A new dustproof spring probe structure

CN122592001APending Publication Date: 2026-08-18SUZHOU UIGREEN MICRO & NANO TECH CO LTD
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Patent Information

Application Number
CN202610669964.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2025-11-18
Filing Date
2026-05-15
Publication Date
2026-08-18

AI Technical Summary

Technical Problem

[0004]但上述的弹簧探针存在一定的弊端,针头在伸缩活动中,针头与针管之间存在间隙,如图2所示,被测物品掉落的氧化层和周围环境中的细小异物(如粉尘、水雾等)会通过此间隙进入至弹簧探针内部,使用时间一段时间后,会加快针管内壁的腐蚀以及弹簧接触不良,降低了弹簧探针的使用寿命,尤其在粉尘、潮湿或液体溅射的环境中更容易发生接触不良,导致阻抗升高或短路等问题

Benefits of technology

[0014] The beneficial effects of this invention are: by adding a dustproof ring and a frame, a two-stage sealing protection is formed, which makes the structure highly adaptable to the environment, not only enhancing its corrosion resistance, but also giving it stable electrical performance; when this structure is used in a humid environment with foreign dust, it can effectively prevent or reduce the entry of small foreign objects into the probe, extend the service life of the probe, and further ensure the good electrical performance of the probe.

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Abstract

The application discloses a novel dustproof spring probe structure, which comprises a needle head, a spring and a needle tube, the spring is arranged in the needle tube, the needle head comprises a needle shaft part arranged in the needle tube and in contact with one end of the spring and a needle head part arranged outside the needle tube, the needle head part is in contact with a measured object, the needle shaft part compresses the spring and moves the needle head to the inside of the needle tube, the outer surface of the needle tube is provided with an annular boss, the outer surface of the needle head part is provided with an annular dustproof ring, the outer side of the needle head part is provided with a frame, one end of the frame is fixed with the annular boss, the other end is provided with a through hole matched with the needle head part, the needle head part passes through the through hole of the frame, and the dustproof ring is located in the frame. The application can effectively prevent or reduce small foreign matters from entering the inside of the probe, prolong the service life of the probe and further ensure that the probe has good electrical performance.
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Description

Technical Field

[0001] This invention relates to the technical field of spring probes, and more specifically to a novel dustproof spring probe structure. Background Technology

[0002] Connector spring probes are elastic contact elements commonly used in electronic testing, signal transmission, or power connection, and are widely used in semiconductor testing, PCB testing, battery connection, communication equipment, and other fields.

[0003] A typical spring probe consists of a needle tip, a spring, and a syringe tube, such as... Figure 1 As shown, the needle tip contacts the tip of the object being tested. A metal plating is usually added to its surface to ensure good conductivity and wear resistance. A spring provides appropriate elastic pressure to ensure contact stability. The needle tube is usually a metal shell to provide structural support.

[0004] However, the aforementioned spring probe has certain drawbacks. During the extension and retraction of the needle, a gap exists between the needle tip and the syringe tube, such as... Figure 2 As shown, the oxide layer of the tested item and small foreign objects in the surrounding environment (such as dust, water mist, etc.) can enter the spring probe through this gap. After a period of use, this will accelerate the corrosion of the inner wall of the needle tube and cause poor contact of the spring, reducing the service life of the spring probe. Poor contact is more likely to occur in dusty, humid or liquid splashed environments, leading to problems such as increased impedance or short circuit. Summary of the Invention

[0005] To overcome the aforementioned problems, the present invention aims to provide a novel dustproof spring probe structure that can effectively prevent or reduce the entry of small foreign objects into the probe, extend the probe's service life, and further ensure the probe's good electrical performance.

[0006] To achieve the above objectives, the technical solution adopted by the present invention is: a novel dustproof spring probe structure, comprising a needle head, a spring, and a needle tube. The spring is disposed inside the needle tube. The needle head includes a needle shaft portion disposed inside the needle tube and in contact with one end of the spring, and a needle head portion disposed outside the needle tube. After the needle head contacts the object being measured, the needle shaft portion compresses the spring and causes the needle head to move into the needle tube. An annular protrusion is provided on the outer surface of the needle tube. An annular dustproof ring is provided on the outer surface of the needle head. A frame is provided on the outer side of the needle head. One end of the frame is fixed to the annular protrusion, and the other end is provided with a through hole that mates with the needle head. The needle head passes through the through hole of the frame, and the dustproof ring is located inside the frame.

[0007] Preferably, the dustproof ring is located near the end of the needle shaft, and one end of the dustproof ring is in contact with the rolled edge of the needle tube.

[0008] Preferably, the inner side of the through hole end of the frame is in contact with the other end of the dustproof ring.

[0009] Preferably, the inner side of the through hole end of the frame has a gap with the other end of the dustproof ring.

[0010] Preferably, the dustproof ring and the needle head are configured for a transition fit.

[0011] Preferably, the through hole and the needle head are configured for a transition fit.

[0012] Preferably, the dustproof ring is made of silicone material.

[0013] Preferably, the frame is made of stainless steel.

[0014] The beneficial effects of this invention are: by adding a dustproof ring and a frame, a two-stage sealing protection is formed, which makes the structure highly adaptable to the environment, not only enhancing its corrosion resistance, but also giving it stable electrical performance; when this structure is used in a humid environment with foreign dust, it can effectively prevent or reduce the entry of small foreign objects into the probe, extend the service life of the probe, and further ensure the good electrical performance of the probe. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure in the background art;

[0016] Figure 2 This is a schematic diagram in the background art;

[0017] Figure 3 This is a schematic diagram of the structure of this embodiment;

[0018] Figure 4 This is a schematic diagram of the needle structure in this embodiment;

[0019] Figure 5 This is a schematic diagram of the structure for installing the dustproof ring in this embodiment;

[0020] Figure 6 This is a schematic diagram of the mounting frame in this embodiment.

