Electrostatic protection element test tool, test method and related device
The automated testing method using electrostatic discharge (ESD) protection component testing fixtures solves the problems of low efficiency and poor accuracy associated with manual clamp testing, achieving efficient and accurate testing of ESD protection components.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CASIC DEFENSE TECH RES & TEST CENT
- Filing Date
- 2026-01-05
- Publication Date
- 2026-05-12
AI Technical Summary
Existing testing methods for electrostatic discharge (ESD) protection components rely on manual clamping, which is inefficient, prone to damaging pins, and has low testing accuracy.
The test fixture, which employs electrostatic protection components, includes a test daughterboard, a test motherboard, and a test system. It achieves automated testing through connecting circuits and switchable circuits, avoiding manual clamping and connection.
It improves the testing efficiency and accuracy of electrostatic protection components, saves labor costs, and avoids testing errors caused by loose clamping.
Smart Images
Figure CN122017393A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of component testing technology, and in particular to a testing fixture, testing method and related apparatus for electrostatic protection components. Background Technology
[0002] Electrostatic discharge (ESD) protection components are crucial for protecting electronic components from electrostatic damage. To reduce losses caused by ESD interference in electronic components, it is imperative to improve the reliability of ESD protection components.
[0003] Existing testing methods for ESD protection components mainly rely on manual clamping, using test clamps to clamp the pins of the ESD protection component one by one for testing. This testing method is inefficient and cumbersome. In addition to clamping each pin for testing, it usually has some problems, such as the pins being easily damaged when using test clamps to connect the device, or the test clamps not making a tight contact with the device pins, resulting in low test accuracy. Summary of the Invention
[0004] In view of this, the purpose of this application is to provide a testing fixture, testing method and related apparatus for electrostatic protection components.
[0005] To achieve the above objectives, this application provides a testing fixture for electrostatic discharge protection components, comprising: The test sub-board is used to connect to the electrostatic discharge protection device under test. The test motherboard includes a connection circuit and a switchable circuit, both of which are connected to the test daughterboard to connect to the electrostatic protection component under test via the test daughterboard. The testing system includes a control port, a connection port, and a test port. The connection port is connected to the electrostatic discharge protection device under test (ESD device) through the connection circuit. The test port is connected to the ESD device under test through the switchable circuit. The control port is connected to the switchable circuit to control the switching on and off of the switchable circuit. The testing system coordinates the control port, connection port, and test port to perform testing on the electrostatic protection component under test.
[0006] Furthermore, the electrostatic discharge protection component under test includes a first end, a second end, and at least one test point. The test sub-board includes a first connection end, a second connection end, and at least one test end. The first connection end is used to connect to the first end, the second connection end is used to connect to the second end, and the at least one test end is connected to the at least one test point in a one-to-one correspondence.
[0007] Furthermore, the testing system includes two connection ports and at least one test port and a control port. The connection circuit includes a first circuit and a second circuit. The switchable circuit includes at least one third circuit. The first circuit is connected to the first connection terminal and a connection port. The second circuit is connected to the second connection terminal and another connection port. One end of the third circuit is connected to the test terminal in a one-to-one correspondence. The other end of the third circuit is connected to the test port in a one-to-one correspondence. The control port is connected to the third circuit in a one-to-one correspondence to control the on / off state of each third circuit.
[0008] Furthermore, the test system includes a controller, which controls two connection ports and at least one test port and control port of the test system to perform testing on the electrostatic protection component under test.
[0009] Furthermore, the electrostatic discharge protection device under test includes four test points, the test sub-board includes four test terminals, the test motherboard includes four third circuits, and the test system includes four test ports. Each test port is connected to a third circuit, each third circuit is connected to a test terminal, and each test terminal is connected to a test point.
[0010] Furthermore, the test fixture also includes an LCR tester, which is used to connect to the electrostatic protection component under test through the test motherboard and the test daughterboard.
[0011] Furthermore, the test fixture also includes a clamping voltage tester, which is used to connect to the electrostatic protection component under test through the test motherboard and the test daughterboard.
