Error test system of micro-integrated metering switch

Abstract

The invention discloses an error test system of a micro-set metering switch, and relates to the field of error test systems of micro-set metering switches, the error test system of the micro-set metering switch comprises the micro-set metering switch, step S1, a main clock module and a synchronous pulse module are arranged on a test platform, instruction time base cooperative measurement and control subsystems are respectively distributed, a unified time base is obtained, and a test result is obtained; the unified time base means that three types of channels run on the same frequency reference and the same time starting point, the main clock module provides a clock source with the unified frequency reference and phase stability and is a time ruler of all the channels, the synchronous pulse module is synchronous mark pulses once per second, the main clock is homologous, and the synchronous pulse module is a synchronous pulse module. The test platform is an integral device for bearing a tested piece and a test link, a one-to-one correspondence relation of three channels of instructions / states / metering at the same absolute time is obtained through mapping of a unified time base and a unified time axis, and the effect of ensuring that events and data can be accurately aligned is achieved.

Description

Technical Field

[0001] This invention relates to the field of error testing systems for micro-integrated metering switches, and more particularly to an error testing system for micro-integrated metering switches. Background Technology

[0002] In scenarios such as distribution-side terminals, distributed grid-connected points, and intelligent distribution boxes on the consumer side, micro-integrated metering switches need to complete closing / opening within milliseconds while simultaneously undertaking metering tasks. The most critical issue is that the time of issuing the action command (t_cmd), the actual on / off time of the switch (t_sw), and the sampling / settlement time of the metering channel (t_meas) are not on the same time base. Because these three types of times come from different clocks or paths (communication / MCU command, drive / contact bounce, ADC / full cycle synchronization), there is a lack of a unified timestamp. Furthermore, the field conditions include power factor changes, harmonics, and sudden load changes, resulting in electrical disturbances at the moment of action and metering readings not being aligned one-to-one. Steady-state deviations and transient deviations from action are superimposed and difficult to separate, making it difficult to pinpoint whether the error is caused by the structure, drive, or metering link.

[0003] Current practices often employ a standard source to output a predetermined waveform, with a reference meter providing a comparison value. The device under test acquires and compares the results over a relatively long energy integration window. A key problem with this method is that long integration times "flatten" millisecond-level transient deviations into the average value. Over tens to hundreds of grid cycles, the short-term peak values ​​during the switching action phase are significantly diluted. Even if there is a significant deviation at the moment of action, the final result is only an approximate steady-state average error, making it difficult to quantify the "additional error at the moment of action." This fails to provide a valid basis for optimizing structural details (such as contact bounce and drive hysteresis) or control strategies (such as action phase and debouncing timing).

[0004] While improvements have been made through higher sampling rates, cross-channel triggering, or source-side phase locking to refine recording, the core shortcoming lies in the lack of a unified clock + unified timestamp synchronous acquisition framework. Triggering links can only mark relative events, making it difficult to guarantee that all channels share the same hardware clock; time drift and fixed delays still exist between different acquisition cards or instruments, preventing action events and measurement data from achieving "point-to-point" alignment on the same timeline. As a result, the sources of error remain unclear: it's difficult to establish a one-to-one correspondence between "action phase / jitter / hysteresis ↔ error response," and it's also difficult to reliably transfer conclusions to production line sampling and on-site verification. Therefore, the industry needs to record action events and measurement data in conjunction with each other under the same time reference to reliably distinguish and quantify transient and steady-state errors. Summary of the Invention

[0005] The purpose of this invention is to provide an error testing system for micro-collection metering switches to solve the above-mentioned technical problems.

[0006] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: an error testing system for a micro-collection metering switch, comprising a micro-collection metering switch, Step S1: By setting the master clock module and the synchronization pulse module on the test platform and assigning command time bases to the coordinated measurement and control subsystem respectively, a unified time base is obtained; Step S2: Set up a synchronous sampling card in the time-based coordinated measurement and control subsystem, and connect the sampling probe and sensor to the synchronous sampling card to obtain multi-channel raw data that is strictly aligned with the unified time base; Step S3: Output closing / opening command and arrival / feedback signal to the micro-collection metering switch and input the timestamp box to obtain the key event sequence of the command occurrence time and physical arrival time, calculate the original time difference and original action phase, and provide time stamp for subsequent fixed delay calibration and action evaluation. Step S4: Trigger the micro-collection metering switch to perform closing / opening command output under standard source no-load conditions, and compare the time difference with the time base coordinated measurement and control subsystem to obtain the fixed delay parameter.

