Electromagnetic field simulation verification auxiliary radio frequency de-embedding method and device

Abstract

The invention provides an electromagnetic field simulation verification auxiliary radio frequency de-embedding method and device, and relates to the field of radio frequency de-embedding, and the method comprises the steps: constructing an overall test structure of a tested device according to a left test connection structure, a right test connection structure and the tested device; constructing a de-embedding structure according to the left side test connection structure, the right side test connection structure and the asymmetric passive device structure; solving ABCD matrixes of the left side test connection structure and the right side test connection structure based on a pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure and the de-embedding structure; generating an ABCD matrix of the overall test structure of the tested device based on the overall test structure of the tested device; and generating an ABCD matrix of the tested device and other two-port network parameters based on the ABCD matrix of the left test connection structure, the right test connection structure and the whole test structure of the tested device. According to the invention, the de-embedding network parameters of the tested device can be accurately obtained under a high-frequency condition, and the application range and the test precision of de-embedding are remarkably improved.

Description

Technical Field

[0001] This application relates to the field of radio frequency de-embedding technology, and in particular to a radio frequency de-embedding method and apparatus assisted by electromagnetic field simulation verification. Background Technology

[0002] RF de-embedding technology is one of the fundamental techniques in RF device characteristic testing. Its core purpose is to remove parasitic parameters introduced by test connectors, fixtures, test bonding pads, and connecting wires from the original test data during RF testing, thereby accurately shifting the measurement reference plane to the port of the device under test to obtain network parameters that reflect the intrinsic characteristics of the device. As the operating frequency of RF devices continues to increase, especially into microwave, millimeter wave, and even higher frequency bands, the impact of parasitic effects becomes increasingly significant, placing higher demands on the accuracy and applicability of de-embedding methods.

[0003] In existing technologies, a pass-through to transmission line RF de-embedding method assisted by electromagnetic field simulation has been proposed. This method constructs pass-through and transmission line de-embedding structures, combines the ABCD matrix test data of the overall test structure of the device under test (DUT), first calculates the main diagonal elements of the DUT and transmission line, and then uses passive electromagnetic field simulation to fit and verify the parameters of the transmission line model. Finally, using the verified simulation results, the secondary diagonal elements of the DUT's ABCD matrix are solved to obtain the de-embedding network parameters of the DUT, which can be further converted to obtain two-port parameters such as impedance, admittance, or scattering parameters. This type of method improves the accuracy of RF de-embedding under high-frequency conditions to a certain extent.

[0004] However, the aforementioned existing technologies are typically based on the premise that the test connection structures on the left and right sides of the device under test (DUT) are mirror images of each other, and their mathematical modeling and parameter solving processes rely on the symmetry assumption of the test structures. In practical engineering applications, due to different requirements for current density, electrical performance, or layout constraints at the input and output ends, the left and right test connection structures often exhibit differences in connection width, thickness, or shape. Furthermore, in multilayer metal devices or complex circuit structures, the connections of the left and right test connection structures may be distributed across different metal layers, resulting in significant asymmetry in the test connection structures. In these asymmetric testing scenarios, existing RF de-embedding methods relying on symmetry assumptions struggle to accurately characterize the influence of parasitic parameters, limiting their applicability and measurement accuracy in practical high-frequency testing. Therefore, there is an urgent need for an RF de-embedding method applicable to general asymmetric test connection structures to meet the demand for high-precision RF parameter extraction under complex testing conditions.

[0005] This section is intended to provide background or context for the embodiments of the invention set forth in the claims. The description herein is not an admission that it is prior art simply because it is included in this section. Summary of the Invention

[0006] To address the problems in the prior art, this application provides an electromagnetic field simulation verification-assisted radio frequency de-embedding method and apparatus, which can solve the problem that existing radio frequency de-embedding methods generally rely on left-right symmetrical test connection structures, making it difficult to accurately strip parasitic parameters and obtain the true electrical characteristics of the device under test under actual high-frequency test conditions where there are asymmetries in wiring, layers, and electrical parameters.

[0007] One aspect of the present invention provides an electromagnetic field simulation verification-assisted radio frequency de-embedding method, the method comprising:

[0008] The overall test structure of the device under test (DUT) is constructed based on the left test connection structure, the right test connection structure, and the DUT itself; the left test connection structure and the right test connection structure are asymmetrical.

[0009] A de-embedding structure is constructed based on the left-side test connection structure, the right-side test connection structure, and the asymmetric passive device structure.

[0010] Based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure, the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure are solved.

[0011] Generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test;

[0012] Based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test, the ABCD matrix of the device under test and other two-port network parameters are generated.

[0013] Further, the asymmetric passive device structure includes a first asymmetric passive device structure and a second asymmetric passive device structure; the de-embedding structure includes a first de-embedding structure and a second de-embedding structure; the construction of the de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure includes:

[0014] The first de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the first asymmetric passive device structure.

[0015] The second de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the second asymmetric passive device structure.

[0016] Furthermore, the method of solving the ABCD matrix of the left test connection structure and the right test connection structure based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure includes:

[0017] The first asymmetric passive device structure was simulated using a pre-verified passive electromagnetic field simulation environment to obtain the first simulation ABCD matrix data.

[0018] The passive electromagnetic field simulation of the second asymmetric passive device structure was performed using a pre-verified passive electromagnetic field simulation environment to obtain the second simulation ABCD matrix data.

[0019] Radio frequency testing was performed on the first de-embedding structure to obtain the test ABCD matrix data of the first de-embedding structure.

[0020] Radio frequency testing was performed on the second de-embedding structure to obtain the test ABCD matrix data of the second de-embedding structure.

[0021] Based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure, the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure are solved.

[0022] Further, the step of solving the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure includes:

[0023] A matrix calculation model is generated based on the network concatenation relationship of the first de-embedding structure and the network concatenation relationship of the second de-embedding structure.

[0024] Substituting the first simulated ABCD matrix data, the second simulated ABCD matrix data, the first de-embedding structure test ABCD matrix data, and the second de-embedding structure test ABCD matrix data into the matrix calculation model, a system of six equations is obtained regarding the ABCD matrix elements of the left test connection structure and the ABCD matrix elements of the right test connection structure.

[0025] Solving the six-equation system yields the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure.

[0026] Further, the step of generating the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test includes:

[0027] Radio frequency testing is performed on the overall test structure of the device under test to obtain test data of the overall test structure of the device under test.

[0028] The ABCD matrix of the overall test structure of the device under test is obtained based on the test data of the overall test structure of the device under test.

