Test tool for triode production
By designing dustproof components in transistor test tooling, using the combination of reset spring and rubber blocks, the problem of dust intrusion in the test tooling is solved, the accuracy and stability of the test are improved, and the combination of buffer spring and damper is enhanced The protection and anti-slip functions of the equipment are provided.
Patent Information
- Application Number
- CN202420640376.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-30
- Publication Date
- 2024-12-17
- Estimated Expiration
- 2034-03-30
AI Technical Summary
Existing transistor testing tools are susceptible to intrusion of air dust during the test, resulting in reduced test accuracy or poor jack contact.
A test tool for the production of transistors including dustproof components is designed. The dustproof components are composed of connecting base, cover plate, telescopic rod, return spring, clamp, pulley and rubber block, and the cover plate is automatically closed through the elastic action of the return spring. , make sure the jack is sealed, prevents dust from entering, and provides clamping force during testing.
Effectively prevent dust from entering the transistor test jack, improving the accuracy and stability of the test. At the same time, the protection and anti-slip function of the equipment are enhanced by the combination of buffer spring and damper to avoid damage to the equipment.
Smart Images
Figure CN222189353U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of testing tooling, in particular to a testing tooling for triode production. Background Art
[0002] Transistor is a commonly used electronic device, and its performance parameters are crucial to the normal operation of electronic equipment. Transistor production test fixtures can accurately measure various parameters of transistors to ensure that the performance and quality of products meet production standards. Test fixtures are usually simple in design and easy to operate, which can reduce the workload and labor intensity of operators. They have the advantages of high accuracy, high degree of automation, high reliability, and easy operation, which can improve production efficiency and product quality and reduce production costs.
[0003] Patent document CN218675194U discloses a transistor clamping test fixture, including: a workbench, a pushing assembly, and a lifting assembly arranged below the workbench. A boss is arranged above the workbench, and a plurality of evenly spaced recesses are arranged along the length direction of the boss. A bearing frame for placing the transistor is arranged in the recess, and three test slots are arranged at one end of the recess in the length direction for passing the pins of the transistor; the pushing assembly is arranged on one side of the length direction of the workbench, including a plurality of push plates arranged in the recess and moving along the width direction of the workbench, for pushing the bearing frame to the test slot, and the lifting assembly includes a horizontal plate slidably penetrated with a plurality of ejector rods, and the ejector rod is provided with a plurality of ejector rods. A top block is also provided at the upper end of the rod, and a plurality of through holes are provided on the workbench. The top block is located in the through hole, and a bracket is provided under the through hole. The bracket is provided with a slide groove along its length direction. The top rod passes through the slide groove. During the detection process, the bending of the transistor pins is avoided, and multiple transistors can be detected at the same time, thereby improving the detection efficiency and having strong practicality. However, the transistor clamping test fixture of the above-mentioned public document mainly considers avoiding damage to the transistor assembly during testing through the cooperation of the top block and the slide groove, thereby improving the detection efficiency, but does not consider the problem that dust in the air enters the transistor test jack on the test fixture, resulting in a decrease in test accuracy or poor contact of the jack. Utility Model Content
[0004] The utility model aims to provide a test tool for triode production, so as to solve the technical problem of dust prevention of triode test sockets on the test tool for triode production proposed in the above background technology.
[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a test tool for triode production, comprising a body and a display screen mounted on the body, wherein a dustproof component is fixedly mounted on the body;
[0006] The dustproof assembly includes a connecting base and a cover plate installed on the connecting base, a telescopic rod and a reset spring are fixedly installed on the inner side of the cover plate, and the telescopic rod passes through the reset spring, the other ends of the reset spring and the telescopic rod are fixedly connected to a fixing plate, and the fixing plate is fixedly installed on the outer side of the connecting base, blocks are symmetrically installed on the side walls of the cover plate, a slot corresponding to the block is provided on the connecting base, and the block is limited in the slot, and a plurality of sets of fixed shafts are correspondingly installed on the cover plate, and a pulley is installed on the fixed shaft.
