In-cloud supersaturation measuring device and measuring method

Abstract

The application discloses a cloud over-saturation measuring device, comprising a laser, a laser driver connected to an input end of the laser, and an optical processing assembly, a first tuning assembly and a measuring assembly arranged on an output optical axis of the laser in sequence; an output end of the optical processing assembly is further provided with a second tuning assembly, the second tuning assembly is arranged perpendicularly to the first tuning assembly, and the first tuning assembly and the second tuning assembly are jointly connected with a frequency stabilizing assembly; the application further discloses a cloud over-saturation measuring method, which is measured and calculated by using the cloud over-saturation measuring device, and solves the problems of cloud water adhesion saturation, insufficient spectral resolution of a semiconductor laser and temperature and water vapor height coupling in the prior art.

Description

Technical Field

[0001] This invention belongs to the technical field of supersaturation measurement devices, specifically relating to a supersaturation measurement device within a cloud, and also to a method for measuring supersaturation within a cloud. Background Technology

[0002] Cloud supersaturation describes the relative degree to which the actual water vapor pressure in the atmosphere exceeds the saturation water vapor pressure. It is a key parameter driving cloud droplet nucleation, condensation / evaporation, and phase transition, significantly influencing cloud evolution. Cloud evolution is a crucial link in the water cycle, significantly impacting weather, climate, atmospheric chemistry, and weather modification, and is one of the most uncertain factors in weather and climate models. Cloud supersaturation is the critical threshold for aerosol particles to activate into cloud condensation nuclei (CCNs) or ice nuclei (INs), directly determining the initial concentration and size distribution of cloud droplets / ice crystals. It also controls the phase transition rate between liquid water and ice crystals, affecting cloud radiation characteristics and precipitation efficiency. In the interaction between cloud thermodynamic equilibrium and phase transition processes, temperature dominates the water vapor phase transition threshold. Water vapor phase transition is accompanied by significant latent heat release or absorption. Cloud inhomogeneity leads to a strong correlation between the spatiotemporal distribution of temperature and water vapor. Therefore, a strong coupling relationship exists between temperature and water vapor; small changes in these temperatures result in a nonlinear response of supersaturation, triggering abrupt changes in the cloud's microphysical state.

[0003] Under supersaturated conditions, cloud water vapor concentrations are extremely high, making contact temperature sensors (such as thermocouples and dew point meters) prone to saturation or drift, and their slow response speed makes them unable to capture rapid dynamics within the cloud. Mainstream optical methods for detecting water vapor include laser absorption spectroscopy, Raman lidar, microwave radiometers, and millimeter-wave radar. Laser absorption spectroscopy is widely used due to its high sensitivity and selectivity, but it generally assumes a uniform path, fails to separate temperature coupling effects, and is susceptible to interference from factors such as laser intensity fluctuations, optical window contamination, and fluctuations in the intensity of light scattered by aerosols and cloud droplets, leading to a decrease in the signal-to-noise ratio and accuracy. Raman lidar technology inverts water vapor density by analyzing the Raman scattering signal intensity of water vapor and calculates cloud supersaturation using temperature-dependent Raman cross-sections, but has low vertical resolution. Microwave radiometers and millimeter-wave radar utilize the microwave absorption characteristics of water vapor and invert temperature and humidity profiles using radiative transfer models, enabling all-weather operation and wide coverage, but requiring complex data synchronization and fusion algorithms, demanding high operator expertise, and exhibiting low spatial resolution. Existing technologies cannot meet the urgent need for in-situ measurements of rapid changes, high interference resistance, and high precision within clouds. There is an urgent need to develop high-precision in-situ measurement technology for supersaturation within clouds, reveal the coupling mechanism of temperature and water vapor on supersaturation, and lay the foundation for data support and technical assurance for improving the theoretical understanding of cloud evolution processes and the development of parameterization schemes. Summary of the Invention

[0004] The purpose of this invention is to provide a cloud supersaturation measurement device, which solves the problems of cloud water adhesion saturation, insufficient spectral resolution of semiconductor lasers, and high coupling between temperature and water vapor in the prior art.

[0005] Another objective of this invention is to provide a method for measuring supersaturation within clouds, which solves the problems of baseline drift interference and the impact of temperature and water vapor coupling on measurement accuracy in the prior art.

[0006] The technical solution adopted in this invention is a cloud supersaturation measurement device, including a laser, a laser driver connected to the laser input end, and a light processing component, a first tuning component and a measurement component arranged sequentially on the output optical axis of the laser; the output end of the light processing component is also provided with a second tuning component, the second tuning component is arranged perpendicularly to the first tuning component, and the first tuning component and the second tuning component are connected to a frequency stabilization component.

[0007] The invention is further characterized by: The light processing component includes a first self-focusing lens, and an Nd:YLF crystal and a Cr crystal are sequentially connected to the optical axis of the first self-focusing lens. 4+ The Nd:YLF crystal and the first polarizing beam splitter are equipped with a dielectric film near the end face of the first self-focusing lens. The film is highly reflective to 1370nm oscillating laser light and simultaneously antireflective to 940nm pump light, 1047nm, and 1053nm. The Nd:YLF crystal is near the Cr... 4+ The YAG crystal has a 1370nm antireflection coating on its end face.

[0008] The first tuning component includes a first electro-optic crystal, which is connected to a second high-voltage power supply. The first electro-optic crystal and the first polarizing beam splitter are arranged on the same optical axis. A first output coupling mirror is provided on the output optical axis of the first electro-optic crystal. The first electro-optic crystal is potassium tantalate niobate, and a 1370nm antireflection film is deposited on the end face of the first electro-optic crystal.

[0009] The second tuning component includes a second electro-optic crystal, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter. The second electro-optic crystal is connected to a first high-voltage power supply. A second output coupling mirror is provided on the output optical axis of the second electro-optic crystal. The second electro-optic crystal is potassium tantalate niobate, and a 1370nm antireflection coating is deposited on the end face of the second electro-optic crystal.