[0029] Further, the generation of the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left-side test connection structure, the ABCD matrix of the right-side test connection structure, and the ABCD matrix of the overall test structure of the device under test includes:

[0030] The ABCD matrix of the device under test is solved based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0031] The ABCD matrix of the device under test is transformed according to the requirements to obtain other two-port network parameters of the device under test.

[0032] In another aspect, the present invention provides an electromagnetic field simulation verification-assisted radio frequency de-embedding device, the device comprising:

[0033] The test structure construction unit is used to construct the overall test structure of the device under test (DUT) based on the left test connection structure, the right test connection structure, and the DUT; the left test connection structure and the right test connection structure are asymmetrical.

[0034] A de-embedding structure building unit is used to construct a de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure.

[0035] The first matrix solving unit is used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure and the de-embedding structure.

[0036] The second matrix solving unit is used to generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test.

[0037] The network parameter generation unit is used to generate the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0038] Further, the asymmetric passive device structure includes a first asymmetric passive device structure and a second asymmetric passive device structure; the de-embedding structure includes a first de-embedding structure and a second de-embedding structure; the de-embedding structure building unit includes:

[0039] The first de-embedding structure construction module is used to construct the first de-embedding structure based on the left test connection structure, the right test connection structure and the first asymmetric passive device structure.

[0040] The second de-embedding structure construction module is used to construct the second de-embedding structure based on the left test connection structure, the right test connection structure, and the second asymmetric passive device structure.

[0041] Furthermore, the first matrix solving unit includes:

[0042] The first simulation module is used to perform passive electromagnetic field simulation on the first asymmetric passive device structure using a pre-verified passive electromagnetic field simulation environment, and obtain the first simulation ABCD matrix data.

[0043] The second simulation module is used to perform passive electromagnetic field simulation on the second asymmetric passive device structure using a pre-verified passive electromagnetic field simulation environment, and obtain the second simulation ABCD matrix data.

[0044] The first test module is used to perform radio frequency testing on the first de-embedding structure and obtain test ABCD matrix data of the first de-embedding structure.

[0045] The second test module is used to perform radio frequency testing on the second de-embedding structure and obtain the test ABCD matrix data of the second de-embedding structure.

[0046] The first matrix solving module is used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure.

[0047] Furthermore, the first matrix solving module includes:

[0048] The computational model generation submodule is used to generate a matrix computational model based on the network concatenation relationship of the first de-embedding structure and the network concatenation relationship of the second de-embedding structure.

[0049] The equation generation submodule is used to substitute the first simulated ABCD matrix data, the second simulated ABCD matrix data, the first de-embedding structure test ABCD matrix data, and the second de-embedding structure test ABCD matrix data into the matrix calculation model to obtain a six-variable equation system concerning the ABCD matrix elements of the left test connection structure and the ABCD matrix elements of the right test connection structure.

[0050] The equation system solving submodule is used to solve the six-equation system to obtain the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure.

[0051] Furthermore, the second matrix solving unit includes:

[0052] The third test module is used to perform radio frequency testing on the overall test structure of the device under test and obtain test data of the overall test structure of the device under test.

[0053] The second matrix solving module is used to obtain the ABCD matrix of the overall test structure of the device under test based on the test data of the overall test structure of the device under test.

[0054] Furthermore, the network parameter generation unit includes:

[0055] The third matrix solving module is used to solve the ABCD matrix of the device under test based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0056] The network parameter generation module is used to transform the ABCD matrix of the device under test according to the requirements to obtain other two-port network parameters of the device under test.

[0057] To achieve the above objectives, according to another aspect of the present invention, a computer device is also provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the above-described electromagnetic field simulation verification-assisted radio frequency de-embedding method.

[0058] To achieve the above objectives, according to another aspect of the present invention, a computer-readable storage medium is also provided, on which a computer program / instructions are stored, which, when executed by a processor, implement the steps of the above-described electromagnetic field simulation verification-assisted radio frequency de-embedding method.

[0059] To achieve the above objectives, according to another aspect of the present invention, a computer program product is also provided, comprising a computer program / instructions that, when executed by a processor, implement the steps of the above-described electromagnetic field simulation verification-assisted radio frequency de-embedding method.

[0060] The beneficial effects of this invention are as follows:

[0061] This application introduces an electromagnetic field simulation-assisted RF de-embedding method applicable to general asymmetric test connection structures. This method overcomes the limitation of existing technologies that only apply to mirror-symmetric left and right test connection structures, accurately removing parasitic parameters introduced by the test connection structure without relying on structural symmetry assumptions. This method effectively adapts to test scenarios where the input and output terminals have inconsistent connection widths, thicknesses, or shapes due to different current density requirements. It is also applicable to multilayer metal devices or complex circuit structures where the left and right test connection structures are located at different metal layers. This significantly expands the applicability of RF de-embedding technology in practical engineering applications and improves the accuracy and reliability of intrinsic parameter extraction for devices under test under high-frequency testing conditions. Attached Figure Description

[0062] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In the drawings:

[0063] Figure 1 This is a schematic diagram of the first process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiment of the present invention;

[0064] Figure 2 This is a schematic diagram of the second process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention;

[0065] Figure 3 This is a schematic diagram of the third process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention;

[0066] Figure 4 This is a schematic diagram of the fourth process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention;

[0067] Figure 5 This is a schematic diagram of the fifth step of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention;

[0068] Figure 6This is a schematic diagram of the sixth process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention;

[0069] Figure 7 This is a schematic block diagram of the first structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiment of the present invention;

[0070] Figure 8 This is a schematic block diagram of the second structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention;

[0071] Figure 9 This is a schematic block diagram of the third structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention;

[0072] Figure 10 This is a schematic block diagram of the fourth structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention;

[0073] Figure 11 This is a schematic block diagram of the fifth structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention;

[0074] Figure 12 This is a sixth structural schematic block diagram of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention;

[0075] Figure 13 This is a schematic diagram of the structure of the computer device provided in an embodiment of the present invention;

[0076] Figure 14 This is a schematic diagram of the overall test structure of the device under test provided in an embodiment of the present invention;

[0077] Figure 15 This is a schematic diagram of the first de-embedding structure provided in an embodiment of the present invention;

[0078] Figure 16 This is a schematic diagram of the second de-embedding structure provided in an embodiment of the present invention. Detailed Implementation

[0079] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0080] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0081] It should be noted that the terms "comprising" and "having" and any variations thereof in the specification, claims and accompanying drawings of this invention are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such processes, methods, products or devices.

[0082] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0083] The following describes the specific implementation process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in this application embodiment, taking the server as the execution subject as an example.

