Automated image analysis system for RF measurement data extraction
By using an automated image analysis system to detect and correct screenshots of RF measurement data using a large language model (LLM), the problem of cumbersome and inaccurate manual operation in existing technologies is solved, achieving efficient and accurate data extraction and analysis.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- KEYSIGHT TECHNOLOGIES INC
- Filing Date
- 2025-07-23
- Publication Date
- 2026-06-02
AI Technical Summary
Existing test and measurement instruments lack embedded and automated tools to identify and process image data, resulting in a large amount of manual work required to convert data from screenshots and inaccurate results, especially when processing RF measurement data.
An automated image analysis system is provided, which uses a large language model (LLM) to detect header information, trajectory identifiers and grid coordinates in measurement screenshots, calculates error estimates through an error correction module, and finally generates formatted measurement data.
It simplifies image processing commands, improves the accuracy and efficiency of data extraction, reduces manual operations, enables efficient identification and extraction of multiple trajectories, ensures the accuracy of unit identification, and provides a unified data retrieval and analysis environment.
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