[0010] The frequency stabilization component includes a second polarizing beam splitter, whose optical axis is perpendicular to that of the first polarizing beam splitter. A fifth photodetector and a sixth photodetector are respectively mounted on the output optical axis of the second polarizing beam splitter, and are perpendicular to each other. The fifth and sixth photodetectors are connected to a frequency stabilization circuit. The output terminals of the frequency stabilization circuit are respectively connected to a first piezoelectric ceramic tube and a second piezoelectric ceramic tube. The first piezoelectric ceramic tube is fixed to the end face of the first output coupling mirror away from the first electro-optic crystal. The second piezoelectric ceramic tube is fixed to the end face of the second output coupling mirror away from the second electro-optic crystal. Both end faces of the first and second output coupling mirrors are coated with a 1370nm high-reflectivity film with a reflectivity of 97%.

[0011] The measurement assembly includes a first beam splitter prism, which is located on the same optical axis as a first output coupling mirror. A third polarizing beam splitter prism, a second self-focusing lens, a cloud chamber, a fourth polarizing beam splitter prism, and a third photodetector are sequentially arranged on the output optical axis of the first beam splitter prism. The third photodetector is connected to a PC via a data acquisition card. A fourth photodetector is located perpendicular to the optical axis of the fourth polarizing beam splitter prism and is connected to the data acquisition card. A second beam splitter prism is located perpendicular to the optical axis of the third polarizing beam splitter prism, and a second beam splitter prism is positioned at a 90-degree angle to the optical axis of the second beam splitter prism. A first reflector is mounted on the output optical axis of the second reflector. The optical axis of the first reflector is set at a 90-degree angle to the optical axis of the second output coupling mirror. A second Fabry-Perot etalon is mounted perpendicular to the optical axis of the second beam splitter. The optical axis of the second Fabry-Perot etalon is parallel to the optical axis of the second self-focusing lens. A second photodetector is mounted on the optical axis of the second Fabry-Perot etalon and is connected to a data acquisition card. A first Fabry-Perot etalon is mounted perpendicular to the optical axis of the first beam splitter and is connected to the data acquisition card through the first photodetector.

[0012] Another technical solution adopted in this invention is a method for measuring supersaturation within clouds, which employs a supersaturation measuring device within clouds and includes the following steps: Step 1: Turn on the laser driver to generate light waves. The light waves are tuned and stabilized by the first tuning component, the second tuning component, and the frequency stabilization component to obtain dual-frequency laser. Step 2: After the dual-frequency laser is transmitted through the cloud chamber, two transmission curves are obtained, which are then transmitted to the PC via a data acquisition card. Step 3: Calculate the supersaturation within the cloud using the transmission curve and Beer-Lambert's law within the PC.

[0013] Another feature of the technical solution of the present invention is that: The specific tuning process in step 1 is as follows: the voltages of the first high-voltage power supply and the second high-voltage power supply are adjusted respectively, and the frequencies of the laser emitted from the first output coupling mirror and the laser output from the second output coupling mirror are adjusted. The frequency stabilization process is as follows: the 1370nm single-frequency laser transmitted from the second polarizing beam splitter enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube to stabilize the p-light frequency; the 1370nm single-frequency laser reflected from the second polarizing beam splitter enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube to stabilize the s-light frequency.

[0014] Step 2, the transmission processing step, refers to obtaining two transmission curves after inputting the dual-frequency laser into the cloud chamber, and the intensity of the transmitted laser after passing through the cloud chamber. and They are represented as follows: (1) (2) In equations (1) and (2), P Indicates the pressure of the gas. Indicates the mole fraction of water vapor. Indicates the gas absorption spectral lines at temperature T spectral intensity at time L indicates Absorption optical path, Line shape function representing water vapor absorption spectral lines. This indicates the incident light intensity of the dual-frequency laser. Indicates the frequency of p-light. Indicates the frequency of s-light; and The third and fourth photodetectors convert the signals into electrical signals.

[0015] The specific process of calculating the supersaturation within the cloud in step 3 is as follows: design a GPR baseline estimator and set values ​​in the PC. The GPR baseline estimator is used to automatically adapt to the nonlinear shape of the baseline and generate a dynamically smoothed baseline. Input the transmission curve into the GPR baseline estimator to obtain the absorbance spectrum. The dynamic smoothed baseline and the transmission curve are fitted using a Voigt line shape to obtain the fitted curve of the absorption spectrum. The residual RMS between the absorbance spectrum curve and the fitted curve is calculated. If the residual RMS is not greater than a set value, the fitted curve is valid. Then, the absorbance ratio method is used to decouple temperature and water vapor. If the temperature error is not greater than 0.1°C, the water vapor mole fraction is obtained according to the Beer-Lambert law. Using data such as the actual water vapor pressure e in the cloud, the supersaturation S within the cloud is calculated. Among them, Voigt line shape refers to the spectral line intensity line shape of a specific gas molecule that is only related to temperature and spectral line position, as shown in formula (3): (3) In equation (3), h Denotes Planck's constant. c This represents the speed of light in a vacuum. This indicates the gas absorption spectral lines at the reference temperature. Spectral line intensity below Indicates the transition frequency The low-state transition energy at that point This represents the partition function of the absorber gas at the reference temperature. V represents the partition function of the absorber gas at the actual temperature, and V0 represents the transition frequency. The value represents the spectral line intensity at the reference temperature, T represents the current actual temperature, T0 represents the reference temperature, and k represents the Boltzmann constant.

[0016] The formula for calculating the absorbance of the two absorption curves with varying intensity is as follows: (4) (5) In equations (4) and (5), This indicates that the temperature at frequency ν1 is T spectral intensity at time This indicates that the temperature at frequency ν2 is T The intensity of the spectral line at that time; The absorbance ratio parameter is: (6) Using the HITRAN spectral database, obtain curve; The formula for calculating the supersaturation S within the cloud is: (7) In equation (7), .

[0017] The beneficial effects of this invention are: The optical processing component preprocesses the laser to ensure transmission quality. Simultaneously, its output is connected to a second tuning component, perpendicular to the first tuning component. Working in conjunction with the frequency stabilization component, this enables precise tuning and frequency stabilization of the dual-frequency laser, effectively improving its frequency stability and purity and preventing frequency fluctuations from affecting measurement accuracy. The first tuning component, positioned along the laser's output optical axis, precisely controls the laser transmission direction and parameters, ensuring smooth transmission of the dual-frequency laser to the measurement component. The data acquisition card in the measurement component quickly and accurately acquires two transmission curves and transmits them to the PC, ensuring timely and complete data transmission. The PC calculates supersaturation based on the transmission curves and Beer-Lambert's law. Combined with the previously stable laser signal and accurate data acquisition, it achieves precise measurement of supersaturation within the cloud. The entire device features tightly integrated components and a simple, efficient method, significantly improving measurement stability, accuracy, and reliability. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the cloud supersaturation measuring device of the present invention; Figure 2 This is a schematic diagram of the overall structure of the cloud supersaturation measurement device of the present invention.

