A precision detection device for metallized film of a capacitor
By combining vision components and parameter calibration units, the problem of existing equipment being unable to detect internal defects in thin films has been solved, enabling comprehensive and accurate detection of metallized thin films and improving detection efficiency and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TONGLING QILI ELECTRONICS MATERIALS
- Filing Date
- 2026-03-04
- Publication Date
- 2026-05-29
AI Technical Summary
Existing precision inspection equipment for metallized thin films cannot effectively detect light transmittance defects inside the film, resulting in a high defect omission rate and affecting capacitor quality.
By employing a vision component combined with an LED array board and supplementary lighting, a vision camera is used to detect surface and internal defects of the thin film. Image analysis and parameter adjustment are performed using a defect detection unit and a parameter calibration unit to achieve comprehensive inspection of the metallized thin film.
It enables comprehensive detection of surface and internal defects in metallized thin films, improving the comprehensiveness and accuracy of detection, adapting to the detection needs of thin films of different specifications, and enhancing the versatility and precision of the equipment.
Smart Images
Figure CN122109083A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of testing equipment technology, and in particular to a precision testing device for metallized thin films of capacitors. Background Technology
[0002] As a core component of capacitors, the precision of metallized film directly determines the electrical performance, service life, and operational stability of capacitors. Therefore, high-precision testing of the surface condition, internal quality, and thickness of metallized film is a crucial step in capacitor production.
[0003] However, existing metallized thin film precision testing equipment has many shortcomings in practical applications, making it difficult to meet the requirements of comprehensiveness, accuracy and efficiency in the production process. Because traditional equipment mostly uses a single light source or detection structure, it can only identify visible defects such as scratches and stains on the surface of the film, and cannot effectively detect hidden defects such as pinholes and impurities, resulting in a high defect omission rate, which in turn affects the quality of subsequent capacitor products. Therefore, the above-mentioned problems need to be addressed and improved. Summary of the Invention
[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing a precision testing device for metallized thin films of capacitors.
[0005] To achieve the above objectives, the present invention adopts the following technical solution: a precision inspection device for metallized thin films of capacitors, comprising a positioning plate, a first placement stage mounted on one side of the top surface of the positioning plate, a matching second placement stage mounted on the top surface of the first placement stage, an LED array plate mounted on the top surface of the positioning plate on the inner side of the first placement stage, a glass plate mounted on the inner side of the second placement stage, and a support component for placing the metal thin film mounted on the other side of the top surface of the positioning plate; a vision component for visual inspection of the metal thin film is mounted on the rear end of the top surface of the positioning plate. The vision component includes a vision camera, a positioning block is sleeved on the lower outer side of the vision camera, a supplementary light adapted to the vision camera is installed below the positioning block, and an intelligent control module is set inside the vision camera, the intelligent control module includes a defect detection unit and a parameter calibration unit. The defect detection unit determines the analysis image through image comparison. When the supplementary light is turned on, it judges whether there are defects such as scratches, stains or holes on the film surface by the continuity and distribution characteristics of the gray block of the abnormal marker structure and the gray value range. When the LED array board is turned on, it further judges whether the defect is located on the surface of the film or inside by combining the surface detection results. The parameter calibration unit calculates key detection parameters based on the actual parameters of the film, combined with the basic parameters of the equipment and preset correction coefficients. When testing films of different specifications, the actual parameters are input into the intelligent control module, and the parameter calibration unit calculates the corresponding parameters and compares them with the actual set values to obtain the adjustment amount, which is then wirelessly transmitted to the control terminal display screen to prompt the operator to make the corresponding adjustments. If the adjustment still does not meet the standard, the prompt will be repeated.
