor belt; 403. Transfer door; 404. First positioning block; 405. Second positioning block; 406. Adjustment slot; 407. Abutment cylinder; 408. Third positioning block; 409. Auxiliary ball; 410. Support bar; 411. Auxiliary pad; 412. Rotating shaft; 413. First toothed block; 414. First gear; 415. Telescopic frame; 416. Adjustment rod; 417. Slide rod; 418. Adjustment spring; 419. Fixed shaft 420. Abutting roller; 421. Second toothed block; 422. Telescopic cylinder; 423. Moving block; 424. Sliding frame; 425. Sliding shaft; 426. Compression spring; 427. Slider; 428. Rotating rod; 429. Third toothed block; 430. Placement slot; 431. Adjusting shaft; 432. Return spring; 433. First rack; 434. Second rack; 435. Second gear; 436. Collection chamber; 5. Test structure; 51. Test pressure plate; 52. Fixture; 53. Telescopic shaft; 54. Limiting rod; 55. Connecting layer; 56. Base plate; 6. Circuit board. Detailed Implementation

[0021] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with specific embodiments.

[0022] Example 1 like Figures 1 to 10As shown, an embodiment of the present invention provides a testing device for circuit board processing, including a control base 1, an operating table 2 at the upper end of the control base 1, a supporting sidewall 21 on the side wall of the operating table 2, a testing structure 5 on the surface of the operating table 2, an electrical control box 3 at the upper end of the testing structure 5, and an adjustment structure 4 at one end of the surface of the operating table 2 near the testing structure 5; the testing structure 5 includes a fixture 52 rotatably connected to the surface of the operating table 2, a telescopic shaft 53 at the lower end of the electrical control box 3, and a testing pressure plate 51 at the lower end of the telescopic shaft 53; the adjustment structure 4 includes an adjustment frame 401, which is slidably connected to the surface of the supporting sidewall 21, a moving block 423 slidably connected to the inner wall of the adjustment frame 401, a sliding frame 424 on the surface of the moving block 423, and a sliding shaft 425 inside the sliding frame 424. A slider 427 is slidably connected to the surface of the movable shaft 425. A compression spring 426 is sleeved on the surface of the sliding shaft 425. A rotating rod 428 is rotatably connected to one end of the slider 427. An abutment roller 420 is provided at one end of the rotating rod 428. A conveyor belt 402 is rotatably connected to one end of the adjusting frame 401. A telescopic cylinder 422 is connected to one end of the moving block 423. Several adjusting slots 406 are opened on the surface of the fixture 52. A first positioning block 404, a second positioning block 405 and two third positioning blocks 408 are respectively provided on the surface of the operating table 2. The two third positioning blocks 408 slide inside the operating table 2. A support strip 410 is provided on the surface of the third positioning block 408. A collection cavity 436 is provided at one end of the operating table 2 near the fixture 52. An abutment cylinder 407 is slidably connected inside the operating table 2 and is in contact with the fixture 52.