[0012] Based on the same inventive concept, this application also provides a method for testing electrostatic discharge (ESD) protection components, applied to the ESD protection component testing fixture described above, the method comprising: Connect the test daughterboard to the test motherboard, and connect the test motherboard to the test system; Connect the electrostatic protection component to be tested to the test sub-board; Start the test system to test the electrostatic discharge protection component under test through the control port, test port and connection port of the test system.
[0013] Furthermore, the method also includes: Connect the test motherboard to the LCR tester, and connect the electrostatic protection component under test to the test daughterboard; Start the LCR tester to test the capacitance of the electrostatic protection component under test.
[0014] Furthermore, the method also includes: Connect the test motherboard to the clamping voltage tester, and connect the electrostatic protection component under test to the test daughterboard; Start the clamping voltage tester to test the clamping voltage of the electrostatic protection component under test.
[0015] Based on the same inventive concept, this disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method described above when executing the computer program.
[0016] Based on the same inventive concept, this disclosure also provides a non-transitory computer-readable storage medium that stores computer instructions for causing a computer to perform the method described above.
[0017] As can be seen from the above description, the electrostatic discharge (ESD) protection component testing fixture, testing method, and related apparatus provided in this application are applied in the field of component testing technology. The testing fixture includes a test sub-board for connecting to the ESD protection component under test, a test motherboard connected to the test sub-board via a connection circuit and a switchable circuit, and a testing system connected to the ESD protection component under test via the test motherboard. The testing system controls the on / off state of the switchable circuit on the test motherboard by controlling the output electrical signal of its control port. Based on this, by controlling the electrical signals of the connection port and test port of the testing system, different parameters of the ESD protection component under test can be tested. This avoids manually changing the connection relationship between the testing instrument and the ESD protection component to achieve different parameters of the ESD protection component under test, thus improving the testing efficiency of ESD protection components and saving labor costs. Attached Figure Description
[0018] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0019] Figure 1 This is a schematic diagram of the structure of a test fixture for an electrostatic protection component according to an embodiment of this application; Figure 2 This is a schematic diagram of the connection structure between the electrostatic protection component under test and the test system in an embodiment of this application; Figure 3 This is a schematic diagram of the structure of the electrostatic protection element under test in an embodiment of this application; Figure 4This is a flowchart illustrating a testing method for an electrostatic protection component according to an embodiment of this application; Figure 5 This is a schematic diagram of the structure of an electronic device according to an embodiment of this application.
[0020] In the diagram: 10, Test daughterboard; 20, Test motherboard; 21, Connection circuit; 22, Switchable circuit; 30, Test system. Detailed Implementation
[0021] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.
[0022] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.
[0023] As described in the background section, electrostatic discharge (ESD) protection components are crucial for protecting electronic components from electrostatic damage. In order to reduce losses caused by ESD interference in electronic components, it is imperative to improve the reliability of ESD protection components.
[0024] Existing testing methods for ESD protection components mainly rely on manual clamping, using test clamps to clamp the pins of the ESD protection component one by one for testing. This testing method is inefficient and cumbersome. In addition to clamping each pin for testing, it usually has some problems, such as the pins being easily damaged when using test clamps to connect the device, or the test clamps not making a tight contact with the device pins, resulting in low test accuracy.
[0025] Based on this, this application proposes a testing fixture, testing method and related apparatus for electrostatic discharge (ESD) protection components to avoid damage to the pins of ESD protection components during testing, and to avoid the problem of decreased ESD due to loose connection with the pins of ESD protection components. This is beneficial to improving the testing efficiency of ESD protection components and also to improving the testing accuracy.
[0026] The embodiments of this application will be described in detail below with reference to the accompanying drawings.
[0027] In some embodiments, a test fixture for electrostatic discharge protection components, such as Figure 1 and Figure 2 As shown, including Test sub-board 10 is used to connect to the electrostatic protection component under test; The test motherboard 20 includes a connection circuit 21 and a switchable circuit 22, both of which are connected to the test daughterboard 10 to connect to the electrostatic protection element under test through the test daughterboard 10. The test system 30 includes a control port, a connection port, and a test port. The connection port is connected to the electrostatic discharge protection device under test (ESD device) through the connection circuit 21. The test port is connected to the ESD device under test through the switchable circuit 22. The control port is connected to the switchable circuit 22 to control the switching of the switchable circuit 22. The test system 30 coordinates the control port, connection port, and test port to perform tests on the electrostatic protection component under test.
