Calibration of light field displays with camera scans

Abstract

One aspect of the present invention relates to a method and an apparatus for performing calibration of a light field display using a camera scan, and more particularly, to a method for performing calibration of a light field display using a camera scan manner and an apparatus operated using the method in order to determine parameters originating from manufacturing errors of the light field display. According to one embodiment of the present invention, it is possible to provide a calibration method for determining an actual parameter of a 3D display system having a manufacturing error and a calibration device for implementing the method, and to provide a calibration method for determining an actual parameter of a 3D display system having a manufacturing error as a correct value of the actual parameter is determined. Therefore, the light field image accurately corresponding to the actual parameters of the 3D display system can be generated and the image is correctly separately irradiated to the two eyes, so that a clear glasses-free 3D display system can be provided.

Description

Technical Field

[0001] One aspect of the present invention relates to a method and apparatus for performing calibration of a light field display using camera scanning, and more specifically, to a method and apparatus for performing calibration of a light field display using camera scanning in order to determine parameters arising from manufacturing errors of the light field display. Background Technology

[0002] The contents described in this section are merely intended to provide background information for embodiments of the present invention and do not constitute prior art.

[0003] The principle behind 3D, which allows us to perceive objects as three-dimensional, stems from binocular parallax. Binocular parallax refers to the difference in how the left and right eyes see the same object. For humans, the distance between the eyes is approximately 6.5 cm. It is this difference that allows the two eyes to observe the same object from different angles. The brain combines this information to perceive the three-dimensionality of the object.

[0004] The same principle applies to 3D video. It creates an artificial parallax by displaying two videos taken from different angles on the same screen. For example, common devices like the Optimus 3D and Nintendo 3DS each have two cameras on their exteriors. These two cameras capture video from different viewpoints and display it on the same screen. When a "special device" separates the videos captured as described above and presents them to the viewer's eyes separately, the brain perceives depth and distance. This creates a three-dimensional image within the two-dimensional "screen."

[0005] The special devices are broadly divided into "glasses type" which uses special glasses and "glasses-free type" which attaches the device to the display screen.

[0006] Optical technologies used to realize glasses-free 3D display systems include lenticular lenses and parallax barriers. The basic principle of both methods is the same: the left and right images are separated in the picture and displayed in alternating rows or more, so that each eye sees a different row (the separated image). At this point, the devices that make each eye see the different rows are different. The lenticular lens method uses lenses, while the parallax barrier method uses barriers.

[0007] The cylindrical lens method transmits different images to the two eyes by attaching a sheet formed into a hemispherical lens to the display, while the parallax barrier method transmits different images to the two eyes by attaching a perforated shielding film to the display.

[0008] While glasses-free 3D display systems have the advantage of being usable without glasses, the manufacturing process, such as creating the light layer and accurately attaching it to the panel, is complex and difficult.

[0009] In glasses-free 3D display systems, it is particularly important to separate the image and illuminate it to each eye. In order to correctly separate the image and illuminate it to the two eyes, it is necessary to generate a light field image that matches the values ​​of the actual 3D display system.

[0010] However, in the actual manufacturing process of 3D display systems, various factors lead to discrepancies between the actual parameters of the panel, lenticular lenses (barriers), and other components and the design parameters. Therefore, in order to generate accurate light field images, the development of calibration methods and devices for determining the actual parameters of 3D display systems is urgently needed.

[0011] As prior art, there is Korean Patent Publication No. 10-1857466 (Head-mounted display and calibration method thereof, 2018.05.15).

[0012] The background technology described above is technical information that the inventors retained or learned during the process of deriving embodiments of the present invention, and is not necessarily publicly known technology disclosed before the application for embodiments of the present invention. Summary of the Invention

[0013] Technical issues Accordingly, in order to solve the above-mentioned technical problems, one aspect of the present invention is conceived and its object is to provide a calibration method for determining the actual parameters of a 3D display system with manufacturing errors in a new way, and a calibration apparatus for implementing the method.

[0014] The technical problems to be solved by the present invention are not limited to those mentioned above. Those skilled in the art to which the present invention pertains can clearly understand other technical problems not mentioned in the following description.

[0015] Technical solution To address the aforementioned technical problems, one aspect of the present invention provides a calibration method comprising: a pattern generation step for generating a test pattern; a pattern display step for displaying the generated test pattern via a light field display; an image generation step for capturing an image of the displayed test pattern; an image analysis step for analyzing the captured image; and a pattern updating step for updating the test pattern based on the analysis results of the captured image; and one or more of the following.

[0016] According to an embodiment, the test pattern may include an analyzable slope.

[0017] According to an embodiment, the test pattern may include a line-shaped pattern.

[0018] According to an embodiment, the test pattern may be generated based on multiple parameters.

[0019] According to an embodiment, the plurality of parameters may include one or more of a pitch parameter, a slantangle parameter, and an offset parameter.

[0020] According to an embodiment, the light field display may include a panel containing multiple pixels and an optical layer deposited on the panel to achieve 3D.

[0021] According to an embodiment, the optical layer may include a lenticular lens or a parallax barrier.

[0022] According to an embodiment, the light field display may include a 3D image device for generating 3D images.

[0023] According to an embodiment, the captured image may include a pattern image displaying the test pattern.

[0024] According to an embodiment, the feature is that the captured image has a larger area than the pattern image, and the entire pattern image is displayed inside the captured image.

