Multi-station circuit board functional testing apparatus and functional testing machine

Abstract

This invention discloses a multi-station circuit board functional testing device and a functional testing machine, belonging to the technical field of testing equipment. It includes a main controller with indicator lights connected to one side and a cooling component fixed to the other side. The bottom of the cooling component is an air outlet. A fixing plate is connected to one side of the cooling component, and a servo motor is fixed to one side of the main controller. A screw is connected to the bottom of the servo motor, and the bottom of the screw is rotatably connected to the inside of the fixing plate. A movement control component is threaded onto the outer wall of the screw, and one side of the movement control component is slidably connected to the inside of the cooling component. A probe component is inserted inside the movement control component. The functional testing machine includes a body assembly and multiple sets of functional testing devices disposed inside the body assembly. The servo motor drives the screw to raise and lower the movement control component, which can precisely adjust the contact pressure of the probe component on the circuit board. Combined with the buffering effect of a third spring, abnormal pressure damage to the circuit board is avoided. The accuracy of the test pressure adjustment is greatly improved, ensuring the monitoring effect of electric vehicle circuit boards while effectively preventing damage to the circuit board during testing, thus effectively reducing the damage rate of the circuit board during testing.

Description

Technical Field

[0001] This application relates to the field of testing equipment technology, and more specifically, to a functional testing device and a functional testing machine for multi-station circuit boards. Background Technology

[0002] The "three-electric system" (battery, motor, and electronic control) of electric vehicles involves complex functions such as high-voltage and high-current control, precision signal transmission, and status monitoring, which need to be achieved through the division of labor and cooperation of circuit boards with different functions.

[0003] The circuit boards of an electric vehicle directly control the high-voltage system (such as the battery, motor, and charging module), and even a minor malfunction can lead to serious consequences. Therefore, testing different functional circuit boards is particularly important during the manufacturing process of electric vehicles, as it directly determines the driving safety and energy efficiency of the vehicle.

[0004] Currently, in the process of testing electric vehicle circuit boards using circuit board testing equipment, existing equipment mainly employs fixed probes and manual pressure adjustment. The circuit board is manually positioned on the test bench, and fixed probe assemblies contact the test points on the circuit board. Test signals are transmitted to the main control system via wires to achieve circuit function testing. While this type of testing equipment is simple to operate, pressure adjustment relies heavily on manual rotation of knobs to adjust the probe height, with test pressure determined by experience. Furthermore, it is difficult to confirm the degree of probe wear, thus compromising the accuracy of circuit board testing. Regular shutdowns are required for manual inspection of probe head wear, but this inspection is cumbersome and inefficient. Replacing probe heads with only minor wear increases the cost of circuit board testing, consequently raising the production cost of electric vehicles.

[0005] In view of this, we propose a functional testing device and functional testing machine for multi-station circuit boards that is efficient and accurate in testing. Summary of the Invention

[0006] Technical problem to be solved: The purpose of this application is to provide a functional testing device and a functional testing machine for multi-station circuit boards, which solves the technical problems mentioned in the background art above.

[0007] Technical Solution: This application provides a functional testing device for multi-station circuit boards, including a main controller. An indicator light is connected to one side of the main controller, and a cooling component is fixed to the other side of the main controller. The bottom end of the cooling component is the air outlet. A fixed plate is connected to one side of the cooling component, and a servo motor is fixed to one side of the main controller. A screw is connected to the bottom end of the servo motor. The bottom end of the screw is rotatably connected to the inside of the fixed plate. A movement control component is threaded onto the outer wall of the screw. One side of the movement control component is slidably connected to the inside of the cooling component. A probe component is inserted into the movement control component. The probe component is a telescopic structure. When the probe component is retracted, its bottom end is on the same horizontal centerline as the air outlet of the cooling component. The movement control component descends by rotating the screw, thereby lowering the probe component to adjust the bonding test pressure of the bottom end of the probe component to the circuit board. The probe assembly includes a probe tube inserted into the motion control assembly, a probe body inserted inside the probe tube, a third spring connecting the top of the probe body to the inside of the probe tube, a probe head connected to the bottom of the probe body, a first wire electrically connecting the top of the probe tube to the bottom surface of the main controller, and the probe tube, probe body, and probe head being electrically connected to each other for transmitting test data to the main controller. A damage measuring component for monitoring the wear thickness of the probe head is disposed through the inside of the probe tube and probe body, and the top of the damage measuring component is electrically connected to the bottom surface of the main controller.

[0008] Furthermore, the damage measurement component includes a second wire that runs through the probe cylinder and probe body. The top end of the second wire is electrically connected to the bottom surface of the main controller. A distance sensor is connected to the bottom end of the second wire. A distance measuring cavity is provided inside the bottom end of the probe body. The distance measuring sensor is located inside the distance measuring cavity. A distance fixing block is inserted into the probe head. The top end of the distance fixing block is inserted into the distance measuring cavity. The distance measuring sensor and the distance fixing block are located on the same vertical centerline. The thickness between the bottom surface of the probe head and the bottom surface of the distance fixing block is set as the normal wear thickness. After the bottom surface of the probe head is worn down to eliminate the normal wear thickness, the bottom end of the spacer block penetrates through the bottom surface of the probe head. The probe head is set to an abnormal wear state. In the abnormal wear state, the thickness of the probe head is reduced through wear, and the bottom surface of the spacer block is pushed up by the circuit board to keep it flush with the worn bottom surface of the probe head, so that the spacer block rises inside the probe head. The rising distance of the spacer block is set to the abnormal wear thickness and is detected by the distance measuring sensor.