[0006] Preferably, the data analysis steps of the defect detection unit are as follows: M1: Perform grayscale processing and segmentation on the acquired image data, and then determine the number of anomalies based on the grayscale value fluctuation range of the corresponding numbered grayscale blocks. ,Pick The smallest grayscale image is used as the preliminary analysis image. Based on the grayscale values of standard thin film components, the grayscale blocks corresponding to the thin film region in the preliminary analysis image are identified as structural grayscale blocks. The number of anomalies in the structural grayscale blocks in the preliminary analysis image is counted. ,Pick The image with the smallest grayscale value is the final image for analysis; M2: Draw the film outline on the final analysis image based on the location of the structural grayscale blocks, obtain the grayscale value of the structural grayscale blocks within the outline and compare it with the grayscale value fluctuation range of the standard part, mark the structural grayscale blocks that exceed the range as anomalies, draw the outline of the anomaly-marked structural grayscale blocks, and determine the defects based on the grayscale value range [0,255]. M3: If the outline is linear and the gray value is close to the lower limit, it is judged as a scratch; if the outline is linear and the gray value is not close to the lower limit, it is judged as a stain; if the outline is circular and the gray value is close to the lower limit, it is judged as a hole; if the outline is circular and the gray value is not close to the lower limit, it is judged as a stain; if the outline is irregular in shape, it is also judged as a stain. M4: Retrieve the defect judgment results and the corresponding abnormal marker structure gray block number during surface inspection, and comprehensively determine whether the defect is located on the surface or inside the film.
[0007] Preferably, the data analysis steps of the parameter calibration unit are as follows: N1: Based on the actual parameters of the thin film, including thickness Surface reflectivity and light transmittance Based on the equipment's basic parameters and preset correction coefficients, the focusing distance is calculated using the following formula. Camera exposure Defect identification threshold Brightness of fill light and LED array panel brightness ; N2: When the equipment is used for the first time, experimental calibration is performed using standard film samples of different thicknesses, transmittances, and reflectivities. After testing the optimal equipment parameters, the correction coefficient is determined by working backward. to After calibration, it can be directly applied to batch testing of films of the same specification; N3: When testing films of different specifications, the actual parameters of the film are input into the intelligent control module. The parameter calibration unit calculates the parameter setting value for the corresponding specification according to the above formula, and compares the calculated parameters with the current actual setting value to obtain the adjustment amount of each parameter. The adjustment amount is wirelessly transmitted to the control terminal display screen through the intelligent control module to prompt the operator to make the corresponding adjustment, and then test again after adjustment. If the parameters still do not meet the standard after adjustment, the adjustment amount of the corresponding parameter is displayed again on the display screen until the parameter setting meets the testing requirements.
[0008] Preferably, the support assembly includes a first positioning rod vertically installed on the other side of the top surface of the positioning plate, a support plate slidably connected to the outside of the first positioning rod, and a first limiting bolt longitudinally threaded to one side of the support plate.
[0009] Preferably, the vision component includes a second positioning rod vertically installed at the rear end of the middle of the top surface of the positioning plate, a positioning platform slidably connected to the outer side of the second positioning rod, a second limiting bolt being threadedly connected to the rear end of the positioning platform, and a positioning groove being provided on the top surface of the front end of the positioning platform, with threaded holes provided on both sides of the positioning groove communicating with the positioning platform.
[0010] Preferably, both sides of the front end of the positioning platform are connected by a third limiting bolt with a mating threaded hole, and an auxiliary platform is installed on one side of the top surface of the positioning platform.
[0011] Preferably, a vision camera is vertically mounted on the front end of the top of the positioning platform.
[0012] Preferably, a thickness detection rod is vertically mounted on one side of the auxiliary platform.