[0019] In the figure, 1. Laser, 2. Optical processing assembly, 201. First self-focusing lens, 202. Nd:YLF crystal, 203. Cr 4+ 204. YAG crystal, 305. First polarizing beam splitter, 406. First tuning component, 407. First electro-optic crystal, 408. Second high-voltage power supply, 309. First output coupling mirror, 4000. Measurement component, 401. First beam splitter, 402. Second self-focusing lens, 403. Cloud chamber, 404. Fourth polarizing beam splitter, 405. Third photodetector, 406. Data acquisition card, 407. PC, 408. Fourth photodetector, 409. Third polarizing beam splitter, 4010. Second beam splitter, 4011. Second reflecting mirror. 4012. First reflecting mirror; 4013. Second Fabry-Perot etalon; 4014. Second photodetector; 4015. First Fabry-Perot etalon; 4016. First photodetector; 5. Second tuning assembly; 501. Second electro-optic crystal; 502. First high-voltage power supply; 503. Second output coupling mirror; 6. Frequency stabilization assembly; 601. Second polarizing beam splitter; 602. Fifth photodetector; 603. Sixth photodetector; 604. Frequency stabilization circuit; 605. First piezoelectric ceramic tube; 606. Second piezoelectric ceramic tube. Detailed Implementation

[0020] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments.

[0021] Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0022] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0023] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0024] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0025] The frequency stabilization component 6 includes a second polarizing beam splitter 601. The optical axis of the second polarizing beam splitter 601 is perpendicular to the optical axis of the first polarizing beam splitter 204. A fifth photodetector 602 and a sixth photodetector 603 are respectively provided on the output optical axis of the second polarizing beam splitter 601. The fifth photodetector 602 and the sixth photodetector 603 are perpendicular to each other. The fifth photodetector 602 and the sixth photodetector 603 are connected to a frequency stabilization circuit 604. The output terminal of the frequency stabilization circuit 604 is respectively connected to a first piezoelectric ceramic tube 605 and a second piezoelectric ceramic tube 606. The first piezoelectric ceramic tube 605 is fixed to the end face of the first output coupling mirror 303 away from the first electro-optic crystal 301. The second piezoelectric ceramic tube 606 is fixed to the end face of the second output coupling mirror 503 away from the second electro-optic crystal 501. Both end faces of the first output coupling mirror 303 and the second output coupling mirror 503 are coated with a 1370nm high-reflection film with a reflectivity of 97%.

[0026] Measurement component 4 includes a first beam splitter 401, which is located on the same optical axis as the first output coupling mirror 303. A third polarizing beam splitter 409, a second self-focusing lens 402, a cloud chamber 403, a fourth polarizing beam splitter 404, and a third photodetector 405 are sequentially arranged on the output optical axis of the first beam splitter 401. The third photodetector 405 is connected to a PC 407 via a data acquisition card 406. A fourth photodetector 408 is arranged perpendicular to the optical axis of the fourth polarizing beam splitter 404 and is connected to the data acquisition card 406. A second beam splitter 4010 is arranged perpendicular to the optical axis of the third polarizing beam splitter 409, and a second reflecting mirror 4 is arranged at a 45-degree angle to the optical axis of the second beam splitter 4010. 011, a first reflector 4012 is provided on the output optical axis of the second reflector 4011. The optical axis of the first reflector 4012 is set at a 45-degree angle to the optical axis of the second output coupling mirror 503. A second Fabry-Perot etalon 4013 is provided perpendicular to the optical axis of the second beam splitter 4010. The optical axis of the second Fabry-Perot etalon 4013 is set parallel to the optical axis of the second self-focusing lens 402. A second photodetector 4014 is provided on the optical axis of the second Fabry-Perot etalon 4013. The second photodetector 4014 is connected to the data acquisition card 406. A first Fabry-Perot etalon 4015 is provided perpendicular to the optical axis of the first beam splitter 401. The first Fabry-Perot etalon 4015 is connected to the data acquisition card 406 through the first photodetector 4016. Figure 2 As shown.

[0027] The method for measuring supersaturation within clouds, using a supersaturation measurement device within clouds, includes the following steps: Step 1: Turn on the laser driver 7 to generate light waves. The light waves are tuned and stabilized by the first tuning component 3, the second tuning component 5 and the frequency stabilization component 6 to obtain dual-frequency laser. Step 2: After reflection and transmission, the dual-frequency laser produces two transmission curves, which are then transmitted to PC407 via data acquisition card 406. Step 3: Calculate the supersaturation within the cloud using the transmission curve and Beer-Lambert's law within PC407.

[0028] The specific tuning process in step 1 is as follows: the voltages of the first high-voltage power supply 502 and the second high-voltage power supply 302 are adjusted respectively, and the frequencies of the laser emitted from the first output coupling mirror 303 and the laser output from the second output coupling mirror 503 are adjusted. The frequency stabilization process is as follows: the 1370nm single-frequency laser transmitted from the second polarizing beam splitter 4010 enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the p-light frequency; the 1370nm single-frequency laser reflected from the second polarizing beam splitter 4010 enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the s-light frequency.

[0029] Step 2, the transmission processing step, refers to obtaining two transmission curves after inputting the dual-frequency laser into cloud chamber 403, and the intensity of the transmitted laser after passing through cloud chamber 403. and They are represented as follows: (1) (2) In equations (1) and (2), P Indicates the pressure of the gas. Indicates the mole fraction of water vapor. Indicates the gas absorption spectral lines at temperature T spectral intensity at time L indicates Absorption optical path, Line shape function representing water vapor absorption spectral lines. This indicates the incident light intensity of the dual-frequency laser. Indicates the frequency of p-light. Indicates the frequency of s-light; and The third photodetector 405 and the fourth photodetector 408 convert the signal into an electrical signal.

