A capacitor wafer full defect detection apparatus

Abstract

The application is suitable for the technical field of capacitor wafer detection, and provides a capacitor wafer comprehensive defect detection equipment, which comprises a processing box used as a mounting carrier of a transportation assembly, a visual detection assembly, a turning assembly, a classification assembly, a resetting assembly and a bottom cleaning assembly; the transportation assembly is used for transportation operation of the capacitor wafer; the visual detection assembly is used for detection of the capacitor wafer; and the turning assembly is used for turning operation of the capacitor wafer. Through the turning assembly, the capacitor wafer on the first stainless steel plate is conveniently put on the second stainless steel plate, the turning operation of the capacitor wafer is further facilitated, the problem of detection dead angle is avoided, the comprehensiveness of capacitor wafer identification is ensured, the applicability of the equipment is increased, and the practical application and operation are facilitated.

Description

Technical Field

[0001] This invention belongs to the field of capacitor wafer inspection technology, and particularly relates to a comprehensive defect inspection device for capacitor wafers. Background Technology

[0002] Capacitor discs are a common structural form of ceramic capacitors, typically referring to capacitors made with a disc-shaped ceramic dielectric and electrode structure. As a fundamental component of key electronic components, the quality of capacitor discs directly affects the performance and reliability of electronic products, making defect detection of capacitor discs a crucial step in the production process.

[0003] During the inspection process, minute defects such as scratches, stains, and cracks on capacitor discs are accurately identified visually. However, during the inspection and transportation process, only the side of the capacitor disc facing upwards can be visually inspected, while the side of the capacitor disc in contact with the conveyor belt cannot be visually inspected. This results in blind spots in the inspection of capacitor discs, reducing the applicability of the equipment and hindering practical application and operation. Summary of the Invention

[0004] The purpose of this invention is to provide a comprehensive defect detection device for capacitor wafers, aiming to solve the problems in the prior art.

[0005] The embodiments of the present invention are implemented as follows: A comprehensive defect detection device for capacitor wafers includes: The processing box serves as a mounting carrier for transport components, visual inspection components, flipping components, sorting components, resetting components, and cleaning components. Transport components for transporting capacitor wafers; A vision inspection component is used to inspect and process capacitor discs. A flipping assembly for flipping capacitor discs; The flipping assembly includes: The second servo motor is mounted on the outside of the machining box; The connecting rod is mounted on the output shaft of the second servo motor; The bracket is installed between the inner walls of the processing box; The square rods are all mounted on the brackets; A skateboard, wherein the skateboard slides in conjunction with two square bars; The chute is formed inside the skateboard; The cam is mounted on the end of the connecting rod away from the second servo motor; The first slide rod is installed on the side of the cam away from the connecting rod, and the first slide rod slides in conjunction with the slide groove; Top bar, mounted on the skateboard.

[0006] Preferably, the transport component includes: Two fixing plates are installed at one end of the processing box, and the two fixing plates are located on both sides of the feed inlet of the processing box; Two double-toothed rollers rotate between two fixed plates and the inner wall of the processing box, respectively. First stainless steel plate; The second stainless steel plate is composed of multiple first and second stainless steel plates forming a conveyor belt, and the two double-toothed rollers are connected by the conveyor belt drive. The first servo motor is mounted on the fixed plate, and the output end of the second stainless steel plate is fixedly connected to one of the double toothed rollers.

[0007] Preferably, the flipping assembly further includes: The square channels are all formed on the first stainless steel plate; The flap rotates inside the square groove; A baffle is installed on one side inside the square groove, and the baffle abuts against the flap. A magnet is installed inside the square groove on one side and above the baffle. An arc-shaped iron plate is installed on one end of the flip plate, and the arc-shaped iron plate is attracted to the magnet. The rubber pads are all installed on the second stainless steel plate.

[0008] Preferably, the visual detection component includes: The screw is threaded into the machining box; A connecting plate, the bottom end of which is rotatably engaged with a screw; High-resolution industrial camera, mounted on a connector plate; A high-sensitivity sensor is mounted on a connecting plate, and the high-sensitivity sensor is located on one side of a high-resolution industrial camera; Auxiliary rods, both of which are slidably fitted with the processing box, and both of which are connected to the connecting plate; A turntable is mounted on the top of the screw; The lighting is installed on the top of the inner wall of the processing box.