[0025] According to an embodiment, the feature is that the pattern image is an image displayed by the light field display.

[0026] According to an embodiment, the feature may be that the pattern image includes a center view image generated from the assigned individual sub-pixels.

[0027] According to an embodiment, the feature is that a center line is displayed in the captured image.

[0028] According to an embodiment, the centerline is characterized in that it is a centerline horizontal to the vertical centerline.

[0029] According to an embodiment, the captured images may include still images and / or video images.

[0030] According to an embodiment, the feature may be that the captured image includes an image captured while sliding and moving a pattern image displaying the test pattern.

[0031] According to an embodiment, the sliding movement refers to the camera that captures the test pattern moving from the front towards the light field display while moving to the left or right.

[0032] According to an embodiment, the accuracy of the analysis of the captured image is improved as the sliding movement distance increases in the image analysis step.

[0033] According to an embodiment, the feature is that, in the image analysis step, the analysis of the captured image refers to reading the changing trend of the test pattern as the camera capturing the test pattern moves.

[0034] According to an embodiment, the feature may be that the reading of the change trend refers to reading whether the test pattern of the camera, when moving, does not lag behind or lead and follows the center of the camera well.

[0035] According to an embodiment, the feature is that, in the image analysis step, the analysis of the captured image refers to reading the slope of the test pattern.

[0036] According to an embodiment, the slope reading refers to comparing the slope of the test pattern with the parameter value provided for generating the test pattern.

[0037] According to an embodiment, the feature is that, in the image analysis step, the analysis of the captured image refers to reading the position of the test pattern on a pattern image displaying the test pattern.

[0038] According to an embodiment, the feature may be that the reading of the position refers to reading whether the test pattern is at the center of the pattern image.

[0039] According to an embodiment, the feature is that, in the pattern update step, the update of the test pattern refers to the update of the parameters that will become the basis for generating the test pattern.

[0040] According to an embodiment, the test pattern is continuously updated, and the initial test pattern in the updated test pattern is the design value of the light field display.

[0041] Furthermore, according to another aspect of the present invention, a calibration apparatus may be provided, comprising: a pattern generating apparatus for generating a test pattern; an image generating apparatus for capturing the pattern image to generate a captured image when a light field display receives the test pattern from the pattern generating apparatus and displays the pattern image; and an image analysis apparatus for analyzing the captured image in order to generate a new test pattern that updates the test pattern, one or more of the above.

[0042] According to an embodiment, the feature is that the pattern generating device receives multiple parameters and generates the test pattern based on the multiple parameters.

[0043] According to an embodiment, the plurality of parameters may be updated based on the analysis results of the captured image by the image analysis device.

[0044] According to an embodiment, the image generating device generates the captured image while sliding from the front of the light field display toward the left or right.

[0045] According to an embodiment, the image generating apparatus may include a camera for capturing the pattern image and a method for moving the camera.

[0046] According to an embodiment, the moving method may include a track structure for moving the camera.

[0047] According to an embodiment, the image analysis device updates the manufacturing parameters of the light field display in order to generate the new test pattern.

[0048] According to an embodiment, the manufacturing parameters may include one or more of the following: pitch parameter, slantangle parameter, and offset parameter.

[0049] Another aspect of the present invention can provide a light field display that performs calibration using the above-described calibration method.

[0050] Another aspect of the present invention can provide a computer program product, stored in a medium, for use in conjunction with hardware to execute the aforementioned method.

[0051] Invention Effects As described above, according to an embodiment of the present invention, a calibration method for determining the actual parameters of a 3D display system with manufacturing errors and a calibration apparatus for implementing the method can be provided.

[0052] By determining the correct values ​​of the actual parameters of a 3D display system with manufacturing errors, a light field image that accurately corresponds to the actual parameters of the 3D display system can be generated, and the image can be correctly separated and illuminated to both eyes, thus providing a clear, glasses-free 3D display system.

[0053] In addition, the present invention has various effects such as excellent versatility depending on the embodiments, and these effects will be clearly confirmed in the description of the embodiments described later. Attached Figure Description

[0054] The accompanying drawings are provided to illustrate one embodiment of the invention and, together with the detailed description of the invention described above, serve to further understand the technical concept of the invention. Therefore, the interpretation of the invention should not be limited to the contents of these drawings.

[0055] Figure 1 A calibration method according to an embodiment of the present invention is shown.

[0056] Figure 2 This illustrates a state in a light field display where a parallax barrier is attached to the front surface of a display panel with arranged subpixels.

[0057] Figure 3 Is to show execution Figure 1 An embodiment of a calibration apparatus for a calibration method.

[0058] Figure 4 This shows the state in which the subpixels assigned to the center view are lit in a panel with attached cylindrical lenses.

[0059] Figure 5 schematically shown Figure 3 The calibration device performs the required calibration sequence.

[0060] Figure 6 The image shown is taken when the pitch value p, which is used as a test parameter, is correct, that is, when it is the same as the actual value displayed by the light field display.

[0061] Figure 7 The image shown is taken when the pitch value p, which is used as a test parameter, is smaller than the actual value displayed on the light field display.

[0062] Figure 8 The image shown is taken when the pitch value p, which is used as a test parameter, is larger than the actual value displayed on the light field display.

[0063] Figure 9 The image shown is taken when the angle value θ, which is used as a test parameter, is correct, that is, when it is the same as the actual value displayed by the light field display.

