Circuit board test fixture

Abstract

The embodiment of the application provides a kind of circuit board test fixture, it is related to circuit board test technical field.The circuit board test fixture includes first carrier plate, second carrier plate, first test component, second test component, to be measured board fixed component and drive component.First test component, to be measured board fixed component and second test component are arranged along the first direction, to be measured board fixed component is located between first test component and second test component.First test component is fixedly connected with first carrier plate, second carrier plate is slidably connected with first carrier plate, to be measured board fixed component is fixedly connected with second carrier plate, second test component is slidably connected with second carrier plate.Drive component is used to drive second carrier plate and second test component to slide along the first direction, to make first test component and second test component butt joint with circuit board in test position.In this way, the risk of circuit board damage when testing the circuit board with interface arranged on both sides can be reduced.

Description

Technical Field

[0001] This application relates to the field of circuit board testing technology, and in particular to a circuit board testing fixture. Background Technology

[0002] Circuit boards such as server motherboards, power supply backplanes, hard drive backplanes, and expansion boards need to be tested before assembly. Circuit board testing is often performed using circuit board test fixtures.

[0003] In related technologies, circuit board test fixtures may include a download board and an upper pressure plate. The circuit board placed on the download board is tested by pressing down on the upper pressure plate.

[0004] However, in related technologies, there is a high risk of damage to circuit boards when testing those with interfaces on both sides. Summary of the Invention

[0005] This application provides a circuit board test fixture that can reduce the risk of circuit board damage when testing circuit boards with interfaces on both sides.

[0006] This application provides a circuit board test fixture, which includes a first carrier board, a second carrier board, a first test component, a second test component, a board under test (DUT) fixing component, and a drive component. The second carrier board, the first test component, the second test component, and the DUT fixing component are disposed on the same side of the first carrier board in the thickness direction.

[0007] The first test component, the board under test fixing component, and the second test component are arranged along the first direction. The board under test fixing component is located between the first test component and the second test component. The board under test fixing component is used to fix the circuit board. The first test component and the second test component are used to test the circuit board.

[0008] The first test component is fixedly connected to the first carrier plate, the second carrier plate is slidably connected to the first carrier plate, the test board fixing component is fixedly connected to the second carrier plate, and the second test component is slidably connected to the second carrier plate.

[0009] The driving component is used to drive the second carrier board and the second test component to slide along a first direction so that the first test component and the second test component are docked with the circuit board at the test position.

[0010] The circuit board test fixture provided in this application first fixes the circuit board to the board under test fixing component when the circuit board needs to be tested. Then, the second carrier board and the second test component are driven to slide along the first direction by the driving component to make the circuit board dock with the first test component and the second test component. Then, the first test component and the second test component are powered on to test the circuit board.

[0011] In this way, the first test component and the second test component are connected to the circuit board from both sides of the circuit board. The connection process between the two sides of the circuit board and the first and second test components is easy to observe, making it less likely to damage the circuit board due to misalignment.

[0012] In some possible implementations, the drive component includes a first drive component and a second drive component.

[0013] The first driving component is fixedly disposed on the first carrier plate and connected to the second carrier plate. The first driving component is used to drive the second carrier plate to slide along the first direction between the first test position and the first exit position. The second carrier plate that slides to the first test position is used to dock the circuit board with the first test component. The second carrier plate that slides to the first exit position is used to disconnect the circuit board from the first test component.

[0014] The second driving component is fixedly mounted on the second carrier board. The second driving component is connected to the second test component. The second driving component is used to drive the second test component to slide along the first direction between the second test position and the second exit position. The second test component that slides to the second test position is used to dock the second test component with the circuit board. The second test component that slides to the second exit position is used to disconnect the second test component from the circuit board.

[0015] When a circuit board needs to be tested, after the circuit board is fixed to the board under test fixing assembly, the second carrier board can be driven from the first exit position to the first test position by the first driving component, so that the side of the circuit board facing the first test assembly is connected to the first test assembly. Then, the second test assembly can be driven from the second exit position to the second test position by the second driving component, so that the side of the circuit board facing the second test assembly is connected to the second test assembly, thereby completing the connection between the circuit board and the first and second test assemblies.

[0016] After the circuit board is tested, the first test component and the second test component are powered down. Then, the second test component is driven by the second drive component to move from the second test position to the second exit position so that the side of the circuit board facing the second test component is disconnected from the second test component. Then, the second carrier board is driven by the first drive component to move from the first test position to the first exit position so that the side of the circuit board facing the first test component is disconnected from the first test component. Finally, the circuit board is removed from the board under test fixing component.

[0017] This facilitates the docking of the circuit board with the first and second test components, as well as the disconnection of the circuit board from the first and second test components.

[0018] In addition, the circuit board can be sequentially connected to the first test component and the second test component through the first driving component and the second driving component, and can be sequentially disconnected from the second test component and the first test component through the second driving component and the first driving component, which can reduce the driving force of the first driving component and the second driving component in a single drive, making the circuit board less prone to deformation or damage due to excessive force.

[0019] In addition, the circuit board can be sequentially docked with the first test component and the second test component through the first driving component and the second driving component, and can be sequentially disconnected from the second test component and the first test component through the second driving component and the first driving component, which facilitates the control of the driving force applied by the first driving component and the second driving component, and makes it easy to achieve reliable and safe docking between the circuit board and the circuit board test fixture.

[0020] In addition, during the process of the circuit board test fixture docking with the circuit board, the driving directions of the first driving component and the second driving component are consistent, and during the process of the circuit board test fixture disengaging from the circuit board, the driving directions of the first driving component and the second driving component are consistent. This means that the first driving component and the second driving component do not need to be arranged on both sides of the board-to-test fixing assembly, which helps to reduce the size of the circuit board test fixture in the first direction, so as to facilitate the arrangement of multiple circuit board test fixtures on one platform.

[0021] In some possible implementations, along the first direction, the first driving component is located on the side of the test board fixing assembly away from the first test assembly, and the second driving component is located on the side of the second test assembly away from the test board fixing assembly.

[0022] In this way, the first and second driving components are centrally located on the same side of the board-under-test (TBT) fixing assembly. This allows the first and second driving components to reuse space in the first direction, reducing the size of the circuit board test fixture in that direction and consequently lowering its development cost. Furthermore, the central location of the first and second driving components on the same side of the TDT fixing assembly also minimizes interference with other components located on the other side of the TDT fixing assembly, facilitating the placement of components on that side.

[0023] In some possible implementations, the test board fixing assembly has a first guide hole at both ends in the second direction, a first guide post is inserted in the first guide hole, the first guide post extends along the first direction, the first guide post is fixedly connected to the first carrier plate through a support member, the first guide post is slidably connected to the hole wall of the first guide hole, and the first guide post is used to guide the test board fixing assembly to slide along the first direction.

[0024] In this way, the sliding fit between the first guide hole and the first guide post improves the motion stability of the board under test fixing assembly, making it less likely for the board under test fixing assembly to shift, thereby improving the docking accuracy between the circuit board and the circuit board test fixture, and making the circuit board and the circuit board test fixture less likely to be damaged due to docking misalignment.

[0025] In some possible implementations, the circuit board test fixture further includes an insertion anti-fooling component, which includes a first abutment, a first locking element, and a first elastic element.

[0026] The first abutment is fixedly connected to the first carrier plate. The first locking member is slidably connected to the second carrier plate. The first locking member can slide relative to the second carrier plate along the thickness direction of the first carrier plate. The first elastic member is disposed between the first locking member and the second carrier plate. The first elastic member is used to make the first locking member abut against the surface of the first abutment member facing the second carrier plate. The first locking member can move along the surface of the first abutment member facing the second carrier plate.

[0027] The surface of the first abutment member facing the second carrier plate includes a first abutment portion and a second abutment portion, which are arranged along a first direction. The distance between the first abutment portion and the second carrier plate is smaller than the distance between the second abutment portion and the second carrier plate. The first abutment portion and the second abutment portion are connected by an inclined surface. The second test assembly has a first locking structure. A first locking member abuts against the first abutment portion when the second carrier plate is in the first retracted position, so that the first locking member passes through the first locking structure, thereby locking the second test assembly and the second carrier plate. The first locking member is also used to abut against the second abutment portion after the second carrier plate slides to the first test position, so that the first locking member is outside the first locking structure, thereby releasing the lock between the second test assembly and the second carrier plate.

[0028] In this way, the first locking member is driven by the first elastic element to abut against the surface of the first abutment member. When the second carrier plate slides relative to the first carrier plate, the first locking member can move along the surface of the first abutment member between the first abutment portion and the second abutment portion. When the second carrier plate is in the first retraction position, the first locking member abuts against the first abutment portion closer to the second carrier plate, allowing the first locking member to pass through the first locking structure and locking the second test assembly to the second carrier plate. When the second carrier plate slides to the first test position, the first locking member abuts against the second abutment portion farther from the second carrier plate, causing the first locking member to move out of the first locking structure and releasing the lock between the second test assembly and the second carrier plate. Thus, after the first driving component moves the second carrier plate to the first test position, the second driving component can drive the second test assembly to move from the second retraction position to the second test position. This ensures the correctness of the operation sequence during the circuit board and circuit board test fixture docking stage, making it less prone to misoperation during the circuit board and circuit board test fixture docking stage, and facilitating reliable and safe docking of the circuit board and circuit board test fixture. In addition, the insertion error prevention is achieved through mechanical components, and the insertion error prevention component does not require power, making the setting and operation of the insertion error prevention component safer and more reliable.

[0029] In some possible implementations, the first abutment is fixedly connected to the side of the first carrier plate opposite to the second carrier plate. The first carrier plate has a first clearance structure, the second carrier plate has a first through hole, and the first locking member passes through the first clearance structure and the first through hole. The first clearance structure is used to allow the first locking member to move relative to the first carrier plate in a first direction, and the first through hole is used to allow the first locking member to move relative to the second carrier plate in the thickness direction of the first carrier plate.

[0030] This facilitates the arrangement of the insertion of the error-proof components, making the circuit board test fixture more compact and smaller in size.

[0031] In some possible implementations, the circuit board test fixture further includes an exit foolproof assembly, which includes a second abutment, a second locking element, and a second elastic element.

[0032] The second abutment is fixedly connected to the second test assembly, and the second locking member is slidably connected to the first carrier plate. The second locking member can slide relative to the first carrier plate along the thickness direction of the first carrier plate. The second elastic member is disposed between the second locking member and the first carrier plate. The second elastic member is used to make the second locking member abut against the surface of the second abutment member away from the second test assembly. The second locking member can move along the surface of the second abutment member away from the second test assembly.

