Multi-phase wire core test method, system, equipment, medium and product

Abstract

The invention provides a multi-phase wire core testing method, system and device, a medium and a product, and relates to the technical field of electric power safety. The method comprises the following steps: executing a loop parasitic test on each phase of wire core in multiple phases of wire cores connected to a wire core test device to obtain a voltage value of the corresponding wire core; determining whether a target voltage value less than or equal to a voltage threshold exists in the plurality of voltage values; if yes, determining the wire core corresponding to the target voltage value as a target wire core; performing an insulation test on the target wire core to obtain an insulation resistance value of the target wire core; and determining the target wire core of which the insulation resistance value is smaller than the resistance value threshold value as a qualified wire core. According to the invention, the efficiency and accuracy of multi-phase wire core testing are improved.

Description

Technical Field

[0001] This application relates to the field of power safety technology, and in particular to a method, system, equipment, medium and product for testing multiphase conductors. Background Technology

[0002] With the expansion and increasing complexity of power systems, the demand for secondary circuit testing of multiphase conductors, as a key component, is becoming increasingly prominent. To ensure the stable operation of power systems, efficient and accurate parasitic detection and insulation testing of multiphase conductors has become a crucial link in ensuring equipment safety and operational reliability.

[0003] Currently, multiphase conductor testing employs a step-by-step manual operation: first, a multimeter is used to check the parasitic voltage of each conductor to confirm the absence of voltage, and then an insulation resistance meter is used for insulation testing. During insulation testing, one clamp of the insulation resistance meter is fixed to the grounding copper busbar or a reference conductor, while the other clamp sequentially clamps the other conductors to be tested, completing the measurement of insulation resistance to ground and between conductors one by one. To ensure the completeness of the test, the operator must repeatedly switch instruments and perform each test item to avoid omissions.

[0004] It is evident that the above methods suffer from low efficiency and poor accuracy. Therefore, there is an urgent need for an efficient and accurate automated multiphase conductor testing solution. Summary of the Invention

[0005] This application provides multiphase conductor testing methods, systems, equipment, media, and products to improve the efficiency and accuracy of multiphase conductor testing.

[0006] Firstly, this application provides a method for testing multiphase conductors, including:

[0007] Perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core;

[0008] Determine whether there is a target voltage value that is less than or equal to a voltage threshold among multiple voltage values;

[0009] If it exists, the core corresponding to the target voltage value will be identified as the target core;

[0010] Insulation tests are performed on the target conductor to obtain its insulation resistance value.

[0011] Target cores with insulation resistance values ​​less than the resistance threshold are identified as qualified cores.

[0012] In one possible implementation, the loop parasitic test includes DC parasitic testing and AC parasitic testing, and the voltage value includes both DC and AC voltage values. The loop parasitic test is performed on each phase core of the multi-phase conductor connected to the conductor testing device to obtain the voltage value of the corresponding core, including:

[0013] The intelligent megohmmeter is used to perform DC parasitic tests on each phase core of a multi-phase conductor to obtain the DC voltage value of the corresponding core. The intelligent megohmmeter is used to perform DC parasitic tests on the connected cores.

[0014] After completing the DC parasitic test of the multiphase conductors, the intelligent megohmmeter is controlled to perform the AC parasitic test on each phase conductor in the multiphase conductors to obtain the AC voltage value of the corresponding conductor. The intelligent megohmmeter is also used to perform the AC parasitic test on the connected conductors.

[0015] In one possible implementation, the insulation test includes a ground insulation test and a phase-to-phase insulation test, and the insulation resistance value includes a ground insulation resistance value and a phase-to-phase insulation resistance value. The insulation test is performed on the target conductor to obtain the insulation resistance value of the target conductor, including:

[0016] The intelligent megohmmeter is controlled to perform a ground insulation test on the target wire core to obtain the ground insulation resistance value of the target wire core;

[0017] The intelligent megohmmeter is controlled to perform phase-to-phase insulation testing on the target conductor to obtain the phase-to-phase insulation resistance value of the target conductor.

[0018] In one possible implementation, DC parasitic testing, AC parasitic testing, insulation-to-ground testing, or phase-to-phase insulation testing all include the following operations:

[0019] The smart megohmmeter automatically switches to the corresponding test mode and performs the following operations by traversing the wire cores according to the preset test order:

[0020] Control the intelligent megohmmeter to close the target test channel corresponding to the current test core;

[0021] The intelligent megohmmeter is controlled to apply a preset test excitation signal to the current test core through the target test channel in order to obtain the test value of the current test core recorded by the intelligent megohmmeter. The test value includes DC voltage value, AC voltage value, insulation resistance to ground value and phase-to-phase insulation resistance value.

[0022] After obtaining the test value, control the smart megohmmeter to disconnect the target test channel.

[0023] In one possible implementation, if present, identifying the core corresponding to the target voltage value as the target core includes:

[0024] If, among multiple DC voltage values ​​and multiple AC voltage values, there exists a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the wire core corresponding to the target voltage value is identified as the target wire core.

[0025] In one possible implementation, at least one of the following is also included:

[0026] Output the voltage value of each phase core in the multi-phase conductor;

[0027] If a target conductor exists, output the insulation resistance value of the target conductor.

[0028] If a qualified conductor is found, output the voltage and insulation resistance values ​​of the qualified conductor.

[0029] Secondly, this application provides a multiphase conductor testing device, comprising:

[0030] The first acquisition module is used to perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core.

[0031] The first determining module is used to determine whether there is a target voltage value that is less than or equal to a voltage threshold among multiple voltage values;

[0032] The second determining module is used to determine the wire core corresponding to the target voltage value as the target wire core if it exists.

[0033] The second acquisition module is used to perform insulation testing on the target wire core and obtain the insulation resistance value of the target wire core;

[0034] The third determination module is used to determine the target wire cores whose insulation resistance is less than the resistance threshold as qualified wire cores.