[0009] Preferably, the classification component includes: The electric telescopic rods are all installed on the processing box, and the two electric telescopic rods are located on both sides of the second servo motor; The push plate is installed on the piston rod of the electric telescopic rod; The first discharge port is located on the side of the processing box away from the electric telescopic rod; The second discharge port is located at the end of the processing box away from the fixed plate; Guide plates are installed inside the first and second discharge ports, respectively. The defective material boxes are all installed on the processing box, and the defective material boxes are located below the first discharge port; A qualified material box is installed between the bottom legs of the processing box, and the qualified material box is located below the guide plate.

[0010] Preferably, the reset component includes: The second slide rod slides in contact with the inner wall of the processing box; Top block, installed between the tops of multiple second slide bars; Preload springs are all fitted on the outside of the second slide rod, and the preload springs are located between the top block and the processing box; A pull plate is installed between the bottom ends of multiple second slide bars.

[0011] Preferably, the bottom cleaning component includes: A slot is formed on one side of the inner wall of the processing box, and the slot is located below the second servo motor; The box door is designed to fit into the slot, and a sealing strip is provided around the inside of the box door.

[0012] Compared with the prior art, the beneficial effects of the present invention are: 1. By setting up a flipping component, the present invention facilitates the transfer of capacitor discs from the first stainless steel plate to the second stainless steel plate, further facilitating the flipping operation of the capacitor discs, avoiding the problem of detection blind spots, ensuring the comprehensiveness of capacitor disc identification, increasing the applicability of the equipment, and benefiting practical application and operation. 2. This invention, by setting up a vision inspection component, transmits the images captured and monitored by a high-resolution industrial camera to the display screen in the workshop in real time for workers to view, ensuring clear capture of the surface details of the capacitor wafers even in complex lighting environments. At the same time, it drives the lighting to illuminate the space inside the processing box, enhancing the effect of vision inspection. 3. The present invention sets up a reset component to push the flip plate into the square slot, thereby completing the reset operation of the flip plate, which facilitates subsequent transportation work; and sets up a classification component to distinguish and store capacitor wafers, which facilitates the optimization of subsequent production processes of capacitor wafers. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall structure of the left side in a frontal view according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the overall structure of the right side of the exterior in a frontal view, provided in an embodiment of the present invention. Figure 3This is a top view of the processing box in cross-section, as provided in an embodiment of the present invention. Figure 4 This is a bottom view of the processing box in cross-section, as provided in an embodiment of the present invention. Figure 5 This is a schematic diagram of the flipping component structure provided in an embodiment of the present invention; Figure 6 This is a partial enlarged view of the first stainless steel plate provided in an embodiment of the present invention; Figure 7 This is a schematic diagram of the structure of the visual inspection component provided in an embodiment of the present invention; Figure 8 This is a schematic diagram of the transportation component structure provided in an embodiment of the present invention.

[0014] Explanation of reference numerals in the attached figures: 1. Processing box; 2. Transport assembly; 201. Fixing plate; 202. Double toothed roller; 203. First stainless steel plate; 204. Second stainless steel plate; 205. First servo motor; 3. Vision inspection assembly; 301. Screw; 302. Connecting plate; 303. High-resolution industrial camera; 304. High-sensitivity sensor; 305. Auxiliary rod; 306. Turntable; 307. Lighting lamp; 4. Flipping assembly; 401. Second servo motor; 402. Connecting rod; 403. Bracket; 404. Square rod; 405. Slide plate; 406. Slide groove; 407. Cam 408. First sliding rod; 409. Top rod; 410. Square channel; 411. Flip plate; 412. Baffle; 413. Magnet; 414. Arc-shaped iron plate; 415. Rubber pad; 5. Sorting component; 501. Electric telescopic rod; 502. First discharge port; 503. Second discharge port; 504. Guide plate; 505. Defective material box; 506. Qualified material box; 507. Push plate; 6. Reset component; 601. Second sliding rod; 602. Top block; 603. Pre-tension spring; 604. Pull plate; 7. Bottom cleaning component; 701. Slot; 702. Box door. Detailed Implementation