[0030] The specific process of calculating the supersaturation within the cloud in step 3 is as follows: Design a GPR baseline estimator and set a value in PC407. The GPR baseline estimator is used to automatically adapt to the nonlinear shape of the baseline and generate a dynamically smoothed baseline; input the transmission curve into the GPR baseline estimator to obtain the absorbance spectrum. The dynamic smoothed baseline and the transmission curve are fitted using a Voigt line shape to obtain the fitted curve of the absorption spectrum. The residual RMS between the absorbance spectrum curve and the fitted curve is calculated. If the residual RMS is not greater than a set value, the fitted curve is valid. Then, the absorbance ratio method is used to decouple temperature and water vapor. If the temperature error is not greater than 0.1°C, the water vapor mole fraction is obtained according to the Beer-Lambert law. Using data such as the actual water vapor pressure e in the cloud, the supersaturation S within the cloud is calculated. Among them, Voigt line shape refers to the spectral line intensity line shape of a specific gas molecule that is only related to temperature and spectral line position, as shown in formula (3): (3) In equation (3), h Denotes Planck's constant. c This represents the speed of light in a vacuum. This indicates the gas absorption spectral lines at the reference temperature. Spectral line intensity below Indicates the transition frequency The low-state transition energy at that point This represents the partition function of the absorber gas at the reference temperature. V represents the partition function of the absorber gas at the actual temperature, and V0 represents the transition frequency. The value represents the spectral line intensity at the reference temperature, where T represents the current actual temperature, T0 represents the reference temperature, and k represents the Boltzmann constant. The formula for calculating the absorbance of the two absorption curves with varying intensity is as follows: (4) (5) In equations (4) and (5), This indicates that the temperature at frequency ν1 is T spectral intensity at time This indicates that the temperature at frequency ν2 is T The intensity of the spectral line at that time; The absorbance ratio parameter is: (6) Using the HITRAN spectral database, obtain curve; The formula for calculating the supersaturation S within the cloud is: (7) In equation (7), .

[0031] The working principle is as follows: When the laser driver 7 is turned on, a 940nm light wave is emitted from the laser 1. The light wave is focused by the first self-focusing lens 201 onto the dielectric film on the end face of the Nd:YLF crystal 202. The light processing component 2 and the first output coupling mirror 303 form a first standing wave resonant cavity, and the light processing component 2 and the second output coupling mirror 503 form a second standing wave resonant cavity. After passing through the light processing component 2, the light wave is converted into a 1370nm laser, which includes p-beams and s-beams. The laser oscillates in a single longitudinal mode in the first and second standing wave resonant cavities, respectively. The voltages of the second high-voltage power supply 302 and the first high-voltage power supply 502 are tuned, and a suitable single longitudinal mode of the laser is selected to achieve frequency tuning of the laser. Due to the fabrication of the first polarizing beam splitter prism 204… Due to imperfections in the manufacturing process, neither the p-light transmittance nor the s-light reflectivity can reach 100%. Therefore, a small amount of residual reflected p-light and residual transmitted s-light coaxially escape from the cavity through the other surface of the first polarizing beam splitter 204. This portion of the dual-frequency laser, after being split by the second beam splitter 4010 outside the cavity, can be used to stabilize the resonant frequency of the corresponding standing wave cavity 1370nm single-frequency laser. Specifically, the p-polarized 1370nm single-frequency laser transmitted from the second beam splitter 4010 enters the frequency stabilization circuit and the p-cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the p-light frequency; the s-polarized 1370nm single-frequency laser reflected from the second beam splitter 4010 enters the frequency stabilization circuit and the s-cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the s-light frequency.

[0032] Next, the frequency-stabilized p-polarized light output from the first output coupling mirror 303 is split into two beams at the first beam splitter 401. The beam passing through the first beam splitter 401 passes through the third polarizing beam splitter 409, and after passing through the second self-focusing lens 402, it enters the cloud chamber 403. The frequency-stabilized s-polarized light output from the second output coupling mirror 503 is reflected by the first reflecting mirror 4012 and the second reflecting mirror 4011, transmitted at the second beam splitter 4010, reflected again by the third polarizing beam splitter 409, and after passing through the second self-focusing lens 402, it enters the cloud chamber 403. The voltage of the first high-voltage power supply 502 is tuned to change the frequency of the laser emitted from the first output coupling mirror 303, and the voltage of the second high-voltage power supply 302 is tuned to change the frequency of the laser emitted from the second output coupling mirror 503, so that they are respectively aligned with 7301.14cm. - ¹ and 7303.76cm - ¹The two water vapor absorption lines match. According to Beer-Lambert's law, their transmitted laser intensities are expressed as: (1) (2) In the formula, P Indicates the pressure of the gas. It is the mole fraction of water vapor. Indicates the gas absorption spectral lines at temperature T spectral intensity at time L For absorption optical path, The line shape function represents the absorption line shape of water vapor. In most cases, the broadening of the spectral line is the result of the combined effects of natural broadening, collisional broadening, and Doppler broadening, forming the Voigt line shape. The intensity line shape of the spectral line for a specific gas molecule is only related to temperature and spectral line position, as shown in formula (3): (3) in, h Represents Planck's constant ， C This represents the speed of light in a vacuum. For gas absorption spectral lines at the reference temperature Spectral line intensity below For the transition frequency The low-state transition energy at that point and These are the partition functions of the absorber gas at the reference temperature and the actual temperature, respectively.

[0033] After the dual-frequency laser passes through cloud chamber 403, the transmitted laser intensities I1 and I2 are converted into electrical signals U1 and U2 by the third photodetector 405 and the fourth photodetector 408. A GPR baseline estimator is designed, employing radial basis functions (RBF) and white noise kernels to automatically adapt to the nonlinear morphology of the baseline (such as exponential drift and local fluctuations), avoiding the bias caused by the manual selection of basis functions in traditional polynomial fitting. The confidence interval of the output baseline provides a basis for error propagation analysis for subsequent inversion. The absorbance spectrum is obtained by dividing the measured transmitted signal by the baseline. The absorbance spectrum is fitted using a Voigt line type to obtain the fitted curve. There is a residual RMS between the measured absorbance spectrum curve and the fitted curve. If the residual > a set value (0.005), the baseline is refitted.