[0035] In one possible implementation, the loop parasitic test includes DC parasitic testing and AC parasitic testing, and the voltage value includes both DC and AC voltage values. The first acquisition module is specifically used for:

[0036] The intelligent megohmmeter is used to perform DC parasitic tests on each phase core of a multi-phase conductor to obtain the DC voltage value of the corresponding core. The intelligent megohmmeter is used to perform DC parasitic tests on the connected cores.

[0037] After completing the DC parasitic test of the multiphase conductors, the intelligent megohmmeter is controlled to perform the AC parasitic test on each phase conductor in the multiphase conductors to obtain the AC voltage value of the corresponding conductor. The intelligent megohmmeter is also used to perform the AC parasitic test on the connected conductors.

[0038] In one possible implementation, the insulation test includes a ground insulation test and a phase-to-phase insulation test, and the insulation resistance value includes a ground insulation resistance value and a phase-to-phase insulation resistance value. The second acquisition module is specifically used for:

[0039] The intelligent megohmmeter is controlled to perform a ground insulation test on the target wire core to obtain the ground insulation resistance value of the target wire core;

[0040] The intelligent megohmmeter is controlled to perform phase-to-phase insulation testing on the target conductor to obtain the phase-to-phase insulation resistance value of the target conductor.

[0041] In one possible implementation, DC parasitic testing, AC parasitic testing, insulation-to-ground testing, or phase-to-phase insulation testing all include the following operations:

[0042] The smart megohmmeter automatically switches to the corresponding test mode and performs the following operations by traversing the wire cores according to the preset test order:

[0043] Control the intelligent megohmmeter to close the target test channel corresponding to the current test core;

[0044] The intelligent megohmmeter is controlled to apply a preset test excitation signal to the current test core through the target test channel in order to obtain the test value of the current test core recorded by the intelligent megohmmeter. The test value includes DC voltage value, AC voltage value, insulation resistance to ground value and phase-to-phase insulation resistance value.

[0045] After obtaining the test value, control the smart megohmmeter to disconnect the target test channel.

[0046] In one possible implementation, the second determining module is specifically used for:

[0047] If, among multiple DC voltage values ​​and multiple AC voltage values, there exists a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the wire core corresponding to the target voltage value is identified as the target wire core.

[0048] In one possible implementation, a processing module is also included, which is specifically used for:

[0049] Output the voltage value of each phase core in the multi-phase conductor;

[0050] If a target conductor exists, output the insulation resistance value of the target conductor.

[0051] If a qualified conductor is found, output the voltage and insulation resistance values ​​of the qualified conductor.

[0052] Thirdly, this application provides a multi-phase conductor testing system, which includes an intelligent megohmmeter and a host computer, wherein the intelligent megohmmeter is connected to the host computer;

[0053] The smart meter is equipped with a multi-phase interface for connecting multi-phase wire cores;

[0054] The host computer is used to execute the multiphase conductor test method as described in the first aspect and / or various possible implementations of the first aspect, so as to perform multiphase conductor test on the multiphase conductor connected to the smart megohmmeter.

[0055] The intelligent megohmmeter is used to perform circuit parasitic tests on the connected multi-phase conductors under the control of a host computer to obtain the voltage value of the conductors; and to perform insulation tests on the connected multi-phase conductors under the control of a host computer to obtain the insulation resistance value of the conductors.

[0056] Fourthly, this application provides an electronic device, including: a memory and a processor;

[0057] The memory stores the instructions that the computer executes;

[0058] The processor executes computer execution instructions stored in memory, causing the processor to perform the first aspect and / or various possible implementations of the first aspect as described above.

[0059] Fifthly, this application provides a computer-readable storage medium storing computer-executable instructions, which, when executed, are used to implement the first aspect and / or various possible embodiments of the first aspect.

[0060] In a sixth aspect, this application provides a computer program product, including a computer program that, when executed by a processor, implements the first aspect and / or various possible implementations of the first aspect.

[0061] This application provides a multiphase conductor testing method, system, equipment, medium, and product, relating to the field of power safety technology. The method includes: performing a circuit parasitic test on each phase conductor in a multiphase conductor connected to a conductor testing device to obtain the voltage value of the corresponding conductor; determining whether there exists a target voltage value less than or equal to a voltage threshold among multiple voltage values; if so, identifying the conductor corresponding to the target voltage value as the target conductor; performing an insulation test on the target conductor to obtain its insulation resistance value; and identifying target conductors with insulation resistance values ​​less than a resistance threshold as qualified conductors. This application, when performing circuit parasitic testing on each phase conductor to obtain the voltage value of the corresponding conductor, significantly shortens the testing time and improves testing efficiency compared to the traditional method of measuring one phase conductor at a time, which requires inserting the conductor to be tested into the conductor testing device. It automatically completes the circuit parasitic testing of multiple phase conductors to obtain the voltage value of the corresponding conductor. Furthermore, it identifies the conductor with a target voltage value less than or equal to a voltage threshold among multiple voltage values, eliminating the need for manual judgment and reducing the risk of human error, thus improving testing accuracy. Insulation testing is then performed on the target conductor to obtain its insulation resistance value. Target conductors with insulation resistance values ​​less than the resistance threshold are identified as qualified conductors, thereby improving the efficiency and accuracy of multi-phase conductor testing. Attached Figure Description

[0062] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0063] Figure 1 Flowchart of the multiphase conductor testing method provided in this application Figure 1 ;

[0064] Figure 2 A schematic diagram of the loop parasitic test provided in an embodiment of this application;

[0065] Figure 3 A schematic diagram of the insulation test process provided in an embodiment of this application;

[0066] Figure 4 This is a flowchart illustrating the host computer provided in an embodiment of this application;

[0067] Figure 5 A schematic diagram of the multiphase conductor testing device provided in this application;

[0068] Figure 6 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.