[0033] The second abutment member has a surface on the side opposite to the second test assembly, including a third abutment portion and a fourth abutment portion. The third and fourth abutment portions are arranged along a first direction. The distance between the third abutment portion and the second carrier plate is smaller than the distance between the fourth abutment portion and the second carrier plate. The third and fourth abutment portions are connected by an inclined surface. The second carrier plate has a second locking structure. A second locking member abuts against the third abutment portion when the second test assembly is in the second test position, so that the second locking member passes through the second locking structure, thereby locking the second carrier plate to the first carrier plate. The second locking member also abuts against the fourth abutment portion after the second test assembly slides to the second exit position, so that the second locking member is outside the second locking structure, thereby releasing the lock between the second carrier plate and the first carrier plate.

[0034] In this way, the second locking member is driven by the second elastic element to abut against the surface of the second abutment member. When the second test assembly slides on the second carrier plate, the second locking member can move along the surface of the second abutment member between the third abutment portion and the fourth abutment portion. When the second test assembly is in the second test position, the second locking member abuts against the third abutment portion closer to the second carrier plate, allowing the second locking member to pass through the second locking structure and locking the first carrier plate and the second carrier plate. When the second test assembly slides to the second exit position, the second locking member abuts against the fourth abutment portion farther from the second carrier plate, causing the second locking member to move out of the second locking structure and releasing the lock between the first carrier plate and the second carrier plate. Thus, after the second driving component moves the second test assembly to the second exit position, the first driving component can drive the second carrier plate to move from the first test position to the first exit position. This ensures the correctness of the operation sequence during the disengagement phase of the circuit board and the circuit board test fixture, making it less prone to misoperation during the disengagement phase and facilitating reliable and safe disengagement of the circuit board and the circuit board test fixture. In addition, the deactivation of the foolproof mechanism is achieved through mechanical components, and the deactivation component does not require power, making the setting and operation of the deactivation component safer and more reliable.

[0035] In some possible implementations, the third and fourth abutting portions are located on the side of the first carrier plate away from the second carrier plate. The second carrier plate has a second clearance structure, and the first carrier plate has a third clearance structure. The second abutting member passes through the second and third clearance structures. The second clearance structure allows the second abutting member to move relative to the second carrier plate in a first direction, and the third clearance structure allows the second abutting member to move relative to the first carrier plate in the first direction. The first carrier plate also has a second through hole, and a second locking member passes through the second through hole. The second through hole allows the second locking member to move relative to the first carrier plate in the thickness direction of the first carrier plate.

[0036] This facilitates the arrangement of the exit error-proof components, allowing for a more compact structure and smaller size of the circuit board test fixture.

[0037] In some possible implementations, the circuit board test fixture further includes a test mis-proofing component and a power supply control component. The power supply control component is electrically connected to the first test component and the second test component, and is used to control the power-on and power-off of the first and second test components. The test mis-proofing component is electrically connected to the power supply control component to enable signal interaction between the two components. When the first and second test components are powered on, the test mis-proofing component restricts the movement of the second test component relative to the second carrier board from a second test position to a second exit position. The test mis-proofing component is also used to release the restriction on the relative movement of the second test component and the second carrier board when the first and second test components are powered off.

[0038] In this way, the test error prevention component can be controlled by the power supply control component used to control the power-on and power-off of the first test component and the second test component, realizing the linkage between the test error prevention component and the power-on and power-off of the first test component and the second test component. This allows for a quick and accurate response based on the timing of the power-on and power-off of the first test component and the second test component, thereby achieving rapid and accurate control of the test error prevention component. This helps ensure the correctness of the circuit board testing process operation sequence and reduces the likelihood of problems such as damage to the circuit board or circuit board testing fixture, as well as operator injury, caused by the circuit board disengaging from the first test component and the second test component when they are powered on for circuit board testing.

[0039] In some possible implementations, the test mis-proofing component includes a fixed member and a movable member. The fixed member is fixedly connected to the side of the second carrier plate facing the first carrier plate, and the movable member is slidably connected to the second carrier plate, allowing the movable member to slide relative to the second carrier plate along the thickness direction of the first carrier plate. The test mis-proofing component is used to restrict movement of the second test component relative to the second carrier plate from the second test position to the second retraction position when the first and second test components are powered on, by positioning a portion of the movable member on the path of movement of the second test component relative to the second carrier plate from the second test position to the second retraction position.

[0040] The test error prevention component is also used to position the movable part on the side of the second test assembly along the thickness direction of the first carrier plate when the first test assembly and the second test assembly are powered down.

[0041] In this way, the cooperation between the fixed and moving parts facilitates the implementation of the error-proof testing function.

[0042] In some possible implementations, the circuit board test fixture further includes a position detection device. The position detection device is fixedly mounted on the second carrier board and is used to detect whether the second test component is in the second test position.

[0043] In this way, feedback from the position detection device can determine whether the circuit board test fixture and the circuit board are properly aligned. This facilitates the timing of powering on and off the first and second test components, reducing the risk of misoperation and ensuring the reliability of the testing process. It also minimizes the risk of damage to the circuit board or test fixture, or injury to operators, caused by inaccurate power-on / off timing of the first and second test components. Furthermore, the feedback from the position detection device enhances the automation level of the circuit board test fixture. Attached Figure Description

[0044] Figure 1 A schematic diagram of a circuit board test fixture provided in an embodiment of this application;

[0045] Figure 2 for Figure 1 Another schematic diagram of the circuit board test fixture provided in the diagram;

[0046] Figure 3 for Figure 1 Another schematic diagram of the circuit board test fixture provided in the document;

[0047] Figure 4 A schematic diagram of a test board fixing assembly provided in an embodiment of this application;

[0048] Figure 5 for Figure 4 An exploded view of the test board fixing assembly provided in the diagram;

[0049] Figure 6 A schematic diagram of a second test component provided in an embodiment of this application;

[0050] Figure 7 for Figure 1 Another schematic diagram of the circuit board test fixture provided in the document;

[0051] Figure 8 A schematic diagram of a circuit board test fixture at the insertion point of a foolproof component, provided in an embodiment of this application;

[0052] Figure 9 for Figure 8 Another schematic diagram of the circuit board test fixture provided in the diagram at the insertion point of the foolproof component;

[0053] Figure 10 for Figure 9 A schematic diagram of the cross-section of plane aa;

[0054] Figure 11 A schematic cross-sectional view of a circuit board test fixture provided in an embodiment of this application when the second carrier board is in the first retraction position;

[0055] Figure 12 A schematic cross-sectional view of a circuit board test fixture provided in an embodiment of this application when the second carrier board is in the first test position;

[0056] Figure 13 A schematic diagram of a circuit board test fixture at the point of exiting the foolproof assembly, provided in an embodiment of this application;

[0057] Figure 14 for Figure 13 Another schematic diagram of the circuit board test fixture provided in the diagram at the point of exiting the foolproof assembly;

[0058] Figure 15 for Figure 14 A schematic diagram of the cross-section of the middle bb surface;

[0059] Figure 16 A cross-sectional schematic diagram of a circuit board test fixture provided in an embodiment of this application when the second test component is in the second test position;

[0060] Figure 17 A schematic cross-sectional view of a circuit board test fixture provided in this application when the second test component is in the second retracted position;

[0061] Figure 18 A schematic diagram of yet another circuit board test fixture provided in an embodiment of this application;

[0062] Figure 19 A schematic diagram of a test error prevention component provided in an embodiment of this application;

[0063] Figure 20 A schematic diagram of a first carrier plate provided in an embodiment of this application;

[0064] Figure 21 This is a schematic diagram of a second carrier plate provided in an embodiment of this application.

[0065] Explanation of reference numerals in the attached figures:

[0066] 100. First test component; 110. First fixing component; 120. First test probe plate;

[0067] 200. Second test component; 210. Second fixing component; 211. First fixing sub-part; 212. Second fixing sub-part; 220. Second test pin plate; 221. First test sub-plate; 222. Second test sub-plate; 230. Trigger component; 231. First trigger part; 232. Second trigger part;

[0068] 300. Test board fixing assembly; 310. Third fixing component; 320. Insert plate; 321. Fixing plate; 322. Reinforcing frame; 330. Guide component;

[0069] 400. Driver components;

[0070] 410. First driving component; 411. Driving unit; 411a. First driving unit; 411b. Second driving unit; 4111. First fixed base; 4112. First operating handle; 4113. First transmission mechanism; 4114. First pressure arm; 412. Synchronizing element;

[0071] 420. Second drive component; 421. Second fixed base; 422. Second operating handle; 423. Second transmission mechanism; 424. Second pressure arm;

[0072] 500. Insertion anti-foolproof component; 510. First abutting member; 511. First abutting part; 512. Second abutting part; 520. First locking member; 521. First locking post; 522. First connecting seat; 523. First roller; 530. First elastic member; 540. Second guide post;

[0073] 600. Deactivation of the foolproof assembly; 610. Second abutment; 611. Third abutment; 612. Fourth abutment; 620. Second locking element; 621. Second locking pin; 6211. First pin segment; 6212. Second pin segment; 622. Third connecting seat; 623. Second roller; 630. Second elastic element; 640. Second connecting seat;

[0074] 700. Test for foolproof components; 710. Fasteners; 720. Moving parts;

[0075] 810. Position detection device; 820. Power supply control components;

[0076] 910. Support component; 920. First guide post;

[0077] B1, First carrier plate; B2, Second carrier plate;

[0078] H1, First guide hole; H2, First through hole; H3, Second through hole; H4, Third through hole; H5, First connecting hole;

[0079] N1, First obstacle avoidance structure; N2, Second obstacle avoidance structure; N3, Third obstacle avoidance structure; N4, Fourth obstacle avoidance structure;

[0080] S1, First locking structure; S2, Second locking structure;

[0081] P1, First sliding channel;

[0082] G1, slot; G11, guide section; G12, limit section;

[0083] x, first direction; y, second direction; z, thickness direction of the first carrier plate;

[0084] U, Test Subunit; U1, First Test Subunit; U2, Second Test Subunit. Detailed Implementation

[0085] The terminology used in the implementation section of this application is only for explaining specific embodiments of this application and is not intended to limit this application. The implementation of the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0086] In the design of electronic devices such as servers, the increasingly complex functional requirements of circuit boards such as motherboards, hard drive backplanes, power supply backplanes, and expansion boards necessitate the placement of a large number of interfaces and other components on the board surface. Due to the overall size constraints of electronic devices, the area of ​​the circuit board is strictly limited. Therefore, double-sided placement has become a solution for placing a large number of interfaces and other components when the circuit board area is limited.