[0023] Specifically, this solution provides a circuit board processing testing device, primarily used for inspecting circuit board 6. During use, the operator first inspects the surface of circuit board 6 to quickly identify obvious defects. After initial inspection confirms no problems, the circuit board 6 is placed on the surface of fixture 52, positioned between the first positioning block 404, the second positioning block 405, and the third positioning block 408. Then, the telescopic shaft 53 is activated, causing the test plate 51 to move downwards. The surface of the test plate 51 makes precise contact with the probe circuit board 6. Combined with automated testing technology, electrical performance verification and environmental adaptability assessment are completed, thereby identifying qualified and defective products. Furthermore, during this process, the operator can proceed with the surface inspection of the next circuit board 6. After the test structure 5 completes the test, the data from the rear end of the test structure 5 is linked to the cylinder at the lower end of the contact cylinder 407 and the third positioning block 408 through a sensor signal interface and control command linkage mechanism. The test result triggers the action execution of the cylinder at the lower end of the contact cylinder 407 and the third positioning block 408. The sensor signal interface is responsible for converting the test result into a standard signal that the controller can recognize, ensuring accurate triggering of the action command. When a qualified product is detected, the cylinder at the lower end of the third positioning block 408 will receive a signal and start, thereby driving the contact cylinder 407 to move upward. During the movement, the support bar 410 on the surface of the contact cylinder 407 will contact the circuit board 6, thereby lifting the circuit board 6. At this time, the telescopic cylinder 422 is activated. The telescopic cylinder 422 will drive the sliding frame 424 to move horizontally. The sliding frame 424 will drive the abutment roller 420 to move towards the circuit board 6. Since the abutment roller 420 and the circuit board 6 are at the same horizontal line at this time, the abutment roller 420 will contact the circuit board 6 during the movement and drive the circuit board 6 to move. Then the circuit board 6 will fall on the surface of the conveyor belt 402 and finally be transferred to the next station. When a defective product is detected, the cylinder at the lower end of the abutment cylinder 407 will receive a signal and start, thereby driving the abutment cylinder 407 to move upward and make the abutment cylinder 407 abut against the lower surface of the fixture 52, so that the fixture 52 and the circuit board 6 rotate. During the rotation, since the free area on the surface of the fixture 52 is provided with an adjustment groove, The adjustment slots 406 are used to move the first positioning block 404, the second positioning block 405, and the third positioning block 408 when the fixture 52 rotates, so that it can rotate smoothly. After rotating to a certain angle, the movement of the abutment cylinder 407 stops, and at this time, the telescopic cylinder 422 is activated to move the abutment roller 420 to the highest point of the circuit board 6. At this time, the adjustment frame 401 is activated to move downward. During the movement, the adjustment frame 401 will drive the sliding frame 424 to move together. During the movement, the abutment roller 420 will abut against the circuit board 6, so that the abutment roller 420 will not continue to move downward. At this time, the slider 427 at one end of the abutment roller 420 will slide on the surface of the sliding shaft 425.The slide frame 424 moves horizontally to the upper end of the sliding shaft 425. At this time, the compression spring 426 is also in a taut state. Then, the telescopic cylinder 422 is activated, which will drive the sliding frame 424 to move horizontally. Since the abutting roller 420 is in contact with the circuit board 6 and the compression spring 426 is in a taut state, the abutting roller 420 will always exert pressure on the circuit board 6, thereby driving the circuit board 6 to move towards the lowest end of the fixture 52. Finally, the circuit board 6 will be transferred by the abutting roller 420 into the collection cavity 436 for collection. The surface of the abutting roller 420 is covered with fibers, which also reduces friction on the fixture 52. During the resetting process of the abutting roller 420, since the abutting roller 420 and the fixture 52 are always in contact, the abutting roller 420 will always exert pressure on the circuit board 6, thereby driving the circuit board 6 to move towards the lowest end of the fixture 52. Finally, the circuit board 6 will be transferred by the abutting roller 420 into the collection cavity 436 for collection. The abutting roller 420 has fibers on its surface, which also reduces friction on the fixture 52. During the resetting process of the abutting roller 420, the abutting roller 420 and the fixture 52 are always in contact. Maintaining contact, the rotating rod 428 is activated to rotate, which in turn drives the contact roller 420 to rotate as well. The fine fibers on the surface of the contact roller 420 clean away any metal shavings that may remain on the surface of the fixture 52, thus keeping the fixture 52 clean at all times. By setting the adjustment structure 4, after the circuit board 6 inspection is completed, the contact roller 420 can separately transfer and collect qualified and defective products. Furthermore, after a defective product is detected, the contact roller 420 can automatically clean the fixture 52, promptly removing impurities such as metal shavings, conductive adhesive, and oxide layers that have detached from the probe contact, preventing them from re-adhering to the surface of the qualified circuit board 6 or the probe, thereby reducing repetitive short-circuit defects caused by impurity accumulation.

[0024] like Figures 1 to 10 As shown, the test structure 5 also includes: a base plate 56, which is located on the upper end of the operating table 2; a number of limit rods 54, which are located on the surface of the operating table 2, and a connecting layer 55 is slidably connected to the surface of the number of limit rods 54, and the connecting layer 55 is connected to the test pressure plate 51; the adjustment structure 4 also includes: a rotating shaft 412, which is located at one end of the fixture 52 and rotates on the upper end of the base plate 56; a first tooth block 413, which is located on the surface of the second positioning block 405; a first gear 414, which is located on the surface of the rotating shaft 412 and meshes with the first tooth block 413; and a fixed shaft 419, which is located on the surface of the supporting side wall 21, and the adjustment frame 401 slides on the surface of the fixed shaft 419.

[0025] Specifically, during testing, the telescopic shaft 53 is activated, which will cause the test plate 51 to move downwards. The connecting layer 55 on the surface of the test plate 51 will also slide on the surface of the limit rod 54, making its movement more stable. Subsequently, when a defective product is detected, the fixture 52 and the circuit board 6 will rotate around the rotating shaft 412. During the rotation, the first gear 414 located on the surface of the rotating shaft 412 will mesh with the second positioning block 405, thereby causing the second positioning block 405 to move downwards, so that the second positioning block 405 will not affect the rotation of the fixture 52.