[0084] Figure 1 This is a schematic diagram of the first process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention, as shown below. Figure 1 As shown, in one embodiment of the present invention, the electromagnetic field simulation verification-assisted radio frequency de-embedding method of the present invention includes:

[0085] S101: Construct the overall test structure for the device under test based on the left test connection structure, the right test connection structure, and the device under test; the left test connection structure and the right test connection structure are asymmetrical;

[0086] S102: Construct a de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure;

[0087] S103: Based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure, solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure;

[0088] S104: Generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test;

[0089] S105: Generate the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0090] from Figure 1 As shown in the flowchart, the electromagnetic field simulation verification-assisted RF de-embedding method provided in this application constructs an overall test structure for the device under test (DUT) based on the left test connection structure, the right test connection structure, and the DUT itself. The left and right test connection structures are asymmetrical. A de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the asymmetrical passive device structure. The ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure are solved based on a pre-verified passive electromagnetic field simulation environment, the asymmetrical passive device structure, and the de-embedding structure. The ABCD matrix of the overall DUT test structure is generated based on the overall DUT test structure. Finally, the ABCD matrix of the DUT and other two-port network parameters are generated based on the ABCD matrix of the left test connection structure, the right test connection structure, and the overall DUT test structure. This method achieves accurate acquisition of the de-embedding network parameters of the DUT under high-frequency and even millimeter-wave conditions, significantly improving the applicability and testing accuracy of de-embedding.

[0091] Each step is explained in detail below.

[0092] S101: Construct the overall test structure for the device under test based on the left test connection structure, the right test connection structure, and the device under test; the left test connection structure and the right test connection structure are asymmetrical;

[0093] Specifically, the server first constructs the overall test structure for the device under test (DUT) based on the left and right test connection structures and the DUT itself. The left and right test connection structures connect the RF test equipment to the input and output terminals of the DUT, respectively. Since differences may exist between the input and output terminals in actual engineering applications due to current density requirements, layout constraints, or process conditions, the left and right test connection structures are no longer limited to being perfectly mirror-symmetrical; rather, they are allowed to present a general asymmetrical structure. By placing the DUT between the asymmetrical left and right test connection structures, a complete overall DUT test structure is formed for subsequent RF testing and parameter extraction.

[0094] In one embodiment, during actual RF testing, the device under test (DUT) is inserted between a typical asymmetrical left-side test connection structure and a right-side test connection structure to form the overall test structure for the DUT, such as... Figure 14 As shown, the test connection structures on the left and right sides are no longer required to be mirror images of each other in terms of structural form, wiring method, or electrical parameters. Instead, they are allowed to exhibit asymmetrical characteristics to reflect the test connection conditions in real engineering applications.

[0095] In this overall test structure, let L be the ABCD matrix corresponding to the left test connection structure and R be the ABCD matrix corresponding to the right test connection structure. Their matrix elements are shown in Equation (1) and Equation (2) respectively:

[0096] (1)

[0097] (2)

[0098] Let D be the ABCD matrix corresponding to the device under test (DUT) inserted between the left and right test connection structures. Based on this, let A be the ABCD matrix of the overall DUT test structure formed by the cascading of the left test connection structure, the DUT, and the right test connection structure.

[0099] By adopting the above modeling method, the general asymmetric test connection structure, the device under test and its overall test structure are uniformly incorporated into the ABCD matrix description framework, which lays the mathematical modeling foundation for the subsequent stripping of the influence of the test connection structure based on the network cascade relationship and the acquisition of the intrinsic network parameters of the device under test.

[0100] S102: Construct a de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure;

[0101] Specifically, after constructing the overall test structure for the device under test (DUT), the server builds a de-embedding structure based on the left-side test connection structure, the right-side test connection structure, and the asymmetric passive device structure. The asymmetric passive device structure is a pre-designed passive circuit or device structure whose structural form, geometry, and material parameters are known, used to provide controllable network characteristics without introducing active effects. By inserting the asymmetric passive device structure between the left-side and right-side test connection structures, a de-embedding structure is formed for parameter inversion, thus providing the foundation for subsequently solving the network parameters of the left-side and right-side test connection structures.

[0102] Figure 2 This is a schematic diagram of the second process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention, as shown below. Figure 2As shown, in one embodiment of the present invention, the asymmetric passive device structure includes a first asymmetric passive device structure and a second asymmetric passive device structure; the de-embedding structure includes a first de-embedding structure and a second de-embedding structure; S102 includes:

[0103] S201: The first de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the first asymmetric passive device structure;

[0104] Specifically, in order to obtain sufficient independent network information under asymmetric test connection structure conditions to support the subsequent solution of network parameters for the left and right test connection structures, the asymmetric passive device structure is not a single configuration, but includes a first asymmetric passive device structure and a second asymmetric passive device structure. These two asymmetric passive device structures differ from each other in geometry, topology, electrical parameters, or wiring methods, thus exhibiting differences in network characteristics and introducing different network constraints.

[0105] The server constructs a first de-embedding structure based on the left-side test connection structure, the right-side test connection structure, and the first asymmetric passive device structure. The first asymmetric passive device structure is positioned between the left-side and right-side test connection structures, physically forming an integrated RF network structure. This first de-embedding structure maintains the original asymmetric characteristics of the left-side and right-side test connection structures while introducing the first asymmetric passive device structure to form an overall network with specific transmission characteristics for subsequent network parameter analysis and processing.

[0106] S202: The second de-embedding structure is constructed based on the left test connection structure, the right test connection structure and the second asymmetric passive device structure.

[0107] Specifically, based on the first de-embedding structure, the server constructs a second de-embedding structure according to the left-side test connection structure, the right-side test connection structure, and the second asymmetric passive device structure. The second de-embedding structure maintains the same overall connection method as the first de-embedding structure, i.e., it is also composed of the left-side test connection structure, the asymmetric passive device structure, and the right-side test connection structure connected sequentially. However, the inserted asymmetric passive device structure is replaced by the second asymmetric passive device structure. Due to the differences in structure or parameters between the first and second asymmetric passive device structures, the first and second de-embedding structures differ in their overall network characteristics.

[0108] By constructing a first de-embedding structure and a second de-embedding structure respectively, this invention introduces two reference structures with different network characteristics without changing the physical form of the left and right test connection structures. These two de-embedding structures provide multiple independent information sources for subsequently establishing the network relationships between the left and right test connection structures and the asymmetric passive device structure, thus laying the structural foundation for achieving RF de-embedding under asymmetric test connection structure conditions.

[0109] In one embodiment, based on the device under test and its overall test structure, two different asymmetric passive device structures are inserted between the general asymmetric left-side test connection structure and the right-side test connection structure, thereby designing and constructing two de-embedding structures accordingly, as shown below. Figure 15 and Figure 16 As shown. The two de-embedding structures mentioned above are named the first de-embedding structure and the second de-embedding structure, respectively.

