Method and device for measuring wideband ac voltage based on quantum dc reference voltage

Abstract

This application relates to a broadband AC voltage measurement method and apparatus based on a quantum DC reference voltage. The method includes: acquiring multiple candidate quantum DC reference voltages and AC voltage data to be measured; selecting a matching comparison reference voltage from the candidate quantum DC reference voltages; detecting the original event signals when the AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the AC voltage data and the selected comparison reference voltage, and recording the timestamp and channel number of each original event signal; compensating the original event signals and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain a compensated non-uniform event sampling dataset; and jointly reconstructing the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data. The entire scheme can achieve accurate and effective voltage measurement under channel-limited conditions.

Description

Technical Field

[0001] This application relates to the field of voltage measurement technology, and in particular to a broadband AC voltage measurement method, apparatus and system based on a quantum DC reference voltage. Background Technology

[0002] In the development of precision electrical metrology and instruments, high accuracy and traceability of AC voltage measurement over a wide frequency range has always been a key requirement. Existing AC quantum voltage measurement technologies mainly include the Programmable Josephson Voltage Standard (PJVS) and the Josephson Arbitrary Waveform Synthesizer (JAWS). The former is complex and limited at high frequencies, while the latter is difficult to implement and has high requirements for waveform and synchronization conditions.

[0003] Using a quantum DC reference voltage in conjunction with a high-speed comparator to record the reference time is another feasible measurement method. However, this method faces the problem of a limited number of available comparison channels, difficulty in simultaneously connecting all quantized reference voltages, and the introduction of errors by non-ideal effects between different channels of the comparator, resulting in incomplete sampling information and difficulty in guaranteeing waveform reconstruction accuracy.

[0004] For wideband AC signals, the fixed reference voltage distribution results in insufficient event sampling points in the rapidly changing waveform region, while there is sampling redundancy in the slowly changing region. Traditional technical solutions are difficult to achieve accurate and effective voltage measurement under channel-limited conditions. Summary of the Invention

[0005] Therefore, it is necessary to provide a broadband AC voltage measurement method, device, and system based on a quantum DC reference voltage that can achieve accurate and effective voltage measurement under channel-limited conditions, addressing the aforementioned technical problems.

[0006] Firstly, this application provides a broadband AC voltage measurement method based on a quantum DC reference voltage. The method includes:

[0007] Acquire multiple candidate quantum DC reference voltages, as well as measured AC voltage data;

[0008] Based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels.

[0009] The system detects the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and records the timestamp and channel number of each original event signal.

[0010] The original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0011] The acquired AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data.

[0012] In one embodiment, obtaining multiple candidate quantum DC reference voltages includes:

[0013] Multiple candidate quantum DC reference voltages are obtained by using a positive and negative polarity Josephson array to output the quantum DC voltage reference source centered on the reference potential point.

[0014] The quantum DC voltage reference source includes 2N programmable Josephson arrays. N programmable Josephson arrays are connected in series to form a positive quantum voltage output arm, and N programmable Josephson arrays are connected in series to form a negative quantum voltage output arm. The reference potential point is located between the positive and negative quantum voltage output arms.

[0015] In one embodiment, selecting a matching comparison reference voltage from a plurality of candidate quantum DC reference voltages based on characteristic parameters of the measured AC voltage data and allocating the selected comparison reference voltage to a plurality of comparison channels includes:

[0016] Acquire the characteristic parameters of the measured AC voltage data, including the estimated amplitude, estimated frequency, and local variation characteristics;

[0017] Based on the characteristic parameters of the measured AC voltage data, a partially matched selected comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels.

[0018] In one embodiment, the original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain a compensated non-uniform event sampling dataset, which includes:

[0019] Obtain the calibration response of each comparison channel, and establish time compensation parameters and reference voltage bias compensation parameters based on the calibration response;

[0020] Based on the timestamp and channel number, and according to the time compensation parameters and the reference voltage bias compensation parameters, the original event signal and the corresponding selected comparison reference voltage are compensated to obtain the compensated non-uniform event sampling dataset.

[0021] In one embodiment, the calibration response of each comparison channel is obtained, and time compensation parameters and reference voltage bias compensation parameters are established based on the calibration response, including:

[0022] Input the known calibration signal into each comparison channel in sequence and obtain the current operating temperature;

[0023] Record the channel calibration response of each comparison channel under different edge directions, different local slopes, and different operating temperatures;

[0024] Based on the channel calibration response, the time compensation function and the reference voltage deviation compensation function corresponding to different comparison channels are obtained.

[0025] In one embodiment, the acquired measured AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the measured AC voltage data, including:

[0026] A preset fusion algorithm is used to jointly reconstruct the measured AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the measured AC voltage data.

[0027] The preset fusion algorithm includes at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform, and non-uniform discrete Fourier inverse transform.

[0028] In one embodiment, after jointly reconstructing the acquired AC voltage data under test and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data under test, the method further includes:

[0029] Based on the reconstructed waveform of the current measurement window, update the data, values, and distribution locations of the selected comparison reference voltage in the next measurement window;

[0030] The process returns to the steps of selecting a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and assigning the selected comparison reference voltage to multiple comparison channels, until the preset measurement stop condition is reached.

[0031] Secondly, this application also provides a broadband AC voltage measurement system based on a quantum DC reference voltage. The system includes:

[0032] The data acquisition module is used to acquire multiple candidate quantum DC reference voltages and the measured AC voltage data;

[0033] The channel allocation module is used to select a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to multiple comparison channels.

[0034] The recording module is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each original event signal.

[0035] The compensation module is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0036] The reconstruction module is used to jointly reconstruct the acquired AC voltage data under test and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data under test.

[0037] Thirdly, this application also provides a broadband AC voltage measurement device based on a quantum DC reference voltage, including a quantum DC voltage reference source, an auxiliary uniform sampling module, a reference voltage selection and distribution module, an event sampling module, a self-calibration module, and a data fusion processing module;

[0038] The quantum DC voltage reference source is used to output multiple candidate quantum DC reference voltages;

[0039] The auxiliary uniform sampling module is used to collect the AC voltage data under test;

[0040] The reference voltage selection and allocation module is used to select a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to multiple comparison channels.