[0064] Figure 10 The image shown is taken when the angle value θ, which is used as a test parameter, is smaller than the actual value displayed on the light field display.

[0065] Figure 11 The image shown is taken when the angle value θ, which is used as a test parameter, is larger than the actual value displayed on the light field display.

[0066] Figure 12The image shown is taken when the offset value o, which is used as a test parameter, is correct, that is, when it is the same as the actual value of the light field display.

[0067] Figure 13 The image shown is taken when the offset value o, which is used as a test parameter, is smaller than the actual value displayed on the light field display.

[0068] Figure 14 The image shown is captured when the offset value o, which is used as a test parameter, is larger than the actual value displayed on the light field display.

[0069] Explanation of reference numerals in the attached figures 10: Calibration device 100: Pattern generating device 200: Light Field Display 210: Subpixel 211: Subpixel assigned to the center view 220: Cylindrical lens 300: Image generating device 310: Camera 400: Image Analysis Device A: Taking images B: Pattern Image T: Test pattern C1: First Center Line C2: Second Centerline Detailed Implementation

[0070] References and Appendix Figure 1 The detailed embodiments described herein will clearly demonstrate the advantages and features of the present invention, as well as the methods for achieving these features. However, the present invention can be implemented in many different forms and is not limited to the embodiments presented below, and should be understood to include all modifications, equivalents, and substitutions within the scope of the present invention's ideas and techniques. The embodiments presented below are provided merely to make the disclosure of the present invention complete and to fully inform those skilled in the art of the invention of its scope. In describing the present invention, detailed descriptions of relevant prior art are omitted where it is determined that such descriptions may obscure the spirit of the invention.

[0071] The terminology used in this application is for illustrative purposes only and is not intended to limit the invention. Unless the context clearly distinguishes them, the singular form includes the plural form as well.

[0072] In this application, terms such as "comprising" or "having" are used to specify the presence of features, figures, steps, operations, constituent elements, components, or combinations thereof described in the specification, and should be understood as not precluding the possibility of the presence or addition of more than one other feature, figure, step, operation, constituent element, component, or combination thereof. Terms such as "first" and "second" may be used to describe multiple constituent elements, but the constituent elements should not be limited by the aforementioned terms. The aforementioned terms are only used to distinguish one constituent element from another.

[0073] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the process of description with reference to the accompanying drawings, the same or corresponding constituent elements are given the same reference numerals, and repeated descriptions of them are omitted.

[0074] Figure 1 A calibration method according to an embodiment of the present invention is shown.

[0075] A calibration method according to an embodiment of the present invention may be configured to include one or more of the following: a pattern generation step, generating a test pattern T; a pattern display step, displaying the generated test pattern T through a light field display 200; an image generation step, capturing an image A by photographing the displayed test pattern T; an image analysis step, analyzing the captured image A; and a pattern update step, updating the test pattern T based on the analysis results of the captured image A.

[0076] In this invention, one embodiment of the light field display 200 can be a glasses-free 3D display. The light field display 200 can be a structure in which a special layer (e.g., an optical layer) is attached to the upper or front surface of the display panel. The optical layer may include lenticular lenses 220, parallax barriers, etc.

[0077] Figure 2 This shows the state in which a parallax barrier is attached to the front surface of a display panel in a light field display where subpixels are arranged.

[0078] Light field displays can be used directly as 3D displays without any additional components, or they can be reflected onto mirrors, translucent glass, etc., to be used as head-up displays (HUDs). Light field display 200 can refer to 3D display products that are actually in mass production.

[0079] In this invention, for light field displays, any 3D display system can be adapted as long as a special layer is attached to the display panel.

[0080] For systems that attach special layers to display panels, manufacturing errors arise during the production process, specifically between the designed values ​​and the actual parameters. These errors can stem from inherent defects in the layer itself or from improper placement of the special layer on the display panel.

[0081] In this embodiment, manufacturing errors may include the actual pitch value p, the actual slanted angle value θ, and the actual offset value o. The process of determining the correct values ​​of these actual product parameters can be described using the calibration method according to the present invention. Since the actual parameters of the product must be known for its correct use in a 3D display product, the calibration method according to the present invention is essential.

[0082] Figure 3 Is to show execution Figure 1 An embodiment of a calibration apparatus for a calibration method.

[0083] One embodiment of the calibration apparatus 10 for performing the calibration method according to the present invention may be configured to include: a pattern generating apparatus 100 for generating a test pattern T; an image generating apparatus 300 for capturing a pattern image B to generate a captured image A when a light field display 200 receives the test pattern T from the pattern generating apparatus 100 and displays a pattern image B; and an image analysis apparatus 400 for analyzing the captured image A in order to generate a new test pattern T that updates the test pattern T; one or more of these components.

[0084] According to this embodiment, the image generating apparatus 300 can be located in front of the light field display 200. The image generating apparatus 300 can be an apparatus that generates images optically or electronically by means of photography, and can be an apparatus that performs the functions of the camera 310. According to this embodiment, the image generating apparatus 300 may include the camera 310. According to this embodiment, the camera 310 can move left and right. For example, the camera 310 can be mounted on a track in a manner that allows it to move left and right. Because the camera 310 has a structure that allows it to move left and right, the camera 310 can scan the light field display 20 while sliding left and right.

[0085] According to this embodiment, the pattern generating apparatus 100 can continuously generate a test pattern T and transmit it to the light field display 200, and the image generating apparatus 300 can capture the area displayed by the light field display 200.