[0069] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0070] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0071] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the collection, use, processing, transmission, provision, disclosure, and application of the relevant data all comply with relevant laws, regulations, and standards, necessary confidentiality measures have been taken, they do not violate public order and good morals, and corresponding operation portals are provided for users to choose to authorize or refuse.

[0072] First, let me explain the terms used in this application:

[0073] The secondary circuit is a crucial component of the primary circuit (the main circuit used for monitoring, control, protection, and measurement) in a power system, typically operating under low voltage and low current conditions. It converts the high voltage and high current of the primary circuit into low-level signals suitable for measurement and control using current transformers and voltage transformers, and utilizes relays, protection devices, and measuring instruments to manage the operation of the power system. In multiphase conductors, the secondary circuit plays a particularly critical role. Due to the complex structure of multiphase conductors, their parasitic parameters and insulation performance can significantly impact system stability. Secondary circuit testing allows for efficient detection of parasitic parameters and insulation status of multiphase conductors, enabling timely identification of potential hazards and ensuring safe operation of equipment under complex conditions. Therefore, the secondary circuit is not only the "nerve center" of stable power system operation but also a vital means of ensuring the reliability and safety of multiphase conductors.

[0074] Circuit parasitic testing refers to the process of measuring and analyzing parasitic parameters in electrical circuits. These parasitic parameters are usually unintentionally introduced due to factors such as circuit design, wiring methods, component layout, or material properties, and are not ideal components in the circuit.

[0075] With the continuous expansion and increasing complexity of power systems, the operating environment of power equipment has become more stringent, placing higher demands on its safety and reliability. Against this backdrop, the secondary circuit testing requirements for multiphase conductors, as a crucial component of power systems, have become increasingly prominent. Secondary circuit testing can not only effectively detect the parasitic parameters of multiphase conductors but also comprehensively evaluate their insulation performance, thereby ensuring the stable operation of power equipment under complex conditions. Therefore, efficient and accurate parasitic detection and insulation testing of multiphase conductors has become a key link in ensuring the safety and operational reliability of power system equipment. Through scientific testing methods, potential hazards can be identified in a timely manner, preventing system paralysis caused by equipment failure and providing strong support for the long-term stable operation of the power system.

[0076] Currently, the method for testing the parasitic properties and insulation of multi-phase cores in AC / DC secondary circuits requires first using a multimeter to measure the parasitic properties of the cable cores by switching between ranges to ensure that the cable cores are de-energized. Then, an insulation tester is used for insulation testing. Typically, one test clamp of the insulation tester is used to clamp the grounding copper busbar or one core of the cable, while the other test clamp is used to clamp other cores that need to be measured. This process must ensure that each core of the cable is free of parasitic properties and that the insulation to ground and phase-to-phase insulation tests are completed without omission. However, this testing method has the following problems:

[0077] 1. The current method for parasitic acceptance testing of AC / DC circuits is too cumbersome. The existing method requires testing each cable sequentially with a multimeter, using both DC and AC voltage settings. This consumes a significant amount of manpower, resources, and time. Furthermore, during the measurement process, there is a risk of accidentally touching the cable cores and potentially getting an electric shock.

[0078] 2. During the parasitic acceptance process of AC / DC circuits, it is necessary to switch the range of the multimeter. In the parasitic acceptance process of some secondary circuits, the wrong range may be used, which may cause DC grounding or accidental tripping of the switch, resulting in unplanned power outages.

[0079] 3. The commonly used insulation testing method currently is to use an insulation megohmmeter. Most insulation megohmmeters on the market only have two outputs. In the process of phase-to-phase insulation testing of multiple cores or multiple circuits, the insulation of the cores needs to be tested sequentially, which requires a lot of manpower, resources and time. In this process, it is also easy to miss the insulation test of some cores.

[0080] To address the aforementioned issues, this application proposes a multiphase conductor testing method. This method simply requires inserting the conductor to be tested into the conductor testing device, automatically completing the circuit parasitic test of the multiphase conductor to obtain the voltage value of the corresponding conductor; identifying the conductor with a target voltage value less than or equal to a voltage threshold among multiple voltage values, without requiring manual judgment; performing an insulation test on the target conductor to obtain its insulation resistance value; and identifying the target conductor with an insulation resistance value less than the resistance threshold as a qualified conductor, thereby improving the efficiency and accuracy of multiphase conductor testing.

[0081] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0082] Figure 1 Flowchart of the multiphase conductor testing method provided in this application Figure 1 ,like Figure 1 As shown, the method includes:

[0083] S101. Perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core.

[0084] In this step, it can be understood that before performing circuit parasitic testing on the multi-phase conductors, the multi-phase conductors to be tested need to be inserted into the conductor testing device. The specific implementation method for performing circuit parasitic testing on each phase conductor inserted into the conductor testing device to obtain the voltage value of the corresponding conductor can be set according to actual needs.

[0085] In one implementation, after determining that the multi-phase conductor has been inserted into the conductor testing device and detecting the multi-phase conductor testing command, a loop parasitic test is performed on each phase conductor in the multi-phase conductor.

[0086] In another implementation, once it is determined that the multi-phase conductors have been inserted into the conductor testing device, a circuit parasitic test is directly performed on each phase conductor in the multi-phase conductors.

[0087] S102. Determine whether there is a target voltage value that is less than or equal to the voltage threshold among multiple voltage values.

[0088] Determine whether there is a target voltage value less than or equal to a voltage threshold among the multiple voltage values ​​obtained by S101. The voltage threshold can be selected according to actual needs, for example, the voltage threshold can be set to 5V.

[0089] For example, determine whether there is a target voltage value less than or equal to 5V among multiple voltage values.