[0028] Specifically, the test sub-board 10 is provided with a groove adapted to the electrostatic discharge (ESD) component under test (ESD), so that when the ESD component under test is located in the groove, it can be connected to the test sub-board 10. That is, the pins of the ESD component under test are in contact with the test sub-board 10, which can avoid the problem of pin clamping and damage caused by the connection of the ESD component under test. It can also simplify the connection method of the ESD component under test and save the connection time between the ESD component under test and the test fixture.
[0029] The test motherboard 20 is connected to the electrostatic discharge (ESD) protection element under test (ESDPE) via the test daughterboard 10, which facilitates the connection of the connection circuit 21 and the switchable circuit 22 to the ESDPE protection element under test. Furthermore, the test system 30 is connected to the connection circuit 21 and the switchable circuit 22 to connect to the ESDPE protection element under test. At the same time, it can control the on / off state of the switchable circuit 22 to achieve coordinated testing of various parameters of the ESDPE protection element under test, which helps to improve testing efficiency.
[0030] It should be noted that the setup of the test fixture can avoid clamping the test system 30 to the electrostatic protection component under test when testing the component under test, thus avoiding test result errors caused by connection errors (such as loose clamping), thereby improving test accuracy. Furthermore, the setup cost of the test sub-board 10 and test mother board 20 in the test fixture is low, which is conducive to application and promotion.
[0031] In addition, the test system 30 can control the output electrical signals of the control port, connection port and test port based on preset rules, thereby realizing the testing of various parameters of the electrostatic protection component under test.
[0032] In this embodiment, the testing fixture includes a test sub-board 10 for connecting to the electrostatic discharge (ESD) protection element under test (ESD), a test motherboard 20 connected to the test sub-board 10 via a connection circuit 21 and a switchable circuit 22, and a test system 30 connected to the ESD protection element under test via the test motherboard 20. The test system 30 controls the on / off state of the switchable circuit 22 on the test motherboard 20 by controlling the output electrical signal of its control port. Based on this, the test system 30 controls the electrical signals of the connection port and the test port to test different parameters of the ESD protection element under test. This avoids manually changing the connection relationship between the testing instrument and the ESD protection element to test different parameters of the ESD protection element, which helps to improve the testing efficiency of the ESD protection element and save labor costs.
[0033] In some embodiments, the electrostatic discharge protection element under test includes a first end, a second end, and at least one test point. The test sub-board 10 includes a first connection end, a second connection end, and at least one test end. The first connection end is used to connect to the first end, the second connection end is used to connect to the second end, and the at least one test end is connected to the at least one test point in a one-to-one correspondence.
[0034] Specifically, the number of test points is related to the number of channels in the electrostatic discharge protection element under test that are connected in parallel with the TVS. That is, each channel includes two low-capacitance diodes, and the test points are located between the two low-capacitance diodes corresponding to each channel, so as to realize the testing of the two low-capacitance diodes in each channel.
[0035] Specifically, the electrostatic discharge protection device under test includes a TVS diode and eight low-capacitance diodes. The eight low-capacitance diodes are connected in series in pairs and in parallel with the TVS diode. The two ends of the TVS diode correspond to the first end and the second end, respectively. The first end corresponds to the positive input end of the TVS diode, and the second end corresponds to the positive output end of the TVS diode. The test point is located between two low-capacitance diodes connected in series, and there are four test points. When testing the electrostatic discharge protection device under test (ESD), various parameters need to be tested according to the first end, the second end, and at least one test point. The test sub-board 10 is adapted to the ESD device under test and serves to connect the ESD device under test to the test motherboard 20. Therefore, the test sub-board 10 includes a first connection end, a second connection end, and at least one test end that correspond one-to-one with the first end, the second end, and at least one test point of the ESD device under test, so that the test motherboard 20 can be connected to the first end, the second end, and at least one test point of the ESD device under test, thereby facilitating the testing of the ESD device under test by the test system 30.
