A multi-stage evolution identification and control method for selective area growth of quantum dots
By monitoring characteristic parameters during the growth process to identify the growth stages of quantum dots and implementing responsive process control, the problem of unstable morphology during the selective growth of quantum dots was solved, and the consistency and controllability of the final morphology were achieved.
Patent Information
- Application Number
- CN202610529440.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-21
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies struggle to identify and control the multi-stage evolution of selective growth in quantum dots, resulting in large fluctuations in the final size of quantum dots, premature or delayed entry into lateral epitaxial growth, top depressions, and difficulty in maintaining stable aspect ratio control.
By monitoring characteristic parameters during the growth process, such as the growth front position, local curvature, and contact line state, multiple stages of the quantum dot growth process can be identified and divided. Based on the stage transition criteria, responsive process control can be implemented to adjust parameters such as deposition flux and temperature to achieve precise regulation.
This improved the consistency of the final state morphology of quantum dots, reduced fluctuations in size and aspect ratio, and ensured the controllability and stability of the growth process.
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