[0090] Based on the judgment result, corresponding measures will be taken. If a target voltage value less than or equal to the voltage threshold exists among multiple voltage values, proceed to step S103; if no target voltage value less than or equal to the voltage threshold exists among multiple voltage values, the wire core can be confirmed as a non-conforming wire core, and the non-conforming wire core will be marked. Otherwise, wire cores marked as non-conforming will no longer undergo insulation testing.

[0091] S103. If it exists, the core corresponding to the target voltage value is determined as the target core.

[0092] S104. Perform an insulation test on the target conductor to obtain the insulation resistance value of the target conductor.

[0093] Insulation testing is performed on the core conductors identified as target conductors through S103 to obtain their insulation resistance value. The insulation resistance value reflects the electrical performance of the conductor's insulation layer and is a crucial indicator for assessing its insulation condition. Furthermore, insulation testing is a critical step in ensuring the safe operation of power systems, effectively preventing short circuits, leakage currents, or equipment damage caused by insulation failure.

[0094] S105. Target wire cores with insulation resistance values ​​less than the resistance threshold are identified as qualified wire cores.

[0095] In this step, it can be understood that target wire cores with insulation resistance less than the resistance threshold are identified as qualified wire cores; target wire cores with insulation resistance greater than or equal to the resistance threshold are identified as unqualified wire cores. The resistance threshold can be set according to actual conditions; for example, the insulation resistance can be set to 10MΩ.

[0096] For example, target wire cores with an insulation resistance of less than 10MΩ are identified as qualified wire cores; target wire cores with an insulation resistance of greater than or equal to 10MΩ are identified as unqualified wire cores.

[0097] In this embodiment, when performing circuit parasitic testing on each phase conductor to obtain the voltage value of the corresponding conductor, compared to the traditional method of measuring one phase conductor at a time and inserting the conductor to be tested into the conductor testing device, the circuit parasitic testing of multiple phase conductors is automatically completed to obtain the voltage value of the corresponding conductor, greatly shortening the testing time and thus improving testing efficiency. The conductor with a target voltage value less than or equal to a voltage threshold among the multiple voltage values ​​is identified as the target conductor. In identifying the target conductor, no manual judgment is required, thus reducing the risk of human error and improving testing accuracy. Insulation testing is performed on the target conductor to obtain its insulation resistance value; and the target conductor with an insulation resistance value less than the resistance threshold is identified as a qualified conductor, thereby improving the efficiency and accuracy of multi-phase conductor testing.

[0098] Based on the above embodiments, the loop parasitic test includes DC parasitic test and AC parasitic test. The voltage value includes AC voltage value and DC voltage value. The loop parasitic test is performed on each phase core of the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core. This includes: controlling a smart megohmmeter to perform a DC parasitic test on each phase core of the multi-phase core to obtain the DC voltage value of the corresponding core. The smart megohmmeter is used to perform DC parasitic test on the connected core. After completing the DC parasitic test of the multi-phase core, the smart megohmmeter is controlled to perform an AC parasitic test on each phase core of the multi-phase core to obtain the AC voltage value of the corresponding core. The smart megohmmeter is also used to perform AC parasitic test on the connected core.

[0099] In this embodiment, it can be understood that the circuit parasitic test described in step S101 includes DC parasitic testing and AC parasitic testing, and the voltage value obtained in S101 includes both DC and AC voltage values. Further, the voltage value obtained in S101 requires controlling the intelligent megohmmeter to perform a DC parasitic test on each phase core of the multi-phase conductor to obtain the corresponding DC voltage value. After completing the DC parasitic test of the multi-phase conductor, the intelligent megohmmeter needs to perform an AC parasitic test on each phase core of the multi-phase conductor to obtain the corresponding AC voltage value.

[0100] In this embodiment, it can be understood that a smart megohmmeter can perform both DC parasitic and AC parasitic tests on multi-phase conductors. Furthermore, after completing the DC parasitic test, the smart megohmmeter automatically switches between ranges without requiring manual intervention, thus enabling AC testing of each phase conductor in the multi-phase conductor system.

[0101] After completing the DC parasitic test of each phase core in the multi-phase conductor, this embodiment automatically switches the range of the smart megohmmeter to perform AC testing on each phase core in the multi-phase conductor. This reduces the probability of switching to the wrong range and avoids unplanned power outages caused by DC grounding or accidental switch tripping.

[0102] Furthermore, after performing a circuit parasitic test on each phase conductor in the multi-phase conductor, the obtained voltage values ​​need to be judged to determine whether there is a target voltage value less than or equal to a voltage threshold among the multiple voltage values. Based on the determination result, corresponding measures are implemented. If such a target voltage value exists, the conductor corresponding to the target voltage value is designated as the target conductor. Specifically, designating the conductor corresponding to the target voltage value as the target conductor includes: if, among multiple DC voltage values ​​and multiple AC voltage values, there is a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the conductor corresponding to the target voltage value is designated as the target conductor. It can be understood that the target conductor must meet the condition that the DC voltage value or AC voltage value is less than or equal to the voltage threshold. Furthermore, conductors corresponding to non-target voltage values ​​are designated as unqualified conductors.

[0103] The embodiments of this application can improve the testing efficiency of multiphase conductors by identifying the target conductor from the multiphase conductors and avoiding subsequent insulation testing of non-target conductors.

[0104] Insulation tests are performed on the identified target conductors to obtain their insulation resistance values. These tests include insulation-to-ground and phase-to-phase insulation tests, with the insulation resistance values ​​calculated for both phases. The process involves controlling a smart megohmmeter to perform both insulation-to-ground and phase-to-phase insulation tests on the target conductors. Essentially, a single smart megohmmeter can perform both insulation-to-ground and phase-to-phase insulation tests on multiple phase conductors. Furthermore, after completing the insulation-to-ground test, the smart megohmmeter automatically switches between ranges to perform phase-to-phase insulation tests on each phase conductor within the multi-phase conductor group, eliminating the need for manual adjustment.

