A system and method for locating delaminated interfaces in a multi-layered material
By combining a grating array module and a data processing module, the temperature decay rate is used to identify multi-layer material interfaces, solving the problem of low detection accuracy in existing technologies and achieving high spatial resolution and long-distance interface positioning.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN UNIV OF TECH
- Filing Date
- 2026-02-25
- Publication Date
- 2026-05-29
AI Technical Summary
Existing multilayer material layer interface detection technologies suffer from low detection accuracy, are unable to identify thin layers within 20 cm, and are affected by medium properties and electromagnetic interference, making it impossible to achieve high spatial resolution and long-distance synchronous analysis.
Employing a grating array module, a grating demodulation module, and a data processing module, and through the parallel deployment of doped measurement fibers and reference measurement fibers, combined with pump heating and optical heating parameters, the temperature changes of multilayer materials are monitored in real time, and the temperature decay rate is calculated to identify the interface.
It achieves high-precision positioning of multi-layer material interfaces, improves spatial resolution to 2cm, and can identify millimeter-level interfaces within a kilometer-level measurement range, thus improving detection accuracy and efficiency.
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Figure CN122108306A_ABST