[0034] Example 1 Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0035] Example 2 Cloud supersaturation measurement device, such as Figure 1As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0036] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0037] Example 3 Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0038] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0039] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0040] Example 4 Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0041] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0042] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0043] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0044] Example 5 Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0045] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0046] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0047] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0048] The frequency stabilization component 6 includes a second polarizing beam splitter 601. The optical axis of the second polarizing beam splitter 601 is perpendicular to the optical axis of the first polarizing beam splitter 204. A fifth photodetector 602 and a sixth photodetector 603 are respectively provided on the output optical axis of the second polarizing beam splitter 601. The fifth photodetector 602 and the sixth photodetector 603 are perpendicular to each other. The fifth photodetector 602 and the sixth photodetector 603 are connected to a frequency stabilization circuit 604. The output terminal of the frequency stabilization circuit 604 is respectively connected to a first piezoelectric ceramic tube 605 and a second piezoelectric ceramic tube 606. The first piezoelectric ceramic tube 605 is fixed to the end face of the first output coupling mirror 303 away from the first electro-optic crystal 301. The second piezoelectric ceramic tube 606 is fixed to the end face of the second output coupling mirror 503 away from the second electro-optic crystal 501. Both end faces of the first output coupling mirror 303 and the second output coupling mirror 503 are coated with a 1370nm high-reflection film with a reflectivity of 97%.

[0049] Example 6 Cloud supersaturation measurement device, such as Figure 1As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0050] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0051] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0052] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0053] The frequency stabilization component 6 includes a second polarizing beam splitter 601. The optical axis of the second polarizing beam splitter 601 is perpendicular to the optical axis of the first polarizing beam splitter 204. A fifth photodetector 602 and a sixth photodetector 603 are respectively provided on the output optical axis of the second polarizing beam splitter 601. The fifth photodetector 602 and the sixth photodetector 603 are perpendicular to each other. The fifth photodetector 602 and the sixth photodetector 603 are connected to a frequency stabilization circuit 604. The output terminal of the frequency stabilization circuit 604 is respectively connected to a first piezoelectric ceramic tube 605 and a second piezoelectric ceramic tube 606. The first piezoelectric ceramic tube 605 is fixed to the end face of the first output coupling mirror 303 away from the first electro-optic crystal 301. The second piezoelectric ceramic tube 606 is fixed to the end face of the second output coupling mirror 503 away from the second electro-optic crystal 501. Both end faces of the first output coupling mirror 303 and the second output coupling mirror 503 are coated with a 1370nm high-reflection film with a reflectivity of 97%.

[0054] Measurement component 4 includes a first beam splitter 401, which is located on the same optical axis as the first output coupling mirror 303. A third polarizing beam splitter 409, a second self-focusing lens 402, a cloud chamber 403, a fourth polarizing beam splitter 404, and a third photodetector 405 are sequentially arranged on the output optical axis of the first beam splitter 401. The third photodetector 405 is connected to a PC 407 via a data acquisition card 406. A fourth photodetector 408 is arranged perpendicular to the optical axis of the fourth polarizing beam splitter 404 and is connected to the data acquisition card 406. A second beam splitter 4010 is arranged perpendicular to the optical axis of the third polarizing beam splitter 409, and a second reflecting mirror 4 is arranged at a 45-degree angle to the optical axis of the second beam splitter 4010. 011, A first reflector 4012 is provided on the output optical axis of the second reflector 4011. The optical axis of the first reflector 4012 is set at a 45-degree angle to the optical axis of the second output coupling mirror 503. A second Fabry-Perot etalon 4013 is provided in a direction perpendicular to the optical axis of the second beam splitter 4010. The optical axis of the second Fabry-Perot etalon 4013 is set parallel to the optical axis of the second self-focusing lens 402. A second photodetector 4014 is provided on the optical axis of the second Fabry-Perot etalon 4013. The second photodetector 4014 is connected to the data acquisition card 406. A first Fabry-Perot etalon 4015 is provided in a direction perpendicular to the optical axis of the first beam splitter 401. The first Fabry-Perot etalon 4015 is connected to the data acquisition card 406 through the first photodetector 4016.

[0055] Example 7 Cloud supersaturation measurement device, such as Figure 1As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0056] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0057] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0058] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0059] The frequency stabilization component 6 includes a second polarizing beam splitter 601. The optical axis of the second polarizing beam splitter 601 is perpendicular to the optical axis of the first polarizing beam splitter 204. A fifth photodetector 602 and a sixth photodetector 603 are respectively provided on the output optical axis of the second polarizing beam splitter 601. The fifth photodetector 602 and the sixth photodetector 603 are perpendicular to each other. The fifth photodetector 602 and the sixth photodetector 603 are connected to a frequency stabilization circuit 604. The output terminal of the frequency stabilization circuit 604 is respectively connected to a first piezoelectric ceramic tube 605 and a second piezoelectric ceramic tube 606. The first piezoelectric ceramic tube 605 is fixed to the end face of the first output coupling mirror 303 away from the first electro-optic crystal 301. The second piezoelectric ceramic tube 606 is fixed to the end face of the second output coupling mirror 503 away from the second electro-optic crystal 501. Both end faces of the first output coupling mirror 303 and the second output coupling mirror 503 are coated with a 1370nm high-reflection film with a reflectivity of 97%.

[0060] Measurement component 4 includes a first beam splitter 401, which is located on the same optical axis as the first output coupling mirror 303. A third polarizing beam splitter 409, a second self-focusing lens 402, a cloud chamber 403, a fourth polarizing beam splitter 404, and a third photodetector 405 are sequentially arranged on the output optical axis of the first beam splitter 401. The third photodetector 405 is connected to a PC 407 via a data acquisition card 406. A fourth photodetector 408 is arranged perpendicular to the optical axis of the fourth polarizing beam splitter 404 and is connected to the data acquisition card 406. A second beam splitter 4010 is arranged perpendicular to the optical axis of the third polarizing beam splitter 409, and a second reflecting mirror 4 is arranged at a 45-degree angle to the optical axis of the second beam splitter 4010. 011, A first reflector 4012 is provided on the output optical axis of the second reflector 4011. The optical axis of the first reflector 4012 is set at a 45-degree angle to the optical axis of the second output coupling mirror 503. A second Fabry-Perot etalon 4013 is provided in a direction perpendicular to the optical axis of the second beam splitter 4010. The optical axis of the second Fabry-Perot etalon 4013 is set parallel to the optical axis of the second self-focusing lens 402. A second photodetector 4014 is provided on the optical axis of the second Fabry-Perot etalon 4013. The second photodetector 4014 is connected to the data acquisition card 406. A first Fabry-Perot etalon 4015 is provided in a direction perpendicular to the optical axis of the first beam splitter 401. The first Fabry-Perot etalon 4015 is connected to the data acquisition card 406 through the first photodetector 4016.