[0007] Preferably, protective components are fixedly installed at the four corners of the body, a base plate is installed inside the protective component, a plurality of groups of buffer springs are correspondingly installed on the base plate, a damper is installed at the other end of the buffer spring, and a rubber plate is fixedly connected to the other end of the damper.
[0008] Preferably, a baffle is fixedly installed below the cover plate, and a handle is fixedly installed above the cover plate.
[0009] Preferably, a rubber block is correspondingly installed on the cross section of the cover plate.
[0010] Preferably, the pulley is slidably connected to the connecting base.
[0011] Preferably, a power switch is provided on the top of the body, a probe interface is provided on the bottom of the body, and a range switch is provided on the middle section of the body.
[0012] Preferably, the side of the body is provided with anti-slip grooves and a charging port.
[0013] Preferably, a transistor test jack is provided on the machine body, and the transistor test jack is located below the dustproof component.
[0014] Compared with the prior art, the beneficial effects of the utility model are:
[0015] 1. The utility model is equipped with a reset spring, a cover plate and a connecting base, which is convenient for improving the dustproof effect of the jack on the test tooling for transistor production. When testing the transistor, the cover plate is pushed to both sides by the handle, the reset spring is stretched, and the telescopic rod is extended. After the transistor is inserted, the handle is released to use the elasticity of the reset spring to pull the cover plate to move in the opposite direction along the card slot. After the rubber block contacts the transistor, the cover plate stops moving. Not only can the transistor test jack be automatically dustproof when not in use, but also a clamping force can be generated on the transistor during testing, thereby improving the stability of the transistor test;
[0016] 2. The utility model is convenient for improving the protectiveness of the test tooling for transistor production by installing a buffer spring, a damper and a rubber plate. When the test tooling for transistor production is impacted by the outside, the buffer spring cooperates with the damper to buffer the impact force using its own elasticity. The rubber plate has a greater protective effect on the machine body due to its own high elasticity and softness. Not only is the structure simple, but it can also prevent the test tooling for transistor production from slipping and falling, causing damage to the machine body. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0018] Figure 2 This is a schematic diagram of the structure of the dustproof component of the utility model;
[0019] Figure 3 For the utility model Figure 2 The enlarged structural diagram at A in the middle;
[0020] Figure 4 This is a schematic diagram of the cover structure of the utility model;
[0021] Figure 5 It is a plan view of the protection component of the utility model.
[0022] In the figure: 1. body; 2. display screen; 3. power switch; 4. range switch; 5. charging port; 6. anti-slip groove; 7. cover plate; 8. protective component; 9. test lead interface; 10. connecting base; 11. baffle; 12. slot; 13. block; 14. pulley; 15. rubber block; 16. fixed shaft; 17. transistor test jack; 18. reset spring; 19. telescopic rod; 20. fixed plate; 21. bottom plate; 22. buffer spring; 23. damper; 24. rubber plate; 25. handle. DETAILED DESCRIPTION
[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0024] See also Figure 1-4A test fixture for transistor production, comprising a body 1 and a display screen 2 mounted on the body 1, a dustproof component fixedly mounted on the body 1, the dustproof component comprising a connecting base 10 and a cover plate 7 mounted on the connecting base 10, a telescopic rod 19 and a reset spring 18 fixedly mounted on the inner side of the cover plate 7, and the telescopic rod 19 penetrates the reset spring 18, and the other ends of the reset spring 18 and the telescopic rod 19 are fixedly connected with a fixing plate 20, and the fixing plate 20 is fixedly mounted on the outer side of the connecting base 10, a clamping block 13 is symmetrically mounted on the side wall of the cover plate 7, a clamping groove 12 corresponding to the clamping block 13 is provided on the connecting base 10, and the clamping block 13 is limited in the clamping groove 12, a plurality of fixed shafts 16 are correspondingly mounted on the cover plate 7, a pulley 14 is mounted on the fixed shaft 16, a baffle 11 is fixedly mounted below the cover plate 7, a handle 25 is fixedly mounted above the cover plate 7, and a rubber block 15 is correspondingly mounted on the cross section of the cover plate 7;
