Watch movement surface defect detection method and system based on image recognition
By using image recognition technology to detect the offset area on the surface of the watch movement, the problem of poor consistency in manual visual inspection of watch movements has been solved, enabling high-precision defect detection and repair status monitoring, and improving the stability of quality control.
CN122335718APending Publication Date: 2026-07-03BAO JIE ELECTRONICS (SHENZHEN) LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BAO JIE ELECTRONICS (SHENZHEN) LTD
- Filing Date
- 2026-03-31
- Publication Date
- 2026-07-03
AI Technical Summary
Technical Problem
In existing technologies, defect detection in watch movements relies on manual visual inspection, which leads to poor consistency in evaluation results, makes it difficult to detect microstructural problems, and affects the stability of quality control.
Method used
By employing an image recognition-based method, the offset region on the surface of the computer core is identified through offset recognition model. Combined with multiple image acquisitions and analyses, the repair status is determined, achieving high-precision defect detection.
Benefits of technology
It improves the accuracy and consistency of defect detection, reduces the false positive rate, effectively identifies microstructural problems and monitors the repair process, ensuring the quality of the movement.
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Smart Images
Figure CN122335718A_ABST
Abstract
This invention relates to the field of detection technology and discloses a method and system for detecting surface defects in watch movements based on image recognition. The method includes: dividing the surface structure of the watch movement into connection structures, main structures, and auxiliary structures with different functions and locations, and further subdividing them into off-center regions and symmetrical regions; calculating offset values based on acquired comparison images to filter out offset regions whose offset values exceed an offset reference threshold; performing repeated image acquisition only on offset regions; and conducting comprehensive analysis based on changes in offset direction to obtain detection results; and determining the repair status based on the first offset comparison result and the second offset comparison result. This invention, through preliminary screening and local repeated verification, eliminates false defects caused by instantaneous factors such as equipment vibration or changes in lighting, avoiding misjudging normal structures as defects; and by introducing the judgment of offset direction, it distinguishes between surface damage and assembly misalignment, improving the accuracy of identification.
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