[0086] That is, according to the embodiment, the pattern generating apparatus 100 can receive a pitch value p, a tilt angle value θ, and an offset value o to generate a test pattern T. When the test pattern T generated by the pattern generating apparatus 100 is transmitted to the light field display 200, the light field display 200 can display the test pattern T on the screen. When the light field display 200 displays the test pattern T on the screen, the camera 310 of the image generating apparatus 300 can capture the screen displayed by the light field display 200 to generate a captured image A.

[0087] According to an embodiment, the pattern generating apparatus 100 may be an apparatus that generates allocation value information for sub-pixels 210 of the display for generating a test pattern T. The pattern generating apparatus 100 does not necessarily refer to a separate device, but may also be in the form of a semiconductor chip mounted on a display product.

[0088] Figure 4 This shows the state in which the subpixels assigned to the center view are lit in a panel with attached cylindrical lenses.

[0089] In this embodiment, for example, displaying the test pattern T on the screen of the light field display 200 can refer to the following situation: in a structure where a lenticular lens 220 is attached to the panel, an assigned value is given to the sub-pixel 211 at the center of the lenticular lens so that the sub-pixel 211 is illuminated and the test pattern T is displayed. In this specification, the image on which such a test pattern T is formed is referred to as a center view image. Regarding the center view image, when the screen of the light field display 200 is viewed normally and perpendicularly, only that portion may appear white.

[0090] The sub-pixels 211 that are illuminated in the display can vary depending on how the designer assigns the pitch, angle, and offset values. According to the present invention, the calibration process can be as described above, whereby the designer arbitrarily changes the pitch, angle, and offset values ​​and observes them to determine how the cylindrical lens 220 is actually attached to the display panel.

[0091] In this embodiment, the display field of the light field display 200 is defined as pattern image B, and the image field captured by the camera 310 is defined as captured image A.

[0092] The image analysis device 400 can analyze the captured image A generated by the image generation device 300 to determine whether the actual parameter values ​​of the light field display 200 product are consistent with the test parameter values ​​input for calibration.

[0093] When the actual parameter value is inconsistent with the test parameter value, the image analysis device 400 can continuously update the test parameter value until the actual parameter value is the same as the test parameter value. The test parameter value can be continuously updated and input to the pattern generation device 100, and the pattern generation device 100 can receive the updated test parameter value to continuously generate new test patterns T.

[0094] That is, continuously modify the test parameters until the correct pattern is seen when the camera 310 of the image generation device 300 is used to take a picture. The following process can be repeated until the correct pattern is seen: regenerate the test pattern T generated based on the test parameters and display the pattern image B, and generate the captured image A by taking a picture of the displayed pattern image B, and analyze the captured image A to update the test parameter values.

[0095] According to this embodiment, since the parameter values ​​initially input to the pattern generation device 100 for displaying the test pattern T on the light field display 200 are unknown, the initial design values ​​can be input. That is, the process can be as follows: the pitch value, bevel angle value, and offset value are input as design values, and the test pattern T is continuously generated by changing only the pitch value. The pattern is then captured and read using the camera 310. Furthermore, if the pitch value is determined, the bevel angle value is changed again for reading; if the bevel angle value is determined, the offset value is changed again for reading. In this embodiment, the readings are performed in the order of pitch value, bevel angle value, and offset value, but changing the order is acceptable.

[0096] Figure 5 schematically shown Figure 3 The calibration device is used to perform the calibration sequence.

[0097] The calibration method of the calibration apparatus 10 according to an embodiment of the present invention will be described in detail. The calibration method according to this embodiment may first perform a display step (S200) in which test parameter values ​​are received, a center view image is generated, and the image is displayed; and a scanning step (S210) in which the displayed center view image is scanned using a camera 310. In the initial display step, the design values ​​of the actual product of the light field display 200 may be input as initial values. These initial values ​​may include pitch values, bevel angle values, and offset values.

[0098] In the display step, the designer can input the design values ​​for pitch, angle, and offset as initial test parameter inputs. If the test pitch value input as the initial value directly satisfies the first condition, then the test pitch value used as the initial value can be regarded as the actual pitch value.

[0099] Furthermore, if the test angle value input as the initial value directly satisfies the second condition, then the test angle value input as the initial value can be regarded as the actual angle value. If the test offset value input as the initial value directly satisfies the third condition, then the test offset value input as the initial value can be regarded as the actual offset value.

[0100] After the scanning step (S210), the first condition reading step (S220) can be performed. In the first condition reading step (S220), it is possible to read whether the linear pattern of the test pattern T satisfies the first condition from the result of scanning the center view image using the camera 310. The first condition will be described below. In the first condition reading step, if the scanned result does not satisfy the first condition, the pitch value can be repeatedly adjusted to regenerate and display the center view image until the first condition is satisfied. For the result of scanning the center view image generated by the camera 310 with the new pitch value, if the first condition is satisfied, the new pitch value is regarded as the actual pitch value, the adjustment of the pitch value is terminated, and the first image capture step, which is the next step after this step, is performed.

[0101] The center view image, used as the object image for reading the first condition in order to determine the actual pitch value, may include an image with a linear pattern that is continuously generated by repeatedly adjusting the test pitch value while maintaining a fixed oblique angle value and offset value.