[0110] Let M be the ABCD matrix of the first de-embedding structure and N be the ABCD matrix of the second de-embedding structure, and let their corresponding matrix elements be described by equations (3) and (4) respectively:

[0111] (3)

[0112] (4)

[0113] Both the first and second de-embedding structures are composed of a left-side test connection structure, an asymmetric passive device structure, and a right-side test connection structure cascaded together in their overall connection method. However, the asymmetric passive device structures inserted inside the two structures are different in terms of structural form or electrical parameters.

[0114] Furthermore, let F be the ABCD matrix of the asymmetric passive device structure inserted into the first de-embedding structure, and G be the ABCD matrix of the asymmetric passive device structure inserted into the second de-embedding structure. Their corresponding matrix elements are described by equations (5) and (6), respectively:

[0115] (5)

[0116] (6)

[0117] By means of the above method, the network characteristics of different asymmetric passive device structures are introduced into different de-embedding structures, so that the first de-embedding structure and the second de-embedding structure have different overall network characteristics.

[0118] By constructing the first de-embedding structure and the second de-embedding structure, this embodiment provides multiple independent information sources for establishing the network relationship between the left and right test connection structure, the asymmetric passive device structure and the de-embedding structure, thereby laying the structural and modeling foundation for realizing RF de-embedding under the general asymmetric test connection structure condition.

[0119] S103: Based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure, solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure;

[0120] Specifically, after constructing the de-embedding structure, the server solves for the ABCD matrices of the left and right test connection structures based on a pre-verified passive electromagnetic field simulation environment, an asymmetric passive device structure, and the de-embedding structure. The pre-verified passive electromagnetic field simulation environment describes the transmission characteristics of passive devices under electromagnetic field conditions, and its model parameters have been determined through simulation and testing. By combining the passive device network parameters obtained from the passive electromagnetic field model with the test results of the de-embedding structure, the network relationships between the left and right test connection structures and the de-embedding structure are established. Thus, without relying on the assumption of symmetry between the left and right structures, the ABCD matrix parameter values ​​corresponding to the left and right test connection structures are calculated.

[0121] In one embodiment, the server extends the transmission line de-embedding structure in the background art into a more general left-right symmetrical passive de-embedding structure, that is, inserting a left-right symmetrical passive device structure between the left and right test connection structures that are left-right mirror symmetrical, thereby forming a left-right symmetrical passive de-embedding structure.

[0122] The design of the symmetrical passive de-embedding structure comprehensively considers factors such as the dielectric layers, metal layers, and vias connecting adjacent metal layers in the multilayer structure. Through rational design of the dielectric layer thickness, metal layer morphology, and via structure, a series of symmetrical passive de-embedding structures meeting RF testing requirements are formed. Simultaneously, by keeping the left and right test connection structures unchanged, the symmetrical passive device structure inserted in the middle of the symmetrical passive de-embedding structure is removed, allowing the left and right test connection structures to be directly connected. This results in a series of through-hole de-embedding structures that correspond one-to-one with the aforementioned symmetrical passive de-embedding structure.

[0123] Based on this, electromagnetic field simulation verification is used to assist in the direct-transmission-line RF de-embedding technique to perform passive electromagnetic field simulation on a symmetrical passive device structure. A passive electromagnetic field simulation environment is established for the symmetrical passive device structure inserted into the symmetrical passive de-embedding structure, and the simulated ABCD matrix is ​​obtained. The main diagonal elements of the ABCD matrix are selected as the simulation verification objects.

[0124] Simultaneously, based on test data of the symmetrical passive de-embedding structure and the corresponding through-hole de-embedding structure, the main diagonal elements of the ABCD matrix of the symmetrical passive device structure are calculated. Using these calculated main diagonal elements as target values, the parameters in the passive electromagnetic field simulation are adjusted and fitted to gradually approximate the calculated main diagonal elements of the simulated symmetrical passive device structure's ABCD matrix.

[0125] The adjusted passive electromagnetic field simulation parameters include, but are not limited to: the dielectric constant and loss tangent of each dielectric layer, the conductivity of each metal layer, and the conductivity of each through-hole metal layer. Through the above parameter adjustment and fitting process, consistency between the simulation results and the test calculation results is achieved, thereby completing the verification of the passive electromagnetic field simulation.

[0126] Figure 3 This is a schematic diagram of the third process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention, as shown below. Figure 3 As shown, in one embodiment of the present invention, S103 includes:

[0127] S301: Use a pre-verified passive electromagnetic field simulation environment to perform passive electromagnetic field simulation on the first asymmetric passive device structure to obtain the first simulation ABCD matrix data.

[0128] Specifically, after pre-verifying the passive electromagnetic field model, the server first uses the passive electromagnetic field model to perform passive electromagnetic field simulation on the first asymmetric passive device structure. The first asymmetric passive device structure is a passive network with a known structural form, and its geometric dimensions, material parameters, and interlayer connections are all determined. By introducing the above structural parameters into the passive electromagnetic field model and performing simulation calculations, the first simulation ABCD matrix data reflecting the electromagnetic transmission characteristics of the first asymmetric passive device structure is obtained, which is used to characterize the network parameter characteristics of the passive device structure.

[0129] S302: Use a pre-verified passive electromagnetic field simulation environment to perform passive electromagnetic field simulation on the second asymmetric passive device structure to obtain the second simulation ABCD matrix data.

[0130] Specifically, the server utilizes the same pre-calibrated passive electromagnetic field simulation environment to perform passive electromagnetic field simulation on the second asymmetric passive device structure. The second asymmetric passive device structure differs from the first asymmetric passive device structure in its structural form or electrical parameters. By performing simulation calculations on this structure, the corresponding second simulation ABCD matrix data is obtained. Due to the differences in network characteristics between the two asymmetric passive device structures, the first and second simulation ABCD matrix data can provide different network information for subsequent parameter analysis.

[0131] S303: Perform radio frequency testing on the first de-embedding structure to obtain the test ABCD matrix data of the first de-embedding structure;

[0132] Specifically, the server performs radio frequency (RF) testing on the first de-embedding structure, which consists of the left-side test connection structure, the right-side test connection structure, and the first asymmetric passive device structure. The RF test equipment acquires the test ABCD matrix data of the first de-embedding structure. This data reflects the overall network characteristics under the combined action of the left-side test connection structure, the first asymmetric passive device structure, and the right-side test connection structure, and is used to describe the actual transmission behavior of the first de-embedding structure.