[0009] Furthermore, the bottom end of the probe body and the top surface of the probe head are detachably connected.

[0010] Furthermore, a fixing cylinder is fixed to the bottom end of the probe body, and the fixing cylinder is connected to the inside of the ranging cavity. The fixing cylinder is threaded to the inside of the probe head, and the top of the distance measuring block is inserted into the inside of the fixing cylinder.

[0011] Furthermore, the probe assembly also includes an infrared temperature sensor sleeved and fixed to the outer wall of the probe body. The infrared temperature sensor is located at the top of the probe head to monitor the probe head temperature.

[0012] Furthermore, the movement control component includes a lifting block threaded onto the outer wall of the screw, a fixing block fixed to the side wall of the lifting block, a clamping and pushing component connected to one side of the fixing block, one end of the clamping and pushing component clamping and fitting against the outer wall of the probe cylinder, and one side of the clamping and pushing component slidingly connected to the inside of the cooling component.

[0013] Furthermore, the clamping and pushing component includes a positioning bolt threaded to the side wall of the fixing block, one end of the positioning bolt being slidably sleeved with a sliding push cylinder, one end of the positioning bolt being connected to the inside of the sliding push cylinder with a first spring, a knob fixed on one side of the sliding push cylinder, an L-shaped limiting plate fixed on the bottom surface of the sliding push cylinder, two limiting plates fixed in mirror image about the vertical center line of the sliding push cylinder, multiple limiting posts fixed on the outer wall of the positioning bolt, the limiting posts being inserted into the inside of the sliding push cylinder, and the sliding push cylinder being slidably connected to the inside of the cooling assembly.

[0014] Furthermore, the cooling assembly includes a fan fixed to the side wall of the main controller, an air outlet pipe connected to the bottom of the fan, an opening structure at the bottom of the air outlet pipe, a sliding hole running through the inside of the air outlet pipe, an air regulating component running through the bottom of the sliding hole and the inside of the air outlet pipe, a second air guide block fixed inside the air outlet pipe, two second air guide blocks mirrored about the vertical center line of the air outlet pipe, an air regulating component disposed between the two second air guide blocks to adjust the air outlet speed inside the air outlet pipe, a sliding push cylinder slidably connected inside the sliding hole, the top of the air regulating component inserted between two limiting plates, and the air regulating component moving inside the air outlet pipe by being pushed by the sliding push cylinder.

[0015] Furthermore, the air regulating component includes a connecting rod that runs through the inside of the air outlet duct. A push plate is fixed to the top of the connecting rod and is inserted between two limiting plates. A first air guide block with an isosceles trapezoidal structure is fixed to the bottom of the connecting rod. A second spring is sleeved on the outer wall of the connecting rod and is connected between the inner wall of the air outlet duct and the top surface of the first air guide block. The second air guide block has a triangular structure, and a ventilation gap is formed between the inclined surfaces of the first and second air guide blocks.

[0016] Furthermore, a retaining ring is fitted and fixed to the outer wall of the probe tube, and the retaining ring is fitted to the bottom surface of the fixing block.

[0017] A multi-station circuit board functional testing machine includes a body assembly and multiple sets of functional testing devices disposed inside the body assembly. The body assembly includes a housing with a testing chassis on the top surface and a lifting platform on the bottom surface inside the housing for positioning and placing the circuit board. An electric slide is disposed inside the housing, and multiple sets of functional testing devices are connected to the electric slide. The functional testing devices are moved and positioned on the top of the circuit board by the electric slide. The circuit board is pushed up by the lifting platform so that the bottom of the functional testing device is in contact with the top surface of the circuit board.

[0018] Beneficial effects: One or more technical solutions provided in this application have at least the following technical effects or advantages: 1. The servo motor drives the screw to raise and lower the movement control component, which can accurately adjust the contact test pressure of the probe component on the circuit board. With the buffering effect of the third spring, abnormal pressure can be avoided to prevent damage to the circuit board. The accuracy of test pressure adjustment is greatly improved, which not only ensures the monitoring effect of electric vehicle circuit boards, but also effectively avoids damage to the circuit board during the test, and effectively reduces the damage rate of the circuit board during the test.

[0019] 2. The damage testing component can monitor the wear status of the probe tip in real time, and the data is transmitted to the main controller in real time through the wire, avoiding test errors caused by probe wear and improving the accuracy of test data.

[0020] 3. By monitoring the wear thickness of the probe head through the damage testing component, the main controller uses a servo motor to drive the screw to move the control component up and down based on the detected wear thickness, thereby compensating for the wear thickness of the probe head, improving the service life of the probe head, reducing the replacement frequency of the probe head, and ensuring the stability of the probe head's test pressure on the circuit board, thus improving the stability and accuracy of the circuit board test.

[0021] 4. As the probe tip wears down, the rough surface of the worn probe tip during contact testing with the circuit board can cause slight contact jitter and intermittent conduction. The current will fluctuate with the contact state, generating "pulse heating" and causing the probe tip temperature to rise. To avoid the impact of probe tip overheating on circuit board testing, a cooling component can be used to cool the probe tip in a timely manner, ensuring the effectiveness of the probe tip in testing the circuit board.

