A method and system for testing clock and power signals

Abstract

The application belongs to the field of electronic equipment automatic testing, and discloses a clock signal and power signal testing method and system. The application automatically determines a testing task according to a product model and a testing type of a device under test, and calls a corresponding testing task template, so that testing items, testing parameters and execution processes of the clock signal and the power signal can be uniformly configured according to preset rules, operation errors caused by manual item-by-item setting are reduced, and consistency of testing processes of different batches and different devices is improved. By obtaining design files and product model information of the device under test, automatically matching electrical testing standard parameters and simulation parameters, and establishing a correlation between electrical testing parameter overrun conditions and simulation trigger conditions, a real testing process and a simulation process are linked.

Description

Technical Field

[0001] This invention belongs to the field of automated testing of electronic equipment, and specifically relates to a testing method and system for clock signals and power signals. Background Technology

[0002] With the increasing integration and operating speed of electronic devices, the stability of clock and power signals has a significant impact on the normal operation of these devices. Parameters such as voltage amplitude, rise time, fall time, jitter, and noise of the clock signal directly affect the timing accuracy of signal transmission, while parameters such as voltage value, ripple, noise, and voltage drop of the power signal affect the power supply stability of electronic components. Therefore, during the research, development, debugging, and mass production testing of electronic devices, it is necessary to test the relevant electrical parameters of clock and power signals, and to analyze and optimize the product's hardware and software design based on the test results.

[0003] Current clock and power signal testing typically relies on instruments such as oscilloscopes and vector network analyzers. Testers need to manually set parameters such as sampling rate, trigger conditions, measurement range, and test thresholds according to different devices under test and test items. After signal acquisition, the test data is manually exported and compared with relevant test standards. This testing method involves many steps and is highly dependent on the experience of the testers. Differences in test parameters and data processing methods set by different testers can easily affect the consistency of test results. Furthermore, manual testing is difficult to perform continuously on multiple test items and monitor multiple parameters over long periods, resulting in low testing efficiency.

[0004] To analyze the causes of clock and power signal anomalies, existing technologies can use simulation software to perform electrical simulations of the product's circuit structure, component parameters, printed circuit board stack-up structure, and material parameters. However, the current electrical parameter measurement and simulation processes are usually conducted independently. Anomaly data generated by the measurement system cannot directly trigger corresponding simulation tasks, and the simulation results generated by the simulation system cannot be automatically correlated with the measured data. Testers need to reselect the simulation model, set simulation parameters, and manually compare the measured and simulated waveforms based on the measurement results, making the simulation analysis process cumbersome and hindering the establishment of an effective correspondence between test and simulation data.

[0005] When electrical parameters of clock or power signals are found to exceed standard ranges during testing, current technology typically relies on testers directly adjusting the product's software parameters or hardware structure based on experience, followed by retesting and verification. This approach requires multiple trials and repeated modifications, making it difficult to quickly determine the correlation between abnormal parameters and the product's software and hardware parameters. This not only prolongs the product debugging cycle but also increases testing and optimization costs. Summary of the Invention

[0006] The purpose of this invention is to overcome the problems of existing clock and power signal testing, such as parameter configuration relying on manual intervention, separation between actual measurement and simulation, and difficulty in quickly locating and optimizing abnormal problems, and to provide a testing method and system for clock and power signals.

[0007] To achieve the above objectives, the present invention adopts the following technical solution: In a first aspect, the present invention provides a method for testing clock signals and power signals, comprising the following steps: The test task is determined based on the product model and test type of the device under test, and the test task template corresponding to the test type is called. Obtain the design documents and product model information of the device under test, match the electrical test standard parameters and simulation parameters corresponding to the clock signal and power signal according to the product model information, and establish the correlation between the electrical test parameter over-limit conditions and the simulation trigger conditions; Configure the test instrument according to the electrical test parameters, collect the clock signal and power signal of the device under test, and obtain the measured signal parameters. The measured signal parameters are compared with the corresponding electrical test parameters. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, the abnormal measured signal parameters are marked, and the simulation task corresponding to the abnormal measured signal parameters is triggered according to the correlation. The simulation task is simulated based on the simulation parameters to obtain simulation results corresponding to the abnormal measured signal parameters. The abnormal measured signal parameters, measured waveforms and simulation results are correlated and analyzed. Based on the correlation analysis results, simulation optimization suggestions are determined and corresponding reports are output.