[0015] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0016] Please see Figure 1-8 This invention provides a technical solution: a grinding device for processing quartz products with a dustproof mechanism, comprising: Processing box 1 serves as the mounting carrier for transport component 2, vision inspection component 3, flipping component 4, sorting component 5, resetting component 6, and bottom cleaning component 7; Transport component 2 is used for transporting capacitor discs; Visual inspection component 3 is used for inspecting and processing capacitor discs; Flipping component 4 is used to flip the capacitor discs. Flipping component 4 includes: The second servo motor 401 is installed on the outside of the machining box 1; Connecting rod 402 is mounted on the output shaft of second servo motor 401; Bracket 403 is installed between the inner walls of processing box 1; Square rods 404 are all mounted on brackets 403; Slide 405, slides with two square rods 404; Slide 406 is formed inside slide plate 405; Cam 407 is installed on the end of connecting rod 402 away from the second servo motor 401; The first slide rod 408 is installed on the side of the cam 407 away from the connecting rod 402, and the first slide rod 408 slides in conjunction with the slide groove 406; Top rod 409 is installed on slide plate 405; Square channels 410 are all formed on the first stainless steel plate 203; The flap 411 rotates inside the square groove 410; A baffle 412 is installed on one side inside the square groove 410, and the baffle 412 abuts against the flap 411; Magnet 413 is installed on one side inside the square groove 410 and above the baffle 412; An arc-shaped iron plate 414 is installed on one end of the flip plate 411, and the arc-shaped iron plate 414 and the magnet 413 are attracted to each other. Rubber pads 415 are all installed on the second stainless steel plate 204.

[0017] In practical application, this embodiment drives the second servo motor 401 to rotate the connecting rod 402, which in turn rotates the cam 407, causing the first slide rod 408 to move in a circular motion. This causes the slide groove 406 on the slide plate 405 to slide up and down on the two square rods 404, while simultaneously causing the top rod 409 to move up and down. When the top rod 409 moves upward, it pushes out the flip plate 411 in the square groove 410, causing the flip plate 411 to separate from the magnet 413. This causes the flip plate 411 to rotate counterclockwise in the square groove 410, placing the capacitor disc on the flip plate 411 onto the rubber pad 415, so that the side of the capacitor disc that contacts the flip plate 411 faces upward, thus achieving the flipping operation of the capacitor disc.

[0018] This embodiment, by setting up a flipping component 4, facilitates the transfer of capacitor discs from the first stainless steel plate 203 onto the second stainless steel plate 204, further facilitating the flipping operation of the capacitor discs, avoiding detection blind spots, ensuring the comprehensiveness of capacitor disc identification, increasing the applicability of the equipment, and benefiting practical applications and operations.

[0019] In one embodiment, the flip angle of the flap 411 is limited, so that when the top rod 409 applies the maximum force to the flap 411, the maximum placement range of the capacitor disc placed on the flap 411 will not exceed the area of ​​the rubber pad 415, thus enabling the capacitor disc to be flipped.

[0020] like Figure 1-8 As shown, in a preferred embodiment of the present invention, the transport component 2 includes: Two fixing plates 201 are installed at one end of the processing box 1, and the two fixing plates 201 are located on both sides of the feed inlet of the processing box 1; Two double-toothed rollers 202 rotate between two fixed plates 201 and the inner wall of the processing box 1, respectively; First stainless steel plate 203; The second stainless steel plate 204 is combined with multiple first stainless steel plates 203 and second stainless steel plates 204 to form a conveyor belt, and the two double toothed rollers 202 are connected by the conveyor belt drive. The first servo motor 205 is mounted on the fixed plate 201, and the output end of the second stainless steel plate 204 is fixedly connected to one of the double toothed rollers 202.

[0021] In practical application, this embodiment uses a first servo motor 205 on a drive plate 201 to rotate one of the double-toothed rollers 202, which in turn drives the conveyor belt composed of a first stainless steel plate 203 and a second stainless steel plate 204 to achieve the effect of transporting capacitor discs.

[0022] In one embodiment, the first stainless steel plate 203 and the second stainless steel plate 204 in the transport assembly 2 are made of stainless steel.

[0023] like Figure 4 and Figure 7 As shown, in another preferred embodiment of the present invention, the visual detection component 3 includes: Screw 301, screw 301 is threaded into machining box 1; The bottom end of the connecting plate 302 is rotatably engaged with the screw 301; A high-resolution industrial camera 303 is mounted on a connecting plate 302; A high-sensitivity sensor 304 is mounted on a connecting plate 302 and is located on one side of a high-resolution industrial camera 303. Auxiliary rods 305, both auxiliary rods 305 are slidably fitted with processing box 1, and both auxiliary rods 305 are connected to connecting plate 302; Turntable 306 is mounted on the top of screw 301; Lighting lamp 307 is installed on the top of the inner wall of the processing box 1.