[0061] The method for measuring supersaturation within clouds, using a supersaturation measurement device within clouds, includes the following steps: Step 1: Turn on the laser driver 7 to generate light waves. The light waves are tuned and stabilized by the first tuning component 3, the second tuning component 5 and the frequency stabilization component 6 to obtain dual-frequency laser. Step 2: After reflection and transmission, the dual-frequency laser produces two transmission curves, which are then transmitted to PC407 via data acquisition card 406. Step 3: Calculate the supersaturation within the cloud using the transmission curve and Beer-Lambert's law within PC407.

[0062] Example 8 Cloud supersaturation measurement device, such as Figure 1 As shown, it includes a laser 1, with a laser driver 7 connected to the input end of the laser 1. The output optical axis of the laser 1 is provided with an optical processing component 2, a first tuning component 3 and a measurement component 4 in sequence. The output end of the optical processing component 2 is also provided with a second tuning component 5, which is arranged perpendicularly to the first tuning component 3. The first tuning component 3 and the second tuning component 5 are connected to a frequency stabilization component 6.

[0063] The light processing component 2 includes a first self-focusing lens 201, on which an Nd:YLF crystal 202 and a Cr crystal are sequentially connected along the optical axis. 4+ YAG crystal 203 and first polarizing beam splitter 204; Nd:YLF crystal 202 near the end face of the first self-focusing lens 201 is coated with a dielectric film that is highly reflective to 1370nm oscillating laser and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm; Nd:YLF crystal 202 near Cr 4+ The YAG crystal 203 has a 1370nm antireflection coating on its end face.

[0064] The first tuning component 3 includes a first electro-optic crystal 301, which is connected to a second high-voltage power supply 302. The first electro-optic crystal 301 and the first polarizing beam splitter 204 are arranged on the same optical axis. A first output coupling mirror 303 is provided on the output optical axis of the first electro-optic crystal 301. The first electro-optic crystal 301 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the first electro-optic crystal 301.

[0065] The second tuning component 5 includes a second electro-optic crystal 501, which is set at a 90-degree angle to the optical axis of the first polarizing beam splitter 204. The second electro-optic crystal 501 is connected to a first high-voltage power supply 502. A second output coupling mirror 503 is provided on the output optical axis of the second electro-optic crystal 501. The second electro-optic crystal 501 is potassium tantalate niobate, and a 1370nm anti-reflection coating is deposited on the end face of the second electro-optic crystal 501.

[0066] The frequency stabilization component 6 includes a second polarizing beam splitter 601. The optical axis of the second polarizing beam splitter 601 is perpendicular to the optical axis of the first polarizing beam splitter 204. A fifth photodetector 602 and a sixth photodetector 603 are respectively provided on the output optical axis of the second polarizing beam splitter 601. The fifth photodetector 602 and the sixth photodetector 603 are perpendicular to each other. The fifth photodetector 602 and the sixth photodetector 603 are connected to a frequency stabilization circuit 604. The output terminal of the frequency stabilization circuit 604 is respectively connected to a first piezoelectric ceramic tube 605 and a second piezoelectric ceramic tube 606. The first piezoelectric ceramic tube 605 is fixed to the end face of the first output coupling mirror 303 away from the first electro-optic crystal 301. The second piezoelectric ceramic tube 606 is fixed to the end face of the second output coupling mirror 503 away from the second electro-optic crystal 501. Both end faces of the first output coupling mirror 303 and the second output coupling mirror 503 are coated with a 1370nm high-reflection film with a reflectivity of 97%.

[0067] Measurement component 4 includes a first beam splitter 401, which is located on the same optical axis as the first output coupling mirror 303. A third polarizing beam splitter 409, a second self-focusing lens 402, a cloud chamber 403, a fourth polarizing beam splitter 404, and a third photodetector 405 are sequentially arranged on the output optical axis of the first beam splitter 401. The third photodetector 405 is connected to a PC 407 via a data acquisition card 406. A fourth photodetector 408 is arranged perpendicular to the optical axis of the fourth polarizing beam splitter 404 and is connected to the data acquisition card 406. A second beam splitter 4010 is arranged perpendicular to the optical axis of the third polarizing beam splitter 409, and a second reflecting mirror 4 is arranged at a 45-degree angle to the optical axis of the second beam splitter 4010. 011, A first reflector 4012 is provided on the output optical axis of the second reflector 4011. The optical axis of the first reflector 4012 is set at a 45-degree angle to the optical axis of the second output coupling mirror 503. A second Fabry-Perot etalon 4013 is provided in a direction perpendicular to the optical axis of the second beam splitter 4010. The optical axis of the second Fabry-Perot etalon 4013 is set parallel to the optical axis of the second self-focusing lens 402. A second photodetector 4014 is provided on the optical axis of the second Fabry-Perot etalon 4013. The second photodetector 4014 is connected to the data acquisition card 406. A first Fabry-Perot etalon 4015 is provided in a direction perpendicular to the optical axis of the first beam splitter 401. The first Fabry-Perot etalon 4015 is connected to the data acquisition card 406 through the first photodetector 4016.

[0068] The method for measuring supersaturation within clouds, using a supersaturation measurement device within clouds, includes the following steps: Step 1: Turn on the laser driver 7 to generate light waves. The light waves are tuned and stabilized by the first tuning component 3, the second tuning component 5 and the frequency stabilization component 6 to obtain dual-frequency laser. Step 2: After reflection and transmission, the dual-frequency laser produces two transmission curves, which are then transmitted to PC407 via data acquisition card 406. Step 3: Calculate the supersaturation within the cloud using the transmission curve and Beer-Lambert's law within PC407.