[0007] As a preferred embodiment of the error testing system for a micro-integrated metering switch described in this invention, the time-based coordinated measurement and control subsystem includes three channels: a command issuance module, a switch status detection module, and a metering sampling module. Step S1 further includes the following steps: The internal components of the instruction issuing module, switch status detection module, and metering sampling module always follow the master clock module. Measure the phase difference between each channel and the master clock, and use this difference to align the channel times uniformly; The clock module, synchronization pulse module, command issuance module, switch status detection module, and metering sampling module are all connected by a unified counter, which distributes start timestamp numbers to obtain a time scale. The unified start point constraint is as follows: , In the formula For the first The channel at the starting time The counter reading, where c represents the counter and i is the channel index, specifically the instruction issuing module, the switch status detection module, and the metering sampling module. For the j-th channel at the same time The counter reading, where the subscript j is the channel index. To unify the starting point time.

[0008] As a preferred embodiment of the error testing system for the micro-collection metering switch described in this invention, step S2 further includes the following steps: The sampling probe samples the current / voltage under a uniform trigger and sets a sampling rate that meets the requirements of millisecond-level action capture to obtain electrical waveforms with strictly aligned event timestamps. To ensure the temporal resolution of millisecond-level motion capture, the sampling rate is determined and calculated as follows: , In the formula Where B is the sampling rate, and B is the effective bandwidth of the signal being measured. M represents the half-window width on both sides at the moment of action, and M is the minimum number of sampling points within the desired short window; The sensor is a temperature sensor that measures the environmental curve at the same time axis at key locations.

[0009] As a preferred embodiment of the error testing system for the micro-collection metering switch described in this invention, step S3 further includes the following steps: A millisecond-level symmetrical short window is established based on the arrival time, the energy added by the short window is calculated, and a quantitative index of the instantaneous additional deviation of the action is obtained. The additional energy of the short window is defined as: , In the formula Adds energy to the short window, measured in joules. , for the moment of arrival Centered on, half the window width is Integral over a symmetric time window, The instantaneous power of the channel under test. The instantaneous power of the reference channel is used as a benchmark. For the timestamp of the physical activation / deactivation of the switch, For a short window, half the width The weighted time constant; By statistically analyzing energy and error in the steady-state regions before and after switching action, two indicators—measurement body deviation and additional deviation—are obtained for clear analysis of error sources; the calculation formula is as follows: , , , In the formula, The energy of the channel being measured before the action. The energy of the measured channel after the action. The energy of the reference channel before the action. The energy of the reference channel after the action. Adding energy to the short window represents the power difference at the instant of the action. To measure the deviation of the body or the steady-state error, it represents the relative error of the energy ratio before and after the action. Additional bias or transient error refers to the relative error after normalizing the energy difference at the instant of action to the sum of the reference energies. The total error is the sum of the steady-state error and the transient error, and is used to evaluate the deviation of the entire measurement process.

[0010] As a preferred embodiment of the error testing system for a micro-collection metering switch according to the present invention, step S4 further includes: By calculating the difference between the actual observation and the calibration, and comparing it with a threshold, a decision is made on whether the test can proceed to the formal test. The formula for calculating the standard deviation is as follows: , In the formula, To align the standard deviation of the quality, Standard deviation, The raw time difference of the j-th event represents the difference between the physical arrival time and the command time. The system's fixed delay Alignment quality threshold, used to determine whether the alignment meets the requirements.

[0011] As a preferred embodiment of the error testing system for a micro-collection metering switch described in this invention, in step S1, to achieve unified time axis mapping, the local counts of each channel are converted into a unified absolute time to provide a common time scale for subsequent alignment. The specific formula for the unified absolute time is as follows: , In the formula, Channel number, For sample points, This is the local calculator reading for this channel. To ensure consistent initial synchronization counting; The master clock frequency, For channel phase compensation, For the first Channel 1 The absolute time of a point.

