Motherboard testing device and motherboard testing method
By designing a detachable testing socket and a movable transfer component, the problem of the inflexibility of existing motherboard testing devices is solved, enabling rapid adaptation and efficient testing of different motherboard models.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TESTRON SUZHOU ELECTRONICS
- Filing Date
- 2026-03-25
- Publication Date
- 2026-06-30
AI Technical Summary
The transmission and support devices of existing motherboard testing equipment are fixed structures, making it difficult to make flexible adjustments according to different motherboard models, resulting in low testing efficiency and poor equipment versatility.
A motherboard testing device was designed, including a detachable first testing base, a second testing base, and a lifting base. Through detachable connections and movable transmission components, it enables rapid adaptation and testing of motherboards of different models.
It improves the adaptability and versatility of the motherboard testing device, enhances testing efficiency, simplifies the equipment replacement process, and reduces operational complexity.
Smart Images
Figure CN122307304A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of testing technology, and in particular to a motherboard testing device and a motherboard testing method. Background Technology
[0002] Motherboard testing is the process of testing the electrical performance and functional integrity of the motherboard under test. This is done to detect whether the motherboard has defects such as short circuits, open circuits, poor soldering, or component failures. It is a key step in the motherboard production process.
[0003] In existing technologies, the transmission and bearing devices of motherboard testing devices are mostly fixed structures, making it difficult to make flexible adjustments according to different motherboard models. They usually require disassembly and replacement, which is a cumbersome process and results in low testing efficiency. Summary of the Invention
[0004] The motherboard testing device and method provided in this invention at least solve the problem that the transmission device for motherboard testing cannot be adjusted according to different motherboard models.
[0005] On one hand, embodiments of the present invention provide a motherboard testing device, comprising: a base; a first testing seat detachably connected to the base; a conveying assembly disposed on the base; two conveying assemblies are provided, arranged alternately along a first direction; at least one conveying assembly is movable along the first direction; the conveying assembly is used to convey a motherboard to be tested; a second testing seat disposed below the first testing seat; the second testing seat is arranged alternately facing the first testing seat; a lifting seat disposed below the second testing seat; the second testing seat is detachably connected to the lifting seat; along a second direction, the lifting seat is movable relative to the base to drive the second testing seat to switch between a separation position and a testing position; the second direction is parallel to the vertical direction; the first direction is perpendicular to the second direction; when the lifting seat is switched to the separation position, the second testing seat is separated from the motherboard to be tested on the conveying assembly; when the lifting seat is switched to the testing position, the motherboard to be tested is clamped between the second testing seat and the first testing seat to achieve testing.
[0006] In one embodiment of the present invention, the lifting seat is provided with a first limiting member and a first guide member; along the first direction, the first limiting member and the first guide member are arranged at intervals; the first limiting member is provided with a first limiting groove; the second detection seat is provided with a first limiting part and a first guide groove; along a third direction, the first limiting part is slidably connected to the first limiting groove, and the first guide groove is slidably connected to the first guide member; the third direction is perpendicular to the second direction and the first direction respectively.
[0007] In one embodiment of the present invention, the second detection seat is provided with a first limiting hole; the lifting seat is provided with a second limiting hole; the first limiting hole and the second limiting hole are correspondingly provided; the motherboard detection device further includes a second limiting member, a portion of which is disposed within the first limiting hole and the second limiting hole; the second limiting member is movable along a third direction to abut against or move away from the inner wall surface of the first limiting hole.
[0008] In one embodiment of the present invention, along a third direction, a third limiting member is provided at one end of the lifting seat, a second limiting groove is provided on the third limiting member, and a second limiting part is provided on the second detection seat, the second limiting part abutting against the second limiting groove; along a third direction, a first fastener is provided at the end of the lifting seat away from the third limiting member, the first fastener connecting the lifting seat and the second detection seat respectively.
[0009] In one embodiment of the present invention, a fourth limiting member and a fifth limiting member are provided on the base; the fourth limiting member and the fifth limiting member are arranged sequentially at intervals along the first direction; the fourth limiting member is provided with a third limiting groove, and the fifth limiting member is provided with a fourth limiting groove; the first detection seat is provided with a third limiting part and a fourth limiting part; along the third direction, the third limiting part is slidably connected to the third limiting groove, and the fourth limiting part is slidably connected to the fourth limiting groove.