[0102] In the first image capture step, the process of capturing the first image can be performed at the center position. Here, the center position can refer to the center position of the light field display 200. That is, the camera 310 can be positioned in front of the center of the light field display 200, and the image can be captured by photographing the screen area (field) of the light field display 200. Furthermore, capturing the first image can refer to acquiring an image using the camera 310. The first image, as an object image used to read the second condition in order to determine the actual oblique angle value, can include an image with a linear pattern continuously generated by repeatedly adjusting the test oblique angle value while maintaining a fixed pitch value and offset value.

[0103] After the first image capture step, a second condition reading step can be performed. In the second condition reading step, it can be determined whether the line pattern of the image captured in the first image capture step satisfies a second condition. This second condition will be explained below. If the line pattern of the captured image does not satisfy the second condition, the first image can be regenerated by repeatedly adjusting the bevel angle value, and the captured and read images can be repeated until the second condition is satisfied.

[0104] In the second condition reading step, if the line pattern of the first image generated by the new bevel value satisfies the second condition, the new bevel value can be regarded as the actual bevel value and the adjustment of the bevel value can be terminated.

[0105] After terminating the adjustment of the tilt angle value, the second image capture step, which is the next step after this step, can be performed.

[0106] In the second image capture step, the process of capturing the second image can be performed at the center position. Similar to the first image capture step, the center position can refer to the center position of the light field display 200. That is, the camera 310 can be placed in front of the center of the light field display 200, and the image field of the light field display 200 can be captured to obtain the second image. The second image, as the object image used to read the third condition in order to determine the actual offset value, can include an image with a linear pattern continuously generated by repeatedly adjusting the test offset value while maintaining a fixed pitch value and angle value.

[0107] After the second image capture step, a third condition reading step can be performed. In the third condition reading step, it can be checked whether the line pattern of the image captured in the second image capture step satisfies a third condition. This third condition will be explained below. If the line pattern of the captured image does not satisfy the third condition, the offset value can be repeatedly adjusted to regenerate and capture the second image, and the captured second image can be read until the third condition is satisfied.

[0108] In the third condition reading step, if the linear pattern of the second image generated by the new offset value satisfies the third condition, the new offset value can be regarded as the actual offset value, and the adjustment of the offset value is terminated. Since the actual pitch value, actual angle value, and actual offset value of the light field display 200 are all determined, the calibration process is terminated.

[0109] The first condition mentioned above will now be explained.

[0110] Figure 6 Image A is shown when the pitch value p, which is used as a test parameter, is correct, that is, when it is the same as the actual value of the light field display 200. Figure 6 (a) shows an image A captured from the left side of the light field display 200, with the camera 310 moving to the left relative to the center line of the light field display 200. Figure 6 (b) shows an image A captured from the central position of the light field display 200, with the camera 310 positioned centered relative to the center line of the light field display 200. Figure 6 (c) shows an image A captured from the right side of the light field display 200 when the camera 310 moves to the right with reference to the center line of the light field display 200.

[0111] Figure 7Image A is shown when the pitch value p, which is used as a test parameter, is smaller than the actual value of the light field display 200. Figure 7 (a) shows an image A captured from the left side of the light field display 200, with the camera 310 moving to the left relative to the center line of the light field display 200. Figure 7 (b) shows an image A captured from the central position of the light field display 200, with the camera 310 positioned centered relative to the center line of the light field display 200. Figure 7 (c) shows an image A captured from the right side of the light field display 200 when the camera 310 moves to the right with reference to the center line of the light field display 200.

[0112] Figure 8 Image A is shown when the pitch value p, which is used as a test parameter, is larger than the actual value of the light field display 200. Figure 8 (a) shows an image A captured from the left side of the light field display 200, with the camera 310 moving to the left relative to the center line of the light field display 200. Figure 8 (b) shows an image A captured from the central position of the light field display 200, with the camera 310 positioned centered relative to the center line of the light field display 200. Figure 8 (c) shows an image A captured from the right side of the light field display 200 when the camera 310 moves to the right with reference to the center line of the light field display 200.

[0113] Figure 6 This refers to the case where the input test pitch value meets the first condition. (Refer to...) Figure 6 The condition that satisfies the first condition is when the test pattern T is captured by the camera 310 from the left side of the light field display 200 (refer to...). Figure 6 Under (a) or when camera 310 is shooting light field display 200 from the right (see reference) Figure 6 Under (c) or when the camera 310 is shooting the light field display 200 from the center (see reference). Figure 6 (b) shows the case where the center of the camera 310 accurately passes through the intersection of the first center line C1 and the second center line C2. That is, this is the case where the center of the camera 310 is always consistent with the center of the detected linear pattern.

[0114] Figure 7 and Figure 8 This refers to the case where the input test pitch value does not meet the first condition. Figure 7 This is for cases where the designer inputs a test pitch value that is less than the actual pitch value.

[0115] Reference Figure 7 (a) shows that when the camera 310 moves to the left, the linear pattern fails to keep up with the center of the camera 310 and lags behind the center of the camera 310 to the right, as shown in reference. Figure 7 (c) shows that when the camera 310 moves to the right, the linear pattern fails to keep up with the center of the camera 310 and lags behind the state when the center of the camera 310 is facing to the left.