[0008] A further improvement of this invention lies in the following method for determining the test task based on the product model and test type of the device under test, and for calling the test task template corresponding to the test type: Determine the clock signal test items and power signal test items corresponding to the device under test based on the product model of the device under test; The test task template corresponding to the test type is called from the pre-established test task template library. The test task template has a pre-set correspondence between electrical test items and simulation test items. The corresponding parameter configuration task and test task are launched based on the invoked test task template.

[0009] A further improvement of the present invention is that the design documents of the device under test include printed circuit board files, schematic files, component library files, and process files; Electrical test parameters include at least one of the following: voltage amplitude, rise time, fall time, eye diagram template, jitter, level, and noise threshold. Simulation parameters include at least one of the following: transmitting device model, receiving device model, board material parameters, and printed circuit board stack-up information.

[0010] A further improvement of this invention lies in the following specific method for establishing the correlation between electrical test parameter over-limit conditions and simulation triggering conditions: Determine the simulation test items corresponding to each electrical test item based on the test task template; Set corresponding electrical test parameter limits for each electrical test item; The measured signal parameters of the electrical test items exceeding the limits of the corresponding electrical test parameters are used as simulation trigger conditions, and the simulation trigger conditions are associated with the corresponding simulation test items.

[0011] A further improvement of this invention lies in the following method for configuring the test instrument according to the electrical test parameters, acquiring the clock signal and power signal of the device under test, and obtaining the measured signal parameters: Connect the oscilloscope and vector network analyzer to the physical layer interface of the device under test; Configure the sampling rate, trigger conditions, and measurement range of the oscilloscope and vector network analyzer according to the test task template; The clock and power signals of the device under test are acquired by the configured oscilloscope and vector network analyzer, and the measured signal parameters and measured waveforms corresponding to the clock and power signals are extracted.

[0012] A further improvement of this invention lies in the following method for triggering simulation tasks corresponding to abnormal measured signal parameters based on correlation relationships: Determine the electrical test items and the time periods when abnormal measured signal parameters occur; Based on the correspondence between electrical test items and simulation test items, determine the target simulation test items corresponding to the abnormal measured signal parameters; The abnormal measured signal parameters, test data during the abnormal occurrence period, and measured waveforms are associated and stored, and then sent to the simulation task corresponding to the target simulation test item.

[0013] A further improvement of this invention lies in the following method for obtaining simulation results corresponding to abnormal measured signal parameters by simulating the simulation task based on simulation parameters: Read the abnormal measured signal parameters and the corresponding simulation parameters; Determine the product software and hardware parameters that need to be adjusted based on the abnormal measured signal parameters; Adjust the product's software and hardware parameters, and then execute simulation tasks based on the adjusted parameters; The simulation results generated by the simulation task are analyzed to obtain the parameter adjustment results corresponding to the abnormal measured signal parameters.

[0014] A further improvement of this invention lies in the following specific method for correlating and analyzing abnormal measured signal parameters, measured waveforms, and simulation results: Based on the pre-established correspondence between electrical test items and simulation test items, determine the simulation results and simulation waveforms corresponding to the abnormal measured signal parameters; The abnormal measured signal parameters and measured waveforms are compared with the corresponding simulation results and simulation waveforms to determine the correlation between the abnormal measured signal parameters and the product software and hardware parameters; Based on the aforementioned correlation, suggestions for modifying product software parameters and hardware parameters are determined, and these suggestions are used as simulation optimization suggestions.

[0015] A further improvement of this invention is that the corresponding report includes an electrical test report and a simulation optimization suggestion report; The electrical test report includes the measured signal parameters, measured waveforms and test conclusions for each electrical test item, with the test conclusions including whether the test is qualified or unqualified. The simulation optimization suggestion report includes abnormal measured signal parameters, the corresponding measured waveforms of the abnormal measured signal parameters, simulation results, simulation waveforms, problem location conclusions, and simulation optimization suggestions.