[0105] This application's embodiments simplify the previously required multiple-time ground insulation tests and phase-to-phase insulation tests into a one-click operation through programmed operation, thereby reducing errors caused by manual intervention.

[0106] Based on the above embodiments, the DC parasitic test, AC parasitic test, ground insulation test, or phase-to-phase insulation test all include the following operations: the smart megohmmeter automatically switches to the corresponding test mode and performs the following operations on the conductor according to the preset test sequence: controls the smart megohmmeter to close the target test channel corresponding to the current test conductor; controls the smart megohmmeter to apply a preset test excitation signal to the current test conductor through the target test channel to obtain the test value of the current test conductor recorded by the smart megohmmeter, the test value including DC voltage value, AC voltage value, ground insulation resistance value, and phase-to-phase insulation resistance value; after obtaining the test value, controls the smart megohmmeter to disconnect the target test channel.

[0107] Specifically, the procedures for DC parasitic testing and AC parasitic testing can be found in [reference needed]. Figure 2 , Figure 2 This is a schematic diagram of the loop parasitic test process provided in an embodiment of this application. Figure 2 As shown, the circuit parasitic test procedure is as follows:

[0108] 1. Set the parasitic test mode in the smart megohmmeter, and the smart megohmmeter will automatically switch to the corresponding parasitic test mode; in this embodiment, first select the DC parasitic test mode, and the smart megohmmeter will automatically measure the DC voltage of the tested wire core in sequence at the DC voltage range and record the measurement results;

[0109] 2. After performing DC parasitic tests on all wire cores, the intelligent megohmmeter will automatically switch to the AC voltage range, measure the AC voltage of the wire cores under test in sequence, and record the measurement results.

[0110] 3. After completing the AC parasitic test for all conductors, compare the DC parasitic test results with the AC parasitic test results. Conduct conductors with AC or DC voltage values ​​less than or equal to the voltage threshold are identified as target conductors, while conductors with AC or DC voltage values ​​greater than the voltage threshold are identified as unqualified conductors. Mark the target conductors and unqualified conductors. Perform subsequent insulation tests on the target conductors.

[0111] Figure 3 This is a schematic diagram of the insulation test process provided in an embodiment of this application. Figure 3 As shown, the insulation test procedure is as follows:

[0112] 1. First, the multi-phase conductors are screened. Conductors that fail the circuit parasitic test will not be tested for insulation. Conductors that are marked as target conductors will be tested for insulation.

[0113] 2. The intelligent megohmmeter performs a ground insulation test on the target wire core, sequentially measuring the ground insulation resistance of the target wire core and recording the results;

[0114] 3. After completing the ground insulation test on the target conductor, perform the phase-to-phase insulation test on the target conductor, measure the phase-to-phase insulation resistance of any two phases of the target conductor in sequence, and record the results;

[0115] 4. For target wire cores whose phase-to-phase insulation resistance value obtained from the phase-to-phase insulation test or whose ground insulation resistance value obtained from the ground insulation test is less than 10MΩ, mark them as unqualified wire cores.

[0116] Furthermore, when performing phase-to-phase insulation testing on the target conductors, the smart megohmmeter needs to be switched from the ground insulation test mode to the phase-to-phase insulation test mode. Two target conductors are selected sequentially as test objects, and the following test operations are performed: close the channel of the test object and disconnect the channels of the other conductors under test; apply a preset phase-to-phase insulation excitation signal to the test object through the channel of the test object, and determine and record the phase-to-phase insulation resistance value of the current test object through the smart megohmmeter; disconnect the channel of the test object; repeat the test operation until all phase-to-phase target conductor combinations are traversed.

[0117] This application embodiment completes the circuit parasitic test, ground insulation test and phase-to-phase insulation test of each branch in sequence by selecting the conductor connection point. It can accurately and quickly complete the multi-phase conductor test while ensuring that the position of the conductor connection device is correct.

[0118] Based on the above embodiments, the multiphase conductor testing method further includes at least one of the following: outputting the voltage value of each phase conductor in the multiphase conductor; if a target conductor exists, outputting the insulation resistance value of the target conductor; if a qualified conductor exists, outputting the voltage value and insulation resistance value of the qualified conductor.

[0119] In this embodiment, it can be understood that after obtaining the voltage value of each phase core in the multi-phase conductor, it needs to be output; if there is a target core in the multi-phase conductor, the insulation resistance value of the target core also needs to be output; if there is a qualified core in the target core, the voltage value and insulation resistance value of the qualified core need to be output.

[0120] Furthermore, the specific implementation method for outputting the voltage value of each phase core in the multi-phase conductor can be set according to actual needs.

[0121] In one implementation, an audio execution module is used to broadcast the voltage values ​​of each phase core in the multi-phase conductor.

[0122] In another implementation, the LCD screen of the smart meter displays the voltage values ​​of each phase conductor in the multi-phase conductor.

[0123] It should be noted that the specific implementation methods of the insulation resistance value of the output target wire core, the voltage value of the output qualified wire core, and the insulation resistance value are similar to the specific implementation methods of the voltage values ​​of each phase wire core in the output multi-phase wire core. Therefore, the embodiments of this application will not be described again here.

[0124] This application embodiment outputs the voltage values ​​of each phase core in a multi-phase conductor, the insulation resistance value of the target core, and the voltage and insulation resistance values ​​of the qualified core. This allows users to clearly understand the specific situation of the multi-phase conductor, reduces the risk of human error, and improves the accuracy of testing and acceptance.