[0036] In some embodiments, the test system 30 includes two connection ports and at least one test port and a control port. The connection circuit 21 includes a first circuit and a second circuit. The switchable circuit 22 includes at least one third circuit. The first circuit is connected to the first connection terminal and a connection port. The second circuit is connected to the second connection terminal and another connection port. One end of the third circuit is connected to the test terminal in a one-to-one correspondence. The other end of the third circuit is connected to the test port in a one-to-one correspondence. The control port is connected to the third circuit in a one-to-one correspondence to control the on / off state of each third circuit.
[0037] Specifically, the two connection ports of the test system 30 are respectively connected to the first and second ends of the electrostatic discharge protection element under test through the first and second circuits. At least one test port of the test system 30 is connected to the test point of the electrostatic discharge protection element under test in a one-to-one correspondence (when there is one test port of the test system, all test points of the electrostatic discharge protection element under test are connected to the test port, and the connectivity between the test port and the test point is related to the on / off state of the third circuit connecting the test port and the test point) to realize the testing of the electrostatic discharge protection element under test. At least one control port of the test system 30 is connected to the third circuit in a one-to-one correspondence to control the on / off state of the third circuit.
[0038] When the test points of the electrostatic discharge protection element under test include 4, the 4 test ports of the test system 30 are connected one-to-one with the test points. Then, the third circuit is provided with 4, which are respectively used to connect the test ports and the test points, so as to realize the test system 30 to test the electrostatic discharge protection element under test. The control port is provided with 4, which are respectively connected to the control terminal of the third circuit to control the on and off of the third circuit.
[0039] It should be noted that the third circuit is a switchable circuit 22, that is, the test system 30 can control the on / off state of the third circuit through the control port connected to the third circuit to realize the test of the electrostatic protection component under test. The third circuit is equipped with a relay, and the control terminal of the relay is the control port of the third circuit.
[0040] For example, such as Figure 3 As shown, the electrostatic discharge protection device under test includes a TVS diode and eight low-capacitance diodes. The eight low-capacitance diodes are connected in series in pairs and in parallel with the TVS diode. When testing the parameters of one of the low-capacitance diodes, the test system 30 controls the third circuit connected to the test point at one end of the low-capacitance diode to be turned on, and controls the test point to be connected to a high level, while the first end (or the second end) at the other end of the first low-capacitance diode is connected to a low level, or controls the test point to be connected to a low level, while the first end at the other end of the first low-capacitance diode is connected to a high level, so as to realize the test of the first low-capacitance diode.
[0041] In some embodiments, the test system 30 includes a controller for controlling two connection ports and at least one test port and control port of the test system 30 to perform testing on the electrostatic discharge protection component under test.
[0042] Specifically, the controller controls the output signals of the connection port, test port and control port of the test system 30 and the electrostatic protection component under test respectively based on the preset test procedure, so as to realize the testing of various parameters of the electrostatic protection component under test.
[0043] It should be noted that the test system 30 can measure the parameters of the electrostatic discharge protection element under test, including: the forward voltage drop, breakdown voltage, and reverse leakage current of each low-capacitance diode at different voltages (e.g., the reverse leakage current of the low-capacitance diode at 5V and the reverse leakage current of the low-capacitance diode at 3.3V).
[0044] In this embodiment, the testing system 30 automatically tests the electrostatic discharge (ESD) protection component under test (ESD) through a pre-stored test program in the controller, which greatly improves the testing efficiency of the ESD protection component under test. Furthermore, the ESD protection component under test is connected to the testing system 30 through the test sub-board 10 and the test mother board 20, which avoids the ESD protection component under test being connected to the testing system 30 by clamping, thereby avoiding the impact of clamping errors on the testing accuracy of the ESD protection component under test, and is conducive to improving the testing accuracy of the ESD protection component under test.
[0045] In some embodiments, the test fixture further includes an LCR tester, which is used to connect to the electrostatic protection element under test through the test motherboard 20 and the test daughterboard 10.
[0046] Specifically, the LCR tester is used to connect to the first and second terminals of the electrostatic discharge protection element under test in order to test the capacitance of the electrostatic discharge protection element under test.