[0087] Circuit boards need to be tested before assembly, and this testing is often done using circuit board test fixtures. For circuit boards with a large number of interfaces and other components on both sides, the circuit board test fixture needs to mate with the interfaces on both sides of the circuit board. In other words, the circuit board test fixture needs to mate with the interfaces on the top and bottom sides of the circuit board to enable testing on both sides of the circuit board.

[0088] This application provides a circuit board test fixture that can be used to test circuit boards with interfaces and other components on both sides.

[0089] Figure 1 This is a schematic diagram of a circuit board test fixture provided in an embodiment of this application. Figure 2 for Figure 1 Another schematic diagram of the circuit board test fixture provided. Figure 3 for Figure 1 This is another schematic diagram of the circuit board test fixture provided. Among them, Figure 1 This is a schematic diagram showing the first test component 100 and the second test component 200 both in a position where they are disconnected from the circuit board. Figure 2 This diagram illustrates the first test component 100 being disconnected from the circuit board and the second test component 200 being connected to the circuit board. Figure 3This is a schematic diagram showing the first test component 100 and the second test component 200 both positioned in contact with the circuit board. The x-direction is the first direction, the y-direction is the second direction, and the z-direction is the thickness direction of the first carrier board B1. The first and second directions can be perpendicular to the thickness direction of the first carrier board B1, and the first direction can be perpendicular to the second direction. For example, the x-direction can be left-right, the y-direction can be front-back, and the z-direction can be up-down.

[0090] like Figures 1-3 As shown in the embodiments of this application, the circuit board test fixture includes a first carrier board B1, a second carrier board B2, a first test component 100, a second test component 200, a board-to-test fixing component 300, and a driving component 400.

[0091] The second carrier plate B2, the first test component 100, the second test component 200, and the test plate fixing component 300 are located on the same side of the thickness direction of the first carrier plate B1.

[0092] The first test component 100, the board under test fixing component 300, and the second test component 200 are arranged along a first direction, with the board under test fixing component 300 located between the first test component 100 and the second test component 200. The board under test fixing component 300 is used to fix the circuit board, and the first test component 100 and the second test component 200 are used to test the circuit board.

[0093] The first test component 100 is fixedly connected to the first carrier board B1, the second carrier board B2 is slidably connected to the first carrier board B1, the board under test fixing component 300 is fixedly connected to the second carrier board B2, the second test component 200 is slidably connected to the second carrier board B2, and the driving component 400 is used to drive the second carrier board B2 and the second test component 200 to slide along a first direction so that the first test component 100 and the second test component 200 are docked with the circuit board at the test position.

[0094] When testing the circuit board, the circuit board is first fixed to the test board fixing assembly 300. Then, the driving assembly 400 drives the second carrier board B2 and the second test assembly 200 to slide along a first direction, so that the circuit board mates with the first test assembly 100 and the second test assembly 200. Specifically, the driving assembly 400 drives the interface on the surface of the circuit board facing the first test assembly 100 to mate with the interface of the first test assembly 100, and the interface on the surface of the circuit board facing the second test assembly 200 to mate with the interface of the second test assembly 200. Then, the first test assembly 100 and the second test assembly 200 are powered on to test the circuit board.

[0095] In this way, the first test component 100 and the second test component 200 are connected to the circuit board from both sides of the circuit board, and the connection process between the two sides of the circuit board and the first test component 100 and the second test component 200 is easy to observe, making it less likely to damage the circuit board due to misalignment.

[0096] For example, the second carrier board B2 is slidable relative to the first carrier board B1 along a first direction between a first test position and a first withdrawal position. The second carrier board B2, slid to the first test position, is used to mate the circuit board with the first test assembly 100; the second carrier board B2, slid to the first withdrawal position, is used to disconnect the circuit board from the first test assembly 100. The second test assembly 200 is slidable relative to the second carrier board B2 along a first direction between a second test position and a second withdrawal position. The second test assembly 200, slid to the second test position, is used to mate with the circuit board; the second test assembly 200, slid to the second withdrawal position, is used to disconnect the second test assembly from the circuit board. Figure 1 In the middle, the second carrier board B2 is in the first exit position, and the second test component 200 is in the second exit position. Figure 2 In the middle, the second carrier board B2 is located in the first test position, and the second test component 200 is located in the second exit position. Figure 3 In the test, the second carrier board B2 is located at the first test position, and the second test component 200 is located at the second test position.

[0097] In some possible implementations, the drive component 400 includes a first drive component 410 and a second drive component 420.

[0098] The first driving component 410 is fixedly disposed on the first carrier plate B1. The first driving component 410 is connected to the second carrier plate B2. The first driving component 410 is used to drive the second carrier plate B2 to slide along the first direction between the first test position and the first exit position.

[0099] The second driving component 420 is fixedly disposed on the second carrier plate B2. The second driving component 420 is connected to the second test assembly 200. The second driving component 420 is used to drive the second test assembly 200 to slide along the first direction between the second test position and the second exit position.

[0100] When testing the circuit board, after fixing the circuit board to the test board fixing assembly 300, the first driving component 410 drives the second carrier board B2 from the first withdrawal position to the first test position, so that the side of the circuit board facing the first test assembly 100 mates with the first test assembly 100. That is, the interface of the circuit board facing the first test assembly 100 mates with the interface of the first test assembly 100. Then, the second driving component 420 drives the second test assembly 200 from the second withdrawal position to the second test position, so that the side of the circuit board facing the second test assembly 200 mates with the second test assembly 200. That is, the interface of the circuit board facing the second test assembly 200 mates with the interface of the second test assembly 200, thus completing the mating of the circuit board with the first test assembly 100 and the second test assembly 200.

[0101] After the circuit board is tested, the first test component 100 and the second test component 200 are powered off. Then, the second test component 200 is driven by the second drive component 420 to move from the second test position to the second exit position so that the side of the circuit board facing the second test component 200 is disconnected from the second test component 200. Then, the second carrier board B2 is driven by the first drive component 410 to move from the first test position to the first exit position so that the side of the circuit board facing the first test component 100 is disconnected from the first test component 100. Finally, the circuit board is removed from the board under test fixing component 300.

[0102] This facilitates the docking of the circuit board with the first test component 100 and the second test component 200, as well as the disconnection of the circuit board from the first test component 100 and the second test component 200.

[0103] Furthermore, the circuit board can be sequentially connected to the first test component 100 and the second test component 200 via the first driving component 410 and the second driving component 420, and can be sequentially disconnected from the second test component 200 and the first test component 100 via the second driving component 420 and the first driving component 410. This reduces the driving force of the first driving component 410 and the second driving component 420 in a single drive, making the circuit board less prone to deformation or damage due to excessive force.

[0104] In addition, the circuit board can be sequentially docked with the first test component 100 and the second test component 200 through the first drive component 410 and the second drive component 420, and can be sequentially disconnected from the second test component 200 and the first test component 100 through the second drive component 420 and the first drive component 410, which facilitates the control of the driving force applied by the first drive component 410 and the second drive component 420, and makes it easier to achieve reliable and safe docking between the circuit board and the circuit board test fixture.

[0105] In addition, during the process of the circuit board test fixture docking with the circuit board, the driving directions of the first driving component 410 and the second driving component 420 are consistent, and during the process of the circuit board test fixture disengaging from the circuit board, the driving directions of the first driving component 410 and the second driving component 420 are consistent. This means that the first driving component 410 and the second driving component 420 do not need to be arranged on both sides of the board under test fixing assembly 300, which helps to reduce the size of the circuit board test fixture in the first direction, so as to facilitate the arrangement of multiple circuit board test fixtures on one platform.

[0106] For example, the first carrier plate B1 and the second carrier plate B2 can be slidably connected by multiple slide rails extending along the first direction.

[0107] For example, the second carrier plate B2 and the second test component 200 can be slidably connected by multiple slide rails extending along the first direction.

[0108] In some possible implementations, the circuit board test fixture further includes a position detection device 810. The position detection device 810 is fixedly disposed on the second carrier board B2, and is used to detect whether the second test component 200 is in the second test position.

[0109] In this way, feedback from the position detection device 810 can determine whether the circuit board test fixture and the circuit board are in a properly aligned state. This facilitates the timing of powering on and off the first test component 100 and the second test component 200, reducing the risk of misoperation and ensuring the reliability of the testing process. It also minimizes the risk of damage to the circuit board or the circuit board test fixture, as well as operator injury, caused by inaccurate power-on / off timing of the first test component 100 and the second test component 200. Furthermore, feedback from the position detection device 810 helps improve the automation level of the circuit board test fixture.

[0110] For example, the position detection device 810 may include a micro switch that, after the second test component 200 moves to the second test position, can be pressed to generate a control signal indicating that the second test component 200 is in the second test position. After the second test component 200 moves away from the second test position, the pressure on the micro switch can be released to generate another control signal indicating that the second test component 200 is not in the second test position.

[0111] For example, the position detection device 810 may also include other sensors, such as photoelectric sensors.

[0112] In some possible implementations, along the first direction, the first driving component 410 is disposed on the side of the test board fixing assembly 300 away from the first test assembly 100, and the second driving component 420 is disposed on the side of the second test assembly 200 away from the test board fixing assembly 300.

[0113] In this way, the first driving component 410 and the second driving component 420 are centrally arranged on the same side of the board under test fixing assembly 300. The first driving component 410 and the second driving component 420 can reuse the space in the first direction, which helps to reduce the size of the circuit board test fixture in the first direction, and thus helps to reduce the development cost of the circuit board test fixture. In addition, the central arrangement of the first driving component 410 and the second driving component 420 on the same side of the board under test fixing assembly 300 also helps to reduce interference with other components arranged on the other side of the board under test fixing assembly 300, and facilitates the setting of components on the other side of the board under test fixing assembly 300.

[0114] In some possible implementations, the first driving component 410 includes two driving units 411 and a synchronizing element 412 arranged at a distance along a second direction, wherein one driving unit 411 is a first driving unit 411a and the other driving unit 411b is a second driving unit 411b. The first driving unit 411a and the second driving unit 411b are respectively located on both sides of the second test assembly 200 in the second direction, and the first driving unit 411a and the second driving unit 411b are connected by the synchronizing element 412, which is used to synchronize the operation of the first driving unit 411a and the second driving unit 411b. Along the second direction, the second driving component 420 is located between the first driving unit 411a and the second driving unit 411b.