[0012] In a preferred embodiment of the error testing system for a micro-collection metering switch described in this invention, the sequence set of command occurrence times is as follows: , In the formula Let be the time of the j-th instruction, where the set of arrival time sequences is . In the formula Let j be the arrival time; The formula for calculating the original time difference is: , The formula for calculating the original motion phase is: , In the formula is the power grid frequency, mod is the modulo operation, and is the relative time within the power grid cycle.

[0013] In a preferred embodiment of the error testing system for a micro-collection metering switch described in this invention, the fixed delay parameter is calculated by statistically analyzing the median of the original time difference obtained in step S3, and the formula is as follows: , In the formula, To represent a fixed delay, it is calculated using the median. To calculate the median of the dataset, The raw time difference of the j-th measurement The j-th arrival time The time for the j-th instruction is given.

[0014] The beneficial effects of this invention are: By mapping a unified time base and a unified time axis, a one-to-one correspondence is obtained between the three channels of instruction, status, and measurement under the same absolute time, which ensures that events and data can be accurately aligned.

[0015] By using short-window additional energy and steady-state / transient decomposition, a separation index is obtained between the instantaneous additional deviation and the measurement body deviation, which helps to avoid long-term integration to amortize transients and the source of positioning error.

[0016] By using fixed-delay median calibration and standard deviation threshold determination, robust consistency alignment results are obtained, which can shorten calibration time and improve the consistency of retests. Detailed Implementation

[0017] To make the technical means, creative features, and achieved objectives and effects of this invention easier to understand, the invention is further described below with reference to specific embodiments. However, the following embodiments are merely preferred embodiments of this invention and not all of them. Other embodiments obtained by those skilled in the art based on the embodiments described herein without creative effort are all within the protection scope of this invention. Unless otherwise specified, the experimental methods in the following embodiments are conventional methods, and the materials and reagents used in the following embodiments are commercially available unless otherwise specified.

[0018] An error testing system for a micro-aggregate metering switch includes a micro-aggregate metering switch. In step S1, a master clock module and a synchronization pulse module are set on the test platform and assigned to a command time base coordinated measurement and control subsystem (the master clock + synchronization pulse module are assigned to the three channel nodes respectively, instead of just a part of them) to obtain a unified time base. The unified time base means that the three types of channels operate on the same frequency reference and the same time starting point. The master clock module provides a clock source with a unified frequency reference and phase stability, and is the time scale for all channels. The synchronization pulse module is a synchronization mark pulse once per second. The master clock is from the same source. The test platform is an overall device that carries the device under test and the test link, such as a box / rack + power supply + standard source + acquisition / time stamp / control module. Step S2: A synchronous sampling card is set up in the time-based coordinated measurement and control subsystem. The synchronous sampling card is a multi-channel A / D acquisition card with simultaneous sampling and holding capability. Each channel samples in the same phase under the same trigger, and the sampling probe and sensor are connected to the synchronous sampling card to obtain multi-channel raw data that is strictly aligned with a unified time base. The sampling probes are voltage probes and current probes, and the sensors are environmental quantity sensors such as temperature / humidity / wind speed, which are used for thermal drift / environmental correlation analysis and are sampled synchronously with electrical quantities onto the same time axis. Step S3: The closing / opening command output and the arrival / feedback signal of the micro-collection metering switch are connected to the timestamp box. The closing / opening command output is the control edge (rising / falling edge) generated by the command issuing module, which is used to drive the switch under test to perform closing or opening actions. The connection to the timestamp box is: the above two digital edge signals are sent in parallel to the event timestamp module to set a uniform absolute time for each edge, obtain the key event sequence of the time of command occurrence and the time of physical arrival, calculate the original time difference and the original action phase, and provide a time stamp for subsequent fixed delay calibration and action evaluation. Step S4: Trigger the micro-collection metering switch to perform closing / opening command output under standard source no-load conditions, and compare the time difference with the time base coordinated measurement and control subsystem to obtain the fixed delay parameter.