[0125] Based on the above embodiments, this application also provides a multiphase conductor testing system. The multiphase conductor testing system includes an intelligent megohmmeter and a host computer, wherein the intelligent megohmmeter is connected to the host computer; the intelligent megohmmeter is provided with a multiphase interface for connecting multiphase conductors; the host computer is used to execute the multiphase conductor testing method described in the previous embodiments to perform multiphase conductor testing on the multiphase conductors connected to the intelligent megohmmeter; the intelligent megohmmeter is used to perform circuit parasitic testing on the connected multiphase conductors under the control of the host computer to obtain the voltage value of the conductors; and, under the control of the host computer, to perform insulation testing on the connected multiphase conductors to obtain the insulation resistance value of the conductors.

[0126] Furthermore, the intelligent circuit breaker is equipped with a switch module, a function button module, a wire core interface module, a circuit parasitic test module, and an insulation test module. The switch module controls the power supply of the intelligent circuit breaker; the function button module selects the test mode, which includes: AC / DC parasitic detection, insulation-to-ground detection, and phase-to-phase insulation detection; the wire core interface module is used to connect the wire cores to be tested; the AC / DC parasitic detection module first performs DC-to-ground potential detection on all tested wire cores, then performs AC-to-ground detection, and sends the test data to the host computer for logical judgment, for example, sending the test data to the CPU for logical judgment.

[0127] Furthermore, the multi-phase conductor testing system also includes a host computer. Figure 4 This is a flowchart illustrating the host computer process provided in an embodiment of this application. Figure 4As shown, the host computer operates using a programmed system, setting voltage and insulation resistance thresholds. When the DC or AC voltage value meets the threshold, the value is recorded. For the target cores (those whose DC or AC voltage values ​​meet the threshold), a circuit-to-ground insulation test is performed. Once the insulation resistance value obtained from the ground insulation test for the target core meets the insulation resistance threshold, the insulation resistance value is recorded. Then, a circuit-to-phase insulation test is performed on the target cores. The phase-to-phase insulation test is programmed to ensure insulation detection for each target core. Simultaneously, the insulation resistance values ​​obtained from the ground insulation test or the phase-to-phase insulation test that meet the insulation resistance threshold are recorded, and the corresponding target cores are identified as qualified cores. The test ends when all target cores have completed phase-to-phase insulation, and the tested circuit is automatically discharged. This operation can also be performed manually. The voltage test results and insulation resistance results are saved in report form and can be copied via removable media.

[0128] This application embodiment, by adding an AC / DC voltage detection module to the smart megohmmeter, enables the use of the smart megohmmeter to complete the circuit parasitic detection and insulation detection of multi-phase conductors.

[0129] Next, an example will be given to illustrate how to use the multi-phase conductor testing method provided in the embodiments of this application. The method includes the following steps:

[0130] 1. Control the intelligent megohmmeter to perform DC parasitic tests on each phase core in the multi-phase conductor to obtain the DC voltage value of the corresponding core;

[0131] 2. After completing the DC parasitic test of the multiphase conductor, control the intelligent megohmmeter to perform the AC parasitic test on each phase conductor in the multiphase conductor to obtain the AC voltage value of the corresponding conductor.

[0132] 3. Determine whether there is a target voltage value among multiple voltage values ​​that is less than or equal to the voltage threshold;

[0133] 4. If, among multiple DC voltage values ​​and multiple AC voltage values, there exists a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the wire core corresponding to the target voltage value is determined as the target wire core.

[0134] 5. Control the intelligent megohmmeter to perform a ground insulation test on the target wire core to obtain the first insulation resistance value of the target wire core; control the intelligent megohmmeter to perform a phase-to-phase insulation test on the target wire core to obtain the second insulation resistance value of the target wire core;

[0135] 6. Among multiple first insulation resistance values ​​and second insulation resistance values, determine whether there exists a target resistance value that is greater than or equal to the insulation resistance value;

[0136] 7. If present, identify the core wire corresponding to the target resistance value as a qualified core wire.

[0137] Furthermore, the multiphase conductor testing method also includes: displaying the DC voltage value and AC voltage value of each phase conductor in the multiphase conductor on the LCD screen of the smart megohmmeter; if a target conductor exists, displaying the first insulation resistance value and the second insulation resistance value of the target conductor on the LCD screen of the smart megohmmeter; if a qualified conductor exists, displaying the voltage value, the first insulation resistance value and the second insulation resistance value of the qualified conductor on the LCD screen of the smart megohmmeter.

[0138] This application embodiment adds an AC / DC voltage detection module to the smart megohmmeter. Simply insert the wire core to be tested into the smart megohmmeter, and the AC / DC voltage of the wire core will be automatically detected according to the programmed operation. Compared with the traditional method of measuring each wire core one by one, the acceptance time is greatly reduced. Moreover, the results can be displayed on the LCD screen of the smart megohmmeter, which is clear and easy to understand, reducing the risk of human error and improving the accuracy of acceptance.

[0139] Furthermore, regarding insulation testing, this embodiment also utilizes a programmed operation, simplifying the previously required multiple-step operations for ground insulation and phase-to-phase insulation into a one-click operation. It only requires ensuring the correct placement of the conductor in the smart megohmmeter. Simultaneously, threshold values ​​are set, and all test results are programmatically evaluated by a host computer, reducing the possibility of human error. Furthermore, test results can be printed, facilitating the completion of acceptance guidelines and significantly shortening the insulation testing time.

[0140] In summary, the multiphase conductor testing method provided in this application simplifies the acceptance process and greatly shortens the time for AC / DC parasitic and insulation testing of secondary circuits. Whether for newly built substations / power plants or plants that require regular inspections, it reduces manpower and material consumption while also shortening the acceptance / testing time.

[0141] The following are embodiments of the apparatus described in this application, which can be used to execute the embodiments of the method described in this application. For details not disclosed in the apparatus embodiments of this application, please refer to the embodiments of the method described in this application.

[0142] Figure 5 This is a schematic diagram of the multiphase conductor testing device provided in this application, as shown below. Figure 5 As shown, the multiphase conductor testing device 500 provided in this embodiment includes:

[0143] The first acquisition module 501 is used to perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core.