[0116] When the designer inputs a test pitch value that is smaller than the actual pitch value, the detected linear pattern moves more slowly than the center of camera 310. In this case, when camera 310 is centered, the center of the linear pattern is accurately located at the center of camera 310, but if camera 310 moves to the right or left, the linear pattern fails to keep up with the speed of camera 310 and lags behind. In this situation, the designer determines that the input test pitch value is smaller than the actual pitch value by reading the result of the captured image A, and then increases the pitch value to regenerate the test pattern T. Furthermore, when a linear pattern is detected, the adjustment operation of increasing the test pitch value can be repeated until it completely follows the center of camera 310 as described above.

[0117] Figure 8 This is for cases where the designer inputs a test pitch value that is greater than the actual pitch value.

[0118] Reference Figure 8 (a) shows that when camera 310 moves to the left, the linear pattern moves further than the center of camera 310 and is ahead of the center of camera 310 when it is facing to the left, as shown in reference. Figure 8 (c) shows that when the camera 310 moves to the right, the linear pattern moves more than the center of the camera 310 and is further ahead to the right than the center of the camera 310.

[0119] When the designer inputs a test pitch value greater than the actual pitch value, the detected linear pattern moves faster than the center of camera 310. In this case, when camera 310 is centered, the center of the linear pattern is accurately located at the center of camera 310; however, if camera 310 moves to the right or left, the linear pattern moves faster than camera 310 and outpaces it. In this situation, the designer determines that the input test pitch value is greater than the actual pitch value by reading the result of the captured image A, and then lowers the pitch value to regenerate the test pattern T. Furthermore, when a linear pattern is detected, the operation of lowering the test pitch value can be repeated until it completely follows the center of camera 310 as described above.

[0120] That is, when the input test pitch value is less than the actual pitch value, the linear pattern moves slower than the center of camera 310; when it is greater than the actual pitch value, it moves faster. Therefore, we need to confirm these three cases (test pitch value less than, greater than the actual pitch value, and the same as the actual pitch value) and repeatedly determine the actual pitch value.

[0121] Scanning with camera 310 refers to observing the changing trend of the linear pattern by sliding and moving camera 310. The changing trend is observed as camera 310 moves to the left or right to see whether the linear pattern it detects follows the center of camera 310 well or falls behind.

[0122] In this case, the farther the camera 310 moves, the longer the distance between the detected linear pattern and the center of the camera 310. Therefore, the longer the distance the camera (310) moves, the more precise the measurement can be.

[0123] Explain the second condition mentioned above.

[0124] Figure 9 Image A is shown when the oblique angle value θ, which is used as a test parameter, is correct, that is, when it is the same as the actual value of the light field display 200.

[0125] Figure 10 Image A is shown when the angle value θ, which is used as a test parameter, is smaller than the actual value of the light field display 200.

[0126] Figure 11 Image A is shown when the angle value θ, which is used as a test parameter, is larger than the actual value of the light field display 200.

[0127] Figure 9 This refers to the case where the input test angle value satisfies the second condition. (Refer to...) Figure 9 The second condition is met when the test pattern T detected by the camera 310 when it takes a picture from the center position in front of the light field display 200 passes through the intersection point of the first center line C1 and the second center line C2 (the center of the camera 310). That is, the center of the camera 310 is consistent with the center of the detected linear pattern, and the detected angle value is consistent with the input angle value.

[0128] Figure 10 and Figure 11 This is the case where the input test angle value does not meet the second condition. Figure 10 This is for cases where the designer inputs a test bevel angle value that is smaller than the actual bevel angle value.

[0129] Reference Figure 10When observing the captured image A taken by camera 310, the center of camera 310 coincides with the center of the detected linear pattern, and the detected angle value is smaller than the input angle value.

[0130] When the designer inputs a test bevel angle value that is less than the actual bevel angle value, the detected bevel angle value will be less than the input bevel angle value. In this case, the designer determines that their input test bevel angle value is less than the actual bevel angle value by reading the captured image A, and then increases the test bevel angle value to regenerate the test pattern T. Furthermore, when a linear pattern is detected, the operation of increasing the test bevel angle value can be repeated until the detected bevel angle value matches the bevel angle value input as its corresponding input value.

[0131] Figure 11 This is for cases where the designer inputs a test angle value that is greater than the actual pitch value.

[0132] Reference Figure 11 When observing the captured image A taken by camera 310, the center of camera 310 coincides with the center of the detected linear pattern, and the detected oblique angle value is greater than the input oblique angle value.

[0133] When the designer inputs a test bevel angle value greater than the actual bevel angle value, and the detected bevel angle value is also greater than the input value, the designer determines, by reading the captured image A, that their input test bevel angle value is indeed greater than the actual bevel angle value. They then lower the test bevel angle value and regenerate the test pattern T. Furthermore, when a linear pattern is detected, this process of lowering the test bevel angle value can be repeated until the detected bevel angle value matches the bevel angle value input as its corresponding value.

[0134] That is, confirm the following three situations and repeatedly determine the actual bevel angle value: when the input test bevel angle value is less than the actual bevel angle value, the detected bevel angle value is less than the input bevel angle value; when the input test bevel angle value is greater than the actual bevel angle value, the detected bevel angle value is greater than the input bevel angle value; when the input test bevel angle value is the same as the actual bevel angle value, the detected bevel angle value is the same as the input bevel angle value.

[0135] Reference Figures 9 to 11 Regarding the second condition mentioned above, when reflected in a mirror, the direction of the oblique angle value is exactly opposite (in this case, unlike...). Figures 9 to 11The linear pattern displayed shows a situation where the detected angle value is the same as the input angle value but has the opposite sign. Specifically, the input test angle value satisfies the second condition when the test pattern T detected by the camera 310 when it is positioned in front of the center of the light field display 200 passes through the intersection of the first center line C1 and the second center line C2 (the center of the camera 310). That is, the center of the camera 310 coincides with the center of the detected linear pattern, and the detected angle value is the same as the input angle value but has the opposite sign (not shown).