[0026] like Figures 1 to 4 As shown, the surfaces of the first positioning block 404, the second positioning block 405 and the third positioning block 408 are all provided with auxiliary balls 409.

[0027] Specifically, by setting up an auxiliary ball 409, when the circuit board 6 is placed on the surface of the fixture 52, the auxiliary ball 409 can guide the circuit board 6 to automatically correct its deviation, and the rolling friction can reduce resistance, so as to achieve the circuit board 6 to return to its position quickly and accurately.

[0028] like Figures 1 to 5 As shown, an adjusting rod 416 is provided inside the upper end of the base plate 56. A sliding rod 417 is slidably connected to the surface of the adjusting rod 416. One end of the sliding rod 417 is connected to a telescopic frame 415, and the second positioning block 405 slides inside the telescopic frame 415.

[0029] Specifically, since the fixture 52 may collide with the second positioning block 405 when it rotates, by setting a slide rod 417, when the fixture 52 contacts the second positioning block 405, the slide rod 417 at the lower end of the second positioning block 405 can be adjusted on the surface of the adjusting rod 416, so that the second positioning block 405 will not affect the rotation of the fixture 52.

[0030] like Figure 5 As shown, an adjusting spring 418 is fitted on the surface of the adjusting rod 416, and one end of the adjusting spring 418 is connected to the slide rod 417.

[0031] Specifically, by setting an adjusting spring 418, when the fixture 52 is reset and no longer rotating, the adjusting spring 418 can release its elastic force, thereby driving the slide bar 417 and the second positioning block 405 to reset, so as to facilitate subsequent testing work.

[0032] like Figure 4 As shown, the surface of the support bar 410 is provided with an auxiliary pad 411.

[0033] Specifically, by setting an auxiliary pad 411, when the support bar 410 lifts the circuit board 6, the auxiliary pad 411 will first contact the circuit board 6, which can increase the stability of the circuit board 6 and reduce the friction of the support bar 410 on the circuit board 6.

[0034] Example 2 like Figure 9 As shown in the first embodiment, another embodiment of the present invention is as follows: the surface of the rotating rod 428 is provided with a plurality of placement grooves 430, one side of the placement groove 430 is provided with an adjusting shaft 431, the surface of the adjusting shaft 431 is rotatably connected with a second tooth block 421, the side wall of the fixture 52 is provided with a plurality of third tooth blocks 429, and the second tooth block 421 meshes with the third tooth block 429 during operation.

[0035] Specifically, during the resetting process of the abutment roller 420, since the abutment roller 420 and the fixture 52 remain in contact, the second tooth block 421 on the surface of the rotating rod 428 will mesh with the third tooth block 429 on the side of the fixture 52, thereby driving the rotating rod 428 and the abutment roller 420 to rotate, thus cleaning the fixture 52. Furthermore, during the process of the abutment roller 420 moving the defective circuit board 6, when the second tooth block 421 and the third tooth block 429 come into contact, the second tooth block 421 will rotate around the adjusting shaft 431 and move into the placement groove 430, thereby preventing the rotation of the abutment roller 420 and making the transfer of the circuit board 6 smoother.

[0036] like Figure 9 As shown, a return spring 432 is fitted on the surface of the adjusting shaft 431, and the return spring 432 is connected to the second tooth block 421.

[0037] Specifically, during the process of the abutment roller 420 moving the defective circuit board 6, the second tooth block 421 will move into the placement groove 430. When the second tooth block 421 is not in contact with the third tooth block 429, the reset spring 432 will release its elastic force, driving the second tooth block 421 to reset, so as to facilitate subsequent meshing operations.

[0038] like Figures 1 to 10 As shown, a transfer door 403 is slidably connected to the upper end of the collection cavity 436.

[0039] Specifically, by setting a transfer door 403, in the initial state, the transfer door 403 seals the collection chamber 436, thereby preventing impurities in the outside air from entering the collection chamber 436.

[0040] like Figure 10As shown, the lower end of the adjusting frame 401 is provided with a second rack 434, the inside of the operating table 2 is rotatably connected with a second gear 435, and the second rack 434 meshes with the second gear 435. One end of the transfer door 403 is provided with a first rack 433, and the first rack 433 meshes with the second gear 435.

[0041] Specifically, when a defective product is detected and needs to be transferred, the adjusting frame 401 will move downward. At this time, the second rack 434 located at the lower end of the adjusting frame 401 will mesh with the second gear 435, thereby driving the first rack 433 to move. Since the first rack 433 is connected to the transfer door 403, the transfer door 403 will open automatically to facilitate the transfer of the circuit board 6.