[0144] The first determining module 502 is used to determine whether there is a target voltage value that is less than or equal to a voltage threshold among multiple voltage values;

[0145] The second determining module 503 is used to determine the wire core corresponding to the target voltage value as the target wire core if it exists.

[0146] The second acquisition module 504 is used to perform an insulation test on the target wire core and obtain the insulation resistance value of the target wire core;

[0147] The third determining module 505 is used to determine target wire cores with insulation resistance values ​​less than the resistance threshold as qualified wire cores.

[0148] In one possible implementation, the loop parasitic test includes a DC parasitic test and an AC parasitic test, and the voltage value includes a DC voltage value and an AC voltage value. The first acquisition module 501 is specifically used for:

[0149] The intelligent megohmmeter is used to perform DC parasitic tests on each phase core of a multi-phase conductor to obtain the DC voltage value of the corresponding core. The intelligent megohmmeter is used to perform DC parasitic tests on the connected cores.

[0150] After completing the DC parasitic test of the multiphase conductors, the intelligent megohmmeter is controlled to perform the AC parasitic test on each phase conductor in the multiphase conductors to obtain the AC voltage value of the corresponding conductor. The intelligent megohmmeter is also used to perform the AC parasitic test on the connected conductors.

[0151] In one possible implementation, the insulation test includes a ground insulation test and a phase-to-phase insulation test, and the second acquisition module 504 is specifically used for:

[0152] The intelligent megohmmeter is controlled to perform a ground insulation test on the target wire core to obtain the insulation resistance value of the target wire core;

[0153] The intelligent megohmmeter is controlled to perform phase-to-phase insulation testing on the target conductor to obtain the insulation resistance value of the target conductor.

[0154] In one possible implementation, DC parasitic testing, AC parasitic testing, insulation-to-ground testing, or phase-to-phase insulation testing all include the following operations:

[0155] The smart megohmmeter automatically switches to the corresponding test mode and performs the following operations by traversing the wire cores according to the preset test order:

[0156] Control the intelligent megohmmeter to close the target test channel corresponding to the current test core;

[0157] The intelligent megohmmeter is controlled to apply a preset test excitation signal to the current test core through the target test channel in order to obtain the test value of the current test core recorded by the intelligent megohmmeter. The test value includes DC voltage value, AC voltage value, insulation resistance value corresponding to the insulation test to ground and insulation resistance value corresponding to the insulation test between phases.

[0158] After obtaining the test value, control the smart megohmmeter to disconnect the target test channel.

[0159] In one possible implementation, the second determining module 503 is specifically used for:

[0160] If, among multiple DC voltage values ​​and multiple AC voltage values, there exists a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the wire core corresponding to the target voltage value is identified as the target wire core.

[0161] In one possible implementation, a processing module (not shown) is also included, which is specifically used for:

[0162] Output the voltage value of each phase core in the multi-phase conductor;

[0163] If a target conductor exists, output the insulation resistance value of the target conductor.

[0164] If a qualified conductor is found, output the voltage and insulation resistance values ​​of the qualified conductor.

[0165] The multiphase conductor testing device provided in this embodiment can execute the method provided in the above method embodiment. Its implementation principle and technical effect are similar, and will not be described in detail here.

[0166] It should be noted that the division of the various modules in the above device is merely a logical functional division. In actual implementation, they can be fully or partially integrated into a single physical entity, or they can be physically separated. Furthermore, these modules can be implemented entirely in software via processing element calls; they can be fully implemented in hardware; or some modules can be implemented by processing element calls to software, while others are implemented in hardware. For example, a processing module can be a separate processing element, or it can be integrated into a chip within the device. Alternatively, it can be stored as program code in the device's memory, and its functions can be called and executed by a processing element. The implementation of other modules is similar. Moreover, these modules can be fully or partially integrated together, or they can be implemented independently. The processing element here can be an integrated circuit with signal processing capabilities. During implementation, each step of the above method or each of the above modules can be completed through integrated logic circuits in the hardware of the processor element or through software instructions.

[0167] For example, these modules can be one or more integrated circuits configured to implement the above methods, such as one or more Application Specific Integrated Circuits (ASICs), one or more Digital Signal Processors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs). As another example, when a module is implemented using processing element scheduler code, the processing element can be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. Furthermore, these modules can be integrated together as a System-On-a-Chip (SOC).

[0168] Figure 6 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Figure 6 As shown, the electronic device 600 provided in this application embodiment may include: a processor 601, and a memory 602 communicatively connected to the processor, wherein:

[0169] The memory stores the instructions that the computer executes;

[0170] The processor executes computer execution instructions stored in memory to implement the method described in the foregoing method embodiments.

[0171] It should be understood that processor 601 can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. A general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in the application can be directly manifested as execution by a hardware processor, or execution by a combination of hardware and software modules within the processor. Memory 602 may include high-speed random access memory (RAM), and may also include non-volatile memory (NVM), such as at least one disk storage device, or a USB flash drive, external hard drive, read-only memory, disk, or optical disc, etc.

[0172] Optionally, the electronic device 600 may also include a communication interface 603. In specific implementations, if the communication interface 603, memory 602, and processor 601 are implemented independently, they can be interconnected via a bus to complete communication. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc., but this does not imply that there is only one bus or one type of bus.

[0173] Optionally, in a specific implementation, if the communication interface 603, memory 602, and processor 601 are integrated on a single chip, then the communication interface 603, memory 602, and processor 601 can communicate through an internal interface.

[0174] This application also provides a computer-readable storage medium storing computer-executable instructions, which, when executed, are used to implement the methods described in any of the foregoing embodiments.

[0175] It is understood that the computer-readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as Static Random Access Memory (SRAM), Electrically Erasable Programmable Read Only Memory (EEPROM), Erasable Programmable Read Only Memory (EPROM), Programmable Read Only Memory (PROM), Read Only Memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. The readable storage medium can be any available medium accessible to a general-purpose or special-purpose computer.