[0024] In practical application, this embodiment involves manually rotating the turntable 306 to rotate the screw 301 on the processing box 1. This, along with two auxiliary rods 305, adjusts the height of the high-resolution industrial camera 303 and high-sensitivity sensor 304 at the bottom of the connecting plate 302. The high-resolution industrial camera 303 and high-sensitivity sensor 304 then transmit the captured images to the display screen in the work area in real time for workers to view. This ensures clear capture of the surface details of the capacitor wafers even under complex lighting conditions. Simultaneously, the lighting lamp 307 illuminates the space inside the processing box 1, enhancing the visual inspection effect.

[0025] In one embodiment, the high-sensitivity sensor 304 can be a CMOS or a CCD, which provides better detection performance.

[0026] like Figure 1-3 As shown, in another preferred embodiment of the present invention, the classification component 5 includes: The electric telescopic rods 501 are all installed on the processing box 1, and the two electric telescopic rods 501 are located on both sides of the second servo motor 401. Push plate 507 is installed on the piston rod of electric telescopic rod 501; The first discharge port 502 is located on the side of the processing box 1 away from the electric telescopic rod 501; The second discharge port 503 is located at the end of the processing box 1 away from the fixed plate 201; Guide plates 504 are respectively installed inside the first discharge port 502 and the second discharge port 503; The defective material boxes 505 are all installed on the processing box 1, and the defective material boxes 505 are located below the first discharge port 502; The qualified material box 506 is installed between the bottom legs of the processing box 1, and the qualified material box 506 is located below the guide plate 504.

[0027] In practical application, the visual inspection component 3 inspects one side of the capacitor discs on the conveyor belt. If minor defects such as scratches, stains, or cracks are found, the electric telescopic rod 501 is driven to move the push plate 507 quickly, passing the capacitor discs on the conveyor belt through the first discharge port 502 and collecting them into the defective material box 505 with the help of the guide plate 504. If there are no minor defects on both sides of the capacitor discs, they are finally collected into the qualified material box 506 through the guide plate 504 on the second discharge port 503. This allows for the separate storage of capacitor discs, facilitating the optimization of subsequent production processes.

[0028] like Figure 4-6 As shown, in another preferred embodiment of the present invention, the reset component 6 includes: The second slide rod 601 slides in contact with the inner wall of the processing box 1; Top block 602 is installed between the tops of multiple second slide bars 601; The preload springs 603 are all sleeved on the outside of the second slide rod 601, and the preload springs 603 are located between the top block 602 and the processing box 1; A pull plate 604 is installed between the bottom ends of multiple second slide bars 601.

[0029] In practical application, when the flap 411 is opened by the push rod 409, some flaps 411 may fail to reset. When the flap 411 moves to the bottom along the movement trajectory of the conveyor belt, the top block 602 squeezes the flap 411 with the help of the elastic force of the pre-tension spring 603. The flap 411 abuts against the baffle 412, pushing the flap into the square groove, thus completing the reset operation of the flap, so as to facilitate subsequent transportation work.

[0030] like Figure 2 As shown, in another preferred embodiment of the present invention, the bottom cleaning component 7 includes: The slot 701 is formed on one side of the inner wall of the machining box 1, and the slot 701 is located below the second servo motor 401; The door 702 is fitted with the slot 701, and a sealing strip is provided around the inside of the door 702.

[0031] In practical applications, when the equipment operates for a long time, some dust may accumulate on the bottom of the inner side of the processing box 1. The box door 702 can be opened, and the bottom of the inner wall of the processing box 1 can be cleaned through the slot 701 using a cleaning tool.