[0010] In one embodiment of the present invention, a plurality of fifth limiting members are provided; the plurality of fifth limiting members are arranged sequentially at intervals along the first direction; the fifth limiting members are detachably connected to the base.
[0011] In one embodiment of the present invention, along a third direction, a sixth limiting member is provided at one end of the base, and a fifth limiting part is provided on the first detection seat, the fifth limiting part abutting against the sixth limiting member; along a third direction, a second fastener is provided at the end of the lifting seat away from the fifth limiting member, the second fastener connecting the base and the first detection seat respectively.
[0012] In one embodiment of the present invention, the conveying assembly includes a first drive motor, a lead screw, a first guide post, and a first connector; the first drive motor is disposed on the side of the lifting seat away from the base; two lead screws are provided, arranged alternately along a third direction; the first guide post and the lead screw are arranged alternately along a second direction; the drive end of the first drive motor is connected to the lead screw; two first connectors are provided, arranged alternately along a third direction; one end of the first connector is respectively provided with a lead screw nut and a first guide sleeve; the lead screw nut is threadedly connected to the lead screw, and the first guide sleeve is slidably connected to the first guide post; the conveying assembly further includes a second connector, a second drive motor, a synchronous pulley, and a synchronous belt; the two ends of the second connector are respectively connected to the two first connectors along a third direction; the synchronous pulley and the second drive motor are arranged alternately along a third direction; the synchronous pulley is rotatably connected to the second connector; the second drive motor is connected to the second connector; the synchronous belt is sleeved on the drive end of the second drive motor and the synchronous pulley.
[0013] In one embodiment of the present invention, it further includes: a transmission group, configured as a plurality of transmission groups; the plurality of transmission groups are arranged sequentially at intervals along a third direction; the transmission group includes a plurality of transmission components, the plurality of transmission components are arranged sequentially at intervals along the first direction; a guide inclined surface is provided on the transmission component; an angle is provided between the guide inclined surface and the bottom surface of the lifting seat along the first direction; a plurality of transmission wheels are correspondingly provided on the lifting seat, the transmission wheels abutting against the guide inclined surface.
[0014] On the other hand, embodiments of the present invention also provide a motherboard testing method, applied to the aforementioned motherboard testing device, comprising the following steps:
[0015] Replace the first detection seat on the lifting platform and the second detection seat on the base to adapt to the size of the motherboard under test; wherein, the first detection seat is detachably connected to the base; the second detection seat is disposed below the first detection seat; the second detection seat and the first detection seat are spaced apart and facing each other; the lifting platform is disposed below the second detection seat; the second detection seat is detachably connected to the lifting platform; along a second direction, the lifting platform is movable relative to the base to drive the second detection seat to switch between a separation position and a detection position; the second direction is parallel to the vertical direction; adjust the distance between the two conveying components to adapt to the size of the motherboard under test; wherein, the conveying components are disposed on the base... On the base; two conveying components are configured, arranged alternately along a first direction; at least one of the conveying components is movable along the first direction; the conveying components are used to convey the motherboard under test; the first direction is perpendicular to the second direction; the conveying components are controlled to convey the motherboard under test to the top of the second testing seat; wherein, when the lifting seat is switched to the separation position, the second testing seat separates from the motherboard under test on the conveying components; the lifting seat is controlled to move the second testing seat closer to the first testing seat; wherein, when the lifting seat is switched to the testing position, the motherboard under test is clamped between the second testing seat and the first testing seat to achieve testing.
[0016] Compared with the prior art, the embodiments of the present invention have the following technical effects:
[0017] The first testing seat is detachably connected to the base, and the second testing seat is detachably connected to the lifting seat. The first and second testing seats can be disassembled and replaced to accommodate motherboards of different sizes. At least one conveying component is movable along a second direction, and the distance between the two conveying components can be adjusted according to the different sizes of the motherboards under test. This allows for rapid adaptation and adjustment to motherboards of different sizes, improving the adaptability and versatility of the motherboard testing device and increasing testing efficiency. Attached Figure Description
[0018] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:
[0019] Figure 1 This is a schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0020] Figure 2 This is one of the partial structural schematic diagrams of the motherboard detection device according to an embodiment of the present invention.
