Automated image analysis system for RF measurement data extraction

By using an automated image analysis system to detect and correct screenshots of RF measurement data using a large language model (LLM), the problem of cumbersome and inaccurate manual operation in existing technologies is solved, achieving efficient and accurate data extraction and analysis.

CN122134608APending Publication Date: 2026-06-02KEYSIGHT TECHNOLOGIES INC

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
KEYSIGHT TECHNOLOGIES INC
Filing Date
2025-07-23
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Existing test and measurement instruments lack embedded and automated tools to identify and process image data, resulting in a large amount of manual work required to convert data from screenshots and inaccurate results, especially when processing RF measurement data.

Method used

An automated image analysis system is provided, which uses a large language model (LLM) to detect header information, trajectory identifiers and grid coordinates in measurement screenshots, calculates error estimates through an error correction module, and finally generates formatted measurement data.

Benefits of technology

It simplifies image processing commands, improves the accuracy and efficiency of data extraction, reduces manual operations, enables efficient identification and extraction of multiple trajectories, ensures the accuracy of unit identification, and provides a unified data retrieval and analysis environment.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure BDA0005513389400000111
    Figure BDA0005513389400000111
  • Figure BDA0005513389400000121
    Figure BDA0005513389400000121
  • Figure HDA0005513389410000011
    Figure HDA0005513389410000011
Patent Text Reader

Abstract

A system for automated image analysis and data extraction includes: an image input module configured to receive a measurement screenshot; an image recognition module configured to detect header information, trajectory identifiers, and grid coordinates from the measurement screenshot; a data processing module configured to convert pixel coordinates into measurement values ​​based on the detected header information and grid coordinates; an error correction module configured to calculate an error estimate and apply the error estimate to the converted measurement values; and an output module configured to generate formatted measurement data based on the error-corrected converted measurement values.
Need to check novelty before this filing date? Find Prior Art