[0133] S304: Perform radio frequency testing on the second de-embedding structure to obtain the test ABCD matrix data of the second de-embedding structure;

[0134] Specifically, the server performs RF testing on the second de-embedding structure, which consists of the left-side test connection structure, the right-side test connection structure, and the second asymmetric passive device structure, to obtain the test ABCD matrix data of the second de-embedding structure. This data reflects the changes in overall network characteristics when different asymmetric passive device structures are introduced under the same left and right test connection structure conditions, providing a basis for subsequently distinguishing the parameters of the left and right test connection structures from the parameters of the passive device structure.

[0135] S305: Based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure, solve for the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure.

[0136] Specifically, after obtaining the first simulated ABCD matrix data, the second simulated ABCD matrix data, and the test ABCD matrix data of the first and second de-embedding structures, the server establishes the network relationships between the left and right test connection structures, the asymmetric passive device structure, and the de-embedding structure based on the aforementioned data. By comprehensively utilizing the simulation data and test data, the network parameters of the left and right test connection structures are solved, thereby obtaining the corresponding ABCD matrix parameter values ​​for the left and right test connection structures. The above solution process is completed without relying on the symmetry of the left and right test connection structures, providing a foundation for subsequently removing the influence of the test connection structures and obtaining the intrinsic parameters of the device under test.

[0137] Figure 4 This is a schematic diagram of the fourth process of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in the embodiments of the present invention, as shown below. Figure 4 As shown, in one embodiment of the present invention, S305 includes:

[0138] S401: Generate a matrix calculation model based on the network concatenation relationship of the first de-embedding structure and the network concatenation relationship of the second de-embedding structure;

[0139] Specifically, in order to solve the network parameters of the left and right test connection structures under the condition of asymmetric test connection structure, the server first generates a matrix calculation model based on the network cascade relationship of the first and second de-embedding structures.

[0140] Both the first and second de-embedding structures are constructed by cascading the left-side test connection structure, the asymmetric passive device structure, and the right-side test connection structure. Based on the multiplicative property of the ABCD matrix in cascaded networks in two-port network theory, the cascading relationship between the left-side test connection structure, the asymmetric passive device structure, and the right-side test connection structure is described using matrix equations, thereby establishing the correspondence between the overall network parameters of the de-embedding structure and the network parameters of the left and right test connection structures. This method forms a matrix calculation model for subsequent parameter solving.

[0141] S402: Substitute the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, and the test ABCD matrix data of the second de-embedding structure into the matrix calculation model to obtain a system of six equations concerning the ABCD matrix elements of the left test connection structure and the ABCD matrix elements of the right test connection structure.

[0142] Specifically, after generating the matrix calculation model, the server substitutes the first simulated ABCD matrix data, the second simulated ABCD matrix data, the first de-embedding structure test ABCD matrix data, and the second de-embedding structure test ABCD matrix data into the matrix calculation model.

[0143] The first and second simulated ABCD matrix data are used to characterize the network characteristics of different asymmetric passive device structures, while the test ABCD matrix data of the first and second de-embedding structures reflect the overall network behavior of the de-embedding structures under actual test conditions. By uniformly substituting the above simulation and test data into the matrix calculation model, a system of six equations can be obtained regarding the ABCD matrix elements of the test connection structure on the left and the test connection structure on the right.

[0144] S403: Solve the six-equation system to obtain the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure.

[0145] Specifically, after constructing a system of six equations, the server solves the system to obtain the ABCD matrix of the left-hand test connection structure and the ABCD matrix of the right-hand test connection structure. Through this solution process, the network parameters of the left-hand and right-hand test connection structures under asymmetric test conditions can be determined separately without assuming that they are mirror images of each other in terms of structure or electrical characteristics.

[0146] Through the above steps, the network parameters of the left and right test connection structures are solved independently under the general asymmetric test connection structure conditions, providing a reliable parameter basis for further isolation of the influence of the test connection structure and acquisition of the network parameters of the device under test.

[0147] In one embodiment, passive electromagnetic field simulations are performed on the asymmetric passive device structures inserted inside the first and second de-embedding structures, respectively. By introducing the geometric dimensions, material parameters, and boundary conditions of the asymmetric passive device structures into a validated passive electromagnetic field simulation environment, simulation data corresponding to the ABCD matrix F of the first and second asymmetric passive device structures are obtained.

[0148] After simulating the asymmetric passive device structure, radio frequency (RF) tests were performed on the first and second de-embedding structures to obtain the corresponding test data. The network parameters obtained from the tests were processed to obtain the test data for the ABCD matrix M of the first de-embedding structure and the ABCD matrix N of the second de-embedding structure.

[0149] After obtaining the simulation data of ABCD matrices F and G and the test data of ABCD matrices M and N, the above simulation data and test data are used as known quantities and substituted into the six-variable equation system, i.e., equations (7) to (12). The six-variable equation system is based on... and The transformation yields unknowns including l. 11 l 12 l 22 r 11 r 12 and r 22 The specific expression is as follows:

[0150] (7)

[0151] (8)

[0152] (9)

[0153] (10)

[0154] (11)

[0155] (12)

[0156] By solving the above system of six equations, we obtain six unknowns l. 11 l 12 l 22 r 11 r 12 and r 22 The numerical values ​​are then determined. Based on the solution results, the ABCD matrices L and R corresponding to the left and right test connection structures can be further determined, thus obtaining a complete network parameter description of the left and right test connection structures under asymmetric test conditions.

[0157] S104: Generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test;

[0158] Specifically, after obtaining the ABCD matrices of the left and right test connection structures, the server performs RF testing on the overall test structure of the device under test (DUT) to obtain test data. RF testing can be performed using testing equipment such as a vector network analyzer. By converting the scattered parameters obtained during the test, the ABCD matrix corresponding to the overall test structure of the DUT is obtained. This ABCD matrix reflects the overall transmission characteristics of the DUT under actual test connection conditions, including the combined effects of the left test connection structure, the DUT itself, and the right test connection structure.

[0159] Figure 5 This is a schematic diagram of the fifth step of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in this embodiment of the invention, as shown below. Figure 5 As shown, in one embodiment of the present invention, S104 includes:

[0160] S501: Perform radio frequency testing on the overall test structure of the device under test to obtain test data of the overall test structure of the device under test;

[0161] Specifically, the server performs radio frequency (RF) testing on the overall test structure of the device under test (DUT), which consists of the left-side test connection structure, the DUT itself, and the right-side test connection structure. The RF test involves connecting the test ports to the external interfaces of the left and right-side test connection structures, applying RF excitation signals to the overall test structure, and acquiring the corresponding response signals. Through this testing process, test data reflecting the transmission characteristics of the overall DUT test structure under actual test conditions can be obtained. This test data includes the comprehensive network behavior resulting from the combined action of the left and right test connection structures and the DUT.