[0013] Compared with the prior art, the beneficial effects of the present invention are: 1. Through the cooperation between the support component and the vision component, accurate detection of film defects is achieved; through the cooperation between the vision camera, supplementary light and LED array plate, surface defects such as scratches and stains on the top surface of the film are detected, and light-transmitting defects such as pinholes and impurities inside the film can also be detected, achieving comprehensive detection of surface and internal defects; through the cooperation between the auxiliary stage and thickness detection rod and the support component, the film thickness is detected before vision inspection, improving inspection efficiency and avoiding defect omissions caused by a single inspection method; 2. By filtering and analyzing images through the defect detection unit, the accuracy and reliability of image data are significantly improved. When the supplementary light is on, the continuity and distribution characteristics of the grayscale blocks of the abnormal marker structure are used, combined with the analysis of grayscale value range and contour shape, to accurately distinguish the types of defects such as scratches, stains and holes on the thin film surface. When the LED array board is on, the surface detection results are combined to further determine whether the defect is located on the surface or inside the thin film, realizing the collaborative judgment of surface defects and internal defects, avoiding the missed detection of defects caused by single light source detection, and greatly improving the comprehensiveness and accuracy of defect detection. 3. The parameter calibration unit calculates key detection parameters based on the actual parameters of the film, combined with the equipment's basic parameters and preset correction coefficients. When detecting films of different specifications, the parameter calibration unit automatically calculates the optimal parameters and compares them with the current set values, obtains the adjustment amount, and wirelessly transmits it to the control terminal to prompt the operator to make adjustments. If the adjustment still does not meet the standard, it will prompt again until the parameter settings meet the requirements. This effectively solves the problem that traditional equipment is difficult to adapt to the detection needs of films of different specifications due to fixed parameters, and significantly improves the equipment's versatility and detection accuracy. Attached Figure Description
[0014] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this application, illustrate exemplary embodiments of the invention and, together with their description, serve to explain the invention and do not constitute an undue limitation thereof. In the drawings: Figure 1 This is a schematic diagram of the overall structure proposed in this invention; Figure 2 This is a schematic diagram of the support plate proposed in this invention; Figure 3 This is a schematic diagram of the LED array board structure proposed in this invention; Figure 4 This is a schematic diagram of the thickness detection rod structure proposed in this invention; Figure 5 This is a flowchart of the system proposed in this invention.
[0015] The following items are numbered in the diagram: 1. Positioning plate; 2. First placement stage; 3. Second placement stage; 4. Glass plate; 5. First positioning rod; 6. Support plate; 7. First limiting bolt; 8. Second positioning rod; 9. Positioning stage; 10. Second limiting bolt; 11. Third limiting bolt; 12. Vision camera; 13. Additional stage; 14. Thickness detection rod; 15. Positioning block; 16. Supplementary light; 17. LED array board. Detailed Implementation
[0016] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.
[0017] Example 1: See Figures 1 to 4 Figure 1 shows a precision testing device for metallized thin films of capacitors according to the present invention. The device includes a positioning plate 1, which facilitates the use of an external limiting device to support and limit subsequent support components and vision components. The bottom surface of the positioning plate 1 is attached with anti-slip strips, and the limiting method can be changed according to different mounting surfaces. A first placement platform 2 is mounted on one side of the top surface of the positioning plate 1, which facilitates the use of an external limiting device to install and limit an LED array plate 17. A plug is mounted on the front end of one side of the first placement platform 2, and the inner side of the plug is connected to the LED array plate 17 via a wire, facilitating subsequent power connection to the external power source to supply power to the LED array plate 17. A matching second placement platform 3 is mounted on the top surface of the first placement platform 2, which facilitates the use of a glass plate 4 to protect the LED array plate 17. The LED array plate 1 is mounted on the top surface of the positioning plate 1 on the inner side of the first placement platform 2. 