[0022] 5. When the probe tip heats up due to wear, it expands, increasing in size. Consequently, the expansion may not be detected during probe tip wear thickness compensation. This expansion affects the accuracy of wear thickness compensation, leading to abnormal test pressure on the circuit board and unstable testing. Increased test pressure also exacerbates probe tip wear. Therefore, a cooling component is installed to cool the probe tip, reducing the impact of expansion on wear thickness compensation, improving thickness compensation accuracy, ensuring stability of circuit board testing, and extending the probe tip's lifespan.

[0023] 6. As the probe tip reaches the abnormal wear thickness, the spacer block penetrates to the bottom surface of the probe tip, further increasing the surface roughness. Consequently, the probe tip generates even more heat during circuit board testing. By employing an air outlet duct structure equipped with an air adjustment component, the air outlet rate can be increased, improving the cooling effect on the probe tip and further reducing its thermal expansion. This ensures the thickness compensation accuracy of the probe tip under abnormal wear conditions and guarantees the stability of circuit board testing under such conditions.

[0024] 7. When the probe tip reaches the abnormal wear thickness and begins to descend to compensate for the wear thickness, the sliding pusher slides downward in the sliding hole and adjusts the air conditioning component in conjunction with it. This causes the air outlet pipe to increase the air outlet rate synchronously, and the air conditioning component to increase the air outlet rate in sync with the wear compensation. This achieves dynamic adjustment of the air outlet rate, improves the adjustment efficiency of the air outlet rate, enhances the cooling effect, effectively reduces the probe tip temperature, ensures the wear thickness compensation accuracy under abnormal wear thickness, and further ensures the stability of circuit board testing under abnormal wear conditions.

[0025] 8. The indicator lights can provide feedback on the device's working status based on the monitoring data received by the main controller, thus enabling visualization of the test status. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the functional testing device for the multi-station circuit board of the present invention.

[0027] Figure 2 This is a cross-sectional view of the back structure of the multi-station circuit board functional testing device of the present invention.

[0028] Figure 3 This is a schematic diagram of the probe assembly structure of the present invention.

[0029] Figure 4 This is a cross-sectional view of the internal structure of the probe assembly of the present invention.

[0030] Figure 5 for Figure 4 A magnified schematic diagram of the structure at point A in the middle.

[0031] Figure 6 This is a cross-sectional view of the connection between the spacer block and the probe head under abnormal wear conditions according to the present invention.

[0032] Figure 7 This is a schematic diagram of the connection structure between the motion control component and the cooling component of the present invention.

[0033] Figure 8 This is a schematic diagram of the mobile control component structure of the present invention.

[0034] Figure 9 This is a cross-sectional view of the internal connection structure of the cooling component of the present invention.

[0035] Figure 10 This is a cross-sectional view of the internal connection structure between the motion control component and the cooling component of the present invention.

[0036] Figure 11 This is a schematic diagram of the functional testing machine of the present invention.

[0037] Figure 12 This is a schematic diagram of the internal structure of the functional testing machine of the present invention.