[0047] It should be noted that when the LCR tester tests the electrostatic discharge protection device under test, it is connected to the connection circuit 21 of the test motherboard 20, so as to realize the connection with the electrostatic discharge protection device under test through the connection between the test motherboard 20 and the test daughterboard 10, and the connection between the test daughterboard 10 and the electrostatic discharge protection device under test.
[0048] In this embodiment, the LCR tester is connected to the electrostatic discharge (ESD) protection component under test through the test mother board 20 and the test daughter board 10, so as to realize the capacitance test of the ESD protection component under test. This avoids the problem of the LCR tester being clamped to the ESD protection component under test, which could lead to the problem of the test accuracy being affected by the clamping not being tight. This is beneficial to improving the test accuracy of the test fixture.
[0049] In some embodiments, the test fixture further includes a clamping voltage tester, which is used to connect to the electrostatic protection element under test through the test motherboard 20 and the test daughterboard 10.
[0050] Specifically, the clamping voltage tester is used to connect to the first and second terminals of the electrostatic discharge protection element under test in order to test the clamping voltage of the electrostatic discharge protection element under test.
[0051] It should be noted that when the clamping voltage tester tests the electrostatic protection element under test, it is connected to the connection circuit 21 of the test motherboard 20, so as to realize the connection with the electrostatic protection element under test through the connection between the test motherboard 20 and the test daughterboard 10, and the connection between the test daughterboard 10 and the electrostatic protection element under test.
[0052] In this embodiment, the clamping voltage tester is connected to the electrostatic discharge (ESD) protection component under test through the test mother board 20 and the test daughter board 10, so as to test the clamping voltage of the ESD protection component under test. This avoids the problem of the clamping voltage tester being clamped to the ESD protection component under test, which could lead to problems such as loose clamping affecting the test accuracy. This is beneficial to improving the test accuracy of the test fixture.
[0053] Based on the same inventive concept, this application also provides a method for testing electrostatic discharge (ESD) protection components, applied to the ESD protection component testing fixture described above, such as... Figure 4 As shown, the method includes: Step S101: Connect the test sub-board to the test motherboard, and connect the test motherboard to the test system; Specifically, the test daughter board is connected to the connection circuit and the switchable circuit on the test mother board, the connection circuit and the switchable circuit on the test mother board are connected to the connection port and the test port of the test system, and the control terminal of the switchable circuit is connected to the control port of the test system so that the test system controls the on / off state of the switchable circuit.
[0054] Step S102: Connect the electrostatic protection component to be tested to the test sub-board; Specifically, by placing the electrostatic discharge (ESD) protection element under test (ESD) in the groove on the test sub-board according to the standard placement direction, the connection between the test sub-board and the ESD protection element under test can be achieved, which helps to improve the connection efficiency between the ESD protection element under test and the test sub-board.
[0055] Step S103: Start the test system to test the electrostatic discharge protection component under test through the control port, test port and connection port of the test system.
[0056] Specifically, pressing the test start button of the test system activates the test system, which then performs tests on the electrostatic protection component under test according to the preset test procedure.
[0057] It should be noted that there is a corresponding relationship between the control port and the test port of the test system. That is, the corresponding control port and the test port are connected to the same switchable circuit. When a control port controls the switchable circuit it is connected to to conduct, the test system determines that the test port corresponding to the switchable circuit needs to execute the test process, and then the connection port assists the test port to complete the test together.
[0058] For example, such as Figure 3As shown, the electrostatic discharge protection device under test includes one TVS diode and eight low-capacitance diodes. The eight low-capacitance diodes are connected in series in pairs and in parallel with the TVS diode. The two ends of the TVS diode correspond to the first end and the second end, respectively. The first end corresponds to the forward input end of the TVS diode, and the second end corresponds to the forward output end of the TVS diode. The test point is located between two low-capacitance diodes connected in series. There are four test points. The test system includes four control ports, four test ports, and two connection ports. The two connection ports are connected to the first end and the second end through two connection circuits. The four test ports are connected to the four test points through four switchable circuits. The four control ports are connected to the four switchable circuits respectively to control the on / off state of the four switchable circuits. The parameters tested by the test system include the forward voltage drop, breakdown voltage, and reverse leakage current of each diode at different voltages.