[0019] For example, this embodiment uses a laboratory bench configuration: by installing a 10MHz master clock and PPS synchronization pulse on the test platform and distributing them in a star configuration to the three channels of "command issuance, status detection, and metering sampling," a unified time base shared by the three channels is obtained, preventing each channel from operating independently; by connecting the voltage probe, current probe, and temperature sensor to a synchronous sampling card that supports simultaneous sampling and enabling unified triggering, and setting the sampling rate to 100kS / s (with anti-aliasing filtering at the front end matched to the sampling rate), multi-channel raw data collected at the same time is obtained, providing a consistent time axis for transient and steady-state comparison; by having the command issuance module output the closing / opening edge and connecting the arrival / release feedback to the timestamp box, the key event sequence of "command time - arrival time" is obtained, and the original time difference and original dynamic data are calculated. The phase (example: command 2.010s → arrival 2.015s = 5.000ms, another set 4.800ms, the phase falls approximately around 270° of the period) serves to provide a clear time scale and phase reference for subsequent calibration and action evaluation; by continuously triggering 30 times under no-load conditions of the standard source and comparing with the original time difference sequence, the representative value of the fixed delay parameter is obtained as 2.10ms (median), and the alignment quality is judged to be qualified with the alignment residual standard deviation of 0.6µs < 1µs, which serves to provide a "constant correction item" for formal testing; subsequently, in the formal evaluation, the observed time difference is uniformly subtracted by 2.10ms to form the net delay (example: 5.30ms → 3.20ms), and the action phase is analyzed in correspondence with transient deviation to obtain results that can reflect both the steady-state deviation of the metrology body and the quantifiable instantaneous additional deviation of the action.

[0020] The time-based coordinated measurement and control subsystem includes three channels: a command issuance module, a switch status detection module, and a metering and sampling module. Step S1 further includes the following steps: The internal components of the instruction issuing module, switch status detection module, and metering sampling module always follow the master clock module. Measure the phase difference between each channel and the master clock, and use this difference to align the channel times uniformly; The clock module, synchronization pulse module, command issuance module, switch status detection module, and metering sampling module are all connected by a unified counter, which distributes start timestamp numbers to obtain a time scale. The unified start point constraint is as follows: , In the formula For the first The channel at the starting time The counter reading, where c represents the counter and i is the channel index, specifically the instruction issuing module, the switch status detection module, and the metering sampling module. For the j-th channel at the same time The counter reading, where the subscript j is the channel index. To unify the starting point time.

[0021] Step S2 further includes the following steps: The sampling probe samples the current / voltage under a uniform trigger and sets a sampling rate that meets the requirements of millisecond-level action capture to obtain electrical waveforms with strictly aligned event timestamps. To ensure the temporal resolution of millisecond-level motion capture, the sampling rate is determined and calculated as follows: , In the formula Where B is the sampling rate, and B is the effective bandwidth of the signal being measured. M represents the half-window width on both sides at the moment of action, and M is the minimum number of sampling points within the desired short window; The sensor is a temperature sensor that measures the environmental curve at the same time axis at key locations.

[0022] Step S3 further includes the following steps: A millisecond-level symmetrical short window is established based on the arrival time, the energy added by the short window is calculated, and a quantitative index of the instantaneous additional deviation of the action is obtained. Example Description: Example Setup: A standard source outputs 230V, 50Hz sine wave; the tested circuit is equivalent to 10A with a power factor of approximately 0.95 and a reference power of approximately 2.2kW; the arrival time of a single closing action is 2.015s. By taking symmetrical short windows of 1.5ms on both sides of the arrival time, a time interval of 2.0135s to 2.0165s is obtained; the measured power and reference power are simultaneously acquired using a synchronous sampling card with the same trigger, resulting in two power curves at the same moment. Actual observations within the short window: By comparing the measured power and the reference power, a spike of approximately +1.0 kW appears from 0 to 0.5 ms after reaching the target, followed by a drop of approximately -0.8 kW from 0.5 to 0.9 ms, with the remaining time remaining relatively constant. The additional energy within the short window is obtained by summing the areas of the measured power and reference power within the short window. Simplifying to a rectangular approximation, it can be visually observed that: the spike phase is approximately 0.5 ms × 1.0 kW ≈ +0.50 J, the drop phase is approximately 0.4 ms × 0.8 kW ≈ -0.32 J, and the remaining minor ringing can be ignored, resulting in an additional energy of approximately +0.18 J. If a weighting method with higher weights near the center and lower weights at both ends is used, the resulting value is usually slightly smaller, such as approximately +0.16 J, but the amplitude and sign remain largely consistent. The additional energy of the short window is defined as: , In the formula Adds energy to the short window, measured in joules. , for the moment of arrival Centered on, half the window width is Integral over a symmetric time window, The instantaneous power of the channel under test. The instantaneous power of the reference channel is used as a benchmark. For the timestamp of the physical activation / deactivation of the switch, For a short window, half the width The weighted time constant; By statistically analyzing energy and error in the steady-state regions before and after switching action, two indicators—measurement body deviation and additional deviation—are obtained for clear analysis of error sources; the calculation formula is as follows: , , , In the formula, The energy of the channel being measured before the action. The energy of the measured channel after the action. The energy of the reference channel before the action. The energy of the reference channel after the action. Adding energy to the short window represents the power difference at the instant of the action. To measure the deviation of the body or the steady-state error, it represents the relative error of the energy ratio before and after the action. Additional bias or transient error refers to the relative error after normalizing the energy difference at the instant of action to the sum of the reference energies. The total error is the sum of the steady-state error and the transient error, and is used to evaluate the deviation of the entire measurement process.