[0041] The event sampling module is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each original event signal;

[0042] The self-calibration module is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset;

[0043] The data fusion processing module is used to jointly reconstruct the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data.

[0044] Fourthly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to perform the following steps:

[0045] Acquire multiple candidate quantum DC reference voltages, as well as measured AC voltage data;

[0046] Based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels.

[0047] The system detects the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and records the timestamp and channel number of each original event signal.

[0048] The original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0049] The acquired AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data.

[0050] Fifthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0051] Acquire multiple candidate quantum DC reference voltages, as well as measured AC voltage data;

[0052] Based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels.

[0053] The system detects the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and records the timestamp and channel number of each original event signal.

[0054] The original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0055] The acquired AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data.

[0056] Sixthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, performs the following steps:

[0057] Acquire multiple candidate quantum DC reference voltages, as well as measured AC voltage data;

[0058] Based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels.

[0059] The system detects the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and records the timestamp and channel number of each original event signal.

[0060] The original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0061] The acquired AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data.

[0062] The aforementioned broadband AC voltage measurement method, system, device, computer equipment, storage medium, and computer program products based on quantum DC reference voltage select a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the AC voltage data being measured, and allocate it to multiple comparison channels. This allows limited comparison channel resources to be concentrated on configuring reference voltages in key change segments based on signal characteristics. Furthermore, by detecting the original event signal when the AC voltage being measured crosses the corresponding selected comparison reference voltage and recording the timestamp and channel number, the continuous waveform is converted into non-uniform event sampling information with the selected comparison reference voltage as a reference. This allows limited sampling points to be concentrated on recording the key moments when the waveform crosses the reference voltage, effectively capturing events that contribute highly to waveform reconstruction even under channel-limited conditions. Subsequently, compensation is applied to the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number, eliminating the impact of non-ideal effects between different comparison channels on the event triggering time and the accuracy of the reference voltage, ensuring the accuracy of the non-uniform event sampling dataset. Finally, the measured AC voltage data is jointly reconstructed with the compensated non-uniform event sampling dataset, so that the overall trend information and the quantum reference information provided by the event sampling complement and fuse, thereby realizing accurate and effective measurement of wideband AC voltage under the condition of limited number of comparison channels. Attached Figure Description

[0063] Figure 1 This is a flowchart illustrating a broadband AC voltage measurement method based on a quantum DC reference voltage in one embodiment.

[0064] Figure 2 This is a flowchart illustrating a broadband AC voltage measurement method based on a quantum DC reference voltage in another embodiment.

[0065] Figure 3 This is a block diagram of a broadband AC voltage measurement system based on a quantum DC reference voltage in one embodiment;

[0066] Figure 4This is a block diagram of a broadband AC voltage measurement device based on a quantum DC reference voltage in one embodiment;

[0067] Figure 5 This is a block diagram of a broadband AC voltage measurement device based on a quantum DC reference voltage in a specific application example.

[0068] Figure 6 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0069] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0070] In one embodiment, such as Figure 1 As shown, a broadband AC voltage measurement method based on a quantum DC reference voltage is provided, including the following steps:

[0071] S100: Acquires multiple candidate quantum DC reference voltages and measured AC voltage data.

[0072] Candidate quantum DC reference voltages refer to a series of discrete DC voltage values ​​with quantum accuracy generated by a quantum voltage reference source. Specifically, this quantum voltage reference source can be implemented using a programmable Josephson array, generating stable quantized voltage steps via microwave drive. These voltage values ​​constitute a discrete, callable set of reference voltages for selection and allocation in subsequent steps. The measured AC voltage data is waveform information obtained by acquiring the input signal. In practical applications, the measured AC voltage data can be acquired through an auxiliary uniform sampling module. This module performs analog-to-digital conversion on the measured AC voltage at a predetermined fixed sampling rate, obtaining a uniformly spaced sequence of sampling points to obtain the measured AC voltage data.

[0073] S200: Based on the characteristic parameters of the measured AC voltage data, select a matching comparison reference voltage from multiple candidate quantum DC reference voltages and assign the selected comparison reference voltage to multiple comparison channels.

[0074] Here, not all candidate reference voltages are connected to all comparison channels at once and in a fixed manner, but rather selected and allocated dynamically and in a matching manner based on the real-time characteristics of the measured signal. The characteristic parameters of the measured AC voltage data are quantities used to characterize the signal amplitude, rate of change, and other properties. Specifically, the characteristic parameters may include at least one of the estimated amplitude, estimated frequency, and local variation characteristics obtained from the measured AC voltage data. Local variation characteristics can further refer to parameters such as local slope and local curvature, reflecting the degree of waveform change within a specific range. Selecting a matching reference voltage means that the value and distribution of the selected reference voltage are adapted to the current state of the measured signal. For example, in sections where the waveform changes steeply, reference voltages with denser voltage intervals can be selected for allocation; in sections where the waveform changes gently, reference voltages with sparser voltage intervals can be selected. This matching selection allows limited comparison channel resources to be preferentially allocated to key waveform sections with richer information. The allocation of the selected reference voltages to multiple comparison channels can be physically implemented using a switching matrix. Based on the selection result, the control unit physically connects the corresponding candidate reference voltage to the input of each comparator, thereby realizing flexible mapping between the channel and the reference voltage.

[0075] S300: Detects the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the comparison process between the measured AC voltage data and the corresponding selected comparison reference voltage, and records the timestamp and channel number of each original event signal.