[0021] Figure 3This is a second partial structural schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0022] Figure 4 This is the third partial structural schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0023] Figure 5 This is the fourth partial structural schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0024] Figure 6 This is the fifth partial structural schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0025] Figure 7 This is the sixth partial structural schematic diagram of the motherboard detection device according to an embodiment of the present invention.
[0026] The above figures include the following reference numerals:
[0027] D1, First Direction; D2, Second Direction; D3, Third Direction;
[0028] 10. Base; 11. Fourth limiting member; 111. Third limiting groove; 12. Fifth limiting member; 121. Fourth limiting groove; 13. Sixth limiting member; 14. Second fastener; 15. First insertion interface; 16. Diffuse reflection sensor; 17. Second guide post;
[0029] 20. First detection seat; 21. Third limiting part; 22. Fourth limiting part; 23. Second insertion interface; 24. Fifth limiting part;
[0030] 30. Second detection seat; 31. First limiting part; 32. First guide groove; 33. First limiting hole; 34. Second limiting part; 35. Limiting post; 36. Position sensor;
[0031] 40. Transmission assembly; 41. First drive motor; 42. Lead screw; 43. First guide post; 44. First connector; 441. Lead screw nut; 442. First guide sleeve; 45. Second connector; 46. Second drive motor; 47. Synchronous pulley; 48. Synchronous belt;
[0032] 50. Lifting seat; 51. First limiting component; 511. First limiting groove; 52. First guide component; 53. Second limiting hole; 54. Third limiting component; 541. Second limiting groove; 55. First fastener; 56. Transmission wheel; 57. Second guide sleeve;
[0033] 60. Second limiting component;
[0034] 70. Transmission assembly; 71. Transmission component; 711. Guide slope;
[0035] 80. Linear electric cylinder; 81. Third connecting part; 82. Slide rail; 83. Slide groove. Detailed Implementation
[0036] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.
[0037] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.
[0038] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values of the components and steps described in these embodiments do not limit the scope of this application. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items; therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.
[0039] Motherboard testing is the process of testing the electrical performance and functional integrity of the motherboard under test. This is done to detect whether the motherboard has defects such as short circuits, open circuits, poor soldering, or component failures. It is a key step in the motherboard production process.
[0040] In related technologies, the transmission and support devices of motherboard testing equipment are mostly fixed structures. The spacing, height, and support positions of the testing stations are usually fixed, making it difficult to flexibly adjust according to the size and specifications of different motherboard models. This results in poor equipment versatility and high operating costs. Furthermore, the support structures used to support the motherboards are mostly fixed, making disassembly and replacement cumbersome and time-consuming. This fails to meet the needs of rapid switching testing of multiple specifications and batches of motherboards, severely impacting testing efficiency and equipment utilization.
[0041] To solve the above-mentioned technical problems, on the one hand, see Figures 1 to 7As shown, this application provides a motherboard testing device, including a base 10, a first testing seat 20, a transmission assembly 40, a second testing seat 30, and a lifting seat 50. The base 10 is fixedly disposed. Exemplarily, the base 10 can be a separate unit or an integrated unit. Preferably, the base 10 is a separate unit for easy disassembly and maintenance. Specifically, the base 10 includes a first sub-seat and a second sub-seat, one end of the first sub-seat and one end of the second sub-seat are rotatably connected to facilitate opening of the second sub-seat relative to the first sub-seat, and the other ends of the first and second sub-seats are connected by a locking member. A hydraulic rod is disposed between the first and second sub-seats to assist in opening the second sub-seat relative to the first sub-seat, thereby enabling maintenance and disassembly.
[0042] The first testing socket 20 and the base 10 are detachably connected. The first testing socket 20 is used to set up some testing equipment. During the testing of the motherboard under test, the testing equipment on the first testing socket 20 is connected to the motherboard under test to achieve partial testing of the motherboard under test. The first testing socket 20 and the base 10 are detachably connected, and the first testing socket 20 can be replaced with a suitable one according to the motherboard under test of different sizes, thereby improving compatibility and testing efficiency.
[0043] Two transmission components 40 are disposed on the base 10, spaced apart along a first direction D1. At least one transmission component 40 is movable along the first direction D1 to adjust the distance between the two transmission components 40. The transmission components 40 are primarily used for transmitting the motherboard under test. The adjustable distance between the two transmission components 40 allows for the adaptation of motherboards of different sizes. For example, one transmission component 40 may be movable along the first direction D1, while the other transmission component 40 is fixedly disposed on the base 10. Alternatively, both transmission components 40 may be movable along the first direction D1, enabling faster distance adjustment.