[0162] S502: Obtain the ABCD matrix of the overall test structure of the device under test based on the test data of the overall test structure of the device under test.

[0163] Specifically, after obtaining the test data of the overall test structure of the device under test (DUT), the server performs network parameter processing on the test data to generate ABCD matrix parameter values ​​for the overall DUT test structure. The scattering parameters obtained during RF testing can be converted into corresponding ABCD parameters, thus obtaining the ABCD matrix characterizing the transmission characteristics of the overall DUT test structure. The ABCD matrix, in the form of parameter values, fully describes the overall network characteristics of the cascaded test connection structure on the left, the DUT, and the test connection structure on the right, providing fundamental data for further isolation of the influence of the test connection structure.

[0164] S105: Generate the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0165] Specifically, after obtaining the ABCD matrix of the left-side test connection structure, the ABCD matrix of the right-side test connection structure, and the ABCD matrix of the overall test structure of the device under test (DUT), the server generates the two-port network parameters of the DUT based on these matrix parameters. By utilizing the cascading relationship of the RF network, the influence of the left-side and right-side test connection structures is separated from the ABCD matrix of the overall test structure of the DUT, and the ABCD matrix of the DUT is obtained. Subsequently, the ABCD matrix of the DUT can be converted into two-port network parameters such as impedance parameters, admittance parameters, hybrid parameters, or scattering parameters as needed, thereby achieving accurate characterization of the intrinsic electrical characteristics of the DUT.

[0166] Figure 6 This is a schematic diagram of the sixth step of the electromagnetic field simulation verification-assisted radio frequency de-embedding method provided in this embodiment of the invention, as shown below. Figure 6 As shown, in one embodiment of the present invention, S105 includes:

[0167] S601: Solve the ABCD matrix of the device under test based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test;

[0168] Specifically, after obtaining the ABCD matrices of the left-side test connection structure, the right-side test connection structure, and the overall test structure of the device under test (DUT), the server performs de-embedding calculations on these matrices based on the cascade relationship of the RF network to solve for the ABCD matrix of the DUT. The left-side and right-side test connection structures are considered as network units located on either side of the DUT within the overall test structure. By performing a reverse stripping operation on the ABCD matrix of the overall test structure, the influence of the left-side and right-side test connection structures on the RF signal transmission is eliminated, thus obtaining an ABCD matrix that only reflects the transmission characteristics of the DUT itself. The ABCD matrix of the DUT is given in the form of parameter values ​​to characterize the intrinsic network characteristics of the DUT.

[0169] S602: Transform the ABCD matrix of the device under test according to the requirements to obtain other two-port network parameters of the device under test.

[0170] Specifically, after obtaining the ABCD matrix of the device under test (DUT), the server performs network parameter transformation on the ABCD matrix according to the actual testing and analysis needs, generating two-port network parameters for the DUT. These two-port network parameters may include one or more of impedance parameters, admittance parameters, mixed parameters, or scattering parameters. Through this transformation process, the electrical characteristics of the DUT can be described and analyzed in different parameter forms. This enables the accurate extraction and characterization of the intrinsic electrical characteristics of the DUT under asymmetric test connection structure conditions.

[0171] In one embodiment, radio frequency (RF) testing is first performed on the overall test structure of the device under test (DUT). The overall DUT test structure consists of a left-side test connection structure, the DUT itself, and a right-side test connection structure cascaded together. RF testing equipment is used to measure this overall test structure, obtaining the corresponding network parameter test data. By processing the obtained test data, the test data for matrix A of the overall DUT test structure (ABCD matrix) is obtained.

[0172] After obtaining the test data for matrix A (ABCD), based on the cascade relationship of the RF network, and using the ABCD matrix L of the left test connection structure and the ABCD matrix R of the right test connection structure obtained in the previous steps, their inverse matrix L is calculated respectively. - ¹ and R - ¹. Subsequently, the inverse matrix L - ¹Left multiply by matrix A of type ABCD, and then multiply the inverse matrix R. - ¹ Multiply by the ABCD matrix A on the right to obtain the ABCD matrix D of the device under test. The calculation relationship is shown in equation (13):

[0173] (13)

[0174] Through the above calculation process, the influence of the left and right test connection structures is eliminated, and the ABCD matrix D only reflects the transmission characteristics of the device under test.

[0175] After obtaining the ABCD matrix D of the device under test (DUT), network parameter transformations can be performed on the ABCD matrix D according to actual testing and analysis needs to obtain other two-port network parameters of the DUT. Two-port network parameters include, but are not limited to, impedance matrix parameter Z, admittance matrix parameter Y, hybrid matrix parameter H, and scattering matrix parameter S. Through the above parameter transformation process, electromagnetic field simulation verification-assisted RF de-embedding is completed for general asymmetric test connection structures, achieving accurate extraction of the intrinsic electrical characteristics of the DUT.

[0176] This application provides an electromagnetic field simulation-assisted RF de-embedding method. It constructs an overall test structure for the device under test (DUT) based on a left-side test connection structure, a right-side test connection structure, and the DUT itself. The left-side and right-side test connection structures are asymmetrical. A de-embedding structure is constructed based on the left-side, right-side, and asymmetrical passive device structure. The ABCD matrices of the left-side and right-side test connection structures are solved using a pre-verified passive electromagnetic field simulation environment, the asymmetrical passive device structure, and the de-embedding structure. The ABCD matrix of the overall DUT test structure is generated based on the overall DUT test structure. Finally, the ABCD matrix of the DUT and other two-port network parameters are generated based on the ABCD matrices of the left-side, right-side, and overall DUT test structures. This method achieves accurate acquisition of the de-embedding network parameters of the DUT under high-frequency and even millimeter-wave conditions, significantly improving the applicability and testing accuracy of de-embedding.

[0177] It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0178] Based on the same inventive concept, embodiments of the present invention also provide an electromagnetic field simulation verification-assisted RF de-embedding device, which can be used to implement the electromagnetic field simulation verification-assisted RF de-embedding method described in the above embodiments, as described in the following embodiments. Since the principle of the electromagnetic field simulation verification-assisted RF de-embedding device in solving the problem is similar to that of the electromagnetic field simulation verification-assisted RF de-embedding method, embodiments of the electromagnetic field simulation verification-assisted RF de-embedding device can refer to embodiments of the electromagnetic field simulation verification-assisted RF de-embedding method, and repeated details will not be elaborated further. As used below, the terms "unit" or "module" can refer to a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0179] Figure 7 This is a schematic block diagram of the first structure of the electromagnetic field simulation verification-assisted radio frequency de-embedding device provided in an embodiment of the present invention, as shown below. Figure 7 As shown, in one embodiment of the present invention, the electromagnetic field simulation verification-assisted radio frequency de-embedding device of the present invention includes:

[0180] The test structure construction unit 701 is used to construct an overall test structure for the device under test based on the left test connection structure, the right test connection structure, and the device under test; the left test connection structure and the right test connection structure are asymmetrical;

[0181] The de-embedding structure building unit 702 is used to build a de-embedding structure based on the left test connection structure, the right test connection structure and the asymmetric passive device structure.