[0076] Each comparison channel compares a selected reference voltage with the measured AC voltage in real time. When the instantaneous value of the measured AC voltage changes and crosses the level of the reference voltage connected to that comparison channel, the comparator's output state flips, generating a raw event signal. This event signal itself signifies that "the waveform crossed a known quantum reference voltage value at a certain moment." The recorded timestamp precisely marks the moment this level crossing occurred, and the channel number identifies the comparison channel that generated the event, which can then be associated with the specific value of the selected reference voltage connected to that channel. In this way, each raw event signal corresponds to an accurate voltage value and time point, forming a set of non-uniform event sampling information referenced to the quantum reference voltage. Exemplarily, this comparison and recording process can be performed collaboratively by a high-speed comparator and its accompanying multi-channel precision timer.

[0077] S400: Based on the timestamp and channel number, the original event signal and the corresponding selected comparison reference voltage are compensated to obtain the compensated non-uniform event sampling dataset.

[0078] This step utilizes the timestamp and channel number recorded by S300 to compensate the original event signal and the corresponding selected comparison reference voltage. The channel number identifies the specific comparison channel that generated the original event signal, allowing for the acquisition of compensation parameters tailored to the characteristics of that channel. The timestamp, as the original object to be compensated, yields an event time closer to the actual time of the event after compensation. In practical applications, the compensation parameters for each comparison channel can be pre-established through the self-calibration module. Specifically, in calibration mode, the self-calibration module sequentially inputs known calibration signals to each comparison channel, records the measured response of each channel under different operating conditions, and compares it with theoretical values ​​to establish the time compensation parameters and reference voltage bias compensation parameters for each channel. During actual measurement, the data fusion processing module can use the channel number and timestamp provided by S300 to call the corresponding compensation parameters to complete the correction. The compensated accurate event time and reference voltage value together constitute a non-uniform event sampling dataset for subsequent joint reconstruction.

[0079] S500: The acquired AC voltage data under test and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data under test.

[0080] This step achieves high-precision waveform reconstruction by fusing two complementary sampling information sets. The measured AC voltage data provides the overall profile and trend information of the measured signal, is uniform in the time domain, and can effectively constrain the low-frequency components and macroscopic shape of the waveform. The non-uniform event sampling dataset provides precise event points under a quantum-accurate reference voltage. These points are highly accurate but non-uniformly distributed. Joint reconstruction refers to using both types of data simultaneously within a unified mathematical framework, rather than simply using one type of data to calibrate the other. Specifically, a function containing multiple objective terms can be constructed, one of which constrains the value of the reconstructed waveform at the event time to be consistent with the compensated reference voltage, and the other constrains the reconstructed waveform to approximate the overall value of the uniformly sampled measured AC voltage data. By solving this optimization problem using methods such as weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform, and its inverse transform, the reconstructed waveform of the measured AC voltage data can be obtained. This reconstructed waveform possesses both the voltage accuracy guaranteed by the quantum reference and the waveform continuity guaranteed by the uniformly sampled data. Finally, measurement results such as amplitude, frequency, phase, and harmonic parameters can be further extracted from it.

[0081] In one embodiment, obtaining multiple candidate quantum DC reference voltages includes:

[0082] Step 1: Obtain multiple candidate quantum DC reference voltages from the quantum DC voltage reference source, centered on the reference potential point, using the positive and negative polarity Josephson array output;

[0083] The quantum DC voltage reference source includes 2N programmable Josephson arrays. N programmable Josephson arrays are connected in series to form a positive quantum voltage output arm, and N programmable Josephson arrays are connected in series to form a negative quantum voltage output arm. The reference potential point is located between the positive and negative quantum voltage output arms.

[0084] A quantum DC voltage reference source, as a device capable of generating DC voltage with quantum accuracy, is based on the Josephson effect, which directly converts microwave frequencies into quantized voltage values. In this embodiment, the quantum DC voltage reference source adopts a bipolar symmetrical structure, extending in the positive and negative voltage directions respectively from the reference potential point.

[0085] Specifically, the quantum DC voltage reference source comprises 2N programmable Josephson arrays. N programmable Josephson arrays are connected in series to form a positive quantum voltage output arm, and N programmable Josephson arrays are connected in series to form a negative quantum voltage output arm. The reference potential point is located between the positive and negative quantum voltage output arms. This symmetrical structure allows the reference source to simultaneously output multiple candidate quantum DC reference voltages covering both positive and negative voltage ranges, meeting the requirement for positive and negative symmetrical reference levels in AC voltage measurements. The aforementioned reference potential point serves as a common reference point for both positive and negative voltage outputs. Specifically, this reference potential point can be connected to ground potential, thus providing a stable zero-potential reference for the entire measurement system. From the reference potential point towards the positive voltage direction, the output voltage increases sequentially with each programmable Josephson array crossed, forming a series of discrete positive candidate quantum DC reference voltages; from the reference potential point towards the negative voltage direction, the output voltage decreases sequentially with each programmable Josephson array crossed, forming a series of discrete negative candidate quantum DC reference voltages.

[0086] In one embodiment, such as Figure 2 As shown, based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from multiple candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to multiple comparison channels, including:

[0087] S220: Acquire characteristic parameters of the measured AC voltage data, including estimated amplitude, estimated frequency, and local variation characteristics.

[0088] The estimated amplitude refers to the estimated range of signal amplitude within the current measurement window of the measured AC voltage, used to determine the effective amplitude range of the reference voltage. The estimated frequency refers to the estimated fundamental frequency or main frequency component of the measured AC voltage, reflecting the overall rate of signal change. Local variation characteristics refer to parameters characterizing the degree of change of the measured AC voltage within a specific local interval, used to reflect the differences in information density in different segments of the waveform. Specifically, the above characteristic parameters can be obtained through statistical analysis of the auxiliary sampling data acquired by the auxiliary uniform sampling module. For example, the estimated amplitude range can be determined by detecting the peak and valley values ​​of the auxiliary sampling data; the estimated frequency can be obtained by zero-crossing detection or spectral analysis of the auxiliary sampling data; and the local variation characteristics can be characterized by calculating parameters such as the local slope and local curvature of the auxiliary sampling data in different time intervals. In addition, local variation characteristics can also be derived from the reconstruction results of the previous measurement window or the statistical distribution density of existing event signals within the current measurement window.