[0136] In this case, if the second condition is satisfied, including the case of reflection to a mirror, it can be represented as the case where the test pattern T detected by the camera 310 when it takes a picture from the central position in front of the light field display 200 passes through the intersection point (center of the camera 310) of the first center line C1 and the second center line C2, that is, the center of the camera 310 coincides with the center of the detected linear pattern, and the detected angle value is the same as the input angle value in absolute value.

[0137] Furthermore, although not illustrated, in the case of reflection into a mirror, when the designer inputs a test angle value that is less than the actual angle value, the detected angle value is greater than the input angle value. In this situation, the designer determines that their input test angle value is less than the actual angle value by reading the captured image A, and thus lowers the test angle value and regenerates the test pattern T. Moreover, when a linear pattern is detected, the operation of lowering the test angle value can be repeated until the detected angle value matches the angle value input as its corresponding input value. Regarding the case of reflection into a mirror, when the designer inputs a test angle value that is greater than the actual angle value, since the corresponding part has already been explained, its detailed explanation is omitted.

[0138] Explain the third condition mentioned above.

[0139] Figure 12 Image A shows the captured image where the offset value o, which is the test parameter, is correct, that is, the same as the actual value of the light field display 200.

[0140] Figure 13 Image A is shown when the offset value o, which is used as a test parameter, is smaller than the actual value of the light field display 200.

[0141] Figure 14 Image A is shown when the offset value o, which is used as a test parameter, is larger than the actual value of the light field display 200.

[0142] Figure 12This refers to the case where the input test offset value satisfies the third condition. (Refer to...) Figure 12 The third condition is met when the test pattern T detected by the camera 310 when it takes a picture from the center position in front of the light field display 200 passes through the intersection point of the first center line C1 and the second center line C2 (the center of the camera 310), that is, the center of the camera 310 is consistent with the center of the detected linear pattern.

[0143] Figure 13 and Figure 14 This is the case where the input test offset value does not meet the third condition. Figure 13 This is for cases where the designer inputs a test offset value that is less than the actual offset value.

[0144] Reference Figure 13 When observing the captured image A by camera 310, the center of the detected linear pattern is tilted to the left compared to the center of camera 310. That is, the center of camera 310 is not the same as the center of the linear pattern.

[0145] When the designer inputs a test offset value that is less than the actual offset value, the center of the detected linear pattern is located to the left of the center of the camera 310. In this case, the designer determines the value by which the input test offset value is less than the actual offset value by reading the captured image A, and then increases the test offset value to regenerate the test pattern T. Furthermore, when a linear pattern is detected, the operation of increasing the test offset value can be repeated until the center of the detected linear pattern is aligned with the center of the camera 310.

[0146] Figure 14 This is for cases where the designer inputs a test offset value that is greater than the actual pitch value.

[0147] Reference Figure 14 When observing the captured image A by camera 310, the center of the detected linear pattern is tilted to the right compared to the center of camera 310. That is, the center of camera 310 is not the same as the center of the linear pattern.

[0148] When the designer inputs a test offset value greater than the actual offset value, the center of the detected linear pattern is located to the right of the center of the camera 310. In this case, the designer determines the value by which the input test offset value is greater than the actual offset value by reading the captured image A, and then lowers the test offset value to regenerate the test pattern T. Furthermore, when a linear pattern is detected, the operation of lowering the test offset value can be repeated until the center of the detected linear pattern coincides with the center of the camera 310.

[0149] That is, confirm the following three situations and repeatedly verify the actual offset value: when the designer inputs a test offset value that is less than the actual offset value, the center of the detected linear pattern is located to the left of the center of the camera 310; when the designer inputs a test offset value that is greater than the actual offset value, the center of the detected linear pattern is located to the right of the center of the camera 310; when the input test offset value is the same as the actual offset value, the center of the detected linear pattern is the same as the center of the camera 310.

[0150] According to the embodiment, when the three steps of determining the pitch value p, slanted angle value θ, and offset value o terminate, it may be necessary to return to the beginning to repeat the process of the three steps to see if all of them pass.

[0151] The embodiments of the present invention described above can be implemented as a computer program executable on a computer through various constituent elements, and the computer program can be recorded in a computer-readable medium. In this case, the medium may include magnetic media such as hard disks, floppy disks, and magnetic tapes; optical recording media such as compact disc read-only memory (CD-ROM) and DVDs; magneto-optical media such as floppy discs; and hardware devices specifically configured to store and execute program commands, such as read-only memory (ROM) and random access memory (RAM).

[0152] Furthermore, the computer program may be a computer program specifically designed and configured for this invention, or it may be a computer program known and available to those skilled in the art of computer software. Examples of computer programs may include not only machine language code generated by a compiler, but also high-level language code executable by a computer, such as using an interpreter.

[0153] In the description of this invention (especially in the claims), the term "described" and similar descriptive terms may correspond to both the singular and the plural. Furthermore, when a range is described in this invention, it includes the application of individual values ​​belonging to the range (unless otherwise stated), which is equivalent to describing the individual values ​​constituting the range in the detailed description of the invention.