[0044] The second testing seat 30 is located below the first testing seat 20, and the first testing seat 20 and the second testing seat 30 are positioned facing each other at a distance. The second testing seat 30 is equipped with some testing devices. During testing, the first testing seat 20 and the second testing seat 30 clamp the motherboard under test, and the testing devices on the second testing seat 30 are connected to the motherboard under test to perform testing.
[0045] The lifting seat 50 is located below the second detection seat 30, and the second detection seat 30 and the lifting seat 50 are detachably connected. The detachable connection between the second detection seat 30 and the lifting seat 50 allows for the replacement of the second detection seat 30 with a suitable one to accommodate different sizes of motherboards under test, thereby improving compatibility and testing efficiency.
[0046] Along the second direction D2, the second detection seat 30 is movable relative to the base 10, moving closer to or further away from the first detection seat 20, thereby switching between a separation position and a detection position. Specifically, when the lifting seat 50 is switched to the separation position, the second detection seat 30 separates from the motherboard under test on the transmission assembly 40; when the lifting seat 50 is switched to the detection position, the motherboard under test is held between the first detection seat 20 and the second detection seat 30, thereby achieving detection. During the movement of the second detection seat 30 along the second direction D2, the second detection seat 30 lifts the motherboard under test on the transmission assembly 40 and, in conjunction with the first detection seat 20, clamps the motherboard under test.
[0047] In summary, the motherboard testing device of the present invention features a detachable connection between the first testing seat 20 and the base 10, and a detachable connection between the second testing seat 30 and the lifting seat 50. By disassembling and replacing the first testing seat 20 and the second testing seat 30, it can adapt to motherboards of different sizes. At least one conveying component 40 is movable along the second direction D2, and the size between the two conveying components 40 can be adjusted according to the different sizes of the motherboards under test. This enables rapid adaptation and adjustment to motherboards of different sizes, improving the adaptability and versatility of the motherboard testing device and increasing testing efficiency.
[0048] Reference Figure 2 As shown, in some embodiments of the motherboard testing device of the present invention, the lifting seat 50 is provided with a first limiting member 51 and a first guide member 52. Along the first direction D1, the first limiting member 51 and the first guide member 52 are arranged at intervals. The first limiting member 51 is provided with a first limiting groove 511, the length direction of which is parallel to the third direction D3. The second testing seat 30 is provided with a first limiting part 31 and a first guide groove 32; along the first direction D1, the first limiting member 51 and the first guide member 52 are arranged at intervals. Along the third direction D3, the first limiting part 31 and the first limiting groove 511 are slidably connected, providing guidance in the third direction D3 and limiting in the first direction D1 and the second direction D2 for the second testing seat 30, facilitating the fixing and quick assembly / disassembly of the second testing seat 30. The first guide groove 32 and the first guide member 52 are slidably connected, providing guidance in the third direction D3 for the second testing seat 30, facilitating the quick assembly / disassembly of the second testing seat 30. It is understandable that the third direction D3 is perpendicular to the first direction D1 and the second direction D2, respectively.
[0049] Reference Figure 3As shown, in some embodiments of the motherboard testing device of the present invention, a first limiting hole 33 is provided on the first testing seat 20. Correspondingly, a second limiting hole 53 is provided on the lifting seat 50. The first limiting hole 33 and the second limiting hole 53 are correspondingly provided. Exemplarily, the shapes of the first limiting hole 33 and the second limiting hole 53 can be rectangular, circular, or triangular.
[0050] A second limiting member 60 is provided on the lifting base 50, and the second limiting member 60 is partially disposed within the first limiting hole 33 and the second limiting hole 53. The second limiting member 60 is movable along a third direction D3 to abut against or move away from the inner wall of the first limiting hole 33, thereby providing a third-party limiting on the second detection seat 30 in the third direction D3, and positioning the second detection seat 30 in the third direction D3 when it is replaced. For example, one end of the first limiting member 51 is connected to a driving device, which is disposed on the lifting base 50 to drive the second limiting member 60 to move along the third direction D3. Preferably, the first limiting hole 33 and the second limiting hole 53 are rectangular to facilitate the abutment and processing design of the second limiting member 60.