[0115] In this way, the first driving unit 411a and the second driving unit 411b are respectively arranged on both sides of the second test assembly 200 in the second direction, making it less likely for the actions of the first driving unit 411a and the second driving unit 411b to interfere with each other. This facilitates the reuse of the action space in the first direction by the first driving component 410 and the second test assembly 200, and also facilitates the centralized layout of the first driving component 410 and the second driving component 420 on the same side of the test board fixing assembly 300. In addition, along the second direction, the second driving component 420 is located between the first driving unit 411a and the second driving unit 411b, making it less likely for the actions of the second driving component 420, which is centrally located on the same side of the test board fixing assembly 300, to interfere with each other. This also facilitates the centralized layout of the first driving component 410 and the second driving component 420 on the same side of the test board fixing assembly 300. Furthermore, the first driving unit 411a and the second driving unit 411b drive the second carrier plate B2 from both sides of the second test assembly 200 in the second direction, respectively. The driving force on the second carrier plate B2 at both ends in the second direction is relatively balanced, making it less prone to skewness. This facilitates precise docking between the circuit board test fixture and the circuit board, preventing damage to the circuit board and the circuit board test fixture due to misalignment. In addition, the synchronization of the first driving unit 411a and the second driving unit 411b through the synchronization component 412 improves the motion accuracy of the second carrier plate B2, making it less prone to skewness and facilitating precise docking between the circuit board test fixture and the circuit board. This also prevents damage to the circuit board and the circuit board test fixture due to misalignment.

[0116] For example, the drive unit 411 can be a quick clamp, and the synchronizing element 412 can be a synchronizing rod.

[0117] For example, the drive unit 411 includes a first fixed base 4111, a first operating handle 4112, a first transmission mechanism 4113, and a first pressure arm 4114. The first fixed base 4111 is fixedly disposed on the first carrier plate B1, and the first pressure arm 4114 extends along a first direction. The first pressure arm 4114 is slidably connected to the first fixed base 4111, and the first fixed base 4111 is used to guide the first pressure arm 4114 to slide relative to the first fixed base 4111 along the first direction. One end of the first pressure arm 4114 is connected to the second carrier plate B2. The first operating handle 4112 is rotatably connected to the first fixed base 4111. The first operating handle 4112 is driven to the other end of the first pressure arm 4114 via the first transmission mechanism 4113. The first transmission mechanism 4113 is used to convert the rotation of the first operating handle 4112 relative to the first fixed base 4111 into linear motion of the first pressure arm 4114 relative to the first fixed base 4111 in a first direction. This allows the first pressure arm 4114 to be driven to move linearly in the first direction by rotating the first operating handle 4112, thereby driving the second carrier plate B2 to move linearly in the first direction. The two ends of the synchronizing member 412 can be fixedly connected to the first operating handle 4112 of the first drive unit 411a and the first operating handle 4112 of the second drive unit 411b, respectively.

[0118] For example, the first operating handle 4112 is rotatable relative to the first fixed base 4111 about a rotation axis extending in a second direction.

[0119] For example, the first transmission mechanism 4113 can be a linkage mechanism or a gear and rack mechanism.

[0120] For example, the second test assembly 200 may include a plurality of test sub-units U arranged along a second direction. The test sub-units U are slidably connected to the second carrier plate B2, and the test sub-units U are capable of sliding relative to the second carrier plate B2 along a first direction between a second test position and a second exit position. The circuit board test fixture includes a plurality of second driving components 420 corresponding to the test sub-units U. The plurality of second driving components 420 are arranged along the second direction, and the second driving components 420 are connected to the corresponding test sub-units U. The second driving components 420 are used to drive the corresponding test sub-units U to slide between the second test position and the second exit position.

[0121] This reduces the driving force of each second driving component 420, facilitating the docking of the second test assembly 200 with the circuit board. Furthermore, the lower driving force of each second driving component 420 reduces the pressure on the circuit board during docking with the second test assembly 200, making the circuit board less prone to deformation or damage.

[0122] For example, each test subunit U can be slidably connected to the second carrier plate B2 via multiple slide rails extending along the first direction.

[0123] For example, the second drive component 420 can be a quick clamp.

[0124] For example, the dimension of the second driving component 420 in the first direction may be smaller than the dimension of the driving unit 411 in the first direction. The dimension of the second driving component 420 in the thickness direction of the first carrier plate B1 may be smaller than the dimension of the driving unit 411 in the thickness direction of the first carrier plate B1. For example, the second driving component 420 may be a smaller quick clamp, and the driving unit 411 may be a larger quick clamp.

[0125] For example, the second driving component 420 includes a second fixed base 421, a second operating handle 422, a second transmission mechanism 423, and a second pressure arm 424. The second fixed base 421 is fixedly disposed on the second carrier plate B2. The second pressure arm 424 extends along a first direction and is slidably connected to the second fixed base 421. The second fixed base 421 is used to guide the second pressure arm 424 to slide relative to the second fixed base 421 along the first direction. One end of the second pressure arm 424 is connected to the second test assembly 200. The second operating handle 422 is rotatably connected to the second fixed base 421. The second operating handle 422 is transmitted to the other end of the second pressure arm 424 through the second transmission mechanism 423. The second transmission mechanism 423 is used to convert the rotation of the second operating handle 422 relative to the second fixed base 421 into linear motion of the second pressure arm 424 relative to the second fixed base 421 along the first direction, so that the second pressure arm 424 can be driven to move linearly along the first direction by rotating the second operating handle 422, thereby driving the second test assembly 200 to move linearly along the first direction.

[0126] When the second test assembly 200 includes multiple test sub-units U arranged along the second direction, the second pressure arm 424 of the second drive component 420 is connected to the corresponding test sub-unit U, and the second pressure arm 424 of the second drive component 420 is used to drive the corresponding test sub-unit U to move linearly along the first direction.

[0127] For example, the second operating handle 422 is rotatable relative to the second fixed base 421 about a rotation axis extending along the thickness direction of the first substrate B1.

[0128] For example, the second transmission mechanism 423 can be a linkage mechanism or a gear and rack mechanism.

[0129] In some examples, the first test assembly 100 includes a first fixing component 110 and a first test probe plate 120. The first fixing component 110 is fixedly connected to the first carrier board B1, and the first test probe plate 120 is detachably connected to the side of the first fixing component 110 facing the board under test fixing assembly 300. The first test probe plate 120 is used to mate with the circuit board fixedly disposed on the board under test fixing assembly 300 to realize the testing of the circuit board.

[0130] In this way, different circuit boards can be tested by replacing the first test pin plate 120, making the circuit board test fixture more versatile.

[0131] For example, when the first driving component 410 drives the second carrier plate B2 from the first withdrawal position to the first test position, for instance, when the first operating handle 4112 is rotated forward to cause the first pressure arm 4114 to move linearly in the first direction, thereby moving the second carrier plate B2 from the first withdrawal position to the first test position, the side of the circuit board facing the first test assembly 100 mates with the first test probe plate 120. After the side of the circuit board facing the second test assembly 200 mates with the second test assembly 200, the first test probe plate 120 and the second test assembly 200 are powered on.

[0132] After the circuit board is tested, the first test pin plate 120 and the second test assembly 200 are powered off. When the first drive component 410 drives the second carrier plate B2 from the first test position to the first exit position, for example, when the first pressure arm 4114 moves linearly in the first direction by rotating the first operating handle 4112 in the opposite direction to move the second carrier plate B2 from the first test position to the first exit position, the side of the circuit board facing the first test assembly 100 is disengaged from the first test pin plate 120.

[0133] Figure 4 This is a schematic diagram of a test board fixing assembly provided in an embodiment of this application.

[0134] like Figure 3 , Figure 4 As shown, in some possible embodiments, the test board fixing assembly 300 has a first guide hole H1 at both ends in the second direction. A first guide post 920 is inserted into the first guide hole H1. The first guide post 920 extends along the first direction. The first guide post 920 is fixedly connected to the first carrier plate B1 through the support member 910. The first guide post 920 is slidably connected to the hole wall of the first guide hole H1. The first guide post 920 is used to guide the test board fixing assembly 300 to slide along the first direction.

[0135] In this way, the sliding cooperation between the first guide hole H1 and the first guide post 920 improves the motion stability of the board under test fixing assembly 300, making it less likely for the board under test fixing assembly 300 to deviate, thereby improving the docking accuracy of the circuit board and the circuit board test fixture, and making the circuit board and the circuit board test fixture less likely to be damaged due to docking misalignment.

[0136] For example, the portion of the test board fixing assembly 300 away from the second carrier plate B2 has a first guide hole H1, so that when the first driving component 410 drives the second carrier plate B2 to move the test board fixing assembly 300, the test board fixing assembly 300 is less likely to deflect due to uneven force on both sides of the first carrier plate B1 in the thickness direction.

[0137] For example, the test board fixing assembly 300 has multiple first guide holes H1 arranged along the thickness direction of the first carrier plate B1 at both ends in the second direction. Each first guide hole H1 is provided with a first guide post 920, so that the test board fixing assembly 300 is not prone to deflection due to uneven force on both sides of the thickness direction of the first carrier plate B1.

[0138] For example, the first guide post 920 and the support member 910 are both located to the side of the second carrier plate B2, the first test assembly 100, the second test assembly 200, the first drive member 410 and the second drive member 420 in the second direction.

[0139] For example, the support component 910 includes two support frames arranged at intervals along a first direction. The support frames are fixedly connected to the first carrier plate B1. The two ends of the first guide post 920 are respectively fixedly connected to the two support frames arranged at intervals along the first direction. The test plate fixing assembly 300 is located between the two support frames arranged at intervals along the first direction.

[0140] like Figure 4 As shown, exemplarily, the test board fixing assembly 300 includes two third fixing components 310 arranged at intervals along a second direction, an insert plate 320 disposed between the two third fixing components 310, and a guide component 330 fixedly connected to the side of the third fixing component 310 away from the insert plate 320.

[0141] The guide member 330 has a first guide hole H1. For example, each guide member 330 has two first guide holes H1 arranged at intervals along the thickness direction of the first carrier plate B1.

[0142] The third fixing component 310 is fixedly connected to the second carrier plate B2. Each of the two third fixing components 310 has a slot G1 on one opposite side surface. The end of the slot G1 furthest from the second carrier plate B2 is open. The two ends of the insert plate 320 in the second direction are respectively inserted into the slots G1 of the two third fixing components 310 to fix the insert plate 320 to the two third fixing components 310. The insert plate 320 is used to fix the circuit board and has a clearance notch for the circuit board to mate with the second test assembly 200.