7. The LED array plate 17 facilitates the provision of a light source for the vision camera 12 during subsequent visual inspection, allowing the light source to illuminate the bottom surface of the film and enabling the vision camera 12 to detect whether the film has defects. A glass plate 4 is installed on the inner side of the second placement stage 3, which facilitates the transmission of the light source from the LED array plate 17 to the bottom surface of the film. A support assembly for placing the metal film is installed on the other side of the top surface of the positioning plate 1. A vision assembly for visual inspection of the metal film is installed at the rear end of the top surface of the positioning plate 1. The support assembly includes a first positioning rod 5 vertically installed on the other side of the top surface of the positioning plate 1. A support plate 6 is slidably connected to the outer side of the first positioning rod 5. A first limiting bolt 7 is longitudinally threaded on one side of the support plate 6. The first positioning rod 5 facilitates the use of the first limiting bolt 7 to limit the support plate 6 used to support the film. The support plate 6 facilitates the placement of the film. Furthermore, a light-transmitting acrylic plate is installed on the inner side of the support plate 6. In this invention, the vision component includes a second positioning rod 8 vertically mounted at the rear end of the middle of the top surface of the positioning plate 1. A positioning platform 9 is slidably connected to the outer side of the second positioning rod 8. A second limiting bolt 10 is threadedly connected to the rear end of the positioning platform 9. The second positioning rod 8 facilitates the subsequent positioning of the positioning platform 9, which is used to install the vision camera 12, in conjunction with the second limiting bolt 10. The positioning platform 9 facilitates the positioning of the vision camera 12 in conjunction with the third limiting bolt 11. A positioning groove is provided on the top surface of the front end of the positioning platform 9 to facilitate the guidance of the vision camera 12. Threaded holes are provided on both sides of the positioning groove and the positioning platform 9 to limit the third limiting bolt 11. The front ends of the positioning platform 9 are both threadedly connected to the third limiting bolt 11 with matching threaded holes. An additional platform 13 is installed on one side of the top surface of the positioning platform 9 to facilitate the use of an external limiting device to limit the thickness. The detection rod 14; a vision camera 12 is vertically mounted on the front end of the top of the positioning stage 9, which facilitates the detection of the top surface of the film; a positioning block 15 is sleeved on the outer side below the vision camera 12, which facilitates the subsequent installation of a supplementary light 16 with an external limiting device; a supplementary light 16 adapted to the vision camera 12 is installed below the positioning block 15, which provides supplementary lighting for the vision camera 12 when it detects the film surface. At this time, the LED array plate 17 is turned off, and when the LED array plate 17 is turned on, the supplementary light 16 is turned off; a thickness detection rod 14 is vertically mounted on one side of the auxiliary stage 13, which facilitates the detection of the film thickness. The detection end of the thickness detection rod 14 is lower than the supplementary light 16. All electrical components used need to be connected to an external control system, and the vision camera 12 has a built-in autofocus effect.
[0018] Working principle: When using this invention, the operator places the positioning plate 1 on the predetermined base surface and then powers it on. The operator then adjusts the height of the support plate 6 on the first positioning rod 5 using the first limiting bolt 7. The metallized film to be tested is then placed stably on the support plate 6 (an acrylic plate is installed on the inner side of the support plate 6 at this time; the acrylic plate is not required when the bottom surface of the support plate 6 abuts against the top surface of the second placement platform 3), so that the film covers the glass plate 4 installed on the inner side of the second placement platform 3. Then, the operator manually drives the positioning platform 9 to slide along the axial direction of the second positioning rod 8, so that the thickness detection rod 14 installed on the auxiliary platform 13 detects the rear end of the film. Then, according to the detection requirements of the vision camera 12, the height of the positioning platform 9 is determined, and the second limiting bolt 10 at the rear end of the positioning platform 9 is tightened to fix the positioning platform 9. Since the vision camera 12 is fixed by the positioning groove and the third limiting bolt 11, it is ensured that the vision camera 12 will not be displaced under the multiple lifting and lowering movements of the positioning platform 9. Then, it is confirmed whether the supplementary light 16 installed below the positioning block 15 is providing normal supplementary lighting. After the preparation work is completed, The staff activates the supplementary light 16 through the external control system. At this time, the LED array plate 17 is turned off. The vision camera 12 uses its built-in autofocus function to accurately photograph and inspect the top surface of the film, capturing surface defects such as scratches and stains. After the surface defect detection is completed, the supplementary light 16 is turned off, and the LED array plate 17 in the first placement stage 2 is activated. At this time, the light emitted by the LED array plate 17 shines through the glass plate 4 inside the second placement stage 3 and illuminates the bottom surface of the film. Based on the light transmission characteristics, the vision camera 12 photographs the film again to identify light transmission defects such as pinholes and impurities inside the film. The inspection of the film is then completed.