[0023] Step S4 further includes: By calculating the difference between the actual observation and the calibration, and comparing it with a threshold, a decision is made on whether the test can proceed to the formal test. The formula for calculating the standard deviation is as follows: , In the formula, To align the standard deviation of the quality, Standard deviation, The raw time difference of the j-th event represents the difference between the physical arrival time and the command time. The system's fixed delay Alignment quality threshold, used to determine whether the alignment meets the requirements.

[0024] For example, during testing, a fixed delay parameter can be obtained by repeatedly triggering and timing the device. This parameter is the fixed response time of the system under specific conditions (such as device response, transmission delay, etc.) and does not change with the test device. Therefore, it is necessary to trigger the device multiple times and record the time difference through standard source no-load testing to obtain the fixed delay, and compare it with the actual observation results to ensure the consistency of the test results. First, the device is triggered multiple times under no-load conditions, and a set of time difference data is obtained by calculating the original time difference. Then, a robust statistical method (such as the median) is used to extract the fixed delay parameter from these data. This step obtains a stable delay parameter by statistically analyzing a series of observation results. Finally, the time difference observed each time is compared with the fixed delay parameter obtained by calibration to obtain the difference.

[0025] In step S1, to achieve a unified timeline mapping, the local counts of each channel are converted into a unified absolute time to provide a common time scale for subsequent alignment. The specific formula for the unified absolute time is as follows: , In the formula, Channel number, For sample points, This is the local calculator reading for this channel. To ensure consistent initial synchronization counting; The master clock frequency, For channel phase compensation, For the first Channel 1 The absolute time of a point.

[0026] The sequence of times when the instructions occurred is as follows: , In the formula Let be the time of the j-th instruction, where the set of arrival time sequences is . In the formula Let j be the arrival time; The formula for calculating the original time difference is: , The formula for calculating the original motion phase is: , In the formula is the power grid frequency, mod is the modulo operation, and is the relative time within the power grid cycle.

[0027] The fixed delay parameter is calculated by statistically analyzing the median of the original time difference obtained in step S3, and the formula is as follows: , In the formula, To represent a fixed delay, it is calculated using the median. To calculate the median of the dataset, The raw time difference of the j-th measurement The j-th arrival time The time for the j-th instruction is given.

[0028] The first step is to unify the time base: a star configuration of a 10 MHz master clock and a second synchronization pulse is established on the test platform and sent to the command issuance channel, switch status detection channel and metering sampling channel respectively, so that the three channels have a common frequency reference and a common start time. After equalizing the cable length, threshold shaping and one-time phase compensation, the local counts of the three channels are mapped to the same absolute time axis, thereby eliminating cross-channel time drift and zero-point inconsistency, and providing the same time scale for all subsequent timestamps and waveform alignment.

[0029] The second step is synchronous sampling: within the time-based coordinated measurement and control subsystem, a synchronous sampling card that supports simultaneous sampling and unified triggering is enabled. Voltage probes, current probes, and environmental sensors such as temperature are connected to independent channels. Under the dual constraints of bandwidth and transient resolution, the sampling rate is set, and a front-end anti-aliasing filter that matches the sampling rate is used to reduce spectral aliasing and group delay difference, ensuring that each channel samples at the same moment on the same trigger edge, obtaining strictly aligned multi-channel raw data, which not only preserves the instantaneous details of the action, but also facilitates steady-state comparison before and after.