[0143] Before testing, the insert plate 320 can be removed from the slot G1. After fixing the circuit board to the insert plate 320, the insert plate 320 with the circuit board fixed thereon can be inserted into the slot G1 to fix the circuit board to the board under test fixing assembly 300. After completing the test of the circuit board, the insert plate with the circuit board fixed thereon can be removed from the slot G1, and then the circuit board can be removed from the insert plate 320.

[0144] By replacing the 320 insert board, different circuit boards can be tested, making the circuit board test fixture more versatile.

[0145] Figure 5 for Figure 4 An exploded view of the test board fixing assembly provided in the diagram.

[0146] like Figure 5 As shown, in some examples, the slot G1 includes a guide section G11 and a limiting section G12. One end of the guide section G11 is connected to the limiting section G12, and the end of the guide section G11 away from the limiting section G12 is an open structure. The guide section G11 is used to guide the insert plate 320 to the limiting section G12, and the limiting section G12 is used to restrict the movement of the insert plate 320 in the first direction, so as to fix the insert plate 320 to the third fixing component 310. By setting the guide section G11, the insertion accuracy between the insert plate 320 and the slot G1 can be reduced, making it easier for the insert plate 320 to be inserted into the slot G1.

[0147] For example, the guide section G11 can be a "V"-shaped guide groove structure with a large opening at the end away from the second carrier plate B2 and a small opening at the end closer to the second carrier plate B2.

[0148] In some examples, the insert plate 320 includes a fixing plate 321 and a reinforcing frame 322. The fixing plate 321 has reinforcing frames 322 at both ends in the second direction. The insert plate 320 is inserted into the slot G1 through the reinforcing frames 322. The reinforcing frames 322 are used to contact the slot wall of the slot G1. The fixing plate 321 is used to fix the circuit board. The fixing plate 321 has a clearance notch for the circuit board to dock with the second test assembly 200.

[0149] In this way, the insertion plate 320 has better reliability and is less likely to be damaged by insertion and removal in the slot G1. In addition, the strength requirements of the fixing plate 321 can be reduced, which is conducive to enriching the selection of fixing plates 321 and reducing the cost of insertion and removal.

[0150] For example, the fixing plate 321 may be made of a lightweight material to facilitate the insertion and removal of the insert plate 320 within the slot G1.

[0151] For example, the fixing plate 321 can be a fiberglass board.

[0152] For example, the reinforcing frame 322 can be made of metal. For instance, the reinforcing frame 322 can be made of stainless steel, alloy steel, aluminum alloy, etc., which makes the reinforcing frame 322 stronger and less prone to damage.

[0153] Figure 6 This is a schematic diagram of a second test component provided in an embodiment of this application.

[0154] like Figure 6 As shown, in some examples, the second test assembly 200 includes a second fixing member 210 and a second test probe plate 220. The second fixing member 210 is slidably connected to the second carrier plate B2 and is slidable relative to the second carrier plate B2 in a first direction, allowing the second test assembly 200 to slide between a second test position and a second exit position. The second test probe plate 220 is detachably connected to the side of the second fixing member 210 facing the board under test fixing assembly 300. The second test probe plate 220 is used to mate with the circuit board fixedly disposed on the board under test fixing assembly 300 to perform testing on the circuit board.

[0155] In this way, different circuit boards can be tested by replacing the second test pin plate 220, making the circuit board test fixture more versatile.

[0156] For example, the second pressure arm 424 of the second driving component 420 is connected to the second fixed component 210. By rotating the second operating handle 422 of the second driving component 420, the second pressure arm 424 can drive the second fixed component 210 to move linearly in the first direction.

[0157] For example, when the second drive component 420 drives the second test component 200 to move from the second exit position to the second test position, the side of the circuit board facing the second test component 200 mates with the second test probe plate 220. After the side of the circuit board facing the second test component 200 mates with the second test probe plate 220, the first test component 100 and the second test probe plate 220 are powered on.

[0158] After the circuit board is tested, the first test assembly 100 and the second test probe plate 220 are powered off. When the second drive component 420 drives the second test assembly 200 from the second test position to the second exit position, the side of the circuit board facing the second test assembly 200 is disconnected from the second test probe plate 220.

[0159] For example, the second fixing component 210 can be slidably connected to the second carrier plate B2 via multiple slide rails extending along the first direction.

[0160] For example, the second test component 200 further includes a triggering component 230, which is fixedly connected to the second fixing component 210. The position detection device 810 is used to detect whether the second test component 200 is in the second test position by detecting the triggering component 230.

[0161] For example, a position detection device 810 is disposed laterally on the second fixing member 210 in a second direction, and a trigger member 230 protrudes from the second fixing member 210 in the second direction. At least a portion of the trigger member 230 is opposite to the position detection device 810 in a first direction. When the second test component 200 is in the second test position, the trigger member 230 can press the position detection device 810 to cause the position detection device 810 to generate a control signal indicating that the second test component 200 is in the second test position. When the second test component 200 is not in the second test position, the trigger member 230 does not press the position detection device 810 to cause the position detection device 810 to generate another control signal indicating that the second test component 200 is not in the second test position.

[0162] For example, the second test probe plate 220 may include multiple test sub-plates, which can be arranged along a second direction. The second fixing component 210 may include multiple fixing parts corresponding one-to-one with the test sub-plates. The test sub-plates are detachably connected to the corresponding fixing parts, and the fixing parts are slidably connected to the second carrier plate B2. The fixing parts can slide relative to the second carrier plate B2 along a first direction. The trigger component 230 includes multiple trigger parts corresponding to the fixing parts, and the trigger parts are fixedly connected to the corresponding fixing parts. The fixing parts, the corresponding test sub-plates, and the corresponding trigger parts are used to form a test sub-unit U. The circuit board test fixture includes multiple second driving components 420 corresponding to the fixing parts. The second driving components 420 are connected to the corresponding fixing parts. Specifically, the second pressure arm 424 of the second driving component 420 is connected to the corresponding fixing part, and the second driving component 420 is used to drive the corresponding fixing part to slide.

[0163] For example, the trigger portion protrudes from the corresponding fixing portion along the second direction. Along the first direction, at least a portion of the trigger portion is opposite to the position detection device 810. When the test subunit U is in the second test position, the trigger portion of the test subunit U presses against the position detection device 810. When the test subunit U is not in the second test position, the trigger portion of the test subunit U does not press against the position detection device 810.

[0164] For example, each fixed sub-part can be slidably connected to the second carrier plate B2 via multiple slide rails extending along the first direction.

[0165] For example, the second test probe plate 220 may include a first test sub-plate 221 and a second test sub-plate 222, which are arranged along a second direction. The second fixing component 210 may include a first fixing sub-part 211 corresponding to the first test sub-plate 221 and a second fixing sub-part 212 corresponding to the second test sub-plate 222. The first test sub-plate 221 is detachably connected to the first fixing sub-part 211, and the second test sub-plate 222 is detachably connected to the second fixing sub-part 212. The first fixing sub-part 211 and the second fixing sub-part 212 are arranged along the second direction, and both the first fixing sub-part 211 and the second fixing sub-part 212 are slidably connected to the second carrier plate B2. The first fixing sub-part 211 and the second fixing sub-part 212 are slidable relative to the second carrier plate B2 along a first direction. The triggering component 230 includes a first triggering part 231 corresponding to the first fixing sub-part 211 and a second triggering part 232 corresponding to the second fixing sub-part 212. The first triggering part 231 is fixedly connected to the first fixing sub-part 211, and the second triggering part 232 is fixedly connected to the second fixing sub-part 212. The first triggering part 231 protrudes from the first fixing sub-part 211 along a second direction, and the second triggering part 232 protrudes from the second fixing sub-part 212 along a second direction. The first fixing sub-part 211, the first test sub-plate 221, and the first triggering part 231 are used to form a first test sub-unit U1, and the second fixing sub-part 212, the second test sub-plate 222, and the second triggering part 232 are used to form a second test sub-unit U2. The circuit board test fixture includes two second driving components 420 arranged along a second direction. One second driving component 420 is arranged in a row with and connected to the first fixing sub-part 211 along a first direction, and the other second driving component 420 is arranged in a row with and connected to the second fixing sub-part 212 along the first direction. The second driving component 420 connected to the first fixing sub-part 211 drives the first fixing sub-part 211 to slide along the first direction, so that the first test sub-unit U1 slides between a second exit position and a second test position. The second driving component 420 connected to the second fixing sub-part 212 drives the second fixing sub-part 212 to slide along the first direction, so that the second test sub-unit U2 slides between a second exit position and a second test position.

[0166] Figure 7 for Figure 1 Another schematic diagram of the circuit board test fixture provided.

[0167] like Figure 7 As shown, in some possible implementations, the circuit board test fixture also includes an insertion foolproof component 500, an exit foolproof component 600, and a test foolproof component 700.

[0168] The insertion anti-foolproof component 500 is used to lock the second test component 200 to the second carrier plate B2 when the second carrier plate B2 is in the first exit position and when the second carrier plate B2 is between the first exit position and the first test position, and is used to release the lock between the second test component 200 and the second carrier plate B2 when the second carrier plate B2 is in the first test position.

[0169] In this way, after the first driving component 410 moves the second carrier board B2 to the first test position, the second driving component 420 can drive the second test assembly 200 to move from the second exit position to the second test position. This ensures the correctness of the operation sequence during the docking stage between the circuit board and the circuit board test fixture, making it less prone to misoperation during the docking stage and facilitating reliable and safe docking between the circuit board and the circuit board test fixture.

[0170] For example, the circuit board test fixture includes a plurality of insertion-proof components 500 arranged along a second direction.

[0171] In an example where the second test assembly 200 includes multiple test sub-units U, the circuit board test fixture includes multiple insertion anti-foolproof components 500 corresponding to the test sub-units U. The insertion anti-foolproof components 500 are used to lock the corresponding test sub-unit U to the second carrier board B2 when the second carrier board B2 is in the first exit position and when the second carrier board B2 is between the first exit position and the first test position, and are used to release the lock between the corresponding test sub-unit U and the second carrier board B2 when the second carrier board B2 is in the first test position.

[0172] The exit anti-foolproof component 600 is used to lock the first carrier plate B1 and the second carrier plate B2 when the second test component 200 is in the second test position and between the second test position and the second exit position, and is used to release the lock on the first carrier plate B1 and the second carrier plate B2 when the second test component 200 is in the second exit position.