[0154] Unless otherwise expressly stated in order or in reverse, the steps constituting the method of the present invention may be performed in a suitable order. The present invention is not limited to the order in which the steps are described above. All examples or exemplary terms used in this invention (e.g., etc.) are intended only to describe the invention in detail, and the scope of the invention is not limited by the examples or exemplary terms unless defined by the claims. Furthermore, it will be apparent to those skilled in the art that various modifications, combinations, and changes can be made according to design conditions and factors without departing from the scope of the appended claims or their equivalents.

[0155] Therefore, the concept of the present invention should not be limited to the above embodiments, and the appended claims and all scopes equivalent to or modified from the claims shall fall within the scope of the concept of the present invention.

Claims

1. A calibration method, comprising: Pattern generation steps: Generate a test pattern; The pattern display step involves displaying the generated test pattern using a light field display. The image generation step involves capturing the displayed test pattern to generate a captured image; The image analysis step involves analyzing the captured image. as well as The pattern update step involves updating the test pattern based on the analysis results of the captured image.

2. The calibration method according to claim 1, characterized in that, The test pattern includes an analyzable slope.

3. The calibration method according to claim 2, characterized in that, The test patterns include line patterns.

4. The calibration method according to claim 1, characterized in that, The test pattern is generated based on multiple parameters.

5. The calibration method according to claim 4, characterized in that, The multiple parameters include one or more of the pitch parameter, the bevel angle parameter, and the offset parameter.

6. The calibration method according to claim 1, characterized in that, The light field display includes a panel containing multiple pixels and a light layer deposited on the panel to achieve 3D.

7. The calibration method according to claim 6, characterized in that, The optical layer includes a cylindrical lens or a parallax barrier.

8. The calibration method according to claim 1, characterized in that, The light field display includes a 3D imaging device for generating 3D images.

9. The calibration method according to claim 1, characterized in that, The captured images include pattern images displaying the test pattern.

10. The calibration method according to claim 9, characterized in that, The captured image has a larger area than the pattern image, and the entire pattern image is displayed within the captured image.

11. The calibration method according to claim 9, characterized in that, The pattern image is the image displayed by the light field display.

12. The calibration method according to claim 1, characterized in that, The captured image shows a center line.

13. The calibration method according to claim 12, characterized in that, The centerline is a vertical centerline.

14. The calibration method according to claim 1, characterized in that, The captured images include still images and / or video images.

15. The calibration method according to claim 1, characterized in that, The captured images include images captured while the pattern image displaying the test pattern is slidably moved.

16. The calibration method according to claim 15, characterized in that, The sliding movement refers to the camera that captures the test pattern moving from the front towards the light field display while simultaneously moving to the left or right.

17. The calibration method according to claim 15, characterized in that, In the image analysis step, the accuracy of the analysis of the captured image improves as the sliding movement distance increases.

18. The calibration method according to claim 1, characterized in that, In the image analysis step, the analysis of the captured image refers to reading the changing trend of the test pattern as the camera capturing the test pattern moves.

19. The calibration method according to claim 1, characterized in that, The reading of the trend of change refers to reading whether the test pattern of the camera, when moving, does not lag behind or lead, but follows the center of the camera well.

20. The calibration method according to claim 1, characterized in that, In the image analysis step, the analysis of the captured image refers to reading the slope of the test pattern.

21. The calibration method according to claim 20, characterized in that, The slope reading refers to comparing the slope of the test pattern with the parameter values ​​provided for generating the test pattern.

22. The calibration method according to claim 1, characterized in that, In the image analysis step, the analysis of the captured image refers to reading the position of the test pattern on the pattern image displaying the test pattern.

23. The calibration method according to claim 22, characterized in that, The location reading refers to reading whether the test pattern is centered on the pattern image.

24. The calibration method according to claim 1, characterized in that, In the pattern update step, the update of the test pattern refers to the update of the parameters that will form the basis for generating the test pattern.

25. The calibration method according to claim 1, characterized in that, The test pattern is continuously updated, and the initial test pattern in the updated test pattern is the design value of the light field display.

26. A calibration apparatus, comprising: Pattern generating device, generating test patterns; An image generating device that, when a light field display receives the test pattern from the pattern generating device and displays the pattern image, captures the pattern image to generate a captured image. as well as An image analysis device, wherein the pattern generation device analyzes the captured image in order to generate a new test pattern that updates the test pattern.

27. The calibration apparatus according to claim 26, characterized in that, The pattern generating device receives multiple parameters and generates the test pattern based on the multiple parameters.

28. The calibration apparatus according to claim 26, characterized in that, The image generating device generates the captured image while sliding from the front of the light field display toward the left or right.

29. The calibration apparatus according to claim 26, characterized in that, The image generation apparatus includes a camera for capturing the pattern image and a method for moving the camera.

30. The calibration apparatus according to claim 29, characterized in that, The movement method includes a track structure for moving the camera.

31. The calibration apparatus according to claim 26, characterized in that, The image analysis device updates the manufacturing parameters of the light field display in order to generate the new test pattern.

32. The calibration apparatus according to claim 31, characterized in that, The manufacturing parameters include one or more of the following: pitch parameter, bevel angle parameter, and offset parameter.

33. A light field display, characterized in that, The calibration shall be performed using the calibration method described in any one of claims 1 to 25.

34. A computer program product, characterized in that, The medium is stored in conjunction with hardware to perform the method according to any one of claims 1 to 25.

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