[0059] For example, as shown in Table 1, these are the parameters of the electrostatic discharge (ESD) protection device obtained after the test system is completed. The serial numbers of the diodes in the ESD protection device are as follows: Figure 3 As shown.
[0060] Table 1 Test Results of the Test System
[0061] In this embodiment, when testing the electrostatic discharge (ESD) protection component under test using the test fixture, it is only necessary to connect the ESD protection component under test to the test fixture and start the test system. The test system can then complete the testing of various parameters of the ESD protection component under test according to a preset procedure, which can greatly improve the testing efficiency of the ESD protection component under test. Furthermore, the test fixture can avoid clamping the ESD protection component under test, which is beneficial to improving the testing accuracy of the ESD protection component under test.
[0062] In some embodiments, the method further includes: Step S201: Connect the test motherboard to the LCR tester and connect the electrostatic protection component under test to the test daughterboard. Step S202: Start the LCR tester to test the capacitance of the electrostatic protection component under test.
[0063] Specifically, after the relevant parameters of the electrostatic protection component under test are tested by the test system, the connection between the test motherboard and the test system is disconnected, and the two connection circuits of the test motherboard are connected to the two test terminals of the LCR tester respectively. The LCR tester is then started, and the LCR tester can measure the capacitance of the electrostatic protection component under test.
[0064] It should be noted that the two connection circuits of the test motherboard correspond to the first and second terminals of the electrostatic discharge protection element under test, respectively. The LCR tester completes the connection of its two test terminals to the first and second terminals according to the rules for capacitance testing of the electrostatic discharge protection element under test, so as to measure the capacitance of the electrostatic discharge protection element under test.
[0065] In this embodiment, the test fixture enables the testing of the capacitance of the electrostatic discharge protection component under test, and avoids the clamping connection between the LCR tester and the electrostatic discharge protection component under test, thereby avoiding the impact of clamping errors on the test accuracy and improving the test accuracy of the capacitance of the electrostatic discharge protection component under test.
[0066] In some embodiments, the method further includes: Step S301: Connect the test motherboard to the clamping voltage tester and connect the electrostatic protection component under test to the test daughterboard. Step S302: Start the clamping voltage tester to test the clamping voltage of the electrostatic protection component under test.
[0067] Specifically, after the relevant parameters of the electrostatic protection component under test are tested by the test system, the connection between the test motherboard and the test system is disconnected, and the two connection circuits of the test motherboard are connected to the two test terminals of the clamping voltage tester respectively. The clamping voltage tester is then started, and the clamping voltage tester can measure the clamping voltage of the electrostatic protection component under test.
[0068] It should be noted that the two connection circuits of the test motherboard correspond to the first and second terminals of the electrostatic protection element under test, respectively. The clamping voltage tester completes the connection of its two test terminals to the first and second terminals according to the rules for clamping voltage testing of the electrostatic protection element under test, so as to measure the clamping voltage of the electrostatic protection element under test.
[0069] In this embodiment, the clamping voltage of the electrostatic discharge protection device under test can be tested using the test fixture, and the clamping voltage tester can be avoided from being clamped to the electrostatic discharge protection device under test, thereby avoiding the situation where the test accuracy is affected by clamping error, which is beneficial to improving the test accuracy of the clamping voltage of the electrostatic discharge protection device under test.
[0070] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the task. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the method described.
[0071] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0072] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the testing method described in any of the above embodiments.
[0073] Figure 5 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.
[0074] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.
[0075] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is called and executed by the processor 1010.
[0076] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.
[0077] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).
[0078] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.
[0079] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.
[0080] The electronic devices described above are used to implement the corresponding test methods in any of the foregoing embodiments and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0081] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium that stores computer instructions for causing the computer to perform the test method as described in any of the above embodiments.
[0082] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.
[0083] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute the test method as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0084] Based on the same concept, corresponding to any of the above embodiments, this application also provides a computer program product, including computer program instructions, which, when run on a computer, cause the computer to perform the method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0085] It is understood that before using the technical solutions of the various embodiments in this disclosure, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.