[0173] In this way, after the second driving component 420 moves the second test component 200 to the second exit position, the first driving component 410 can drive the second carrier board B2 to move from the first test position to the first exit position. This ensures the correctness of the operation sequence during the disconnection phase between the circuit board and the circuit board test fixture, making it less prone to misoperation during the disconnection phase and facilitating reliable and safe disconnection between the circuit board and the circuit board test fixture.

[0174] For example, the circuit board test fixture includes a plurality of exit-foolproof components 600 arranged along a second direction.

[0175] In an example where the second test assembly 200 includes multiple test sub-units U, the circuit board test fixture includes multiple exit anti-foolproof components 600 corresponding to the test sub-units U. The exit anti-foolproof components 600 are used to lock the first carrier board B1 and the second carrier board B2 when the corresponding test sub-unit U is in the second test position and when the corresponding test sub-unit U is between the second test position and the second exit position, and are used to release the lock on the first carrier board B1 and the second carrier board B2 when the corresponding test sub-unit U is in the second exit position.

[0176] The test error prevention component 700 is used to restrict the movement of the second test component 200 relative to the second carrier plate B2 from the second test position to the second exit position when the first test component 100 and the second test component 200 are powered on, and to release the restriction on the relative movement of the second test component 200 and the second carrier plate B2 when the first test component 100 and the second test component 200 are powered off.

[0177] This helps ensure the correctness of the circuit board testing process sequence and reduces the likelihood of damage to the circuit board or circuit board testing fixture, as well as injury to operators, caused by the circuit board disengaging from the first test component 100 and the second test component 200 when the circuit board is powered on and tested.

[0178] For example, the circuit board test fixture includes a plurality of test-proofing components 700 arranged along a second direction.

[0179] In an example where the second test assembly 200 includes multiple test sub-units U, the circuit board test fixture includes multiple test anti-mistake components 700 corresponding to the test sub-units U. The test anti-mistake components 700 are used to restrict the movement of the corresponding test sub-unit U relative to the second carrier board B2 from a second test position to a second exit position when the first test assembly 100 and the second test assembly 200 are powered on, and to release the restriction on the relative movement of the second carrier board B2 and the corresponding test sub-unit U when the first test assembly 100 and the second test assembly 200 are powered off.

[0180] Figure 8 This is a schematic diagram of a circuit board test fixture at the insertion point of the foolproof component, provided in an embodiment of this application. Figure 9 for Figure 8 Another schematic diagram of the circuit board test fixture provided in the diagram, showing the insertion of the foolproof component. Figure 10 for Figure 9 A cross-sectional diagram of plane aa. Figure 11 This is a cross-sectional schematic diagram of a circuit board test fixture provided in an embodiment of the present application when the second carrier board is in the first retracted position. Figure 12 This is a cross-sectional schematic diagram of a circuit board test fixture provided in an embodiment of this application when the second carrier board is in the first test position.

[0181] like Figure 8 , Figure 9 As shown, in some possible embodiments, the insertion anti-misplacement component 500 includes a first abutment 510, a first locking member 520, and a first elastic member 530. The first abutment 510 is fixedly connected to the first carrier plate B1. The first locking member 520 is slidably connected to the second carrier plate B2.

[0182] The first locking member 520 can slide relative to the second carrier plate B2 along the thickness direction of the first carrier plate B1. The first elastic member 530 is disposed between the first locking member 520 and the second carrier plate B2. The first elastic member 530 is used to make the first locking member 520 abut against the surface of the first abutting member 510 facing the second carrier plate B2. The first locking member 520 can move along the surface of the first abutting member 510 facing the second carrier plate B2.

[0183] like Figures 10-12 As shown, the surface of the first abutment 510 facing the second carrier plate B2 includes a first abutment portion 511 and a second abutment portion 512. The first abutment portion 511 and the second abutment portion 512 are arranged along a first direction. The distance between the first abutment portion 511 and the second carrier plate B2 is smaller than the distance between the second abutment portion 512 and the second carrier plate B2. The first abutment portion 511 and the second abutment portion 512 are connected by an inclined surface. The second test assembly 200 has a first locking structure S1.

[0184] The first locking member 520 is used to abut against the first abutting part 511 when the second carrier plate B2 is in the first withdrawing position, so that the first locking member 520 passes through the first locking structure S1, thereby realizing the locking of the second test component 200 and the second carrier plate B2.

[0185] The first locking member 520 is also used to abut against the second abutment portion 512 after the second carrier plate B2 slides to the first test position, so that the first locking member 520 is outside the first locking structure S1, thereby releasing the lock between the second test assembly 200 and the second carrier plate B2.

[0186] Thus, the first locking member 520 is driven by the first elastic member 530 to abut against the surface of the first abutting member 510. When the second carrier plate B2 slides relative to the first carrier plate B1, the first locking member 520 can move along the surface of the first abutting member 510 between the first abutting portion 511 and the second abutting portion 512. When the second carrier plate B2 is in the first retracted position, the first locking member 520 abuts against the first abutting portion 511, which is closer to the second carrier plate B2, so that the first locking member 520 passes through the first locking structure S1, thereby locking the second test assembly 200 and the second carrier plate B2. When the second carrier plate B2 slides to the first test position, the first locking member 520 abuts against the second abutting portion 512, which is farther from the second carrier plate B2, so that the first locking member 520 moves out of the first locking structure S1, releasing the lock between the second test assembly 200 and the second carrier plate B2. Thus, after the first driving component 410 moves the second carrier board B2 to the first test position, the second driving component 420 can drive the second test assembly 200 to move from the second exit position to the second test position. This ensures the correctness of the operation sequence during the circuit board and circuit board test fixture docking stage, reducing the likelihood of misoperation and facilitating reliable and safe docking of the circuit board and circuit board test fixture. Furthermore, the insertion error prevention is achieved through mechanical components, and the insertion error prevention component 500 does not require power, making its setup and operation safer and more reliable.

[0187] For example, along the thickness direction of the first carrier plate B1, the first locking member 520 and the second carrier plate B2 are located on the same side of the first abutment member 510.

[0188] For example, when the second carrier plate B2 is in the first test position, the first locking member 520 is located on the side of the second test assembly 200 facing the second carrier plate B2.

[0189] For example, the insertion anti-misplacement component 500 may further include a second guide post 540, which extends along the thickness direction of the first carrier plate B1 and is fixedly connected to the second carrier plate B2. The first locking member 520 has a second guide hole, and the second guide post 540 passes through the second guide hole and is slidably connected to the hole wall of the second guide hole to realize the slidable connection between the first locking member 520 and the second carrier plate B2. The first elastic member 530 is sleeved on the outside of the second guide post 540.

[0190] For example, the first elastic element 530 may be a column spring.

[0191] For example, the first locking member 520 includes a first locking pin 521, a first connecting seat 522, and a first roller 523. The first connecting seat 522 has a second guide hole and is slidably connected to the second carrier plate B2 via the second guide pin 540. A first elastic member 530 is disposed between the first connecting seat 522 and the second carrier plate B2. Along the thickness direction of the first carrier plate B1, the first locking pin 521 is fixedly connected to the side of the first connecting seat 522 away from the first abutment member 510. The first roller 523 is rotatably connected to the first connecting seat 522, and the first locking member 520 abuts against the surface of the first abutment member 510 via the first roller 523, so that the friction between the first locking member 520 and the first abutment member 510 is small, which facilitates the movement of the first locking member 520 along the surface of the first abutment member 510.

[0192] The first locking member 520 is used to cause the first roller 523 to abut against the first abutment portion 511 when the second carrier plate B2 is in the first retracted position, so that the first locking pin 521 passes through the first locking structure S1. The first locking member 520 is also used to cause the first roller 523 to abut against the second abutment portion 512 after the second carrier plate B2 slides to the first test position, so that the first locking pin 521 is outside the first locking structure S1.

[0193] Figure 13 This is a schematic diagram of a circuit board test fixture at the point of disengagement from the foolproof assembly, provided in an embodiment of this application. Figure 14 for Figure 13 Another schematic diagram of the circuit board test fixture provided in the image, showing the exit point of the foolproof assembly. Figure 15 for Figure 14 A cross-sectional diagram of the middle bb plane. Figure 16 This is a cross-sectional schematic diagram of a circuit board test fixture provided in an embodiment of the present application when the second test component is in the second test position. Figure 17 This is a cross-sectional schematic diagram of a circuit board test fixture provided in an embodiment of this application when the second test component is in the second exit position.

[0194] like Figures 13-15 As shown, in some possible embodiments, the exit anti-mistake component 600 includes a second abutment 610, a second locking member 620, and a second elastic member 630. The second abutment 610 is fixedly connected to the second test component 200. The second locking member 620 is slidably connected to the first carrier plate B1, and the second locking member 620 can slide relative to the first carrier plate B1 along the thickness direction of the first carrier plate B1. The second elastic member 630 is disposed between the second locking member 620 and the first carrier plate B1, and the second elastic member 630 is used to cause the second locking member 620 to abut against the surface of the second abutment 610 on the side opposite to the second test component 200, and the second locking member 620 can move along the surface of the second abutment 610 on the side opposite to the second test component 200.

[0195] like Figure 16 , Figure 17 As shown, the surface of the second abutment 610 opposite to the second test assembly 200 includes a third abutment portion 611 and a fourth abutment portion 612. The third abutment portion 611 and the fourth abutment portion 612 are arranged along a first direction. The distance between the third abutment portion 611 and the second carrier plate B2 is smaller than the distance between the fourth abutment portion 612 and the second carrier plate B2. The third abutment portion 611 and the fourth abutment portion 612 are connected by an inclined surface. The second carrier plate B2 has a second locking structure S2.

[0196] The second locking member 620 is used to abut against the third abutment 611 when the second test assembly 200 is in the second test position, so that the second locking member 620 passes through the second locking structure S2, thereby realizing the locking of the second carrier plate B2 and the first carrier plate B1.

[0197] The second locking member 620 is also used to abut against the fourth abutment part 612 after the second test assembly 200 slides to the second exit position, so that the second locking member 620 is outside the second locking structure S2, thereby releasing the lock between the second carrier plate B2 and the first carrier plate B1.