[0051] Reference Figure 2 As shown, in some embodiments of the motherboard testing device of the present invention, a third limiting member 54 is provided on the lifting seat 50 along the third direction D3. The third limiting member 54 is provided with a second limiting groove 541. Correspondingly, a second limiting part 34 is provided on the second testing seat 30, and the second limiting part 34 abuts against the second limiting groove 541, thereby providing a third-direction limit for the second limiting part 34 along the third direction D3. A first fastener 55 is provided at the end of the lifting seat 50 away from the third limiting member 54 along the third direction D3. The first fastener 55 is connected to both the lifting seat 50 and the second testing seat 30, thereby further securing the second testing seat 30.
[0052] Reference Figure 4 and Figure 5 As shown, in some embodiments of the motherboard detection device of the present invention, a fourth limiting member 11 and a fifth limiting member 12 are provided on the base 10. The fourth limiting member 11 and the fifth limiting member 12 are arranged sequentially at intervals along the first direction D1. The fourth limiting member 11 is provided with a third limiting groove 111, and the fifth limiting member 12 is provided with a fourth limiting groove 121. It is understood that the length direction of the third limiting groove 111 and the fourth limiting groove 121 is parallel to the third direction D3.
[0053] The second detection seat 30 is provided with a third limiting part 21 and a fourth limiting part 22. Along the third direction D3, the third limiting part 21 is slidably connected to the third limiting groove 111, and the fourth limiting part 22 is slidably connected to the fourth limiting groove 121, which facilitates the quick assembly and disassembly of the first detection seat 20.
[0054] Reference Figure 4 and Figure 5 As shown, in some embodiments of the motherboard testing device of the present invention, multiple fifth limiting members 12 are provided. Along the first direction D1, multiple fifth limiting members 12 are arranged sequentially at intervals, and the fifth limiting members 12 and the base 10 are detachably connected. When the first testing socket 20 is replaced to match different motherboards under test, since the sizes of the first testing socket 20 are different, some fifth limiting members 12 can be removed, thereby allowing the first testing socket 20 of different sizes to be connected to the base 10.
[0055] In some other embodiments, only one fifth limiting member 12 may be provided on the base 10. When replacing the first detection seat 20 of different sizes, the fifth limiting member 12 can be directly disassembled and installed on the corresponding position of the base 10 to save costs.
[0056] Refer to Figure 4 and Figure 5 As shown, in some embodiments of the motherboard detection device of the present invention, a sixth limiting member 13 is provided at one end of the base 10 along the third direction D3. Correspondingly, a fifth limiting part 24 is provided on the first detection seat 20, and the fifth limiting part 24 and the sixth limiting member 13 abut against each other to provide a third-direction limiting for the first detection seat 20 along the third direction D3.
[0057] Furthermore, a second fastener 14 is provided at the end of the lifting seat 50 away from the fifth limiting member 12. The second fastener 14 is connected to the second detection seat 30 and the base 10 respectively, thereby further fixing the second detection seat 30.
[0058] Reference Figure 6 As shown, in some embodiments of the motherboard testing device of the present invention, the transmission component 40 includes a first drive motor 41, a lead screw 42, a first guide post 43, and a first connector 44. The first drive motor 41 is disposed on the side of the lifting seat 50 away from the base 10, and the axial direction of the first drive motor 41 is parallel to the first direction D1. Two lead screws 42 are provided, spaced apart along the third direction D3. Along the second direction D2, the lead screw 42 and the first guide post 43 are spaced apart. The drive end of the first drive motor 41 is connected to the lead screw 42 via a transmission connection. For example, the drive end of the first drive motor 41 and one end of the lead screw 42 can be connected via a synchronous gear transmission, a synchronous chain, or a transmission belt.
[0059] Two first connecting members 44 are provided, arranged sequentially along the third direction D3. Along the second direction D2, one end of each first connecting member 44 is provided with a lead screw nut 441 and a first guide sleeve 442. The lead screw nut 441 is threadedly connected to the lead screw 42, and the first guide sleeve 442 is slidably connected to the first guide post 43. A first drive motor 41 is driven to rotate the lead screw 42, which in turn causes the first connecting member 44 to move along the first direction D1. The first guide post 43 provides guidance for the first connecting member 44 in the first direction D1.