[0182] The first matrix solving unit 703 is used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure and the de-embedding structure.

[0183] The second matrix solving unit 704 is used to generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test.

[0184] The network parameter generation unit 705 is used to generate the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0185] Figure 8 This is a schematic block diagram of the second structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention. Figure 7 Based on the embodiments, further, such as Figure 8 As shown, in one embodiment of the present invention, the asymmetric passive device structure includes a first asymmetric passive device structure and a second asymmetric passive device structure; the de-embedding structure includes a first de-embedding structure and a second de-embedding structure; the de-embedding structure building unit 702 includes:

[0186] The first de-embedding structure construction module 801 is used to construct the first de-embedding structure based on the left test connection structure, the right test connection structure and the first asymmetric passive device structure.

[0187] The second de-embedding structure construction module 802 is used to construct the second de-embedding structure based on the left test connection structure, the right test connection structure and the second asymmetric passive device structure.

[0188] Figure 9 This is a schematic block diagram of the third structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention. Figure 8 Based on the embodiments, further, such as Figure 9As shown, in one embodiment of the present invention, the first matrix solving unit 703 includes:

[0189] The first simulation module 901 is used to perform passive electromagnetic field simulation on the first asymmetric passive device structure using a pre-verified passive electromagnetic field simulation environment to obtain the first simulation ABCD matrix data.

[0190] The second simulation module 902 is used to perform passive electromagnetic field simulation on the second asymmetric passive device structure using a pre-verified passive electromagnetic field simulation environment, and obtain the second simulation ABCD matrix data.

[0191] The first test module 903 is used to perform radio frequency testing on the first de-embedding structure and obtain test ABCD matrix data of the first de-embedding structure.

[0192] The second test module 904 is used to perform radio frequency testing on the second de-embedding structure and obtain the test ABCD matrix data of the second de-embedding structure.

[0193] The first matrix solving module 905 is used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure.

[0194] Figure 10 This is a schematic block diagram of the fourth structure of the electromagnetic field simulation verification-assisted radio frequency de-embedding device provided in the embodiments of the present invention. Figure 9 Based on the embodiments, further, such as Figure 10 As shown, in one embodiment of the present invention, the first matrix solving module 905 includes:

[0195] The computational model generation submodule 1001 is used to generate a matrix computational model based on the network concatenation relationship of the first de-embedding structure and the network concatenation relationship of the second de-embedding structure.

[0196] The equation generation submodule 1002 is used to substitute the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, and the test ABCD matrix data of the second de-embedding structure into the matrix calculation model to obtain a six-equation system about the ABCD matrix elements of the left test connection structure and the ABCD matrix elements of the right test connection structure.

[0197] The equation system solving submodule 1003 is used to solve the six-equation system to obtain the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure.

[0198] Figure 11 This is a schematic block diagram of the fifth structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention. Figure 7 Based on the embodiments, further, such as Figure 11 As shown, in one embodiment of the present invention, the second matrix solving unit 704 includes:

[0199] The third test module 1101 is used to perform radio frequency testing on the overall test structure of the device under test and obtain test data of the overall test structure of the device under test.

[0200] The second matrix solving module 1102 is used to obtain the ABCD matrix of the overall test structure of the device under test based on the test data of the overall test structure of the device under test.

[0201] Figure 12 This is a schematic block diagram of the sixth structure of the electromagnetic field simulation verification auxiliary radio frequency de-embedding device provided in the embodiments of the present invention. Figure 7 Based on the embodiments, further, such as Figure 12 As shown, in one embodiment of the present invention, the network parameter generation unit 705 includes:

[0202] The third matrix solving module 1201 is used to solve the ABCD matrix of the device under test based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

[0203] The network parameter generation module 1202 is used to transform the ABCD matrix of the device under test according to the requirements to obtain other two-port network parameters of the device under test.

[0204] This application provides an electromagnetic field simulation verification-assisted RF de-embedding method and apparatus. It constructs an overall test structure for the device under test (DUT) based on a left-side test connection structure, a right-side test connection structure, and the DUT itself; the left-side and right-side test connection structures are asymmetrical. A de-embedding structure is constructed based on the left-side, right-side, and asymmetrical passive device structure. The ABCD matrix of the left-side and right-side test connection structures is solved using a pre-verified passive electromagnetic field simulation environment, the asymmetrical passive device structure, and the de-embedding structure. The ABCD matrix of the overall DUT test structure is generated based on the overall DUT test structure. Finally, the ABCD matrix of the DUT and other two-port network parameters are generated based on the ABCD matrix of the left-side, right-side, and overall DUT test structure. This method achieves accurate acquisition of the de-embedding network parameters of the DUT under high-frequency and even millimeter-wave conditions, significantly improving the applicability and testing accuracy of de-embedding.

[0205] Figure 13 This is a schematic diagram of the structure of the computer device provided in an embodiment of the present invention, such as... Figure 13 As shown, the electronic device may include: a processor 1301, a communications interface 1302, a memory 1303, and a communications bus 1304, wherein the processor 1301, the communications interface 1302, and the memory 1303 communicate with each other through the communications bus 1304. Processor 1301 can call logic instructions in memory 1303 to execute the following methods: constructing an overall test structure for the device under test (DUT) based on the left test connection structure, the right test connection structure, and the DUT; the left test connection structure and the right test connection structure are asymmetric; constructing a de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure; solving the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on a pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure; generating the ABCD matrix of the overall test structure for the DUT based on the overall test structure for the DUT; and generating the ABCD matrix of the DUT and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure for the DUT.

[0206] Furthermore, the logical instructions in the aforementioned memory 1303 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, a top-drive control center server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0207] This embodiment discloses a computer program product, which includes a computer program stored on a computer-readable storage medium. The computer program includes program instructions, and when the program instructions are executed by a computer, the computer can execute the methods provided in the above-described method embodiments, such as: constructing an overall test structure for the device under test (DUT) based on a left-side test connection structure, a right-side test connection structure, and the DUT; the left-side test connection structure and the right-side test connection structure are asymmetric; constructing a de-embedding structure based on the left-side test connection structure, the right-side test connection structure, and the asymmetric passive device structure; solving for the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure based on a pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure; generating the ABCD matrix of the overall test structure of the DUT based on the overall test structure of the DUT; and generating the ABCD matrix of the DUT and other two-port network parameters based on the ABCD matrix of the left-side test connection structure, the ABCD matrix of the right-side test connection structure, and the ABCD matrix of the overall test structure of the DUT.