[0198] Thus, the second locking member 620 is driven by the second elastic member 630 to abut against the surface of the second abutment member 610. When the second test assembly 200 slides on the second carrier plate B2, the second locking member 620 can move along the surface of the second abutment member 610 between the third abutment portion 611 and the fourth abutment portion 612. When the second test assembly 200 is in the second test position, the second locking member 620 abuts against the third abutment portion 611, which is closer to the second carrier plate B2, so that the second locking member 620 passes through the second locking structure S2, thereby locking the first carrier plate B1 and the second carrier plate B2. When the second test assembly 200 slides to the second exit position, the second locking member 620 abuts against the fourth abutment portion 612, which is farther from the second carrier plate B2, so that the second locking member 620 moves out of the second locking structure S2, releasing the lock between the first carrier plate B1 and the second carrier plate B2. Thus, only after the second driving component 420 moves the second test assembly 200 to the second exit position can the first driving component 410 drive the second carrier board B2 to move from the first test position to the first exit position. This ensures the correctness of the operation sequence during the disengagement phase between the circuit board and the circuit board test fixture, reducing the likelihood of misoperation and facilitating reliable and safe disengagement. Furthermore, the mechanical component implements the exit error prevention mechanism, which does not require power, making the setup and operation of the exit error prevention mechanism 600 safer and more reliable.

[0199] For example, when the second test component 200 is in the second withdrawn position, the second locking member 620 is located on the side of the second carrier plate B2 facing the first carrier plate B1.

[0200] For example, the insertion anti-misplacement component 500 may further include a second connecting seat 640, which is fixedly connected to the second carrier plate B2. The second connecting seat 640 has a first sliding channel P1 extending along the thickness direction of the first carrier plate B1, the first sliding channel P1 passing through one end of the second connecting seat 640 near the second carrier plate B2, and the end of the second connecting seat 640 away from the second carrier plate B2 also has a first communicating hole H5. The second locking member 620 includes a second locking pin 621, a third connecting seat 622, and a second roller 623. The second locking pin 621 passes through the first sliding channel P1 and the first communicating hole H5, and is slidably connected to at least one of the channel wall of the first sliding channel P1 and the hole wall of the first communicating hole H5, so as to realize the sliding connection between the second locking member 620 and the second carrier plate B2. The third connecting seat 622 is located on the side of the second connecting seat 640 away from the second carrier plate B2, and the third connecting seat 622 is fixedly connected to the second locking pin 621. The second roller 623 is rotatably connected to the third connecting seat 622. The second locking member 620 abuts against the surface of the second abutting member 610 through the second roller 623, so that the friction between the second locking member 620 and the second abutting member 610 is small, which is conducive to the movement of the second locking member 620 along the surface of the second abutting member 610.

[0201] The second locking member 620 is used to cause the second roller 623 to abut against the third abutment portion 611 when the second test assembly 200 is in the second test position, so that the second locking pin 621 passes through the second locking structure S2. The second locking member 620 is also used to cause the second roller 623 to abut against the fourth abutment portion 612 after the second test assembly 200 slides to the second exit position, so that the second locking pin 621 is outside the second locking structure S2.

[0202] For example, the second locking post 621 includes a coaxial first post segment 6211 and a second post segment 6212. The outer diameter of the first post segment 6211 is larger than the outer diameter of the second post segment 6212. The second post segment 6212 passes through the first connecting hole H5 and is slidably connected to the hole wall of the first connecting hole H5. The end of the second post segment 6212 near the second carrier plate B2 is fixedly connected to the first post segment 6211, and the end of the second post segment 6212 away from the second carrier plate B2 is fixedly connected to the third connecting seat 622. The first post segment 6211 passes through the first sliding channel P1 and is slidably connected to the channel wall of the first sliding channel P1. The second elastic member 630 is disposed in the first sliding channel P1 and is located between the end of the first post segment 6211 connected to the second post segment 6212 and the end of the second connecting seat 640 away from the second carrier plate B2. When the second test assembly 200 is in the second test position, the first post segment 6211 passes through the second locking structure S2.

[0203] Figure 18 This is a schematic diagram of another circuit board test fixture provided in an embodiment of this application.

[0204] like Figure 18 As shown, in some possible embodiments, the circuit board test fixture further includes a power supply control component 820, which is electrically connected to the first test component 100 and the second test component 200. The power supply control component 820 is used to control the power supply and power-on / off of the first test component 100 and the second test component 200. A test error prevention component 700 is electrically connected to the power supply control component 820 to realize signal interaction between the test error prevention component 700 and the power supply control component 820.

[0205] In this way, the test-proof component 700 can be controlled by the power supply control component 820 used to control the power-on and power-off of the first test component 100 and the second test component 200, realizing the linkage between the test-proof component 700 and the power-on and power-off of the first test component 100 and the second test component 200. This allows for a quick and accurate response based on the timing of the power-on and power-off of the first test component 100 and the second test component 200, thereby achieving rapid and accurate control of the test-proof component 700. This helps ensure the correctness of the circuit board testing process operation sequence and reduces the likelihood of damage to the circuit board or circuit board testing fixture, as well as operator injury, caused by the circuit board disengaging from the first test component 100 and the second test component 200 when the circuit board is powered on for testing.

[0206] For example, the test-prevention component 700 is configured to switch to a state that restricts the movement of the second test component 200 relative to the second carrier plate B2 from the second test position to the second exit position, based on a control signal that controls the first test component 100 and the second test component 200 to power on. The test-prevention component 700 is also configured to switch to a state that releases the relative movement restriction between the second test component 200 and the second carrier plate B2, based on a control signal that controls the first test component 100 and the second test component 200 to power off.

[0207] For example, the position detection device 810 is electrically connected to the power supply control component 820 to enable signal interaction between the position detection device 810 and the power supply control component 820. The power supply control component 820 is used to control the first test component 100 and the second test component 200 to be powered on after the position detection device 810 detects that the second test component 200 is in the second test position.

[0208] In some examples, the test error prevention component 700 can switch to a state that restricts the second test component 200 from moving from the second test position to the second exit position relative to the second carrier plate B2, based on the signal detected by the position detection device 810 that the second test component 200 is in the second test position.

[0209] Figure 19 This is a schematic diagram of a test error prevention component provided in an embodiment of this application.

[0210] like Figure 19 As shown, in some possible implementations, the test error prevention component 700 includes a fixed member 710 and a movable member 720. The fixed member 710 is fixedly connected to the side of the second carrier plate B2 facing the first carrier plate B1, and the movable member 720 is slidably connected to the second carrier plate B2, and the movable member 720 can slide relative to the second carrier plate B2 along the thickness direction of the first carrier plate B1.

[0211] The test error prevention component 700 is used to position a portion of the movable component 720 on the path in which the second test component 200 moves relative to the second carrier plate B2 from the second test position to the second exit position when the first test component 100 and the second test component 200 are powered on, thereby restricting the movement of the second test component 200 relative to the second carrier plate B2 from the second test position to the second exit position.

[0212] The test error prevention component 700 is also used to position the movable component 720 to the side of the second test component 200 along the thickness direction of the first carrier plate B1 when the first test assembly 100 and the second test assembly 200 are powered off.

[0213] In this way, the cooperation between the fixed part 710 and the movable part 720 facilitates the implementation of the test error prevention function.

[0214] For example, when the first test assembly 100 and the second test assembly 200 are powered down, the movable part 720 is located on the side of the second test assembly 200 facing the second carrier plate B2.

[0215] For example, the fixing member 710 has a second sliding channel extending along the thickness direction of the first carrier plate B1, and the movable member 720 is slidably connected to the channel wall of the second sliding channel to realize the sliding connection between the movable member 720 and the second carrier plate B2.

[0216] For example, the test foolproof component 700 can be a bidirectional self-holding electromagnet, with its coil located at the fixed member 710 and its permanent magnet located at the movable member 720. When the first test assembly 100 and the second test assembly 200 are energized, the coil of the bidirectional self-holding electromagnet is energized such that a portion of the movable member 720 is located on the path along which the second test assembly 200 moves relative to the second carrier plate B2 from the second test position to the second exit position. When the first test assembly 100 and the second test assembly 200 are de-energized, the coil of the bidirectional self-holding electromagnet is de-energized such that the movable member 720 is located laterally to the second test assembly 200 along the thickness direction of the first carrier plate B1.

[0217] Figure 20 A schematic diagram of a first carrier plate provided in an embodiment of this application. Figure 21 This is a schematic diagram of a second carrier plate provided in an embodiment of this application.

[0218] like Figure 20 , Figure 21 As shown, in some possible embodiments, the first abutment member 510 is fixedly connected to the side of the first carrier plate B1 facing away from the second carrier plate B2. The first carrier plate B1 has a first clearance structure N1, and the second carrier plate B2 has a first through hole H2. The first locking member 520 passes through the first clearance structure N1 and the first through hole H2. The first clearance structure N1 is used to allow the first locking member 520 to move relative to the first carrier plate B1 in a first direction, and the first through hole H2 is used to allow the first locking member 520 to move relative to the second carrier plate B2 in the thickness direction of the first carrier plate B1.

[0219] This facilitates the arrangement of the insertion of the foolproof component 500, making the circuit board test fixture more compact and smaller in size.

[0220] For example, the second guide post 540 and the first elastic member 530 are disposed within the first clearance structure N1, which is also used to allow the second guide post 540 and the first elastic member 530 to move relative to the first carrier plate B1 in a first direction.

[0221] In some possible embodiments, the third abutment portion 611 and the fourth abutment portion 612 are located on the side of the first carrier plate B1 away from the second carrier plate B2. The second carrier plate B2 has a second clearance structure N2, and the first carrier plate B1 has a third clearance structure N3. The second abutment member 610 passes through the second clearance structure N2 and the third clearance structure N3. The second clearance structure N2 is used to allow the second abutment member 610 to move relative to the second carrier plate B2 in a first direction, and the third clearance structure N3 is used to allow the second abutment member 610 to move relative to the first carrier plate B1 in a first direction. The first carrier plate B1 also has a second through hole H3, and the second locking member 620 passes through the second through hole H3. The second through hole H3 is used to allow the second locking member 620 to move relative to the first carrier plate B1 in the thickness direction of the first carrier plate B1.

[0222] This facilitates the arrangement of the exit error prevention component 600, allowing the circuit board test fixture to have a more compact structure and smaller size.

[0223] For example, the second through hole H3 is connected to the third clearance structure N3.

[0224] In some possible implementations, the first carrier plate B1 has a fourth clearance structure N4, and the second carrier plate B2 has a third through hole H4. A test mis-detection component 700 passes through the fourth clearance structure N4, which allows the test mis-detection component 700 to move relative to the first carrier plate B1 in a first direction. A movable member 720 of the test mis-detection component 700 passes through the third through hole H4, which allows the movable member 720 to move relative to the second carrier plate B2 along the thickness direction of the first carrier plate B1.

