Photovoltaic module inspection method and system based on infrared spectral imaging
By using infrared spectral imaging technology to acquire multi-band infrared radiation data of photovoltaic modules, and combining reflectivity and spectral characteristics, the problem of accuracy in identifying defects in photovoltaic modules is solved, enabling non-contact online detection and early warning.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NANJING KANSHIJIE INTELLIGENT TECH CO LTD
- Filing Date
- 2026-04-29
- Publication Date
- 2026-07-17
AI Technical Summary
Existing photovoltaic module testing methods cannot accurately identify defects under different conditions, especially in distinguishing between temperature changes and material emissivity changes, resulting in inaccurate defect identification and classification.
An infrared spectral imaging-based method is used to acquire infrared radiation intensity images of multiple infrared bands using a spectral camera. Radiation calibration is performed using a blackbody radiation furnace, reflectivity is calculated, and a reflectivity distribution map is generated. Spectral features are extracted to identify defects.
It enables accurate identification of surface defects in photovoltaic modules, distinguishes between temperature anomalies and changes in material emissivity, provides non-contact online detection and early warning, and improves the accuracy of defect identification.
Smart Images
Figure CN122415563A_ABST