A carrier probe automatic cleaning device

By designing an automatic cleaning device for the carrier probe, the coordinated movement of components is used to achieve efficient cleaning of the carrier probe, which solves the problems of flaw detection interference and probe damage caused by impurity adhesion and extends the service life.

CN122124998APending Publication Date: 2026-06-02BEIJING LEAD TIME SCI & TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING LEAD TIME SCI & TECH
Filing Date
2026-04-29
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

In wheel rim and spoke flaw detection systems, the carrier probe is prone to being contaminated with impurities such as oil, rust, and dust during the detection process, leading to jamming and damage, which affects the accuracy of the flaw detection results and the service life of the probe.

Method used

Design an automatic cleaning device for a carrier probe, including a mounting component, a control component, a first moving component, a second moving component, and a cleaning head. Through the coordinated movement of these components, the cleaning head can be aligned with the carrier probe to clean and remove impurities.

Benefits of technology

It effectively removes impurities from the carrier probe, reduces interference with the flaw detection results, and extends the service life of the carrier fixture and probe.

✦ Generated by Eureka AI based on patent content.

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Abstract

This invention relates to an automatic cleaning device for a carrier probe, belonging to the field of wheel rim flaw detection technology, and solves the technical problem that impurities on the wheel rim easily interfere with the flaw detection effect. The automatic cleaning device for the carrier probe includes a mounting assembly, a control assembly, a first moving assembly, a second moving assembly, and a cleaning head. The mounting assembly is installed on the rail; the control assembly is installed on the mounting assembly; the first moving assembly is installed on one side of the control assembly; the second moving assembly is installed on the first moving assembly and moves along a second direction; the cleaning head is installed on the second moving assembly. Therefore, this automatic cleaning device for the carrier probe, through the first and second moving assemblies, aligns the cleaning head with the carrier probe, better cleaning the carrier probe, reducing impurities adhering to the carrier probe, and extending the service life of the carrier clamp and the probe itself.
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