[0038] Explanation of the numbers in the diagram: 100, Main controller; 110, Indicator light; 200, Servo motor; 300, Screw; 400, Fixing plate; 500, Movement control component; 510, Fixing block; 520, Lifting block; 530, Clamping and pushing component; 531, Positioning bolt; 532, Limiting post; 533, Sliding cylinder; 534, Limiting plate; 535, Knob; 536, First spring; 600, Cooling component; 610, Fan; 620, Air outlet duct; 621, Sliding hole; 630, Air adjustment component; 631, Push plate; 632, Connecting rod; 633. Second spring; 634, First air guide block; 640, Second air guide block; 700, Probe assembly; 710, Probe cylinder; 711, First wire; 712, Retaining ring; 720, Second wire; 730, Infrared temperature sensor; 740, Probe body; 741, Fixing cylinder; 742, Distance measuring cavity; 750, Probe head; 751, Distance block; 760, Third spring; 770, Distance sensor; 800, Circuit board; 900, Body assembly; 910, Test chassis; 920, Housing; 930, Lifting platform; 940, Electric slide block. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0040] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0041] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or a link; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0042] Reference Figures 1-12 This application provides a functional testing device for a multi-station circuit board, including a main controller 100. An indicator light 110 is connected to one side of the main controller 100, and a cooling assembly 600 is fixed to the other side of the main controller 100. The bottom end of the cooling assembly 600 is an air outlet. A fixing plate 400 is connected to one side of the cooling assembly 600, and a servo motor 200 is fixed to one side of the main controller 100. A screw 300 is connected to the bottom end of the servo motor 200, and the bottom end of the screw 300 is rotatably connected to the inside of the fixing plate 400. A movement control component 500 is threaded onto the outer wall. One side of the movement control component 500 is slidably connected to the inside of the cooling component 600. A probe component 700 is inserted inside the movement control component 500. The probe component 700 is a telescopic structure. When the probe component 700 is retracted, its bottom end is on the same horizontal centerline as the air outlet end of the cooling component 600. The movement control component 500 is lowered by rotating the screw 300, so that the probe component 700 is lowered to adjust the bonding test pressure of the bottom end of the probe component 700 against the circuit board 800. The probe assembly 700 includes a probe cylinder 710 inserted into the movement control assembly 500, a probe body 740 inserted into the probe cylinder 710, a third spring 760 connected between the top of the probe body 740 and the inside of the probe cylinder 710, a probe head 750 connected to the bottom of the probe body 740, a first wire 711 electrically connected between the top of the probe cylinder 710 and the bottom surface of the main controller 100, and the probe cylinder 710, the probe body 740 and the probe head 750 electrically connected to transmit test data to the main controller 100. A wear test component for monitoring the wear thickness of the probe head 750 is disposed through the inside of the probe cylinder 710 and the probe body 740, and the top of the wear test component is electrically connected to the bottom surface of the main controller 100. Servo motor 200 drives screw 300 to move control component 500 up and down, which can accurately adjust the contact test pressure of probe component 700 on circuit board 800. With the buffering effect of third spring 760, abnormal pressure is avoided to prevent damage to circuit board 800. The test pressure adjustment accuracy is greatly improved and the damage rate of circuit board 800 is reduced. The damage testing component can monitor the wear status of the probe tip 750 in real time, and the data is transmitted to the main controller 100 in real time via wires, avoiding test errors caused by probe wear and improving the accuracy of test data. The wear thickness of the probe head 750 is monitored by the damage testing component. Based on the detected wear thickness, the main controller 100 uses the servo motor 200 to drive the screw 300 to move the control component 500 up and down, thereby compensating for the wear thickness of the probe head 750 and ensuring the stability of the test pressure of the probe head 750 on the circuit board 800, thus improving the stability and accuracy of the test board. The air outlet of the cooling component 600 is flush with the bottom of the probe component 700 in the retracted state, which can directly blow air to cool the probe head 750. The cooling component 600 and the probe component 700 are reasonably matched, and the cooling is timely, avoiding the accelerated wear of the probe head 750 due to high temperature, extending the service life of the probe head 750, and reducing equipment maintenance costs. Indicator light 110 can provide feedback on the device's working status based on the monitoring data received by the main controller 100, thus enabling visualization of the test status.

[0043] In this embodiment, the damage testing component includes a second wire 720 that runs through the probe cylinder 710 and the probe body 740. The top end of the second wire 720 is electrically connected to the bottom surface of the main controller 100, and the bottom end of the second wire 720 is connected to a ranging sensor 770. A ranging cavity 742 is provided inside the bottom end of the probe body 740, and the ranging sensor 770 is disposed inside the ranging cavity 742. A distance fixing block 751 is inserted into the probe head 750, and the top end of the distance fixing block 751 is inserted into the ranging cavity 742. The ranging sensor 770 and the distance fixing block 751 are disposed on the same vertical centerline, and the thickness between the bottom surface of the probe head 750 and the bottom surface of the distance fixing block 751 is set as the normal wear thickness. After the bottom surface of the probe head 750 is worn to eliminate the normal wear thickness, the bottom end of the spacer block 751 penetrates through the bottom surface of the probe head 750. The probe head 750 is set to an abnormal wear state. In the abnormal wear state, the thickness of the probe head 750 is reduced through wear, and the bottom surface of the spacer block 751 is pushed up by the circuit board 800 to keep it flush with the worn bottom surface of the probe head 750, so that the spacer block 751 rises inside the probe head 750. The rising distance of the spacer block 751 is set to the abnormal wear thickness, and is detected by the distance measuring sensor 770. The ranging sensor 770 is coaxially set with the distance block 751, which can accurately capture the displacement change of the distance block 751 and thus accurately calculate the wear thickness of the probe head 750. Compared with the external monitoring structure, the built-in damage measurement component has stronger anti-interference ability, reduces the measurement error of wear data, and avoids the influence of environmental factors on the monitoring results. By setting a normal wear thickness threshold, normal and abnormal wear states can be clearly defined. During normal wear, the monitoring distance of the ranging sensor 770 remains unchanged. During abnormal wear, the abnormal wear thickness can be accurately obtained by the rising distance of the distance-fixing block 751, thus realizing the graded judgment of wear state. This provides accurate data basis for subsequent pressure compensation and other operations of the main controller 100, reduces the probability of incorrect adjustment, and further improves the reliability of test data. Moreover, the data is quickly transmitted to the main controller 100 via the second wire 720, resulting in a rapid response.

[0044] In this embodiment, the bottom end of the probe body 740 and the top surface of the probe head 750 are detachably connected. When the probe head 750 reaches the scrap thickness or malfunctions, it is not necessary to disassemble the entire probe assembly 700. Only the damaged probe head 750 needs to be disassembled separately, which greatly simplifies the replacement process, shortens equipment downtime, reduces consumable costs by replacing the probe head 750 separately, and makes the replacement operation convenient. The replacement time of a single set of probe heads 750 is shortened, ensuring the continuity of batch circuit board 800 testing.