[0032] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A comprehensive defect detection device for capacitor wafers, characterized in that: include: The processing box (1) is used as a mounting carrier for the transport component (2), the visual inspection component (3), the flipping component (4), the sorting component (5), the reset component (6), and the cleaning component (7); Transport assembly (2) is used for transporting capacitor discs; The visual inspection component (3) is used to inspect and process the capacitor discs; The flipping assembly (4) is used to flip the capacitor discs. The flipping component (4) includes: The second servo motor (401) is installed on the outside of the machining box (1); The connecting rod (402) is mounted on the output shaft of the second servo motor (401); The bracket (403) is installed between the inner walls of the processing box (1); The square rods (404) are all mounted on the brackets (403); A sliding plate (405) is slidably engaged with two square rods (404); A groove (406) is formed inside the slide (405); A cam (407) is mounted on the end of the connecting rod (402) away from the second servo motor (401); The first slide rod (408) is installed on the side of the cam (407) away from the connecting rod (402), and the first slide rod (408) slides in cooperation with the slide groove (406); The top rod (409) is mounted on the slide plate (405).

2. The capacitor wafer comprehensive defect detection equipment according to claim 1, characterized in that, The transport component (2) includes: Two fixing plates (201) are installed at one end of the processing box (1), and the two fixing plates (201) are located on both sides of the feed port provided in the processing box (1); Two double-toothed rollers (202) rotate between two fixed plates (201) and the inner wall of the processing box (1), respectively; First stainless steel plate (203); The second stainless steel plate (204) is combined with multiple first stainless steel plates (203) and second stainless steel plates (204) to form a conveyor belt, and the two double toothed rollers (202) are connected by the conveyor belt drive. The first servo motor (205) is mounted on the fixed plate (201), and the output end of the second stainless steel plate (204) is fixedly connected to one of the double toothed rollers (202).

3. The capacitor wafer comprehensive defect detection equipment according to claim 2, characterized in that, The flipping assembly (4) also includes: Square channels (410) are all formed on the first stainless steel plate (203); The flap (411) rotates inside the square groove (410); A baffle (412) is installed on one side inside the square groove (410), and the baffle (412) abuts against the flap (411); A magnet (413) is installed on one side inside the square groove (410) and above the baffle (412); An arc-shaped iron plate (414) is installed on one end of a flip plate (411), and the arc-shaped iron plate (414) and the magnet (413) are attracted to each other; Rubber pads (415) are all installed on the second stainless steel plate (204).

4. The capacitor wafer comprehensive defect detection equipment according to claim 1, characterized in that, The visual inspection component (3) includes: The screw (301) is threadedly engaged with the machining box (1); A connecting plate (302) is provided, the bottom end of which is rotatably engaged with a screw (301); A high-resolution industrial camera (303) is mounted on a connecting plate (302); A high-sensitivity sensor (304) is mounted on a connecting plate (302), and the high-sensitivity sensor (304) is located on one side of a high-resolution industrial camera (303); Auxiliary rods (305), both of which are slidably fitted with the processing box (1), and both of which are connected to the connecting plate (302); A turntable (306) is mounted on the top of a screw (301); Lighting lamp (307) is installed on the top of the inner wall of the processing box (1).

5. The capacitor wafer comprehensive defect detection equipment according to claim 2, characterized in that, The classification component (5) includes: Electric telescopic rods (501) are all installed on the processing box (1), and the two electric telescopic rods (501) are located on both sides of the second servo motor (401); Push plate (507) is installed on the piston rod of electric telescopic rod (501); The first discharge port (502) is located on the side of the processing box (1) away from the electric telescopic rod (501); The second discharge port (503) is located at the end of the processing box (1) away from the fixed plate (201); Guide plates (504) are respectively installed inside the first discharge port (502) and the second discharge port (503); The defective material boxes (505) are all installed on the processing box (1), and the defective material boxes (505) are located below the first discharge port (502); A qualified material box (506) is installed between the bottom legs of the processing box (1), and the qualified material box (506) is located below the guide plate (504).

6. The capacitor wafer comprehensive defect detection equipment according to claim 1, characterized in that, The reset component (6) includes: The second slide rod (601) slides in contact with the inner wall of the processing box (1); A top block (602) is installed between the tops of a plurality of second slide bars (601); The preload springs (603) are all sleeved on the outside of the second slide bar (601), and the preload springs (603) are located between the top block (602) and the processing box (1); A pull plate (604) is installed between the bottom ends of a plurality of second slide bars (601).

7. The capacitor wafer comprehensive defect detection equipment according to claim 1, characterized in that, The bottom-cleaning component (7) includes: The slot (701) is opened on one side of the inner wall of the processing box (1), and the slot (701) is located below the second servo motor (401); The box door (702) is matched with the slot (701), and a sealing strip is provided around the inside of the box door (702).

Images