[0208] This embodiment provides a computer-readable storage medium storing a computer program that causes a computer to execute the methods provided in the above-described method embodiments. For example, the methods include: constructing an overall test structure for the device under test (DUT) based on a left-side test connection structure, a right-side test connection structure, and the DUT; wherein the left-side test connection structure and the right-side test connection structure are asymmetric; constructing a de-embedding structure based on the left-side test connection structure, the right-side test connection structure, and the asymmetric passive device structure; solving for the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure based on a pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure; generating the ABCD matrix of the overall DUT test structure based on the overall DUT test structure; and generating the ABCD matrix of the DUT and other two-port network parameters based on the ABCD matrix of the left-side test connection structure, the ABCD matrix of the right-side test connection structure, and the ABCD matrix of the overall DUT test structure.

[0209] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0210] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0211] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1The function specified in one or more boxes.

[0212] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0213] In the description of this specification, the references to terms such as "an embodiment," "a specific embodiment," "some embodiments," "for example," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0214] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of this application. It should be understood that the above descriptions are merely specific embodiments of this application and are not intended to limit the scope of protection of this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of protection of this application.

Claims

1. A method for assisting radio frequency de-embedding through electromagnetic field simulation verification, characterized in that, include: Construct the overall test structure for the device under test based on the test connection structure on the left, the test connection structure on the right, and the device under test. The left-side test connection structure is asymmetrical with the right-side test connection structure; A de-embedding structure is constructed based on the left-side test connection structure, the right-side test connection structure, and the asymmetric passive device structure. Based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure, the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure are solved. Generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test; Based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test, the ABCD matrix of the device under test and other two-port network parameters are generated.

2. The electromagnetic field simulation verification-assisted RF de-embedding method according to claim 1, characterized in that, The asymmetric passive device structure includes a first asymmetric passive device structure and a second asymmetric passive device structure; the de-embedding structure includes a first de-embedding structure and a second de-embedding structure; the construction of the de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure includes: The first de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the first asymmetric passive device structure. The second de-embedding structure is constructed based on the left test connection structure, the right test connection structure, and the second asymmetric passive device structure.

3. The electromagnetic field simulation verification-assisted RF de-embedding method according to claim 2, characterized in that, The pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure, and the de-embedding structure are used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure, including: The first asymmetric passive device structure was simulated using a pre-verified passive electromagnetic field simulation environment to obtain the first simulation ABCD matrix data. The passive electromagnetic field simulation of the second asymmetric passive device structure was performed using a pre-verified passive electromagnetic field simulation environment to obtain the second simulation ABCD matrix data. Radio frequency testing was performed on the first de-embedding structure to obtain the test ABCD matrix data of the first de-embedding structure. Radio frequency testing was performed on the second de-embedding structure to obtain the test ABCD matrix data of the second de-embedding structure. Based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure, the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure are solved.

4. The electromagnetic field simulation verification-assisted RF de-embedding method according to claim 3, characterized in that, The step of solving the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure based on the first simulated ABCD matrix data, the second simulated ABCD matrix data, the test ABCD matrix data of the first de-embedding structure, the test ABCD matrix data of the second de-embedding structure, the network cascading relationship of the first de-embedding structure, and the network cascading relationship of the second de-embedding structure includes: A matrix calculation model is generated based on the network concatenation relationship of the first de-embedding structure and the network concatenation relationship of the second de-embedding structure. Substituting the first simulated ABCD matrix data, the second simulated ABCD matrix data, the first de-embedding structure test ABCD matrix data, and the second de-embedding structure test ABCD matrix data into the matrix calculation model, a system of six equations is obtained regarding the ABCD matrix elements of the left test connection structure and the ABCD matrix elements of the right test connection structure. Solving the six-equation system yields the ABCD matrix of the left-side test connection structure and the ABCD matrix of the right-side test connection structure.

5. The electromagnetic field simulation verification-assisted RF de-embedding method according to claim 1, characterized in that, The step of generating the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test includes: Radio frequency testing is performed on the overall test structure of the device under test to obtain test data of the overall test structure of the device under test. The ABCD matrix of the overall test structure of the device under test is obtained based on the test data of the overall test structure of the device under test.

6. The electromagnetic field simulation verification-assisted RF de-embedding method according to claim 1, characterized in that, The generation of the ABCD matrix and other two-port network parameters of the device under test (DUT) based on the ABCD matrix of the left-side test connection structure, the ABCD matrix of the right-side test connection structure, and the ABCD matrix of the overall test structure of the DUT includes: The ABCD matrix of the device under test is solved based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test. The ABCD matrix of the device under test is transformed according to the requirements to obtain other two-port network parameters of the device under test.

7. An electromagnetic field simulation verification auxiliary radio frequency de-embedding device, characterized in that, include: The test structure building unit is used to construct the overall test structure of the device under test based on the left test connection structure, the right test connection structure and the device under test. The left-side test connection structure is asymmetrical with the right-side test connection structure; A de-embedding structure building unit is used to construct a de-embedding structure based on the left test connection structure, the right test connection structure, and the asymmetric passive device structure. The first matrix solving unit is used to solve the ABCD matrix of the left test connection structure and the ABCD matrix of the right test connection structure based on the pre-verified passive electromagnetic field simulation environment, the asymmetric passive device structure and the de-embedding structure. The second matrix solving unit is used to generate the ABCD matrix of the overall test structure of the device under test based on the overall test structure of the device under test. The network parameter generation unit is used to generate the ABCD matrix of the device under test and other two-port network parameters based on the ABCD matrix of the left test connection structure, the ABCD matrix of the right test connection structure, and the ABCD matrix of the overall test structure of the device under test.

8. A computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the electromagnetic field simulation verification-assisted radio frequency de-embedding method as described in any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program / instructions stored thereon, characterized in that, When the computer program / instructions are executed by the processor, they implement the steps of the electromagnetic field simulation verification-assisted radio frequency de-embedding method as described in any one of claims 1 to 6.

10. A computer program product comprising a computer program / instructions, characterized in that, When the computer program / instruction is executed by the processor, it implements the steps of the electromagnetic field simulation verification-assisted radio frequency de-embedding method as described in any one of claims 1 to 6.

Images