[0016] Secondly, the present invention provides a testing system for clock signals and power signals, comprising: The test initiation module is used to determine the test task based on the product model and test type of the device under test, and to call the test task template corresponding to the test type. The parameter configuration module is used to obtain the design documents and product model information of the device under test, match the electrical test standard parameters and simulation parameters corresponding to the clock signal and power signal according to the product model information, and establish the correlation between the electrical test parameter over-limit conditions and the simulation trigger conditions. The test module is used to configure the test instruments according to the electrical test parameters, collect the clock signal and power signal of the device under test, and obtain the measured signal parameters. The simulation module is used to compare the measured signal parameters with the corresponding electrical test parameters. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, the abnormal measured signal parameters are marked, and the simulation task corresponding to the abnormal measured signal parameters is triggered according to the correlation. The data fusion and analysis module is used to simulate the simulation task based on the simulation parameters and obtain simulation results corresponding to the abnormal measured signal parameters. The results output module is used to perform correlation analysis on abnormal measured signal parameters, measured waveforms and simulation results, determine simulation optimization suggestions based on the correlation analysis results, and output corresponding reports.

[0017] Compared with the prior art, the present invention has the following beneficial effects: This invention automatically determines test tasks based on the product model and test type of the device under test (DUT) and calls the corresponding test task template. This allows for the unified configuration of test items, test parameters, and execution processes for clock and power signals according to preset rules, reducing operational errors caused by manual item-by-item settings and improving the consistency of testing processes across different batches and devices. By acquiring the DUT's design documents and product model information, it automatically matches electrical test standard parameters and simulation parameters, establishing a correlation between electrical test parameter exceedance conditions and simulation trigger conditions, thus linking the actual test process with the simulation process. When measured signal parameters exceed the corresponding limits, abnormal parameters are promptly marked and the corresponding simulation task is automatically triggered, eliminating the need for test personnel to reselect simulation items and repeatedly configure parameters, thereby shortening anomaly analysis time. By correlating and analyzing abnormal measured signal parameters, measured waveforms, and simulation results, the relationship between measured anomalies and related software and hardware parameters can be intuitively determined, and simulation optimization suggestions can be generated accordingly, avoiding repeated modifications and tests based solely on manual experience. Finally, it automatically outputs electrical test reports and simulation optimization suggestion reports, realizing unified recording of test data, simulation results and problem location conclusions, improving the testing efficiency of clock signals and power signals, the accuracy of anomaly location, and the efficiency of product debugging and optimization, while reducing testing and rectification costs. Attached Figure Description

[0018] Figure 1 This is a system diagram of the present invention; Figure 2 This is a flowchart of the present invention. Detailed Implementation

[0019] To further understand the content of this invention, the invention will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the embodiments are merely illustrative and not limiting of the invention.

[0020] Example 1: See Figure 1The clock signal and power signal testing system of the present invention includes a test initiation module, a parameter configuration module, a test module, a simulation module, a data fusion analysis module, and a result output module. The modules communicate with each other via Ethernet or USB bus to transmit test data, simulation data, and control commands. The test initiation module initiates test tasks and monitors the operating status of each module; the parameter configuration module configures electrical test parameters and simulation parameters; the test module acquires the clock signal and power signal of the device under test; the simulation module triggers simulation tasks corresponding to abnormal measured signal parameters; the data fusion analysis module obtains simulation results corresponding to abnormal measured signal parameters; and the result output module performs correlation analysis on abnormal measured signal parameters, measured waveforms, and simulation results, and outputs corresponding reports.

[0021] Example 2: See Figure 2 The testing method for clock signals and power signals of the present invention specifically includes the following steps: Step S1: Determine the test task based on the product model and test type of the device under test, and call the test task template corresponding to the test type.

[0022] The test initiation module has a pre-built test task template library, which stores test task templates corresponding to different product models and test types. The test task templates include clock signal test templates and power signal test templates, and can also pre-store other physical layer signal test templates such as Ethernet signal test templates.