[0021] In the diagram: 1. Needle tip; 2. Spring; 3. Needle tube; 4. Needle shaft; 5. Needle head; 6. Annular boss; 7. Dustproof ring; 8. Frame; 9. Through hole; 10. Rolled edge; 11. Boss. Detailed Implementation

[0022] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby providing a clearer and more explicit definition of the scope of protection of the present invention.

[0023] See Figures 3-6 As shown, this embodiment discloses a novel dustproof spring probe structure, including a needle 1, a spring 2, and a needle tube 3. The spring 2 is disposed inside the needle tube 3. The needle 1 includes a needle shaft portion 4 disposed inside the needle tube 3 and in contact with one end of the spring 2, and a needle head portion 5 disposed outside the needle tube 3. The needle shaft portion 4 and the needle head portion 5 are integrally formed. A boss 11 is provided at the connection between the needle shaft portion 4 and the needle head portion 5. After the needle head portion 5 contacts the object being measured, the needle shaft portion 4 compresses the spring 2 and causes the needle 1 to move into the needle tube 3. An annular boss 6 is provided on the outer surface of the needle tube 3. An annular dustproof ring 7 is provided on the outer surface of the needle head portion 5. A frame 8 is provided on the outer side of the needle head portion 5. One end of the frame 8 is fixed to the annular boss 6, and the other end is provided with a through hole 9 that cooperates with the needle head portion 5. The needle head portion 5 passes through the through hole 9 of the frame 8, and the dustproof ring 7 is located inside the frame 8.

[0024] During assembly, first assemble according to the conventional spring probe assembly method. First, fix the needle tube 3 vertically with the opening that needs to be rolled facing upwards. Place the spring 2 into the needle tube 3, and insert the needle shaft 4 into the needle tube 3 and make it contact with the spring 2. Roll the movable end of the needle tube 3. Then, put the dustproof ring 7 on the outer surface of the needle head 5 to form the first level of dustproof sealing protection. Next, assemble one end of the frame body 8 (with the through hole 9) starting from the needle head 5, so that it cooperates with the annular boss 6 on the needle tube 3 and ensures that the needle head 5 will not loosen during the reciprocating extension and retraction process. The cooperation between the frame body 8 and the needle head 5 forms the second level of dustproof sealing protection.

[0025] In one embodiment, the dustproof ring 7 is disposed near the end of the needle shaft portion 4, and one end of the dustproof ring 7 is in contact with the rolled edge 10 of the needle tube 3, so that the dustproof ring 7 can provide dust protection at the rolled edge 10.

[0026] In one embodiment, the inner side of the through hole 9 end of the frame 8 contacts the other end of the dustproof ring 7, so that the dustproof ring 7 can play a dustproof role at the through hole 9 end.

[0027] In one embodiment, the inner side of the through hole 9 end of the frame 8 has a gap with the other end of the dustproof ring 7 for better fit.

[0028] In one embodiment, the dustproof ring 7 and the needle head 5 are configured for a transition fit, and the through hole 9 and the needle head 5 are configured for a transition fit.

[0029] In one embodiment, the dustproof ring 7 is made of silicone, and the frame 8 is made of stainless steel.

[0030] The above embodiments are only for illustrating the technical concept and features of the present invention. Their purpose is to enable those skilled in the art to understand the content of the present invention and implement it. They should not be used to limit the scope of protection of the present invention. All equivalent changes or modifications made in accordance with the spirit and essence of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A novel dustproof spring probe structure, comprising a needle tip, a spring, and a needle tube, wherein the spring is disposed within the needle tube, the needle tip comprises a needle shaft portion disposed within the needle tube and contacting one end of the spring, and a needle head portion disposed outside the needle tube, wherein after the needle head portion contacts the object being measured, the needle shaft portion compresses the spring and causes the needle head portion to move into the needle tube, and the outer surface of the needle tube is provided with an annular protrusion, characterized in that, The outer surface of the needle head is provided with an annular dustproof ring, and a frame is provided on the outer side of the needle head. One end of the frame is fixed to the annular protrusion, and the other end is provided with a through hole that mates with the needle head. The needle head passes through the through hole of the frame, and the dustproof ring is located inside the frame.

2. The novel dustproof spring probe structure according to claim 1, characterized in that, The dustproof ring is located near the end of the needle shaft, and one end of the dustproof ring is in contact with the rolled edge of the needle tube.

3. The novel dustproof spring probe structure according to claim 2, characterized in that, The inner side of the through hole end of the frame contacts the other end of the dustproof ring.

4. The novel dustproof spring probe structure according to claim 2, characterized in that, The inner side of the through hole end of the frame has a gap with the other end of the dustproof ring.

5. The novel dustproof spring probe structure according to claim 1, characterized in that, The dustproof ring and the needle head are configured for a transition fit.

6. A novel dustproof spring probe structure according to claim 1, characterized in that, The through hole and the needle head are configured for a transition fit.

7. A novel dustproof spring probe structure according to claim 1, characterized in that, The dustproof ring is made of silicone.

8. A novel dustproof spring probe structure according to claim 1, characterized in that, The frame is made of stainless steel.