[0069] The specific tuning process in step 1 is as follows: the voltages of the first high-voltage power supply 502 and the second high-voltage power supply 302 are adjusted respectively, and the frequencies of the laser emitted from the first output coupling mirror 303 and the laser output from the second output coupling mirror 503 are adjusted. The frequency stabilization process is as follows: the 1370nm single-frequency laser transmitted from the second polarizing beam splitter 4010 enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the p-light frequency; the 1370nm single-frequency laser reflected from the second polarizing beam splitter 4010 enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube 606 to stabilize the s-light frequency.

[0070] Step 2, the transmission processing step, refers to obtaining two transmission curves after inputting the dual-frequency laser into cloud chamber 403, and the intensity of the transmitted laser after passing through cloud chamber 403. and They are represented as follows: (1) (2) In equations (1) and (2), P Indicates the pressure of the gas. Indicates the mole fraction of water vapor. Indicates the gas absorption spectral lines at temperature T spectral intensity at time L indicates Absorption optical path, Line shape function representing water vapor absorption spectral lines. This indicates the incident light intensity of the dual-frequency laser. Indicates the frequency of p-light. Indicates the frequency of s-light; and The third photodetector 405 and the fourth photodetector 408 convert the signal into an electrical signal.

[0071] The specific process of calculating the supersaturation within the cloud in step 3 is as follows: Design a GPR baseline estimator and set a value in PC407. The GPR baseline estimator is used to automatically adapt to the nonlinear shape of the baseline and generate a dynamically smoothed baseline; input the transmission curve into the GPR baseline estimator to obtain the absorbance spectrum. The dynamic smoothed baseline and the transmission curve are fitted using a Voigt line shape to obtain the fitted curve of the absorption spectrum. The residual RMS between the absorbance spectrum curve and the fitted curve is calculated. If the residual RMS is not greater than a set value, the fitted curve is valid. Then, the absorbance ratio method is used to decouple temperature and water vapor. If the temperature error is not greater than 0.1°C, the water vapor mole fraction is obtained according to the Beer-Lambert law. Using data such as the actual water vapor pressure e in the cloud, the supersaturation S within the cloud is calculated. Among them, Voigt line shape refers to the spectral line intensity line shape of a specific gas molecule that is only related to temperature and spectral line position, as shown in formula (3): (3) In equation (3), h Denotes Planck's constant. c This represents the speed of light in a vacuum. This indicates the gas absorption spectral lines at the reference temperature. Spectral line intensity below Indicates the transition frequency The low-state transition energy at that point This represents the partition function of the absorber gas at the reference temperature. V represents the partition function of the absorber gas at the actual temperature, and V0 represents the transition frequency. The value represents the spectral line intensity at the reference temperature, where T represents the current actual temperature, T0 represents the reference temperature, and k represents the Boltzmann constant. The formula for calculating the absorbance of the two absorption curves with varying intensity is as follows: (4) (5) In equations (4) and (5), This indicates that the temperature at frequency ν1 is T spectral intensity at time This indicates that the temperature at frequency ν2 is T The intensity of the spectral line at that time; The absorbance ratio parameter is: (6) Using the HITRAN spectral database, obtain curve; The formula for calculating the supersaturation S within the cloud is: (7) In equation (7), .

Claims

1. A cloud supersaturation measuring device, characterized in that, The laser (1) is connected to a laser driver (7) at its input end. A light processing component (2), a first tuning component (3), and a measurement component (4) are sequentially arranged on the output optical axis of the laser (1). A second tuning component (5) is also provided at the output end of the light processing component (2). The second tuning component (5) is arranged perpendicularly to the first tuning component (3). The first tuning component (3) and the second tuning component (5) are connected together to a frequency stabilization component (6).

2. The cloud supersaturation measuring device according to claim 1, characterized in that, The light processing component (2) includes a first self-focusing lens (201), and an Nd:YLF crystal (202) and a Cr crystal are sequentially connected on the optical axis of the first self-focusing lens (201). 4+ The Nd:YLF crystal (203) and the first polarizing beam splitter (204) are equipped with a YAG crystal (203) and a first polarizing beam splitter (204). The Nd:YLF crystal (202) near the end face of the first self-focusing lens (201) is coated with a dielectric film that is highly reflective to 1370nm oscillating laser light and simultaneously antireflective to 940nm pump light, 1047nm and 1053nm light. The Nd:YLF crystal (202) near the end face of the Cr 4+ The end face of the YAG crystal (203) is coated with a 1370nm antireflection film.

3. The cloud supersaturation measuring device according to claim 2, characterized in that, The first tuning component (3) includes a first electro-optic crystal (301), which is connected to a second high-voltage power supply (302). The first electro-optic crystal (301) and the first polarizing beam splitter (204) are arranged on the same optical axis. A first output coupling mirror (303) is provided on the output optical axis of the first electro-optic crystal (301). The first electro-optic crystal (301) is potassium tantalate niobate, and the end face of the first electro-optic crystal (301) is coated with a 1370nm anti-reflection film.

4. The cloud supersaturation measuring device according to claim 3, characterized in that, The second tuning component (5) includes a second electro-optic crystal (501), which is set at 90 degrees to the optical axis of the first polarizing beam splitter (204). The second electro-optic crystal (501) is connected to a first high-voltage power supply (502). A second output coupling mirror (503) is provided on the output optical axis of the second electro-optic crystal (501). The second electro-optic crystal (501) is potassium tantalate niobate, and a 1370nm anti-reflection film is deposited on the end face of the second electro-optic crystal (501).

5. The cloud supersaturation measuring device according to claim 4, characterized in that, The frequency stabilization component (6) includes a second polarizing beam splitter (601). The optical axis of the second polarizing beam splitter (601) is perpendicular to the optical axis of the first polarizing beam splitter (204). A fifth photodetector (602) and a sixth photodetector (603) are respectively provided on the output optical axis of the second polarizing beam splitter (601). The fifth photodetector (602) and the sixth photodetector (603) are perpendicular to each other. The fifth photodetector (602) and the sixth photodetector (603) are connected to a frequency stabilization circuit (604). The output terminals of the frequency stabilization circuit (604) are respectively connected to a first piezoelectric ceramic tube (605) and a second piezoelectric ceramic tube (606). The first piezoelectric ceramic tube (605) is fixed to the end face of the first output coupling mirror (303) away from the first electro-optic crystal (301). The second piezoelectric ceramic tube (606) is fixed to the end face of the second output coupling mirror (503) away from the second electro-optic crystal (501). Both end faces of the first output coupling mirror (303) and the second output coupling mirror (503) are coated with a 1370nm high reflectivity film with a reflectivity of 97%.