[0019] Example 2: See Figure 5 The vision camera 12 has an internal intelligent control module, which includes a defect detection unit and a parameter calibration unit. The defect detection unit determines the analysis image through image comparison. When the supplementary light is turned on, it judges whether there are defects such as scratches, stains or holes on the film surface by the continuity and distribution characteristics of the gray block of the abnormal marker structure and the gray value range. When the LED array board is turned on, it further judges whether the defect is located on the surface of the film or inside by combining the surface detection results. The parameter calibration unit calculates key detection parameters based on the actual parameters of the film, combined with the basic parameters of the equipment and preset correction coefficients. When testing films of different specifications, the actual parameters are input into the intelligent control module, and the parameter calibration unit calculates the corresponding parameters and compares them with the actual set values to obtain the adjustment amount and wirelessly transmits it to the control terminal display screen to prompt the operator to make the corresponding adjustments. If the adjustment still does not meet the standard, the prompt will be repeated. The real-time acquired image data is processed into grayscale, and the grayscale image is segmented according to the size of pixel blocks, resulting in... The image data consists of several identical grayscale blocks, numbered according to their row and column numbers on the grayscale image. The acquired image data is sorted by acquisition time, and the corresponding numbered grayscale blocks within a single image acquired at the same time are further analyzed. Average the gray values and standard deviation The calculation, and the mean obtained from the calculation. and standard deviation Range of grayscale data The setting compares the corresponding grayscale value data with the corresponding grayscale value fluctuation range, marks the corresponding grayscale value data that is outside the fluctuation range as an outlier, and records the number of outliers. ; like If the grayscale data is abnormal, the grayscale data will be detected again. This is a preset proportional coefficient; if If outliers are removed, the remaining grayscale data after outlier removal is averaged. The calculation, and the mean obtained from the calculation. As the grayscale value data detected at the corresponding time; If the grayscale data is still determined to be abnormal upon re-inspection, then the corresponding numbered grayscale block is determined to be abnormal; after determining the grayscale values of all numbered grayscale blocks on the grayscale image, the number of abnormal grayscale blocks is calculated. Record and take the quantity The smallest grayscale image is used as the preliminary analysis image. Based on the grayscale values of the standard thin film components, the grayscale values of all grayscale blocks in the preliminary analysis image are compared to determine the corresponding grayscale block number for the thin film. These grayscale blocks are named structural grayscale blocks. The number of grayscale block anomalies in the structural grayscale blocks of the preliminary analysis image is then analyzed. Perform statistics and collect quantities. The image with the smallest grayscale value is the final image for analysis; When the supplementary light 16 is on and the LED array board 17 is off, the outline of the thin film is drawn on the final analysis image based on the position of the structural grayscale blocks. The grayscale value data of the structural grayscale blocks inside the thin film outline is acquired and compared with the grayscale value fluctuation range of the standard part. Structural grayscale blocks that are not within the grayscale value fluctuation range of the standard part are marked as abnormal. If there are also structural grayscale blocks marked as abnormal at the adjacent positions of the abnormally marked structural grayscale blocks, the two structural grayscale blocks are determined to be continuous. A line is drawn connecting the two structural grayscale blocks, and the line is extended to both ends. The number of continuous structural grayscale blocks on the extension path is counted. If there is only a single discontinuity between two continuous structural grayscale blocks with abnormal markings, the two continuous structural grayscale blocks with abnormal markings are determined to be continuous structural grayscale blocks with the same abnormal marking. The total number of structural grayscale blocks on the extension path of this continuous structural grayscale block is calculated. ; For length of The line segments are divided according to the length of the grayscale blocks, and then divided into... For each segment, calculate the number of continuous grayscale blocks with anomalous markers in other directions at the corresponding segmentation point. ,according to Depict the outline of the grayscale block representing the anomaly marker structure; the grayscale value range of the grayscale block is... If the outline is linear and the gray value is close to the lower limit of the gray value range, it is determined that there are scratches on the film surface; otherwise, it is determined that there are stains on the film surface. If the outline is circular and the gray value is close to the lower limit of the gray value range, it is determined that there are holes on the film surface; otherwise, it is determined that there are stains on the film surface. If it is an irregular shape, it is also determined that there are stains on the film surface. When the supplementary light 16 is off and the LED array board 17 is on, the defect judgment results and the corresponding abnormal marker structure gray block number are retrieved during surface inspection to determine whether the defect is located on the surface or inside the film. The number and area data of the corresponding defects are statistically analyzed. When the number or area of the corresponding defects exceeds the threshold, a defect warning signal is generated. The defect type, threshold type and location are displayed on the terminal display screen to facilitate the staff to classify and process the defective film.
