A pole piece surface defect visual inspection method and system based on double light source time-sharing frequency flash
By using dual-light source time-division stroboscopic technology to control the alternating illumination of low-angle and high-angle light sources, combined with a single acquisition module and defect detection model, the detection blind zone and illumination interference problems of electrode surface inspection are solved, achieving low-cost, high-efficiency full-coverage inspection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- GUANGDONG AOPUTE TECH CO LTD
- Filing Date
- 2026-06-01
- Publication Date
- 2026-07-17
AI Technical Summary
Existing electrode surface defect detection solutions suffer from blind spots due to single-angle light source detection, light interference caused by simultaneous illumination of multiple light sources, and high cost and complex structure of multi-camera solutions, making it difficult to achieve low-cost, interference-free full-coverage detection.
The dual-light source time-division stroboscopic technology is adopted to control the low-angle and high-angle light sources to light up alternately. Image data is continuously acquired at the same position of the electrode through a single acquisition module, and then split and recombined into low-angle and high-angle image data by row. These data are then input into the defect detection model for detection and fusion.
It achieves dual-angle interference-free imaging, reduces hardware costs and installation complexity, is suitable for rapid deployment on existing production lines, balances detection accuracy and production line cycle time, and achieves full-coverage scanning.
Smart Images
Figure CN122409666A_ABST