6. The cloud supersaturation measuring device according to claim 5, characterized in that, The measurement component (4) includes a first beam splitter (401), which is located on the same optical axis as the first output coupling mirror (303). A third polarizing beam splitter (409), a second self-focusing lens (402), a cloud chamber (403), a fourth polarizing beam splitter (404), and a third photodetector (405) are sequentially arranged on the output optical axis of the first beam splitter (401). The third photodetector (405) is connected to a PC (407) via a data acquisition card (406). A fourth photodetector (408) is arranged in a direction perpendicular to the optical axis of the fourth polarizing beam splitter (404), and is connected to the data acquisition card (406). A second beam splitter (4010) is arranged in a direction perpendicular to the optical axis of the third polarizing beam splitter (409), and a second reflector is arranged at a 45-degree angle to the optical axis of the second beam splitter (4010). The first reflector (4012) is provided on the output optical axis of the second reflector (4011). The optical axis of the first reflector (4012) is set at 45 degrees with the optical axis of the second output coupling mirror (503). A second Fabry-Perot etalon (4013) is provided in a direction perpendicular to the optical axis of the second beam splitter (4010). The optical axis of the second Fabry-Perot etalon (4013) is set parallel to the optical axis of the second self-focusing lens (402). A second photodetector (4014) is provided on the optical axis of the second Fabry-Perot etalon (4013). The second photodetector (4014) is connected to the data acquisition card (406). A first Fabry-Perot etalon (4015) is provided in a direction perpendicular to the optical axis of the first beam splitter (401). The first Fabry-Perot etalon (4015) is connected to the data acquisition card (406) through the first photodetector (4016).

7. A method for measuring supersaturation within clouds, employing the supersaturation measuring device described in claim 6, characterized in that, Includes the following steps: Step 1: Turn on the laser driver (7) to generate light waves. The light waves are tuned and stabilized by the first tuning component (3), the second tuning component (5) and the frequency stabilization component (6) to obtain dual-frequency laser. Step 2: After reflection and transmission, the dual-frequency laser produces two transmission curves, which are then transmitted to the PC (407) via the data acquisition card (406). Step 3: Calculate the supersaturation within the cloud using the transmission curve and Beer-Lambert's law within PC (407).

8. The method for measuring supersaturation within clouds according to claim 7, characterized in that, The specific tuning process in step 1 is as follows: the voltages of the first high-voltage power supply (502) and the second high-voltage power supply (302) are adjusted respectively, and the frequencies of the laser emitted from the first output coupling mirror (303) and the laser output from the second output coupling mirror (503) are adjusted. The frequency stabilization process is as follows: the 1370nm single-frequency laser transmitted from the second polarizing beam splitter (4010) enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube (606) to stabilize the p-light frequency; the 1370nm single-frequency laser reflected from the second polarizing beam splitter (4010) enters the frequency stabilization circuit and the cavity length is adjusted by the second piezoelectric ceramic tube (606) to stabilize the s-light frequency.

9. The method for measuring supersaturation within clouds according to claim 8, characterized in that, The transmission processing step described in step 2 refers to obtaining two transmission curves after inputting the dual-frequency laser into the cloud chamber (403), wherein the intensity of the transmitted laser after passing through the cloud chamber (403) is... and They are represented as follows: （1） （2） In equations (1) and (2), P Indicates the pressure of the gas. Indicates the mole fraction of water vapor. Indicates the gas absorption spectral lines at temperature T spectral intensity at time L indicates Absorption optical path, Line shape function representing water vapor absorption spectral lines. This indicates the incident light intensity of the dual-frequency laser. Indicates the frequency of p-light. Indicates the frequency of s-light; and The third photodetector (405) and the fourth photodetector (408) convert the signal into an electrical signal.

10. The method for measuring supersaturation within clouds according to claim 9, characterized in that, The specific process of calculating the supersaturation in the cloud in step 3 is as follows: design the GPR baseline estimator and set value in PC (407). The GPR baseline estimator is used to automatically adapt to the nonlinear shape of the baseline and generate a dynamically smooth baseline; input the transmission curve into the GPR baseline estimator to obtain the absorbance spectrum. The dynamic smoothed baseline and the transmission curve are fitted using a Voigt line shape to obtain the fitted curve of the absorption spectrum. The residual RMS between the absorbance spectrum curve and the fitted curve is calculated. If the residual RMS is not greater than a set value, the fitted curve is valid. Then, the absorbance ratio method is used to decouple temperature and water vapor. If the temperature error is not greater than 0.1°C, the water vapor mole fraction is obtained according to the Beer-Lambert law. Using data such as the actual water vapor pressure e in the cloud, the supersaturation S within the cloud is calculated. Among them, Voigt line shape refers to the spectral line intensity line shape of a specific gas molecule that is only related to temperature and spectral line position, as shown in formula (3): （3） In equation (3), h Denotes Planck's constant. c This represents the speed of light in a vacuum. This indicates the gas absorption spectral lines at the reference temperature. The intensity of the spectral lines below, Indicates the transition frequency The low-state transition energy at that point This represents the partition function of the absorber gas at the reference temperature. V0 represents the partition function of the absorber gas at the actual temperature, and V0 represents the transition frequency. The value represents the spectral line intensity at the reference temperature, where T represents the current temperature, T0 represents the reference temperature, and k represents the Boltzmann constant. The formula for calculating the absorbance of the two absorption curves with varying intensity is as follows: （4） （5） In equations (4) and (5), This indicates that the temperature at frequency ν1 is T spectral intensity at time This indicates that the temperature at frequency ν2 is T spectral line intensity at time; The absorbance ratio parameter is: （6） Using the HITRAN spectral database, obtain curve; The formula for calculating the supersaturation S within the cloud is: （7） In equation (7), .

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