[0176] An exemplary computer-readable storage medium is coupled to a processor, enabling the processor to read information from and write information to the computer-readable storage medium. Of course, the computer-readable storage medium can also be a component of the processor. The processor and the computer-readable storage medium can reside in an ASIC. Alternatively, the processor and the computer-readable storage medium can exist as discrete components in an electronic device.

[0177] The integrated modules implemented as software functional modules described above can be stored in a computer-readable storage medium. These software functional modules, stored in a computer-readable storage medium, include several instructions to cause an electronic device (which may be a personal computer, server, or network device, etc.) or processor to execute some steps of the methods described in the various embodiments of this application.

[0178] This application also provides a computer program product, including a computer program that, when executed, implements the method described in any of the foregoing embodiments.

[0179] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0180] It should be further noted that although the steps in the flowchart are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0181] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this specification.

[0182] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the following claims.

[0183] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A method for testing multiphase conductors, characterized in that, include: Perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core; Determine whether there exists a target voltage value among the plurality of voltage values ​​that is less than or equal to a voltage threshold; If it exists, the core corresponding to the target voltage value will be identified as the target core; An insulation test is performed on the target wire core to obtain the insulation resistance value of the target wire core; Target wire cores with insulation resistance values ​​less than the resistance threshold are identified as qualified wire cores.

2. The method according to claim 1, characterized in that, The loop parasitic test includes DC parasitic testing and AC parasitic testing. The voltage value includes both DC and AC voltage values. The loop parasitic test is performed on each phase core of the multi-phase conductor connected to the conductor testing device to obtain the voltage value of the corresponding core, including: The intelligent megohmmeter is used to perform DC parasitic testing on each phase core of the multi-phase conductor to obtain the DC voltage value of the corresponding conductor. The intelligent megohmmeter is used to perform DC parasitic testing on the connected conductor. After completing the DC parasitic test of the multiphase core, the intelligent megohmmeter is controlled to perform an AC parasitic test on each phase core of the multiphase core to obtain the AC voltage value of the corresponding core. The intelligent megohmmeter is also used to perform an AC parasitic test on the connected core.

3. The method according to claim 2, characterized in that, The insulation test includes a ground insulation test and a phase-to-phase insulation test. The insulation resistance value includes a ground insulation resistance value and a phase-to-phase insulation resistance value. Performing an insulation test on the target conductor to obtain the insulation resistance value of the target conductor includes: The intelligent megohmmeter is controlled to perform a ground insulation test on the target wire core to obtain the ground insulation resistance value of the target wire core; The intelligent megohmmeter is controlled to perform phase-to-phase insulation testing on the target wire core to obtain the phase-to-phase insulation resistance value of the target wire core.

4. The method according to claim 3, characterized in that, The DC parasitic test, AC parasitic test, ground insulation test, or phase-to-phase insulation test all include the following operations: The intelligent speed tester automatically switches to the corresponding test mode and performs the following operations by traversing the wire cores according to the preset test order: The intelligent megohmmeter is controlled to close the target test channel corresponding to the current test core; The intelligent megohmmeter is controlled to apply a preset test excitation signal to the current test core through the target test channel to obtain the test value of the current test core recorded by the intelligent megohmmeter. The test value includes DC voltage value, AC voltage value, insulation resistance to ground value and phase-to-phase insulation resistance value. After obtaining the test value, the smart megohmmeter is controlled to disconnect the target test channel.

5. The method according to any one of claims 2 to 4, characterized in that, If such a core exists, the core corresponding to the target voltage value is identified as the target core, including: If, among multiple DC voltage values ​​and multiple AC voltage values, there exists a target voltage value where either the DC voltage value or the AC voltage value is less than or equal to the voltage threshold, then the wire core corresponding to the target voltage value is identified as the target wire core.

6. The method according to any one of claims 1 to 4, characterized in that, It also includes at least one of the following: Output the voltage value of each phase core in the multiphase conductor; If a target conductor exists, output the insulation resistance value of the target conductor. If a qualified conductor is found, output the voltage value and insulation resistance value of the qualified conductor.

7. A multi-phase conductor testing system, characterized in that, The multiphase conductor testing system includes an intelligent megohmmeter and a host computer, wherein the intelligent megohmmeter is connected to the host computer; The smart rocker is equipped with a multi-phase interface for connecting multi-phase wire cores; The host computer is used to execute the multiphase core testing method as described in any one of claims 1 to 6, so as to perform multiphase core testing on the multiphase cores connected to the smart megohmmeter; The intelligent megohmmeter is used to perform a circuit parasitic test on the connected multi-phase conductors under the control of the host computer to obtain the voltage value of the conductors; and to perform an insulation test on the connected multi-phase conductors under the control of the host computer to obtain the insulation resistance value of the conductors.

8. A multiphase conductor testing device, characterized in that, include: The first acquisition module is used to perform a circuit parasitic test on each phase core in the multi-phase core connected to the core testing device to obtain the voltage value of the corresponding core. The first determining module is used to determine whether there is a target voltage value that is less than or equal to a voltage threshold among the plurality of voltage values; The second determining module is used to determine the wire core corresponding to the target voltage value as the target wire core if it exists. The second acquisition module is used to perform an insulation test on the target wire core to obtain the insulation resistance value of the target wire core; The third determining module is used to determine the target wire core with an insulation resistance value less than the resistance threshold as a qualified wire core.

9. An electronic device, characterized in that, include: Memory, processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory, causing the processor to perform the method as described in any one of claims 1-6.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed, are used to implement the method as described in any one of claims 1-6.

11. A computer program product, characterized in that, Includes a computer program that, when executed, implements the method described in any one of claims 1-6.

Images