[0020] The core of camera focusing parameters is the focusing distance. The straight-line distance from the camera lens to the thin-film detection surface is a core quantitative indicator for focusing and is only related to the film thickness. And the distance to the equipment structure foundation is related to the focusing distance. , To determine the object distance for the equipment base focus, This is the focus thickness correction factor, and the flatness correction amount. ; Camera exposure These are the core parameters for shooting, divided into surface defect detection exposure. and exposure of internal defect detection , respectively with the reflectivity of the thin film surface Light transmittance and thickness Relevance leads to increased exposure. Exposure ,in For, the exposure correction factor Exposure correction factor ; Defect identification threshold It is the core criterion for machine vision to identify defects, and is divided into surface defect threshold. and internal defect threshold , respectively with film thickness Light transmittance Correlation, then surface defect threshold Internal defect threshold Threshold correction coefficient , ; Fill light 16 brightness For surface defect detection only; reflectivity of core and thin film surfaces. and thickness Related, fill light brightness , The fill light has a base brightness of 16, and the fill light brightness correction factor is... ; LED array panel 17 brightness For internal defect detection only; core and film transmittance. and thickness Related, then , The reference brightness of the LED array board is 17, and the LED brightness correction factor is... ; The correction factor in the formula ( When using the equipment for the first time, it is necessary to conduct experimental calibration using multiple sets of standard film samples (e.g., select 5-10 standard films with different thicknesses / transmittances / reflectances, test the optimal equipment parameters, and then back-calculate the coefficients). After calibration, it can be directly applied to the batch testing of films of the same specification. When testing films of different specifications, the actual parameter data of the film is input into the intelligent control module. The parameter calibration unit in the intelligent control module calculates the corresponding parameter settings for the corresponding specifications and compares the calculated parameters with the corresponding actual parameters to obtain the adjustment amount of the corresponding parameters. The adjustment amount of the corresponding parameters is wirelessly transmitted to the display screen of the control terminal through the intelligent control module, so that the staff can make adjustments according to the parameter adjustment amount and test again after adjustment. If the corresponding parameters do not meet the standards, the adjustment amount of the corresponding parameters will be displayed again on the display screen.
[0021] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.
Claims
1. A precision testing device for metallized thin films of capacitors, comprising a positioning plate (1), characterized in that: A first placement platform (2) is installed on one side of the top surface of the positioning plate (1), and a matching second placement platform (3) is installed on the top surface of the first placement platform (2). An LED array plate (17) is installed on the inner side of the first placement platform (2) on the top surface of the positioning plate (1). A glass plate (4) is installed on the inner side of the second placement platform (3). A support assembly for placing a metal film is installed on the other side of the top surface of the positioning plate (1). A vision assembly for visual inspection of the metal film is installed at the rear end of the top surface of the positioning plate (1). The vision component includes a vision camera (12), a positioning block (15) is sleeved on the lower outer side of the vision camera (12), a supplementary light (16) adapted to the vision camera (12) is installed below the positioning block (15), and an intelligent control module is provided inside the vision camera (12), the intelligent control module includes a defect detection unit and a parameter calibration unit; The defect detection unit determines the analysis image through image comparison. When the supplementary light is turned on, it judges whether there are defects such as scratches, stains or holes on the film surface by the continuity and distribution characteristics of the gray block of the abnormal marker structure and the gray value range. When the LED array board is turned on, it further judges whether the defect is located on the surface of the film or inside by combining the surface detection results. The parameter calibration unit calculates key detection parameters based on the actual parameters of the film, combined with the basic parameters of the equipment and preset correction coefficients. When testing films of different specifications, the actual parameters are input into the intelligent control module, and the parameter calibration unit calculates the corresponding parameters and compares them with the actual set values to obtain the adjustment amount, which is then wirelessly transmitted to the control terminal display screen to prompt the operator to make the corresponding adjustments. If the adjustment still does not meet the standard, the prompt will be repeated.