[0089] S240: Based on the characteristic parameters of the measured AC voltage data, select a partially matched comparison reference voltage from multiple candidate quantum DC reference voltages and allocate the selected comparison reference voltage to multiple comparison channels.

[0090] The matching here refers to ensuring that the number, value, and distribution location of the selected reference voltages are compatible with the current state of the measured signal. Specifically, the effective amplitude range of the current measurement window is determined based on the estimated amplitude, and the selected voltage range is limited to this range. Based on local variation characteristics, the reference voltage distribution density at different voltage locations within this effective amplitude range is determined. In areas with rapid local changes, a denser reference voltage distribution is selected to obtain more sufficient event sampling points; in areas with slow local changes, a sparser reference voltage distribution is selected to avoid wasting sampling resources. In this way, limited comparison channel resources are preferentially allocated to key sections that contribute more information to waveform reconstruction. Specifically, the above selection and allocation operations can be completed by the reference voltage scheduling control unit in conjunction with the switching matrix. The reference voltage scheduling control unit reads the characteristic parameters and executes the selection decision, determining which candidate reference voltages are selected as the chosen comparison reference voltages; the switching matrix then physically connects the corresponding candidate reference voltages to the input terminals of each comparison channel according to the selection results. The switching matrix can be implemented using analog switching matrices, analog multiplexer arrays, or cross-connection matrices, and its switching action can change as the measurement window is updated, enabling the system to be dynamically configured for different waveform segments.

[0091] In one embodiment, the original event signal and the corresponding selected comparison reference voltage are compensated based on the timestamp and channel number to obtain a compensated non-uniform event sampling dataset, which includes:

[0092] Step 1: Obtain the calibration response of each comparison channel, and establish time compensation parameters and reference voltage bias compensation parameters based on the calibration response.

[0093] The calibration response of each comparator channel refers to the actual output characteristics exhibited by each comparator channel under known input conditions. Due to differences in manufacturing processes and device characteristics, hardware differences such as offset voltage and propagation delay inevitably exist between different comparator channels. The process of obtaining the calibration response is essentially a systematic measurement and recording of the actual behavior of each channel under specific operating conditions. Specifically, obtaining the calibration response can be accomplished in calibration mode through a self-calibration module. This self-calibration module may include a calibration signal generation unit, used to sequentially input calibration signals with known characteristics to each comparator channel and record the measured trigger time of each channel under different conditions. Different conditions may include, for example, the edge direction of the event signal, the local slope of the signal at the time of event occurrence, and the current operating temperature. By comparing the measured trigger time with the theoretical trigger time, the time deviation information of each channel is obtained, and then the time compensation parameters of each channel are statistically established. At the same time, by analyzing the difference between the equivalent comparison threshold and the nominal reference voltage of each channel under different conditions, reference voltage bias compensation parameters are established to correct the comparator offset voltage and its drift effect at different temperatures.

[0094] Step 2: Based on the timestamp and channel number, and according to the time compensation parameters and the reference voltage bias compensation parameters, compensate the original event signal and the corresponding selected comparison reference voltage to obtain the compensated non-uniform event sampling dataset.

[0095] The channel number identifies the specific comparison channel that generated the original event signal, allowing the retrieval of the corresponding time compensation parameters and reference voltage bias compensation parameters from the compensation parameters established in step 1. The timestamp identifies the moment the event occurred; this timestamp itself serves as the original object to be compensated. By applying the time compensation parameters to this channel, a more accurate compensated event time is obtained. Specifically, based on the channel number of each original event signal, the corresponding compensation parameters can be obtained from a table. Time compensation correction is then applied to the original event time, and reference voltage bias compensation is applied to the corresponding selected comparison reference voltage. Thus, the original event signal is corrected to a more precise event time and a more accurate comparison reference voltage value. These two elements together constitute the compensated non-uniform event sampling dataset, used for subsequent joint reconstruction.

[0096] In a specific application example, the self-calibration module records the channel response of each comparison channel under different edge directions b, different local slopes s, and different operating temperatures T, and establishes the time compensation function corresponding to the j-th comparison channel based on this. and reference voltage bias compensation function .

[0097] Specifically, for the j-th comparison channel in the i-th calibration event, its time deviation can be expressed as: ;in, This represents the measured trigger time of the j-th comparison channel under the i-th calibration event. This indicates the corresponding theoretical trigger time. The self-calibration module establishes a time compensation function based on time deviation and statistical results under different edge directions, local slopes, and temperature conditions. Simultaneously, the self-calibration module also establishes a reference voltage bias compensation function to compensate for the comparator offset voltage and its temperature drift effects. .

[0098] In one embodiment, the calibration response of each comparison channel is obtained, and time compensation parameters and reference voltage bias compensation parameters are established based on the calibration response, including:

[0099] Step 1: Input the known calibration signal into each comparison channel in sequence and obtain the current operating temperature.

[0100] The known calibration signal refers to a reference signal with predetermined waveform characteristics. Its theoretical trigger time and theoretical trigger level can be accurately calculated, providing a reliable benchmark for subsequent comparisons. Inputting the signal sequentially to each comparison channel means that the calibration operation is performed channel-by-channel, with each channel independently receiving the calibration signal excitation and thus obtaining its own independent response data. Simultaneously acquiring the current operating temperature is crucial because the comparator's offset voltage, propagation delay, and other characteristics often drift with temperature changes. Including temperature as one of the calibration conditions in the record provides data support for subsequently establishing a temperature-dependent compensation model.

[0101] Step 2: Record the channel calibration response of each comparison channel under different edge directions, different local slopes, and different operating temperatures.

[0102] Edge direction refers to the direction of change of the calibration signal when it crosses the comparison threshold, and is divided into rising edge and falling edge. Due to the asymmetry of the comparator's internal circuitry, the response delay of the same channel to the rising edge and falling edge often differs, therefore it is necessary to record them separately according to different edge directions. Local slope refers to the rate of change of the calibration signal at the moment the event occurs; the degree of overdrive of the comparator varies under different slopes, and the response delay will also differ. Operating temperature, as mentioned above, affects the temperature drift characteristics of the device. By systematically recording the measured trigger times of each channel under the above multi-dimensional conditions, a calibration dataset that fully reflects the non-ideal characteristics of the channels can be obtained.