[0060] The transmission assembly 40 also includes a second connector 45, a second drive motor 46, a synchronous pulley 47, and a synchronous belt 48. Along the third direction D3, the two ends of the second connector 45 are respectively connected to two first connectors 44. The first connectors 44 move along the first direction D1 to drive the second connectors 45 to move along the first direction D1, thereby adjusting the distance between the two second connectors 45 to adapt to different specifications of the motherboard under test.
[0061] Along the third direction D3, a synchronous pulley 47 and a second drive motor 46 are sequentially spaced apart. The synchronous pulley 47 is rotatably connected to a second connecting member 45, and the axis of the synchronous pulley 47 is parallel to the first direction D1. The second drive motor 46 is connected to the second connecting member 45, and the axis of the second drive motor 46 is parallel to the first direction D1. A synchronous belt 48 is fitted onto the drive end of the second drive motor 46 and the synchronous pulley 47. Controlling the rotation of the second drive motor 46 drives the synchronous belt 48 to move along the third direction D3, thereby achieving the transportation of the motherboard under test.
[0062] Reference Figure 7 As shown, the motherboard detection device of the present invention, in some embodiments, further includes multiple transmission groups 70. Along the first direction D1, the multiple transmission groups 70 are arranged sequentially at intervals. Each transmission group 70 includes multiple transmission components 71. Along the first direction D1, the multiple transmission components 71 are arranged sequentially at intervals. Further, a guide slope 711 is provided on the transmission component 71. Along the first direction D1, the guide slope 711 and the bottom surface of the lifting seat 50 are at an angle. Correspondingly, the lifting seat 50 is provided with multiple corresponding transmission wheels 56, which abut against the guide slope 711. The transmission wheels 56 slide relative to the guide slope 711, providing movement guidance when the lifting seat 50 moves relative to the base 10.
[0063] Furthermore, a linear electric cylinder 80 is provided on the side of the lifting seat 50 away from the base 10, and the driving direction of the linear electric cylinder 80 is parallel to the first direction D1. A third connecting member 81 is provided at the driving end of the linear electric cylinder 80, and the third connecting member 81 is connected to multiple transmission members 71 respectively. Driving the linear electric cylinder 80 causes the third connecting member 81 to move along the first direction D1, thereby causing the transmission members 71 to move along the first direction D1, thereby realizing the movement of the lifting seat 50 along the second direction D2.
[0064] A slide rail 82 is provided on the lower side of the third connector 81, and the length direction of the slide rail 82 is parallel to the first direction D1. A corresponding slide groove 83 is provided on the third connector 81, and the slide groove 83 is slidably connected to the slide rail 82, thereby providing guidance for the third connector 81 in the first direction D1.
[0065] Multiple second guide posts 17 are provided on the base 10, and the multiple second guide posts 17 are located on the outer periphery of the third connector 81. A second guide sleeve 57 is provided on the lifting seat 50, and the second guide sleeve 57 and the second guide posts 17 are slidably connected to provide guidance for the lifting seat 50 in the second direction D2.
[0066] Reference Figure 2 As shown, in some embodiments of the motherboard testing device of the present invention, the second testing seat 30 is provided with two limiting posts 35. When the motherboard to be tested is placed on the second testing seat 30, the two limiting posts 35 provide sufficient limiting for the motherboard to be tested.
[0067] Reference Figure 1 As shown, in some embodiments of the motherboard testing device of the present invention, a diffuse reflection sensor 16 is provided on the base 10, and the detection end of the diffuse reflection sensor 16 is flush with the synchronous belt 48, so as to detect whether the motherboard to be tested is provided on the synchronous belt 48.
[0068] Reference Figure 5 As shown, in some embodiments of the motherboard testing device of the present invention, a first connector 15 is provided on the base 10, and a second connector 23 is provided on the first testing socket 20. When the first testing socket 20 and the base 10 are connected, the first connector 15 and the second connector 23 are correspondingly arranged, and various wire harnesses used for testing can be uniformly constrained through the first connector 15 and the second connector 23 to prevent wire harnesses from scattering and thus affecting safety.
[0069] Reference Figure 2 and Figure 3 As shown, in some embodiments of the motherboard testing device of the present invention, a position sensor 36 is provided on the second testing seat 30 to detect whether the motherboard to be tested has been transferred to the top of the second testing seat 30.