[0030] The third step involves generating event timestamps and raw data: the control edge for closing or disconnecting is generated by the command issuance channel, and the feedback edge for arrival or release is output by the status detection channel. Both edges enter the timestamp box and are assigned a unified absolute time, forming a command time sequence and an arrival time sequence. Events are paired according to the rule of the nearest successor arrival of the same command, resulting in one-to-one corresponding sample pairs. The raw time difference is calculated based on this, i.e., arrival time minus command time. At the same time, the arrival time is converted to a single power frequency cycle to obtain the raw action phase. To avoid the influence of glitches and bounces, the edges undergo hysteresis shaping and debouncing. Abnormal samples with pairing timeouts or multiple arrivals are removed or resampled, thereby outputting clean timestamps and phase references for calibration and action evaluation.

[0031] Step 4: Fixed Delay Calibration and Alignment Quality Control: Under stable operating conditions with the reference standard source under no-load conditions, multiple triggers are performed to obtain a set of original time difference samples. Robust statistics are used to obtain the fixed delay parameter as a constant-level time correction term for the system link. At the same time, the standard deviation of the residual of the original time difference minus the fixed delay is calculated and compared with the threshold to determine whether the alignment quality meets the standard. If it meets the standard, the formal testing phase begins. Afterward, all observed time differences are first deducted from the fixed delay to obtain the net delay of the device body. The action phase is then calculated using a unified time axis to characterize the response speed and jitter. Error assessment based on a unified timescale employs a two-part synthesis approach: A millisecond-level symmetrical short window is set centered on the arrival time. The difference between the measured power and the reference power is weighted and integrated over time to obtain the short-window additional energy, which quantifies the additional impact of the action on measurement. The measured energy and reference energy are statistically analyzed in two steady-state windows before and after the action to obtain the steady-state error, representing the measurement's intrinsic deviation. The short-window additional energy is normalized to the reference steady-state energy to obtain the transient additional error. The steady-state error and transient additional error are added to obtain the total error. Simultaneously, the transient additional error can be statistically analyzed by action phase partition to identify phase-sensitive intervals, providing a basis for optimizing drive timing and contact structure. If the alignment quality exceeds a threshold, recalibration and connection verification are triggered to ensure that the conclusions are reproducible, traceable, and locatable.

[0032] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

[0033] This embodiment also provides a storage medium storing a computer program that, when executed by a processor, implements the error testing system for the micro-collection metering switch as described in the above embodiments. The storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as Static Random Access Memory (SRAM), Electrically Erasable Programmable Read-Only Memory (EEPROM), Erasable Programmable Read-Only Memory (EPROM), Programmable Red-Only Memory (PROM), Read-Only Memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk.

[0034] Furthermore, those skilled in the art will understand that although some embodiments herein include certain features included in other embodiments but not others, combinations of features from different embodiments are meant to be within the scope of this application and form different embodiments. For example, all the embodiments above can be used in any combination. The information disclosed in this background section is intended only to enhance the understanding of the general background of this application and should not be construed as an admission or in any way implying that such information constitutes prior art known to those skilled in the art. The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. An error testing system for a micro-collector metering switch, comprising a micro-collector metering switch, characterized in that: Step S1: By setting the master clock module and the synchronization pulse module on the test platform and assigning command time bases to the coordinated measurement and control subsystem respectively, a unified time base is obtained; Step S2: Set up a synchronous sampling card in the time-based coordinated measurement and control subsystem, and connect the sampling probe and sensor to the synchronous sampling card to obtain multi-channel raw data that is strictly aligned with the unified time base; Step S3: Output closing / opening command and arrival / feedback signal to the micro-collection metering switch and input the timestamp box to obtain the key event sequence of the command occurrence time and physical arrival time, calculate the original time difference and original action phase, and provide time stamp for subsequent fixed delay calibration and action evaluation. Step S4: Trigger the micro-collection metering switch to perform closing / opening command output under standard source no-load conditions, and compare the time difference with the time base coordinated measurement and control subsystem to obtain the fixed delay parameter.