[0025] The dustproof component is installed just above the transistor test socket 17. The cover plate 7 is divided into two groups. The connecting base 10 can be bonded to the body 1 by soft glue. When testing the transistor, the two groups of cover plates 7 are pushed to both sides by the handle 25, the reset spring 18 is stretched, the telescopic rod 19 is extended, and the transistor is aligned and inserted into the transistor test socket 17. The handle 25 is released to utilize the elastic contraction of the reset spring 18 itself to pull the cover plate 7 to move in opposite directions along the card slot 12. After the rubber block 15 contacts the transistor, the cover plate 7 stops moving. The card block 13 is limited in the card slot 12 to provide a guiding and limiting effect for the movement of the cover plate 7. The fixed shaft 16 provides a supporting and fixing effect for the pulley 14. The cover plate 7 and the connecting base 10 are connected by the pulley 14 to form a sliding structure. The pulley 14 The friction between the cover plate 7 and the connection base 10 can be reduced, which is beneficial to improving the sliding effect of the cover plate 7. The baffle 11 can prevent the cover plate 7 from completely separating from the connection base 10 when moving to both sides. The rubber block 15 is correspondingly installed on the cross section of the cover plate 7 to prevent the cover plate 7 from directly contacting the transistor and causing certain damage to the transistor. The cover plate 7 is automatically recovered and moved by utilizing the elasticity of the reset spring 18 itself, and the unused transistor test socket 17 is blocked by the cover plate 7. The reset spring 18 pulls the cover plate 7 to make the rubber block 15 contact the transistor and generate a certain clamping force on the transistor. Not only can the unused transistor test socket 17 be automatically dustproof, but the clamping force generated by the rubber block 15 on the transistor can also be used to improve the stability of the transistor test.
[0026] See also Figure 1 and Figure 5 The four corners of the machine body 1 are fixedly mounted with a protective assembly 8, a bottom plate 21 is mounted inside the protective assembly 8, a plurality of groups of buffer springs 22 are correspondingly mounted on the bottom plate 21, a damper 23 is mounted on the other end of the buffer spring 22, and a rubber plate 24 is fixedly connected to the other end of the damper 23;
[0027] When the machine body 1 is hit by an external impact, the buffer spring 22 is compressed and cooperates with the damper 23 to gradually buffer the external impact force. The bottom plate 21 is conducive to improving the stability of the installation of the buffer spring 22. Based on the high elasticity and softness of the rubber plate 24, sharp objects can be prevented from causing damage to the machine body 1. By utilizing the elasticity of the buffer spring 22 itself and the buffering effect of the damper 23 itself, the buffering effect of the protective component 8 is greatly improved, preventing the machine body 1 from slipping and falling off and causing the machine body 1 to be damaged.
[0028] See also Figure 1 A power switch 3 is provided on the top of the body 1, a probe interface 9 is provided on the bottom of the body 1, a range switch 4 is provided on the middle of the body 1, and anti-slip grooves 6 and a charging port 5 are provided on the side of the body 1;
[0029] The power switch 3 controls the overall power supply of the body 1, the test lead interface 9 can be connected to the test lead to test the transistor power-on performance, the range switch 4 is used to adjust the range of the transistor test, and the anti-slip pattern 6 can increase the friction between the hand and the body 1 to prevent the body 1 from slipping and falling off.
[0030] See also Figure 1 A transistor test jack 17 is provided on the body 1, and the transistor test jack 17 is located below the dustproof component. The transistor test jack 17 is located directly below the dustproof component, which is beneficial to improving the sealing performance of the dustproof component to the transistor test jack 17.