[0070] On the other hand, embodiments of the present invention also provide a motherboard testing method, applied to the aforementioned motherboard testing device, comprising the following steps:
[0071] Replace the first detection seat 20 on the lifting seat 50 and the second detection seat 30 on the base 10 to adapt to the size of the motherboard to be tested; wherein, the first detection seat 20 is detachably connected to the base 10; the second detection seat 30 is disposed below the first detection seat 20; the second detection seat 30 and the first detection seat 20 are arranged facing each other at a distance; the lifting seat 50 is disposed below the second detection seat 30; the second detection seat 30 and the lifting seat 50 are detachably connected; along the second direction D2, the lifting seat 50 is movable relative to the base 10 to drive the second detection seat 30 to switch between a separation position and a detection position; the second direction D2 is parallel to the vertical direction;
[0072] The spacing between the two transmission components 40 is adjusted to fit the size of the motherboard under test; wherein, the transmission component 40 is disposed on the base 10; there are two transmission components 40, which are arranged alternately along the first direction D1; at least one transmission component 40 is movable along the first direction D1; the transmission component 40 is used to transport the motherboard under test; the first direction D1 is perpendicular to the second direction D2.
[0073] The control and transmission assembly 40 transmits the test motherboard to the top of the second test seat 30; wherein, when the lifting seat 50 is switched to the separation position, the second test seat 30 is separated from the test motherboard on the transmission assembly 40;
[0074] The lifting seat 50 is controlled to move the second detection seat 30 closer to the first detection seat 20; wherein, when the lifting seat 50 is switched to the detection position, the motherboard under test is clamped between the second detection seat 30 and the first detection seat 20 to achieve detection.
[0075] Working principle:
[0076] First, the first testing mount 20 and the second testing mount 30 are replaced according to the different sizes of the motherboards under test. Second, the spacing between the two synchronous belts 48 is adjusted to accommodate motherboards of different sizes. After the synchronous belt 48 transfers the motherboard under test to the second testing mount 30, the second testing mount 30 moves along the second direction D2 with the lifting seat 50 to switch from the separation position to the testing position. During this process, the second testing mount 30 lifts the motherboard under test and, together with the first testing mount 20, clamps the motherboard under test, thereby achieving the testing of the motherboard under test.
[0077] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.
[0078] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be construed as limiting the scope of protection of this application.
[0079] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A motherboard testing device, characterized in that, include: Base; A first detection seat, which is detachably connected to the base; A transmission component is disposed on the base; The transmission component is configured as two, and the two transmission components are arranged alternately along the first direction; at least one of the transmission components is movable along the first direction; the transmission component is used to transmit the motherboard to be tested; The second detection seat is disposed below the first detection seat; the second detection seat and the first detection seat are disposed facing each other at a distance. A lifting seat is disposed below the second detection seat; the second detection seat is detachably connected to the lifting seat; the lifting seat is movable relative to the base along a second direction to drive the second detection seat to switch between a separated position and a detection position; the second direction is parallel to the vertical direction; the first direction is perpendicular to the second direction; When the lifting seat is switched to the separation position, the second detection seat is separated from the motherboard under test on the transmission component; when the lifting seat is switched to the detection position, the motherboard under test is clamped between the second detection seat and the first detection seat to achieve detection.
2. The motherboard testing device according to claim 1, characterized in that: The lifting seat is provided with a first limiting member and a first guide member; along the first direction, the first limiting member and the first guide member are arranged at intervals; the first limiting member is provided with a first limiting groove; The second detection seat is provided with a first limiting part and a first guide groove; along the third direction, the first limiting part is slidably connected to the first limiting groove, and the first guide groove is slidably connected to the first guide member; The third direction is perpendicular to both the second direction and the first direction.
3. The motherboard testing device according to claim 1, characterized in that: The second detection seat is provided with a first limiting hole; The lifting seat is provided with a second limiting hole; the first limiting hole and the second limiting hole are provided correspondingly; The motherboard detection device further includes a second limiting member, a portion of which is disposed within the first limiting hole and the second limiting hole; the second limiting member is movable in a third direction to abut against or move away from the inner wall surface of the first limiting hole.