[0023] Different test task templates pre-set the correspondence between electrical test items and simulation test items. For example, the power signal test template can set electrical test items such as power DC test, power noise test, and power spectrum test, and associate them with simulation test items such as power DC voltage drop simulation and power distribution network simulation. The clock signal test template can set electrical test items such as clock voltage amplitude test, clock rise time test, clock fall time test, clock jitter test, and noise test, and associate them with corresponding clock signal integrity simulation test items.

[0024] The user first enters or selects the product model of the device under test (DUT) in the test startup module, and then selects clock signal test, power signal test, or both, depending on the actual testing needs. The test startup module determines the corresponding clock signal test item and power signal test item based on the DUT's product model, calls the corresponding test task template from the test task template library, and configures the task and test task according to the startup parameters of the called test task template.

[0025] The test initiation module, as the task control part of the test system, is also used to monitor the running status of the parameter configuration module, test module, simulation module, data fusion analysis module, and result output module. After the user selects the product model and test type, they can trigger the subsequent test process by starting the module, without having to manually create each test task individually.

[0026] Step S2: Obtain the design documents and product model information of the device under test. Match the electrical test standard parameters and simulation parameters corresponding to the clock signal and power signal according to the product model information, and establish the correlation between the electrical test parameter over-limit conditions and the simulation trigger conditions.

[0027] Users import the design files of the device under test (DUT) through the test initiation module. The DUT's design files include printed circuit board files, schematic files, component library files, and process files. The parameter configuration module reads the DUT's design files and product model information, and matches the corresponding electrical test standard parameters and simulation parameters to the DUT using pre-stored component test standard library information and protocol information.

[0028] Electrical test parameters include at least one of the following: voltage amplitude, rise time, fall time, eye diagram template, jitter, level, and noise threshold. For power signals, electrical test parameters may also include the power supply DC voltage range, power supply noise range, and power supply spectrum parameters. For clock signals, electrical test parameters may include the clock signal's voltage amplitude, rise time, fall time, jitter value, level, and noise threshold.

[0029] Simulation parameters include at least one of the following: transmitting device model, receiving device model, board parameters, and printed circuit board stack-up information. The parameter configuration module can automatically select the corresponding transmitting device model, receiving device model, component parameters, board parameters, number of printed circuit board layers, and stack-up relationships between layers based on the product model of the device under test.

[0030] The parameter configuration module includes a basic parameter unit and an association mapping unit. The basic parameter unit reads the product model information of the device under test and matches the corresponding electrical test parameters and simulation parameters from the component test standard library. The association mapping unit determines the simulation test items corresponding to each electrical test item according to the test task template, sets the limit range of the electrical test parameters corresponding to each electrical test item, and uses the exceeding of the limit range of the corresponding electrical test parameters as the simulation trigger condition.

[0031] The association mapping unit associates simulation triggering conditions with corresponding simulation test items, thereby establishing a correlation between electrical test parameter over-limit conditions and simulation triggering conditions. When a measured signal parameter exceeds the limit range of the corresponding electrical test parameter during subsequent testing, the system can automatically determine the simulation test item to be activated based on this correlation.

[0032] For example, when the device under test is an FT2000-4 processor module, the parameter configuration module matches the DC voltage test range of the FT2000-4 nuclear power supply to 0.8V to 0.88V, the power supply noise test range to 0.8V ± 5%, and the corresponding power supply DC voltage drop simulation parameter to 2%, based on its product model information. The parameter configuration module then sends the above electrical test parameters and simulation parameters to the test module and simulation module, respectively.

[0033] Step S3: Configure the test instrument according to the electrical test parameters, collect the clock signal and power signal of the device under test, and obtain the measured signal parameters.

[0034] The test instruments include an oscilloscope and a vector network analyzer. During testing, the oscilloscope and vector network analyzer are connected to the physical layer interface of the device under test (DUT), and the test instruments are connected to the host computer for communication. A high-bandwidth oscilloscope with a bandwidth of at least 20 GHz can be used to meet the requirements for acquiring high-speed clock signals and power supply noise signals.