[0042] Working principle: When testing circuit board 6, the operator first inspects the surface of circuit board 6 to quickly identify obvious defects. After the initial inspection shows no problems, circuit board 6 is placed on the surface of fixture 52, between the first positioning block 404, the second positioning block 405, and the third positioning block 408. Then, the telescopic shaft 53 is activated, which moves the test plate 51 downward. The surface of the test plate 51 makes precise contact with the probe circuit board 6. Combined with automated testing technology, electrical performance verification and environmental adaptability assessment are completed, thereby detecting qualified and defective products. During this process, the operator can proceed to inspect the surface of the next circuit board 6. After the test structure 5 is completed, due to the contact cylinder 40... The cylinder at the lower end of the third positioning block 408 and the data at the rear end of the test structure 5 are linked through a sensor signal interface and a control command linkage mechanism. The test result triggers the action execution of the abutment cylinder 407 and the cylinder at the lower end of the third positioning block 408. The sensor signal interface is responsible for converting the test result into a standard signal that the controller can recognize, ensuring accurate triggering of the action command. When a qualified product is detected, the cylinder at the lower end of the third positioning block 408 will receive a signal and start, thereby driving the abutment cylinder 407 to move upward. During the movement, the support strip 410 on the surface of the abutment cylinder 407 will contact the circuit board 6, thereby lifting the circuit board 6. At this time, the telescopic cylinder 422 is activated, which will drive the sliding frame 424 to move horizontally. The sliding frame 424 will drive the abutment roller 420 to move towards the circuit board 6. Since the abutment roller 420 and the circuit board 6 are at the same horizontal line at this time, the abutment roller 420 will contact the circuit board 6 during the movement and drive the circuit board 6 to move. Then the circuit board 6 will fall on the surface of the conveyor belt 402 and finally be transferred to the next station. When a defective product is detected, the cylinder at the lower end of the abutment cylinder 407 will receive a signal and start, thereby driving the abutment cylinder 407 to move upward and make the abutment cylinder 407 abut against the lower surface of the fixture 52. At this time, the fixture 52 and the circuit board 6 will rotate around the rotating shaft 412 as the axis. During the rotation, the first gear 414 located on the surface of the rotating shaft 412 will engage with the second positioning block. The 405 parts mesh, causing the second positioning block 405 to move downwards. The slide rod 417 at the lower end of the second positioning block 405 can be adjusted on the surface of the adjusting rod 416, ensuring that the second positioning block 405 does not affect the rotation of the fixture 52. Furthermore, since the surface of the fixture 52 has adjustable slots 406, these slots are used to move the first positioning block 404, the second positioning block 405, and the third positioning block 408 when the fixture 52 rotates, allowing for smooth rotation. After rotating to a certain angle, the movement of the abutment cylinder 407 stops, and at this time, the telescopic cylinder 422 is activated to move the abutment roller 420 to the highest point of the circuit board 6. Simultaneously, the adjusting frame 401 is activated to move downwards.During the movement of the adjusting frame 401, the sliding frame 424 will move along with it. During this movement, the abutting roller 420 will abut against the circuit board 6, preventing it from moving further downwards. At this time, the slider 427 at one end of the abutting roller 420 will slide on the surface of the sliding shaft 425 and move to the upper end of the sliding shaft 425. The compression spring 426 is also in a taut state. Then, the telescopic cylinder 422 is activated, causing the sliding frame 424 to move horizontally. Because the abutting roller 420 is abutting against the circuit board 6 and the compression spring 426 is taut, the abutting roller 420 will continuously exert pressure on the circuit board 6, thus moving the circuit board 6 towards the lower end of the fixture 52. At this point, the transfer door 403 is opened, and the circuit board 6 will be transferred by the abutting roller 420 to... The collection chamber 436 collects the material, and the surface of the abutment roller 420 is covered with fine hairs, which reduces friction on the fixture 52. During the resetting process of the abutment roller 420, since the abutment roller 420 and the fixture 52 remain in contact, the second tooth block 421 on the surface of the rotating rod 428 will mesh with the third tooth block 429 on the side of the fixture 52, thereby driving the rotating rod 428 and the abutment roller 420 to rotate. The fine hairs on the surface of the abutment roller 420 will clean away any metal shavings that may remain on the surface of the fixture 52, thus keeping the fixture 52 clean. Furthermore, during the transfer of the defective circuit board 6 by the abutment roller 420, when the second tooth block 421 contacts the third tooth block 429, the second tooth block 421 will rotate around the adjusting shaft 431, thereby preventing the abutment roller 420 from rotating and making the transfer of the circuit board 6 smoother.