[0225] When testing a circuit board, the circuit board test fixture first fixes the circuit board to the board under test fixture 710. Then, the first drive component 410 drives the second carrier board B2 from the first exit position to the first test position. After the second carrier board B2 moves to the first test position, the foolproof component 500 is inserted to release the lock between the second carrier board B2 and the second test component 200. Then, the second drive component 420 drives the second test component 200 from the second exit position to the second test position. The foolproof component 600 is then released to lock the first carrier board B1 and the second carrier board B2. After the second test component 200 moves to the second test position, the position detection device 810 is triggered to power on the first test component 100 and the second test component 200 and to switch the foolproof component 700 to a state that restricts the second test component 200 from moving relative to the second carrier board B2 from the second test position to the second exit position. After the circuit board test is completed, the first test component 100 and the second test component 200 are powered off, and the test foolproof component 700 is switched to a state that releases the relative movement restriction between the second test component 200 and the second carrier board B2. Then, the second test component 200 is driven from the second test position to the second exit position by the second drive component 420. After the second test component 200 moves to the second exit position, the foolproof component 600 is removed to release the lock between the first carrier board B1 and the second carrier board B2. Then, the second carrier board B2 is driven from the first test position to the first exit position by the first drive component 410. The foolproof component 500 is inserted to lock the second carrier board B2 and the second test component 200. After the second carrier board B2 moves to the first exit position, the circuit board is removed from the board under test fixture 710.

[0226] In the description of the embodiments of this application, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, an indirect connection through an intermediate medium, or the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application according to the specific circumstances.

[0227] The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0228] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of this application, and are not intended to limit them. Although the embodiments of this application have been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A circuit board testing fixture, characterized in that, It includes a first carrier board (B1), a second carrier board (B2), a first test component (100), a second test component (200), a board under test fixing component (300), and a driving component (400). The second carrier plate (B2), the first test component (100), the second test component (200) and the test plate fixing component (300) are located on the same side of the thickness direction of the first carrier plate (B1); The first test component (100), the board under test fixing component (300), and the second test component (200) are arranged along a first direction. The board under test fixing component (300) is located between the first test component (100) and the second test component (200). The board under test fixing component (300) is used to fix the circuit board. The first test component (100) and the second test component (200) are used to test the circuit board. The first test component (100) is fixedly connected to the first carrier plate (B1), the second carrier plate (B2) is slidably connected to the first carrier plate (B1), the test plate fixing component (300) is fixedly connected to the second carrier plate (B2), and the second test component (200) is slidably connected to the second carrier plate (B2). The driving component (400) is used to drive the second carrier board (B2) and the second test component (200) to slide along the first direction so that the first test component (100) and the second test component (200) are docked with the circuit board at the test position.

2. The circuit board test fixture according to claim 1, characterized in that, The drive assembly (400) includes a first drive component (410) and a second drive component (420). The first driving component (410) is fixedly disposed on the first carrier plate (B1). The first driving component (410) is connected to the second carrier plate (B2). The first driving component (410) is used to drive the second carrier plate (B2) to slide along the first direction between the first test position and the first exit position. The second carrier plate (B2) sliding to the first test position is used to dock the circuit board with the first test assembly (100). The second carrier plate (B2) sliding to the first exit position is used to disconnect the circuit board from the first test assembly (100). The second driving component (420) is fixedly disposed on the second carrier board (B2). The second driving component (420) is connected to the second test component (200). The second driving component (420) is used to drive the second test component (200) to slide between the second test position and the second exit position along the first direction. The second test component (200) sliding to the second test position is used to dock the second test component (200) with the circuit board. The second test component (200) sliding to the second exit position is used to disconnect the second test component (200) from the circuit board.

3. The circuit board test fixture according to claim 2, characterized in that, Along the first direction, the first driving component (410) is located on the side of the test board fixing assembly (300) away from the first test assembly (100), and the second driving component (420) is located on the side of the second test assembly (200) away from the test board fixing assembly (300).

4. The circuit board test fixture according to claim 2 or 3, characterized in that, It also includes a foolproof insertion component (500); The insertion anti-fooling component (500) includes a first abutment (510), a first locking member (520), and a first elastic member (530); The first abutment (510) is fixedly connected to the first carrier plate (B1); The first locking member (520) is slidably connected to the second carrier plate (B2). The first locking member (520) can slide relative to the second carrier plate (B2) along the thickness direction of the first carrier plate (B1). The first elastic member (530) is disposed between the first locking member (520) and the second carrier plate (B2). The first elastic member (530) is used to make the first locking member (520) abut against the surface of the first abutment member (510) facing the second carrier plate (B2). The first locking member (520) can move along the surface of the first abutment member (510) facing the second carrier plate (B2). The surface of the first abutting member (510) facing the second carrier plate (B2) includes a first abutting part (511) and a second abutting part (512). The first abutting part (511) and the second abutting part (512) are arranged along the first direction. The distance between the first abutting part (511) and the second carrier plate (B2) is smaller than the distance between the second abutting part (512) and the second carrier plate (B2). The first abutting part (511) and the second abutting part (512) are connected by an inclined surface. The second test component (200) has a first locking structure (S1); The first locking member (520) is used to abut against the first abutting part (511) when the second carrier plate (B2) is in the first withdrawing position, so that the first locking member (520) passes through the first locking structure (S1), thereby realizing the locking of the second test component (200) and the second carrier plate (B2); The first locking member (520) is also used to abut against the second abutment (512) after the second carrier plate (B2) slides to the first test position, so that the first locking member (520) is outside the first locking structure (S1), thereby releasing the lock between the second test component (200) and the second carrier plate (B2).

5. The circuit board test fixture according to claim 4, characterized in that, The first abutment (510) is fixedly connected to the side of the first carrier plate (B1) away from the second carrier plate (B2); The first carrier plate (B1) has a first clearance structure (N1), the second carrier plate (B2) has a first through hole (H2), and the first locking member (520) passes through the first clearance structure (N1) and the first through hole (H2). The first clearance structure (N1) is used to allow the first locking member (520) to move relative to the first carrier plate (B1) along the first direction, and the first through hole (H2) is used to allow the first locking member (520) to move relative to the second carrier plate (B2) along the thickness direction of the first carrier plate (B1).

6. The circuit board test fixture according to any one of claims 2-5, characterized in that, It also includes the exit foolproof component (600); The exit anti-foolproof component (600) includes a second abutment (610), a second locking component (620), and a second elastic component (630). The second abutment (610) is fixedly connected to the second test assembly (200); The second locking member (620) is slidably connected to the first carrier plate (B1). The second locking member (620) can slide relative to the first carrier plate (B1) along the thickness direction of the first carrier plate (B1). The second elastic member (630) is disposed between the second locking member (620) and the first carrier plate (B1). The second elastic member (630) is used to make the second locking member (620) abut against the surface of the second abutment member (610) on the side away from the second test assembly (200). The second locking member (620) can move along the surface of the second abutment member (610) on the side away from the second test assembly (200). The second abutment (610) has a surface on the side opposite to the second test assembly (200) including a third abutment (611) and a fourth abutment (612). The third abutment (611) and the fourth abutment (612) are arranged along the first direction. The distance between the third abutment (611) and the second carrier plate (B2) is smaller than the distance between the fourth abutment (612) and the second carrier plate (B2). The third abutment (611) and the fourth abutment (612) are connected by an inclined surface. The second carrier plate (B2) has a second locking structure (S2); The second locking member (620) is used to abut against the third abutment (611) when the second test assembly (200) is in the second test position, so that the second locking member (620) passes through the second locking structure (S2), thereby realizing the locking of the second carrier plate (B2) and the first carrier plate (B1); The second locking member (620) is also used to abut against the fourth abutment (612) after the second test component (200) slides to the second exit position, so that the second locking member (620) is outside the second locking structure (S2), thereby releasing the lock between the second carrier plate (B2) and the first carrier plate (B1).

7. The circuit board test fixture according to claim 6, characterized in that, The third abutment (611) and the fourth abutment (612) are located on the side of the first carrier plate (B1) away from the second carrier plate (B2); The second carrier plate (B2) has a second clearance structure (N2), and the first carrier plate (B1) has a third clearance structure (N3). The second abutment (610) passes through the second clearance structure (N2) and the third clearance structure (N3). The second clearance structure (N2) is used to allow the second abutment (610) to move relative to the second carrier plate (B2) in the first direction, and the third clearance structure (N3) is used to allow the second abutment (610) to move relative to the first carrier plate (B1) in the first direction. The first carrier plate (B1) also has a second through hole (H3), and the second locking member (620) passes through the second through hole (H3). The second through hole (H3) is used to allow the second locking member (620) to move relative to the first carrier plate (B1) along the thickness direction of the first carrier plate (B1).

8. The circuit board test fixture according to any one of claims 2-7, characterized in that, It also includes a test-proof component (700) and a power supply control component (820); The power supply control component (820) is electrically connected to the first test component (100) and the second test component (200), and the power supply control component (820) is used to control the power supply of the first test component (100) and the second test component (200); The test error prevention component (700) is electrically connected to the power supply control component (820) to realize signal interaction between the test error prevention component (700) and the power supply control component (820); The test error prevention component (700) is used to restrict the movement of the second test component (200) relative to the second carrier board (B2) from the second test position to the second exit position when the first test component (100) and the second test component (200) are powered on; The test error prevention component (700) is also used to release the restriction on the relative movement of the second test component (200) and the second carrier plate (B2) when the first test component (100) and the second test component (200) are powered off.

9. The circuit board test fixture according to claim 8, characterized in that, The test error prevention component (700) includes a fixed part (710) and a movable part (720); The fixing member (710) is fixedly connected to the side of the second carrier plate (B2) facing the first carrier plate (B1), and the movable member (720) is slidably connected to the second carrier plate (B2). The movable member (720) can slide relative to the second carrier plate (B2) along the thickness direction of the first carrier plate (B1). The test error prevention component (700) is used to position a portion of the movable part (720) on the path in which the second test component (200) moves relative to the second carrier plate (B2) from the second test position to the second exit position when the first test component (100) and the second test component (200) are powered on, thereby restricting the movement of the second test component (200) relative to the second carrier plate (B2) from the second test position to the second exit position; The test error prevention component (700) is also used to position the movable part (720) on the side of the second test component (200) along the thickness direction of the first carrier plate (B1) when the first test component (100) and the second test component (200) are powered off.

10. The circuit board test fixture according to any one of claims 2-9, characterized in that, It also includes a position detection device (810); The position detection device (810) is fixedly mounted on the second carrier plate (B2), and the position detection device (810) is used to detect whether the second test component (200) is in the second test position.

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