[0035] The testing module includes a signal acquisition unit, a parameter standard comparison unit, and an abnormal test result marking unit. The signal acquisition unit receives electrical test parameters and test task templates from the parameter configuration module, and automatically configures the sampling rate, trigger conditions, and measurement range of the oscilloscope and vector network analyzer according to the test task templates.

[0036] The oscilloscope's sampling rate, trigger conditions, and measurement range can be configured according to different test tasks. For example, when testing the power signals of a processor module, the oscilloscope's sampling rate can be set to 10GSa / s, and the measurement range and trigger conditions can be set according to the rated voltage range of the corresponding power signal.

[0037] After the test instrument configuration is completed, the signal acquisition unit acquires the clock signal and power signal of the device under test through an oscilloscope and a vector network analyzer, and extracts the corresponding measured signal parameters and measured waveforms from the acquired signals.

[0038] For clock signals, measured signal parameters may include voltage amplitude, rise time, fall time, jitter, level, and noise; for power signals, measured signal parameters may include DC voltage, noise, and spectral parameters. The test module executes each test item sequentially according to the test task template, thereby achieving automatic continuous testing of multiple test items.

[0039] Step S4: Compare the measured signal parameters with the corresponding electrical test parameters. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, mark the abnormal measured signal parameters and trigger the simulation task corresponding to the abnormal measured signal parameters according to the correlation.

[0040] The parameter standard comparison unit receives the measured signal parameters obtained by the signal acquisition unit and compares each measured signal parameter with the corresponding electrical test parameters issued by the parameter configuration module in real time.

[0041] When the measured signal parameter is within the limit range of the corresponding electrical test parameter, the test result of the electrical test item is determined to be qualified; when the measured signal parameter exceeds the limit range of the corresponding electrical test parameter, the test result of the electrical test item is determined to be unqualified, and the abnormal measured signal parameter is marked by the abnormal test result marking unit.

[0042] The abnormal test result marking unit records the product model, electrical test item, measured value, standard limit range, and abnormal occurrence time corresponding to the abnormal measured signal parameters, and sends the abnormal marking information to the data fusion analysis module and simulation module.

[0043] For example, when performing DC voltage testing on the FT2000-4 nuclear power supply, the corresponding electrical test parameters are limited to a range of 0.8V to 0.88V. When the measured voltage value obtained by the test module is 0.89V, since the measured voltage value is higher than 0.88V, the abnormal test result marking unit marks the test result as abnormal and generates abnormal marking information including "Abnormal parameter type: FT2000-4 nuclear power supply, measured value: 0.89V".

[0044] After marking the abnormal measured signal parameters, first determine the electrical test items and the time period of the abnormality corresponding to the abnormal measured signal parameters. Then, based on the correspondence between the electrical test items and the simulation test items pre-established in the test task template, determine the target simulation test items corresponding to the abnormal measured signal parameters.

[0045] The data fusion and analysis module correlates and stores abnormal measured signal parameters, test data during the abnormal occurrence period, and measured waveforms. It then packages the correlated and stored abnormal data and measured waveforms together and sends them to the simulation task corresponding to the target simulation test item. In this way, abnormal data discovered during testing can automatically trigger the corresponding simulation task, eliminating the need for testers to reselect the simulation item.

[0046] Step S5: Simulate the simulation task according to the simulation parameters to obtain the simulation results corresponding to the abnormal measured signal parameters.

[0047] The simulation module includes a product usage scenario simulation unit and a parameter optimization unit. The product usage scenario simulation unit is equipped with electrical automation simulation tools to simulate the electrical parameters of the clock and power signals of the device under test, and save the corresponding simulation results and waveforms.

[0048] After receiving the simulation task corresponding to the target simulation test item, the simulation module reads the abnormal measured signal parameters, measured waveforms, the design file of the device under test and the corresponding simulation parameters, and starts the corresponding simulation test item according to the association established by the parameter configuration module.

[0049] During simulation, the product's software and hardware parameters that need adjustment are determined based on the abnormal measured signal parameters. Product software parameters can be configuration parameters that affect the output state of clock or power signals, while product hardware parameters can be circuit parameters such as resistor parameters that affect clock or power signals.