[0043] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A testing device for circuit board processing, characterized in that: Includes a control base (1), an operating table (2) is provided at the upper end of the control base (1), a supporting side wall (21) is provided on the side wall of the operating table (2), a test structure (5) is provided on the surface of the operating table (2), an electrical control box (3) is provided at the upper end of the test structure (5), and an adjustment structure (4) is provided at the end of the surface of the operating table (2) near the test structure (5). The test structure (5) includes a fixture (52), which is rotatably connected to the surface of the operating table (2). The lower end of the electrical control box (3) is provided with a telescopic shaft (53), and the lower end of the telescopic shaft (53) is provided with a test pressure plate (51). The adjustment structure (4) includes an adjustment frame (401), which is slidably connected to the surface of the support sidewall (21). A moving block (423) is slidably connected to the inner wall of the adjustment frame (401). A sliding frame (424) is provided on the surface of the moving block (423). A sliding shaft (425) is provided inside the sliding frame (424). A slider (427) is slidably connected to the surface of the sliding shaft (425). A compression spring (426) is sleeved on the surface of the sliding shaft (425). A rotating rod (428) is rotatably connected to one end of the slider (427). An abutment roller (420) is provided at one end of the rotating rod (428). One end of the adjustment frame (401) rotates. A conveyor belt (402) is connected to the moving block (423), and a telescopic cylinder (422) is connected to one end of the moving block (423). Several adjustment slots (406) are opened on the surface of the fixture (52). A first positioning block (404), a second positioning block (405) and two third positioning blocks (408) are respectively provided on the surface of the operating table (2). The two third positioning blocks (408) slide inside the operating table (2). A support strip (410) is provided on the surface of the third positioning block (408). A collection cavity (436) is provided at one end of the operating table (2) near the fixture (52). An abutment cylinder (407) is slidably connected inside the operating table (2), and the abutment cylinder (407) is in contact with the fixture (52).

2. The testing device for circuit board processing according to claim 1, characterized in that: The test structure (5) also includes: A base plate (56) is provided at the upper end of the operating table (2); Limiting rods (54), a plurality of the limiting rods (54) are provided on the surface of the operating table (2), and a connecting layer (55) is slidably connected to the surface of the plurality of limiting rods (54), and the connecting layer (55) is connected to the test pressure plate (51); The adjustment structure (4) also includes: A rotating shaft (412) is provided at one end of the fixture (52) and rotates at the upper end of the base plate (56); First tooth block (413), a plurality of first tooth blocks (413) are disposed on the surface of second positioning block (405); The first gear (414) is disposed on the surface of the rotating shaft (412) and meshes with the first tooth block (413); A fixed shaft (419) is disposed on the surface of the support sidewall (21), and the adjusting frame (401) slides on the surface of the fixed shaft (419).

3. The testing device for circuit board processing according to claim 1, characterized in that: The surfaces of the first positioning block (404), the second positioning block (405) and the third positioning block (408) are all provided with auxiliary balls (409).

4. The testing device for circuit board processing according to claim 3, characterized in that: An adjusting rod (416) is provided inside the upper end of the base plate (56). A sliding rod (417) is slidably connected to the surface of the adjusting rod (416). One end of the sliding rod (417) is connected to a telescopic frame (415), and the second positioning block (405) slides inside the telescopic frame (415).

5. The testing device for circuit board processing according to claim 4, characterized in that: The surface of the adjusting rod (416) is fitted with an adjusting spring (418), and one end of the adjusting spring (418) is connected to the slide rod (417).

6. The testing device for circuit board processing according to claim 1, characterized in that: The surface of the support bar (410) is provided with an auxiliary pad (411).

7. The testing device for circuit board processing according to claim 1, characterized in that: The rotating rod (428) has several placement slots (430) on its surface. An adjusting shaft (431) is provided on one side of the placement slot (430). A second tooth block (421) is rotatably connected to the surface of the adjusting shaft (431). A number of third tooth blocks (429) are provided on the side wall of the fixture (52). The second tooth block (421) meshes with the third tooth block (429) when working.

8. The testing device for circuit board processing according to claim 7, characterized in that: The surface of the adjusting shaft (431) is fitted with a return spring (432), and the return spring (432) is connected to the second tooth block (421).

9. The testing device for circuit board processing according to claim 1, characterized in that: The upper end of the collecting cavity (436) is slidably connected to a transfer door (403).

10. A testing device for circuit board processing according to claim 9, characterized in that: The lower end of the adjustment frame (401) is provided with a second rack (434), the inside of the operating table (2) is rotatably connected with a second gear (435), and the second rack (434) meshes with the second gear (435). One end of the transfer door (403) is provided with a first rack (433), and the first rack (433) meshes with the second gear (435).

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