[0045] In this embodiment, a fixing cylinder 741 is fixed at the bottom of the probe body 740. The fixing cylinder 741 is connected to the inside of the ranging cavity 742. The fixing cylinder 741 is threaded to the inside of the probe head 750. The top of the distance measuring block 751 is inserted into the inside of the fixing cylinder 741. The threaded connection between the fixed cylinder 741 and the probe head 750 ensures a stable connection, preventing poor contact caused by loose probe head 750 during testing. The high coaxiality after connection ensures precise alignment between probe head 750 and the test point on circuit board 800. The threaded structure facilitates disassembly and is not easily damaged, maintaining good connection accuracy even after multiple replacements, further enhancing the durability and testing stability of the equipment. The fixed cylinder 741 is connected to the ranging cavity 742, which does not affect the normal movement of the distance block 751 or the monitoring of the ranging sensor 770, ensuring that the wear monitoring function is not affected.

[0046] In this embodiment, the probe assembly 700 further includes an infrared temperature sensor 730 sleeved and fixed to the outer wall of the probe body 740. The infrared temperature sensor 730 is disposed on the top of the probe head 750 to monitor the temperature of the probe head 750. The infrared temperature sensor 730 is sleeved on the outer wall of the probe body 740 and located on the top of the probe head 750. It can capture the temperature data of the probe head 750 in real time. When the temperature is abnormal, it can promptly feed back to the main controller 100, providing data support for the main controller 100 to determine whether the cooling effect needs to be enhanced. This prevents the probe head 750 from being damaged due to high temperature, making up for the shortcoming of traditional equipment that lacks temperature monitoring of the probe head 750. It can provide early warning of high temperature risks, avoid performance degradation of the probe head 750 due to high temperature, and extend the service life of the probe head 750. At the same time, it avoids the impact of high temperature on the conductivity of the test, ensuring the stability and accuracy of the test data.

[0047] In this embodiment, the movement control component 500 includes a lifting block 520 threaded onto the outer wall of the screw 300, a fixing block 510 fixed to the side wall of the lifting block 520, a clamping and pushing component 530 connected to one side of the fixing block 510, one end of the clamping and pushing component 530 clamping and adhering to the outer wall of the probe cylinder 710, and one side of the clamping and pushing component 530 slidingly connected to the inside of the cooling component 600. The lifting block 520 engages with the screw 300 via threads. When the servo motor 200 drives the screw 300 to rotate, the lifting block 520 can smoothly rise and fall, driving the fixed block 510 and the probe assembly 700 to move precisely, significantly reducing the positioning error of the probe assembly 700. The clamping and pushing component 530 clamps the outer wall of the probe cylinder 710, effectively fixing the probe assembly 700 and preventing it from shaking during testing. The probe assembly 700 is firmly fixed, enhancing the consistency of test data and meeting the testing requirements of the high-precision circuit board 800. The clamping and pushing component 530 is slidably connected to the cooling component 600, further limiting the movement trajectory of the movement control component 500 and ensuring the stability of the lifting process.

[0048] In this embodiment, the clamping and pushing component 530 includes a positioning bolt 531 threadedly connected to the side wall of the fixing block 510. One end of the positioning bolt 531 is slidably sleeved with a sliding push cylinder 533. A first spring 536 is connected between one end of the positioning bolt 531 and the inside of the sliding push cylinder 533. A knob 535 is fixed on one side of the sliding push cylinder 533. An L-shaped limiting plate 534 is fixed on the bottom surface of the sliding push cylinder 533. Two limiting plates 534 are fixed in mirror image about the vertical center line of the sliding push cylinder 533. Multiple limiting posts 532 are fixed on the outer wall of the positioning bolt 531. The limiting posts 532 are inserted into the inside of the sliding push cylinder 533. The sliding push cylinder 533 is slidably connected to the inside of the cooling component 600. By rotating the sliding push cylinder 533, under the restriction of the limiting post 532, the positioning bolt 531 is driven to rotate and clamp onto the side wall of the probe cylinder 710. Under the pulling force of the first spring 536, the sliding push cylinder 533 is inserted into the sliding hole 621, so that the L-shaped limiting plate 534 can be precisely connected with the air regulating component 630, realizing the linkage between the clamping push component 530 and the cooling component 600. The clamping push component 530 has both fixing and linkage functions, and the disassembly operation is convenient, which greatly improves the efficiency of the probe component 700 maintenance and reduces the equipment downtime maintenance time.

[0049] In this embodiment, the cooling assembly 600 includes a fan 610 fixed to the side wall of the main controller 100. The bottom surface of the fan 610 is connected to an air outlet pipe 620. The bottom end of the air outlet pipe 620 is provided with an opening structure. A sliding hole 621 is provided through the air outlet pipe 620. An air regulating component 630 is provided through the bottom surface of the sliding hole 621 and the air outlet pipe 620. A second air guide block 640 is fixed inside the air outlet pipe 620. Two second air guide blocks 640 are provided mirror images of the vertical center line of the air outlet pipe 620. The air regulating component 630 is provided between the two second air guide blocks 640 to adjust the air outlet rate inside the air outlet pipe 620. A sliding push cylinder 533 is slidably connected inside the sliding hole 621. The top end of the air regulating component 630 is inserted between two limiting plates 534. The air regulating component 630 is pushed to move inside the air outlet pipe 620 by the sliding push cylinder 533. The fan 610 blows air to the probe head 750 for cooling through the air outlet duct 620. The air regulating component 630 is located between the two second air guide blocks 640. It can change the ventilation gap by moving, avoiding the problem of unreasonable cooling caused by fixed wind speed, and saving energy while ensuring cooling effect. When the sliding push cylinder 533 slides in the sliding hole 621, it can push the air regulating component 630 to move and link with the air regulating component 630. There is no need for an additional drive structure to control the air regulating component 630, which simplifies the equipment structure and reduces manufacturing costs. When the probe head 750 wears more and the temperature rises, the air regulating component 630 increases the air outlet rate in sync with the wear compensation, realizing dynamic adjustment of the air outlet rate and improving the cooling effect.