2. The error testing system for a micro-collector metering switch according to claim 1, characterized in that: The time-based coordinated measurement and control subsystem includes three channels: a command issuance module, a switch status detection module, and a metering and sampling module. Step S1 further includes the following steps: The internal components of the instruction issuing module, switch status detection module, and metering sampling module always follow the master clock module. Measure the phase difference between each channel and the master clock, and use this difference to align the channel times uniformly; The clock module, synchronization pulse module, command issuance module, switch status detection module, and metering sampling module are all connected by a unified counter, which distributes start timestamp numbers to obtain a time scale. The unified start point constraint is as follows: ， In the formula For the first The channel at the starting time The counter reading, where c represents the counter and i is the channel index, specifically the instruction issuing module, the switch status detection module, and the metering sampling module. For the j-th channel at the same time The counter reading, where the subscript j is the channel index. To unify the starting point time.

3. The error testing system for a micro-collector metering switch according to claim 2, characterized in that: Step S2 further includes the following steps: The sampling probe samples the current / voltage under a uniform trigger and sets a sampling rate that meets the requirements of millisecond-level action capture to obtain electrical waveforms with strictly aligned event timestamps. To ensure the temporal resolution of millisecond-level motion capture, the sampling rate is determined and calculated as follows: ， In the formula Where B is the sampling rate, and B is the effective bandwidth of the signal being measured. M represents the half-window width on both sides at the moment of action, and M is the minimum number of sampling points within the desired short window; The sensor is a temperature sensor that measures the environmental curve at the same time axis at key locations.

4. The error testing system for a micro-collection metering switch according to claim 3, characterized in that: Step S3 further includes the following steps: A millisecond-level symmetrical short window is established based on the arrival time, the energy added by the short window is calculated, and a quantitative index of the instantaneous additional deviation of the action is obtained. The additional energy of the short window is defined as: ， In the formula Adds energy to the short window, measured in joules. , for the moment of arrival Centered on, half the window width is Integral over a symmetric time window, The instantaneous power of the channel under test. The instantaneous power of the reference channel is used as a benchmark. For the timestamp of the physical activation / deactivation of the switch, For a short window, half the width The weighted time constant; By statistically analyzing energy and error in the steady-state regions before and after switching action, two indicators—measurement body deviation and additional deviation—are obtained for clear analysis of error sources; the calculation formula is as follows: ， ， ， In the formula, The energy of the channel being measured before the action. The energy of the measured channel after the action. The energy of the reference channel before the action. The energy of the reference channel after the action. Adding energy to the short window represents the power difference at the instant of the action. To measure the deviation of the body or the steady-state error, it represents the relative error of the energy ratio before and after the action. Additional bias or transient error refers to the relative error after normalizing the energy difference at the instant of action to the sum of the reference energies. The total error is the sum of the steady-state error and the transient error, and is used to evaluate the deviation of the entire measurement process.

5. The error testing system for a micro-collection metering switch according to claim 4, characterized in that: Step S4 further includes: By calculating the difference between the actual observation and the calibration, and comparing it with a threshold, a decision is made on whether the test can proceed to the formal test. The formula for calculating the standard deviation is as follows: ， In the formula, To align the standard deviation of the quality, Standard deviation, The raw time difference of the j-th event represents the difference between the physical arrival time and the command time. The system's fixed delay Alignment quality threshold, used to determine whether the alignment meets the requirements.

6. The error testing system for a micro-collector metering switch according to claim 5, characterized in that: In step S1, to achieve a unified timeline mapping, the local counts of each channel are converted into a unified absolute time to provide a common time scale for subsequent alignment. The specific formula for the unified absolute time is as follows: ， In the formula, Channel number, For sample points, This is the local calculator reading for this channel. To ensure consistent initial synchronization counting; The master clock frequency, For channel phase compensation, For the first Channel 1 The absolute time of a point.

7. The error testing system for a micro-collection metering switch according to claim 6, characterized in that: The sequence of times when the instructions occurred is as follows: ， In the formula Let be the time of the j-th instruction, where the set of arrival time sequences is . In the formula Let j be the arrival time; The formula for calculating the original time difference is: ， The formula for calculating the original motion phase is: ， In the formula is the power grid frequency, mod is the modulo operation, and is the relative time within the power grid cycle.

8. The error testing system for a micro-collection metering switch according to claim 7, characterized in that: The fixed delay parameter is calculated by statistically analyzing the median of the original time difference obtained in step S3, and the formula is as follows: ， In the formula, To represent a fixed delay, it is calculated using the median. To calculate the median of the dataset, The raw time difference of the j-th measurement The j-th arrival time The time for the j-th instruction is given.

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