A port impedance online measurement method and system based on a dual-inductor probe configuration

By adopting an online port impedance measurement method based on dual inductor probes, the problems of measurement error and scenario limitations in traditional methods are solved, achieving efficient and accurate measurement of circuit port impedance parameters and supporting EMI black-box modeling.

CN122307194APending Publication Date: 2026-06-30HARBIN INST OF TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
HARBIN INST OF TECH
Filing Date
2026-06-02
Publication Date
2026-06-30

AI Technical Summary

Technical Problem

Existing technologies cannot effectively measure the port impedance of circuits, especially multi-port impedance parameters. Furthermore, the traditional dual-probe method suffers from signal attenuation and phase shift issues in high-impedance scenarios, failing to meet the requirements for EMI black-box modeling.

Method used

An online port impedance measurement method based on dual inductor probes is adopted. The probe characteristic parameters are measured by a calibration fixture and a vector network analyzer. Combined with a simple and efficient calibration strategy, the probe characteristic parameters are directly calculated, eliminating the influence of probe reflection and realizing the online measurement of multi-port impedance parameters.

Benefits of technology

It simplifies the measurement process, reduces random errors, achieves high-precision port impedance measurement, and supports EMI black-box modeling and comprehensive characterization of circuit parameters.

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Abstract

This invention belongs to the field of circuit impedance measurement and discloses an online port impedance measurement method and system based on a dual-inductor probe configuration. The method includes: S1: calibrating a probe clamp on a fixture, measuring the two-port S-parameters using a VNA, then removing the probe; measuring the fixture reflection coefficient at the port connected to the VNA, and measuring the probe's unloaded reflection coefficient at the port connected to the probe. S k S2: Repeat the operation of S1 with another probe to measure its relevant S-parameters; S3: After calibration and measurement, based on the two-port S-parameters, fixture reflection coefficient, and unloaded reflection coefficient... S k S4: Calculate the characteristic parameters of each of the two probes; S5: Perform online port impedance measurement by clamping the dual inductor probes onto the wires of the two ports to be measured and measuring the S-parameters; S6: After the measurement is completed, combine the measured port S-parameters with the probe characteristic parameters and the no-load reflection coefficient to calculate the port impedance parameters.
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