[0050] In this embodiment, the air regulating component 630 includes a connecting rod 632 that runs through the interior of the air outlet duct 620. A push plate 631 is fixed to the top of the connecting rod 632 and is inserted between two limiting plates 534. A first air guide block 634 with an isosceles trapezoidal structure is fixed to the bottom of the connecting rod 632. A second spring 633 is sleeved on the outer wall of the connecting rod 632 and is connected between the inner wall of the air outlet duct 620 and the top surface of the first air guide block 634. The second air guide block 640 has a triangular structure, and a ventilation gap is formed between the inclined surface of the first air guide block 634 and the inclined surface of the second air guide block 640. The isosceles trapezoidal first air guide block 634 cooperates with the triangular second air guide block 640 to precisely adjust the airflow rate by changing the gap between them, greatly improving the airflow adjustment accuracy. It can accurately match the cooling intensity according to the actual state of the probe head 750. The second spring 633 can pull the first air guide block 634 to reset when the air adjustment component 630 loses thrust, ensuring that the cooling airflow speed returns to the initial state without manual intervention, simplifying the operation process and further improving the automation level and ease of use of the equipment. The push plate 631 and the limit plate 534 are precisely connected to ensure that the sliding push cylinder 533 can stably push the air adjustment component 630 to move, and the adjustment response is rapid.

[0051] In this embodiment, a retaining ring is sleeved and fixed on the outer wall of the probe cylinder 710, and the retaining ring is fitted to the bottom surface of the fixing block 510. By setting a retaining ring on the outer wall of the probe cylinder 710 that fits to the bottom surface of the fixing block 510, the positioning of the probe cylinder 710 on the fixing block 510 can be achieved, ensuring the stability of the probe cylinder 710 fixed on the fixing block 510 when the probe cylinder 710 is pushed by the third spring 760 when it moves downward for testing.

[0052] This application provides a multi-station circuit board functional testing machine. The functional testing machine includes a body assembly 900 and multiple sets of functional testing devices disposed inside the body assembly 900. The body assembly 900 includes a housing 920. A test chassis 910 is disposed on the top surface of the housing 920. A lifting platform 930 is disposed on the bottom surface inside the housing 920. The lifting platform 930 is used to position and place the circuit board 800. An electric slide 940 is disposed inside the housing 920. Multiple sets of functional testing devices are connected to the electric slide 940. The functional testing devices are moved and disposed on the top of the circuit board 800 by the electric slide 940. The circuit board 800 is pushed up by the lifting platform 930 so that the bottom of the functional testing device is in contact with the test top surface of the circuit board 800. The machine is equipped with multiple sets of functional testing devices, which can test multiple circuit boards 800 simultaneously, greatly improving batch testing efficiency and meeting the testing needs of large-scale circuit board 800 production. The electric slide 940 can move the functional testing devices, and the lifting platform 930 can push the circuit board 800 up to fit the testing devices. The two work together to adapt to circuit boards 800 of different sizes and test positions. The test chassis 910 works with the main controller 100 to centrally process the data from multiple sets of testing devices and realize centralized control of the testing process.