4. The motherboard testing device according to claim 1, characterized in that: Along a third direction, one end of the lifting seat is provided with a third limiting member, the third limiting member is provided with a second limiting groove, the second detection seat is provided with a second limiting part, and the second limiting part abuts against the second limiting groove; Along a third direction, a first fastener is provided at the end of the lifting seat away from the third limiting member, and the first fastener is connected to the lifting seat and the second detection seat respectively.
5. The motherboard testing device according to claim 1, characterized in that: The base is provided with a fourth limiting member and a fifth limiting member; along the first direction, the fourth limiting member and the fifth limiting member are arranged at intervals; the fourth limiting member is provided with a third limiting groove, and the fifth limiting member is provided with a fourth limiting groove; The first detection seat is provided with a third limiting part and a fourth limiting part; along the third direction, the third limiting part is slidably connected to the third limiting groove, and the fourth limiting part is slidably connected to the fourth limiting groove.
6. The motherboard testing device according to claim 5, characterized in that: The fifth limiting member is provided in multiple ways; along the first direction, the multiple fifth limiting members are arranged sequentially at intervals; the fifth limiting member is detachably connected to the base.
7. The motherboard testing device according to claim 5, characterized in that: Along a third direction, a sixth limiting member is provided at one end of the base, and a fifth limiting part is provided on the first detection seat, the fifth limiting part abutting against the sixth limiting member; Along a third direction, a second fastener is provided at the end of the lifting seat away from the fifth limiting member, and the second fastener is respectively connected to the base and the first detection seat.
8. The motherboard testing device according to claim 1, characterized in that: The transmission assembly includes a first drive motor, a lead screw, a first guide post, and a first connector; The first drive motor is located on the side of the lifting seat away from the base; there are two lead screws, which are arranged alternately along a third direction; along the second direction, the first guide post and the lead screw are arranged alternately; the drive end of the first drive motor is connected to the lead screw. Two first connectors are provided, arranged alternately along the third direction; along the second direction, one end of each first connector is provided with a lead screw nut and a first guide sleeve; the lead screw nut is threadedly connected to the lead screw, and the first guide sleeve is slidably connected to the first guide post. The transmission assembly further includes a second connector, a second drive motor, a synchronous pulley, and a synchronous belt; along a third direction, the two ends of the second connector are respectively connected to two first connectors; along a third direction, the synchronous pulley and the second drive motor are arranged at intervals in sequence; the synchronous pulley and the second connector are rotatably connected; the second drive motor is connected to the second connector; the synchronous belt is sleeved on the drive end of the second drive motor and the synchronous pulley.
9. The motherboard testing device according to claim 1, characterized in that, Also includes: Multiple transmission groups are configured; the multiple transmission groups are arranged sequentially at intervals along a third direction; each transmission group includes multiple transmission components, which are arranged sequentially at intervals along the first direction; each transmission component is provided with a guide slope; an angle is provided between the guide slope and the bottom surface of the lifting seat along the first direction. The lifting seat is provided with a plurality of transmission wheels, which abut against the guide inclined surface.
10. A motherboard testing method, characterized in that, The motherboard testing device as described in any one of claims 1 to 9 includes the following steps: Replace the first detection seat on the lifting platform and the second detection seat on the base to adapt to the size of the motherboard to be tested; wherein, the first detection seat is detachably connected to the base; the second detection seat is disposed below the first detection seat; the second detection seat and the first detection seat are disposed facing each other at a distance; the lifting platform is disposed below the second detection seat; the second detection seat is detachably connected to the lifting platform; along a second direction, the lifting platform is movable relative to the base to drive the second detection seat to switch between a separated position and a detection position; the second direction is parallel to the vertical direction; The spacing between the two transmission components is adjusted to fit the size of the motherboard under test; wherein, the transmission components are disposed on the base; there are two transmission components, which are arranged alternately along a first direction; at least one of the transmission components is movable along the first direction; the transmission components are used to transport the motherboard under test; the first direction is perpendicular to the second direction; The control and transmission assembly transmits the test motherboard to the top of the second test seat; wherein, when the lifting seat is switched to the separation position, the second test seat separates from the test motherboard on the transmission assembly; The lifting seat is controlled to move the second detection seat closer to the first detection seat; wherein, when the lifting seat is switched to the detection position, the motherboard to be tested is clamped between the second detection seat and the first detection seat to achieve detection.