[0050] The parameter optimization unit adjusts the product's software and hardware parameters and executes simulation tasks based on the adjusted parameters. The simulation module iterates through different software and hardware parameter adjustment results, saves the simulation results and waveforms corresponding to each set of parameters, and analyzes the simulation results generated by the simulation task to obtain the parameter adjustment results corresponding to the abnormal measured signal parameters.

[0051] For example, in response to the abnormal situation where the measured voltage of the FT2000-4 nuclear power supply is 0.89V, the simulation module reads the abnormal measured signal parameters and the corresponding power supply simulation parameters. By adjusting the relevant hardware parameters of the power supply output and performing multiple simulations, it determines that the feedback resistor value can be adjusted to 183 kΩ and generates a hardware parameter modification suggestion to change the feedback resistor value to 183 kΩ.

[0052] The simulation module sends the simulation results, simulation waveforms, parameter adjustment results, and modification suggestions for product software and hardware parameters obtained during the simulation process to the data fusion and analysis module.

[0053] Step S6: Perform correlation analysis on the abnormal measured signal parameters, measured waveforms and simulation results, determine simulation optimization suggestions based on the correlation analysis results, and output the corresponding report.

[0054] The data fusion and analysis module includes a test problem identification unit, a simulation correlation analysis unit, and a simulation optimization test result unit.

[0055] The test problem identification unit determines the electrical test item that has an abnormality based on the abnormal test results marked by the test module, and completely saves and packages the abnormal measured signal parameters, test data and measured waveforms of the same test item or the same abnormal occurrence period.

[0056] The simulation correlation analysis unit determines the simulation results and simulation waveforms corresponding to abnormal measured signal parameters based on the pre-established correspondence between electrical test items and simulation test items, and compares the abnormal measured signal parameters and measured waveforms with the corresponding simulation results and simulation waveforms.

[0057] By performing correlation analysis on measured signal parameters, measured waveforms, simulation results, and simulation waveforms, the correlation between abnormal measured signal parameters and product software and hardware parameters is determined, thereby identifying the product software or hardware parameters that cause abnormal clock or power signals.

[0058] The simulation optimization test results unit drives the simulation module to perform simulation optimization based on the correlation analysis results. It receives the parameter adjustment results output by the simulation module and determines the modification suggestions for product software parameters and hardware parameters based on the correlation between abnormal measured signal parameters and product software and hardware parameters. The product software parameter modification suggestions and hardware parameter modification suggestions together constitute the simulation optimization suggestions.

[0059] The results output module generates an electrical test report and a simulation optimization suggestion report based on the measured signal parameters, measured waveforms, test conclusions, simulation results, simulation waveforms, problem location conclusions, and simulation optimization suggestions.

[0060] The electrical test report presents all test images, measured signal parameters, and test conclusions for each electrical test item in document format. Test conclusions include pass and fail. The electrical test report may also simultaneously present the standard limits for each electrical test item, allowing testers to determine whether the device under test passes the test and the deviation between the measured signal parameters and the standard limits.

[0061] The simulation optimization suggestion report presents abnormal measured signal parameters, corresponding measured waveforms, simulation results, simulation waveforms, problem location conclusions, and simulation optimization suggestions in a combination of simulation results and textual descriptions. By linking the measured waveforms of abnormal electrical test items with their corresponding simulation waveforms, testers can directly view the correspondence between measured and simulation data.

[0062] Taking the power supply test of the FT2000-4 processor module as an example, the user selects power supply test in the test startup module, imports the printed circuit board file, schematic file, component library file and process file of the device under test, and clicks start test.

[0063] The parameter configuration module matches the power supply DC test standard and power supply noise test standard corresponding to the power supply test task, automatically configures the DC voltage limit range of the FT2000-4 nuclear power supply to 0.8V to 0.88V, the power supply noise limit range to 0.8V±5%, and configures the power supply DC voltage drop simulation parameter to 2%.