[0053] Specifically, according to Figures 1-12As shown, two circuit boards 800 required for electric vehicle production are positioned on a lifting platform 930. Two sets of functional testing devices are moved to the top of the circuit boards 800 via an electric sliding mechanism 940, positioning the probe head 750 above the test point on the circuit board 800. Both the lifting platform 930 and the electric sliding mechanism 940 are existing technologies. The lifting platform 930 is then activated to rise, placing the probe head 750 against the test point on the circuit board 800. The probe head 750 pushes the probe body 740 to insert further into the probe cylinder 710, compressing the third spring 760. The probe head 750, probe body 740, and probe cylinder 710... The first wire 711 transmits test data to the main controller 100. The main controller 100 further transmits the data to the test chassis 910 and adjusts the test pressure of the probe head 750 according to the normal data. By starting the servo motor 200 to drive the screw 300 to rotate, the lifting block 520 drives the fixed block 510 to descend. The fixed block 510 drives the probe assembly 700 to descend as a whole. The probe head 750 is adjusted to ensure that the test data is within the error range even at the maximum test pressure. Before the bottom surface of the probe head 750 is worn away to eliminate the normal wear thickness, the test pressure of the probe head 750 on the motherboard can still ensure that the test data is within the error range. After adjusting the test pressure, place the two circuit boards 800 to be tested on the lifting platform 930. With the cooperation of the electric sliding block 940 and the lifting platform 930, the probe head 750 performs contact testing on the circuit board 800 to be tested, uploads test data, and the probe body 740 is inserted into the probe tube 710, compressing the third spring 760. The air outlet at the bottom of the air outlet 620 is flush with the probe head 750, and the fan 610 is started. Air is discharged through the air outlet 620 to cool the probe head 750. After the test, the lifting platform 930 is lowered, the third spring 760 pushes the probe body 740 to extend out of the probe tube 710, and the air outlet 620 discharges air to cool the extended probe body 740. Then, another circuit board 800 to be tested is replaced. As more and more circuit boards 800 are continuously tested, the probe head 750 begins to wear. Within the normal wear thickness, the distance block 751 remains positioned inside the probe head 750. The distance sensor 770 monitors the constant distance to the distance block 751 and uploads the normal distance data to the main controller 100 via the first wire 711. The main controller 100 controls the indicator light 110 to turn green. As the probe head 750 is tested frequently, its temperature rises. The infrared temperature sensor 730 monitors this and transmits the monitored temperature data to the main controller 100. The probe head 750 expands due to heat. The main controller 100 uses the thermal expansion formula to determine the expansion size at the bottom of the probe head 750. This expansion size can be used to offset the normal wear, thus maintaining the test pressure of the probe head 750 and ensuring the stability of the test on the circuit board 800. Subsequently, as the probe head 750 wears further, the normal wear thickness of the probe head 750 is eliminated, and the bottom end of the distance block 751 penetrates the worn bottom surface of the probe head 750. During the next test of the circuit board 800, the circuit board 800 begins to push the distance block 751 against it. The distance sensor 770 detects that the distance block 751 has risen, and the rising distance of the distance block 751 is the abnormal wear thickness. This abnormal wear thickness data is transmitted to the main controller 100, and the main controller 100 controls the indicator light 110 to turn yellow. After abnormal wear, the temperature of the probe head 750 rises, and the heat... The expansion size cannot compensate for the wear size, and under continuous high temperature, the abnormal wear of the probe tip 750 will be further increased. In order to ensure the service life of the probe tip 750, the test pressure, and the stability of the test data, the main controller 100 starts the motor to drive the screw 300 to rotate according to the abnormal wear thickness data, so that the lifting block 520 drives the fixed block 510 to descend, and the fixed block 510 drives the probe assembly 700 to descend as a whole, in order to compensate for the abnormal wear thickness of the probe tip 750, ensure the detection pressure of the probe tip 750, and thus ensure that the detection data is within the error range. Simultaneously, the fixing block 510 drives the clamping and pushing component 530 to slide inside the sliding hole 621. The sliding push cylinder 533 pushes the push plate 631 to lower the connecting rod 632. The connecting rod 632 pushes the first air guide block 634 to lower. The first air guide block 634 stretches the second spring 633, increasing the gap between the first air guide block 634 and the second air guide block 640. This increases the airflow rate inside the air outlet pipe 620, thereby improving the cooling effect on the probe head 750. As the abnormal wear thickness increases, the probe head 750 lowers to compensate for the wear thickness, while improving the cooling effect of the air outlet pipe 620 on the probe head 750 and extending the service life of the probe head 750. Finally, when the abnormal wear of the probe head 750 exceeds the preset scrap thickness, the distance sensor 770 can detect that the abnormal wear thickness of the distance block 751 has reached the scrap thickness and transmit the detection data to the main controller 100. The main controller 100 controls the indicator light 110 to be red. By observing the function testing device with the red indicator light 110, the staff can accurately replace the probe head 750 that has reached the scrap thickness. By rotating the probe head 750 to separate it from the fixed cylinder 741, a new probe head 750 can be replaced. After the circuit board 800 has been tested by the functional testing device for a long time, the probe assembly 700 is periodically removed from the fixing block 510 for inspection and maintenance. By pulling the knob 535, the sliding push cylinder 533 is pulled out from the sliding hole 621, so that the push plate 631 is separated from the limiting plate 534. Then, by rotating the knob 535, under the restriction of the limiting post 532, the sliding push cylinder 533 drives the positioning bolt 531 to rotate synchronously, and then the probe cylinder 710 is pulled out from the fixing block 510, which improves the convenience of removing the probe assembly 700 for inspection and maintenance.

[0054] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. All electrical components mentioned herein are electrically connected to the main controller and 220V AC mains power, and the main controller is a common existing technology such as a computer that performs control functions. Content not described in detail in this specification is prior art known to those skilled in the art.

[0055] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A functional testing device for multi-station circuit boards, characterized in that: The device includes a main controller, with an indicator light connected to one side and a cooling component fixed to the other side. The bottom of the cooling component is the air outlet. A fixing plate is connected to one side of the cooling component, and a servo motor is fixed to one side of the main controller. A screw is connected to the bottom of the servo motor, and the bottom of the screw is rotatably connected to the inside of the fixing plate. A movement control component is threaded onto the outer wall of the screw. One side of the movement control component is slidably connected to the inside of the cooling component. A probe component is inserted into the movement control component. The probe component is a telescopic structure. When the probe component is retracted, its bottom end is on the same horizontal centerline as the air outlet of the cooling component. The movement control component descends by rotating the screw, thereby lowering the probe component to adjust the bonding test pressure of the bottom end of the probe component on the circuit board. The probe assembly includes a probe tube inserted into the motion control assembly, a probe body inserted inside the probe tube, a third spring connecting the top of the probe body to the inside of the probe tube, a probe head connected to the bottom of the probe body, a first wire electrically connecting the top of the probe tube to the bottom surface of the main controller, and the probe tube, probe body, and probe head being electrically connected to each other for transmitting test data to the main controller. A damage measuring component for monitoring the wear thickness of the probe head is disposed through the inside of the probe tube and probe body, and the top of the damage measuring component is electrically connected to the bottom surface of the main controller.