[0103] Step 3: Based on the channel calibration response, obtain the time compensation function and reference voltage deviation compensation function corresponding to different comparison channels.

[0104] The time compensation function describes the relationship between the channel's time deviation and various influencing factors. Specifically, the measured trigger time for each calibration event is compared with the corresponding theoretical trigger time to obtain the time deviation for that event. Then, through fitting or interpolation methods, a time compensation function is established with variables such as edge direction, local slope, and operating temperature. The reference voltage deviation compensation function describes the relationship between the channel's comparison threshold and the nominal reference voltage. It mainly compensates for the comparator offset voltage and its drift effect at different temperatures. It can be established by analyzing the equivalent comparison level deviation of each channel under different conditions.

[0105] In one embodiment, the acquired measured AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the measured AC voltage data, including:

[0106] Step 1: Use a preset fusion algorithm to jointly reconstruct the measured AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the measured AC voltage data; wherein, the preset fusion algorithm includes at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform and non-uniform discrete Fourier inverse transform.

[0107] The measured AC voltage data is obtained through uniform sampling, providing the overall profile, amplitude range, and macroscopic trend of the measured signal. Its advantage lies in complete time-domain coverage, but voltage accuracy is limited by the precision of the sampling channels. The non-uniform event sampling dataset is obtained through event triggering, consisting of a series of compensated precise event times and corresponding compensated comparison reference voltages. Its advantage is that the voltage value at each sampling point has a quantum reference, resulting in high accuracy, but the sampling points are unevenly distributed along the time axis. Joint reconstruction refers to simultaneously utilizing both types of data within a unified mathematical framework for waveform reconstruction, rather than simply using one type of data to calibrate or replace the other. Through fusion, the trend constraints provided by the uniform sampling data can compensate for the sparsity and non-uniformity of the event sampling points in time, while the high-precision voltage reference provided by the event sampling data can improve the accuracy of the reconstructed waveform at critical levels; the two complement each other. The preset fusion algorithm refers to the pre-selected mathematical method used to achieve the above joint reconstruction. In this embodiment, the preset fusion algorithm includes at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform, and non-uniform discrete Fourier transform. These algorithms can handle non-uniformly distributed sampling points and support joint solutions for multi-source data.

[0108] In specific application examples, fusion can be achieved through a data fusion processing module. Before joint reconstruction, the module first compensates for the original event time and the corresponding selected comparison reference voltage. Regarding the original event time... The data fusion processing module performs time compensation according to the following formula:

[0109] ;

[0110] in, This is the compensated event time. For the selected comparison reference voltage corresponding to the event. The data fusion processing module performs reference voltage bias compensation according to the following formula:

[0111] ;

[0112] in, This is the compensated reference voltage.

[0113] After compensation, the data fusion processing module constructs a non-uniform event sampling dataset:

[0114] ;

[0115] And combine it with the auxiliary sampling dataset output by the auxiliary uniform sampling module:

[0116] ;

[0117] The measured AC voltage is jointly reconstructed. More specifically, this is achieved by constructing the following objective function:

[0118] ;

[0119] in, To reconstruct the waveform, The weights of the event sampling points, To assist in the weighting of sampling points, For the auxiliary sampling constraint term weight coefficients, The weight coefficients for the regularization term. This is a regularization constraint term. In the objective function above, the first term is used to constrain the reconstructed waveform to be consistent with the corresponding compensated reference voltage at each event occurrence time; the second term is used to constrain the reconstructed waveform to maintain consistency with the auxiliary uniform sampling result in the overall trend; and the third term is used to suppress noise amplification and non-physical oscillations.

[0120] Alternatively, the non-uniform discrete Fourier interpolation method can be used to reconstruct the frequency domain of the compensated non-uniform event sampling data. Let the compensated non-uniform event sampling points be... Then its non-uniform discrete Fourier transform can be expressed as:

[0121] ;

[0122] For any interpolation frequency point If the following conditions are met:

[0123] ;

[0124] The frequency domain interpolation result can then be expressed as:

[0125] ;

[0126] The interpolated frequency domain data is then used to reconstruct the time domain signal through inverse transform:

[0127] ;

[0128] This also allows us to obtain the reconstructed waveform of the measured AC voltage and further extract its amplitude, frequency, phase, and harmonic parameters.

[0129] In one embodiment, after jointly reconstructing the acquired AC voltage data under test and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data under test, the method further includes:

[0130] Step 1: Based on the reconstructed waveform of the current measurement window, update the data, values, and distribution positions of the selected comparison reference voltage in the next measurement window.

[0131] After completing waveform reconstruction for the current measurement window, the system has obtained complete waveform information of the measured AC voltage within that window, as well as the distribution of each event signal in different waveform segments. This information provides a basis for optimizing the reference voltage configuration for the next window.

[0132] Updating the selected reference voltage data refers to adjusting the number of reference voltages selected for the next window. When the reconstruction results show that the number of event sampling points in a certain segment is insufficient or redundant, the number of reference voltages in that segment can be increased or decreased accordingly. Updating the value of the selected reference voltage means adjusting the specific voltage value of the selected reference voltage to better match the estimated amplitude range of the signal in the next window. Updating the distribution position of the selected reference voltage means adjusting the density of the reference voltages within the effective amplitude range to match the local variation characteristics of the measured signal.

[0133] Step 2: Return to the steps of selecting a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and assigning the selected comparison reference voltage to multiple comparison channels, until the preset measurement stop condition is reached.