2. The precision testing equipment for metallized thin films of capacitors according to claim 1, characterized in that: The data analysis steps for the defect detection unit are as follows: M1: Perform grayscale processing and segmentation on the acquired image data, and then determine the number of anomalies based on the grayscale value fluctuation range of the corresponding numbered grayscale blocks. ,Pick The smallest grayscale image is the initial analysis image; Based on the grayscale values of the standard thin film, the grayscale blocks corresponding to the thin film region in the preliminary analysis image are identified as structural grayscale blocks; Preliminary statistical analysis of the number of anomalies in structural grayscale blocks in the image ,Pick The image with the smallest grayscale value is the final image for analysis; M2: Draw the film outline on the final analysis image based on the location of the structural grayscale blocks, obtain the grayscale value of the structural grayscale blocks within the outline and compare it with the grayscale value fluctuation range of the standard part, mark the structural grayscale blocks that exceed the range as anomalies, draw the outline of the anomaly-marked structural grayscale blocks, and determine the defects based on the grayscale value range [0,255]. M3: If the outline is linear and the gray value is close to the lower limit, it is judged as a scratch; if the outline is linear and the gray value is not close to the lower limit, it is judged as a stain; if the outline is circular and the gray value is close to the lower limit, it is judged as a hole; if the outline is circular and the gray value is not close to the lower limit, it is judged as a stain; if the outline is irregular in shape, it is also judged as a stain. M4: Retrieve the defect judgment results and the corresponding abnormal marker structure gray block number during surface inspection, and comprehensively determine whether the defect is located on the surface or inside the film.
3. The precision testing equipment for metallized thin films of capacitors according to claim 1, characterized in that: The data analysis steps for the parameter calibration unit are as follows: N1: Based on the actual parameters of the thin film, including thickness Surface reflectivity and light transmittance Based on the equipment's basic parameters and preset correction coefficients, the focusing distance is calculated using the following formula. Camera exposure Defect identification threshold , Fill light (16) brightness Brightness of LED array panel (17) ; N2: When the equipment is used for the first time, experimental calibration is performed using standard film samples of different thicknesses, transmittances, and reflectivities. After testing the optimal equipment parameters, the correction coefficient is determined by working backward. to After calibration, it can be directly applied to batch testing of films of the same specification; N3: When testing films of different specifications, the actual parameters of the film are input into the intelligent control module. The parameter calibration unit calculates the parameter setting value for the corresponding specification according to the above formula, and compares the calculated parameters with the current actual setting value to obtain the adjustment amount of each parameter. The adjustment amount is wirelessly transmitted to the control terminal display screen through the intelligent control module to prompt the operator to make the corresponding adjustment, and then test again after adjustment. If the parameters still do not meet the standard after adjustment, the adjustment amount of the corresponding parameter is displayed again on the display screen until the parameter setting meets the testing requirements.
4. The precision testing equipment for metallized thin films of capacitors according to claim 1, characterized in that: The support assembly includes a first positioning rod (5) vertically installed on the other side of the top surface of the positioning plate (1), a support plate (6) slidably connected to the outside of the first positioning rod (5), and a first limiting bolt (7) longitudinally threadedly connected to one side of the support plate (6).
5. The precision testing equipment for metallized thin films of capacitors according to claim 1, characterized in that: The vision component includes a second positioning rod (8) vertically installed at the rear end of the middle of the top surface of the positioning plate (1). A positioning platform (9) is slidably connected to the outside of the second positioning rod (8). A second limiting bolt (10) is threadedly connected to the rear end of the positioning platform (9). A positioning groove is opened on the top surface of the front end of the positioning platform (9). Threaded holes are opened on both sides of the positioning groove and the positioning platform (9).
6. The precision testing equipment for metallized thin films of capacitors according to claim 5, characterized in that: The positioning platform (9) has a third limiting bolt (11) with a mating threaded hole on both sides of its front end, and an additional platform (13) is installed on one side of the top surface of the positioning platform (9).
7. The precision testing equipment for metallized thin films of capacitors according to claim 6, characterized in that: A vision camera (12) is vertically mounted on the front end of the top of the positioning platform (9).
8. The precision testing equipment for metallized thin films of capacitors according to claim 6, characterized in that: A thickness detection rod (14) is vertically installed on one side of the auxiliary platform (13).