[0064] The test module controls the oscilloscope to connect to the host computer communication interface and acquires the FT2000-4 nuclear power supply signal at a sampling rate of 10GSa / s. When the obtained measured voltage value is 0.89V, the test module compares the measured voltage value with the electrical test parameter limit range of 0.8V to 0.88V and marks the DC test item of the power supply as unqualified.

[0065] The data fusion and analysis module completely saves and packages the measured voltage value of 0.89V of the FT2000-4 nuclear power supply, the test data and measured waveforms during the abnormal period, and triggers the power supply DC voltage drop simulation task based on the correspondence between the power supply DC test items and the power supply DC voltage drop simulation test items.

[0066] The simulation module performs simulations based on the design documents of the device under test and the corresponding simulation parameters. By adjusting the hardware parameters at the power output terminal, different simulation results are obtained, and a hardware parameter modification suggestion to change the feedback resistor value to 183 kΩ is determined.

[0067] The data fusion analysis module correlates the measured voltage value of 0.89V and the corresponding measured waveform with the simulation results and simulation waveform to determine the correlation between the abnormal voltage value and the feedback resistor parameter at the power supply output terminal, and changes the feedback resistor value to 183 kΩ as a simulation optimization suggestion.

[0068] The output module generates a "Processor Module Electrical Test Report," which records the measured value of the FT2000-4 nuclear power supply as 0.89V and marks the test conclusion as unqualified. At the same time, it generates a corresponding simulation optimization suggestion report, which presents the measured waveform, simulation waveform, problem location conclusion, and hardware parameter modification suggestion to change the feedback resistance value of the FT2000-4 nuclear power supply output terminal to 183 kΩ.

[0069] The results output module can also push the generated electrical test reports and simulation optimization suggestion reports to the test management platform to enable unified management and traceability of test data, simulation results, and product modification processes.

[0070] The above testing process combines the actual measurement of electrical parameters for clock and power signals with the simulation process. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, the system can automatically trigger the corresponding simulation task based on the pre-established correlation. Through correlation analysis between the measured waveform and the simulated waveform, the system determines modification suggestions for the product's software and hardware parameters, thus completing a continuous testing process from test task initiation, automatic parameter configuration, signal acquisition, anomaly identification, simulation optimization to report output.

[0071] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for testing clock signals and power signals, characterized in that, Includes the following steps: The test task is determined based on the product model and test type of the device under test, and the test task template corresponding to the test type is called. Obtain the design documents and product model information of the device under test, match the electrical test standard parameters and simulation parameters corresponding to the clock signal and power signal according to the product model information, and establish the correlation between the electrical test parameter over-limit conditions and the simulation trigger conditions; Configure the test instrument according to the electrical test parameters, collect the clock signal and power signal of the device under test, and obtain the measured signal parameters. The measured signal parameters are compared with the corresponding electrical test parameters. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, the abnormal measured signal parameters are marked, and the simulation task corresponding to the abnormal measured signal parameters is triggered according to the correlation. The simulation task is simulated based on the simulation parameters to obtain simulation results corresponding to the abnormal measured signal parameters. The abnormal measured signal parameters, measured waveforms and simulation results are correlated and analyzed. Based on the correlation analysis results, simulation optimization suggestions are determined and corresponding reports are output.

2. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for determining the test task based on the product model and test type of the device under test, and calling the test task template corresponding to the test type, is as follows: Determine the clock signal test items and power signal test items corresponding to the device under test based on the product model of the device under test; The test task template corresponding to the test type is called from the pre-established test task template library. The test task template has a pre-set correspondence between electrical test items and simulation test items. The corresponding parameter configuration task and test task are launched based on the invoked test task template.

3. The method for testing clock signals and power signals according to claim 1, characterized in that, The design documents of the device under test include printed circuit board files, schematic files, component library files, and process documents; Electrical test parameters include at least one of the following: voltage amplitude, rise time, fall time, eye diagram template, jitter, level, and noise threshold. Simulation parameters include at least one of the following: transmitting device model, receiving device model, board material parameters, and printed circuit board stack-up information.

4. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for establishing the correlation between electrical test parameter over-limit conditions and simulation trigger conditions is as follows: Determine the simulation test items corresponding to each electrical test item based on the test task template; Set corresponding electrical test parameter limits for each electrical test item; The measured signal parameters of the electrical test items exceeding the limits of the corresponding electrical test parameters are used as simulation trigger conditions, and the simulation trigger conditions are associated with the corresponding simulation test items.

5. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for configuring test instruments according to electrical test parameters, acquiring clock and power signals from the device under test, and obtaining the measured signal parameters is as follows: Connect the oscilloscope and vector network analyzer to the physical layer interface of the device under test; Configure the sampling rate, trigger conditions, and measurement range of the oscilloscope and vector network analyzer according to the test task template; The clock and power signals of the device under test are acquired by the configured oscilloscope and vector network analyzer, and the measured signal parameters and measured waveforms corresponding to the clock and power signals are extracted.

6. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for triggering simulation tasks corresponding to abnormal measured signal parameters based on correlation relationships is as follows: Determine the electrical test items and the time periods when abnormal measured signal parameters occur; Based on the correspondence between electrical test items and simulation test items, determine the target simulation test items corresponding to the abnormal measured signal parameters; The abnormal measured signal parameters, test data during the abnormal occurrence period, and measured waveforms are associated and stored, and then sent to the simulation task corresponding to the target simulation test item.

7. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for simulating the task based on simulation parameters and obtaining simulation results corresponding to the abnormal measured signal parameters is as follows: Read the abnormal measured signal parameters and the corresponding simulation parameters; Determine the product software and hardware parameters that need to be adjusted based on the abnormal measured signal parameters; Adjust the product's software and hardware parameters, and then execute simulation tasks based on the adjusted parameters; The simulation results generated by the simulation task are analyzed to obtain the parameter adjustment results corresponding to the abnormal measured signal parameters.

8. The method for testing clock signals and power signals according to claim 1, characterized in that, The specific method for correlating and analyzing abnormal measured signal parameters, measured waveforms, and simulation results is as follows: Based on the pre-established correspondence between electrical test items and simulation test items, determine the simulation results and simulation waveforms corresponding to the abnormal measured signal parameters; The abnormal measured signal parameters and measured waveforms are compared with the corresponding simulation results and simulation waveforms to determine the correlation between the abnormal measured signal parameters and the product software and hardware parameters; Based on the aforementioned correlation, suggestions for modifying product software parameters and hardware parameters are determined, and these suggestions are used as simulation optimization suggestions.

9. The method for testing clock signals and power signals according to claim 1, characterized in that, The corresponding reports include electrical test reports and simulation optimization suggestion reports; The electrical test report includes the measured signal parameters, measured waveforms and test conclusions for each electrical test item, with the test conclusions including whether the test is qualified or unqualified. The simulation optimization suggestion report includes abnormal measured signal parameters, the corresponding measured waveforms of the abnormal measured signal parameters, simulation results, simulation waveforms, problem location conclusions, and simulation optimization suggestions.

10. A testing system for clock signals and power signals, characterized in that, include: The test initiation module is used to determine the test task based on the product model and test type of the device under test, and to call the test task template corresponding to the test type. The parameter configuration module is used to obtain the design documents and product model information of the device under test, match the electrical test standard parameters and simulation parameters corresponding to the clock signal and power signal according to the product model information, and establish the correlation between the electrical test parameter over-limit conditions and the simulation trigger conditions. The test module is used to configure the test instruments according to the electrical test parameters, collect the clock signal and power signal of the device under test, and obtain the measured signal parameters. The simulation module is used to compare the measured signal parameters with the corresponding electrical test parameters. When the measured signal parameters exceed the limits of the corresponding electrical test parameters, the abnormal measured signal parameters are marked, and the simulation task corresponding to the abnormal measured signal parameters is triggered according to the correlation. The data fusion and analysis module is used to simulate the simulation task based on the simulation parameters and obtain simulation results corresponding to the abnormal measured signal parameters. The results output module is used to perform correlation analysis on abnormal measured signal parameters, measured waveforms and simulation results, determine simulation optimization suggestions based on the correlation analysis results, and output corresponding reports.

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