[0134] After updating the reference voltage configuration information for the next window in step 1, the system returns and re-executes the reference voltage selection and allocation steps, using the updated configuration for a new round of event sampling, compensation, and joint reconstruction. This process is repeated continuously, with each measurement window adaptively adjusting based on the reconstruction results of the previous window. The preset measurement stop condition refers to the trigger condition for the system to end iterative measurements. Specifically, this stop condition may include, but is not limited to, reaching a preset number of measurement windows.

[0135] It should be understood that although the steps in the flowcharts of the above embodiments are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0136] Based on the same inventive concept, this application also provides a broadband AC voltage measurement system based on a quantum DC reference voltage for implementing the broadband AC voltage measurement method based on a quantum DC reference voltage described above. The solution provided by this system is similar to the implementation described in the above method. Therefore, the specific limitations of one or more embodiments of the broadband AC voltage measurement system based on a quantum DC reference voltage provided below can be found in the limitations of the broadband AC voltage measurement method based on a quantum DC reference voltage described above, and will not be repeated here.

[0137] In one embodiment, such as Figure 3 As shown, a broadband AC voltage measurement system based on a quantum DC reference voltage is provided, comprising:

[0138] The data acquisition module 310 is used to acquire multiple candidate quantum DC reference voltages and the measured AC voltage data;

[0139] The channel allocation module 320 is used to select a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to multiple comparison channels.

[0140] The recording module 330 is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the process of comparing the measured AC voltage data with the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each original event signal.

[0141] The compensation module 340 is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset.

[0142] The reconstruction module 350 is used to jointly reconstruct the acquired AC voltage data under test and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data under test.

[0143] In one embodiment, the data acquisition module 310 is further configured to acquire multiple candidate quantum DC reference voltages output by the quantum DC voltage reference source with a reference potential point as the center, using positive and negative polarity Josephson arrays; wherein, the quantum DC voltage reference source includes 2N programmable Josephson arrays, N programmable Josephson arrays connected in series to form a positive polarity quantum voltage output arm, N programmable Josephson arrays connected in series to form a negative polarity quantum voltage output arm, and the reference potential point is located between the positive polarity quantum voltage output arm and the negative polarity quantum voltage output arm.

[0144] In one embodiment, the channel allocation module 320 is further configured to acquire characteristic parameters of the measured AC voltage data, including estimated amplitude, estimated frequency and local variation characteristics; based on the characteristic parameters of the measured AC voltage data, select a partially matched selected comparison reference voltage from multiple candidate quantum DC reference voltages and allocate the selected comparison reference voltage to multiple comparison channels.

[0145] In one embodiment, the compensation module 340 is further configured to acquire the calibration response of each comparison channel, establish time compensation parameters and reference voltage bias compensation parameters based on the calibration response, and compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number, and according to the time compensation parameters and reference voltage bias compensation parameters, to obtain the compensated non-uniform event sampling dataset.

[0146] In one embodiment, the compensation module 340 is further configured to sequentially input known calibration signals to each comparison channel and obtain the current operating temperature; record the channel calibration response of each comparison channel under different edge directions, different local slopes and different operating temperature conditions; and obtain the time compensation function and reference voltage deviation compensation function corresponding to different comparison channels based on the channel calibration response.

[0147] In one embodiment, the reconstruction module 350 is further configured to jointly reconstruct the measured AC voltage data and the non-uniform event sampling dataset using a preset fusion algorithm to obtain the reconstructed waveform of the measured AC voltage data; wherein the preset fusion algorithm includes at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform, and non-uniform discrete Fourier inverse transform.

[0148] In one embodiment, the reconstruction module 350 is further configured to update the data, value and distribution position of the selected comparison reference voltage in the next measurement window based on the reconstructed waveform of the current measurement window; the control channel allocation module 320 re-executes the operation of selecting a matching selected comparison reference voltage from multiple candidate quantum DC reference voltages according to the characteristic parameters of the measured AC voltage data and allocating the selected comparison reference voltage to multiple comparison channels until the preset measurement stop condition is reached.

[0149] The modules in the aforementioned broadband AC voltage measurement system based on quantum DC reference voltage can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in hardware within or independently of the processor in a computer device, or stored in software within the computer device's memory, allowing the processor to call and execute the corresponding operations of each module.

[0150] In addition, such as Figure 4 As shown, this application also provides a broadband AC voltage measurement device based on quantum DC reference voltage, including a quantum DC voltage reference source 410, an auxiliary uniform sampling module 420, a reference voltage selection and distribution module 430, an event sampling module 440, a self-calibration module 450, and a data fusion processing module 460.

[0151] The quantum DC voltage reference source 410 is used to output multiple candidate quantum DC reference voltages;

[0152] The auxiliary uniform sampling module 420 is used to collect the AC voltage data under test;

[0153] The reference voltage selection and allocation module 430 is used to select a matching comparison reference voltage from multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to multiple comparison channels.

[0154] The event sampling module 440 is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the process of comparing the measured AC voltage data with the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each original event signal;

[0155] The self-calibration module 450 is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset;

[0156] The data fusion processing module 460 is used to jointly reconstruct the acquired AC voltage data under test and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data under test.

[0157] Specifically, in practical applications, the overall architecture and processing flow of the broadband AC voltage measurement device based on quantum DC reference voltage in this application are as follows: Figure 5 As shown below, the function and processing flow of each component module in a specific application example will be described in detail below.

[0158] The quantum DC voltage reference source is preferably implemented using a Josephson array DC quantum voltage reference source. This quantum DC voltage reference source includes a positive quantum voltage output arm, a negative quantum voltage output arm, and a reference potential point E0 located between them. In the preferred structure, the quantum DC voltage reference source includes 2N programmable Josephson arrays, where N programmable Josephson arrays are connected in series to form the positive quantum voltage output arm, and the other N programmable Josephson arrays are connected in series to form the negative quantum voltage output arm, with E0 as the intermediate common reference point.