[0031] Working principle: first operate the power switch 3 to turn on the body 1, and use the handle 25 to push the two groups of cover plates 7 to both sides, the reset spring 18 is stretched, the telescopic rod 19 is extended, and the transistor is aligned and inserted into the transistor test socket 17. Release the handle 25 and use the elastic contraction of the reset spring 18 to pull the cover plate 7 to move in the opposite direction along the card slot 12. After the rubber block 15 contacts the transistor, the cover plate 7 stops moving. Use the range switch 4 to adjust to the test range corresponding to the transistor. The test information can be viewed on the display screen 2. After the test is completed, pull out the transistor, and use the elasticity of the reset spring 18 to pull the cover plate 7 to move in the opposite direction. After the two corresponding groups of rubber blocks 15 are completely in contact, the transistor test socket 17 is in a completely sealed state, and dust particles in the air cannot enter the transistor test socket 17, so as to prevent the poor contact between the transistor test socket 17 and the transistor and cause the test accuracy to decrease.
[0032] Finally, when the body 1 is hit by an external impact, the buffer spring 22 is compressed and cooperates with the damper 23 to gradually buffer the external impact force. The bottom plate 21 is conducive to improving the stability of the installation of the buffer spring 22. Based on the high elasticity and softness of the rubber plate 24, sharp objects can be prevented from causing damage to the body 1. By utilizing the elasticity of the buffer spring 22 and the buffering effect of the damper 23, the buffering effect of the protective component 8 is greatly improved, preventing the body 1 from slipping and falling off and causing the body 1 to be damaged.
[0033] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.
Claims
1. A test tool for transistor production, comprising a body (1) and a display screen (2) mounted on the body (1), Features: A dustproof component is fixedly mounted on the machine body (1); The dustproof component comprises a connecting base (10) and a cover plate (7) mounted on the connecting base (10); a telescopic rod (19) and a reset spring (18) are fixedly mounted on the inner side of the cover plate (7); the telescopic rod (19) penetrates the reset spring (18); the other ends of the reset spring (18) and the telescopic rod (19) are fixedly connected with a fixing plate (20); the fixing plate (20) is fixedly mounted on the outer side of the connecting base (10); a clamping block (13) is symmetrically mounted on the side wall of the cover plate (7); a clamping groove (12) corresponding to the clamping block (13) is provided on the connecting base (10), and the clamping block (13) is limited in the clamping groove (12); a plurality of fixed shafts (16) are correspondingly mounted on the cover plate (7); a pulley (14) is mounted on the fixed shaft (16).
2. A test tool for transistor production according to claim 1, Features: The four corners of the machine body (1) are fixedly mounted with protective components (8), a bottom plate (21) is mounted inside the protective component (8), a plurality of groups of buffer springs (22) are correspondingly mounted on the bottom plate (21), a damper (23) is mounted on the other end of the buffer spring (22), and a rubber plate (24) is fixedly connected to the other end of the damper (23).
3. A test tool for transistor production according to claim 1, Features: A baffle (11) is fixedly mounted below the cover plate (7), and a handle (25) is fixedly mounted above the cover plate (7).
4. A test tool for transistor production according to claim 1, Features: A rubber block (15) is correspondingly mounted on the cross section of the cover plate (7).
5. A test tool for transistor production according to claim 1, Features: The pulley (14) is slidably connected to the connecting base (10).
6. A test tool for transistor production according to claim 1, Features: A power switch (3) is provided on the top of the machine body (1), a probe interface (9) is provided on the bottom of the machine body (1), and a range switch (4) is provided on the middle section of the machine body (1).
7. A test tool for transistor production according to claim 1, Features: The side surface of the machine body (1) is provided with anti-slip grooves (6) and a charging port (5).
8. A test tool for transistor production according to claim 1, Features: The machine body (1) is provided with a triode test socket (17), and the triode test socket (17) is located below the dustproof component.