2. The multi-station circuit board functional testing device according to claim 1, characterized in that: The damage testing component includes a second wire that runs through the probe cylinder and probe body. The top end of the second wire is electrically connected to the bottom surface of the main controller. A distance sensor is connected to the bottom end of the second wire. A distance measuring cavity is provided inside the bottom end of the probe body. The distance measuring sensor is located inside the distance measuring cavity. A distance fixing block is inserted into the probe head. The top end of the distance fixing block is inserted into the distance measuring cavity. The distance measuring sensor and the distance fixing block are located on the same vertical centerline. The thickness between the bottom surface of the probe head and the bottom surface of the distance fixing block is set to the normal wear thickness. After the bottom surface of the probe head is worn down to eliminate the normal wear thickness, the bottom end of the spacer block penetrates through the bottom surface of the probe head. The probe head is set to an abnormal wear state. In the abnormal wear state, the thickness of the probe head is reduced through wear, and the bottom surface of the spacer block is pushed up by the circuit board to keep it flush with the worn bottom surface of the probe head, so that the spacer block rises inside the probe head. The rising distance of the spacer block is set to the abnormal wear thickness and is detected by the distance measuring sensor.

3. The multi-station circuit board functional testing device according to claim 2, characterized in that: The bottom end of the probe body and the top surface of the probe head are detachably connected.

4. The multi-station circuit board functional testing device according to claim 3, characterized in that: The bottom of the probe body is fixed with a fixing cylinder, which is connected to the inside of the ranging cavity. The fixing cylinder is threaded into the inside of the probe head, and the top of the distance measuring block is inserted into the inside of the fixing cylinder.

5. The multi-station circuit board functional testing device according to claim 1, characterized in that: The probe assembly also includes an infrared temperature sensor sleeved and fixed to the outer wall of the probe body. The infrared temperature sensor is located on the top of the probe head to monitor the probe head temperature.

6. The multi-station circuit board functional testing device according to claim 1, characterized in that: The movement control component includes a lifting block threaded onto the outer wall of the screw, a fixing block fixed to the side wall of the lifting block, a clamping and pushing component connected to one side of the fixing block, one end of the clamping and pushing component clamping and fitting against the outer wall of the probe cylinder, and one side of the clamping and pushing component slidingly connected to the inside of the cooling component.

7. The multi-station circuit board functional testing device according to claim 6, characterized in that: The clamping and pushing component includes a positioning bolt threaded to the side wall of the fixed block. One end of the positioning bolt is slidably sleeved with a sliding push cylinder. A first spring is connected between one end of the positioning bolt and the inside of the sliding push cylinder. A knob is fixed on one side of the sliding push cylinder. An L-shaped limiting plate is fixed on the bottom surface of the sliding push cylinder. Two limiting plates are fixed in mirror image about the vertical center line of the sliding push cylinder. Multiple limiting posts are fixed on the outer wall of the positioning bolt. The limiting posts are inserted into the inside of the sliding push cylinder. The sliding push cylinder is slidably connected to the inside of the cooling component.

8. The multi-station circuit board functional testing device according to claim 7, characterized in that: The cooling assembly includes a fan fixed to the side wall of the main controller. The bottom surface of the fan is connected to an air outlet pipe. The bottom end of the air outlet pipe has an opening structure. A sliding hole is provided through the air outlet pipe. An air regulating component is provided through the bottom surface of the sliding hole and the air outlet pipe. A second air guide block is fixed inside the air outlet pipe. There are two second air guide blocks mirrored about the vertical center line of the air outlet pipe. The air regulating component is located between the two second air guide blocks to adjust the air outlet speed inside the air outlet pipe. A sliding push cylinder is slidably connected inside the sliding hole. The top of the air regulating component is inserted between two limiting plates. The air regulating component moves inside the air outlet pipe by being pushed by the sliding push cylinder.

9. The multi-station circuit board functional testing device according to claim 8, characterized in that: The air regulating component includes a connecting rod that runs through the inside of the air outlet duct. A push plate is fixed to the top of the connecting rod and inserted between two limiting plates. A first air guide block with an isosceles trapezoidal structure is fixed to the bottom of the connecting rod. A second spring is sleeved on the outer wall of the connecting rod and is connected between the inner wall of the air outlet duct and the top surface of the first air guide block. The second air guide block has a triangular structure, and ventilation gaps are formed between the inclined surfaces of the first and second air guide blocks.

10. A multi-station circuit board functional testing machine, characterized in that: The multi-station circuit board functional testing device according to any one of claims 1-9 includes a body assembly and multiple sets of functional testing devices disposed inside the body assembly. The body assembly includes a housing, a test chassis is disposed on the top surface of the housing, and a lifting platform is disposed on the bottom surface inside the housing. The lifting platform is used to position and place the circuit board. An electric slide is disposed inside the housing, and multiple sets of functional testing devices are connected to the electric slide. The functional testing devices are moved and disposed on the top of the circuit board by the electric slide. The circuit board is pushed up by the lifting platform so that the bottom of the functional testing device is in contact with the top surface of the circuit board.

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