[0159] An intermediate reference potential point E0 is set, which is connected to ground potential and serves as a common reference point for the positive and negative voltage outputs. From point E0 towards the positive voltage direction, the output voltage is sequentially labeled E1⁺, E2⁺, ..., E⁻ after each Josephson junction array. n ⁺, where n ≤ N; from point E0 towards the negative voltage direction, the output voltage is labeled E1⁻, E2⁻...E after each Josephson junction array is crossed. n ⁻; The high-speed comparator includes a ground potential comparator P0 connected to point E0, and comparators P connected to each positive voltage tap. n ⁺ and comparator P connected to each negative voltage tap n ⁻ Each comparator has the same electrical characteristics and is powered by an independently isolated dual power supply to eliminate crosstalk between channels and ground loop interference.

[0160] The reference voltage selection and allocation module includes a reference voltage scheduling control unit and a switch matrix. Let Q be the number of candidate quantized DC reference voltages output by the quantum DC voltage reference source, and M be the number of comparison channels in the event sampling module, satisfying Q > M. Under this condition, the system cannot simultaneously connect all candidate quantized DC reference voltages to all comparison channels. Therefore, the reference voltage scheduling control unit needs to select M or fewer than M reference voltages from the Q candidate quantized DC reference voltages as selected comparison reference voltages based on the waveform characteristics in the current measurement window, and then connect the selected comparison reference voltages to multiple comparison channels via the switch matrix.

[0161] The reference voltage scheduling and control unit first reads the auxiliary sampling data output by the auxiliary uniform sampling module to obtain the estimated amplitude range, estimated frequency range, and overall waveform trend of the measured AC voltage. Based on the estimated amplitude range, the effective amplitude interval of the current measurement window is determined; then, based on local variation characteristics, the reference voltage distribution density at different voltage positions within this effective amplitude interval is determined. These local variation characteristics include at least one of the following: the local slope obtained from the auxiliary sampling data, the local curvature obtained from the auxiliary sampling data, the reconstruction result of the previous measurement window, and the distribution density of event signals within the current measurement window.

[0162] In regions with rapid local changes, such as those with large local slopes or curvatures, where the previous window indicates rapid changes in that region, or where the current event distribution is sparse, the reference voltage scheduling control unit increases the distribution density of the selected comparison reference voltage in that region. Conversely, in regions with slow local changes, the distribution density of the selected comparison reference voltage is reduced. In this way, the present invention achieves, with a limited number of comparison channels, prioritizing the allocation of comparison resources to segments that provide more information for the current waveform reconstruction, thereby improving the utilization rate of sampling resources and the sampling effectiveness of key segments.

[0163] The switching matrix can be implemented using any of the following methods: analog switching matrix, analog multiplexer array, or cross-connection matrix. Its function is to select M or fewer than M comparison reference voltages from Q candidate quantized DC reference voltages after the scheduling and control unit has given a selection result, and then connect these selected comparison reference voltages to each comparison channel. Because this switching action can be updated as the measurement window changes, the system has the ability to be dynamically configured for different waveform segments.

[0164] The event sampling module includes M high-speed comparators and a multi-channel precision timer corresponding to each high-speed comparator. The first input of each high-speed comparator is connected to a selected reference voltage, and its second input is connected to the input of the AC voltage being measured. In this way, each comparison channel corresponds to the "comparison relationship between the AC voltage being measured and a certain selected reference voltage".

[0165] When the instantaneous value of the measured AC voltage changes from below a selected reference voltage to above it, or from above a selected reference voltage to below it, the corresponding high-speed comparator outputs an event signal. A multi-channel precision timer records this event signal, obtaining the timestamp, trigger channel number, and edge type corresponding to the event. Therefore, the event sampling module outputs not discrete sampled values ​​on a traditional uniform time axis, but a set of non-uniform event sampling information where the waveform crosses a selected reference voltage. This information is essentially characterized by both time and voltage thresholds, thus possessing high informational value for AC waveform reconstruction.

[0166] The auxiliary uniform sampling module includes an analog-to-digital conversion unit and a sampling clock unit, which are used to uniformly sample the AC voltage under test at a predetermined sampling rate to form an auxiliary sampling dataset.

[0167] It should be noted that the auxiliary uniform sampling module is not the main precision measurement link of this invention. Its main function is not to directly replace event sampling, but to provide the amplitude range, frequency information, and waveform variation trend of the measured AC voltage. This information is input to the reference voltage selection and allocation module to determine the effective amplitude range and reference voltage distribution density; on the other hand, it is input to the data fusion processing module, which uses it as trend constraints and auxiliary information during joint reconstruction. Therefore, the auxiliary uniform sampling data mainly serves as an auxiliary constraint.

[0168] like Figure 5 As shown, the self-calibration module includes a calibration signal generation unit and a temperature acquisition unit. In calibration mode, the calibration signal generation unit sequentially inputs known calibration signals to each comparison channel, and the temperature acquisition unit acquires the current operating temperature T. The self-calibration module records the channel response of each comparison channel under different edge directions b, different local slopes s, and different operating temperatures T, and establishes the time compensation function corresponding to the j-th comparison channel accordingly. and reference voltage bias compensation function .

[0169] The data fusion processing module is connected to the event sampling module, the auxiliary uniform sampling module, the self-calibration module, and the reference voltage selection and allocation module. Before joint reconstruction, the data fusion processing module first compensates for the original event time and the corresponding selected comparison reference voltage.

[0170] The data fusion processing module performs joint reconstruction by constructing the following objective function:

[0171] ;

[0172] in, To reconstruct the waveform, The weights of the event sampling points, To assist in the weighting of sampling points, For the auxiliary sampling constraint term weight coefficients, The weight coefficients for the regularization term. This is a regularization constraint term. In the above objective function, the first term is used to constrain the reconstructed waveform to be consistent with the corresponding compensated reference voltage at each event occurrence time; the second term is used to constrain the reconstructed waveform to maintain consistency with the overall trend of the auxiliary uniform sampling result; and the third term is used to suppress noise amplification and non-physical oscillations. The data fusion processing module can use at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform and its inverse transform to solve the above objective function, thereby obtaining the reconstructed waveform of the measured AC voltage. Furthermore, its amplitude, frequency, phase, and harmonic parameters are extracted.