[0086] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations of this disclosed technical solution.
[0087] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.
[0088] It is understood that the above notification and user authorization process are merely illustrative and do not constitute a limitation on the implementation of this disclosure. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.
[0089] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in detail for the sake of brevity.
[0090] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.
[0091] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.
[0092] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the claims of this application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.
Claims
1. A testing fixture for electrostatic discharge protection components, characterized in that, include: The test sub-board is used to connect to the electrostatic discharge protection device under test. The test motherboard includes a connection circuit and a switchable circuit, both of which are connected to the test daughterboard to connect to the electrostatic protection component under test via the test daughterboard. The testing system includes a control port, a connection port, and a test port. The connection port is connected to the electrostatic discharge protection device under test (ESD device) through the connection circuit. The test port is connected to the ESD device under test through the switchable circuit. The control port is connected to the switchable circuit to control the switching on and off of the switchable circuit. The testing system coordinates the control port, connection port, and test port to perform testing on the electrostatic protection component under test.
2. The electrostatic discharge protection element testing fixture according to claim 1, characterized in that, The electrostatic discharge protection component under test includes a first end, a second end, and at least one test point. The test sub-board includes a first connection end, a second connection end, and at least one test end. The first connection end is used to connect to the first end, the second connection end is used to connect to the second end, and the at least one test end is connected to the at least one test point in a one-to-one correspondence.
3. The electrostatic protection element testing fixture according to claim 2, characterized in that, The testing system includes two connection ports and at least one test port and a control port. The connection circuit includes a first circuit and a second circuit. The switchable circuit includes at least one third circuit. The first circuit is connected to the first connection terminal and a connection port. The second circuit is connected to the second connection terminal and another connection port. One end of the third circuit is connected to the test terminal in a one-to-one correspondence. The other end of the third circuit is connected to the test port in a one-to-one correspondence. The control port is connected to the third circuit in a one-to-one correspondence to control the on / off state of each third circuit.
4. The electrostatic discharge protection element testing fixture according to claim 3, characterized in that, The testing system includes a controller, which controls two connection ports and at least one test port and a control port of the testing system to perform testing on the electrostatic protection component under test.
5. The electrostatic protection element testing fixture according to claim 3, characterized in that, The electrostatic discharge protection device under test includes four test points, the test sub-board includes four test terminals, the test motherboard includes four third circuits, and the test system includes four test ports. Each test port is connected to a third circuit, each third circuit is connected to a test terminal, and each test terminal is connected to a test point.
6. The electrostatic discharge protection element testing fixture according to claim 1, characterized in that, It also includes an LCR tester, which is used to connect to the electrostatic discharge protection component under test through the test motherboard and the test daughterboard.
7. The electrostatic discharge protection element testing fixture according to claim 1, characterized in that, It also includes a clamping voltage tester, which is used to connect to the electrostatic protection component under test through the test motherboard and the test daughterboard.
8. A method for testing electrostatic discharge protection components, characterized in that, The method, applied to the electrostatic discharge protection element test fixture as described in any one of claims 1-7, comprises: Connect the test daughterboard to the test motherboard, and connect the test motherboard to the test system; Connect the electrostatic protection component to be tested to the test sub-board; Start the test system to test the electrostatic discharge protection component under test through the control port, test port and connection port of the test system.
9. The method according to claim 8, characterized in that, Also includes: Connect the test motherboard to the LCR tester, and connect the electrostatic protection component under test to the test daughterboard; Start the LCR tester to test the capacitance of the electrostatic protection component under test.
10. The method according to claim 8, characterized in that, Also includes: Connect the test motherboard to the clamping voltage tester, and connect the electrostatic protection component under test to the test daughterboard; Start the clamping voltage tester to test the clamping voltage of the electrostatic protection component under test.
11. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the program, it implements the method as described in any one of claims 8-10.
12. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method of claim 8.
13. A computer program product comprising computer program instructions, characterized in that, When the computer program instructions are executed on a computer, the computer causes the computer to perform the method as described in any one of claims 8-10.