[0173] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 6 As shown, the computer device includes a processor, memory, communication interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a broadband AC voltage measurement method based on a quantum DC reference voltage. The display screen can be an LCD screen or an e-ink display. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad on the computer device's casing, or an external keyboard, touchpad, or mouse.

[0174] Those skilled in the art will understand that Figure 6 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0175] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the above-described broadband AC voltage measurement method based on a quantum DC reference voltage.

[0176] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the above-described broadband AC voltage measurement method based on a quantum DC reference voltage.

[0177] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the above-described broadband AC voltage measurement method based on a quantum DC reference voltage.

[0178] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0179] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0180] The above embodiments are merely illustrative of several implementation methods of this application, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for measuring wideband AC voltage based on a quantum DC reference voltage, characterized in that, The method includes: Acquire multiple candidate quantum DC reference voltages, as well as measured AC voltage data; Based on the characteristic parameters of the measured AC voltage data, a matching comparison reference voltage is selected from the plurality of candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to a plurality of comparison channels; During the process of comparing the measured AC voltage data with the corresponding selected comparison reference voltage, the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage are detected, and the timestamp and channel number of each original event signal are recorded. Based on the timestamp and channel number, the original event signal and the corresponding selected comparison reference voltage are compensated to obtain the compensated non-uniform event sampling dataset. The acquired AC voltage data and the non-uniform event sampling dataset are jointly reconstructed to obtain the reconstructed waveform of the AC voltage data.

2. The method according to claim 1, characterized in that, Obtaining multiple candidate quantum DC reference voltages includes: Multiple candidate quantum DC reference voltages are obtained by using a positive and negative polarity Josephson array to output the quantum DC voltage reference source centered on the reference potential point. The quantum DC voltage reference source includes 2N programmable Josephson arrays. N programmable Josephson arrays are connected in series to form a positive quantum voltage output arm, and N programmable Josephson arrays are connected in series to form a negative quantum voltage output arm. The reference potential point is located between the positive quantum voltage output arm and the negative quantum voltage output arm.

3. The method according to claim 1, characterized in that, The step of selecting a matching comparison reference voltage from the plurality of candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data and allocating the selected comparison reference voltage to multiple comparison channels includes: The characteristic parameters of the measured AC voltage data are obtained, including the estimated amplitude, the estimated frequency, and local variation characteristics. Based on the characteristic parameters of the measured AC voltage data, a partially matched selected comparison reference voltage is selected from the plurality of candidate quantum DC reference voltages, and the selected comparison reference voltage is assigned to a plurality of comparison channels.

4. The method according to claim 1, characterized in that, The compensation of the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset includes: Obtain the calibration response of each comparison channel, and establish time compensation parameters and reference voltage bias compensation parameters based on the calibration response; Based on the timestamp and channel number, and according to the time compensation parameter and the reference voltage bias compensation parameter, the original event signal and the corresponding selected comparison reference voltage are compensated to obtain the compensated non-uniform event sampling dataset.

5. The method according to claim 4, characterized in that, The process of acquiring the calibration response of each comparison channel and establishing time compensation parameters and reference voltage bias compensation parameters based on the calibration response includes: Input the known calibration signal into each comparison channel in sequence and obtain the current operating temperature; Record the channel calibration response of each comparison channel under different edge directions, different local slopes, and different operating temperatures; Based on the channel calibration response, the time compensation function and the reference voltage deviation compensation function corresponding to different comparison channels are obtained.

6. The method according to claim 1, characterized in that, The step of jointly reconstructing the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data includes: A preset fusion algorithm is used to jointly reconstruct the measured AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the measured AC voltage data. The preset fusion algorithm includes at least one of weighted least squares fitting, spline interpolation, non-uniform discrete Fourier transform, and non-uniform discrete Fourier inverse transform.

7. The method according to claim 1, characterized in that, After jointly reconstructing the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data, the method further includes: Based on the reconstructed waveform of the current measurement window, update the data, values, and distribution locations of the selected comparison reference voltage in the next measurement window; The process returns to the steps of selecting a matching comparison reference voltage from the plurality of candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocating the selected comparison reference voltage to the plurality of comparison channels, until the preset measurement stop condition is reached.

8. A broadband AC voltage measurement system based on a quantum DC reference voltage, characterized in that, The system includes: The data acquisition module is used to acquire multiple candidate quantum DC reference voltages and the measured AC voltage data; The channel allocation module is used to select a matching comparison reference voltage from the plurality of candidate quantum DC reference voltages according to the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to the plurality of comparison channels; The recording module is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the process of comparing the measured AC voltage data with the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each of the original event signals; The compensation module is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain the compensated non-uniform event sampling dataset. The reconstruction module is used to jointly reconstruct the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data.

9. A broadband AC voltage measuring device based on a quantum DC reference voltage, characterized in that, It includes a quantum DC voltage reference source, an auxiliary uniform sampling module, a reference voltage selection and allocation module, an event sampling module, a self-calibration module, and a data fusion processing module; The quantum DC voltage reference source is used to output multiple candidate quantum DC reference voltages; The auxiliary uniform sampling module is used to collect the measured AC voltage data; The reference voltage selection and allocation module is used to select a matching comparison reference voltage from the multiple candidate quantum DC reference voltages based on the characteristic parameters of the measured AC voltage data, and allocate the selected comparison reference voltage to multiple comparison channels; The event sampling module is used to detect the original event signals when the measured AC voltage data crosses the corresponding selected comparison reference voltage during the process of comparing the measured AC voltage data with the corresponding selected comparison reference voltage, and to record the timestamp and channel number of each original event signal; The self-calibration module is used to compensate the original event signal and the corresponding selected comparison reference voltage based on the timestamp and channel number to obtain a compensated non-uniform event sampling dataset. The data fusion processing module is used to jointly reconstruct the acquired AC voltage data and the non-uniform event sampling dataset to obtain the reconstructed waveform of the AC voltage data.

10. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

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